JPS524283A - Method of detecting coated substance in jewel - Google Patents

Method of detecting coated substance in jewel

Info

Publication number
JPS524283A
JPS524283A JP50112471A JP11247175A JPS524283A JP S524283 A JPS524283 A JP S524283A JP 50112471 A JP50112471 A JP 50112471A JP 11247175 A JP11247175 A JP 11247175A JP S524283 A JPS524283 A JP S524283A
Authority
JP
Japan
Prior art keywords
jewel
coated substance
detecting
detecting coated
substance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50112471A
Other languages
English (en)
Japanese (ja)
Inventor
Kurausu Buriyutsuku Gerunooto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DEIHAKO DEIAMANTEN HANDERUSU CO ESUTABURISHIYUMEN
DIHACO DIAMANTEN HANDELS CO
Original Assignee
DEIHAKO DEIAMANTEN HANDERUSU CO ESUTABURISHIYUMEN
DIHACO DIAMANTEN HANDELS CO
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DEIHAKO DEIAMANTEN HANDERUSU CO ESUTABURISHIYUMEN, DIHACO DIAMANTEN HANDELS CO filed Critical DEIHAKO DEIAMANTEN HANDERUSU CO ESUTABURISHIYUMEN
Publication of JPS524283A publication Critical patent/JPS524283A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/87—Investigating jewels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP50112471A 1974-09-18 1975-09-17 Method of detecting coated substance in jewel Pending JPS524283A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19742444644 DE2444644A1 (de) 1974-09-18 1974-09-18 Verfahren und vorrichtung zur ermittlung und groessenbestimmung von einschluessen in edelsteinen

Publications (1)

Publication Number Publication Date
JPS524283A true JPS524283A (en) 1977-01-13

Family

ID=5926123

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50112471A Pending JPS524283A (en) 1974-09-18 1975-09-17 Method of detecting coated substance in jewel

Country Status (12)

Country Link
US (1) US4049350A (enExample)
JP (1) JPS524283A (enExample)
AT (1) AT354137B (enExample)
BE (1) BE833519A (enExample)
CA (1) CA1052885A (enExample)
CH (1) CH600330A5 (enExample)
DE (1) DE2444644A1 (enExample)
DK (1) DK412275A (enExample)
FR (1) FR2285609A1 (enExample)
GB (1) GB1519033A (enExample)
IL (1) IL48106A (enExample)
IT (1) IT1042392B (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53120587A (en) * 1977-03-30 1978-10-21 Matsushita Electric Ind Co Ltd Inspecting method and inspecting apparatus for striae of glass blocks
JPS5659647U (enExample) * 1979-10-12 1981-05-21
JPH03115949A (ja) * 1989-09-29 1991-05-16 Shimadzu Corp 粒度分布測定方法

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1566325A (en) * 1976-02-05 1980-04-30 Dihaco Diamanten Handels Co Process and apparatus for ascertaining data relating to the valuation of gems
JPS54109488A (en) * 1978-02-08 1979-08-28 Fuji Photo Optical Co Ltd Analyzing method and device of optically scattered image information
ZA79531B (en) * 1978-02-14 1980-02-27 De Beers Cons Mines Ltd Improvements in radiography
NL7810905A (nl) * 1978-11-02 1980-05-07 Skf Ind Trading & Dev Inspectie systeem voor beweegbare voorwerpen.
DE2855598A1 (de) * 1978-12-22 1980-07-03 Aeg Telefunken Kabelwerke Vorrichtung zur durchleuchtung und abbildung eines langgestreckten gebildes
DE3802535A1 (de) * 1987-05-21 1989-02-23 Sattler Hans Eberhard Vorrichtung zur betrachtung insbesondere von rohedelsteinen in einer immersionsfluessigkeit
US5463464A (en) * 1991-10-04 1995-10-31 Kms Fusion, Inc. Electro-optical system for gauging surface profile deviations using infrared radiation
US5416589A (en) * 1991-10-04 1995-05-16 Kms Fusion, Inc. Electro-optical system for gauging surface profile deviations
US5517575A (en) * 1991-10-04 1996-05-14 Ladewski; Theodore B. Methods of correcting optically generated errors in an electro-optical gauging system
US5465153A (en) * 1991-10-04 1995-11-07 Kms Fusion, Inc. Electro-optical system for gauging specular surface profile deviations
US5289267A (en) * 1991-10-04 1994-02-22 Kms Fusion, Inc. Electro-optical system for gauging surface profile deviations
FR2718232B1 (fr) * 1994-03-31 1996-05-24 Saint Gobain Vitrage Procédé et dispositif pour mesurer la qualité optique de la surface d'un objet transparent.
US5966673A (en) * 1997-01-10 1999-10-12 Diamond Technologies, Inc. System and method for computerized evaluation of gemstones
US6020954A (en) 1997-12-18 2000-02-01 Imagestatistics, Inc. Method and associated apparatus for the standardized grading of gemstones
US6980283B1 (en) 1997-12-18 2005-12-27 Imagestatistics, Inc. Method and associated apparatus for the standardized grading of gemstones
GB0017639D0 (en) * 2000-07-18 2000-09-06 Gersan Ets Instrument for examining a gemstone
FR2831031A1 (fr) * 2001-10-23 2003-04-25 Dji Design Article de bijouterie illuminable comportant une pierre transparente a la lumiere, et procede d'illumination de celle-ci
US7130037B1 (en) * 2003-01-09 2006-10-31 Kla-Tencor Technologies Corp. Systems for inspecting wafers and reticles with increased resolution
WO2005116617A1 (en) * 2004-05-21 2005-12-08 Corning Incorporated Apparatus and process for detecting inclusions
IL181484A0 (en) * 2007-02-21 2007-07-04 Haim Shlezinger A method for evaluation of a gemstone
DE102005039679A1 (de) * 2005-08-22 2007-03-08 Galatea Ltd. Verfahren zum Bestimmen des Wertes eines Objekts
US7800741B2 (en) * 2005-08-22 2010-09-21 Galatea Ltd. Method for evaluation of a gemstone
DE102007039630B3 (de) * 2007-08-22 2009-01-15 Ullrich Gmbh Verfahren und Vorrichtung zum Prüfen eines Prüfobjekts
BE1019409A5 (nl) 2010-07-07 2012-07-03 Octonus Finland Oy Verbeterde werkwijze voor het analyseren van een edelsteen.
EP2725348A1 (en) 2012-10-29 2014-04-30 Scientific Visual SARL Optical quality control device
WO2014203266A1 (en) 2013-06-18 2014-12-24 Arvindbhai Lavjibhai Patel Method and device for gemstone evolution
SG10201609555YA (en) * 2013-08-12 2017-01-27 Caratell Pte Ltd Method and system for certification and verification of gemstones
US11320370B2 (en) * 2019-06-26 2022-05-03 Open Water Internet Inc. Apparatus for directing optical and acoustic signals

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3609380A (en) * 1968-11-29 1971-09-28 Ppg Industries Inc Radiation sensitive defect scanner for transparent materials
US3586444A (en) * 1970-01-30 1971-06-22 American Optical Corp Striaescope for inspecting a transparent object submerged in a liquid having the same index of refraction
AT344419B (de) * 1973-03-20 1978-07-25 Dihaco Diamanten Handels Co Vorrichtung zur feststellung der bewertungsdaten von farbedelsteinen, insbesondere brillanten

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53120587A (en) * 1977-03-30 1978-10-21 Matsushita Electric Ind Co Ltd Inspecting method and inspecting apparatus for striae of glass blocks
JPS5659647U (enExample) * 1979-10-12 1981-05-21
JPH03115949A (ja) * 1989-09-29 1991-05-16 Shimadzu Corp 粒度分布測定方法

Also Published As

Publication number Publication date
DK412275A (da) 1976-03-19
GB1519033A (en) 1978-07-26
FR2285609A1 (fr) 1976-04-16
CH600330A5 (enExample) 1978-06-15
CA1052885A (en) 1979-04-17
IT1042392B (it) 1980-01-30
DE2444644A1 (de) 1976-04-08
ATA711575A (de) 1979-05-15
BE833519A (fr) 1976-01-16
IL48106A (en) 1978-08-31
US4049350A (en) 1977-09-20
AT354137B (de) 1979-12-27
FR2285609B1 (enExample) 1981-09-25
IL48106A0 (en) 1975-11-25

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