JPS5267567A - Test piece processing device of electronic microscope - Google Patents

Test piece processing device of electronic microscope

Info

Publication number
JPS5267567A
JPS5267567A JP14300775A JP14300775A JPS5267567A JP S5267567 A JPS5267567 A JP S5267567A JP 14300775 A JP14300775 A JP 14300775A JP 14300775 A JP14300775 A JP 14300775A JP S5267567 A JPS5267567 A JP S5267567A
Authority
JP
Japan
Prior art keywords
test piece
processing device
electronic microscope
piece processing
stress
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14300775A
Other languages
Japanese (ja)
Inventor
Kiyoshi Ishikawa
Hiroshi Fujita
Teizo Tabata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP14300775A priority Critical patent/JPS5267567A/en
Publication of JPS5267567A publication Critical patent/JPS5267567A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To apply the fixed stress to the test piece, using the electric distortion element as the stress generation source, in case of producing the transformation by applying the stress to the test piece under observation.
COPYRIGHT: (C)1977,JPO&Japio
JP14300775A 1975-12-03 1975-12-03 Test piece processing device of electronic microscope Pending JPS5267567A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14300775A JPS5267567A (en) 1975-12-03 1975-12-03 Test piece processing device of electronic microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14300775A JPS5267567A (en) 1975-12-03 1975-12-03 Test piece processing device of electronic microscope

Publications (1)

Publication Number Publication Date
JPS5267567A true JPS5267567A (en) 1977-06-04

Family

ID=15328771

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14300775A Pending JPS5267567A (en) 1975-12-03 1975-12-03 Test piece processing device of electronic microscope

Country Status (1)

Country Link
JP (1) JPS5267567A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS561452A (en) * 1979-06-18 1981-01-09 Jeol Ltd Bending and fatigue testing device for specimen by scanning electron microscope, etc.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS561452A (en) * 1979-06-18 1981-01-09 Jeol Ltd Bending and fatigue testing device for specimen by scanning electron microscope, etc.

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