JPH1131775A - Method for manufacturing resin-sealed semiconductor device, and lead frame used for it - Google Patents

Method for manufacturing resin-sealed semiconductor device, and lead frame used for it

Info

Publication number
JPH1131775A
JPH1131775A JP20082197A JP20082197A JPH1131775A JP H1131775 A JPH1131775 A JP H1131775A JP 20082197 A JP20082197 A JP 20082197A JP 20082197 A JP20082197 A JP 20082197A JP H1131775 A JPH1131775 A JP H1131775A
Authority
JP
Japan
Prior art keywords
frame
strip
resin
lead
inner lead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20082197A
Other languages
Japanese (ja)
Inventor
Yoshio Yokota
芳夫 横田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shindengen Electric Manufacturing Co Ltd
Original Assignee
Shindengen Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shindengen Electric Manufacturing Co Ltd filed Critical Shindengen Electric Manufacturing Co Ltd
Priority to JP20082197A priority Critical patent/JPH1131775A/en
Publication of JPH1131775A publication Critical patent/JPH1131775A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Lead Frames For Integrated Circuits (AREA)

Abstract

PROBLEM TO BE SOLVED: To prevent peeling off, drop, residue, etc., of resin burr from occurring by recovering with the remaining mold burr sticking to a frame body and a thin streak after a lead frame resin sealing process. SOLUTION: In this method, using a lead frame 1 comprising a frame body 6 which connects an external lead 5 drawn out of the one side of an inner lead part 2 and a frame body 8 which connects a thin streak 7 drawn out of the other side of the inner lead part 2, semiconductor substrates 3 and 4 are fixed to a required part of the inner lead part 2, and then molded by resin- sealing (9). After that, the thin streak 7 and the frame body 6 connecting the eternal lead 5 and the frame body 8 connecting the thin streak 7 are removed. When the thin streak 7 is provided with a tensile breakage part 7a and a resin burr reservoir part 7b for removing the thin streak 7 and the frame body 8 connecting the thin streak 7, the thin streak 7 is removed by the tensile breakage part 7a with a resin burr 9a sticking, while a tensile force in drawn out direction is acted on the thin streak 7.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する分野の説明】本発明は比較的大きな電力
を扱うことのできるパワーデバイス或いはICとパワー
デバイスを組込んだ所謂マルチチップモジュール等の樹
脂封止型半導体装置 (2) の製造方法及びこれに使用するリードフレームに関す
る。
Description of the Field of the Invention The present invention relates to a method of manufacturing a resin-encapsulated semiconductor device (2) such as a power device capable of handling relatively large power or a so-called multi-chip module incorporating an IC and a power device. It relates to a lead frame used for this.

【0002】[0002]

【従来の技術】最近の一般的な樹脂封止型半導体装置
は、半導体チップが固定された支持板或いは内部リード
の両面に樹脂成形された所謂フルモールドタイプのもの
が多い。又このフルモールドタイプでは樹脂封止成形
後、リードフレームの不要な枠体或いは細条を切断し、
或いは予め形成されている小切断部から引張りにより破
断し、夫々除去する工程を含んでいる。特に引張りによ
り破断する場合には破断面を樹脂中におくことが可能な
ため、外部放熱体に取付ける際に外部放熱体との沿面距
離が向上し、絶縁耐圧が向上する利点がある。このよう
な樹脂封止技術は特公平3−778号、特公平4−51
974号で開示されている。
2. Description of the Related Art In recent years, general resin-encapsulated semiconductor devices are often of the so-called full-mold type in which resin is molded on both surfaces of a support plate on which a semiconductor chip is fixed or internal leads. In this full mold type, after resin molding, unnecessary frames or strips of the lead frame are cut,
Alternatively, the method includes a step of breaking the pre-formed small cut portion by pulling and removing each. In particular, in the case of breaking due to tension, the fracture surface can be placed in the resin, so that when it is attached to an external heat radiator, the creeping distance with the external heat radiator is improved, and there is an advantage that the dielectric strength is improved. Such a resin sealing technology is disclosed in Japanese Patent Publication No. 3-778 and Japanese Patent Publication No. 4-51.
No. 974.

【0003】即ちリードフレームの一部を構成する支持
板或いは内部リード(インナーリード)に半導体チップ
を固着し、半導体チップは細線等で外部リードと接続さ
れる。次にリードフレームは金型に装着され、キャビテ
ィ内に融解樹脂が圧入される。この時、支持板の各側部
に連結された外部リードと細条が金型で把持される。樹
脂が固化したのちリードフレームが金型から取り外され
る。
That is, a semiconductor chip is fixed to a support plate or an internal lead (inner lead) which constitutes a part of a lead frame, and the semiconductor chip is connected to an external lead by a thin wire or the like. Next, the lead frame is mounted on a mold, and the molten resin is pressed into the cavity. At this time, the external leads and strips connected to each side of the support plate are gripped by the mold. After the resin has solidified, the lead frame is removed from the mold.

【0004】[0004]

【発明が解決しようとする課題】上記の融解樹脂はキャ
ビティから外部に流出しない事が望ましいが、リードフ
レームの金型による把持部分で滲出し、この部分が固化
した後、図4に示すように樹脂バリ10aとして残る。
この樹脂バリ10aは、細条11の引抜き加工時に、付
着した樹脂バリが剥離、落下し、装置内へ散乱して、製
品詰まりや、製品破損等の問題を発生させていた。な
お、図4(a)(b)は従来例を示す平面図及び側面図
で図中10は樹脂封止成型部12、13は枠体、14は
外部リードである。
It is desirable that the above-mentioned molten resin does not flow out of the cavity to the outside, but oozes out at the portion of the lead frame gripped by the die, and after this portion is solidified, as shown in FIG. It remains as resin burr 10a.
The resin burrs 10a, when the strip 11 is pulled out, cause the attached resin burrs to peel off, fall, and scatter into the apparatus, causing problems such as product clogging and product damage. 4 (a) and 4 (b) are a plan view and a side view showing a conventional example. In the figures, reference numeral 10 denotes a resin sealing molded portion 12, 13 denotes a frame, and 14 denotes external leads.

【0005】[0005]

【発明の目的】[Object of the invention]

(3) 本発明は、上記従来技術の不具合を解決するために創作
されたもので、その目的はリードフレームの樹脂封止工
程以降の枠体及び細条に付着したモールドバリを密着さ
せたまま、回収して、樹脂バリの剥離、落下、残り等の
問題発生を防止するものである。
(3) The present invention has been made in order to solve the above-mentioned disadvantages of the prior art, and has an object to keep mold burrs attached to a frame and a strip after a resin sealing step of a lead frame in close contact. , Collecting, and preventing the occurrence of problems such as peeling, dropping, and remaining resin burrs.

【0006】[0006]

【課題を解決する為の手段】本発明はインナーリード部
の一方の側から導出される外部リードをつなぐ枠体と、
前記インナーリード部の他方の側から導出される細条を
つなぐ枠体とを有するリードフレームを用いて、半導体
基板を前記インナーリード部の所要部に固定し、樹脂封
止成型したのち、前記外部リードをつなぐ枠体および前
記細条と、該細条をつなぐ枠体を除去する工程より成
り、前記細条に引張り破断部と樹脂バリ溜り部を設けて
前記細条と該細条をつなぐ枠体を除去する工程におい
て、前記細条にその導出方向への引張力を作用させ、樹
脂バリを付着させたまま前記引張り破断部で該細条を除
去する工程を備えたことを特徴とする。
According to the present invention, there is provided a frame for connecting external leads extending from one side of an inner lead portion,
A semiconductor substrate is fixed to a required portion of the inner lead portion by using a lead frame having a frame that connects strips derived from the other side of the inner lead portion, and after resin sealing and molding, A frame connecting the leads, the strip, and a step of removing the frame connecting the strips, wherein the strip is provided with a tensile break portion and a resin burr-retaining portion, and the frame is connected to the strips. In the step of removing the body, a step of applying a tensile force to the strip in a direction in which the strip is led out and removing the strip at the pull-rupture portion with resin burr adhered is provided.

【0007】[0007]

【実施例】図1(a)(b)(c)は本発明の一実施例
を示すリードフレームの平面図(樹脂封止前)側面図、
及び部分的拡大図である。1は板状金属板を打抜き加工
等により形成されたリードフレームで横方向に複数個連
接されている。2はインナーリード部で、この内2a,
2bは半導体チップを固着する支持板として及び放熱体
兼ね巾広状に打抜き加工されている。3及び4は前記イ
ンナーリードの巾広部に固着されたパワーデバイス(例
えばMOSFET)及び制御機能等を備えたICチッ
プ、5は前記インナーリードの一方から導出されている
外部リードで枠体6に連接されている。6a,6bは
孔、7はインナーリードの他方の側に導出される細条
(フリピン)、8は細条に連接された他方の枠体、8a
は孔である。
1 (a), 1 (b) and 1 (c) are plan views (before resin sealing) and side views of a lead frame showing an embodiment of the present invention.
And a partially enlarged view. Reference numeral 1 denotes a plurality of lead frames formed by punching a plate-like metal plate, and is connected in the lateral direction. Reference numeral 2 denotes an inner lead portion, of which 2a,
2b is punched in a wide shape as a support plate for fixing the semiconductor chip and also as a heat radiator. Reference numerals 3 and 4 denote a power device (for example, a MOSFET) fixed to a wide portion of the inner lead, an IC chip having a control function, and the like. Reference numeral 5 denotes an external lead derived from one of the inner leads. It is articulated. 6a and 6b are holes, 7 is a strip (flippin) led out to the other side of the inner lead, 8 is the other frame connected to the strip, 8a
Is a hole.

【0008】次に細条7において、7aはインナーリー
ド部付近(基部)が巾狭く加工され (4) 引張りにより破断される引張り破断部、なお破断し易く
するにはこの外基部に、切込みを入れたり、厚みを薄く
したり或はミシン状に糸目加工してもよい。7bは細条
の上方において枠体8の側面に跨がって形成された半球
状の切欠きで、後述する樹脂バリ溜り部で形成する。9
は樹脂封止成型部(モールド樹脂)である。
Next, in the strip 7, 7a is processed so as to be narrow in the vicinity of the inner lead portion (base portion). (4) A tensile break portion that is broken by tension, and a cut is made in the outer base portion to facilitate breakage. It may be inserted, thinned, or threaded like a sewing machine. Reference numeral 7b denotes a hemispherical notch formed over the side surface of the frame body 8 above the narrow strip, and is formed by a resin burr reservoir described later. 9
Denotes a resin sealing molded part (mold resin).

【0009】図2(a)(b)は本発明の実施例を示す
樹脂封止後の平面図、及び部分的拡大図で9aは細条7
及び枠体8の側面に形成された樹脂バリである。本発明
は細条7の一部へ半円状の切欠き7bを設けて、樹脂封
止以降に発生する樹脂バリの密着強度を上げるための樹
脂ダマリを有する事を特徴としている。尚、上記切欠き
形状は台形や三角形でも良く、この他、細条の側面を凹
凸にしてもよく、又粗面加工してもよい。次に、モール
ドから切断工程に於ける、樹脂バリ発生と、枠体8の引
き抜き状態を説明する。即ち図3に示すように樹脂封止
成型後、一方の枠体8を図中矢印の如く引張ることによ
り細条7は樹脂バリ9aを付着したまま容易に除去でき
る。なお他方の枠体6及び外部リード接続部等の不要部
はその後、機械加工等により除去される。
FIGS. 2 (a) and 2 (b) are a plan view and a partially enlarged view showing an embodiment of the present invention after resin sealing.
And resin burrs formed on the side surfaces of the frame 8. The present invention is characterized in that a semicircular notch 7b is provided in a part of the strip 7 to have a resin dummy for increasing the adhesion strength of resin burrs generated after resin sealing. The shape of the notch may be trapezoidal or triangular. In addition, the side of the strip may be made uneven, or may be roughened. Next, the generation of resin burrs and the state in which the frame 8 is pulled out in the cutting step from the mold will be described. That is, as shown in FIG. 3, after the resin sealing molding, by pulling one of the frames 8 as shown by the arrow in the figure, the strip 7 can be easily removed with the resin burr 9a attached. Unnecessary portions such as the other frame 6 and the external lead connection portion are thereafter removed by machining or the like.

【0010】[0010]

【発明の効果】以上の説明から明らかなように本発明に
よれば枠体をつなぐ細条に切欠等による樹脂バリ溜り部
設け、バリの接触面積を増し、接着強度を上げられるた
め、枠体の引き抜き加工時に樹脂バリを密着させたま
ま、回収する事が出来、樹脂バリの剥離、落下、残り等
の発生による、加工装置内での製品詰まりによる装置停
止や、製品破損を防止する事が出来る。
As is apparent from the above description, according to the present invention, a resin burr is formed in a strip connecting the frames by notches or the like to increase the contact area of the burr and increase the bonding strength. The resin burr can be collected with the resin burr kept in contact during the drawing process, preventing the stoppage of the device due to product clogging in the processing device due to the occurrence of resin burr peeling, dropping, residue, etc., and preventing product damage. I can do it.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例図(樹脂封止前) (5) (a) 平面図 (b) 側面図 (c) 部分的断面図FIG. 1 is a view showing an embodiment of the present invention (before resin sealing). (5) (a) Plan view (b) Side view (c) Partial sectional view

【図2】本発明の一実施例図(樹脂封止後) (a) 平面図 (b) 側面図FIG. 2 is a view of one embodiment of the present invention (after resin sealing) (a) Plan view (b) Side view

【図3】本発明実施例の説明図FIG. 3 is an explanatory view of an embodiment of the present invention.

【図4】従来例 (a) 平面図 (b) 側面図FIG. 4 shows a conventional example (a) plan view (b) side view

【符号の簡単な説明】[Brief description of reference numerals]

1 リードフレーム 2 インナーリード部 3,4 半導体基板(デバイス) 5 外部リード 6,8 枠体 7 細条 7a 破断部 7b 切欠部(樹脂バリ溜り) 9 樹脂封止成型部 9a 樹脂バリ DESCRIPTION OF SYMBOLS 1 Lead frame 2 Inner lead part 3, 4 Semiconductor substrate (device) 5 External lead 6, 8 Frame 7 Narrow 7a Breaking part 7b Notch part (resin burr pool) 9 Resin sealing molding part 9a Resin burr

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 インナーリード部の一方の側から導出さ
れる外部リードをつなぐ枠体と、前記インナーリード部
の他方の側から導出される細条をつなぐ枠体とを有する
リードフレームを用いて、半導体基板を前記インナーリ
ード部の所要部に固定し、樹脂封止成型したのち、前記
外部リードをつなぐ枠体および前記細条と、該細条をつ
なぐ枠体を除去する工程より成り、前記細条に引張り破
断部と樹脂バリ溜り部を設けて前記細条と該細条をつな
ぐ枠体を除去する工程において、前記細条にその導出方
向への引張力を作用させ、樹脂バリを付着させたまま前
記引張り破断部で該細条を除去する工程を備えたことを
特徴とする樹脂封止型半導体装置の製造方法。
1. A lead frame having a frame for connecting external leads derived from one side of an inner lead portion and a frame for connecting strips derived from the other side of the inner lead portion. Fixing the semiconductor substrate to a required portion of the inner lead portion, molding the resin, and then removing the frame and the strip connecting the external leads, and removing the frame connecting the strip. In the step of providing a tensile breaking portion and a resin burr-retaining portion on the strip and removing the frame connecting the strip and the strip, a tensile force is applied to the strip in a direction in which the strip is led out to attach the resin burr. A method for manufacturing a resin-encapsulated semiconductor device, comprising the step of removing the strip at the tensile break portion while keeping the tension.
【請求項2】 インナーリード部(又は半導体支持板)
の一方の側から導出される外部リードをつなぐ枠体と、
前記インナーリード部(又は半導体支持板)の他方の側
から導出される細条をつなぐ枠体を有するリードフレー
ムにおいて、前記細条は導出方向の基部に形成された引
張り破断部と、細条の一部もしくは枠体に跨がって形成
された樹脂バリ溜り部を備えたことを特徴とするリード
フレーム。
2. An inner lead portion (or a semiconductor support plate).
A frame that connects external leads derived from one side of the
In a lead frame having a frame for connecting a strip led out from the other side of the inner lead part (or the semiconductor support plate), the strip is formed by a tensile break portion formed at a base in a lead-out direction, and A lead frame comprising a resin burr pool formed partially or over a frame.
【請求項3】 細条の一部に切欠部を設けて樹脂バリ溜
り部としたことを特徴とする請求項2のリードフレー
ム。
3. The lead frame according to claim 2, wherein a notch is provided in a part of the narrow strip to form a resin burr pool.
【請求項4】 細条の一部もしくは枠体の一部を粗面加
工して樹脂バリ溜り部としたことを特徴とする請求項2
のリードフレーム。
4. A resin burr storing part formed by roughening a part of a thin strip or a part of a frame body.
Lead frame.
JP20082197A 1997-07-10 1997-07-10 Method for manufacturing resin-sealed semiconductor device, and lead frame used for it Pending JPH1131775A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20082197A JPH1131775A (en) 1997-07-10 1997-07-10 Method for manufacturing resin-sealed semiconductor device, and lead frame used for it

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20082197A JPH1131775A (en) 1997-07-10 1997-07-10 Method for manufacturing resin-sealed semiconductor device, and lead frame used for it

Publications (1)

Publication Number Publication Date
JPH1131775A true JPH1131775A (en) 1999-02-02

Family

ID=16430773

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20082197A Pending JPH1131775A (en) 1997-07-10 1997-07-10 Method for manufacturing resin-sealed semiconductor device, and lead frame used for it

Country Status (1)

Country Link
JP (1) JPH1131775A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002083927A (en) * 2000-09-07 2002-03-22 Matsushita Electric Ind Co Ltd Semiconductor device
WO2006070581A1 (en) * 2004-12-28 2006-07-06 Kokusan Denki Co., Ltd. Semiconductor device
US7193320B2 (en) 2002-05-30 2007-03-20 Fujitsu Limited Semiconductor device having a heat spreader exposed from a seal resin
US7659144B2 (en) 2006-02-21 2010-02-09 Renesas Technology Corp. Semiconductor device and manufacturing the same
JP2012216858A (en) * 2012-06-15 2012-11-08 Renesas Electronics Corp Semiconductor device manufacturing method and semiconductor device

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002083927A (en) * 2000-09-07 2002-03-22 Matsushita Electric Ind Co Ltd Semiconductor device
US7193320B2 (en) 2002-05-30 2007-03-20 Fujitsu Limited Semiconductor device having a heat spreader exposed from a seal resin
WO2006070581A1 (en) * 2004-12-28 2006-07-06 Kokusan Denki Co., Ltd. Semiconductor device
US7741708B2 (en) 2004-12-28 2010-06-22 Kokusan Denki Co., Ltd. Semiconductor device
JP4811273B2 (en) * 2004-12-28 2011-11-09 国産電機株式会社 Semiconductor device
US7659144B2 (en) 2006-02-21 2010-02-09 Renesas Technology Corp. Semiconductor device and manufacturing the same
JP2012216858A (en) * 2012-06-15 2012-11-08 Renesas Electronics Corp Semiconductor device manufacturing method and semiconductor device

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