JPS561452A - Bending and fatigue testing device for specimen by scanning electron microscope, etc. - Google Patents
Bending and fatigue testing device for specimen by scanning electron microscope, etc.Info
- Publication number
- JPS561452A JPS561452A JP7647179A JP7647179A JPS561452A JP S561452 A JPS561452 A JP S561452A JP 7647179 A JP7647179 A JP 7647179A JP 7647179 A JP7647179 A JP 7647179A JP S561452 A JPS561452 A JP S561452A
- Authority
- JP
- Japan
- Prior art keywords
- specimen
- bending stress
- testing device
- bending
- electron microscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005452 bending Methods 0.000 title abstract 5
- 238000009661 fatigue test Methods 0.000 title 1
- 238000012360 testing method Methods 0.000 abstract 3
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
PURPOSE:To permit the observation of the fatigue condition of a specimen by a method in which a driving bar is reciprocally moved to apply a repeated bending stress to a specimen and then electron rays are scanned. CONSTITUTION:The test specimen 3 is laid and fixed between the specimen supporters 5a and 5b and then a testing device is established in the test room 1. Then, when positive and negative voltages are repeatedly applied to the motor 13 from the power source 15, the driving bar 8 is reciprocally moved from side to side to apply a repeated bending stress to the specimen 3. After applying the bending stress desired times to the specimen, the surface of the specimen 3 is scanned by the electron rays EB in order to observe the fatigue condition of the specimen 3 due to the repeated bending stress applied.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7647179A JPS561452A (en) | 1979-06-18 | 1979-06-18 | Bending and fatigue testing device for specimen by scanning electron microscope, etc. |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7647179A JPS561452A (en) | 1979-06-18 | 1979-06-18 | Bending and fatigue testing device for specimen by scanning electron microscope, etc. |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS561452A true JPS561452A (en) | 1981-01-09 |
Family
ID=13606081
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7647179A Pending JPS561452A (en) | 1979-06-18 | 1979-06-18 | Bending and fatigue testing device for specimen by scanning electron microscope, etc. |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS561452A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59137547U (en) * | 1983-03-04 | 1984-09-13 | 株式会社アマダ | bending test equipment |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5014270A (en) * | 1973-06-06 | 1975-02-14 | ||
JPS5267567A (en) * | 1975-12-03 | 1977-06-04 | Hitachi Ltd | Test piece processing device of electronic microscope |
-
1979
- 1979-06-18 JP JP7647179A patent/JPS561452A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5014270A (en) * | 1973-06-06 | 1975-02-14 | ||
JPS5267567A (en) * | 1975-12-03 | 1977-06-04 | Hitachi Ltd | Test piece processing device of electronic microscope |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59137547U (en) * | 1983-03-04 | 1984-09-13 | 株式会社アマダ | bending test equipment |
JPS6336260Y2 (en) * | 1983-03-04 | 1988-09-27 |
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