JPH11219976A - Method for mounting semiconductor chip and semiconductor device - Google Patents

Method for mounting semiconductor chip and semiconductor device

Info

Publication number
JPH11219976A
JPH11219976A JP10018861A JP1886198A JPH11219976A JP H11219976 A JPH11219976 A JP H11219976A JP 10018861 A JP10018861 A JP 10018861A JP 1886198 A JP1886198 A JP 1886198A JP H11219976 A JPH11219976 A JP H11219976A
Authority
JP
Japan
Prior art keywords
semiconductor chip
base substrate
underfill resin
filling
sides
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10018861A
Other languages
Japanese (ja)
Inventor
Kenji Takahashi
賢二 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP10018861A priority Critical patent/JPH11219976A/en
Publication of JPH11219976A publication Critical patent/JPH11219976A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15151Shape the die mounting substrate comprising an aperture, e.g. for underfilling, outgassing, window type wire connections

Abstract

PROBLEM TO BE SOLVED: To provide a method for filling under-fill resin and its device wherein, by shortening a filling time of an under-fill resin, production efficiency of a semiconductor chip is raised while occurrence of void is eliminated. SOLUTION: A semiconductor chip 1 is mounted on a base substrate 3 through a solder bump 2, and, while a dispenser syringe 4 is moved along three or more sides of the semiconductor chip 1, an under-fill resin 6 is filled in a gap between the semiconductor chip 1 and the base substrate 3. During the filling process, vacuum-suction is performed through a hole 9 opened around center of a part of the base substrate 3 where the semiconductor chip 1 is allocated.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、半導体チップをプ
リント配線基板に搭載した半導体チップ実装方法及び装
置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and apparatus for mounting a semiconductor chip on a printed wiring board.

【0002】[0002]

【従来の技術】従来、MPUやゲートアレイに用いる多
ピンのLSIパッケージには、半導体チップのボンディ
ングパット部に共晶ハンダのバンプを形成し、フェイス
ダウンにて、対向するセラミック基板の端子部とを溶融
接合するフリップチップ実装方式が採用されてきた。
2. Description of the Related Art Conventionally, in a multi-pin LSI package used for an MPU or a gate array, a eutectic solder bump is formed on a bonding pad portion of a semiconductor chip, and the terminal portion of the opposing ceramic substrate is face-down. Has been adopted in a flip chip mounting method of melting and bonding the components.

【0003】この方式によるフリップチップ素子の実装
では、一般に、チップの電極に形成されたハンダバンプ
をベース基板の電極パッドに接合する。しかし、ここで
問題となるのは、半導体チップとベース基板との熱膨張
係数の差によって生ずるハンダバンプ接合部の応力によ
って、ハンダバンプ接合部が破断し易いことである。こ
の問題を解決する手段として、半導体チップとベース基
板との隙間に液状の絶縁樹脂(アンダフィル樹脂)を充
填する方法(以下アンダフィル充填方法と呼ぶ)がとら
れている。
In mounting a flip chip element by this method, generally, solder bumps formed on the electrodes of the chip are joined to the electrode pads on the base substrate. However, the problem here is that the solder bump joint is easily broken by the stress of the solder bump joint caused by the difference in thermal expansion coefficient between the semiconductor chip and the base substrate. As a means for solving this problem, a method of filling a gap between the semiconductor chip and the base substrate with a liquid insulating resin (underfill resin) (hereinafter referred to as an underfill filling method) has been adopted.

【0004】このアンダフィル充填方法としては、図4
に示されている如く、半導体チップ1をハンダバンプ2
を介してベース基板3に実装した後、ディスペンサシリ
ンジ4のニードル5の先端から、液状のアンダフィル樹
脂6を半導体チップ1の一辺又は2辺に沿って塗布し、
毛細管現象により内部に侵み込ませて供給する方法が一
般にとられている。
FIG. 4 shows an underfill filling method.
As shown in FIG.
After mounting on the base substrate 3 through the above, a liquid underfill resin 6 is applied from one end of the needle 5 of the dispenser syringe 4 along one side or two sides of the semiconductor chip 1,
In general, a method of infiltrating the inside by capillary action and supplying the same is employed.

【0005】この様子、即ちアンダフィル樹脂6を半導
体チップ1の一辺又は2辺に沿って塗布した様子を示し
たのが図5で、同図(A)はディスペンサシリンジ4を
ベース基板3の一辺上に矢示7方向に走らせて、アンダ
フィル樹脂6を塗布した状態を、又同図(B)はディス
ペンサシリンジ4をベース基板3の2辺上に矢示8方向
に走らせて、アンダフィル樹脂6を塗布した状態を、そ
れぞれ示している。
FIG. 5 shows this state, that is, a state in which the underfill resin 6 is applied along one side or two sides of the semiconductor chip 1, and FIG. 5A shows the dispenser syringe 4 connected to one side of the base substrate 3. In the state where the underfill resin 6 is applied by running upward in the direction indicated by arrow 7, the dispenser syringe 4 is driven in the direction indicated by arrow 8 on two sides of the base substrate 3 by applying the underfill resin 6. 6 shows a state where 6 is applied.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、この様
な従来の塗布方法では、半導体チップ1とベース基板3
との隙間が約70μmと微細である事から、アンダフィ
ル樹脂6が半導体チップ1の全面に充填するまで長時間
を要し、その為生産効率が悪いことと、充填に長時間を
要することから、アンダフィル樹脂6のゲル化が進み、
その結果粘度が増して、半導体チップ1の中央部にボイ
ドが出来る等の問題点があった。
However, in such a conventional coating method, the semiconductor chip 1 and the base substrate 3 are not provided.
Is very small, about 70 μm, so that it takes a long time to fill the entire surface of the semiconductor chip 1 with the underfill resin 6, which results in poor production efficiency and a long time for the filling. The gelation of the underfill resin 6 proceeds,
As a result, there is a problem that the viscosity is increased and a void is formed in the central portion of the semiconductor chip 1.

【0007】そこで、本発明の目的は、アンダフィル樹
脂の充填時間を短縮させる事により、半導体チップの生
産効率を高め、且つボイドの発生を排除したアンダフィ
ル樹脂の充填方法及びその装置を提供することにある。
Accordingly, an object of the present invention is to provide a method and an apparatus for filling an underfill resin in which the production time of a semiconductor chip is increased by reducing the filling time of the underfill resin and the generation of voids is eliminated. It is in.

【0008】[0008]

【課題を解決するための手段】本発明の半導体チップ実
装方法は、ベース基板上にハンダバンプを介して、半導
体チップを搭載する工程と、このベース基板上に搭載さ
れた半導体チップの3辺以上の辺に沿ってディスペンサ
シリンジを移動しつつ、前記ベース基板および半導体チ
ップの間隙にアンダフィル樹脂を充填する工程と、この
充填工程中に前記半導体チップが搭載された部分のベー
ス基板に開けられた孔を介して、真空吸引する工程とを
備えたことを特徴とするものである。
According to the present invention, there is provided a semiconductor chip mounting method comprising the steps of mounting a semiconductor chip on a base substrate via solder bumps, and mounting the semiconductor chip on three or more sides of the semiconductor chip mounted on the base substrate. Filling the gap between the base substrate and the semiconductor chip with an underfill resin while moving the dispenser syringe along the side; and holes formed in the base substrate in the portion where the semiconductor chip is mounted during the filling step. And a step of vacuum suction via

【0009】又、本発明半導体チップ実装方法は、ベー
ス基板上に搭載された半導体チップの4辺に沿ってディ
スペンサシリンジを移動しつつ、前記ベース基板および
半導体チップの間隙にアンダフィル樹脂を充填すること
を特徴とするものである。本発明の半導体チップ実装方
法によって製造される半導体装置は、ベース基板上にハ
ンダバンプを介して搭載された半導体チップと、この半
導体チップが搭載された部分のベース基板に開けられた
真空吸引孔とを備えたことを特徴とするものである。
Further, according to the semiconductor chip mounting method of the present invention, a gap between the base substrate and the semiconductor chip is filled with an underfill resin while moving a dispenser syringe along four sides of the semiconductor chip mounted on the base substrate. It is characterized by the following. A semiconductor device manufactured by the semiconductor chip mounting method of the present invention includes a semiconductor chip mounted on a base substrate via solder bumps, and a vacuum suction hole formed in a portion of the base substrate where the semiconductor chip is mounted. It is characterized by having.

【0010】[0010]

【発明の実施の形態】以下、本発明の実施形態を図1乃
至図3に基づいて説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to FIGS.

【0011】図1は本発明の半導体チップ実装方法の一
実施形態を示した断面図、図2は本発明の実装方法に用
いるベース基板の平面図、そして図3は本発明によるア
ンダフィル樹脂の充填方法を示す説明図である。これら
の図においては、図4及び図5と同一構成部は同一符号
を付し、以下では詳細な説明は省略する。
FIG. 1 is a sectional view showing an embodiment of a semiconductor chip mounting method of the present invention, FIG. 2 is a plan view of a base substrate used in the mounting method of the present invention, and FIG. It is explanatory drawing which shows a filling method. In these drawings, the same components as those in FIGS. 4 and 5 are denoted by the same reference numerals, and a detailed description thereof will be omitted below.

【0012】図1及び図2において、半導体チップ1が
配置された部分のベース基板3には、半導体チップ1の
ほぼ中央部のハンダバンプ2のない部分に、孔9が開け
られていて、ディスペンサシリンジ4から半導体チップ
1とベース基板3との間隙にアンダフィル樹脂6を充填
する際、ベース基板3の裏側、即ち図1の下面に設けら
れた真空装置10によって真空吸引させる様になってい
る。
In FIG. 1 and FIG. 2, a hole 9 is formed in a portion of the base substrate 3 where the semiconductor chip 1 is disposed, in a portion of the semiconductor chip 1 where no solder bump 2 is provided, and a dispenser syringe is provided. When the underfill resin 6 is filled in the gap between the semiconductor chip 1 and the base substrate 3 from 4, vacuum suction is performed by a vacuum device 10 provided on the back side of the base substrate 3, that is, on the lower surface of FIG. 1.

【0013】この様な構成において、アンダフィル樹脂
6がディスペンサシリンジ4によって、半導体チップ1
の3辺或いは4辺に沿って半導体チップ1とベース基板
3との間隙に充填される。そして、このディスペンサシ
リンジ4によるアンダフィル樹脂6の充填とともに、真
空装置10によって、孔9から真空吸引する。
In such a configuration, the underfill resin 6 is transferred to the semiconductor chip 1 by the dispenser syringe 4.
Is filled in the gap between the semiconductor chip 1 and the base substrate 3 along the three or four sides. Then, the underfill resin 6 is filled with the dispenser syringe 4 and, at the same time, vacuum suction is performed through the hole 9 by the vacuum device 10.

【0014】この孔9からの真空吸引によって、アンダ
フィル樹脂6の中央部への充填速度が促進され、その結
果、アンダフィル樹脂6の充填時間が短縮されることに
なる。
By the vacuum suction from the holes 9, the filling speed of the underfill resin 6 into the central portion is accelerated, and as a result, the filling time of the underfill resin 6 is shortened.

【0015】次に、本発明により、アンダフィル樹脂6
がベース基板3上で半導体チップ1の3辺以上に沿って
充填する様子を、図3に基づいて説明する。
Next, according to the present invention, the underfill resin 6
The state of filling along three or more sides of the semiconductor chip 1 on the base substrate 3 will be described with reference to FIG.

【0016】図3には、このアンダフィル樹脂6を、半
導体チップ1の3辺或いは4辺に沿って、充填した状態
が示されていて、同図(A)は、半導体チップ1の3辺
に沿って、矢示11方向にディスペンサシリンジ4を走
らせて、アンダフィル樹脂6を塗布した場合のアンダフ
ィル樹脂6の広がり状態を、又同図(B)は、半導体チ
ップ1の4辺に沿って、矢示12方向にディスペンサシ
リンジ4を走らせて、アンダフィル樹脂6を充填した場
合のアンダフィル樹脂6の広がり状態を、それぞれ示し
ている。
FIG. 3 shows a state in which the underfill resin 6 is filled along three or four sides of the semiconductor chip 1, and FIG. Along the arrow 11, the dispenser syringe 4 is run in the direction of arrow 11 to apply the underfill resin 6, and the spread state of the underfill resin 6 is shown. The spreading state of the underfill resin 6 when the underfill resin 6 is filled by running the dispenser syringe 4 in the direction of arrow 12 is shown.

【0017】このように、アンダフィル樹脂6の充填
が、ディスペンサシリンジ4を半導体チップ1の3辺或
いは4辺に沿って矢示11或いは12で示すように一方
向に走らせて行うため、真空装置10による真空吸引作
用に加えて、アンダフィル樹脂6の充填時間を更に短縮
させる事となる。
As described above, the filling of the underfill resin 6 is performed by running the dispenser syringe 4 in one direction along the three sides or four sides of the semiconductor chip 1 as shown by arrows 11 or 12. In addition to the vacuum suction action by the step 10, the filling time of the underfill resin 6 is further reduced.

【0018】[0018]

【発明の効果】上記した本発明によれば、ベース基板の
半導体チップが搭載された部分のほぼ中央部に真空吸引
用の孔を設けるという、極めて簡単な構成でアンダフィ
ル樹脂を半導体チップの辺に沿って半導体チップとベー
ス基板との間隙に充填しつつ、その孔から真空吸引する
ため、アンダフィル樹脂の充填速度が促進され、その結
果、アンダフィル樹脂6の充填時間が大幅に短縮され
て、中央部に生ずるボイドを完全に排除することが可能
となる。
According to the present invention described above, the underfill resin is provided on the side of the semiconductor chip with a very simple structure in which a hole for vacuum suction is provided substantially at the center of the portion of the base substrate on which the semiconductor chip is mounted. While filling the gap between the semiconductor chip and the base substrate along with, the vacuum suction from the hole accelerates the filling speed of the underfill resin, and as a result, the filling time of the underfill resin 6 is greatly reduced. In addition, it is possible to completely eliminate voids generated in the central portion.

【0019】又、本発明によれば、アンダフィル樹脂が
ベース基板上に搭載された半導体チップの3辺以上に沿
って充填されるため、ベース基板にあけられた孔からの
真空吸引作用に加えて、アンダフィル樹脂の充填速度が
更に促進され、より一層の充填時間の短縮が計られ、ベ
ース基板の中央部でのボンド発生をより完全に排除で
き、半導体チップの信頼性を著しく向上させることが出
来る。
Further, according to the present invention, the underfill resin is filled along three or more sides of the semiconductor chip mounted on the base substrate. As a result, the filling speed of the underfill resin is further promoted, the filling time is further reduced, the occurrence of bonds at the center of the base substrate can be more completely eliminated, and the reliability of the semiconductor chip is significantly improved. Can be done.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明によるアンダフィル樹脂の充填工程を示
す説明断面図である。
FIG. 1 is an explanatory sectional view showing a step of filling an underfill resin according to the present invention.

【図2】本発明に用いるベース基板の平面図である。FIG. 2 is a plan view of a base substrate used in the present invention.

【図3】本発明によるベース基板へのアンダフィル樹脂
の充填方法を示した図で、(A)は半導体チップの3辺
からアンダフィル樹脂を充填した状態を示した平面図、
(B)は半導体チップの4辺からアンダフィル樹脂を充
填した状態を示した平面図である。
3A and 3B are diagrams showing a method of filling an underfill resin into a base substrate according to the present invention, wherein FIG. 3A is a plan view showing a state where the underfill resin is filled from three sides of a semiconductor chip;
(B) is a plan view showing a state where the underfill resin is filled from four sides of the semiconductor chip.

【図4】従来のアンダフィル樹脂の充填工程を示す説明
断面図である。
FIG. 4 is an explanatory sectional view showing a conventional underfill resin filling step.

【図5】従来技術によるベース基板へのアンダフィル樹
脂を充填した状態を示した図で、(A)は半導体チップ
の一辺からアンダフィル樹脂を充填した状態を示した平
面図、(B)は半導体チップの2辺からアンダフィル樹
脂を充填した状態を示した平面図である。
5A and 5B are diagrams showing a state in which an underfill resin is filled in a base substrate according to the related art, wherein FIG. 5A is a plan view showing a state in which the underfill resin is filled from one side of a semiconductor chip, and FIG. FIG. 4 is a plan view showing a state where an underfill resin is filled from two sides of the semiconductor chip.

【符号の説明】[Explanation of symbols]

1……………………………半導体チップ 2……………………………ハンダバンプ 3……………………………ベース基板 4……………………………ディスペンサシリンジ 5……………………………ニードル 6……………………………アンダフィル樹脂 7,8,11,12………矢示 9……………………………孔 10…………………………真空装置 1. Semiconductor chip 2. Solder bump 3. Solder bump 3. Base substrate 4. Base board 4. …… Dispenser syringe 5 ………………… Needle 6 ………………………… Underfill resin 7, 8, 11, 12 …………… Hole 10 …………………… Vacuum device

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 ベース基板上にハンダバンプを介して、
半導体チップを搭載する工程と、このベース基板上に搭
載された半導体チップの3辺以上の辺に沿ってディスペ
ンサシリンジを移動しつつ、前記ベース基板および半導
体チップの間隙にアンダフィル樹脂を充填する工程と、
この充填工程中に前記半導体チップが搭載された部分の
ベース基板に開けられた孔を介して、真空吸引する工程
とを備えたことを特徴とする半導体チップ実装方法。
1. A solder bump on a base substrate,
Mounting a semiconductor chip, and filling an underfill resin into a gap between the base substrate and the semiconductor chip while moving a dispenser syringe along three or more sides of the semiconductor chip mounted on the base substrate When,
A step of performing vacuum suction through a hole formed in a portion of the base substrate where the semiconductor chip is mounted during the filling step.
【請求項2】 前記ベース基板上に搭載された半導体チ
ップの4辺に沿って前記ディスペンサシリンジを移動し
つつ、前記ベース基板および半導体チップの間隙にアン
ダフィル樹脂を充填することを特徴とする請求項1記載
の半導体チップ実装方法。
2. A gap between the base substrate and the semiconductor chip is filled with an underfill resin while moving the dispenser syringe along four sides of the semiconductor chip mounted on the base substrate. Item 2. The semiconductor chip mounting method according to Item 1.
【請求項3】 ベース基板上にハンダバンプを介して搭
載された半導体チップと、この半導体チップが搭載され
た部分のベース基板に開けられた真空吸引孔とを備えた
ことを特徴とする半導体装置。
3. A semiconductor device comprising: a semiconductor chip mounted on a base substrate via solder bumps; and a vacuum suction hole formed in a portion of the base substrate where the semiconductor chip is mounted.
JP10018861A 1998-01-30 1998-01-30 Method for mounting semiconductor chip and semiconductor device Pending JPH11219976A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10018861A JPH11219976A (en) 1998-01-30 1998-01-30 Method for mounting semiconductor chip and semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10018861A JPH11219976A (en) 1998-01-30 1998-01-30 Method for mounting semiconductor chip and semiconductor device

Publications (1)

Publication Number Publication Date
JPH11219976A true JPH11219976A (en) 1999-08-10

Family

ID=11983334

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10018861A Pending JPH11219976A (en) 1998-01-30 1998-01-30 Method for mounting semiconductor chip and semiconductor device

Country Status (1)

Country Link
JP (1) JPH11219976A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104979225A (en) * 2015-05-19 2015-10-14 深圳创维-Rgb电子有限公司 Bottom filling method for preventing cold solder joint of BGA IC
WO2023105307A1 (en) * 2021-12-06 2023-06-15 International Business Machines Corporation Underfill vacuum process

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104979225A (en) * 2015-05-19 2015-10-14 深圳创维-Rgb电子有限公司 Bottom filling method for preventing cold solder joint of BGA IC
WO2023105307A1 (en) * 2021-12-06 2023-06-15 International Business Machines Corporation Underfill vacuum process

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