JPS5312379A - Illuminating method in surface flaw inspecting system - Google Patents

Illuminating method in surface flaw inspecting system

Info

Publication number
JPS5312379A
JPS5312379A JP8701276A JP8701276A JPS5312379A JP S5312379 A JPS5312379 A JP S5312379A JP 8701276 A JP8701276 A JP 8701276A JP 8701276 A JP8701276 A JP 8701276A JP S5312379 A JPS5312379 A JP S5312379A
Authority
JP
Japan
Prior art keywords
surface flaw
inspecting system
illuminating method
flaw inspecting
uniformalizing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8701276A
Other languages
English (en)
Other versions
JPS5814984B2 (ja
Inventor
Yoshio Tomioka
Toyoji Maruyama
Nobumasa Oya
Akira Sudo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Nippon Steel Corp
Original Assignee
Fujitsu Ltd
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd, Nippon Steel Corp filed Critical Fujitsu Ltd
Priority to JP51087012A priority Critical patent/JPS5814984B2/ja
Publication of JPS5312379A publication Critical patent/JPS5312379A/ja
Publication of JPS5814984B2 publication Critical patent/JPS5814984B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP51087012A 1976-07-20 1976-07-20 圧延鋼板表面疵検査システムに於ける照明方法 Expired JPS5814984B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP51087012A JPS5814984B2 (ja) 1976-07-20 1976-07-20 圧延鋼板表面疵検査システムに於ける照明方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP51087012A JPS5814984B2 (ja) 1976-07-20 1976-07-20 圧延鋼板表面疵検査システムに於ける照明方法

Publications (2)

Publication Number Publication Date
JPS5312379A true JPS5312379A (en) 1978-02-03
JPS5814984B2 JPS5814984B2 (ja) 1983-03-23

Family

ID=13903041

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51087012A Expired JPS5814984B2 (ja) 1976-07-20 1976-07-20 圧延鋼板表面疵検査システムに於ける照明方法

Country Status (1)

Country Link
JP (1) JPS5814984B2 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT507121B1 (de) * 2008-07-22 2012-04-15 Software Competence Center Hagenberg Gmbh Verfahren zur güteprüfung von oberflächen

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60132685A (ja) * 1983-12-21 1985-07-15 神鋼電機株式会社 振動部品供給機における部品選別方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS446160Y1 (ja) * 1965-08-28 1969-03-05

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS446160Y1 (ja) * 1965-08-28 1969-03-05

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT507121B1 (de) * 2008-07-22 2012-04-15 Software Competence Center Hagenberg Gmbh Verfahren zur güteprüfung von oberflächen

Also Published As

Publication number Publication date
JPS5814984B2 (ja) 1983-03-23

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