JPS4973967A - - Google Patents
Info
- Publication number
- JPS4973967A JPS4973967A JP9563973A JP9563973A JPS4973967A JP S4973967 A JPS4973967 A JP S4973967A JP 9563973 A JP9563973 A JP 9563973A JP 9563973 A JP9563973 A JP 9563973A JP S4973967 A JPS4973967 A JP S4973967A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
- H01J37/073—Electron guns using field emission, photo emission, or secondary emission electron sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/02—Manufacture of electrodes or electrode systems
- H01J9/022—Manufacture of electrodes or electrode systems of cold cathodes
- H01J9/025—Manufacture of electrodes or electrode systems of cold cathodes of field emission cathodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/063—Electron sources
- H01J2237/06308—Thermionic sources
- H01J2237/06316—Schottky emission
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Cold Cathode And The Manufacture (AREA)
- Electron Sources, Ion Sources (AREA)
- Cathode-Ray Tubes And Fluorescent Screens For Display (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US00293322A US3817592A (en) | 1972-09-29 | 1972-09-29 | Method for reproducibly fabricating and using stable thermal-field emission cathodes |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4973967A true JPS4973967A (US07345094-20080318-C00003.png) | 1974-07-17 |
| JPS585496B2 JPS585496B2 (ja) | 1983-01-31 |
Family
ID=23128615
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP48095639A Expired JPS585496B2 (ja) | 1972-09-29 | 1973-08-25 | 安定な熱電界放出陰極を再生可能に製造する方法 |
Country Status (7)
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1019538A (ja) * | 1997-03-27 | 1998-01-23 | Hitachi Ltd | 電子ビーム欠陥検査方法および装置 |
| WO2024018570A1 (ja) * | 2022-07-20 | 2024-01-25 | 株式会社日立ハイテク | 荷電粒子源、荷電粒子銃、荷電粒子ビーム装置 |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3947716A (en) * | 1973-08-27 | 1976-03-30 | The United States Of America As Represented By The Secretary Of The Army | Field emission tip and process for making same |
| JPS5062766A (US07345094-20080318-C00003.png) * | 1973-10-05 | 1975-05-28 | ||
| US3919580A (en) * | 1974-09-11 | 1975-11-11 | Us Energy | Relativistic electron beam generator |
| US4324999A (en) * | 1980-04-30 | 1982-04-13 | Burroughs Corporation | Electron-beam cathode having a uniform emission pattern |
| US4486684A (en) * | 1981-05-26 | 1984-12-04 | International Business Machines Corporation | Single crystal lanthanum hexaboride electron beam emitter having high brightness |
| US4588928A (en) * | 1983-06-15 | 1986-05-13 | At&T Bell Laboratories | Electron emission system |
| JPS60225345A (ja) * | 1984-04-20 | 1985-11-09 | Hitachi Ltd | 電界放射方法およびそれに用いる電子線装置 |
| EP0287774A3 (de) * | 1987-04-24 | 1990-03-07 | Balzers Aktiengesellschaft | Thermionische Haarnadelkathode |
| US5012194A (en) * | 1989-09-05 | 1991-04-30 | Raytheon Company | Method testing electron discharge tubes |
| US5459296A (en) * | 1990-12-15 | 1995-10-17 | Sidmar N.V. | Method for the low-maintenance operation of an apparatus for producing a surface structure, and apparatus |
| FR2707795B1 (fr) * | 1993-07-12 | 1995-08-11 | Commissariat Energie Atomique | Perfectionnement à un procédé de fabrication d'une source d'électrons à micropointes. |
| FR2750785B1 (fr) * | 1996-07-02 | 1998-11-06 | Pixtech Sa | Procede de regeneration de micropointes d'un ecran plat de visualisation |
| US9159527B2 (en) * | 2003-10-16 | 2015-10-13 | Carl Zeiss Microscopy, Llc | Systems and methods for a gas field ionization source |
| JP2006059513A (ja) * | 2004-07-22 | 2006-03-02 | Kuresutetsuku:Kk | 電子ビーム照射装置および描画装置 |
| US7888654B2 (en) * | 2007-01-24 | 2011-02-15 | Fei Company | Cold field emitter |
| US8736170B1 (en) | 2011-02-22 | 2014-05-27 | Fei Company | Stable cold field emission electron source |
| CN102629538B (zh) | 2012-04-13 | 2014-03-19 | 吴江炀晟阴极材料有限公司 | 具有低逸出功和高化学稳定性的电极材料 |
| US9697983B1 (en) * | 2016-02-29 | 2017-07-04 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Thermal field emitter tip, electron beam device including a thermal field emitter tip and method for operating an electron beam device |
| US11887805B2 (en) | 2021-09-30 | 2024-01-30 | Fei Company | Filament-less electron source |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3374386A (en) * | 1964-11-02 | 1968-03-19 | Field Emission Corp | Field emission cathode having tungsten miller indices 100 plane coated with zirconium, hafnium or magnesium on oxygen binder |
| US3356887A (en) * | 1965-07-30 | 1967-12-05 | Frederick C W Heil | Fe cathode redesign |
-
1972
- 1972-09-29 US US00293322A patent/US3817592A/en not_active Expired - Lifetime
-
1973
- 1973-08-21 CA CA179,326A patent/CA1014602A/en not_active Expired
- 1973-08-21 FR FR7330310A patent/FR2201533B1/fr not_active Expired
- 1973-08-25 JP JP48095639A patent/JPS585496B2/ja not_active Expired
- 1973-09-06 DE DE19732345096 patent/DE2345096A1/de active Pending
- 1973-09-26 GB GB4508173A patent/GB1445695A/en not_active Expired
- 1973-09-28 NL NL7313420A patent/NL7313420A/xx not_active Application Discontinuation
Non-Patent Citations (1)
| Title |
|---|
| JOURNAL OF APPLIED PHYSICS=1972 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1019538A (ja) * | 1997-03-27 | 1998-01-23 | Hitachi Ltd | 電子ビーム欠陥検査方法および装置 |
| WO2024018570A1 (ja) * | 2022-07-20 | 2024-01-25 | 株式会社日立ハイテク | 荷電粒子源、荷電粒子銃、荷電粒子ビーム装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| GB1445695A (en) | 1976-08-11 |
| NL7313420A (US07345094-20080318-C00003.png) | 1974-04-02 |
| US3817592A (en) | 1974-06-18 |
| JPS585496B2 (ja) | 1983-01-31 |
| FR2201533B1 (US07345094-20080318-C00003.png) | 1977-05-13 |
| DE2345096A1 (de) | 1974-04-04 |
| CA1014602A (en) | 1977-07-26 |
| FR2201533A1 (US07345094-20080318-C00003.png) | 1974-04-26 |
