JPS5063982A - - Google Patents

Info

Publication number
JPS5063982A
JPS5063982A JP49084047A JP8404774A JPS5063982A JP S5063982 A JPS5063982 A JP S5063982A JP 49084047 A JP49084047 A JP 49084047A JP 8404774 A JP8404774 A JP 8404774A JP S5063982 A JPS5063982 A JP S5063982A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP49084047A
Other languages
Japanese (ja)
Other versions
JPS5328222B2 (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5063982A publication Critical patent/JPS5063982A/ja
Publication of JPS5328222B2 publication Critical patent/JPS5328222B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP8404774A 1973-07-25 1974-07-22 Expired JPS5328222B2 (enrdf_load_stackoverflow)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US00382481A US3852594A (en) 1973-07-25 1973-07-25 X-ray diffraction apparatus

Publications (2)

Publication Number Publication Date
JPS5063982A true JPS5063982A (enrdf_load_stackoverflow) 1975-05-30
JPS5328222B2 JPS5328222B2 (enrdf_load_stackoverflow) 1978-08-12

Family

ID=23509145

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8404774A Expired JPS5328222B2 (enrdf_load_stackoverflow) 1973-07-25 1974-07-22

Country Status (4)

Country Link
US (1) US3852594A (enrdf_load_stackoverflow)
JP (1) JPS5328222B2 (enrdf_load_stackoverflow)
CA (1) CA1016669A (enrdf_load_stackoverflow)
GB (1) GB1473414A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7443952B2 (en) 2006-10-06 2008-10-28 Rigaku Corporation X-ray diffraction measurement method and X-ray diffraction apparatus
EP4036562A1 (en) 2021-01-29 2022-08-03 Rigaku Corporation X-ray analysis apparatus

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2748501C3 (de) * 1977-10-28 1985-05-30 Born, Eberhard, Dr. Verfahren und Vorrichtung zur Erstellung von Texturtopogrammen
JPS55112554A (en) * 1979-01-05 1980-08-30 Philips Corp Diffraction beam monochrometer assembly
US4322618A (en) * 1979-01-05 1982-03-30 North American Philips Corporation Diffracted beam monochromator
DE2907160C2 (de) * 1979-02-23 1986-09-25 Siemens AG, 1000 Berlin und 8000 München Röntgen-Pulverdiffraktometer
US4278883A (en) * 1979-12-27 1981-07-14 The United States Of America As Represented By The Secretary Of The Interior Sample mount for X-ray diffraction
NL8201343A (nl) * 1982-03-31 1983-10-17 Philips Nv Roentgen analyse apparaat met instelbare strooistralenspleet.
NL8300419A (nl) * 1983-02-04 1984-09-03 Philips Nv Roentgen analyse apparaat.
EP0137078B1 (en) * 1983-10-12 1989-01-25 Koninklijke Philips Electronics N.V. X-ray examination apparatus
NL8304009A (nl) * 1983-11-22 1985-06-17 Philips Nv Roentgen analyse apparaat met afbuigsysteem.
JPS6163370U (enrdf_load_stackoverflow) * 1984-09-28 1986-04-30
DE3439471A1 (de) * 1984-10-27 1986-04-30 MTU Motoren- und Turbinen-Union München GmbH, 8000 München Verfahren und vorrichtung zum pruefen einkristalliner gegenstaende
NL8903044A (nl) * 1989-12-12 1991-07-01 Philips Nv Roentgen analyse apparaat met een instelbaar spleetdiafragma.
US5008909A (en) * 1990-02-07 1991-04-16 The United States Of America As Represented By The Department Of Energy Diffractometer data collecting method and apparatus
SE502223C2 (sv) 1994-01-14 1995-09-18 Sandvik Ab Sätt och alster vid beläggning av ett skärande verktyg med ett aluminiumoxidskikt
JPH11502312A (ja) * 1996-01-12 1999-02-23 フィリップス エレクトロニクス エヌ ベー 回転可能な一次コリメータを含むｘ線分析装置
WO2004079754A1 (en) * 2003-02-28 2004-09-16 Osmic, Inc. X-ray optical system with adjustable convergence
EP1477795B1 (en) * 2003-05-14 2007-03-14 Bruker AXS GmbH X-ray diffractometer for grazing incidence diffraction of horizontally and vertically oriented samples
US7310410B2 (en) * 2004-07-28 2007-12-18 General Electric Co. Single-leaf X-ray collimator
JP4711430B2 (ja) * 2006-08-01 2011-06-29 株式会社リガク Ｘ線回折装置
EP3719484B1 (en) * 2019-04-04 2024-02-14 Malvern Panalytical B.V. X-ray beam shaping apparatus and method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1087219A (en) * 1965-07-22 1967-10-18 Jeol Ltd An x-ray diffraction goniometer

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3124681A (en) * 1964-03-10 Zingaro
DE1080320B (de) * 1954-04-09 1960-04-21 Siemens Ag Einrichtung zur Beugung von Roentgenstrahlen
NL113488C (enrdf_load_stackoverflow) * 1958-06-19
DE1472373B2 (de) * 1964-05-23 1970-02-26 Chirana Praha n.p., Prag Spindel, insbesondere für Röntgengo niomet er
US3411000A (en) * 1965-04-14 1968-11-12 Siemens Ag X-ray diffractometer diaphragm which is synchronously rotated with the specimen
FR1572651A (enrdf_load_stackoverflow) * 1967-06-19 1969-06-27

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1087219A (en) * 1965-07-22 1967-10-18 Jeol Ltd An x-ray diffraction goniometer

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7443952B2 (en) 2006-10-06 2008-10-28 Rigaku Corporation X-ray diffraction measurement method and X-ray diffraction apparatus
EP4036562A1 (en) 2021-01-29 2022-08-03 Rigaku Corporation X-ray analysis apparatus
US11808721B2 (en) 2021-01-29 2023-11-07 Rigaku Corporation X-ray analysis apparatus

Also Published As

Publication number Publication date
JPS5328222B2 (enrdf_load_stackoverflow) 1978-08-12
CA1016669A (en) 1977-08-30
AU7154374A (en) 1976-01-29
US3852594A (en) 1974-12-03
GB1473414A (en) 1977-05-11

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