JPS4952547A - - Google Patents

Info

Publication number
JPS4952547A
JPS4952547A JP48051217A JP5121773A JPS4952547A JP S4952547 A JPS4952547 A JP S4952547A JP 48051217 A JP48051217 A JP 48051217A JP 5121773 A JP5121773 A JP 5121773A JP S4952547 A JPS4952547 A JP S4952547A
Authority
JP
Japan
Prior art keywords
state
sequence
variables
testing
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP48051217A
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4952547A publication Critical patent/JPS4952547A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318392—Generation of test inputs, e.g. test vectors, patterns or sequences for sequential circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP48051217A 1972-06-21 1973-05-10 Pending JPS4952547A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26503572A 1972-06-21 1972-06-21

Publications (1)

Publication Number Publication Date
JPS4952547A true JPS4952547A (de) 1974-05-22

Family

ID=23008681

Family Applications (1)

Application Number Title Priority Date Filing Date
JP48051217A Pending JPS4952547A (de) 1972-06-21 1973-05-10

Country Status (4)

Country Link
JP (1) JPS4952547A (de)
CA (1) CA990405A (de)
GB (1) GB1381413A (de)
IT (1) IT998133B (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4184630A (en) * 1978-06-19 1980-01-22 International Business Machines Corporation Verifying circuit operation
US4853928A (en) * 1987-08-28 1989-08-01 Hewlett-Packard Company Automatic test generator for logic devices
US5097468A (en) * 1988-05-03 1992-03-17 Digital Equipment Corporation Testing asynchronous processes
DE69333806T2 (de) * 1992-03-27 2005-10-06 Matsushita Electric Industrial Co., Ltd., Kadoma Verfahren und Gerät zur Prüfsequenzgenerierung

Also Published As

Publication number Publication date
IT998133B (it) 1976-01-20
GB1381413A (en) 1975-01-22
CA990405A (en) 1976-06-01

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