JPS50147793A - - Google Patents

Info

Publication number
JPS50147793A
JPS50147793A JP49055150A JP5515074A JPS50147793A JP S50147793 A JPS50147793 A JP S50147793A JP 49055150 A JP49055150 A JP 49055150A JP 5515074 A JP5515074 A JP 5515074A JP S50147793 A JPS50147793 A JP S50147793A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP49055150A
Other versions
JPS5762016B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP49055150A priority Critical patent/JPS5762016B2/ja
Publication of JPS50147793A publication Critical patent/JPS50147793A/ja
Publication of JPS5762016B2 publication Critical patent/JPS5762016B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
JP49055150A 1974-05-17 1974-05-17 Expired JPS5762016B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP49055150A JPS5762016B2 (ja) 1974-05-17 1974-05-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP49055150A JPS5762016B2 (ja) 1974-05-17 1974-05-17

Publications (2)

Publication Number Publication Date
JPS50147793A true JPS50147793A (ja) 1975-11-27
JPS5762016B2 JPS5762016B2 (ja) 1982-12-27

Family

ID=12990715

Family Applications (1)

Application Number Title Priority Date Filing Date
JP49055150A Expired JPS5762016B2 (ja) 1974-05-17 1974-05-17

Country Status (1)

Country Link
JP (1) JPS5762016B2 (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59181451A (ja) * 1983-03-31 1984-10-15 Jeol Ltd 電子線エネルギ−分析装置を備えた電子顕微鏡
JPH02216040A (ja) * 1989-02-16 1990-08-28 Nobuo Mikoshiba 反射電子線回折装置
JPH05296947A (ja) * 1992-04-24 1993-11-12 Japan Aviation Electron Ind Ltd 電子線回折測定装置
JP2017110935A (ja) * 2015-12-14 2017-06-22 株式会社Tslソリューションズ Ebsd検出装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
ELECTRON PROBE MICROANALYSIS=1963 *

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59181451A (ja) * 1983-03-31 1984-10-15 Jeol Ltd 電子線エネルギ−分析装置を備えた電子顕微鏡
JPH0363175B2 (ja) * 1983-03-31 1991-09-30 Nippon Electron Optics Lab
JPH02216040A (ja) * 1989-02-16 1990-08-28 Nobuo Mikoshiba 反射電子線回折装置
JPH05296947A (ja) * 1992-04-24 1993-11-12 Japan Aviation Electron Ind Ltd 電子線回折測定装置
JP2017110935A (ja) * 2015-12-14 2017-06-22 株式会社Tslソリューションズ Ebsd検出装置
WO2017104186A1 (ja) * 2015-12-14 2017-06-22 株式会社Tslソリューションズ Ebsd検出装置

Also Published As

Publication number Publication date
JPS5762016B2 (ja) 1982-12-27

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