JPS522784A - Mass analyzing device - Google Patents

Mass analyzing device

Info

Publication number
JPS522784A
JPS522784A JP50079192A JP7919275A JPS522784A JP S522784 A JPS522784 A JP S522784A JP 50079192 A JP50079192 A JP 50079192A JP 7919275 A JP7919275 A JP 7919275A JP S522784 A JPS522784 A JP S522784A
Authority
JP
Japan
Prior art keywords
analyzing device
mass analyzing
mass
maintaining
range
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50079192A
Other languages
English (en)
Other versions
JPS5812984B2 (ja
Inventor
Hiroo Naito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP50079192A priority Critical patent/JPS5812984B2/ja
Priority to US05/698,316 priority patent/US4054796A/en
Priority to DE2628422A priority patent/DE2628422C3/de
Priority to GB26412/76A priority patent/GB1549219A/en
Publication of JPS522784A publication Critical patent/JPS522784A/ja
Publication of JPS5812984B2 publication Critical patent/JPS5812984B2/ja
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP50079192A 1975-06-24 1975-06-24 シツリヨウブンセキソウチ Expired JPS5812984B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP50079192A JPS5812984B2 (ja) 1975-06-24 1975-06-24 シツリヨウブンセキソウチ
US05/698,316 US4054796A (en) 1975-06-24 1976-06-22 Mass spectrometer with superimposed electric and magnetic fields
DE2628422A DE2628422C3 (de) 1975-06-24 1976-06-24 Verfahren zur Massenspektroskopie
GB26412/76A GB1549219A (en) 1975-06-24 1976-06-24 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50079192A JPS5812984B2 (ja) 1975-06-24 1975-06-24 シツリヨウブンセキソウチ

Publications (2)

Publication Number Publication Date
JPS522784A true JPS522784A (en) 1977-01-10
JPS5812984B2 JPS5812984B2 (ja) 1983-03-11

Family

ID=13683100

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50079192A Expired JPS5812984B2 (ja) 1975-06-24 1975-06-24 シツリヨウブンセキソウチ

Country Status (4)

Country Link
US (1) US4054796A (ja)
JP (1) JPS5812984B2 (ja)
DE (1) DE2628422C3 (ja)
GB (1) GB1549219A (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63231861A (ja) * 1987-03-19 1988-09-27 Jeol Ltd ウイーンフィルタ
JP2003532875A (ja) * 2000-05-08 2003-11-05 マス センサーズ、インコーポレイテッド 微小規模質量分析化学的ガス・センサ
JP2006278069A (ja) * 2005-03-28 2006-10-12 Jeol Ltd ウィーンフィルタ型エネルギーアナライザ及び放出電子顕微鏡
JP2018028989A (ja) * 2016-08-16 2018-02-22 樋口 哲夫 質量分析装置及び質量分析方法

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2133924B (en) * 1983-01-17 1986-08-06 Jeol Ltd Mass spectrometry
US4521687A (en) * 1983-01-17 1985-06-04 Jeol Ltd. Mass spectrometer
JPS614148A (ja) * 1984-06-19 1986-01-10 Jeol Ltd 重畳場質量分析装置の掃引方法
DE3813641A1 (de) * 1988-01-26 1989-08-03 Finnigan Mat Gmbh Doppelfokussierendes massenspektrometer und ms/ms-anordnung
DE3905631A1 (de) * 1989-02-23 1990-08-30 Finnigan Mat Gmbh Verfahren zur massenspektroskopischen untersuchung von isotopen sowie isotopenmassenspektrometer
US5723862A (en) * 1996-03-04 1998-03-03 Forman; Leon Mass spectrometer utilizing high energy product density permanent magnets
US6501074B1 (en) * 1999-10-19 2002-12-31 Regents Of The University Of Minnesota Double-focusing mass spectrometer apparatus and methods regarding same
US6831276B2 (en) * 2000-05-08 2004-12-14 Philip S. Berger Microscale mass spectrometric chemical-gas sensor
US6639227B1 (en) 2000-10-18 2003-10-28 Applied Materials, Inc. Apparatus and method for charged particle filtering and ion implantation
JP3855951B2 (ja) * 2002-05-17 2006-12-13 Ｊｆｅエンジニアリング株式会社 パイプラインの形状計測装置及び方法
RU2549367C1 (ru) * 2013-11-07 2015-04-27 Федеральное государственное унитарное предприятие "Всероссийский электротехнический институт имени В.И. Ленина" Масс-спектрометр
CN111146070B (zh) * 2019-12-25 2023-06-16 兰州空间技术物理研究所 一种小型高性能空间探测质谱计

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3816748A (en) * 1972-04-28 1974-06-11 Alpha Ind Inc Ion accelerator employing crossed-field selector
US3984682A (en) * 1974-07-12 1976-10-05 Nihon Denshi Kabushiki Kaisha Mass spectrometer with superimposed electric and magnetic fields

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63231861A (ja) * 1987-03-19 1988-09-27 Jeol Ltd ウイーンフィルタ
JP2003532875A (ja) * 2000-05-08 2003-11-05 マス センサーズ、インコーポレイテッド 微小規模質量分析化学的ガス・センサ
JP2006278069A (ja) * 2005-03-28 2006-10-12 Jeol Ltd ウィーンフィルタ型エネルギーアナライザ及び放出電子顕微鏡
JP2018028989A (ja) * 2016-08-16 2018-02-22 樋口 哲夫 質量分析装置及び質量分析方法

Also Published As

Publication number Publication date
JPS5812984B2 (ja) 1983-03-11
GB1549219A (en) 1979-08-01
DE2628422C3 (de) 1980-08-28
DE2628422A1 (de) 1977-05-26
DE2628422B2 (de) 1979-12-13
US4054796A (en) 1977-10-18

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