JPS50147793A - - Google Patents
Info
- Publication number
- JPS50147793A JPS50147793A JP49055150A JP5515074A JPS50147793A JP S50147793 A JPS50147793 A JP S50147793A JP 49055150 A JP49055150 A JP 49055150A JP 5515074 A JP5515074 A JP 5515074A JP S50147793 A JPS50147793 A JP S50147793A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49055150A JPS5762016B2 (cg-RX-API-DMAC10.html) | 1974-05-17 | 1974-05-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49055150A JPS5762016B2 (cg-RX-API-DMAC10.html) | 1974-05-17 | 1974-05-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS50147793A true JPS50147793A (cg-RX-API-DMAC10.html) | 1975-11-27 |
| JPS5762016B2 JPS5762016B2 (cg-RX-API-DMAC10.html) | 1982-12-27 |
Family
ID=12990715
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP49055150A Expired JPS5762016B2 (cg-RX-API-DMAC10.html) | 1974-05-17 | 1974-05-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5762016B2 (cg-RX-API-DMAC10.html) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59181451A (ja) * | 1983-03-31 | 1984-10-15 | Jeol Ltd | 電子線エネルギ−分析装置を備えた電子顕微鏡 |
| JPH02216040A (ja) * | 1989-02-16 | 1990-08-28 | Nobuo Mikoshiba | 反射電子線回折装置 |
| JPH05296947A (ja) * | 1992-04-24 | 1993-11-12 | Japan Aviation Electron Ind Ltd | 電子線回折測定装置 |
| WO2017104186A1 (ja) * | 2015-12-14 | 2017-06-22 | 株式会社Ｔｓｌソリューションズ | Ｅｂｓｄ検出装置 |
-
1974
- 1974-05-17 JP JP49055150A patent/JPS5762016B2/ja not_active Expired
Non-Patent Citations (1)
| Title |
|---|
| ELECTRON PROBE MICROANALYSIS=1963 * |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59181451A (ja) * | 1983-03-31 | 1984-10-15 | Jeol Ltd | 電子線エネルギ−分析装置を備えた電子顕微鏡 |
| JPH02216040A (ja) * | 1989-02-16 | 1990-08-28 | Nobuo Mikoshiba | 反射電子線回折装置 |
| JPH05296947A (ja) * | 1992-04-24 | 1993-11-12 | Japan Aviation Electron Ind Ltd | 電子線回折測定装置 |
| WO2017104186A1 (ja) * | 2015-12-14 | 2017-06-22 | 株式会社Ｔｓｌソリューションズ | Ｅｂｓｄ検出装置 |
| JP2017110935A (ja) * | 2015-12-14 | 2017-06-22 | 株式会社Ｔｓｌソリューションズ | Ｅｂｓｄ検出装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5762016B2 (cg-RX-API-DMAC10.html) | 1982-12-27 |