JPS51130287A - Method of electrically sensing marks or nonuniformity of color printed on polymer film or sheet or a paper and other defects or opacity - Google Patents

Method of electrically sensing marks or nonuniformity of color printed on polymer film or sheet or a paper and other defects or opacity

Info

Publication number
JPS51130287A
JPS51130287A JP5563475A JP5563475A JPS51130287A JP S51130287 A JPS51130287 A JP S51130287A JP 5563475 A JP5563475 A JP 5563475A JP 5563475 A JP5563475 A JP 5563475A JP S51130287 A JPS51130287 A JP S51130287A
Authority
JP
Japan
Prior art keywords
opacity
defects
nonuniformity
paper
sheet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5563475A
Other languages
Japanese (ja)
Inventor
Keiji Yamashita
Hirotami Yamashita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SANEI ENG KK
SANEI ENJINIARINGU KK
Original Assignee
SANEI ENG KK
SANEI ENJINIARINGU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SANEI ENG KK, SANEI ENJINIARINGU KK filed Critical SANEI ENG KK
Priority to JP5563475A priority Critical patent/JPS51130287A/en
Publication of JPS51130287A publication Critical patent/JPS51130287A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Abstract

PURPOSE:By following variation of opacity of the material to be tested without fail, reliable detection of marks and other defects becomes possible.
JP5563475A 1975-05-07 1975-05-07 Method of electrically sensing marks or nonuniformity of color printed on polymer film or sheet or a paper and other defects or opacity Pending JPS51130287A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5563475A JPS51130287A (en) 1975-05-07 1975-05-07 Method of electrically sensing marks or nonuniformity of color printed on polymer film or sheet or a paper and other defects or opacity

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5563475A JPS51130287A (en) 1975-05-07 1975-05-07 Method of electrically sensing marks or nonuniformity of color printed on polymer film or sheet or a paper and other defects or opacity

Publications (1)

Publication Number Publication Date
JPS51130287A true JPS51130287A (en) 1976-11-12

Family

ID=13004211

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5563475A Pending JPS51130287A (en) 1975-05-07 1975-05-07 Method of electrically sensing marks or nonuniformity of color printed on polymer film or sheet or a paper and other defects or opacity

Country Status (1)

Country Link
JP (1) JPS51130287A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6224348U (en) * 1985-07-29 1987-02-14
JP2015031613A (en) * 2013-08-02 2015-02-16 住友化学株式会社 Defect inspection system and film manufacturing device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6224348U (en) * 1985-07-29 1987-02-14
JP2015031613A (en) * 2013-08-02 2015-02-16 住友化学株式会社 Defect inspection system and film manufacturing device

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