JPS5213394A - Direct-reading silicon content measuring apparatus - Google Patents

Direct-reading silicon content measuring apparatus

Info

Publication number
JPS5213394A
JPS5213394A JP50089900A JP8990075A JPS5213394A JP S5213394 A JPS5213394 A JP S5213394A JP 50089900 A JP50089900 A JP 50089900A JP 8990075 A JP8990075 A JP 8990075A JP S5213394 A JPS5213394 A JP S5213394A
Authority
JP
Japan
Prior art keywords
direct
measuring apparatus
silicon content
content measuring
reading
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50089900A
Other languages
Japanese (ja)
Other versions
JPS5925174B2 (en
Inventor
Hinao Goto
Masaaki Tani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HODAKA DENSHI GIJIYUTSU KENKIY
HODAKA DENSHI GIJIYUTSU KENKIYUUSHIYO
HODAKA DENSHI GIJUTSU KENKYUSHO
NAMI DENSHI KOGYO KK
NAMI DENSHI KOUGIYOU KK
Original Assignee
HODAKA DENSHI GIJIYUTSU KENKIY
HODAKA DENSHI GIJIYUTSU KENKIYUUSHIYO
HODAKA DENSHI GIJUTSU KENKYUSHO
NAMI DENSHI KOGYO KK
NAMI DENSHI KOUGIYOU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by HODAKA DENSHI GIJIYUTSU KENKIY, HODAKA DENSHI GIJIYUTSU KENKIYUUSHIYO, HODAKA DENSHI GIJUTSU KENKYUSHO, NAMI DENSHI KOGYO KK, NAMI DENSHI KOUGIYOU KK filed Critical HODAKA DENSHI GIJIYUTSU KENKIY
Priority to JP50089900A priority Critical patent/JPS5925174B2/en
Publication of JPS5213394A publication Critical patent/JPS5213394A/en
Publication of JPS5925174B2 publication Critical patent/JPS5925174B2/en
Expired legal-status Critical Current

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  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)

Abstract

PURPOSE: An apparatus which has the wide effective measuring range and offers the high precision and gives no influence to the measuring accuracy due to the variety of correlation.
COPYRIGHT: (C)1977,JPO&Japio
JP50089900A 1975-07-22 1975-07-22 Silicon content direct reading measuring device Expired JPS5925174B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50089900A JPS5925174B2 (en) 1975-07-22 1975-07-22 Silicon content direct reading measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50089900A JPS5925174B2 (en) 1975-07-22 1975-07-22 Silicon content direct reading measuring device

Publications (2)

Publication Number Publication Date
JPS5213394A true JPS5213394A (en) 1977-02-01
JPS5925174B2 JPS5925174B2 (en) 1984-06-15

Family

ID=13983599

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50089900A Expired JPS5925174B2 (en) 1975-07-22 1975-07-22 Silicon content direct reading measuring device

Country Status (1)

Country Link
JP (1) JPS5925174B2 (en)

Also Published As

Publication number Publication date
JPS5925174B2 (en) 1984-06-15

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