JPS5262479A - Prove device for measurement - Google Patents

Prove device for measurement

Info

Publication number
JPS5262479A
JPS5262479A JP13820275A JP13820275A JPS5262479A JP S5262479 A JPS5262479 A JP S5262479A JP 13820275 A JP13820275 A JP 13820275A JP 13820275 A JP13820275 A JP 13820275A JP S5262479 A JPS5262479 A JP S5262479A
Authority
JP
Japan
Prior art keywords
measurement
measured
prove device
prove
promptness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13820275A
Other languages
Japanese (ja)
Other versions
JPS5525382B2 (en
Inventor
Yutaka Hayashi
Kiyoko Nagai
Yasuo Tarui
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP13820275A priority Critical patent/JPS5262479A/en
Publication of JPS5262479A publication Critical patent/JPS5262479A/en
Publication of JPS5525382B2 publication Critical patent/JPS5525382B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: The captioned device which has current and voltage probes capable of measuring the carrier mobility and resistivity or sheet resistance and impurity concentration of the object to be measured of arbitrary geometry without fabricating the material to be measured and which is small in size, light in weight and is capable of performing measurement at high accuracy and promptness.
COPYRIGHT: (C)1977,JPO&Japio
JP13820275A 1975-11-19 1975-11-19 Prove device for measurement Granted JPS5262479A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13820275A JPS5262479A (en) 1975-11-19 1975-11-19 Prove device for measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13820275A JPS5262479A (en) 1975-11-19 1975-11-19 Prove device for measurement

Publications (2)

Publication Number Publication Date
JPS5262479A true JPS5262479A (en) 1977-05-23
JPS5525382B2 JPS5525382B2 (en) 1980-07-05

Family

ID=15216456

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13820275A Granted JPS5262479A (en) 1975-11-19 1975-11-19 Prove device for measurement

Country Status (1)

Country Link
JP (1) JPS5262479A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014503114A (en) * 2010-12-21 2014-02-06 カプレス・アクティーゼルスカブ Single-position Hall effect measurement
US8907690B2 (en) 2007-09-03 2014-12-09 Capres A/S Method of determining an electrical property of a test sample

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4515150Y1 (en) * 1965-12-09 1970-06-25

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4515150Y1 (en) * 1965-12-09 1970-06-25

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8907690B2 (en) 2007-09-03 2014-12-09 Capres A/S Method of determining an electrical property of a test sample
JP2014503114A (en) * 2010-12-21 2014-02-06 カプレス・アクティーゼルスカブ Single-position Hall effect measurement

Also Published As

Publication number Publication date
JPS5525382B2 (en) 1980-07-05

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