JPS5269272A - Method of detecting temperature of semiconductor part and circuit therefor - Google Patents

Method of detecting temperature of semiconductor part and circuit therefor

Info

Publication number
JPS5269272A
JPS5269272A JP51124514A JP12451476A JPS5269272A JP S5269272 A JPS5269272 A JP S5269272A JP 51124514 A JP51124514 A JP 51124514A JP 12451476 A JP12451476 A JP 12451476A JP S5269272 A JPS5269272 A JP S5269272A
Authority
JP
Japan
Prior art keywords
detecting temperature
semiconductor part
circuit therefor
therefor
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP51124514A
Other languages
English (en)
Inventor
Arekusandaa Aauin Yangu Jiyon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Canada Co
Original Assignee
Canadian General Electric Co Ltd
General Electric Canada Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canadian General Electric Co Ltd, General Electric Canada Co filed Critical Canadian General Electric Co Ltd
Publication of JPS5269272A publication Critical patent/JPS5269272A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H6/00—Emergency protective circuit arrangements responsive to undesired changes from normal non-electric working conditions using simulators of the apparatus being protected, e.g. using thermal images

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Amplifiers (AREA)
JP51124514A 1975-12-03 1976-10-19 Method of detecting temperature of semiconductor part and circuit therefor Pending JPS5269272A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA241,111A CA1046646A (en) 1975-12-03 1975-12-03 Temperature monitor for semiconductor junction

Publications (1)

Publication Number Publication Date
JPS5269272A true JPS5269272A (en) 1977-06-08

Family

ID=4104670

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51124514A Pending JPS5269272A (en) 1975-12-03 1976-10-19 Method of detecting temperature of semiconductor part and circuit therefor

Country Status (6)

Country Link
US (1) US4001649A (ja)
JP (1) JPS5269272A (ja)
CA (1) CA1046646A (ja)
DE (1) DE2646227A1 (ja)
FR (1) FR2336799A1 (ja)
GB (1) GB1536293A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60109063U (ja) * 1983-12-27 1985-07-24 三菱電機株式会社 電力半導体の温度検出装置
JPH03261877A (ja) * 1990-03-12 1991-11-21 Mitsubishi Electric Corp 電力変換装置及びインバータ装置

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2551133C2 (de) * 1975-11-14 1983-10-06 Kessler, Karl H., Ing.(grad.), 7300 Esslingen Steuereinrichtung für eine Nähmaschine
US4039928A (en) * 1976-07-19 1977-08-02 Pertron Controls Corporation Electrical operating circuit having semiconductor device junction temperature monitoring
US4117527A (en) * 1977-03-25 1978-09-26 General Electric Company Solid state valve thermal protection for hvdc power converters
US4301396A (en) * 1978-09-19 1981-11-17 Gould Inc. Thermal current limiting controller
US4330809A (en) * 1979-12-31 1982-05-18 Crown International, Inc. Thermal protection circuit for the die of a transistor
FR2484726A1 (fr) * 1980-06-11 1981-12-18 Telemecanique Electrique Dispositif de simulation de l'echauffement instantane d'un composant semi-conducteur de puissance en vue de sa protection
US4553092A (en) * 1982-12-20 1985-11-12 The Boeing Company Apparatus and method for temperature estimation of overhead conductors
US4675770A (en) * 1985-01-30 1987-06-23 Telefonaktiebolaget L. M. Ericsson Multiple voltage regulator integrated circuit having control circuits for selectively disabling a voltage regulator in an over-current condition
US4669025A (en) * 1986-04-21 1987-05-26 Digital Equipment Corporation Semiconductor junction temperature emulator
US5140394A (en) * 1988-07-26 1992-08-18 Texas Instruments Incorporated Electrothermal sensor apparatus
US5005008A (en) * 1989-04-20 1991-04-02 Hewlett Packard Company Method and apparatus for providing thermodynamic protection of a driver circuit used in an in-circuit tester
FR2651919B1 (fr) * 1989-09-13 1995-12-15 Merlin Gerin Disjoncteur comportant un declencheur electronique.
US5017906A (en) * 1989-10-06 1991-05-21 Aritech Corporation Apparatus and method for combining analog detection signals to provide enhanced alarm integrity
US5249141A (en) * 1990-10-24 1993-09-28 Astec America, Inc. Method and apparatus for maintaining an active device below a maximum safe operating temperature
DE4308769A1 (de) * 1993-03-19 1994-09-22 Bosch Gmbh Robert Diodenüberwachung
US5600575A (en) * 1994-10-05 1997-02-04 Anticole; Robert B. Drive protection monitor for motor and amplifier
US6092927A (en) * 1994-11-10 2000-07-25 International Rectifier Corp. Temperature detection of power semiconductors performed by a co-packaged analog integrated circuit
AU5860696A (en) * 1995-05-16 1996-11-29 Giga Operations Corporation Monitor cpu for a logic device
GB2337823A (en) * 1998-05-26 1999-12-01 Motorola Ltd Temperature estimation method
US6203191B1 (en) 1998-10-28 2001-03-20 Speculative Incorporated Method of junction temperature determination and control utilizing heat flow
JP2001006518A (ja) * 1999-04-23 2001-01-12 Sony Chem Corp 過電流保護装置
US6667869B2 (en) * 2000-02-24 2003-12-23 Acuity Imaging, Llc Power control system and method for illumination array
US6349023B1 (en) * 2000-02-24 2002-02-19 Robotic Vision Systems, Inc. Power control system for illumination array
US6631066B1 (en) * 2000-05-05 2003-10-07 National Semiconductor Corporation Apparatus and method for initiating crowbar protection in a shunt regulator
DE10048704B4 (de) * 2000-09-30 2014-07-10 Sew-Eurodrive Gmbh & Co Kg Verfahren für eine Vorrichtung mit Leistungshalbleitern und Vorrichtung
US6984064B1 (en) * 2002-07-31 2006-01-10 Advanced Micro Devices, Inc. Thermal transfer measurement of an integrated circuit
US6992452B1 (en) 2002-12-02 2006-01-31 Deka Products Limited Partnership Dynamic current limiting
US6888469B2 (en) * 2003-01-02 2005-05-03 Copley Controls Corporation Method and apparatus for estimating semiconductor junction temperature
US7508671B2 (en) * 2003-10-10 2009-03-24 Intel Corporation Computer system having controlled cooling
DE102004062655B4 (de) * 2004-12-24 2014-12-31 Leopold Kostal Gmbh & Co. Kg Verfahren zum Korrigieren einer durch eine elektrische Spannungsmessung indirekt durchgeführten elektrischen Strommessung
ATE449992T1 (de) * 2007-03-22 2009-12-15 Baumueller Nuernberg Gmbh Temperaturüberwachung bei leistungsschaltern
US8057094B2 (en) * 2007-11-16 2011-11-15 Infineon Technologies Ag Power semiconductor module with temperature measurement
FR2944876B1 (fr) * 2009-04-27 2012-12-28 Peugeot Citroen Automobiles Sa Procede et systeme pour quantifier une temperature de jonction de composant.
CN102207534B (zh) * 2011-03-18 2013-04-17 华南师范大学 利用pn结测量LED热阻的方法及其装置
CN104792824B (zh) * 2015-04-15 2017-10-31 西安工程大学 用于ZnO陶瓷点缺陷结构检测的温差电势电流方法
DE102016116400A1 (de) 2016-09-01 2018-03-01 Eaton Industries (Austria) Gmbh Schutzschaltgerät
US11423203B2 (en) 2019-07-23 2022-08-23 Delphi Technologies Ip Limited System and method for modeling thermal circuits
CN112824841A (zh) * 2019-11-19 2021-05-21 许继集团有限公司 一种阀塔温度监测系统与方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3564293A (en) * 1968-04-16 1971-02-16 Power Semiconductors Inc Temperature-compensating thyristor control
US3622849A (en) * 1970-06-23 1971-11-23 Gen Electric Thyristor junction temperature monitor
US3868554A (en) * 1973-12-26 1975-02-25 Gen Electric Current limit system for DC motor control
US3961173A (en) * 1974-11-20 1976-06-01 Varian Associates Heat unit integrator for X-ray tubes

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60109063U (ja) * 1983-12-27 1985-07-24 三菱電機株式会社 電力半導体の温度検出装置
JPH03261877A (ja) * 1990-03-12 1991-11-21 Mitsubishi Electric Corp 電力変換装置及びインバータ装置

Also Published As

Publication number Publication date
DE2646227A1 (de) 1977-06-16
CA1046646A (en) 1979-01-16
US4001649A (en) 1977-01-04
FR2336799A1 (fr) 1977-07-22
GB1536293A (en) 1978-12-20

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