JPS5258984A - Flaw detector - Google Patents

Flaw detector

Info

Publication number
JPS5258984A
JPS5258984A JP13470175A JP13470175A JPS5258984A JP S5258984 A JPS5258984 A JP S5258984A JP 13470175 A JP13470175 A JP 13470175A JP 13470175 A JP13470175 A JP 13470175A JP S5258984 A JPS5258984 A JP S5258984A
Authority
JP
Japan
Prior art keywords
examined
length
flaw detector
detection
section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13470175A
Other languages
Japanese (ja)
Other versions
JPS5528012B2 (en
Inventor
Yoshihisa Morioka
Chiaki Fukazawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP13470175A priority Critical patent/JPS5258984A/en
Publication of JPS5258984A publication Critical patent/JPS5258984A/en
Publication of JPS5528012B2 publication Critical patent/JPS5528012B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array

Abstract

PURPOSE:When flaws of a wide object to be examined is going to be examined by placing a plurality of flaw detectors, only the signals detected by the flaw detector whose detection section is assigned to the standard end part of the object to be examined is read out by shifting the number of bits corresponding to the length after subtracting the length of the object being examined within that section from the scanning length of the detection sections, whereby the easy detection is made possible.
JP13470175A 1975-11-11 1975-11-11 Flaw detector Granted JPS5258984A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13470175A JPS5258984A (en) 1975-11-11 1975-11-11 Flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13470175A JPS5258984A (en) 1975-11-11 1975-11-11 Flaw detector

Publications (2)

Publication Number Publication Date
JPS5258984A true JPS5258984A (en) 1977-05-14
JPS5528012B2 JPS5528012B2 (en) 1980-07-24

Family

ID=15134564

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13470175A Granted JPS5258984A (en) 1975-11-11 1975-11-11 Flaw detector

Country Status (1)

Country Link
JP (1) JPS5258984A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52150056A (en) * 1976-06-08 1977-12-13 Hitachi Shipbuilding Eng Co Method of multipoint detection using a plurality of detectors
JPS5657938A (en) * 1979-10-17 1981-05-20 Hitachi Ltd Oversight detector for object to be inspected

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5789906U (en) * 1980-11-21 1982-06-03

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52150056A (en) * 1976-06-08 1977-12-13 Hitachi Shipbuilding Eng Co Method of multipoint detection using a plurality of detectors
JPS5913079B2 (en) * 1976-06-08 1984-03-27 日立造船株式会社 Multi-point detection method using multiple detectors
JPS5657938A (en) * 1979-10-17 1981-05-20 Hitachi Ltd Oversight detector for object to be inspected

Also Published As

Publication number Publication date
JPS5528012B2 (en) 1980-07-24

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