JPH1194750A - Method and apparatus for inspecting photoreceptor drum - Google Patents

Abstract

PROBLEM TO BE SOLVED: To properly inspect the cut stripe flaw ranging from the surface of a photoreceptor drum to the surface of a photoreceptor element pipe. SOLUTION: A photoreceptor drum inspection apparatus 10 is constituted so that laser beam LB is condensed to the surface of a photoreceptor drum 14 from the laser beam source 11 of an inspection heat 15 through a condensing lens 12 and the inspection head 15 and the photoreceptor drum 14 are relatively moved over the entire region in the axial direction of the photoreceptor drum 14 while the reflected laser beam LB from the surface of the photoreceptor drum 14 is allowed to be incident on the position detection element 13 at the position separated by a measuring distance L from the incident surface (w) of the laser beam LB. The presence and position of a cut stripe flaw are detected from the change of the incident position of the reflected laser beam LB to the position detection element 13. Therefore, the photoreceptor drum 14 can be inspected only by drawing the photoreceptor drum in an inspection process once after a photosensitive layer is applied to inspect the same and the production efficiency of the photoreceptor drum can be enhanced.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a photoreceptor drum inspection method and a photoreceptor drum inspection apparatus, and more particularly, to a photoreceptor for detecting a streak defect of a photoreceptor drum caused by a defective cutting of a photoreceptor tube. The present invention relates to a drum inspection method and a photosensitive drum inspection device.

[0002]

2. Description of the Related Art In general, a photosensitive drum is made by cutting and smoothing an aluminum pipe (photosensitive element pipe).
It is produced by coating a photoreceptor layer.

[0003] In order for this photosensitive drum to be appropriate, when the photosensitive drum before coating the photosensitive layer is cut,
It is necessary that the cut surface is smooth and that no cut streak defects are generated to the extent that it causes obstacles, and that the photoreceptor layer is coated smoothly without any scratches or protrusions.

A method and an apparatus for inspecting such a photosensitive drum or a photosensitive drum are required, and as an inspection method and an apparatus applicable as an inspection method for the photosensitive drum, for example, a photosensitive drum or the like is conventionally used. (See Japanese Patent Application Laid-Open No. 4-169840). This circumferential surface flaw inspection method and apparatus rotates the object to be inspected around its axis, projects light extending in the axial direction on its surface, and receives scattered light from the surface with a line sensor, A surface flaw inspection method for detecting surface flaws of the object to be inspected, wherein a ratio between a main scanning cycle determined by a readout cycle of a line sensor and a rotation cycle of the object to be inspected is compared with a ratio at the time of a horizontal line flaw inspection. It is characterized by being large. When this method is applied to the inspection of the photoconductor drum, projections on the surface of the photoconductor drum coated with the photoconductor layer,
Foreign matter, scratches or CGL layer (Charge
Generation layer (charge generation layer) can be inspected for color unevenness and the like.

[0005]

However, in such a conventional inspection method and apparatus, projections, foreign matter and scratches on the surface of the photosensitive drum or CG on the surface of the photosensitive drum are not known.
The color unevenness of the L layer is subject to the inspection, and these inspections can be performed. However, the unevenness of the photosensitive body tube itself such as a cut streak defect on the photosensitive body tube before the photosensitive layer coating is applied. It does not have sufficient inspection capability for the resulting photosensitive drum defects.

That is, as shown in FIG. 12, the photosensitive drum after coating the photosensitive layer has a UL layer (Under Layer: undercoat layer) 2 and a CG on the surface of a photosensitive drum 1 which is an aluminum pipe.
It has an L layer (Charge Generation Layer: charge generation layer) 3 and a CTL layer (Charge Transfer Layer: charge transport layer) 4, but if there is a cutting streak defect 5 in the photoreceptor tube before coating the photoreceptor layer. The unevenness of the surface of the photoreceptor drum due to the cutting streak defect 5 is more than a certain level. The cutting streak defect refers to a portion where a difference of more than a certain level is generated as compared with a normal portion due to uncut or excessively cut when the photoreceptor tube 1 is cut.

[0007] However, the above-mentioned conventional inspection method is intended to inspect for projections, foreign matter, scratches or color unevenness of the CGL layer on the surface of the photoreceptor drum. , But can be tested,
It does not have sufficient inspection capability for cutting streak defects of the photoconductor drum due to unevenness of the photoconductor tube itself, such as cutting streak defects on the photoconductor tube before coating the photoconductor layer. .

As a result, in order to obtain an appropriate photosensitive drum without large unevenness due to such a cut streak defect, conventionally, a photoreceptor tube was cut on a production line, and then the cut streak defect was inspected. After the inspection, the appearance is inspected for the presence or absence of cutting streak defects. If the inspection is passed, the apparatus is returned to the production line again to perform the photoconductor layer coating process. When the coating process is completed, the photoconductor drum after coating is pulled into the inspection device again to perform the appearance inspection.

As described above, conventionally, it is necessary to perform the inspection twice after cutting the photoconductor tube and after coating the photoconductor layer, and there has been a problem that the production efficiency is poor.

Therefore, according to the first aspect of the present invention, the surface of the photosensitive drum is irradiated with a laser beam from a laser light source via a condensing lens, and the reflected laser beam of the surface of the photosensitive drum is irradiated with the laser beam. While being incident on the position detecting means at a position separated by a predetermined measurement distance from the surface, the inspection head and the photosensitive drum integrated with the laser light source, the condensing lens and the position detecting means are relatively moved in the axial direction of the photosensitive drum, By detecting the presence and location of cutting streak defects based on the change in the incident position of the reflected laser beam on the position detection means of the inspection head, the inspection process can be performed twice before and after the photoconductor layer coating as before. Inspection of the photoconductor drum is performed only by pulling in the inspection process once after application of the photoconductor layer, without performing the inspection by pulling the photoconductor tube and the photoconductor drum. Bets can be, and its object is to provide a photosensitive drum inspection method capable of improving the production efficiency of the photosensitive drum.

According to a second aspect of the present invention, a laser beam is condensed from the laser light source of the inspection head to the surface of the photosensitive drum through a condenser lens, and the laser beam reflected from the surface of the photosensitive drum is converted into a laser beam by the photosensitive member. The inspection head and the photosensitive drum are moved relative to each other in the axial direction of the photosensitive drum while being incident on the position detecting means located at a predetermined measurement distance from the incident surface of the drum, and the incident position of the reflected laser beam on the position detecting means Detecting the presence and location of the cutting streak defect from the change of the photoconductor drum and the photoconductor drum in the inspection process twice before and after the application of the photoconductor layer as in the related art The inspection of the photosensitive drum can be performed only by pulling it into the inspection process once after the application of the photosensitive layer, thereby improving the production efficiency of the photosensitive drum. And its object is to provide a photosensitive drum test apparatus that.

According to a third aspect of the present invention, a position change signal corresponding to a change in the incident position of the reflected laser beam output from the position detecting means is subjected to an averaging process for removing a signal change appearing due to the cutting pitch. After performing averaging processing such as differential operation to emphasize the signal change caused by the cutting streak defect on the averaged position change signal, it compares it with a predetermined threshold level to detect the presence and position of the cutting streak defect The object of the present invention is to provide a photoreceptor drum inspection apparatus capable of more accurately inspecting a photoreceptor drum for a cutting streak defect without being affected by a signal change caused by a normal cutting streak of a photoreceptor tube. And

According to a fourth aspect of the present invention, a defect candidate area of a cutting streak defect is extracted based on a position change signal corresponding to a change in the incident position of the reflected laser beam output from the position detecting means. Based on the light amount signal corresponding to the incident light amount output from the position detecting means, the cutting streak defect and the scattering defect such as the projection are determined, and the presence or absence and the position of the cutting streak defect are detected. It is an object of the present invention to provide a photosensitive drum inspection apparatus capable of accurately distinguishing and detecting other scattering defects such as protrusions and scratches and detecting a streak defect of the photosensitive drum more accurately.

According to a fifth aspect of the present invention, the inspection head and the photosensitive drum are relatively rotated in the circumferential direction about the axial direction of the photosensitive drum, so that the photosensitive drum is exposed at a plurality of positions in the circumferential direction of the photosensitive drum. Inspection in the axial direction of the body drum,
Provided is a photoreceptor drum inspection apparatus that can reliably detect a cutting streak defect interrupted in the circumferential direction of a photoreceptor drum and more appropriately inspect a cutting streak defect of the photoreceptor drum.

According to a sixth aspect of the present invention, a plurality of inspection heads are arranged at predetermined angular intervals in the circumferential direction around the axial direction of the photosensitive drum, thereby simultaneously cutting at a plurality of locations in the circumferential direction of the photosensitive drum. Inspection of streak defects, cutting streak defects that are interrupted in the circumferential direction of the photosensitive drum,
Provided is a photoreceptor drum inspection apparatus that can detect a streak defect of a photoreceptor drum more appropriately and in a short time by detecting a short time and surely by one inspection.

[0016]

According to a first aspect of the present invention, there is provided a method for inspecting a photoreceptor drum, wherein a photoreceptor drum is coated with a photoreceptor layer after a surface of a photoreceptor tube is cut at a predetermined cutting pitch. A photosensitive drum inspection method for inspecting the presence and position of a cutting streak defect, irradiating a laser beam at a predetermined incident angle from a laser light source to a surface of the photosensitive drum via a condenser lens, Inspection that integrates the laser light source, the condenser lens, and the position detection unit while causing the reflected laser beam on the surface of the photosensitive drum to enter a position detection unit at a predetermined measurement distance from the incident surface of the laser beam. A head and the photosensitive drum are relatively moved in the axial direction of the photosensitive drum, and a change in an incident position of the reflected laser beam to the position detecting means of the inspection head is changed. By detecting the presence or absence and location of al the cutting streak defect have achieved the above objects.

According to the above configuration, the surface of the photosensitive drum is irradiated with a laser beam from the laser light source via the condenser lens, and the reflected laser beam of the laser beam on the surface of the photosensitive drum is irradiated from the laser beam incident surface to a predetermined position. The inspection head and the photosensitive drum, which integrate the laser light source, the condensing lens and the position detection means, are relatively moved in the axial direction of the photosensitive drum while being incident on the position detection means at a position apart from the measurement distance, and the position of the inspection head is Since the presence and position of the cutting streak defect are detected from the change of the incident position of the reflected laser beam to the detection means, the photoconductor tube and the photoconductor tube are subjected to the two inspection steps before and after the photoconductor layer coating as in the related art. Inspection of the photoconductor drum can be performed only by pulling in the inspection process once after coating the photoconductor layer without performing the inspection by pulling in the photoconductor drum. It is possible to improve the production efficiency of the ram.

According to a second aspect of the present invention, there is provided the photoconductor drum inspection apparatus, wherein after the surface of the photoconductor tube is cut at a predetermined pitch, the presence or absence of cut streak defects on the photoconductor drum surface coated with the photoconductor layer is determined. A photosensitive drum inspection device for inspecting a position,
A laser light source that emits a laser beam at a predetermined incident angle on the surface of the photoconductor drum, a condensing lens that condenses the laser beam emitted from the laser light source and irradiates the surface of the photoconductor drum with the laser, A position detecting means disposed at a position separated by a predetermined measurement distance from the incident surface of the photosensitive drum of the laser beam and having the reflected laser beam from the surface of the photosensitive drum of the laser beam incident thereon; The inspection head while converging the laser beam on the surface of the photosensitive drum from the laser light source through the condenser lens, and allowing the reflected laser beam from the surface of the photosensitive drum to enter the position detection unit. Moving the photosensitive drum relative to the photosensitive drum in the axial direction, and reflecting the reflected laser beam to the position detecting means; By detecting the position and presence of the cutting streak defects from the change of the incident position of the beam, it has achieved the above objects.

According to the above construction, the laser beam is condensed from the laser light source of the inspection head to the surface of the photosensitive drum through the condenser lens, and the laser beam reflected from the surface of the photosensitive drum is reflected on the photosensitive drum by the laser beam. The inspection head and the photosensitive drum are moved relative to each other in the axial direction of the photosensitive drum while being incident on the position detecting means at a predetermined measurement distance from the incident surface, and the incident position of the reflected laser beam on the position detecting means is changed. Since the presence and location of the cutting streak defect is detected from the conventional method, the photosensitive drum and the photosensitive drum are not inspected by pulling the photosensitive drum and the photosensitive drum in two inspection steps before and after the photosensitive layer coating as in the related art. The inspection of the photoconductor drum can be performed only by pulling it into the inspection process once after the application of the photoconductor layer, and the production efficiency of the photoconductor drum can be improved.

In this case, for example, as described in claim 3, the position detecting means outputs a position change signal corresponding to a change in the incident position of the reflected laser beam. An averaging process for removing a signal change caused by the cutting pitch from the position change signal of the position detecting means is performed, and a differential operation or the like for emphasizing a signal change caused by the cutting streak defect included in the averaged position change signal is performed. After the emphasizing process, a signal processing unit that detects the presence or absence and the position of the cutting streak defect by comparing with a predetermined threshold level may be further provided.

According to the above arrangement, the position change signal corresponding to the change in the incident position of the reflected laser beam output from the position detecting means is subjected to an averaging process for removing a signal change caused by the cutting pitch, and the averaging process is performed. Since the processed position change signal is subjected to an enhancement process such as a differential operation for enhancing a signal change appearing due to the cutting streak defect, the presence / absence and position of the cutting streak defect are detected by comparing with a predetermined threshold level. In addition, it is possible to more accurately inspect a cutting streak defect of the photosensitive drum without being affected by a signal change caused by a normal cutting streak of the photosensitive drum.

Further, for example, as described in claim 4, the position detecting means includes a position change signal corresponding to a change in the incident position of the reflected laser beam and an amount of incident light of the reflected laser beam to the position detecting means. Output a light amount signal corresponding to the position change signal, extract a defect candidate area of the cutting streak defect based on the position change signal, and detect the cutting streak defect and the protrusion based on the light amount signal of the position detection means in the defect candidate area. Signal processing means for determining the presence or absence and position of the cutting streak defect by determining the scattering defect such as the above.

According to the above arrangement, a defect candidate area of a cutting streak defect is extracted based on a position change signal corresponding to a change in the incident position of the reflected laser beam output from the position detection means, and the position is detected in the defect candidate area. A cutting streak defect and a scattering defect such as a protrusion are determined based on a light amount signal corresponding to an incident light amount output by the means, and the presence or absence and position of the cutting streak defect are detected. And other scattering defects can be accurately distinguished and detected, and the streak defects of the photosensitive drum can be more accurately inspected.

Further, for example, as set forth in claim 5, the photoconductor drum inspection device rotates the inspection head and the photoconductor drum relatively in the circumferential direction around the axial direction of the photoconductor drum. A rotating mechanism may be provided.

According to the above configuration, the inspection head and the photosensitive drum are relatively rotated in the circumferential direction around the axial direction of the photosensitive drum, so that the photosensitive drum can be rotated at a plurality of positions in the circumferential direction of the photosensitive drum. By performing the inspection in the axial direction, it is possible to reliably detect a cutting streak defect interrupted in the middle of the photosensitive drum in the circumferential direction, and it is possible to more appropriately inspect the cutting streak defect of the photosensitive drum.

Further, for example, a plurality of the inspection heads may be arranged at a predetermined angular interval in a circumferential direction around an axial direction of the photosensitive drum.

According to the above arrangement, a plurality of inspection heads are arranged at a predetermined angular interval in the circumferential direction around the axial direction of the photosensitive drum. By inspecting the defects, it is possible to detect the cutting streak defect interrupted in the circumferential direction of the photosensitive drum in a short time and surely by one inspection. Defects can be inspected more appropriately and in a shorter time.

[0028]

Preferred embodiments of the present invention will be described below in detail with reference to the accompanying drawings. It should be noted that the embodiments described below are preferred embodiments of the present invention, and therefore, various technically preferable limitations are added. However, the scope of the present invention is not limited to the following description. The embodiments are not limited to these embodiments unless otherwise specified.

FIGS. 1 to 3 show a first embodiment of a photosensitive drum inspection method and a photosensitive drum inspection apparatus according to the present invention. It corresponds to.

FIG. 1 is a schematic configuration diagram of a photosensitive drum inspection apparatus 10 to which a first embodiment of a photosensitive drum inspection method and a photosensitive drum inspection apparatus according to the present invention is applied.

In FIG. 1, a photosensitive drum inspection device 10
Is provided with a laser light source 11, a condenser lens 12, a position detector 13, and the like. The laser beam LB emitted from the laser light source 11 is condensed by the condenser lens 12 to a predetermined beam diameter, and the surface of the photosensitive drum 14 And the laser beam LB reflected from the photosensitive drum 14 is incident on the position detector 13. In addition to the above, the photosensitive drum inspection device 10 includes a signal processing unit (not shown) that processes the detection result of the position detector 13 to determine the presence or absence of a cutting streak defect.

The photoreceptor drum 14 is formed by coating a photoreceptor layer on the surface of a photoreceptor tube whose surface has been cut in a cutting step, and as shown in FIG. ,
It has a CGL layer 3 and a CTL layer 4. Each of the UL layer 2, the CGL layer 3, and the CTL layer 4 has a thickness of 3.5 μm.
(UL layer 2), 0.3 to 0.4 μm (CGL layer 3) and 30.5 μm (CTL layer 4). The surface cutting of the photoreceptor tube 1 is usually 0.2 mm to 0.25 m.
m (200 μm to 250 μm)
If a cutting streak defect occurs during this cutting, the pitch becomes larger than the cutting pitch of the normal portion and the depth becomes deeper, and this cutting streak defect appears on the surface after the photosensitive layer coating.

In the photoconductor drum inspection apparatus 10, the laser light source 11, the condenser lens 12, and the position detector 13 are attached as an inspection head 15 to a housing (not shown).
While being perpendicular to the surface of the photosensitive drum 14,
The photosensitive drum 14 is disposed so as to be located on a vertical plane perpendicular to the surfaces of the ends 14a and 14b.

The laser light source 11 is, for example, He-Ne
And a laser beam L at an angle at which the incident angle θ with respect to the surface of the photosensitive drum 14 becomes 30 degrees.
B is emitted.

The condenser lens 12 has, for example, a focal length of 5
A 0 mm convex lens is used, and the laser light source 11
The laser beam LB emitted from the photosensitive drum 14
The beam is condensed on the surface of the photosensitive drum 14 in a state where the diameter w of the incident beam on the surface becomes 62 μm.

The laser beam LB applied to the surface of the photosensitive drum 14 is reflected on the surface of the photosensitive drum 14 and is reflected toward the position detector 13.

As the position detector (position detecting means) 13, for example, a two-dimensional PSD (Position Sensitive Diode) is used, and a predetermined measuring distance L (L = 250 mm) from the incident position of the laser beam LB on the surface of the photosensitive drum 14 is used. ). As shown in FIG. 1, the position detector 13 detects two-dimensional position information in the X direction and the Y direction when a direction perpendicular to the surface of the position detector 13 is defined as a Z direction. That is, the two-dimensional PS as the position detector 13
D is composed of three layers in which a P layer is formed on the flat silicon surface, an N layer is formed on the back surface, and an I layer is formed in the middle. When the laser beam LB is incident, charges proportional to the light energy are generated at the incident position. . The generated charges are output as currents from two electrodes provided through the P layer (resistive layer) as a photocurrent. Since the resistance layer (P layer) is formed to have a uniform resistance value over the entire surface, the photocurrent is
The laser beam LB is divided and taken out in inverse proportion to the distance from the incident position of the laser beam LB to the two electrodes, that is, the resistance value. Therefore, the incident position of the laser beam LB is detected based on the current values output from the two electrodes, and the energy of the incident laser beam LB is detected based on the sum of the current values output from the two electrodes. can do. The position detector 13 outputs a position change output in the X direction and a position change output in the Y direction indicating the position information in the X direction and the Y direction, and outputs a light amount output corresponding to the light amount of the incident laser LB.

Next, the operation of the present embodiment will be described. In order to detect the cutting streak defect of the photoconductor drum 14 by the photoconductor drum inspection device 10, the cutting of the photosensitive drum is performed in the circumferential direction, and the generated cutting streak defect also occurs in the circumferential direction of the photoconductor drum 14. Therefore, the inspection head 15 and the photosensitive drum 1
The laser beam LB is irradiated from the laser light source 11 to the surface of the photosensitive drum 14 through the condenser lens 12 while relatively moving the laser beam 4 in the axial direction of the photosensitive drum 14. LB is detected by the position detector 13.

That is, the incident angle θ of the laser beam LB from the laser light source 11 of the photosensitive drum inspection device 10 to the photosensitive drum 14 is 30 degrees, and the laser beam L
The position detector 13 is determined based on the incident position of B on the photosensitive drum 14.
Is maintained at 250 mm, and the laser beam LB from the laser light source 11 to the photosensitive drum 14 is maintained.
And the reflection surface of the laser beam LB from the photosensitive drum 14 to the position detector 13 is perpendicular to the surface of the photosensitive drum 14 and the end surfaces 14a and 14b of the photosensitive drum 14
The photosensitive drum 14 and the inspection head 15 are moved relatively in the axial direction of the photosensitive drum 14 while maintaining a state perpendicular to the photosensitive drum 14. Reflected laser beam L
B is detected by the position detector 13.

In this case, the position change output of the position detector 13 is sampled in the axial direction of the photosensitive drum 14 at a sampling pitch of 1/2 or less of the cutting pitch, for example, a sampling pitch of 50 μm. That is,
As described above, the photoreceptor tube is usually cut by 200 μm
This is because the cutting streak defect appears at the same level of the cycle because the cutting is performed at ２５０250 μm.

In the photosensitive drum inspection apparatus 10 of the present embodiment, a two-dimensional PS is used as the position detector 13.
D, the X direction and the Y direction are used as shown in FIG.
When the direction is set, the output in the X direction of the position detector 13 in the axial direction of the photosensitive drum 14, ie, the cutting pitch direction, is as shown in FIG. FIG. 3 shows the position change output of the position detector 13, which is the direction, in the Y direction.

That is, as shown in FIG. 2, the position change output of the position detector 13 at the portion where the cutting streak is normal has a cycle of substantially the cutting pitch (200 μm, ie, 4 points). Although the waveform has an amplitude of about 0.8 V, both the cycle and the amplitude show a larger change in the cut streak defect portion than in the normal portion.

As shown in FIG. 3, the output of the position change of the position detector 13 in the Y direction does not show a large change in the period and amplitude in both the normal portion and the defective portion of the cutting streak.

Therefore, the presence or absence and position of a cutting streak defect can be detected from the position change output of the position detector 13 in the X direction.

As described above, the photosensitive drum inspection apparatus 10 of the present embodiment focuses the laser beam LB on the surface of the photosensitive drum 14 from the laser light source 11 of the inspection head 15 through the condenser lens 12, and The laser beam LB reflected from the surface of the drum 14 is
While being incident on the position detector 13 at a position away from the incident surface of the photosensitive drum 14 by the measurement distance L, the inspection head 15
And the photosensitive drum 14 are relatively moved in the axial direction of the photosensitive drum 14, and the reflected laser beam LB to the position detector 13 is
The presence / absence and position of the cutting streak defect are detected from the change in the incident position. Therefore, as in the prior art, the photosensitive element tube and the photosensitive drum 14 are subjected to two inspection steps before and after the application of the photosensitive layer.
The inspection of the photoconductor drum 14 can be performed only by pulling the photoconductor drum 14 into the inspection process after the photoconductor layer is applied and inspecting the photoconductor drum 14 without performing the inspection by drawing the photoconductor layer. To simplify the photosensitive drum 14
Cost can be reduced.

In the above embodiment, the case where a two-dimensional PSD is used as the position detector 13 has been described. However, the position detector 13 is not limited to the two-dimensional PSD, and as described above, The presence / absence and position of a cutting streak defect can be detected only by the X-direction position change output, so that a one-dimensional PSD can be used.
A CD (Charge Coupled Device) camera can also be used. When using the CCD camera, the surface of the photosensitive drum 14 is imaged by the CCD camera while the photosensitive drum 14 and the inspection head 15 are relatively moved in the axial direction of the photosensitive drum 14, and each of the captured images is taken. Calculates the position of the center of gravity of the reflected beam from, and examines the change in the position to detect a cutting streak defect.

The inspection head 15 is mounted on the photosensitive drum 1
4 and perpendicular to the surface of the photosensitive drum 1
Since it is arranged so as to be located on a vertical plane perpendicular to the surfaces of the end portions 14a and 14b of the fourth member 4, it is possible to accurately detect a cutting streak defect.

FIGS. 4 to 6 are views showing a second embodiment of a photosensitive drum inspection method and a photosensitive drum inspection apparatus according to the present invention. This embodiment corresponds to claim 3 of the present invention. It is.

The present embodiment is applied to a photosensitive drum inspection apparatus similar to the photosensitive drum inspection apparatus 10 of the first embodiment, and in the description of the present embodiment, A description will be given below using the reference numerals used in the photoconductor drum inspection apparatus 10 of the first embodiment as they are.

In the present embodiment, the position change output of the position detector 13 of the cut streak defect portion is emphasized to more reliably detect the cut streak defect.

That is, in the photosensitive drum inspection apparatus 10 of the present embodiment, as shown in FIG. 4, the signal processing section (signal processing means) outputs the position change output of the position detector 13 in the X direction. Only (Step S1), an averaging process is performed on the surrounding four points (Step S2), and then a difference between before and after is calculated (Step S3). The cutting streak defect is reliably detected in comparison with the threshold level (step S4).

That is, the signal processing unit extracts the X-direction position change output of the position detector 13 (step S).
1), averaging processing of four surrounding points is performed (step S2).
This is because the cycle of the cutting streak defect portion is longer than the cutting pitch of the normal portion, the amplitude is large, and the cycle (frequency) of the cutting streak defect portion and the cutting pitch of the normal portion are different. The average of 200 μm, which is the cutting pitch of the normal part, that is, the four points around the X-direction position change output of the position detector 13 is calculated, and the change in the signal appearing at the four points of the normal part cutting pitch is removed. That is, when averaging processing of four points around the X direction position change output of the position detector 13 is performed,
As shown in FIG. 5, it is possible to remove a change in the X-direction position change output of the position detector 13 which appears at four points of the cutting pitch of the normal portion while the signal change of the cutting streak defect portion is left.

In the averaging process of the four surrounding points, the X-direction position change output of the position detector 13 is subjected to FFT processing (Fourier transform processing) to remove the frequency component of the cutting pitch.
This can be performed by performing an inverse FFT process. That is, the averaging process of the surrounding four points is to perform a low-pass filter process on the position change output of the position detector 13 in the X direction.
The averaging process is not limited to the above method.

Next, the signal processing section includes the position detector 13
Of the X-direction position change, the signal of the cutting streak in the normal part is removed by averaging processing of four points around the output, and then the differential processing is performed to calculate the difference between the output and the position detector 13 due to the cutting streak defect. (Step S3). After averaging the position change output in the X direction of the position detector 13 in this way and calculating the difference before and after the differentiation processing, as shown in FIG. X of streak defect position detector 13
The direction change output can be emphasized, and a tilt component due to the inclination of the output of the position detector 13 when the inspection head 15 and the photosensitive drum 14 are relatively inclined can be removed.

Next, the signal processing section calculates the difference before and after the differential processing, and as shown in FIG. 6, converts the signal of the difference before and after the signal into a predetermined threshold level in the positive direction and a threshold level in the negative direction. A cutting streak defect is detected by comparing with a threshold level (step S4).

Therefore, it is possible to more reliably detect the presence and position of a cutting streak defect, and to detect the output of the position detector 13 when the inspection head 15 and the photosensitive drum 14 are relatively inclined. The tilt component due to the inclination is removed, and the presence / absence and position of the cutting streak defect are more reliably detected.

FIGS. 7 to 9 are views showing a third embodiment of a photosensitive drum inspection method and a photosensitive drum inspection apparatus according to the present invention. This embodiment corresponds to claim 4 of the present invention. It is.

The present embodiment is applied to a photosensitive drum inspection apparatus similar to the photosensitive drum inspection apparatus 10 of the first embodiment, and in the description of the present embodiment, A description will be given below using the reference numerals used in the photoconductor drum inspection apparatus 10 of the first embodiment as they are.

In the present embodiment, a candidate area of a cutting streak defect is detected from the position change output of the position detector 13 in the X direction.
The cutting streak defect and the scattering defect are distinguished from the output of the received light amount of the position detector 13, and the detection of the cutting streak defect is performed more reliably.

That is, in the photosensitive drum inspection apparatus 10 of the present embodiment, the signal processing unit detects the defect candidate area of the cutting streak defect from the position change output (particularly, the X direction position change output) of the position detector 13. Identify. Next, it is determined from the output of the received light amount of the position detector 13 in the defect candidate area of the cutting streak defect whether the defect is a cutting streak defect or a scattering defect.

That is, when there are no scattering defects such as protrusions and scratches on the photosensitive drum 14 but only cutting streak defects, the output of the received light amount of the position detector 13 is remarkable as shown in FIG. Does not show any significant changes. That is, the received light amount output of the position detector 13 does not show a remarkable change depending on the cutting streak defect.

However, when the photosensitive drum 14 has a scattering defect and a cutting streak defect, the position change output of the position detector 13, particularly the X direction position change output, is as shown in FIG. In both the part and the scattering defect, a change larger than that caused by a normal cutting streak occurs. This is because the light emitted from the laser light source 11 is
The incident laser beam LB condensed on the surface of the photoreceptor drum 14 is scattered by the scattering defect portion, and the position detector 1
This is because the position of incidence on 3 changes. As described above, when a scattering defect exists on the surface of the photoconductor drum 14, the incident laser beam LB is scattered, and thus the position detector 1
Although the reliability of the position detection by the position change output of No. 3 is lowered, as shown in FIG. 8, the signal change is similar to the signal change due to the cutting streak defect portion. The distinction between defects and scattering defects is not clear.

Therefore, in the photosensitive drum inspection apparatus 10, the signal processing section detects a defect candidate area of the cutting streak defect portion (in FIG. 8, the cutting streak defect portion and the scattering property) based on the position change output of the position detector 13. The defect in the defect candidate area is a cutting streak defect or a scattering defect by specifying the both of the defect portions and examining the output of the received light amount of the position detector 13 in the specified defect candidate area. Is determined.

That is, as shown in FIG. 9, when the defect in the defect candidate area is a cutting streak defect, the incident laser beam LB is not scattered, so that the received light amount output of the position detector 13 reaches a predetermined output level. However, when the defect in the defect candidate area is a scattering defect, the incident laser beam LB is scattered and the amount of received light decreases, so that the output of the received light amount of the position detector 13 does not reach an appropriate output level.

Therefore, the signal processing section of the photosensitive drum inspection apparatus 10 checks whether or not the output of the received light amount of the position detector 13 of the defect candidate area has reached a predetermined output level, thereby determining the defect candidate area. It is possible to determine whether the defect is a cutting streak defect or a scattering defect. If there is a scattering defect on the surface of the photoreceptor drum 14, the presence and position of the cutting streak defect are appropriately determined as the scattering defect. And can be detected more reliably.

FIG. 10 is a view showing a photosensitive drum inspection method and a photosensitive drum inspection apparatus according to a fourth embodiment of the present invention. This embodiment is also applicable to an inspection of a photosensitive drum in a circumferential direction. The inspection is performed to more appropriately inspect a cutting streak defect, and corresponds to claim 5.

In FIG. 10, the photosensitive drum inspection apparatus 20 includes an inspection head 21, a ball screw 22, a head rotation motor 23, a rotation chuck 24, a rotation jig 25, and a bearing 2.
6. Coupling 27 and photosensitive drum rotating motor 28
Etc. are provided.

The inspection head 21 is provided inside the housing 29 with the first
Laser light source 30 and condenser lens 3 similar to those of the embodiment.
1 and the position detecting element 32 are housed in the housing 29.
And is supported by the ball screw 22.

The ball screw 22 has a head rotation motor 23
, And is rotationally driven by a head rotation motor 23.

The inspection head 21 moves in the axial direction of the ball screw 22 while being supported by the ball screw 22 in accordance with the rotation direction of the ball screw 22 when the ball screw 22 is driven to rotate by the head rotation motor 23. For example, when the ball screw 22 is rotated in the direction shown by the arrow in FIG. 10, the inspection head 21 is moved in the axial direction of the ball screw 22 shown by the arrow in FIG.

The rotating chuck 24 and the rotating jig 25 hold both ends of the photosensitive drum 33 in the axial direction.
Are rotatably supported by bearings 26. The rotating jig 25 is connected to a rotating shaft of a photosensitive drum rotating motor 28 via a coupling 27. The photosensitive drum rotating motor 28 is connected via the coupling 27 in a direction indicated by an arrow in FIG. By rotating the rotary jig 25, the photosensitive drum 33 held between the rotary jig 25 and the rotary chuck 24 is rotated in the circumferential direction indicated by an arrow in FIG. The rotation chuck 24, the rotation jig 25, the bearing 26, the coupling 27, and the rotation motor 28 function as a rotation mechanism 34 as a whole.

The photosensitive drum inspection apparatus 20 of the present embodiment
Is to hold both ends of the photosensitive drum 33 to be inspected in the axial direction between the rotating chuck 24 and the rotating jig 25, and to stand still with a predetermined inspection surface facing the inspection head 21 side.

In this state, the inspection head 21 is positioned at one end of the photosensitive drum 33, for example, at the initial position of the left end in FIG. 10, and the head rotation motor 23 is rotated at a predetermined rotation speed. While moving the head 21 from the initial position to the other end of the photosensitive drum 33, for example, the right end in FIG. 10, the inspection head 21 detects the presence or absence and the position of the cutting streak defect of the photosensitive drum 33.

That is, the inspection head 21 emits the laser beam LB from the laser light source 30, and applies the laser beam LB to the surface of the photosensitive drum 33 by the condenser lens 31.
Focusing on the same incident beam diameter w as in the first embodiment,
Laser beam L reflected on the surface of photoconductor drum 33
B is incident on the position detecting element 32, and the position detecting element 32
The presence / absence and position of a cutting streak defect on the surface of the photoreceptor drum 33 are detected in the same manner as in each of the above-described embodiments using the output signal.

As described above, the laser beam is applied to the photosensitive drum 33 while the inspection head 21 is moved from the initial position.
When the surface is irradiated to complete the detection of the presence and position of the cutting streak defect over the entire area of the photosensitive drum 33 in the axial direction, the photosensitive drum inspection device 20
The photosensitive drum 33 is fixed by rotating the photosensitive drum 33 by a predetermined amount, for example, 1/4 turn, by rotating the photosensitive drum 8 by a predetermined amount.

In this state, the head rotation motor 23 is rotated in the direction opposite to the above, and the inspection head 21 is moved to the photosensitive drum 3.
3 while moving from the right end to the initial position.
As a result, the presence or absence and the position of the cutting streak defect of the photosensitive drum 33 are detected.

While moving the inspection head 21 to the initial position as described above, the laser beam is
When the surface is irradiated to complete the detection of the presence and position of the cutting streak defect over the entire area of the photosensitive drum 33 in the axial direction, the photosensitive drum inspection device 20 again rotates the photosensitive drum drum rotation motor 28 by a predetermined amount. And the photosensitive drum 33
Is further rotated by a predetermined amount, for example, 1/4 turn, and the rotation of the photosensitive drum rotation motor 28 is stopped at the position,
The photosensitive drum 33 is fixed.

In this state, as in the first inspection, the head rotation motor 23 is rotated to move the inspection head 21 from the initial position to the right end of the photosensitive drum 33. Detects the presence and position of cutting streak defects.

Further, as described above, the inspection head 21
When the surface of the photosensitive drum 33 is irradiated with a laser beam while moving from the initial position to complete the detection of the presence or absence and the position of the cutting streak defect over the entire axial direction of the photosensitive drum 33, the photosensitive drum inspection device 20 By rotating the photoconductor drum rotation motor 28 by a predetermined amount, the photoconductor drum 33 is rotated by a predetermined amount, for example, １ ／ rotation, and at this position, the rotation of the photoconductor drum rotation motor 28 is stopped. 33 is fixed.

In this state, the head rotation motor 23 is rotated in the opposite direction to the above, and the inspection head 21 is moved to the photosensitive drum 3
3 while moving from the right end to the initial position.
As a result, the presence or absence and the position of the cutting streak defect of the photosensitive drum 33 are detected.

As described above, １ ／ of the photosensitive drum 33
The photosensitive drum 3
When the presence / absence and position of the cutting streak defect are detected over the entire area in the axial direction of No. 3, the inspection processing is terminated.

As described above, the photoconductor drum inspection apparatus 20 of the present embodiment detects the presence or absence and position of the cutting streak defect over the entire area of the photoconductor drum 33 in the axial direction.
3 is rotated by １ ／ of a turn at four positions in the circumferential direction of the photosensitive drum 33, so that a cutting streak defect interrupted in the circumferential direction can be appropriately detected. That is, since the cutting streak defect generally exists over the entire circumferential direction of the photoconductor drum 33, the cutting streak defect is generated at any one position in the circumferential direction of the photoconductor drum 33 over the entire axial direction of the photoconductor drum 33. When the inspection is performed, the presence / absence and position of the cutting streak defect can be detected. However, among the cutting streak defects, there are cutting streak defects that do not occur continuously in the entire circumferential direction and are interrupted in the middle of the circumferential direction, for example, cutting streak defects that are set only for about half a circumference. Such a cutting streak defect that does not cover the entire circumference of the photosensitive drum 33 cannot be detected even if inspection of the cutting streak defect is performed only at one location in the circumferential direction of the photosensitive drum 33. . Therefore, in the present embodiment, the inspection of the cutting streak defect over the entire area in the axial direction of the photoconductor drum 33 is performed in one circumferential direction of the photoconductor drum 33.
Since the inspection is performed at four locations of 分 rotation, cutting streak defects that are interrupted in the middle of the photosensitive drum 33 can be surely outstanding.

In the present embodiment, the photosensitive drum 33 is rotated by 周 rotation to
The inspection of the cutting streak defect over the entire area of the photosensitive drum 33 in the axial direction is performed at the position of every 1/3 of the circumference of the photosensitive drum 33. The position is not limited to this and can be set as appropriate.
For example, a large number of cutting streak defects generated in an actual manufacturing line of the photosensitive drum 33 are collected, and the length of the shortest cutting streak defect among the collected cutting streak defects is determined.
A division position at which the shortest cutting streak defect can be detected is set.

In this embodiment, the photosensitive drum 33 is rotated so that the inspection position in the circumferential direction of the photosensitive drum 33 is opposed to the inspection head 21. Conversely, the inspection head 21 is The inspection head 21 and the photosensitive drum 33 may be moved in the circumferential direction of the drum 33.

Further, in the present embodiment, the inspection head 21 is moved in the axial direction of the photosensitive drum 33 to inspect the cutting streak defect over the entire area of the photosensitive drum 33 in the axial direction. The present invention is not limited to moving the photosensitive drum 33. For example, the inspection head 21 may be fixed and the photosensitive drum 33 may be moved in the axial direction. It may be moved in the axial direction.

FIG. 11 is a view showing a fifth embodiment of a photosensitive drum inspection method and a photosensitive drum inspection apparatus according to the present invention. In this embodiment, the photosensitive drum is inspected in the circumferential direction. Thus, the inspection of the cutting streak defect is performed more appropriately, and corresponds to claim 6.

In FIG. 11, the photoconductor drum inspection apparatus 40 has four inspection heads 41 to 44 arranged at intervals of 90 degrees in the circumferential direction of the photoconductor drum 45 by a holding mechanism (not shown). I have.

Although not shown, each of the inspection heads 41 to 44 includes a laser light source, a condenser lens, a position detecting element, and the like, and collects a laser beam emitted from the laser light source, as in the fourth embodiment. Photosensitive drum 4 with lens
The surface of the photoconductor drum 45 is irradiated with the reflected laser beam to irradiate the position detecting element, and the presence or absence and the position of the cutting streak defect on the surface of the photosensitive drum 45 are detected.

Inspection heads 41 to 44 and photosensitive drum 45
Are relatively movable in the axial direction of the photosensitive drum 45, and the inspection heads 41 to 44 and the photosensitive drum 4
The relative movement of 5 may be performed, for example, by attaching the inspection heads 41 to 44 to one holding mechanism and moving the inspection heads with the holding mechanism in the axial direction of the photosensitive drum 45, or by moving the photosensitive drum 45 in the axial direction. It may be performed by moving, or by moving both the inspection heads 41 to 44 and the photosensitive drum 45 in the axial direction of the photosensitive drum 45 and in directions opposite to each other.

The photosensitive drum inspection device 40 of the present embodiment
Position the inspection heads 41 to 44 at an initial position at one end of the photosensitive drum 45, and move the inspection heads 41 to 44 and the photosensitive drum 45 from the initial position in the axial direction of the photosensitive drum 45. While moving relatively, each inspection head 4
Inspection of the cutting streak defect of the photosensitive drum 45 by 1 to 44, and inspection over the entire axial direction of the photosensitive drum 45 up to the other end of the photosensitive drum 45, the cutting streaking defect of the photosensitive drum 45 The inspection of the presence or absence and the position is terminated.

Therefore, the four inspection heads 41 to 44
4 which is separated by 1/4 turn in the circumferential direction of the photosensitive drum 45
Inspection of a cutting streak defect can be performed in a single scan of a portion, and a cutting streak defect that breaks in the middle of the photosensitive drum 45 in the circumferential direction can be reliably detected in a short time.

In this embodiment, the four inspection heads 41 to 44 are moved 90 degrees in the circumferential direction of the photosensitive drum 45.
Although the inspection heads are arranged at intervals, the number and intervals of the inspection heads are not limited to the case of the present embodiment, and can be set as appropriate. For example, a large number of cutting streak defects generated in the actual production line of the photosensitive drum 45 are collected, and the shortest cutting streak defect is selected according to the length of the shortest cutting streak defect among the collected cutting streak defects. Are installed at necessary intervals at which the can be detected at intervals.

Although the invention made by the inventor has been specifically described based on the preferred embodiments, the present invention is not limited to the above-described embodiment, and various modifications can be made without departing from the gist of the invention. It goes without saying that it is possible.

In each of the above-described embodiments, the inspection for the cut streak defect on the surface of the photoreceptor drum after the coating of the photoreceptor layer is performed. Inspection can be performed.

[0095]

According to the method for inspecting a photosensitive drum according to the first aspect of the present invention, the surface of the photosensitive drum is irradiated with a laser beam from a laser light source via a condenser lens, and the surface of the photosensitive drum is irradiated with the laser beam. The inspection head and the photosensitive drum, which integrate the laser light source, the condensing lens, and the position detecting means, are incident on the photosensitive drum while the reflected laser beam is incident on the position detecting means at a predetermined measurement distance from the laser beam incident surface. Relative to the axial direction of the laser beam, and the presence or absence of a cutting streak defect is detected from the change in the incident position of the reflected laser beam to the position detection means of the inspection head. The photoconductor drum and the photoconductor drum are not pulled in for inspection in the subsequent two inspection steps, and the inspection is not performed. It can be inspected beam, thereby improving the production efficiency of the photosensitive drum.

According to the second aspect of the present invention, the laser beam is focused on the surface of the photosensitive drum from the laser light source of the inspection head through the condenser lens, and the laser beam reflected from the surface of the photosensitive drum is reflected. The inspection head and the photoconductor drum are moved relative to each other in the axial direction of the photoconductor drum while the beam is incident on the position detection device at a position separated by a predetermined measurement distance from the incident surface of the photoconductor drum of the laser beam. The presence and location of the cutting streak defect is detected from the change in the incident position of the reflected laser beam to the photoconductor layer. Inspection of the photosensitive drum can be performed only by pulling in the inspection process once after applying the photosensitive layer without performing the inspection by pulling in the drum,
The production efficiency of the photosensitive drum can be improved.

According to the photoreceptor drum inspection apparatus of the present invention, a signal change appearing due to the cutting pitch is removed from a position change signal corresponding to a change in the incident position of the reflected laser beam output from the position detecting means. After performing an averaging process such as a differential operation for enhancing the signal change caused by the cutting streak defect on the averaged position change signal, the cutting is performed by comparing with a predetermined threshold level. Since the presence / absence and position of the streak defect are detected, the cut streak defect of the photosensitive drum can be more accurately inspected without being affected by a signal change due to a normal cut streak of the photosensitive drum.

According to the photoreceptor drum inspection apparatus of the present invention, a defect candidate area of a cutting streak defect is extracted based on a position change signal corresponding to a change in the incident position of the reflected laser beam output from the position detecting means. Then, a cutting streak defect and a scattering defect such as a projection are determined based on a light amount signal corresponding to an incident light amount output from the position detection unit in the defect candidate region, and the presence or absence and position of the cutting streak defect are detected. Therefore, the cutting streak defect can be accurately distinguished and detected from other scattering defects such as protrusions and scratches, and the cutting streak defect of the photosensitive drum can be inspected more accurately.

According to the photosensitive drum inspection apparatus of the present invention, the inspection head and the photosensitive drum are relatively rotated in the circumferential direction around the axial direction of the photosensitive drum. Inspection in the axial direction of the photoconductor drum at a plurality of positions in the direction, the cutting streak defect interrupted in the middle of the circumferential direction of the photoconductor drum can be reliably detected, and the cutting streak defect of the photoconductor drum can be reliably detected. Can be more appropriately inspected.

According to the photoconductor drum inspection apparatus of the present invention, a plurality of inspection heads are arranged at a predetermined angular interval in the circumferential direction around the axial direction of the photoconductor drum. Inspection of cutting streak defects at multiple locations in the circumferential direction at the same time, and cutting streak defects interrupted in the circumferential direction of the photoreceptor drum can be performed in a single inspection in a short time.
In addition, it is possible to reliably detect, and it is possible to more appropriately and quickly inspect a cutting streak defect of the photosensitive drum.

[Brief description of the drawings]

FIG. 1 is a schematic configuration diagram of a photosensitive drum inspection apparatus to which a first embodiment of a photosensitive drum inspection method and a photosensitive drum inspection apparatus according to the present invention is applied.

FIG. 2 is a waveform diagram of an X-direction position change output of the position detecting element of FIG.

FIG. 3 is a waveform diagram of a Y-direction position change output of the position detection element of FIG.

FIG. 4 is a flowchart showing a procedure of signal processing of a position detecting element by the photosensitive drum inspection apparatus to which the second embodiment of the photosensitive drum inspection method and the photosensitive drum inspection apparatus according to the present invention is applied.

FIG. 5 is a signal waveform diagram obtained by a surrounding four-point averaging process of FIG. 4;

FIG. 6 is a diagram showing a signal waveform and a threshold level obtained by the difference processing of FIG. 4;

FIG. 7 shows a waveform of a received light amount output of a position detecting element of the photoconductor drum inspection apparatus to which the third embodiment of the photoconductor drum inspection method and the photoconductor drum inspection apparatus according to the present invention is applied, when there is no scattering defect. FIG.

FIG. 8 shows a photoconductor drum inspection method and a photoconductor drum inspection device according to a third embodiment of the present invention. FIG. 4 is a waveform diagram of an X-direction position change output of a detection element.

FIG. 9 shows a waveform of a light-receiving amount output of a position detection element of a photoconductor drum inspection apparatus to which a third embodiment of the photoconductor drum inspection method and the photoconductor drum inspection apparatus according to the present invention is applied when there is a scattering defect. FIG.

FIG. 10 is a front view of a photosensitive drum inspection apparatus to which a fourth embodiment of the photosensitive drum inspection method and the photosensitive drum inspection apparatus according to the present invention is applied.

FIG. 11 is a schematic side view of a photosensitive drum inspection apparatus to which a fifth embodiment of the photosensitive drum inspection method and the photosensitive drum inspection apparatus according to the present invention is applied.

FIG. 12 is an enlarged front sectional view of a surface portion of a photosensitive drum.

[Explanation of symbols]

 DESCRIPTION OF REFERENCE NUMERALS 1 photoconductor tube 2 UL layer 3 CGL layer 4 CTL layer 5 cutting streak defect portion 10 photoconductor drum inspection device 11 laser light source 12 condensing lens 13 position detection element 14 photoconductor drum 14a, 14b end face 15 inspection head 20 photoconductor Drum inspection device 21 Inspection head 22 Ball screw 23 Head rotation motor 24 Rotation chuck 25 Rotation jig 26 Bearing 27 Coupling 28 Photoconductor drum rotation motor 29 Housing 30 Laser light source 31 Condensing lens 32 Position detection element 33 Photoconductor drum 34 Rotation Mechanism 40 Photoconductor drum inspection device 41-44 Inspection head 45 Photoconductor drum

Claims (6)

[Claims] 1. A photosensitive drum inspection method for inspecting the presence or absence and position of a cutting streak defect of a photosensitive drum coated with a photosensitive layer after a surface of a photosensitive drum is cut at a predetermined cutting pitch. A laser beam is applied to the surface of the photosensitive drum from a laser light source through a condenser lens at a predetermined incident angle, and a reflected laser beam of the laser beam on the surface of the photosensitive drum is irradiated from the incident surface of the laser beam with a predetermined angle. While making it incident on the position detection means at a position away from the measurement distance,
The inspection head, which integrates the laser light source, the condenser lens, and the position detection means, and the photosensitive drum are relatively moved in the axial direction of the photosensitive drum, and the reflected laser is transmitted to the position detection means of the inspection head. A method for inspecting a photoreceptor drum, comprising detecting the presence and position of the cutting streak defect from a change in the incident position of the beam. 2. A photoreceptor drum inspection apparatus for inspecting the presence or absence and position of a cutting streak defect on a photoreceptor drum surface coated with a photoreceptor layer after a photoreceptor tube surface is cut at a predetermined pitch. A laser light source that emits a laser beam at a predetermined incident angle on the surface of the photoconductor drum, a condensing lens that condenses the laser beam emitted from the laser light source and irradiates the surface of the photoconductor drum, A position detection means disposed at a position separated by a predetermined measurement distance from a laser beam incident surface of the photoconductor drum, and a position detection means for receiving the reflected laser beam of the laser beam from the photoconductor drum surface. And condensing the laser beam from the laser light source through the condenser lens onto the surface of the photosensitive drum, and reflecting the laser beam from the surface of the photosensitive drum. The inspection head and the photosensitive drum are relatively moved in the axial direction of the photosensitive drum while the laser beam is incident on the position detecting means, and the cutting is performed based on a change in the incident position of the reflected laser beam on the position detecting means. A photoreceptor drum inspection device for detecting the presence and position of a streak defect. 3. The position detecting means outputs a position change signal corresponding to a change in the incident position of the reflected laser beam.
The photosensitive drum inspection apparatus performs an averaging process for removing a signal change appearing due to the cutting pitch from the position change signal of the position detecting unit, and the averaging process is performed by the cutting streak defect included in the averaged position change signal. The signal processing means further comprising signal processing means for detecting presence or absence and a position of the cutting streak defect by performing an enhancement process such as a differential operation for enhancing a signal change, and comparing with a predetermined threshold level. Item 3. A photoconductor drum inspection apparatus according to item 2. 4. The position detecting means outputs a position change signal corresponding to a change in the incident position of the reflected laser beam and a light amount signal corresponding to the amount of incident light of the reflected laser beam on the position detecting means. Extract a defect candidate area of the cutting streak defect based on the change signal, determine the cutting streak defect and scattering defects such as projections based on the light amount signal of the position detection means in the defect candidate area, 3. The photoconductor drum inspection apparatus according to claim 2, further comprising a signal processing unit for detecting the presence or absence and the position of the cutting streak defect. 5. The photoconductor drum inspection device according to claim 1, further comprising a rotation mechanism that relatively rotates the inspection head and the photoconductor drum in a circumferential direction around an axial direction of the photoconductor drum. The photoconductor drum inspection apparatus according to any one of claims 2 to 4, wherein 6. The inspection head according to claim 2, wherein a plurality of the inspection heads are arranged at predetermined angular intervals in a circumferential direction around an axial direction of the photosensitive drum. Photoconductor drum inspection equipment.