JPS53143289A - Semiconductor radiation measuring instrument - Google Patents

Semiconductor radiation measuring instrument

Info

Publication number
JPS53143289A
JPS53143289A JP5806977A JP5806977A JPS53143289A JP S53143289 A JPS53143289 A JP S53143289A JP 5806977 A JP5806977 A JP 5806977A JP 5806977 A JP5806977 A JP 5806977A JP S53143289 A JPS53143289 A JP S53143289A
Authority
JP
Japan
Prior art keywords
semiconductor radiation
measuring instrument
radiation measuring
detecting elements
checking
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5806977A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6228432B2 (enrdf_load_stackoverflow
Inventor
Noboru Matsuo
Tetsuji Kobayashi
Toru Sugita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP5806977A priority Critical patent/JPS53143289A/ja
Publication of JPS53143289A publication Critical patent/JPS53143289A/ja
Publication of JPS6228432B2 publication Critical patent/JPS6228432B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP5806977A 1977-05-19 1977-05-19 Semiconductor radiation measuring instrument Granted JPS53143289A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5806977A JPS53143289A (en) 1977-05-19 1977-05-19 Semiconductor radiation measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5806977A JPS53143289A (en) 1977-05-19 1977-05-19 Semiconductor radiation measuring instrument

Publications (2)

Publication Number Publication Date
JPS53143289A true JPS53143289A (en) 1978-12-13
JPS6228432B2 JPS6228432B2 (enrdf_load_stackoverflow) 1987-06-19

Family

ID=13073604

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5806977A Granted JPS53143289A (en) 1977-05-19 1977-05-19 Semiconductor radiation measuring instrument

Country Status (1)

Country Link
JP (1) JPS53143289A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10186045A (ja) * 1996-12-26 1998-07-14 Canon Inc 放射線検出装置および放射線検出方法
JP2009042233A (ja) * 2001-03-23 2009-02-26 Koninkl Philips Electronics Nv 放射線センサによって吸収される照射線量を決定する方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5161876A (enrdf_load_stackoverflow) * 1974-09-27 1976-05-28 Philips Nv
JPS5293383A (en) * 1976-02-02 1977-08-05 Nec Corp Cosmic ray detector

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5161876A (enrdf_load_stackoverflow) * 1974-09-27 1976-05-28 Philips Nv
JPS5293383A (en) * 1976-02-02 1977-08-05 Nec Corp Cosmic ray detector

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10186045A (ja) * 1996-12-26 1998-07-14 Canon Inc 放射線検出装置および放射線検出方法
JP2009042233A (ja) * 2001-03-23 2009-02-26 Koninkl Philips Electronics Nv 放射線センサによって吸収される照射線量を決定する方法

Also Published As

Publication number Publication date
JPS6228432B2 (enrdf_load_stackoverflow) 1987-06-19

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