JPS502060B1 - - Google Patents

Info

Publication number
JPS502060B1
JPS502060B1 JP45005160A JP516070A JPS502060B1 JP S502060 B1 JPS502060 B1 JP S502060B1 JP 45005160 A JP45005160 A JP 45005160A JP 516070 A JP516070 A JP 516070A JP S502060 B1 JPS502060 B1 JP S502060B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP45005160A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS502060B1 publication Critical patent/JPS502060B1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • C—CHEMISTRY; METALLURGY
    • C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00—Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/30—Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
    • C04B2237/32—Ceramic
    • C04B2237/36—Non-oxidic
    • C04B2237/366—Aluminium nitride

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
JP45005160A 1969-01-22 1970-01-21 Pending JPS502060B1 (enrdf_load_stackoverflow)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19691903088 DE1903088A1 (de) 1969-01-22 1969-01-22 Kontaktvorrichtung

Publications (1)

Publication Number Publication Date
JPS502060B1 true JPS502060B1 (enrdf_load_stackoverflow) 1975-01-23

Family

ID=5723108

Family Applications (1)

Application Number Title Priority Date Filing Date
JP45005160A Pending JPS502060B1 (enrdf_load_stackoverflow) 1969-01-22 1970-01-21

Country Status (6)

Country Link
JP (1) JPS502060B1 (enrdf_load_stackoverflow)
AT (1) AT300955B (enrdf_load_stackoverflow)
DE (1) DE1903088A1 (enrdf_load_stackoverflow)
FR (1) FR2028879A1 (enrdf_load_stackoverflow)
GB (1) GB1255465A (enrdf_load_stackoverflow)
NL (1) NL143045B (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6430028U (enrdf_load_stackoverflow) * 1987-08-14 1989-02-23
WO2005045451A1 (ja) * 2003-11-05 2005-05-19 Nhk Spring Co., Ltd. 導電性接触子ホルダおよび導電性接触子ユニット

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2493671A1 (fr) * 1980-10-30 1982-05-07 Everett Charles Inc Decaleur de contacts, appareil d'essai muni d'un decaleur de contacts et procede de fabrication d'un decaleur de contacts
DE3108523A1 (de) * 1981-03-06 1982-09-23 Feinmetall Gmbh, 7033 Herrenberg Kontaktvorrichtung
DE3263256D1 (en) * 1981-07-08 1985-05-30 Fujitsu Ltd Device for testing semiconductor devices at a high temperature
DE3136896A1 (de) * 1981-09-17 1983-04-14 Ingun Prüfmittelbau GmbH & Co KG Elektronik, 7750 Konstanz Vorrichtung zum pruefen einer elektronischen leiterplatte
FR2547959B1 (fr) * 1983-06-23 1986-06-13 Laudren Cie Ets Dispositif de prise de test pour tete de cable
DE3421799A1 (de) * 1984-06-12 1985-12-12 Feinmetall Gmbh, 7033 Herrenberg Kontaktelement fuer pruefadapter
DE3844685C2 (de) * 1987-04-16 1995-05-18 Teradyne Inc Kontaktsonde
DE3722485A1 (de) * 1987-07-03 1989-01-12 Deutsche Telephonwerk Kabel Federnde kontaktnadel und kontaktiereinrichtung
EP0346737A3 (de) * 1988-06-13 1991-04-03 Siemens Aktiengesellschaft Dehnbares Nadelfeld
FI84948C (fi) * 1989-04-12 1992-02-10 Nokia Mobira Oy Ytkontaktdon foer radiofrekventa signaler.
FI89842C (fi) * 1989-04-12 1993-11-25 Nokia Mobira Oy Fjaedrande kontaktdon foer radiofrekventa signaler
JP4757531B2 (ja) * 2005-04-28 2011-08-24 日本発條株式会社 導電性接触子ホルダおよび導電性接触子ユニット

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6430028U (enrdf_load_stackoverflow) * 1987-08-14 1989-02-23
WO2005045451A1 (ja) * 2003-11-05 2005-05-19 Nhk Spring Co., Ltd. 導電性接触子ホルダおよび導電性接触子ユニット

Also Published As

Publication number Publication date
NL143045B (nl) 1974-08-15
DE1903088A1 (de) 1971-01-21
GB1255465A (en) 1971-12-01
NL7000860A (enrdf_load_stackoverflow) 1970-07-24
AT300955B (de) 1972-08-10
FR2028879A1 (enrdf_load_stackoverflow) 1970-10-16

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