JPH1167718A - Cooling/heating apparatus for semiconductor processing solution - Google Patents

Cooling/heating apparatus for semiconductor processing solution

Info

Publication number
JPH1167718A
JPH1167718A JP22250897A JP22250897A JPH1167718A JP H1167718 A JPH1167718 A JP H1167718A JP 22250897 A JP22250897 A JP 22250897A JP 22250897 A JP22250897 A JP 22250897A JP H1167718 A JPH1167718 A JP H1167718A
Authority
JP
Japan
Prior art keywords
cooling
heating
heat exchange
semiconductor processing
processing liquid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22250897A
Other languages
Japanese (ja)
Other versions
JP3724763B2 (en
Inventor
Kenji Shimizu
健児 清水
Isakata Mori
勇鋼 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumco Techxiv Corp
Original Assignee
Sumco Techxiv Corp
Komatsu Electronic Metals Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumco Techxiv Corp, Komatsu Electronic Metals Co Ltd filed Critical Sumco Techxiv Corp
Priority to JP22250897A priority Critical patent/JP3724763B2/en
Publication of JPH1167718A publication Critical patent/JPH1167718A/en
Application granted granted Critical
Publication of JP3724763B2 publication Critical patent/JP3724763B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a cooling/heating apparatus which attains a cooling/heating chamber having high sealing ability, realize high heat transfer and lightweight and can easily increase its cooling/heating performance, even if the apparatus is subjected to repeated temperature cycles by cooling and heating and to plastic deformation over aging. SOLUTION: Sidewalls 1 of fluorine plastic are integrally formed, with each side wall bored cylindrically and heat exchange plates 2a, 2b, 12a and 12b are disposed opposite to one other with respect to the cylindrical bores, defining two cylindrical cooling/heating chambers 10 and 11. Each of the chambers 10 and 11 has a plurality of small cooling/heating chambers defined by one or more partition plates, flow holes communicating with the adjacent small chambers are made in the partition plates or the sidewalls 1, so that flow paths arranged in series and passing through all the small chambers are formed as being extended zigzag from a flow inlet hole to a flow outlet hole. Thereby cooling/heating performance can be increased higher in comparison with that when cooling/heating is carried out with only the single cooling/heating chamber 10. Disc springs 6 can change the pushing force and allowable expansion/contraction degree by suitably selecting the number of such springs and their mounting directions for ensuring the sealing ability of seals 9a, 9b, 19a and 19b.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、腐食性薬液等の半
導体処理液を冷却または加熱して該半導体処理液を温度
制御する半導体処理液用冷却加熱装置に関し、特に半導
体処理液の冷却加熱を効率的に行う半導体処理液冷却加
熱装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor processing liquid cooling / heating apparatus for cooling or heating a semiconductor processing liquid such as a corrosive chemical liquid to control the temperature of the semiconductor processing liquid. The present invention relates to a semiconductor processing liquid cooling / heating apparatus that performs the processing efficiently.

【0002】[0002]

【従来の技術】従来から、半導体処理液用冷却加熱装置
は、熱交換基板に半導体処理液を接触させ、この熱交換
基板を介して半導体処理液を冷却または加熱している。
すなわち、耐食性を有するフッ素樹脂からなる側部壁体
とこの側部壁体を介して対向配置される熱交換基板によ
って冷却加熱室を形成し、この冷却加熱室に流入する半
導体処理液が熱交換基板に接触することによって該半導
体処理液が冷却または加熱される。
2. Description of the Related Art Conventionally, a semiconductor processing liquid cooling / heating apparatus has brought a semiconductor processing liquid into contact with a heat exchange substrate and cooled or heated the semiconductor processing liquid via the heat exchange substrate.
That is, a cooling and heating chamber is formed by a side wall body made of a fluororesin having corrosion resistance and a heat exchange substrate disposed to face through the side wall body, and the semiconductor processing liquid flowing into the cooling and heating chamber is subjected to heat exchange. The semiconductor processing liquid is cooled or heated by contacting the substrate.

【0003】この熱交換基板としては、例えば半導体処
理液面側をアモルファスカーボン層で被覆したグラファ
イト基材で構成したものがある(特願平8−32059
号)。すなわち、この熱交換基板は、加工性の容易なグ
ラファイト基板を用い、このグラファイト基板表面に熱
処理を施すことにより、アモルファスカーボン層を形成
したもので、これによれば、ピンホールが少なく緻密
で、良好な鏡面を得ることができ、薬液やその蒸気を通
過させないという高信頼性を有し、Oリングを用いた気
密シールを容易にするとともに、極めて耐薬品性が高
く、パーティクルを生じないという利点がある。また、
熱交換基板が金属でないことから、化学薬品等により湿
式洗浄の他、気相洗浄法によって、高純度化処理が可能
であり、装置構成前に極めて高度の不純物除去を行うこ
とができ、冷却加熱時における半導体処理液に与える影
響を少なくしている。
As this heat exchange substrate, for example, there is a substrate formed of a graphite base material whose semiconductor processing liquid side is coated with an amorphous carbon layer (Japanese Patent Application No. 8-32059).
issue). In other words, this heat exchange substrate uses a graphite substrate that is easy to process, and is subjected to a heat treatment on the surface of the graphite substrate, thereby forming an amorphous carbon layer. Good mirror surface, high reliability not to allow chemicals and vapors to pass through, easy sealing with O-rings, extremely high chemical resistance, and no particle generation There is. Also,
Since the heat exchange substrate is not metal, high-purity treatment can be performed by wet cleaning with chemicals or the like, or gas phase cleaning method, and extremely high-level impurity removal can be performed before configuring the apparatus. The effect on the semiconductor processing liquid at the time is reduced.

【0004】[0004]

【発明が解決しようとする課題】ところで、従来の半導
体処理液用冷却加熱装置が熱交換基板として用いるアモ
ルファスカーボンは、別名ガラス状カーボンと呼ばれる
ように、硬いが脆く、この熱交換基板を補強する補強板
を熱交換基板にさらに重ねる必要があり、従来は、熱伝
導率の高いアルミニュームまたはアルミ合金等の金属材
を補強板として用いていた。
Amorphous carbon used as a heat exchange substrate by a conventional semiconductor processing solution cooling / heating apparatus is hard but brittle, also called glassy carbon, and reinforces the heat exchange substrate. It is necessary to further stack a reinforcing plate on the heat exchange substrate, and conventionally, a metal material such as aluminum or an aluminum alloy having high thermal conductivity has been used as the reinforcing plate.

【0005】しかし、熱交換基板としてのアモルファス
カーボンの熱膨張率は、アルミニュームまたはアルミ合
金等の金属材の熱膨張率と著しく異なるため、互いに接
着固定して取扱い時の強度を改善することができず、冷
却加熱時の温度変化で割れや剥がれを生じるおそれがあ
る。このため、熱交換基板と補強板との間には固着を避
けて熱伝導率の良好なグリースを介在させているが、熱
抵抗が小さくないので、これによる伝熱性能の低下は避
けられない。また、アモルファスカーボンやグラファイ
ト基材は、アルミニュームまたはアルミ合金等の金属材
に比べて熱伝導率が低いという難点があるので、伝熱性
能の損失を最小限に抑えるには、熱交換基板をできるだ
け薄くすることが望ましいが、機械的強度が弱くなると
いう問題があった。そのため、熱交換基板の機械的弱点
を補う補強板が必要となるが、従来の補強板は、アルミ
ニュームの展伸材が用いられ、軽量、高熱伝導性を確保
することができるものの、剛性の点で問題があり、補強
の目的として不十分であった。
However, the coefficient of thermal expansion of amorphous carbon as a heat exchange substrate is significantly different from the coefficient of thermal expansion of a metal material such as aluminum or an aluminum alloy. It may not be possible, and cracking or peeling may occur due to temperature changes during cooling and heating. For this reason, a grease with good thermal conductivity is interposed between the heat exchange substrate and the reinforcing plate to avoid sticking, but since the thermal resistance is not small, a decrease in heat transfer performance due to this is inevitable. . In addition, amorphous carbon or graphite base material has the disadvantage that its thermal conductivity is lower than that of metal materials such as aluminum or aluminum alloy.To minimize the loss of heat transfer performance, use a heat exchange substrate. Although it is desirable to make it as thin as possible, there is a problem that the mechanical strength becomes weak. For this reason, a reinforcing plate is needed to compensate for the mechanical weakness of the heat exchange board.However, the conventional reinforcing plate is made of wrought aluminum and can secure light weight and high thermal conductivity. There was a problem in that it was insufficient for reinforcement.

【0006】すなわち、補強板材質の縦弾性率が低いと
補強板としての剛性が小さく、シールリングの外周に設
けられた締め付けネジのトルクを高めていくと、シール
リングの内側の板面が外側に向かって凸状に湾曲し、ひ
いては補強されるべき熱交換基板を破損する危険がある
とともに、シール部での接触面圧の低下を招いてシール
性が低下するという問題点があった。
That is, when the longitudinal elastic modulus of the material of the reinforcing plate is low, the rigidity of the reinforcing plate is low, and when the torque of the tightening screw provided on the outer periphery of the seal ring is increased, the inner plate surface of the seal ring becomes outer. In addition, there is a problem that the heat-exchange board to be reinforced may be damaged in a convex shape toward the end, and the heat exchange substrate to be reinforced may be damaged.

【0007】さらに、冷却加熱体であるサーモモジュー
ルを補強板の外側に取り付ける際、補強板が湾曲するこ
とにより、サーモモジュールと補強板との間の接触圧に
むらが生じ、サーモモジュールの機械的破損や熱接触抵
抗の増大を招き、結果として装置全体の性能や信頼性の
低下を招くという問題点もあった。
Further, when the thermo module as the cooling / heating body is mounted on the outside of the reinforcing plate, the reinforcing plate is curved, so that the contact pressure between the thermo module and the reinforcing plate becomes uneven, and the mechanical strength of the thermo module is reduced. There is also a problem in that damage and an increase in thermal contact resistance are caused, and as a result, performance and reliability of the entire device are reduced.

【0008】一方、一般にシール材として用いられるエ
ラストマーは、成分物質を溶出して半導体処理液を汚染
する恐れがあることから、シール材としてのエラストマ
ーの使用は避け、フッ素樹脂をシール材として用いたい
が、フッ素樹脂そのものは、エラストマーのような弾力
性がなく、また塑性変形もし易い。このため、半導体処
理液との接触部分をフッ素樹脂とすべく断面がコの字型
のフッ素樹脂とこのコの字に包まれる部分をエラストマ
ーとする複合シール材が用いられている。
On the other hand, elastomers generally used as sealing materials may elute component substances and contaminate the semiconductor processing solution. Therefore, it is desirable to avoid using elastomers as sealing materials and to use fluororesin as sealing materials. However, the fluororesin itself does not have elasticity like an elastomer, and easily undergoes plastic deformation. For this reason, a composite sealing material having a U-shaped cross-section and an elastomer for the portion surrounded by the U-shape is used in order to make the contact portion with the semiconductor processing liquid a fluororesin.

【0009】しかしながら、シールリングを構成するフ
ッ素樹脂と側部壁体を構成するフッ素樹脂とは、冷却ま
たは加熱の温度サイクルや長期間の使用によりコールド
フローと呼ばれる塑性変形が生じ、この塑性変形による
寸法減少によってシール部での接触面圧が経時的に低下
し、結果的にシール性が低下するという問題点があっ
た。
However, the fluororesin forming the seal ring and the fluororesin forming the side wall body undergo a plastic deformation called cold flow due to a cooling or heating temperature cycle or long-term use, and the plastic deformation is caused by this plastic deformation. Due to the reduction in dimensions, the contact surface pressure at the seal portion decreases with time, resulting in a problem that the sealability deteriorates.

【0010】さらに、従来の半導体処理液冷却加熱装置
では、冷却加熱性能の向上の要求があるにもかかわら
ず、1つの冷却加熱室に対して対応配置された熱交換基
板を介して冷却加熱を行うことから、冷却加熱性能に限
界があるという問題点もあった。
Further, in the conventional semiconductor processing liquid cooling / heating apparatus, although there is a demand for improvement of the cooling / heating performance, the cooling / heating is performed via the heat exchange substrate corresponding to one cooling / heating chamber. There is also a problem that the cooling and heating performance is limited due to the performance.

【0011】そこで、本発明は、かかる問題点を除去
し、冷却加熱に伴う温度サイクルの繰り返しや経時的変
化に伴う塑性変形が生じても冷却加熱室の高いシール性
を維持し、高伝熱性能及び軽量化を達成し、さらに冷却
加熱性能を容易に倍増することができる半導体処理液用
冷却加熱装置を提供することを目的とする。
Therefore, the present invention eliminates such a problem, and maintains a high sealing property of the cooling and heating chamber even if plastic deformation occurs due to repetition of a temperature cycle accompanying cooling and heating or a change with time, thereby achieving high heat transfer. It is an object of the present invention to provide a cooling and heating apparatus for a semiconductor processing liquid, which can achieve performance and weight reduction and can easily double cooling and heating performance.

【0012】[0012]

【課題を解決するための手段】第1の発明は、フッ素樹
脂からなる側部壁体と該側部壁体を介して対向配置され
る第1及び第2の熱交換基板とで冷却加熱室を形成し、
該冷却加熱室は、シールリングを介して気密にシールさ
れ、前記第1及び第2の熱交換基板を補強する第1及び
第2の補強板を該第1及び第2の熱交換基板の外側に重
ねて取り付け、第1の補強板、第1の熱交換基板、側部
壁体、第2の熱交換基板及び第2の補強板を貫通する複
数の締め付けネジによって前記冷却加熱室のシーリング
を確実にし、入口孔を介して前記冷却加熱室に流入した
半導体処理液を前記熱交換基板に接触させて冷却または
加熱を行い、この冷却または加熱された半導体処理液を
出口孔を介して流出させる半導体処理液用冷却加熱装置
において、前記側部壁体、前記第1及び第2の熱交換基
板、前記第1及び第2の補強板のうち、少なくとも前記
側部壁体は、一体形成によって複数の冷却加熱室を形成
し、前記複数の冷却加熱室毎に、前記締め付けネジ及び
前記シールシングを含むシーリング構成を設け、各冷却
加熱室は、1以上の仕切板によって複数の冷却加熱小部
屋を形成するとともに、各冷却加熱小部屋は、前記側部
壁体及び前記仕切板に設けられた所定の流通孔によって
前記半導体処理液が前記入口孔から前記出口孔に至るま
での間を直列に流通接続されることを特徴とする。
According to a first aspect of the present invention, there is provided a cooling and heating chamber comprising a side wall made of fluororesin and first and second heat exchange substrates disposed to face each other via the side wall. To form
The cooling and heating chamber is hermetically sealed via a seal ring, and first and second reinforcing plates for reinforcing the first and second heat exchange substrates are provided outside the first and second heat exchange substrates. And sealing the cooling and heating chamber with a plurality of tightening screws penetrating the first reinforcing plate, the first heat exchange substrate, the side wall, the second heat exchange substrate, and the second reinforcing plate. The semiconductor processing liquid that has flowed into the cooling and heating chamber through the inlet hole is brought into contact with the heat exchange substrate to perform cooling or heating, and the cooled or heated semiconductor processing liquid flows out through the outlet hole. In the cooling and heating device for a semiconductor processing liquid, at least the side wall of the side wall, the first and second heat exchange substrates, and the first and second reinforcing plates is formed by integral formation. Forming a plurality of cooling chambers, For each heating chamber, a sealing configuration including the tightening screw and the sealing member is provided, and each cooling and heating chamber forms a plurality of cooling and heating chambers with one or more partition plates, and each of the cooling and heating chambers is The semiconductor processing liquid is serially connected between the inlet hole and the outlet hole by a predetermined flow hole provided in the side wall and the partition plate.

【0013】第2の発明は、第1の発明において、前記
第1及び第2の熱交換基板は、少なくとも半導体処理液
に接触する処理液接触面側をアモルファスカーボン層で
被覆したグラファイト基材であることを特徴とする。
According to a second aspect of the present invention, in the first aspect, the first and second heat exchange substrates are made of a graphite base material having at least a treatment liquid contacting surface contacting a semiconductor treatment liquid coated with an amorphous carbon layer. There is a feature.

【0014】第3の発明は、第1の発明において、前記
第1及び第2の熱交換基板は、アモルファスカーボン材
であることを特徴とする。
A third invention is characterized in that, in the first invention, the first and second heat exchange substrates are made of an amorphous carbon material.

【0015】第4の発明は、第2または第3の発明にお
いて、前記第1及び第2の補強板は、急冷凝固アルミ合
金粉末を原料とする粉末鍛造法によって成形焼結された
アルミ合金材であることを特徴とする。
According to a fourth aspect, in the second or third aspect, the first and second reinforcing plates are formed and sintered by a powder forging method using a rapidly solidified aluminum alloy powder as a raw material. It is characterized by being.

【0016】第5の発明は、第1から第4の発明におい
て、前記シールリングは、接液表面がフッ素樹脂で形成
され、各締め付けネジに対して複数枚の皿バネを重ね合
わせて併用し、前記複数枚の皿バネのうち隣接する皿バ
ネの少なくとも1箇所以上を逆向きに重ね合わせたこと
を特徴とする。
According to a fifth aspect of the present invention, in the first to fourth aspects, the seal ring has a liquid contact surface formed of a fluorine resin, and a plurality of disc springs are used in combination with each other for each tightening screw. At least one or more of adjacent disk springs of the plurality of disk springs are overlapped in the opposite direction.

【0017】[0017]

【発明の実施の形態】以下、図面を参照して本発明の実
施の形態について説明する。
Embodiments of the present invention will be described below with reference to the drawings.

【0018】図1は、本発明の実施の形態である半導体
処理液冷却加熱装置の平面図を示し、図2はその正面図
を示し、図3は、その右側面図を示す図である。
FIG. 1 is a plan view of a semiconductor processing liquid cooling and heating apparatus according to an embodiment of the present invention, FIG. 2 is a front view thereof, and FIG. 3 is a right side view thereof.

【0019】図1から図3に示す半導体処理液冷却加熱
装置は、中央部分が円筒状にくり貫かれた2つの冷却加
熱室10,11を形成し、フッ素樹脂で構成された側部
壁体1、この側部壁体1が形成する冷却加熱室10,1
1の両端面を覆うように対向配置され、少なくとも両端
面に接する表面がアモルファスカーボンで被覆されたグ
ラファイト基材からなる熱交換基板2a,2b,12
a,12b、急冷凝固アルミ合金粉末を原料とする粉末
鍛造法によって成形焼結されたアルミ合金材で構成さ
れ、熱交換基板2a,2b,12a,12bの外側に重
畳されて熱交換基板2a,2b,12a,12bを補強
する補強板3a,3b,13a,13bを有する。
The semiconductor processing liquid cooling and heating apparatus shown in FIGS. 1 to 3 has two cooling and heating chambers 10 and 11 whose central portions are hollowed out in a cylindrical shape, and a side wall made of fluororesin. 1. The cooling and heating chambers 10, 1 formed by the side wall bodies 1.
1, heat exchange substrates 2a, 2b, 12 made of a graphite base material, at least surfaces of which contact with both end surfaces are coated with amorphous carbon.
a, 12b, made of an aluminum alloy material formed and sintered by a powder forging method using a rapidly solidified aluminum alloy powder as a raw material, and superimposed on the outside of the heat exchange substrates 2a, 2b, 12a, 12b to overlap the heat exchange substrates 2a, 2b. It has reinforcing plates 3a, 3b, 13a, 13b for reinforcing 2b, 12a, 12b.

【0020】配管8は、図示しない処理容器からの半導
体処理液を冷却加熱室10に流入させ、配管7は、冷却
加熱室10からの半導体処理液を図示しない処理容器に
流出させる。また、後述するように、冷却加熱室10,
11は、1以上の仕切板によって複数の冷却加熱小部屋
を形成し、冷却加熱室10は、冷却加熱室11との間を
複数の流通孔を介して半導体処理液を直列に、かつ蛇行
させて流通させている。
The pipe 8 allows the semiconductor processing liquid from the processing vessel (not shown) to flow into the cooling and heating chamber 10, and the pipe 7 causes the semiconductor processing liquid from the cooling and heating chamber 10 to flow into the processing vessel (not shown). In addition, as described later, the cooling and heating chamber 10,
11 forms a plurality of cooling and heating chambers by one or more partition plates, and the cooling and heating chamber 10 makes the semiconductor processing liquid meander between the cooling and heating chamber 11 and the cooling and heating chamber 11 in series and through a plurality of flow holes. And distribute them.

【0021】一体形成された側部壁体1が形成する冷却
加熱室10,11の周囲で側部壁体1と熱交換基板2
a,2b12a,12bとの間には、それぞれ4つの環
状のシール部9a,9b,19a,19bが形成され
る。
The side wall 1 and the heat exchange board 2 are formed around the cooling and heating chambers 10 and 11 formed by the integrally formed side wall 1.
Four annular seal portions 9a, 9b, 19a, and 19b are formed between a and b, respectively.

【0022】さらに、シール部9a,9b,19a,1
9bの外周には、それぞれ補強板3a,13a、熱交換
基板2a,12a、側部壁体1、熱交換基板2b,12
b、補強板3b,13bを順次貫通する24本のネジ4
を有する。各ネジ4は、先端部分、すなわち補強板3
b,13b側にナット5が取り付けられて、ネジの頭と
ナット5との間の厚みを任意に調整することができ、ネ
ジ4の頭と補強板3a,13aとの間に複数の皿バネ6
が貫装され、この皿バネ6の押圧力とともに、補強板3
a,13a、熱交換基板2a,12a、側部壁体1、熱
交換基板2b,12b、及び補強板3b,13bからな
る2つのサンドウィッチ構造を圧接し、シール部9a,
9b,19a,19bのシールを確実にする。
Further, the sealing portions 9a, 9b, 19a, 1
9b, the reinforcing plates 3a and 13a, the heat exchange boards 2a and 12a, the side walls 1, and the heat exchange boards 2b and 12
b, 24 screws 4 sequentially penetrating the reinforcing plates 3b, 13b
Having. Each screw 4 has a tip portion, that is, a reinforcing plate 3.
The nut 5 is attached to the b, 13b side, the thickness between the head of the screw and the nut 5 can be adjusted arbitrarily, and a plurality of disc springs are provided between the head of the screw 4 and the reinforcing plates 3a, 13a. 6
And the pressing force of the disc spring 6 and the reinforcing plate 3
a, 13a, heat exchange boards 2a, 12a, side wall 1, heat exchange boards 2b, 12b, and reinforcing plates 3b, 13b.
Ensure the seal of 9b, 19a, 19b.

【0023】なお、補強板3a,3b,13a,13b
の外側には、図示しない4つのサーモモジュールがそれ
ぞれ取り付けられ、補強板3a,3b,13a,13b
及び熱交換基板2a,2b,12a,12bを介して冷
却加熱室10,11に対する熱の供給あるいは熱の吸収
が行われ、複数の孔s1,s2がサーモモジュールの取
り付けに利用される。また、サーモモジュールのさらに
外側には、図示しない放熱ブロックが取り付けられ、こ
の放熱ブロックには冷却水が供給されることにより、サ
ーモモジュールからの放熱が効率的に行われる。
The reinforcing plates 3a, 3b, 13a, 13b
, Four thermo modules (not shown) are attached to the outside, and reinforcing plates 3a, 3b, 13a, 13b
Heat is supplied or absorbed to the cooling and heating chambers 10 and 11 via the heat exchange boards 2a, 2b, 12a and 12b, and the plurality of holes s1 and s2 are used for mounting the thermo module. Further, a heat radiating block (not shown) is attached to the outside of the thermo module, and cooling water is supplied to the heat radiating block to efficiently radiate heat from the thermo module.

【0024】次に、図4に示す側部壁体1の平面図及び
図5に示す側部壁体1のA−A線断面図を参照して、側
部壁体1の詳細構成について説明する。
Next, the detailed configuration of the side wall 1 will be described with reference to a plan view of the side wall 1 shown in FIG. 4 and a cross-sectional view taken along line AA of the side wall 1 shown in FIG. I do.

【0025】冷却加熱室10,11は、それぞれ3つの
仕切板21〜23及び31〜33によって、さらにそれ
ぞれ4つの冷却加熱小部屋30a〜30d及び30e〜
30hに区切られ、合計8つの冷却加熱小部屋30a〜
30hが形成される。側部壁体1の一端面と冷却加熱室
10との間は、円筒状にくり貫かれた流入孔24と流出
孔25とが形成され、流入孔24は、配管8から小部屋
30aへの半導体処理液の流入を許容し、流出孔25
は、冷却加熱小部屋30dから配管7への半導体処理液
の流出を許容する。仕切板22は、側部壁体1の一端面
側に流入孔24及び流出孔25とほぼ同一の流通孔22
aを有し、仕切板31,33は、側部壁体1の一端面に
対向する面側に流入孔24及び流出孔25とほぼ同一の
流通孔31a,33aを有する。さらに、冷却加熱小部
屋30aと30eとの間、冷却加熱小部屋30bと30
fとの間、冷却加熱小部屋30cと30gとの間、及び
冷却加熱小部屋30dと30hとの間は、それぞれ流入
孔24及び流出孔25とほぼ同一の流通孔26〜29が
形成され、半導体処理液が流通できるように連通されて
いる。
The cooling and heating chambers 10 and 11 are further divided into four cooling and heating chambers 30a to 30d and 30e to 30e by three partition plates 21 to 23 and 31 to 33, respectively.
30h, divided into a total of eight cooling and heating chambers 30a-
30h are formed. Between one end surface of the side wall 1 and the cooling and heating chamber 10, an inflow hole 24 and an outflow hole 25 which are hollowed out in a cylindrical shape are formed, and the inflow hole 24 extends from the pipe 8 to the small room 30a. The semiconductor processing liquid is allowed to flow in, and the outflow holes 25 are formed.
Allows the semiconductor processing solution to flow from the cooling / heating small room 30d to the pipe 7. The partition plate 22 is provided on one end face side of the side wall 1 with the same flow hole 22 as the inflow hole 24 and the outflow hole 25.
a, and the partition plates 31, 33 have flow holes 31a, 33a substantially identical to the inflow hole 24 and the outflow hole 25 on the surface side facing one end surface of the side wall 1. Furthermore, between the cooling and heating small rooms 30a and 30e, and between the cooling and heating small rooms 30b and 30e.
f, between the cooling and heating compartments 30c and 30g, and between the cooling and heating compartments 30d and 30h, the flow holes 26 to 29, which are almost the same as the inflow hole 24 and the outflow hole 25, respectively, are formed, The semiconductor processing liquid is communicated so that it can be circulated.

【0026】この結果、図6に示すように、配管8から
流入した半導体処理液は、まず流入孔24を介して冷却
加熱小部屋30aに流入し、流通孔26→冷却加熱小部
屋30e→流通孔31a→冷却加熱小部屋30f→流通
孔27→冷却加熱小部屋30b→流通孔22a→冷却加
熱小部屋30c→流通孔28→冷却加熱小部屋30g→
流通孔33a→冷却加熱小部屋30h→流通孔29→冷
却加熱小部屋30dの順で流入し、最後に流出孔25を
介して配管7から流出される。
As a result, as shown in FIG. 6, the semiconductor processing liquid flowing from the pipe 8 first flows into the cooling and heating small room 30a through the inflow hole 24, and flows through the flow hole 26 → the cooling and heating small room 30e → the flow. Hole 31a → cooling and heating small room 30f → circulation hole 27 → cooling and heating small room 30b → circulation hole 22a → cooling and heating small room 30c → circulation hole 28 → cooling and heating small room 30g →
It flows in the order of the flow hole 33a → the cooling / heating small room 30h → the flow hole 29 → the cooling / heating small room 30d, and finally flows out of the pipe 7 through the outflow hole 25.

【0027】このようにして、冷却加熱小部屋30a〜
30hは、流入孔24から流出孔25までの間に配置さ
れる流通孔22a,31a,33a,26〜29によっ
て直列でかつ蛇行する流路を形成し、半導体処理液は、
この流路にしたがって全ての冷却加熱小部屋30a〜3
0hを直列に蛇行しながら流動する。
Thus, the cooling and heating small chambers 30a to 30a
30h forms a serial and meandering flow path by the flow holes 22a, 31a, 33a, 26 to 29 arranged between the inflow hole 24 and the outflow hole 25, and the semiconductor processing liquid is
According to this flow path, all the cooling / heating small rooms 30a-3
It flows while meandering 0h in series.

【0028】これにより、冷却加熱小部屋30a〜30
hに流入した半導体処理液は、冷却加熱室10,11の
上下端面に接触配置される熱交換基板2a,2b,12
a,12bと効率的に接触し、半導体処理液の冷却ある
いは加熱が効率的になされる。
Thus, the cooling and heating small rooms 30a to 30a
The semiconductor processing liquid flowing into the heat exchange substrates 2 a, 2 b, and 12 arranged in contact with the upper and lower end surfaces of the cooling and heating chambers 10 and 11, respectively.
a, 12b, so that the semiconductor processing liquid is efficiently cooled or heated.

【0029】ここで、従来の半導体処理液冷却加熱装置
は、1つの冷却加熱室10のみで半導体処理液の冷却加
熱を行っていたが、本発明の実施の形態では2つの冷却
加熱室10,11を有するため、約2倍の冷却加熱性能
を有することになる。なお、半導体処理液の冷却加熱
は、上述したように熱交換基板との接触伝熱によって行
われるが、この伝熱性能は、半導体処理液の流速によっ
ても著しく左右される。すなわち、半導体処理液の流速
が小さくなると伝熱性能は低下するので、制限される流
速が低下してしまうような設計は避けなければならな
い。例えば、複数の冷却加熱室同士が並列になるような
流路を形成すると、それぞれの冷却加熱室に対しては並
列の流路によって分割された流量の半導体処理液が流入
することになるので、たとえ2つの冷却加熱室を設けた
としても、流速の低下による伝熱性能の低下を免れるこ
とはできない。このため、本発明の実施の形態では、隣
接する冷却加熱小部屋30a〜30h間を側部壁体1内
に設けられた流通孔26〜29で連通させることによっ
て直列の流路を形成しており、各冷却加熱室の流速は1
つの冷却加熱室とした場合の流速と同じ流速となり、全
体の冷却加熱性能は、倍増する。このような冷却加熱室
を、3つ、4つというように、さらに直列接続させるこ
とにより、増加した冷却加熱室分に対応して冷却加熱性
能が増大することは容易に理解することができる。
Here, the conventional semiconductor processing liquid cooling and heating apparatus cools and heats the semiconductor processing liquid only in one cooling and heating chamber 10, but in the embodiment of the present invention, the two cooling and heating chambers 10, Since it has 11, it has about twice the cooling and heating performance. Note that the cooling and heating of the semiconductor processing liquid is performed by the contact heat transfer with the heat exchange substrate as described above, and the heat transfer performance is also significantly affected by the flow rate of the semiconductor processing liquid. That is, when the flow rate of the semiconductor processing liquid is reduced, the heat transfer performance is reduced. Therefore, it is necessary to avoid a design in which the restricted flow rate is reduced. For example, if a plurality of cooling and heating chambers are formed in parallel to form a flow path, a semiconductor processing liquid having a flow rate divided by the parallel flow path flows into each cooling and heating chamber. Even if two cooling and heating chambers are provided, a decrease in heat transfer performance due to a decrease in flow velocity cannot be avoided. For this reason, in the embodiment of the present invention, the adjacent cooling and heating small chambers 30a to 30h are communicated with the communication holes 26 to 29 provided in the side wall body 1 to form a serial flow path. Flow rate of each cooling and heating chamber is 1
The flow velocity is the same as that in the case of two cooling / heating chambers, and the overall cooling / heating performance is doubled. It can be easily understood that, by further connecting the cooling and heating chambers in series, such as three or four, the cooling and heating performance is increased corresponding to the increased number of the cooling and heating chambers.

【0030】なお、側部壁体1における流通孔26,2
9は、流入孔24、流出孔25の形成時に同時にドリル
加工によって形成され、流通孔27,28もドリル加工
によって形成されるが、この流通孔27,28の形成と
ともに、不必要な孔35,36が形成される。したがっ
て、孔35,36は、メクラ栓37,38によって半導
体処理液の流出を防いでいる。この場合、単にメクラ栓
37,38によって孔35,36を塞ぐのではなく、こ
のメクラ栓37,38を冷却加熱室10内への温度セン
サ取り付け口として利用することができる。ただし、側
部壁体1の形成方法によっては、孔35,36を生成し
ないで済むので、その場合はこの限りでない。
The through holes 26, 2 in the side wall 1
9 is formed by drilling at the same time when the inflow hole 24 and the outflow hole 25 are formed, and the through holes 27 and 28 are also formed by drilling. However, with the formation of the through holes 27 and 28, unnecessary holes 35 and 36 are formed. Therefore, the holes 35 and 36 prevent the semiconductor processing liquid from flowing out by the black plugs 37 and 38. In this case, instead of simply closing the holes 35 and 36 with the plugs 37 and 38, the plugs 37 and 38 can be used as a temperature sensor mounting port in the cooling and heating chamber 10. However, depending on the method of forming the side wall 1, the holes 35 and 36 do not need to be formed.

【0031】次に、シール部9は、冷却加熱室10,1
1の円形端面よりやや大きい環状形状をなし、側部壁体
1における熱交換基板2a,2b,12a,12bの接
触面側に配置される。側部壁体1には、予め環状のシー
ル部9a,9b19a,19bが装着されるように4つ
の環状の溝が形成される。
Next, the sealing portion 9 is provided in the cooling and heating chambers 10 and 1.
1 has a circular shape slightly larger than the circular end face, and is disposed on the side wall 1 on the contact surface side of the heat exchange boards 2a, 2b, 12a, 12b. Four annular grooves are formed in the side wall body 1 so that the annular seal portions 9a, 9b 19a, and 19b are mounted in advance.

【0032】図5のBは、シール部9bの拡大断面図を
示し、シール部9bは、その断面がコの字状をなすフッ
素樹脂41と、このコの字状に包まれた断面が角形のエ
ラストマー40とが複合されたものである。コの字状の
フッ素樹脂41は、熱交換基板2b側及び側部壁体1に
形成された溝の低面側に、それぞれ2つの同心円状の突
起42を有し、これによってシールを確実にしている。
また、これらの突起42間を結合するコの字状のフッ素
樹脂部分は、冷却加熱室10の中心部に向けられてお
り、半導体処理液のシールリングとの接触はフッ素樹脂
のみとなり、エラストマーとは接触しないことになる。
したがって、エラストマー40の成分物質が、冷却加熱
室10内の半導体処理液に溶出することもなく、これに
よる汚染もない。
FIG. 5B is an enlarged cross-sectional view of the seal portion 9b. The seal portion 9b has a U-shaped fluororesin 41 and a U-shaped cross-section. And the elastomer 40 are composited. The U-shaped fluororesin 41 has two concentric projections 42 on the heat exchange substrate 2b side and on the lower surface side of the groove formed in the side wall 1, respectively, thereby ensuring the seal. ing.
The U-shaped fluororesin portion connecting these projections 42 is directed toward the center of the cooling and heating chamber 10, and the semiconductor processing solution contacts the seal ring only with the fluororesin, and the elastomer and Will not contact.
Therefore, the component material of the elastomer 40 does not elute into the semiconductor processing liquid in the cooling and heating chamber 10 and there is no contamination due to this.

【0033】ここで、側部壁体1には、上述したネジ4
を貫通させる貫通孔39を有し、このネジ4とナット5
との間の厚み調整と皿バネ6の押圧とによってシール部
9a,9b,19a,19bのシールを確実にしてい
る。
Here, the side wall 1 has the screw 4
Screw 4 and nut 5
The thickness of the seal portions 9a, 9b, 19a, and 19b is reliably sealed by adjusting the thickness between the two and the pressing of the disc spring 6.

【0034】すなわち、図示しないサーモモジュールに
よる冷却あるいは加熱による温度サイクルあるいは長期
間の使用によって、シール部9a,9b,19a,19
bを構成するフッ素樹脂及び側部壁体1を構成するフッ
素樹脂は、いわゆるコールドフローを生じ、圧接方向の
寸法減少が生じ、シール部9a,9b,19a,19b
での接触面圧を低下させるが、皿バネ6の伸縮と押圧と
によって寸法減少分を吸収し、これによってシール部9
a,9b,19a,19bでのシール性の低下を防止す
る。
That is, the seal portions 9a, 9b, 19a, 19 are formed by a temperature cycle by cooling or heating by a thermo module (not shown) or by use for a long period of time.
The fluororesin constituting the b and the fluororesin constituting the side wall 1 cause a so-called cold flow, a reduction in dimension in the pressing direction, and the sealing portions 9a, 9b, 19a, 19b.
The contact surface pressure is reduced, but the expansion and contraction and pressing of the disc spring 6 absorb the reduction in dimension, and as a result, the sealing portion 9
a, 9b, 19a, and 19b are prevented from deteriorating the sealing performance.

【0035】皿バネ6の押圧は、皿バネ6の枚数あるい
は重ね方を適宜選択することによって簡単に調整するこ
とができる。例えば、皿バネ6全体の押圧力を高めるに
は、皿バネ6の向きを同一に多く配置することにより達
成することができ、皿バネ6の伸縮を増大して寸法減少
分を多く吸収するには、皿バネ6の向きを逆向きに多く
配置すればよい。図7(a)及び(b)には、8個の皿
バネを用いた場合の皿バネ配置例が示され、図7(a)
は、皿バネを1箇所のみ逆向きに配置し、図7(b)
は、皿バネを3箇所逆向きに配置している。皿バネを1
箇所のみ逆向きに配置した場合の方が、皿バネを3箇所
逆向きに配置した場合に比べて大きな押圧力を得ること
ができる。また、皿バネを3箇所逆向きに配置した場合
の方が、皿バネを1箇所のみ逆向きに配置した場合に比
べて、伸縮許容を大きく取ることができる。
The pressing of the disc springs 6 can be easily adjusted by appropriately selecting the number of disc springs 6 or the manner of stacking them. For example, it is possible to increase the pressing force of the entire disc spring 6 by arranging the same number of directions of the disc springs 6. In this case, the disc springs 6 may be arranged in many opposite directions. FIGS. 7A and 7B show examples of the arrangement of the disc springs when eight disc springs are used, and FIG.
In FIG. 7B, only one disc spring is arranged in the opposite direction.
Has three disc springs arranged in opposite directions. 1 disc spring
A larger pressing force can be obtained when only the portions are arranged in the opposite direction than when the disc springs are arranged in three opposite directions. In addition, when the disc springs are arranged in three opposite directions, the expansion and contraction allowance can be larger than when only one disc spring is arranged in the opposite direction.

【0036】このようにして押圧力及び伸縮許容を任意
に調整することができることは、シール性の安定確保の
他に、板厚寸法の制約や材質状の問題で機械的強度に難
点のある、アモルファスカーボン層で被覆したグラファ
イト基材や、アモルファスカーボン材を用いた熱交換基
板2a,2b,12a,12bを使用するときに、その
機械的強度を損なうことのないように、設計に応じて安
全かつ安定な熱交換基板あるいは補強板の取り付け、圧
接を行うことを可能にする。
The ability to arbitrarily adjust the pressing force and the allowable expansion and contraction in this way means that, besides ensuring the stability of sealing, there is a problem in mechanical strength due to restrictions on plate thickness dimensions and problems with the material. When using a graphite base material covered with an amorphous carbon layer or a heat exchange substrate 2a, 2b, 12a, 12b using an amorphous carbon material, it is safe to design according to the design so as not to impair the mechanical strength. In addition, it is possible to attach and press-fit a stable heat exchange board or reinforcing plate.

【0037】一方、補強板3a,3bは、急冷凝固アル
ミ合金粉末を原料とする粉末鍛造法によって成形焼結さ
れたアルミ合金材であるが、このアルミ合金材は、一般
に多用されるアルミニュームの展伸材や鋳造材の長所で
ある軽量、高熱伝導性を失わずに、短所である低い縦弾
性率を30〜60%も大幅に高めることができる。これ
により、補強板3a,3bは、板厚を増大しなくても十
分な縦弾性率を有し、シールリングの外周に設けられた
ネジによる押圧力を増大しても熱交換基板2a,2b,
12a,12bを破損することがない。また、補強板3
a,3b,13a,13bの板厚を増大しなくてもよい
ので、補強板3a,3b,13a,13bの熱容量を最
小限にでき、加熱冷却の応答速度を損なうこともなく、
小型軽量化を実現することができる。
On the other hand, the reinforcing plates 3a and 3b are aluminum alloy materials formed and sintered by a powder forging method using a rapidly solidified aluminum alloy powder as a raw material. The low longitudinal elastic modulus, which is a disadvantage, can be significantly increased by 30 to 60% without losing the advantages of lightweight and high thermal conductivity, which are advantages of wrought materials and cast materials. Thus, the reinforcing plates 3a and 3b have a sufficient longitudinal elastic modulus without increasing the plate thickness, and the heat exchange substrates 2a and 2b even when the pressing force of the screw provided on the outer periphery of the seal ring is increased. ,
12a and 12b are not damaged. Also, the reinforcing plate 3
Since it is not necessary to increase the thickness of the a, 3b, 13a, 13b, the heat capacity of the reinforcing plates 3a, 3b, 13a, 13b can be minimized, and the response speed of heating and cooling is not impaired.
A reduction in size and weight can be realized.

【0038】なお、上述した熱交換基板2a,2b,1
2a,12bの形成に際しては、アルカリ金属・重金属
含有率が5ppm以下の高純度のグラファイト基板を所
望の形状に加工したのち、表面を弗化水素ガスと反応さ
せ、金属元素等の不純物(汚染物)を弗化物として気化
させることにより、高純度化し、樹脂等を塗布した後、
所望の温度に加熱した反応装置内に設置し、熱処理によ
り樹脂中のカーボンをアモルファス化し、アモルファス
カーボン層を形成する。このように樹脂膜を形成した状
態で熱処理するようにすれば、基板表面の凹凸に樹脂が
含浸せしめられ平滑となった状態でアモルファス化がな
され、より平滑な表面状態を得ることができる。
The above-mentioned heat exchange boards 2a, 2b, 1
In forming 2a and 12b, a high-purity graphite substrate having an alkali metal / heavy metal content of 5 ppm or less is processed into a desired shape, and then the surface is reacted with hydrogen fluoride gas to remove impurities such as metal elements (contaminants). ) Is vaporized as fluoride to obtain high purity, and after applying a resin or the like,
It is placed in a reactor heated to a desired temperature, and the carbon in the resin is made amorphous by heat treatment to form an amorphous carbon layer. If the heat treatment is performed in the state where the resin film is formed in this way, the resin is impregnated into the unevenness of the surface of the substrate and the substrate is made amorphous in a smooth state, so that a smoother surface state can be obtained.

【0039】このようにして形成された熱交換基板2
a,2b,12a,12bを用いた装置では、熱交換基
板2a,2b,12a,12bと接触して液中に不純物
を混入させるようなことも、パーティクルを生じること
もなく、長期間にわたって良好に半導体処理液の温度制
御を行うことが可能である。なお、この装置では、半導
体処理液として多用される弗酸、硝酸、リン酸、硫酸、
塩酸等の多くの酸に対しても十分な耐性を発揮する。
The heat exchange substrate 2 thus formed
In the apparatus using the a, 2b, 12a, and 12b, it is favorable for a long period of time without contacting the heat exchange substrates 2a, 2b, 12a, and 12b to mix impurities into the liquid and without generating particles. In addition, it is possible to control the temperature of the semiconductor processing liquid. In this apparatus, hydrofluoric acid, nitric acid, phosphoric acid, sulfuric acid, which is frequently used as a semiconductor processing liquid,
It exhibits sufficient resistance to many acids such as hydrochloric acid.

【0040】この熱交換基板2a,2b,12a,12
bは、表面が鏡面に近い状態となっているため、気密性
が極めて良好なシールができ、液漏れが皆無となる。
The heat exchange boards 2a, 2b, 12a, 12
In the case of b, since the surface is in a state close to a mirror surface, a seal with extremely good airtightness can be formed, and no liquid leakage occurs.

【0041】さらに、基材として用いるグラファイトに
は、できる限り気孔の少ない高密度なものが望ましく、
特に、表面を緻密化処理したものを用いれば、加工性が
良好で、鏡面加工も容易であり、アモルファスカーボン
層は、5乃至10μm程度の膜厚でかつ、表面反応によ
って形成されるため、この鏡面を良好に維持することが
でき、温度変化等に起因する剥離のおそれもない。
Further, it is desirable that the graphite used as the base material be as dense as possible with as few pores as possible.
In particular, when a material whose surface is densified is used, the workability is good and the mirror finish is easy, and the amorphous carbon layer has a thickness of about 5 to 10 μm and is formed by a surface reaction. The mirror surface can be maintained satisfactorily, and there is no fear of peeling due to a temperature change or the like.

【0042】なお、上述した熱交換基板は、グラファイ
ト基板表面に、樹脂を塗布し、熱処理によるトリートメ
ントを施し、アモルファスカーボン層を形成したが、熱
処理によりグラファイト基板そのものをアモルファス化
し、アモルファスカーボン層を形成してもよいし、気相
成長によりグラファイト基板表面に、アモルファスカー
ボン層を形成してもよい。
In the above-mentioned heat exchange substrate, a resin was applied to the surface of the graphite substrate, and a treatment was performed by heat treatment to form an amorphous carbon layer. Alternatively, an amorphous carbon layer may be formed on the surface of the graphite substrate by vapor phase growth.

【0043】さらに、グラファイト基板表面にアモルフ
ァスカーボン層を形成することに換えて、基材をアモル
ファスカーボンで形成してもよい。例えば、熱交換基板
2a,2b,12a,12bを板厚1mm乃至3mmの
アモルファスカーボンで構成してもよい。
Further, instead of forming the amorphous carbon layer on the surface of the graphite substrate, the base material may be formed of amorphous carbon. For example, the heat exchange substrates 2a, 2b, 12a, 12b may be made of amorphous carbon having a thickness of 1 mm to 3 mm.

【0044】なお、上述したネジ4は、ネジ4の頭とナ
ット5との間の厚みをネジ4の回転によって任意に調整
することができるが、ナット5自体を補強板3bに固着
するようにしてもよいし、ロッドと止めピン等によって
皿バネ6の装着スペースを考慮した厚みに最初から固定
されるようにしてもよい。要は、皿バネ6の押圧力が適
切に加わり、かつ皿バネ6の伸縮許容が適切であればよ
い。
The thickness of the screw 4 between the head of the screw 4 and the nut 5 can be arbitrarily adjusted by rotating the screw 4, but the nut 5 itself is fixed to the reinforcing plate 3b. Alternatively, the thickness may be fixed from the beginning by a rod and a fixing pin or the like in consideration of a mounting space of the disc spring 6. In short, it is only necessary that the pressing force of the disc spring 6 is appropriately applied and that the expansion and contraction of the disc spring 6 is appropriate.

【0045】また、上述した仕切板は、各冷却加熱室に
3つ設け、各冷却加熱室を4つの冷却加熱小部屋に区分
けしたが、これに限らず、さらに多くの仕切板を設けて
さらに多い冷却加熱小部屋を形成してもよいし、逆に少
ない仕切板として少ない冷却加熱小部屋を形成してもよ
い。ただし、各冷却加熱小部屋間を連通させる流通孔は
形成された各冷却加熱小部屋に対応して形成する必要が
ある。
Further, the above-mentioned three partition plates are provided in each cooling and heating chamber, and each cooling and heating chamber is divided into four cooling and heating small rooms. However, the present invention is not limited to this, and more partition plates are provided and further divided. A large number of cooling / heating small rooms may be formed, and conversely, a small number of cooling / heating small rooms may be formed as a small number of partition plates. However, it is necessary to form a flow hole for communicating between the cooling and heating small rooms corresponding to each of the formed cooling and heating small rooms.

【0046】さらに、仕切板あるいはこれによって形成
される冷却加熱小部屋の形成は、できる限り、蛇行させ
る必要があるが、各冷却加熱小部屋の形状及びこれによ
って形成される流路は任意に設定することができる。た
だし、各冷却小部屋間の流通する半導体処理液は、直列
に流入するようにしなければならない。
Further, it is necessary to meander as much as possible when forming the partitioning plate or the cooling and heating small room formed by the partition plate. However, the shape of each cooling and heating small room and the flow path formed thereby are arbitrarily set. can do. However, the semiconductor processing liquid flowing between the cooling small rooms must flow in series.

【0047】また、上述した実施の形態では、側部壁体
1のみを一体形成とし、熱交換基板2a,2b及び補強
板3a,3bを冷却加熱室10に、熱交換基板12a,
12b及び補強板13a,13bを冷却加熱室11にそ
れぞれ対応させたものとしたが、これに限らず、熱交換
基板2aと12a及び熱交換基板2bと12bをもそれ
ぞれ一体形成してもよいし、補強板3a,13a及び補
強板3bと13bをもそれぞれ一体形成してもよい。こ
こで、熱交換基板2aと12a、熱交換基板2bと12
b、補強板3aと13a、補強板3bと13bをそれぞ
れ一体形成しない場合には、単一の冷却加熱室の構成に
用いる熱交換基板及び補強板との部品の共通化を図るこ
とができる。
In the above-described embodiment, only the side wall 1 is integrally formed, the heat exchange boards 2a and 2b and the reinforcing plates 3a and 3b are provided in the cooling and heating chamber 10, and the heat exchange boards 12a and 12a are provided.
Although 12b and the reinforcing plates 13a and 13b correspond to the cooling and heating chamber 11, respectively, the present invention is not limited to this, and the heat exchange substrates 2a and 12a and the heat exchange substrates 2b and 12b may also be integrally formed. The reinforcing plates 3a and 13a and the reinforcing plates 3b and 13b may also be integrally formed. Here, the heat exchange boards 2a and 12a and the heat exchange boards 2b and 12a
In the case where b, the reinforcing plates 3a and 13a and the reinforcing plates 3b and 13b are not integrally formed, components common to the heat exchange substrate and the reinforcing plate used for the configuration of the single cooling and heating chamber can be shared.

【0048】[0048]

【発明の効果】以上詳細に説明したように、第1の発明
では、側部壁体、第1及び第2の熱交換基板、第1及び
第2の補強板のうち、少なくとも前記側部壁体は、一体
形成によって複数の冷却加熱室を形成し、複数の冷却加
熱室毎に、締め付けネジ及びシールリングを含むシーリ
ング構成を設け、各冷却加熱室は、1以上の仕切板によ
って複数の冷却加熱小部屋を形成するとともに、各冷却
加熱小部屋は、前記側部壁体及び前記仕切板に設けられ
た所定の流通孔によって前記半導体処理液が前記入口孔
から前記出口孔に至るまでの間を直列に流通接続される
ようにしているので、簡単な構成により小型軽量を維持
したまま、冷却加熱性能を増大することができるという
利点を有する。
As described in detail above, in the first aspect, at least the side wall of the side wall, the first and second heat exchange boards, and the first and second reinforcing plates is provided. The body forms a plurality of cooling and heating chambers by integral formation, a sealing configuration including a fastening screw and a seal ring is provided for each of the plurality of cooling and heating chambers, and each of the cooling and heating chambers is formed by a plurality of cooling plates by one or more partition plates. While forming the heating small room, each cooling heating small room is provided between the side wall body and the predetermined flow hole provided in the partition plate until the semiconductor processing liquid reaches the outlet hole from the inlet hole. Are connected in series, so that there is an advantage that the cooling and heating performance can be increased while maintaining a small size and light weight with a simple configuration.

【0049】第2または第3の発明では、第1の発明に
おいて、第1及び第2の熱交換基板を、少なくとも半導
体処理液に接触する処理液接触面側をアモルファスカー
ボン層で被覆したグラファイト基材とし、または、アモ
ルファスカーボン材としているので、加工性が良好で製
造が極めて良好であり、また研磨加工も容易にであるた
め、平滑な平面を容易に得ることができとともに、精緻
な表面を得ることができるため、気体の通過がなく極め
て耐薬品性が高いので、気密性の高いシーリングを実現
することができる利点を有する。
According to a second or third aspect of the present invention, in the first aspect, the first and second heat exchange substrates are each made of a graphite base having an amorphous carbon layer coated on at least a treatment liquid contact surface that contacts a semiconductor treatment liquid. Since it is a material, or it is an amorphous carbon material, it has good workability and extremely good production, and it is easy to polish, so it is possible to easily obtain a smooth flat surface, and Since it can be obtained, there is no gas passage and the chemical resistance is extremely high, so that there is an advantage that highly airtight sealing can be realized.

【0050】第4の発明では、第2または第3の発明に
おいて、第1及び第2の補強板は、急冷凝固アルミ合金
粉末を原料とする粉末鍛造法によって成形焼結されたア
ルミ合金材であるので、一般に多用されるアルミニュー
ムの展伸材や鋳造材の長所である軽量、高熱伝導性を失
わず、短所である低い縦弾性率を30〜60%も大幅に
高めることができ、この結果、板厚を増大させずに補強
板の剛性を高めることができるので、補強板の熱容量を
最小限にでき、冷却加熱の応答速度を損なうことなく、
装置全体の小型・軽量化を図ることができるという利点
を有する。
In a fourth aspect based on the second or third aspect, the first and second reinforcing plates are made of an aluminum alloy material formed and sintered by a powder forging method using a rapidly solidified aluminum alloy powder as a raw material. Because of this, the strength of lightweight and high thermal conductivity, which are the advantages of commonly used aluminum wrought and cast materials, is not lost, and the low longitudinal elastic modulus, which is a disadvantage, can be greatly increased by 30 to 60%. As a result, the rigidity of the reinforcing plate can be increased without increasing the plate thickness, so that the heat capacity of the reinforcing plate can be minimized, without impairing the response speed of cooling and heating,
There is an advantage that the entire device can be reduced in size and weight.

【0051】また、このアルミ合金材は、剛性が高いの
で、シールリングの外周における締め付けネジの締め付
けによってシールリングの内側の板面が外側に向かって
凸状に湾曲することがなくなり、熱交換基板を破損する
危険性を少なくし、シール部での接触面圧を低下させず
にシール性を保持することができる利点を有する。
Further, since the aluminum alloy material has high rigidity, the inner plate surface of the seal ring does not bend outwardly by the tightening of the tightening screw on the outer periphery of the seal ring. This has the advantage of reducing the risk of breakage and maintaining the sealing performance without reducing the contact surface pressure at the seal portion.

【0052】さらに、補強板が湾曲しないことは、その
外側に取り付けられるサーモモジュールとの接触圧を平
坦にし、接触圧にむらが生じることによる機械的破損や
熱接触抵抗の増大等に起因する装置全体の性能や信頼性
の低下を防止することができるという利点を有する。
Further, the non-curvature of the reinforcing plate flattens the contact pressure with the thermo module attached to the outside of the reinforcing plate, and causes the mechanical damage and the increase in thermal contact resistance due to the uneven contact pressure. This has the advantage that a decrease in overall performance and reliability can be prevented.

【0053】第5の発明では、第1から第4の発明にお
いて、前記シールリングは、接液表面がフッ素樹脂で形
成され、各締め付けネジに対して複数枚の皿バネを重ね
合わせて併用し、前記複数枚の皿バネのうち隣接する皿
バネの少なくとも1箇所以上を逆向きに重ね合わせてい
るので、シールリングを構成するフッ素樹脂や側部壁体
を構成するフッ素樹脂が温度サイクルや長期間の使用に
よりコールドフローを生じ、これによる締め付け方向の
寸法減少が生じても、皿バネの伸縮許容により、寸法減
少を吸収し、シール部における接触面の圧力低下を防止
して安定したシールを提供することができるという利点
を有する。
According to a fifth aspect, in the first to fourth aspects, the seal ring has a liquid contact surface formed of a fluorine resin, and a plurality of disc springs are used in combination with each other for each tightening screw. Since at least one or more of the adjacent disc springs among the plurality of disc springs are overlapped in the opposite direction, the fluorocarbon resin forming the seal ring and the fluorocarbon resin forming the side wall may be subjected to a temperature cycle or a long cycle. Even if cold flow occurs due to the use of the period and the dimension decreases in the tightening direction due to this, the contraction of the coned disc spring absorbs the dimension decrease and prevents the pressure drop of the contact surface in the seal part to ensure a stable seal. It has the advantage that it can be provided.

【0054】また、皿バネによる押圧力は、皿バネの枚
数及び配置方向の適宜選択により調整することができる
ため、機械的強度が強くないアモルファスカーボン層で
被覆されたグラファイト基材やアモルファスカーボン材
を用いた熱交換基板を使用しても、この機械的強度を損
なうことがないよう、設計に応じて安全かつ安定な取り
付けや圧接を行うことができるという利点を有する。
The pressing force of the disc spring can be adjusted by appropriately selecting the number and arrangement direction of the disc springs. Therefore, the graphite base material or the amorphous carbon material coated with the amorphous carbon layer having low mechanical strength can be used. There is an advantage that even if a heat-exchange substrate using the same is used, safe and stable mounting and pressure welding can be performed according to the design so that the mechanical strength is not impaired.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の形態である半導体処理液冷却加
熱装置の平面図を示す図である。
FIG. 1 is a plan view of a semiconductor processing liquid cooling and heating apparatus according to an embodiment of the present invention.

【図2】本発明の実施の形態である半導体処理液冷却加
熱装置の正面図を示す図である。
FIG. 2 is a diagram showing a front view of a semiconductor processing liquid cooling and heating apparatus according to an embodiment of the present invention.

【図3】本発明の実施の形態である半導体処理液冷却加
熱装置の右側面図を示す図である。
FIG. 3 is a right side view of a semiconductor processing liquid cooling and heating apparatus according to an embodiment of the present invention.

【図4】側部壁体の平面図である。FIG. 4 is a plan view of a side wall body.

【図5】側部壁体のA−A線断面図である。FIG. 5 is a sectional view of the side wall taken along line AA.

【図6】側部壁体の斜視図及び半導体処理液の流れを示
す図である。
FIG. 6 is a perspective view of a side wall and a view showing a flow of a semiconductor processing liquid.

【図7】シール部の拡大断面図である。FIG. 7 is an enlarged sectional view of a seal portion.

【符号の説明】[Explanation of symbols]

1…側部壁体 2a,2b,12a,12b…熱交換基
板 3a,3b,13a,13b…補強板 4…ネジ 5…
ナット 6…皿バネ 7,8…配管 9a,9b,19a,19b…シール部 10,11…冷却加熱室 21〜23,31〜33…仕
切板 22a,26〜29,31a,33a…流通孔 30a〜30h…冷却加熱小部屋 24…流入孔 25
…流出孔 39…貫通孔
DESCRIPTION OF SYMBOLS 1 ... Side wall 2a, 2b, 12a, 12b ... Heat exchange board 3a, 3b, 13a, 13b ... Reinforcement plate 4 ... Screw 5 ...
Nut 6 ... Bellet spring 7,8 ... Pipe 9a, 9b, 19a, 19b ... Seal part 10, 11 ... Cooling and heating chamber 21-23, 31-33 ... Partition plate 22a, 26-29, 31a, 33a ... Flow hole 30a ~ 30h ... Cooling and heating room 24 ... Inlet 25
… Outflow hole 39… Through hole

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 フッ素樹脂からなる側部壁体と該側部壁
体を介して対向配置される第1及び第2の熱交換基板と
で冷却加熱室を形成し、該冷却加熱室は、シールリング
を介して気密にシールされ、前記第1及び第2の熱交換
基板を補強する第1及び第2の補強板を該第1及び第2
の熱交換基板の外側に重ねて取り付け、第1の補強板、
第1の熱交換基板、側部壁体、第2の熱交換基板及び第
2の補強板を貫通する複数の締め付けネジによって前記
冷却加熱室のシーリングを確実にし、入口孔を介して前
記冷却加熱室に流入した半導体処理液を前記熱交換基板
に接触させて冷却または加熱を行い、この冷却または加
熱された半導体処理液を出口孔を介して流出させる半導
体処理液用冷却加熱装置において、 前記側部壁体、前記第1及び第2の熱交換基板、前記第
1及び第2の補強板のうち、少なくとも前記側部壁体
は、一体形成によって複数の冷却加熱室を形成し、 前記複数の冷却加熱室毎に、前記締め付けネジ及び前記
シールリングを含むシーリング構成を設け、 各冷却加熱室は、1以上の仕切板によって複数の冷却加
熱小部屋を形成するとともに、各冷却加熱小部屋は、前
記側部壁体及び前記仕切板に設けられた所定の流通孔に
よって前記半導体処理液が前記入口孔から前記出口孔に
至るまでの間を直列に流通接続されることを特徴とする
半導体処理液用冷却加熱装置。
1. A cooling and heating chamber is formed by a side wall made of a fluororesin and first and second heat exchange substrates disposed to face each other with the side wall being interposed therebetween. The first and second reinforcing plates are hermetically sealed via a seal ring and reinforce the first and second heat exchange boards.
The first reinforcing plate,
A plurality of tightening screws penetrating the first heat exchange board, the side wall, the second heat exchange board, and the second reinforcing plate ensure the sealing of the cooling and heating chamber, and the cooling and heating are performed through an inlet hole. The semiconductor processing liquid flowing into the chamber is brought into contact with the heat exchange substrate to perform cooling or heating, and the cooled or heated semiconductor processing liquid is discharged through an outlet hole. At least the side wall member among the wall member, the first and second heat exchange substrates, and the first and second reinforcing plates forms a plurality of cooling and heating chambers by integral formation, For each cooling and heating chamber, a sealing configuration including the tightening screw and the seal ring is provided.Each cooling and heating chamber forms a plurality of cooling and heating chambers with one or more partition plates, and each of the cooling and heating chambers includes: The semiconductor processing liquid, wherein the semiconductor processing liquid is serially connected between the inlet hole and the outlet hole by a predetermined flow hole provided in the side wall and the partition plate. For cooling and heating equipment.
【請求項2】 前記第1及び第2の熱交換基板は、少な
くとも半導体処理液に接触する処理液接触面側をアモル
ファスカーボン層で被覆したグラファイト基材であるこ
とを特徴とする請求項1記載の半導体処理液用冷却加熱
装置。
2. The method according to claim 1, wherein the first and second heat exchange substrates are graphite base materials having at least a processing liquid contact surface that comes into contact with a semiconductor processing liquid covered with an amorphous carbon layer. Cooling and heating equipment for semiconductor processing liquids.
【請求項3】 前記第1及び第2の熱交換基板は、アモ
ルファスカーボン材であることを特徴とする請求項1記
載の半導体処理液用冷却加熱装置。
3. The cooling device according to claim 1, wherein the first and second heat exchange substrates are made of an amorphous carbon material.
【請求項4】 前記第1及び第2の補強板は、急冷凝固
アルミ合金粉末を原料とする粉末鍛造法によって成形焼
結されたアルミ合金材であることを特徴とする請求項2
または3記載の半導体処理液用冷却加熱装置。
4. The aluminum plate according to claim 2, wherein said first and second reinforcing plates are formed and sintered by a powder forging method using rapidly solidified aluminum alloy powder as a raw material.
Or a cooling and heating device for a semiconductor processing liquid according to 3.
【請求項5】 前記シールリングは、接液表面がフッ素
樹脂で形成され、 前記各締め付けネジに対して複数枚の皿バネを重ね合わ
せて併用し、前記複数枚の皿バネのうち隣接する皿バネ
の少なくとも1箇所以上を逆向きに重ね合わせたことを
特徴とする請求項1〜4のうちのいずれか1項記載の半
導体処理液用冷却加熱装置。
5. The seal ring has a liquid contact surface formed of a fluororesin, and a plurality of disc springs are used in combination with each other for each of the tightening screws, and an adjacent disc among the plurality of disc springs is used. The cooling and heating device for a semiconductor processing liquid according to any one of claims 1 to 4, wherein at least one or more of the springs are overlapped in a reverse direction.
JP22250897A 1997-08-19 1997-08-19 Cooling and heating equipment for semiconductor processing liquid Expired - Lifetime JP3724763B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22250897A JP3724763B2 (en) 1997-08-19 1997-08-19 Cooling and heating equipment for semiconductor processing liquid

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JP22250897A JP3724763B2 (en) 1997-08-19 1997-08-19 Cooling and heating equipment for semiconductor processing liquid

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JPH1167718A true JPH1167718A (en) 1999-03-09
JP3724763B2 JP3724763B2 (en) 2005-12-07

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JP2008186913A (en) * 2007-01-29 2008-08-14 Komatsu Electronics Inc Fluid-temperature controller
JP2008251843A (en) * 2007-03-30 2008-10-16 Smc Corp Heat exchanger for chemical, and temperature-regulating device for chemical using the same

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KR102413795B1 (en) 2020-07-20 2022-06-28 글로벌라이트 주식회사 Cooling-heating apparatus of semi-conductor liquid
KR102367230B1 (en) 2020-07-20 2022-02-24 글로벌라이트 주식회사 Cooling-heating apparatus of semi-conductor liquid
KR102477211B1 (en) 2020-09-13 2022-12-13 글로벌라이트 주식회사 Cooling-heating apparatus of semi-conductor liquid

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008186913A (en) * 2007-01-29 2008-08-14 Komatsu Electronics Inc Fluid-temperature controller
JP2008251843A (en) * 2007-03-30 2008-10-16 Smc Corp Heat exchanger for chemical, and temperature-regulating device for chemical using the same
TWI395266B (en) * 2007-03-30 2013-05-01 Smc Corp Temperature control device for liquid medicines

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