JPS5762016B2 - - Google Patents

Info

Publication number
JPS5762016B2
JPS5762016B2 JP49055150A JP5515074A JPS5762016B2 JP S5762016 B2 JPS5762016 B2 JP S5762016B2 JP 49055150 A JP49055150 A JP 49055150A JP 5515074 A JP5515074 A JP 5515074A JP S5762016 B2 JPS5762016 B2 JP S5762016B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP49055150A
Other versions
JPS50147793A (ja
Inventor
Hirotami Koike
Yasushi Kokubo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Denshi KK filed Critical Nihon Denshi KK
Priority to JP49055150A priority Critical patent/JPS5762016B2/ja
Publication of JPS50147793A publication Critical patent/JPS50147793A/ja
Publication of JPS5762016B2 publication Critical patent/JPS5762016B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
JP49055150A 1974-05-17 1974-05-17 Expired JPS5762016B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP49055150A JPS5762016B2 (ja) 1974-05-17 1974-05-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP49055150A JPS5762016B2 (ja) 1974-05-17 1974-05-17

Publications (2)

Publication Number Publication Date
JPS50147793A JPS50147793A (ja) 1975-11-27
JPS5762016B2 true JPS5762016B2 (ja) 1982-12-27

Family

ID=12990715

Family Applications (1)

Application Number Title Priority Date Filing Date
JP49055150A Expired JPS5762016B2 (ja) 1974-05-17 1974-05-17

Country Status (1)

Country Link
JP (1) JPS5762016B2 (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59181451A (ja) * 1983-03-31 1984-10-15 Jeol Ltd 電子線エネルギ−分析装置を備えた電子顕微鏡
JPH07117504B2 (ja) * 1989-02-16 1995-12-18 宣夫 御子柴 反射電子線回折装置
JPH05296947A (ja) * 1992-04-24 1993-11-12 Japan Aviation Electron Ind Ltd 電子線回折測定装置
JP6359002B2 (ja) * 2015-12-14 2018-07-18 株式会社Ｔｓｌソリューションズ Ｅｂｓｄ検出装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
ELECTRON PROBE MICROANALYSIS=1963 *

Also Published As

Publication number Publication date
JPS50147793A (ja) 1975-11-27

Similar Documents

Publication Publication Date Title
DE2408079C2 (ja)
FR2291276B1 (ja)
FR2267836A1 (ja)
FR2269848B3 (ja)
FR2280374B1 (ja)
JPS50135172A (ja)
JPS5762016B2 (ja)
JPS50105365A (ja)
JPS50129170U (ja)
FR2287429B1 (ja)
JPS50112527U (ja)
JPS50126971U (ja)
JPS50124433U (ja)
JPS50104271A (ja)
CS174557B1 (ja)
IN139960B (ja)
JPS50103734U (ja)
JPS50108781A (ja)
JPS50122071A (ja)
JPS50130773U (ja)
CS175091B1 (ja)
AR198841Q (ja)
CH577886A5 (ja)
CH570190A5 (ja)
CH577817A5 (ja)