JPS52135270A - Testing apparatus for semiconductor elements - Google Patents

Testing apparatus for semiconductor elements

Info

Publication number
JPS52135270A
JPS52135270A JP5195476A JP5195476A JPS52135270A JP S52135270 A JPS52135270 A JP S52135270A JP 5195476 A JP5195476 A JP 5195476A JP 5195476 A JP5195476 A JP 5195476A JP S52135270 A JPS52135270 A JP S52135270A
Authority
JP
Japan
Prior art keywords
semiconductor elements
testing apparatus
measuring
measureing
thyristor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5195476A
Other languages
Japanese (ja)
Inventor
Ihei Sugimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP5195476A priority Critical patent/JPS52135270A/en
Publication of JPS52135270A publication Critical patent/JPS52135270A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To reduce the time of measureing saturated current in a reverse direction by firing a thyristor and inverting the polarity of measuring voltage with a relay only when the current flowing in a measuring specimen is above a predetermined value.
COPYRIGHT: (C)1977,JPO&Japio
JP5195476A 1976-05-06 1976-05-06 Testing apparatus for semiconductor elements Pending JPS52135270A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5195476A JPS52135270A (en) 1976-05-06 1976-05-06 Testing apparatus for semiconductor elements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5195476A JPS52135270A (en) 1976-05-06 1976-05-06 Testing apparatus for semiconductor elements

Publications (1)

Publication Number Publication Date
JPS52135270A true JPS52135270A (en) 1977-11-12

Family

ID=12901258

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5195476A Pending JPS52135270A (en) 1976-05-06 1976-05-06 Testing apparatus for semiconductor elements

Country Status (1)

Country Link
JP (1) JPS52135270A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61118670A (en) * 1984-11-14 1986-06-05 Rohm Co Ltd Method for measuring polarized semiconductor element

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4859332A (en) * 1971-11-29 1973-08-20

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4859332A (en) * 1971-11-29 1973-08-20

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61118670A (en) * 1984-11-14 1986-06-05 Rohm Co Ltd Method for measuring polarized semiconductor element

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