JPS52135270A - Testing apparatus for semiconductor elements - Google Patents
Testing apparatus for semiconductor elementsInfo
- Publication number
- JPS52135270A JPS52135270A JP5195476A JP5195476A JPS52135270A JP S52135270 A JPS52135270 A JP S52135270A JP 5195476 A JP5195476 A JP 5195476A JP 5195476 A JP5195476 A JP 5195476A JP S52135270 A JPS52135270 A JP S52135270A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor elements
- testing apparatus
- measuring
- measureing
- thyristor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: To reduce the time of measureing saturated current in a reverse direction by firing a thyristor and inverting the polarity of measuring voltage with a relay only when the current flowing in a measuring specimen is above a predetermined value.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5195476A JPS52135270A (en) | 1976-05-06 | 1976-05-06 | Testing apparatus for semiconductor elements |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5195476A JPS52135270A (en) | 1976-05-06 | 1976-05-06 | Testing apparatus for semiconductor elements |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS52135270A true JPS52135270A (en) | 1977-11-12 |
Family
ID=12901258
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5195476A Pending JPS52135270A (en) | 1976-05-06 | 1976-05-06 | Testing apparatus for semiconductor elements |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS52135270A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61118670A (en) * | 1984-11-14 | 1986-06-05 | Rohm Co Ltd | Method for measuring polarized semiconductor element |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4859332A (en) * | 1971-11-29 | 1973-08-20 |
-
1976
- 1976-05-06 JP JP5195476A patent/JPS52135270A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4859332A (en) * | 1971-11-29 | 1973-08-20 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61118670A (en) * | 1984-11-14 | 1986-06-05 | Rohm Co Ltd | Method for measuring polarized semiconductor element |
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