JPS5262479A - Prove device for measurement - Google Patents
Prove device for measurementInfo
- Publication number
- JPS5262479A JPS5262479A JP13820275A JP13820275A JPS5262479A JP S5262479 A JPS5262479 A JP S5262479A JP 13820275 A JP13820275 A JP 13820275A JP 13820275 A JP13820275 A JP 13820275A JP S5262479 A JPS5262479 A JP S5262479A
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- measured
- prove device
- prove
- promptness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 title abstract 2
- 239000012535 impurity Substances 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
- 239000000523 sample Substances 0.000 abstract 1
Landscapes
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13820275A JPS5262479A (en) | 1975-11-19 | 1975-11-19 | Prove device for measurement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13820275A JPS5262479A (en) | 1975-11-19 | 1975-11-19 | Prove device for measurement |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5262479A true JPS5262479A (en) | 1977-05-23 |
| JPS5525382B2 JPS5525382B2 (cs) | 1980-07-05 |
Family
ID=15216456
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13820275A Granted JPS5262479A (en) | 1975-11-19 | 1975-11-19 | Prove device for measurement |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5262479A (cs) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014503114A (ja) * | 2010-12-21 | 2014-02-06 | カプレス・アクティーゼルスカブ | 単一位置ホール効果測定 |
| US8907690B2 (en) | 2007-09-03 | 2014-12-09 | Capres A/S | Method of determining an electrical property of a test sample |
| JP2024109926A (ja) * | 2020-12-22 | 2024-08-14 | ユニークチップス合同会社 | 移動度測定装置 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4515150Y1 (cs) * | 1965-12-09 | 1970-06-25 |
-
1975
- 1975-11-19 JP JP13820275A patent/JPS5262479A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4515150Y1 (cs) * | 1965-12-09 | 1970-06-25 |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8907690B2 (en) | 2007-09-03 | 2014-12-09 | Capres A/S | Method of determining an electrical property of a test sample |
| JP2014503114A (ja) * | 2010-12-21 | 2014-02-06 | カプレス・アクティーゼルスカブ | 単一位置ホール効果測定 |
| JP2024109926A (ja) * | 2020-12-22 | 2024-08-14 | ユニークチップス合同会社 | 移動度測定装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5525382B2 (cs) | 1980-07-05 |
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