JPS5267567A - Test piece processing device of electronic microscope - Google Patents
Test piece processing device of electronic microscopeInfo
- Publication number
- JPS5267567A JPS5267567A JP14300775A JP14300775A JPS5267567A JP S5267567 A JPS5267567 A JP S5267567A JP 14300775 A JP14300775 A JP 14300775A JP 14300775 A JP14300775 A JP 14300775A JP S5267567 A JPS5267567 A JP S5267567A
- Authority
- JP
- Japan
- Prior art keywords
- test piece
- processing device
- electronic microscope
- piece processing
- stress
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To apply the fixed stress to the test piece, using the electric distortion element as the stress generation source, in case of producing the transformation by applying the stress to the test piece under observation.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14300775A JPS5267567A (en) | 1975-12-03 | 1975-12-03 | Test piece processing device of electronic microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14300775A JPS5267567A (en) | 1975-12-03 | 1975-12-03 | Test piece processing device of electronic microscope |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5267567A true JPS5267567A (en) | 1977-06-04 |
Family
ID=15328771
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14300775A Pending JPS5267567A (en) | 1975-12-03 | 1975-12-03 | Test piece processing device of electronic microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5267567A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS561452A (en) * | 1979-06-18 | 1981-01-09 | Jeol Ltd | Bending and fatigue testing device for specimen by scanning electron microscope, etc. |
-
1975
- 1975-12-03 JP JP14300775A patent/JPS5267567A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS561452A (en) * | 1979-06-18 | 1981-01-09 | Jeol Ltd | Bending and fatigue testing device for specimen by scanning electron microscope, etc. |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5275261A (en) | Test piece image dispaly unit | |
JPS5214946A (en) | High frequency heating apparatus | |
JPS51148131A (en) | Apparatus to utilize wave energy | |
JPS5267567A (en) | Test piece processing device of electronic microscope | |
JPS5430026A (en) | Objective lens of high reduced scale | |
JPS5211655A (en) | Dust-proof device for mat etc | |
JPS5216068A (en) | Parts insertion device | |
JPS547877A (en) | Test method for electronic device | |
JPS51118968A (en) | Electron beam exposure device | |
JPS5240748A (en) | Tester for relay device | |
JPS52134148A (en) | High frequency heating apparatus | |
JPS5212560A (en) | Electronic beam probe control device | |
JPS5271137A (en) | Buffer memory | |
JPS51150962A (en) | Analog output apparatus | |
JPS5219079A (en) | Ic tester | |
JPS5397765A (en) | Production of semiconductor device | |
JPS52129275A (en) | Impurity diffusion method | |
JPS5273673A (en) | Production of semiconductor device | |
JPS51137890A (en) | Terminal fixing apparatus | |
JPS5259117A (en) | Process for preparation of halogenosilane | |
JPS52104862A (en) | Scanning electronic microscope | |
JPS51150944A (en) | Microscope video data input system | |
JPS5213147A (en) | High-frequency heating equipment | |
JPS5252781A (en) | Apparatus for breathing applied to method for charging gas by breathin g | |
JPS51151184A (en) | Metallic lead quantitative analysig method |