NL113488C - - Google Patents

Info

Publication number
NL113488C
NL113488C NL113488DA NL113488C NL 113488 C NL113488 C NL 113488C NL 113488D A NL113488D A NL 113488DA NL 113488 C NL113488 C NL 113488C
Authority
NL
Netherlands
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of NL113488C publication Critical patent/NL113488C/xx

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/09Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Electron Beam Exposure (AREA)
NL113488D 1958-06-19 NL113488C (enrdf_load_stackoverflow)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CS881094X 1958-06-19

Publications (1)

Publication Number Publication Date
NL113488C true NL113488C (enrdf_load_stackoverflow)

Family

ID=5456498

Family Applications (1)

Application Number Title Priority Date Filing Date
NL113488D NL113488C (enrdf_load_stackoverflow) 1958-06-19

Country Status (4)

Country Link
US (1) US2993993A (enrdf_load_stackoverflow)
DE (1) DE1125566B (enrdf_load_stackoverflow)
GB (1) GB881094A (enrdf_load_stackoverflow)
NL (1) NL113488C (enrdf_load_stackoverflow)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL288034A (enrdf_load_stackoverflow) * 1962-01-23
DE1216454B (de) * 1962-05-15 1966-05-12 Siemens Ag Blendenanordnung zum Ausblenden bestimmter Strahlen aus dem Strahlengang von an der Pumpe arbeitenden Korpuskularstrahlgeraeten
US3333098A (en) * 1963-07-31 1967-07-25 Hitachi Ltd Aperture device for electron microscopes and the like
US3411000A (en) * 1965-04-14 1968-11-12 Siemens Ag X-ray diffractometer diaphragm which is synchronously rotated with the specimen
US3446960A (en) * 1965-08-30 1969-05-27 Nasa Device for measuring electron-beam intensities and for subjecting materials to electron irradiation in an electron microscope
US3852594A (en) * 1973-07-25 1974-12-03 Pepi Inc X-ray diffraction apparatus
US4466112A (en) * 1982-01-29 1984-08-14 Technicare Corporation Variable detector aperture
US4602377A (en) * 1984-03-30 1986-07-22 The United States Of America As Represented By The United States Department Of Energy Diamond-anvil high-pressure cell with improved X-ray collimation system
GB0320187D0 (en) * 2003-08-28 2003-10-01 Shimadzu Res Lab Europe Ltd Particle optical apparatus
DE102009028013B9 (de) * 2009-07-24 2014-04-17 Carl Zeiss Microscopy Gmbh Teilchenstrahlgerät mit einer Blendeneinheit und Verfahren zur Einstellung eines Strahlstroms in einem Teilchenstrahlgerät

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1386630A (en) * 1920-06-07 1921-08-09 Charles T Kinsman Bunsen burner
US2851610A (en) * 1954-09-08 1958-09-09 Akashi Kazuhiko Variable aperture for electron microscope

Also Published As

Publication number Publication date
GB881094A (en) 1961-11-01
DE1125566B (de) 1962-03-15
US2993993A (en) 1961-07-25

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