JPH11317191A5 - - Google Patents

Info

Publication number
JPH11317191A5
JPH11317191A5 JP1999070761A JP7076199A JPH11317191A5 JP H11317191 A5 JPH11317191 A5 JP H11317191A5 JP 1999070761 A JP1999070761 A JP 1999070761A JP 7076199 A JP7076199 A JP 7076199A JP H11317191 A5 JPH11317191 A5 JP H11317191A5
Authority
JP
Japan
Prior art keywords
electrode
substrate
ionization chamber
facing
insulating layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1999070761A
Other languages
English (en)
Japanese (ja)
Other versions
JPH11317191A (ja
JP4338810B2 (ja
Filing date
Publication date
Priority claimed from DE19811556A external-priority patent/DE19811556A1/de
Application filed filed Critical
Publication of JPH11317191A publication Critical patent/JPH11317191A/ja
Publication of JPH11317191A5 publication Critical patent/JPH11317191A5/ja
Application granted granted Critical
Publication of JP4338810B2 publication Critical patent/JP4338810B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

JP07076199A 1998-03-17 1999-03-16 電離箱およびｘ線システム Expired - Lifetime JP4338810B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19811556:3 1998-03-17
DE19811556A DE19811556A1 (de) 1998-03-17 1998-03-17 Strahlungsmeßeinrichtung mit einer Ionisatonskammer

Publications (3)

Publication Number Publication Date
JPH11317191A JPH11317191A (ja) 1999-11-16
JPH11317191A5 true JPH11317191A5 (OSRAM) 2006-05-11
JP4338810B2 JP4338810B2 (ja) 2009-10-07

Family

ID=7861199

Family Applications (1)

Application Number Title Priority Date Filing Date
JP07076199A Expired - Lifetime JP4338810B2 (ja) 1998-03-17 1999-03-16 電離箱およびｘ線システム

Country Status (4)

Country Link
US (1) US6236711B1 (OSRAM)
EP (1) EP0944108B1 (OSRAM)
JP (1) JP4338810B2 (OSRAM)
DE (1) DE19811556A1 (OSRAM)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10213482B4 (de) * 2002-03-22 2007-09-27 Xtreme Technologies Gmbh Detektoranordnung zur Impulsenergiemessung von gepulster Röntgenstrahlung
DE10313602B4 (de) * 2003-03-26 2013-05-08 Siemens Aktiengesellschaft Vorrichtung zur Messung einer Strahlungsdosis
WO2006046206A1 (en) 2004-10-29 2006-05-04 Koninklijke Philips Electronics N.V. Portable x-ray detector unit
WO2006126075A2 (en) * 2005-05-27 2006-11-30 Ion Beam Applications, S.A. Device and method for quality assurance and online verification of radiation therapy
JP2013506823A (ja) * 2009-10-01 2013-02-28 イオン・ビーム・アプリケーションズ・エス・アー エネルギービームのライン制御装置および方法
WO2013057618A2 (en) 2011-10-18 2013-04-25 Koninklijke Philips Electronics N.V. Dose measuring in x-ray imaging
DE102012210638A1 (de) * 2012-06-22 2013-12-24 Siemens Aktiengesellschaft Verfahren zur Ermittlung des Zustands einer Strahlungsquelle, sowie Röntgenvorrichtung, insbesondere Röntgenangiographievorrichtung, ausgebildet zur Durchführung des Verfahrens
US11073623B2 (en) * 2017-06-29 2021-07-27 Shimadzu Corporation Radiation measuring instrument and radiation imaging apparatus
WO2019003406A1 (ja) * 2017-06-30 2019-01-03 株式会社島津製作所 放射線計測器および放射線撮影装置
IT202100019211A1 (it) * 2021-07-20 2023-01-20 Devices & Tech Torino S R L Elettrodo sensore per rivelatori a ionizzazione e rivelatore a ionizzazione che lo incorpora

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1082989B (de) 1959-02-27 1960-06-09 Siemens Reiniger Werke Ag Strahlenmesseinrichtung mit einer grossflaechigen Ionisationskammer
GB1494519A (en) * 1974-02-28 1977-12-07 Siemens Ag Preparation of radiograms
US4230944A (en) * 1979-02-09 1980-10-28 Advanced Instrument Development, Inc. X-ray system exposure control with ion chamber
JPS56119876A (en) * 1980-02-27 1981-09-19 Toshiba Corp Semiconductor x-ray detector
AU570439B2 (en) * 1983-03-28 1988-03-17 Compression Labs, Inc. A combined intraframe and interframe transform coding system
US5264701A (en) * 1992-03-26 1993-11-23 General Electric Company Ion chamber for X-ray detection

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