JPS5312384A - Indicating method for defect mark - Google Patents

Indicating method for defect mark

Info

Publication number
JPS5312384A
JPS5312384A JP8701976A JP8701976A JPS5312384A JP S5312384 A JPS5312384 A JP S5312384A JP 8701976 A JP8701976 A JP 8701976A JP 8701976 A JP8701976 A JP 8701976A JP S5312384 A JPS5312384 A JP S5312384A
Authority
JP
Japan
Prior art keywords
defect
defect mark
indicating method
mark
sihnal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8701976A
Other languages
Japanese (ja)
Other versions
JPS5718572B2 (en
Inventor
Nobumasa Oya
Akira Sudo
Hideo Sato
Kokichi Dozaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP8701976A priority Critical patent/JPS5312384A/en
Publication of JPS5312384A publication Critical patent/JPS5312384A/en
Publication of JPS5718572B2 publication Critical patent/JPS5718572B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To indicate defect mark of rolled steel plate, etc., by providing defect detector for detecting defect on surface of inspected object according to output video sihnal for output image delivered from image pickup device.
JP8701976A 1976-07-20 1976-07-20 Indicating method for defect mark Granted JPS5312384A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8701976A JPS5312384A (en) 1976-07-20 1976-07-20 Indicating method for defect mark

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8701976A JPS5312384A (en) 1976-07-20 1976-07-20 Indicating method for defect mark

Publications (2)

Publication Number Publication Date
JPS5312384A true JPS5312384A (en) 1978-02-03
JPS5718572B2 JPS5718572B2 (en) 1982-04-17

Family

ID=13903238

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8701976A Granted JPS5312384A (en) 1976-07-20 1976-07-20 Indicating method for defect mark

Country Status (1)

Country Link
JP (1) JPS5312384A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2447550A1 (en) * 1979-01-25 1980-08-22 Hajime Industries DEVICE FOR EXAMINING OBJECTS
CN102818809A (en) * 2012-09-05 2012-12-12 杭州瑞利测控技术有限公司 Gray cloth defect on-line detecting system based on machine vision and achieving method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2447550A1 (en) * 1979-01-25 1980-08-22 Hajime Industries DEVICE FOR EXAMINING OBJECTS
CN102818809A (en) * 2012-09-05 2012-12-12 杭州瑞利测控技术有限公司 Gray cloth defect on-line detecting system based on machine vision and achieving method

Also Published As

Publication number Publication date
JPS5718572B2 (en) 1982-04-17

Similar Documents

Publication Publication Date Title
JPS5644803A (en) System measuring for thickness of nonmetallic sheet like object
ATE44342T1 (en) VIDEO SIGNAL ANALYZER.
JPS55125439A (en) Defect inspection device
JPS5332789A (en) Method and apparatus for measuring of stress of white color x-ray
JPS5312384A (en) Indicating method for defect mark
JPS5244656A (en) Method of measuring camber of steel plates
JPS5235691A (en) Surface inspection apparatus for cylindrical pellets
JPS5312377A (en) Inspecting apparatus for surface
JPS5312379A (en) Illuminating method in surface flaw inspecting system
JPS56135106A (en) Material plate thickness correction
JPS52125389A (en) Defect inspection apparatus
JPS5312380A (en) Detecting method for steel plate surface irregularity in zm*vwymuw_v oovteel plate surface irregularity in rolled steel plate surface inspecting system
JPS5312381A (en) Separating method for steel plate surface irregularity in rolled steel plate surface flaw inspecting system
JPS53128238A (en) Velocity test system
JPS5312383A (en) Image pickup method in rolled steel plate surface flaw inspecting system
JPS52153468A (en) Thickness measuring method of substrates
JPS5344047A (en) Abnormality detection method for multi-unit apparatus
JPS55121106A (en) Detector for waveform of beltlike body
JPS5263751A (en) Automatic detection of translating specific pattern
JPS51136437A (en) A process for inspecting signal quality
JPS5222998A (en) Liquid metal leakage detecting device
JPS5388750A (en) Device for detecting surface membrane thickness
JPS5385451A (en) Distance measuring device
JPS5398870A (en) Shape inspecting apparatus
JPS51114168A (en) Device for detecting disparity of an alternating current signal