JPH11209734A - Liquid joint member - Google Patents

Liquid joint member

Info

Publication number
JPH11209734A
JPH11209734A JP1870698A JP1870698A JPH11209734A JP H11209734 A JPH11209734 A JP H11209734A JP 1870698 A JP1870698 A JP 1870698A JP 1870698 A JP1870698 A JP 1870698A JP H11209734 A JPH11209734 A JP H11209734A
Authority
JP
Japan
Prior art keywords
bis
aminophenoxy
phenyl
propane
formula
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1870698A
Other languages
Japanese (ja)
Inventor
Naoki Hase
直樹 長谷
Hiroyuki Furuya
浩行 古谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kanegafuchi Chemical Industry Co Ltd
Original Assignee
Kanegafuchi Chemical Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kanegafuchi Chemical Industry Co Ltd filed Critical Kanegafuchi Chemical Industry Co Ltd
Priority to JP1870698A priority Critical patent/JPH11209734A/en
Publication of JPH11209734A publication Critical patent/JPH11209734A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/4826Connecting between the body and an opposite side of the item with respect to the body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73215Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA

Landscapes

  • Adhesives Or Adhesive Processes (AREA)
  • Die Bonding (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain a liquid joint member excellent in heat tolerance, processability and adhesion, and having a low water absorption by including a polyimide polymer having a specific repeating unit, glass transition temperature and water absorption. SOLUTION: This liquid joint member includes a polyimide polymer containing a repeating unit of formula I [R1 is a tetravalent organic group; (n) is 1-10], and having <=200 deg.C glass transition temperature and <=1% water absorption. In formula I, R1 is preferably formulas II or III, or the like. The polyimide polymer is, for example, obtained by using (A) a tetracarboxylic dianhydride of formula IV [e.g. 2,2'-bis(4-hydroxyphenyl) propanedibenzoate-3,3',4,4'-tetracarboxylic dianhydride] and (B) a diamine of formula V e.g. 1,2-bis-[2-(4-aminophenoxy)ethoxy]ethane} as a raw material.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は液状接合部材に関
し、詳しくは、電子部品、電子回路基板等の固定用又は
絶縁用等の耐熱性を要求される液状接合部材に関する。
特には、フレキシブルプリント基板(以下、FPCと略
す。)や半導体素子のダイボンディング用、あるいはL
OC(Lead on Chip)、BGA(Ball Grid Array )、
CSP(ChipSize Package )などの半導体装置の実装
材料として好適に用いることのできる液状接合部材に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid bonding member, and more particularly, to a liquid bonding member which is required to have heat resistance, such as for fixing electronic parts and electronic circuit boards, or for insulation.
In particular, for die bonding of a flexible printed circuit board (hereinafter abbreviated as FPC) or a semiconductor element, or
OC (Lead on Chip), BGA (Ball Grid Array),
The present invention relates to a liquid bonding member that can be suitably used as a mounting material for a semiconductor device such as a CSP (ChipSize Package).

【0002】[0002]

【従来の技術】近年、電子機器の高機能化、高性能化、
小型化が進んでおり、それらに伴って用いられる電子部
品に対する小型化、軽量化が求められてきている。その
ため、半導体素子パッケージ方法やそれらを実装する配
線材料又は配線部品も、より高密度、高機能、かつ高性
能なものが求められるようになってきた。特に、LO
C、CSP、BGAといった構造の半導体パッケー
ジ、、MCM(Multi Chip Module )等の高密度実装材
料や多層FPC等のプリント配線材料、さらには、航空
宇宙材料として好適に用いることのできる、良好な接着
特性を示す絶縁接着材料が求められている。
2. Description of the Related Art In recent years, electronic devices have become more sophisticated and more sophisticated.
With miniaturization progressing, there has been a demand for miniaturization and weight reduction of electronic components used accordingly. For this reason, a semiconductor element packaging method and a wiring material or a wiring component for mounting the same are required to have higher density, higher function and higher performance. In particular, LO
Good adhesion that can be suitably used as a semiconductor package having a structure such as C, CSP, or BGA, a high-density mounting material such as an MCM (Multi Chip Module), a printed wiring material such as a multilayer FPC, and an aerospace material. There is a need for an insulating adhesive material that exhibits properties.

【0003】一般に、電子部品や電子材料に用いられる
絶縁接着材料としては、低温(200℃)で加工でき、
取り扱いが容易であることから、エポキシ系樹脂やアク
リル系樹脂等が用いられることが多く、これらの接着材
料は半導体装置を製造するときに、例えば、エポキシ樹
脂に銀フィラーを分散させた銀ペーストとして、リード
フレームと半導体チップを接着する用途にも用いられて
いる。
[0003] In general, an insulating adhesive material used for electronic parts and electronic materials can be processed at a low temperature (200 ° C).
Because of easy handling, epoxy resins and acrylic resins are often used.When manufacturing semiconductor devices, these adhesive materials are used, for example, as a silver paste in which a silver filler is dispersed in an epoxy resin. It is also used for bonding a lead frame and a semiconductor chip.

【0004】しかし、これらの接合部材は、低温での取
り扱いは容易であるが、高温での耐熱性に劣るという問
題を有している。また、硬化には長時間のキュアを必要
とし、キュア時には低分子量のガスが発生するため、例
えば、リードフレームと半導体チップを接合する用途に
用いた場合、その発生ガスによりチップ表面が汚れ、リ
ードフレームとチップの密着性が悪くなり、製品の歩留
まりが悪くなるという問題も有している。その為、特に
半導体装置を製造するときのような高密度実装材料用途
には、更なる高性能な接合部材が強く要望されている。
[0004] However, these joining members are easy to handle at low temperatures, but have a problem that they are inferior in heat resistance at high temperatures. In addition, curing requires a long curing time, and a low molecular weight gas is generated during the curing.For example, when used for bonding a lead frame and a semiconductor chip, the generated gas contaminates the chip surface and leads There is also a problem that the adhesion between the frame and the chip is deteriorated, and the yield of products is deteriorated. Therefore, especially for high-density packaging materials such as when manufacturing semiconductor devices, there is a strong demand for further high-performance bonding members.

【0005】かかる要望に応える接合部材として、高い
耐熱性、機械的強度を有しており、しかも電気特性に優
れるポリイミドは、その優れた特性により有望である。
しかし、一般にポリイミドは閉環状態でほとんど不溶、
不融であり、有機絶縁材料として、FPCやTAB用F
Cテープのベースフィルム等には利用されている。
As a joining member meeting such demands, polyimide having high heat resistance and mechanical strength and excellent electrical properties is promising because of its excellent properties.
However, in general, polyimide is almost insoluble in the closed state,
It is infusible and used as an organic insulating material for FPC and TAB
It is used as a base film for C tape.

【0006】近年、ポリイミドであり接合部材として使
用できる例が提案されてきている。無水ピロメリット酸
と通常の芳香族ジアミンとから合成されるポリアミド酸
のようなポリイミド樹脂の前駆体溶液に銀フィラーを混
練してなる銀ペースト組成物が提案されており、これに
よればダイボンディング時の加熱硬化により上記前駆体
が閉環(イミド化)して耐熱性に優れたポリイミド樹脂
を与えるため、半導体装置の高温での電気特性に好結果
がもたらされる。例えば、特開昭60−71662で
は、シロキサンジアミンを用いたシロキサン変性ポリイ
ミド樹脂の前駆体の有機溶剤溶液に銀フィラーを混練さ
せた導電性銀ペースト組成物が開示されている。
In recent years, examples have been proposed in which polyimide is used as a joining member. A silver paste composition has been proposed in which a silver filler is kneaded in a precursor solution of a polyimide resin such as polyamic acid synthesized from pyromellitic anhydride and a normal aromatic diamine, and according to this, die bonding is performed. The precursor is ring-closed (imidized) by heat curing to give a polyimide resin having excellent heat resistance, and therefore, good results are obtained in the high-temperature electrical characteristics of the semiconductor device. For example, JP-A-60-71662 discloses a conductive silver paste composition in which a silver filler is kneaded in an organic solvent solution of a siloxane-modified polyimide resin precursor using siloxane diamine.

【0007】また、特開平2−138789号では、3,
3',4,4'-ベンゾフェノンテトラカルボン酸二無水物と芳
香族ジアミンからなる芳香族ポリイミドとマレイミドと
を混合した樹脂組成物から得られる接着フィルムを用
い、ポリイミドフィルム等の基材と銅箔を接着させるF
PCの製造方法が提案されている。また、特開平5−1
709224号や特開平5−112768号では、種々
の加熱圧着できる熱可塑性ポリイミド接着材料について
提案されている。
In Japanese Patent Application Laid-Open No. 2-138789, 3,3
3 ', 4,4'-benzophenonetetracarboxylic dianhydride and an aromatic polyimide composed of an aromatic diamine using an adhesive film obtained from a resin composition mixed with maleimide, a substrate such as a polyimide film and a copper foil Glue F
A method for manufacturing a PC has been proposed. Further, Japanese Patent Application Laid-Open No.
JP-A-709224 and JP-A-5-112768 propose various kinds of thermoplastic polyimide adhesive materials which can be heated and pressed.

【0008】[0008]

【発明が解決しようとする課題】しかしながら、銀フィ
ラーを混練したエポキシ樹脂や、ポリイミド前駆体を用
い、閉環(イミド化)した樹脂では、吸湿率が比較的高
く、エポキシ樹脂で半導体装置を樹脂封止し、ハンダリ
フロー等の240℃程度の熱履歴がかけられた際、接着
剤等が吸湿した水分が膨張し、パッケージクラックを生
じるという問題があった。
However, an epoxy resin mixed with a silver filler or a resin which is ring-closed (imidized) using a polyimide precursor has a relatively high moisture absorption rate, and the semiconductor device is sealed with the epoxy resin. When a thermal history of about 240 ° C. such as solder reflow is applied, moisture absorbed by the adhesive or the like expands, and a package crack occurs.

【0009】また、上記記載のポリイミド系フィルム状
接合部材は、ポリイミド溶融流動性を改善して接着剤と
しての利用を可能としているものの、接着に高温・長時
間を要し、加工性に問題があった。
Although the polyimide-based film-like joining member described above improves the polyimide melt flowability and can be used as an adhesive, it requires a high temperature and a long time for adhesion and has a problem in workability. there were.

【0010】また、フィルム状接合部材は、従来の銀ペ
ーストで利用されてきた接合設備及び工程が利用でき
ず、フィルムを打ち抜き、リードフレームに貼り合せる
といった新たな設備が必要となる。フィルムに関して
も、リール状のラインで流されるため、所定の大きさに
打ち抜く際は、長尺方向でちぎれないように、打ち抜か
れたフィルムに余白があり、これは廃棄処分となる。こ
のように、銀ペーストからフィルム状接着剤に移行する
際に、半導体装置製造のコストアップにつながるという
問題もある。
[0010] In addition, the film-shaped joining member cannot use the joining equipment and process used in the conventional silver paste, and requires new equipment for punching a film and bonding the film to a lead frame. Since the film is also flowed on a reel-shaped line, when punching into a predetermined size, the punched film has a margin so as not to be broken in the longitudinal direction, and this is discarded. As described above, there is also a problem that the transition from the silver paste to the film adhesive leads to an increase in the cost of manufacturing the semiconductor device.

【0011】[発明の目的]そこで、本発明者らは、上
記問題を解決し、耐熱性、加工性、接着性に優れ、特に
は低い吸水率を示す優れた特性を有する液状接合部材を
提供することを目的に鋭意研究を重ねた結果、本発明に
至ったのである。
[Object of the Invention] Accordingly, the present inventors have solved the above problems and provided a liquid joining member having excellent properties such as excellent heat resistance, workability, and adhesiveness, and particularly exhibiting a low water absorption. As a result of intensive studies for the purpose of doing so, the present invention has been achieved.

【0012】[0012]

【課題を解決するための手段】本発明の液状接合部材
は、下記一般式(1)
The liquid joining member of the present invention has the following general formula (1):

【化3】 (ただし、式中Rは4価の有機基、nは1〜10の整
数を示す)で表される繰り返し単位を含有し、かつガラ
ス転移温度が200℃以下と吸水率が1%以下のポリイ
ミド重合体を含む液状接合部材である。
Embedded image (Wherein, R 1 is a tetravalent organic group, n is an integer of 1 to 10), and has a glass transition temperature of 200 ° C. or less and a water absorption of 1% or less. It is a liquid joining member containing a polyimide polymer.

【0013】また、上記一般式(1)において、R
下記一般式(2)
In the above general formula (1), R 1 is the following general formula (2)

【化4】 (ただし、式中Xは2価の有機基を示す)で表される基
から選択される少なくとも1種であることが好適であ
る。
Embedded image (Wherein, X represents a divalent organic group), and is preferably at least one selected from groups represented by the following formula:

【0014】[0014]

【発明の実施の形態】以下、本発明に係る液状接合部材
の製造方法と共に具体的に説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a method for manufacturing a liquid bonding member according to the present invention will be specifically described.

【0015】本発明において用いられるポリエステルイ
ミドは、例えば、次のようにして製造される。
The polyesterimide used in the present invention is produced, for example, as follows.

【0016】下記一般式(A)The following general formula (A)

【化5】 (式中、Rは一般式(1)におけるRと同じ4価の
有機基を示す)で表されるテトラカルボン酸二無水物
と、下記一般式(B)
Embedded image (Wherein, R 1 represents the same tetravalent organic group as R 1 in the general formula (1)) and the tetracarboxylic dianhydride represented by the following general formula (B)

【化6】 (式中、nは1〜10の整数を示す)で表されるジアミ
ンを原料として得ることができる。
Embedded image (Wherein, n represents an integer of 1 to 10) can be obtained as a raw material.

【0017】一般式(A)で表される化合物の最も代表
的な例としては、ピロメリット酸二無水物(以下、PM
DAと略す)、3,3',4,4'-ベンゾフェノンテトラカルボ
ン酸二無水物(以下、BTDAと略す)、3,3',4,4'-ビ
フェニルテトラカルボン酸二無水物(以下、BPDAと
略す)、3,3',4,4'-オキシジフタル酸二無水物(以下、
ODPAと略す)、2,2'- ビス(4-ヒドロキシフェニ
ル)プロパンジベンゾエート-3,3',4,4'- テトラカルボ
ン酸二無水物(以下、ESDAと略す)、3,3',4,4'-エ
チレングリコールジベンゾエートテトラカルボン酸二無
水物(以下、EGDAと略す)、3,3',4,4'-ハイドロキ
ノンジベンゾエートテトラカルボン酸二無水物(以下、
TMHQと略す)が挙げられる。これらは1種または2
種以上を混合して用いることができる。
The most typical example of the compound represented by the general formula (A) is pyromellitic dianhydride (hereinafter referred to as PM).
DA), 3,3 ′, 4,4′-benzophenonetetracarboxylic dianhydride (hereinafter abbreviated as BTDA), 3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride (hereinafter abbreviated) BPDA), 3,3 ', 4,4'-oxydiphthalic dianhydride (hereinafter, referred to as BPDA)
ODPA), 2,2′-bis (4-hydroxyphenyl) propanedibenzoate-3,3 ′, 4,4′-tetracarboxylic dianhydride (hereinafter abbreviated as ESDA), 3,3 ′, 4,4′-ethylene glycol dibenzoate tetracarboxylic dianhydride (hereinafter abbreviated as EGDA), 3,3 ′, 4,4′-hydroquinone dibenzoate tetracarboxylic dianhydride (hereinafter, referred to as EGDA)
TMHQ). These are one or two
A mixture of more than one species can be used.

【0018】一般式(B)で表されるジアミンとして
は、nが1〜10で選ばれる少なくとも1種または、2
種以上を混合して用いることができ、また、その他のジ
アミン類も、本発明の効果が阻害されない程度、混合し
て用いることができる。
As the diamine represented by the general formula (B), n is at least one selected from 1 to 10 or 2
More than one species can be used as a mixture, and other diamines can be used as a mixture to the extent that the effects of the present invention are not impaired.

【0019】その他のジアミン類としては、p−フェニ
レンジアミン、m−フェニレンジアミン、1,4-ジアミノ
ジフェニル、4,4'- ジアミノジフェニルエーテル、3,3'
- ジアミノジフェニルエーテル、4,4'- ジアミノベンゾ
フェノン、4,4'- ジアミノジフェニルプロパン、4,4'-
ジアミノジフェニルスルフィド、3,4'- ジアミノジフェ
ニルスルフィド、3,3'- ジアミノジフェニルスルフィ
ド、4,4'- ジアミノジフェニルスルホン、3,4'- ジアミ
ノジフェニルスルホン、3,3'- ジアミノジフェニルスル
ホン、4,4'- ジアミノジフェニルアミン、4,4'- ジアミ
ノジフェニル-N-メチルアミン、4,4'- ジアミノジフェ
ニル-N- フェニルアミン、4,4'- ジアミノジフェニルメ
タン、1,2-ビス(2-(4-アミノフェノキシ)エトキシ)
エタン、1,2-ビス(2-(3-アミノフェノキシ)エトキ
シ)エタン、2,2-ビス((4-アミノフェノキシ)メチ
ル)プロパン、2,2-ビス((3-アミノフェノキシ)メチ
ル)プロパン、1,3-ビス(3-アミノフェノキシ)ベンゼ
ン、1,3-ビス(4-アミノフェノキシ)ベンゼン、1,4-ビ
ス(4-アミノフェノキシ)ベンゼン、1,1-ビス(4-(4-
アミノフェノキシ)フェニル)メタン、1,1-ビス(3-メ
チル-4- (4-アミノフェノキシ)フェニル)メタン、1,
1-ビス(3-エチル-4- (4-アミノフェノキシ)フェニ
ル)メタン、1,1-ビス(3-プロピル-4- (4-アミノフェ
ノキシ)フェニル)メタン、1,1-ビス(3-イソプロピル
-4- (4-アミノフェノキシ)フェニル)メタン、1,1-ビ
ス(3-ブチル-4- (4-アミノフェノキシ)フェニル)メ
タン、1,1-ビス(3-sec-ブチル-4- (4-アミノフェノキ
シ)フェニル)メタン、1,1-ビス(3-メトキシ-4- (4-
アミノフェノキシ)フェニル)メタン、1,1-ビス(3-エ
トキシ-4- (4-アミノフェノキシ)フェニル)メタン、
1,1-ビス(3,5-ジメチル-4- (4-アミノフェノキシ)フ
ェニル)メタン、1,1-ビス(3,5-ジメトキシ-4- (4-ア
ミノフェノキシ)フェニル)メタン、1,1-ビス(4-(4-
アミノフェノキシ)フェニル)エタン、1,1-ビス(3-メ
チル-4- (4-アミノフェノキシ)フェニル)エタン、1,
1-ビス(3-エチル-4- (4-アミノフェノキシ)フェニ
ル)エタン、1,1-ビス(3-プロピル-4- (4-アミノフェ
ノキシ)フェニル)エタン、1,1-ビス(3-イソプロピル
-4- (4-アミノフェノキシ)フェニル)エタン、1,1-ビ
ス(3-ブチル-4- (4-アミノフェノキシ)フェニル)エ
タン、1,1-ビス(3-sec-ブチル-4- (4-アミノフェノキ
シ)フェニル)エタン、1,1-ビス(3-メトキシ-4- (4-
アミノフェノキシ)フェニル)エタン、1,1-ビス(3-エ
トキシ-4- (4-アミノフェノキシ)フェニル)エタン、
1,1-ビス(3,5-ジメチル-4- (4-アミノフェノキシ)フ
ェニル)エタン、1,1-ビス(3,5-ジメトキシ-4- (4-ア
ミノフェノキシ)フェニル)エタン、2,2-ビス(4-(4-
アミノフェノキシ)フェニル)プロパン、2,2-ビス(3-
メチル-4- (4-アミノフェノキシ)フェニル)プロパ
ン、2,2-ビス(3-エチル-4- (4-アミノフェノキシ)フ
ェニル)プロパン、2,2-ビス(3-プロピル-4-(4-アミ
ノフェノキシ)フェニル)プロパン、2,2-ビス(3-イソ
プロピル-4- (4-アミノフェノキシ)フェニル)プロパ
ン、2,2-ビス(3-ブチル-4- (4-アミノフェノキシ)フ
ェニル)プロパン、2,2-ビス(3-sec −ブチル-4- (4-
アミノフェノキシ)フェニル)プロパン、2,2-ビス(3-
メトキシ-4- (4-アミノフェノキシ)フェニル)プロパ
ン、2,2-ビス(3-エトキシ-4- (4-アミノフェノキシ)
フェニル)プロパン、2,2-ビス(3,5-ジメチル-4- (4-
アミノフェノキシ)フェニル)プロパン、2,2-ビス(3,
5-ジメトキシ-4- (4-アミノフェノキシ)フェニル)プ
ロパン、1,1-ビス(4-(4-アミノフェノキシ)フェニ
ル)プロパン、1,1-ビス(3-メチル-4- (4-アミノフェ
ノキシ)フェニル)プロパン、1,1-ビス(3-エチル-4-
(4-アミノフェノキシ)フェニル)プロパン、1,1-ビス
(3-プロピル-4- (4-アミノフェノキシ)フェニル)プ
ロパン、1,1-ビス(3-イソプロピル-4-(4-アミノフェ
ノキシ)フェニル)プロパン、1,1-ビス(3-ブチル-4-
(4-アミノフェノキシ)フェニル)プロパン、1,1-ビス
(3-sec −ブチル-4- (4-アミノフェノキシ)フェニ
ル)プロパン、1,1-ビス(3-メトキシ-4- (4-アミノフ
ェノキシ)フェニル)プロパン、1,1-ビス(3-エトキシ
-4- (4-アミノフェノキシ)フェニル)プロパン、1,1-
ビス(3,5-ジメチル-4- (4-アミノフェノキシ)フェニ
ル)プロパン、1,1-ビス(3,5-ジメトキシ-4- (4-アミ
ノフェノキシ)フェニル)プロパン、1,1,1,3,3,3-ヘキ
サフルオロ-2,2- ビス(4-(4-アミノフェノキシ)フェ
ニル)プロパン、1,1,1,3,3,3-ヘキサフルオロ-2,2- ビ
ス(3-メチル-4- (4-アミノフェノキシ)フェニル)プ
ロパン、1,1,1,3,3,3-ヘキサフルオロ-2,2- ビス(3-エ
チル-4- (4-アミノフェノキシ)フェニル)プロパン、
1,1,1,3,3,3-ヘキサフルオロ-2,2- ビス(3-プロピル-4
- (4-アミノフェノキシ)フェニル)プロパン、1,1,1,
3,3,3-ヘキサフルオロ-2,2- ビス(3-イソプロピル-4-
(4-アミノフェノキシ)フェニル)プロパン、1,1,1,3,
3,3-ヘキサフルオロ-2,2-ビス(3-ブチル-4- (4-アミ
ノフェノキシ)フェニル)プロパン、1,1,1,3,3,3-ヘキ
サフルオロ-2,2- ビス(3-sec −ブチル-4- (4-アミノ
フェノキシ)フェニル)プロパン、1,1,1,3,3,3-ヘキサ
フルオロ-2,2- ビス(3-メトキシ-4- (4-アミノフェノ
キシ)フェニル)プロパン、1,1,1,3,3,3-ヘキサフルオ
ロ-2,2- ビス(3-エトキシ-4- (4-アミノフェノキシ)
フェニル)プロパン、1,1,1,3,3,3-ヘキサフルオロ-2,2
- ビス(3,5-ジメチル-4- (4-アミノフェノキシ)フェ
ニル)プロパン、1,1,1,3,3,3-ヘキサフルオロ-2,2- ビ
ス(3,5-ジメトキシ-4- (4-アミノフェノキシ)フェニ
ル)プロパン、2,2-ビス(4-(4-アミノフェノキシ)フ
ェニル)ブタン、2,2-ビス(3-メチル-4- (4-アミノフ
ェノキシ)フェニル)ブタン、2,2-ビス(3-エチル-4-
(4-アミノフェノキシ)フェニル)ブタン、2,2-ビス
(3-プロピル-4- (4-アミノフェノキシ)フェニル)ブ
タン、2,2-ビス(3-イソプロピル-4- (4-アミノフェノ
キシ)フェニル)ブタン、2,2-ビス(3-ブチル-4- (4-
アミノフェノキシ)フェニル)ブタン、2,2-ビス(3-se
c −ブチル-4- (4-アミノフェノキシ)フェニル)ブタ
ン、2,2-ビス(3-メトキシ-4- (4-アミノフェノキシ)
フェニル)ブタン、2,2-ビス(3-エトキシ-4- (4-アミ
ノフェノキシ)フェニル)ブタン、2,2-ビス(3,5-ジメ
チル-4- (4-アミノフェノキシ)フェニル)ブタン、2,
2-ビス(3,5-ジメトキシ-4- (4-アミノフェノキシ)フ
ェニル)ブタン、3,3-ビス(4-(4-アミノフェノキシ)
フェニル)ペンタン、3,3-ビス(3-メチル-4- (4-アミ
ノフェノキシ)フェニル)ペンタン、3,3-ビス(3-エチ
ル-4- (4-アミノフェノキシ)フェニル)ペンタン、3,
3-ビス(3-プロピル-4- (4-アミノフェノキシ)フェニ
ル)ペンタン、3,3-ビス(3-イソプロピル-4- (4-アミ
ノフェノキシ)フェニル)ペンタン、3,3-ビス(3-ブチ
ル-4- (4-アミノフェノキシ)フェニル)ペンタン、3,
3-ビス(3-sec −ブチル-4- (4-アミノフェノキシ)フ
ェニル)ペンタン、3,3-ビス(3-メトキシ-4- (4-アミ
ノフェノキシ)フェニル)ペンタン、3,3-ビス(3-エト
キシ-4- (4-アミノフェノキシ)フェニル)ペンタン、
3,3-ビス(3,5-ジメチル-4- (4-アミノフェノキシ)フ
ェニル)プロパン、3,3-ビス(3,5-ジメトキシ-4- (4-
アミノフェノキシ)フェニル)ペンタン、3,5-ビス(4-
(4-アミノフェノキシ)フェニル)ペンタン、3,5-ビス
(3-メチル-4- (4-アミノフェノキシ)フェニル)ペン
タン、3,5-ビス(3-エチル-4- (4-アミノフェノキシ)
フェニル)ペンタン、3,5-ビス(3-プロピル-4- (4-ア
ミノフェノキシ)フェニル)ペンタン、3,5-ビス(3-イ
ソプロピル-4- (4-アミノフェノキシ)フェニル)ペン
タン、3,5-ビス(3-ブチル-4- (4-アミノフェノキシ)
フェニル)ペンタン、3,5-ビス(3-sec −ブチル-4-
(4-アミノフェノキシ)フェニル)ペンタン、3,5-ビス
(3-メトキシ-4- (4-アミノフェノキシ)フェニル)ペ
ンタン、3,5-ビス(3-エトキシ-4- (4-アミノフェノキ
シ)フェニル)ペンタン、3,5-ビス(3,5-ジメチル-4-
(4-アミノフェノキシ)フェニル)プロパン、3,5-ビス
(3,5-ジメトキシ-4- (4-アミノフェノキシ)フェニ
ル)ペンタン、ビス(4-(4-アミノフェノキシ)フェニ
ル)スルホン、ビス(4-(3-アミノフェノキシ)フェニ
ル)スルホン、ビス(4-(4-アミノフェノキシ)フェニ
ル)エーテル、ビス(3-(4-アミノフェノキシ)フェニ
ル)エーテル、ビス(3-(3-アミノフェノキシ)フェニ
ル)エーテルなどがある。
Other diamines include p-phenylenediamine, m-phenylenediamine, 1,4-diaminodiphenyl, 4,4'-diaminodiphenyl ether, 3,3 '
-Diaminodiphenyl ether, 4,4'-diaminobenzophenone, 4,4'-diaminodiphenylpropane, 4,4'-
Diaminodiphenyl sulfide, 3,4'-diaminodiphenyl sulfide, 3,3'-diaminodiphenyl sulfide, 4,4'-diaminodiphenyl sulfone, 3,4'-diaminodiphenyl sulfone, 3,3'-diaminodiphenyl sulfone, 4 , 4'-diaminodiphenylamine, 4,4'-diaminodiphenyl-N-methylamine, 4,4'-diaminodiphenyl-N-phenylamine, 4,4'-diaminodiphenylmethane, 1,2-bis (2- ( 4-aminophenoxy) ethoxy)
Ethane, 1,2-bis (2- (3-aminophenoxy) ethoxy) ethane, 2,2-bis ((4-aminophenoxy) methyl) propane, 2,2-bis ((3-aminophenoxy) methyl) Propane, 1,3-bis (3-aminophenoxy) benzene, 1,3-bis (4-aminophenoxy) benzene, 1,4-bis (4-aminophenoxy) benzene, 1,1-bis (4- ( Four-
Aminophenoxy) phenyl) methane, 1,1-bis (3-methyl-4- (4-aminophenoxy) phenyl) methane, 1,
1-bis (3-ethyl-4- (4-aminophenoxy) phenyl) methane, 1,1-bis (3-propyl-4- (4-aminophenoxy) phenyl) methane, 1,1-bis (3- Isopropyl
-4- (4-aminophenoxy) phenyl) methane, 1,1-bis (3-butyl-4- (4-aminophenoxy) phenyl) methane, 1,1-bis (3-sec-butyl-4- ( 4-aminophenoxy) phenyl) methane, 1,1-bis (3-methoxy-4- (4-
Aminophenoxy) phenyl) methane, 1,1-bis (3-ethoxy-4- (4-aminophenoxy) phenyl) methane,
1,1-bis (3,5-dimethyl-4- (4-aminophenoxy) phenyl) methane, 1,1-bis (3,5-dimethoxy-4- (4-aminophenoxy) phenyl) methane, 1-bis (4- (4-
Aminophenoxy) phenyl) ethane, 1,1-bis (3-methyl-4- (4-aminophenoxy) phenyl) ethane, 1,
1-bis (3-ethyl-4- (4-aminophenoxy) phenyl) ethane, 1,1-bis (3-propyl-4- (4-aminophenoxy) phenyl) ethane, 1,1-bis (3- Isopropyl
-4- (4-aminophenoxy) phenyl) ethane, 1,1-bis (3-butyl-4- (4-aminophenoxy) phenyl) ethane, 1,1-bis (3-sec-butyl-4- ( 4-aminophenoxy) phenyl) ethane, 1,1-bis (3-methoxy-4- (4-
Aminophenoxy) phenyl) ethane, 1,1-bis (3-ethoxy-4- (4-aminophenoxy) phenyl) ethane,
1,1-bis (3,5-dimethyl-4- (4-aminophenoxy) phenyl) ethane, 1,1-bis (3,5-dimethoxy-4- (4-aminophenoxy) phenyl) ethane, 2, 2-bis (4- (4-
Aminophenoxy) phenyl) propane, 2,2-bis (3-
Methyl-4- (4-aminophenoxy) phenyl) propane, 2,2-bis (3-ethyl-4- (4-aminophenoxy) phenyl) propane, 2,2-bis (3-propyl-4- (4 -Aminophenoxy) phenyl) propane, 2,2-bis (3-isopropyl-4- (4-aminophenoxy) phenyl) propane, 2,2-bis (3-butyl-4- (4-aminophenoxy) phenyl) Propane, 2,2-bis (3-sec-butyl-4- (4-
Aminophenoxy) phenyl) propane, 2,2-bis (3-
Methoxy-4- (4-aminophenoxy) phenyl) propane, 2,2-bis (3-ethoxy-4- (4-aminophenoxy)
Phenyl) propane, 2,2-bis (3,5-dimethyl-4- (4-
Aminophenoxy) phenyl) propane, 2,2-bis (3,
5-dimethoxy-4- (4-aminophenoxy) phenyl) propane, 1,1-bis (4- (4-aminophenoxy) phenyl) propane, 1,1-bis (3-methyl-4- (4-amino Phenoxy) phenyl) propane, 1,1-bis (3-ethyl-4-
(4-aminophenoxy) phenyl) propane, 1,1-bis (3-propyl-4- (4-aminophenoxy) phenyl) propane, 1,1-bis (3-isopropyl-4- (4-aminophenoxy) Phenyl) propane, 1,1-bis (3-butyl-4-
(4-aminophenoxy) phenyl) propane, 1,1-bis (3-sec-butyl-4- (4-aminophenoxy) phenyl) propane, 1,1-bis (3-methoxy-4- (4-amino Phenoxy) phenyl) propane, 1,1-bis (3-ethoxy)
-4- (4-aminophenoxy) phenyl) propane, 1,1-
Bis (3,5-dimethyl-4- (4-aminophenoxy) phenyl) propane, 1,1-bis (3,5-dimethoxy-4- (4-aminophenoxy) phenyl) propane, 1,1,1, 3,3,3-hexafluoro-2,2-bis (4- (4-aminophenoxy) phenyl) propane, 1,1,1,3,3,3-hexafluoro-2,2-bis (3- Methyl-4- (4-aminophenoxy) phenyl) propane, 1,1,1,3,3,3-hexafluoro-2,2-bis (3-ethyl-4- (4-aminophenoxy) phenyl) propane ,
1,1,1,3,3,3-hexafluoro-2,2-bis (3-propyl-4
-(4-aminophenoxy) phenyl) propane, 1,1,1,
3,3,3-hexafluoro-2,2-bis (3-isopropyl-4-
(4-aminophenoxy) phenyl) propane, 1,1,1,3,
3,3-hexafluoro-2,2-bis (3-butyl-4- (4-aminophenoxy) phenyl) propane, 1,1,1,3,3,3-hexafluoro-2,2-bis ( 3-sec-butyl-4- (4-aminophenoxy) phenyl) propane, 1,1,1,3,3,3-hexafluoro-2,2-bis (3-methoxy-4- (4-aminophenoxy) ) Phenyl) propane, 1,1,1,3,3,3-hexafluoro-2,2-bis (3-ethoxy-4- (4-aminophenoxy)
Phenyl) propane, 1,1,1,3,3,3-hexafluoro-2,2
-Bis (3,5-dimethyl-4- (4-aminophenoxy) phenyl) propane, 1,1,1,3,3,3-hexafluoro-2,2-bis (3,5-dimethoxy-4- (4-aminophenoxy) phenyl) propane, 2,2-bis (4- (4-aminophenoxy) phenyl) butane, 2,2-bis (3-methyl-4- (4-aminophenoxy) phenyl) butane, 2,2-bis (3-ethyl-4-
(4-aminophenoxy) phenyl) butane, 2,2-bis (3-propyl-4- (4-aminophenoxy) phenyl) butane, 2,2-bis (3-isopropyl-4- (4-aminophenoxy) Phenyl) butane, 2,2-bis (3-butyl-4- (4-
Aminophenoxy) phenyl) butane, 2,2-bis (3-se
c-Butyl-4- (4-aminophenoxy) phenyl) butane, 2,2-bis (3-methoxy-4- (4-aminophenoxy)
Phenyl) butane, 2,2-bis (3-ethoxy-4- (4-aminophenoxy) phenyl) butane, 2,2-bis (3,5-dimethyl-4- (4-aminophenoxy) phenyl) butane, 2,
2-bis (3,5-dimethoxy-4- (4-aminophenoxy) phenyl) butane, 3,3-bis (4- (4-aminophenoxy)
Phenyl) pentane, 3,3-bis (3-methyl-4- (4-aminophenoxy) phenyl) pentane, 3,3-bis (3-ethyl-4- (4-aminophenoxy) phenyl) pentane,
3-bis (3-propyl-4- (4-aminophenoxy) phenyl) pentane, 3,3-bis (3-isopropyl-4- (4-aminophenoxy) phenyl) pentane, 3,3-bis (3- Butyl-4- (4-aminophenoxy) phenyl) pentane, 3,
3-bis (3-sec-butyl-4- (4-aminophenoxy) phenyl) pentane, 3,3-bis (3-methoxy-4- (4-aminophenoxy) phenyl) pentane, 3,3-bis ( 3-ethoxy-4- (4-aminophenoxy) phenyl) pentane,
3,3-bis (3,5-dimethyl-4- (4-aminophenoxy) phenyl) propane, 3,3-bis (3,5-dimethoxy-4- (4-
Aminophenoxy) phenyl) pentane, 3,5-bis (4-
(4-aminophenoxy) phenyl) pentane, 3,5-bis (3-methyl-4- (4-aminophenoxy) phenyl) pentane, 3,5-bis (3-ethyl-4- (4-aminophenoxy)
Phenyl) pentane, 3,5-bis (3-propyl-4- (4-aminophenoxy) phenyl) pentane, 3,5-bis (3-isopropyl-4- (4-aminophenoxy) phenyl) pentane, 5-bis (3-butyl-4- (4-aminophenoxy)
Phenyl) pentane, 3,5-bis (3-sec-butyl-4-
(4-aminophenoxy) phenyl) pentane, 3,5-bis (3-methoxy-4- (4-aminophenoxy) phenyl) pentane, 3,5-bis (3-ethoxy-4- (4-aminophenoxy) Phenyl) pentane, 3,5-bis (3,5-dimethyl-4-
(4-aminophenoxy) phenyl) propane, 3,5-bis (3,5-dimethoxy-4- (4-aminophenoxy) phenyl) pentane, bis (4- (4-aminophenoxy) phenyl) sulfone, bis ( 4- (3-aminophenoxy) phenyl) sulfone, bis (4- (4-aminophenoxy) phenyl) ether, bis (3- (4-aminophenoxy) phenyl) ether, bis (3- (3-aminophenoxy) Phenyl) ether.

【0020】また、本発明において脂肪族または脂環式
ジアミンを、本発明の効果を著しく低下させない範囲で
使用してもよい。このようなジアミンとしては、ピペラ
ジン、ヘキサメチレンジアミン、ヘプタメチレンジアミ
ン、テトラメチレンジアミン、p−キシリレンジアミ
ン、m−キシリレンジアミン、3−メチルヘプタメチレ
ンジアミンなどがある。これらのジアミンを単独で用い
ることもできるし、また、共重合させてもよい。
In the present invention, an aliphatic or alicyclic diamine may be used as long as the effects of the present invention are not significantly reduced. Examples of such a diamine include piperazine, hexamethylenediamine, heptamethylenediamine, tetramethylenediamine, p-xylylenediamine, m-xylylenediamine, and 3-methylheptamethylenediamine. These diamines can be used alone or may be copolymerized.

【0021】本発明のポリエステルイミド重合体を得る
ための重合方法としては、極性溶媒中で一般式(C)
As a polymerization method for obtaining the polyesterimide polymer of the present invention, a compound represented by the following general formula (C) is used in a polar solvent.

【化7】 (ただし、Rは一般式(1)と同じもの、nは1〜1
0の整数を示す)で表されるポリアミド酸誘導体を合
成、単離した後、イミド化して一般式(1)で表される
ポリイミド重合体を得る二段合成法や、極性溶媒中でイ
ミド化まで完結させて、一般式(1)で表されるポリイ
ミド重合体を得る一段合成法を利用できる。
Embedded image (Where R 1 is the same as in the general formula (1), and n is 1 to 1)
A polyamic acid derivative represented by the general formula (1) is synthesized, isolated, and then imidized to obtain a polyimide polymer represented by the general formula (1), or imidation in a polar solvent. To obtain a polyimide polymer represented by the general formula (1).

【0022】まず、一段合成法について説明する。上記
一般式(A)で表される酸二無水物1当量に対してジア
ミンを0.8〜1.2当量、好ましくは0.95〜1.
05当量使用し、N,N−ジメチルホルムアミド、N,
N−ジメチルアセトアミド、N−メチル−2−ピロリド
ン等の極性溶媒中で0〜100℃で数十分から数時間反
応させた後、イミド化を行う。イミド化には、(1)5
0〜200℃で数十分から数時間、加熱により反応させ
てイミド化を行う方法と、(2)50〜180℃で、無
水酢酸2〜5当量、ピリジン1〜2当量加えて化学的に
イミド化を促進する方法がある。
First, the one-step synthesis method will be described. The diamine is used in an amount of 0.8 to 1.2 equivalents, preferably 0.95 to 1.1 equivalent, relative to 1 equivalent of the acid dianhydride represented by the general formula (A).
05 equivalents, N, N-dimethylformamide, N, N
After reaction in a polar solvent such as N-dimethylacetamide or N-methyl-2-pyrrolidone at 0 to 100 ° C. for several tens of minutes to several hours, imidization is performed. (1) 5
(2) 2 to 5 equivalents of acetic anhydride and 1 to 2 equivalents of pyridine are added at 50 to 180 ° C. and chemically. There is a method of promoting imidization.

【0023】次に、二段合成法について説明する。上記
一般式(A)で表される酸二無水物1当量に対してジア
ミンを0.8〜1.2当量、好ましくは0.95〜1.
05当量使用し、N,N−ジメチルホルムアミド、N,
N−ジメチルアセトアミド、N−メチル−2−ピロリド
ン等の極性溶媒中で0〜100℃、好ましくは0〜60
℃の範囲で反応させることによって、上記一般式(C)
で表されるポリアミド酸誘導体を製造し、従来より用い
られている脱水環化法により、一般式(1)で表される
本発明のポリイミド重合体を製造することができる。脱
水環化法としては(1)重合体を単離した後、150〜
350℃の加熱により環化する方法、(2)溶液状態に
おいて、80〜400℃、好ましくは100〜250℃
で加熱することで環化する方法、この時、ベンゼン、ト
ルエン、キシレンのような水と共沸する溶媒を併用する
のが好ましい。(3)溶液状態で酢酸、プロピオン酸、
酪酸、安息香酸等の酸無水物のような化学的脱水剤によ
り環化する方法がある。この時、環化反応を促進する物
質としてピリジン、キノリン、ピコリン等を併用するこ
とが好ましい。中でも、β−ピコリンは、他のアミン類
に比べイミド化をより促進させ、かつ比較的沸点が低い
ことから、ポリイミド樹脂を製造する際にバランスのよ
いアミン類であり、特に好ましい。
Next, the two-stage synthesis method will be described. The diamine is used in an amount of 0.8 to 1.2 equivalents, preferably 0.95 to 1.1 equivalent, relative to 1 equivalent of the acid dianhydride represented by the general formula (A).
05 equivalents, N, N-dimethylformamide, N, N
0-100 ° C., preferably 0-60 ° C. in a polar solvent such as N-dimethylacetamide and N-methyl-2-pyrrolidone.
By reacting in the range of ° C, the above-mentioned general formula (C)
Is produced, and the polyimide polymer of the present invention represented by the general formula (1) can be produced by a conventionally used dehydration cyclization method. As the dehydration cyclization method, (1) after isolating the polymer,
A method of cyclizing by heating at 350 ° C., (2) in a solution state, 80 to 400 ° C., preferably 100 to 250 ° C.
Cyclization by heating at this time, and in this case, it is preferable to use a solvent azeotropic with water, such as benzene, toluene and xylene. (3) acetic acid, propionic acid,
There is a method of cyclizing with a chemical dehydrating agent such as an acid anhydride such as butyric acid and benzoic acid. At this time, it is preferable to use pyridine, quinoline, picoline, and the like in combination as substances that promote the cyclization reaction. Above all, β-picoline promotes imidation more than other amines and has a relatively low boiling point, so that it is a well-balanced amine when producing a polyimide resin, and is particularly preferable.

【0024】高分子量のポリイミド重合体を得るには、
酸二無水物をジアミンを上記範囲内で配合するのが好ま
しく、この範囲を外れると低分子量のものしか得られな
い傾向にある。
To obtain a high molecular weight polyimide polymer,
It is preferable to mix the diamine with the acid dianhydride in the above range, and if it is out of this range, only low molecular weight compounds tend to be obtained.

【0025】本発明のポリエステルイミド重合体を得る
方法は、上記のようにして得られた反応液を低級アルコ
ール、水等の上記極性溶媒と相溶性であり、かつ樹脂に
対して貧溶媒である溶媒を大過剰に注いで沈殿物を得
て、濾過、乾燥し、粉砕して粉体を得る。
In the method for obtaining the polyesterimide polymer of the present invention, the reaction solution obtained as described above is compatible with the above-mentioned polar solvents such as lower alcohol and water, and is a poor solvent for the resin. The solvent is poured into a large excess to obtain a precipitate, which is filtered, dried and pulverized to obtain a powder.

【0026】さらにこれを、液状接合部材として利用す
るためには、N,N−ジメチルホルムアミド、N,N−
ジメチルアセトアミド、N−メチル−2−ピロリドン等
の極性溶媒中に上記粉体を溶解させればよい。
Further, in order to use this as a liquid joining member, N, N-dimethylformamide, N, N-
The powder may be dissolved in a polar solvent such as dimethylacetamide and N-methyl-2-pyrrolidone.

【0027】この接合部材に熱伝導性が必要な場合、樹
脂に対して0〜80重量%のAg、Au、Al、Cu、
Ni、C、SiC、SiO、MgO、BN、Al
、BaSO、ZrO等の熱伝導性フィラーを混入
することができる。フィラーが80重量%を超えると接
着性が低下する。また、導電性が必要な場合、樹脂に対
して50〜80重量%のAg、Au、Al、Cu、N
i、C等の金属フィラーを使用することができる。フィ
ラーが50重量%より少ないと導電性付与効果が小さ
く、80重量%を超えると接着性が低下する。
When the joining member needs to have thermal conductivity, Ag, Au, Al, Cu, 0 to 80% by weight with respect to the resin.
Ni, C, SiC, SiO 2 , MgO, BN 3 , Al 2
A thermally conductive filler such as O 3 , BaSO 4 , or ZrO can be mixed. If the amount of the filler exceeds 80% by weight, the adhesiveness is reduced. When conductivity is required, 50 to 80% by weight of Ag, Au, Al, Cu, N
Metal fillers such as i and C can be used. When the amount of the filler is less than 50% by weight, the effect of imparting conductivity is small, and when the amount exceeds 80% by weight, the adhesiveness is reduced.

【0028】本発明の液状接合部材を用いて半導体装置
における支持部材に半導体素子を接合するには、以下の
ような方法がある。(1)支持部材に上記液状接合部材
をディスペンスし、この上に半導体素子を載置して加熱
処理をする。(2)上記液状接合部材の浴に支持部材の
接着面を漬け、その上に半導体素子を載置して加熱処理
をする。(3)半導体素子の接合面に、上記液状接合部
材をディスペンスし、この上に支持部材を載置して加熱
処理をする。(4)上記液状接合部材の浴に半導体素子
の接着面を漬け、その上に支持部材を載置して加熱処理
をする。
There are the following methods for joining a semiconductor element to a support member in a semiconductor device using the liquid joining member of the present invention. (1) The liquid bonding member is dispensed on a support member, and a semiconductor element is mounted thereon to perform a heat treatment. (2) The bonding surface of the support member is immersed in the bath of the liquid bonding member, and the semiconductor element is mounted thereon and subjected to heat treatment. (3) The liquid bonding member is dispensed on the bonding surface of the semiconductor element, and a supporting member is placed thereon to perform a heat treatment. (4) The bonding surface of the semiconductor element is immersed in the bath of the liquid bonding member, and a supporting member is placed thereon to perform a heat treatment.

【0029】このような接着加工の後、支持部材と半導
体素子の電気的接合をはかる目的で、ワイヤボンディン
グが施され、エポキシ樹脂等の樹脂封止やガラス封止、
セラミック封止等で封止される。
After such bonding, wire bonding is performed for the purpose of electrically connecting the support member and the semiconductor element, and resin sealing such as epoxy resin or glass sealing is performed.
Sealed by ceramic sealing or the like.

【0030】このようにして得られた半導体装置を図1
から図3に示す。図1から図3は樹脂封止型半導体装置
の断面図であり、図1は、支持部材(リードフレーム)
3に、接合部材2を介して半導体素子1が接合されてお
り、半導体素子1と外部リード線6はボンディングワイ
ヤ4によってワイヤーボンディングされている。半導体
装置全体はエポキシ樹脂5で封止されている。図2は、
半導体素子1の上に接合部材2を介して外部リード線を
兼ねた支持部材3が接合されており、半導体素子1と支
持部材3はボンディングワイヤ4によってワイヤーボン
ディングされている。半導体装置全体はエポキシ樹脂5
で封止されている。図3は、回路パターンを施工したセ
ラミック、プラスチック、金属等の支持部材3の上に、
接合部材2を介して半導体素子1が接合されており、支
持部材3の回路パターン電極にボンディングワイヤ4に
よって半導体素子1が接合されている。この支持部材3
は、基板積層技術等によって厚み方向に電気的導通があ
り、半導体素子1の電極はボンディングワイヤ4を通し
て外部のハンダボール7に電気的に通じている。半導体
装置全体はエポキシ樹脂5で封止されている。
FIG. 1 shows the semiconductor device thus obtained.
3 to FIG. 1 to 3 are cross-sectional views of a resin-encapsulated semiconductor device. FIG. 1 is a supporting member (lead frame).
The semiconductor element 1 is bonded to the semiconductor element 3 via a bonding member 2, and the semiconductor element 1 and the external lead wires 6 are wire-bonded by bonding wires 4. The entire semiconductor device is sealed with epoxy resin 5. FIG.
A support member 3 also serving as an external lead wire is joined to the semiconductor element 1 via a joining member 2, and the semiconductor element 1 and the support member 3 are wire-bonded by a bonding wire 4. Epoxy resin 5 for the entire semiconductor device
It is sealed with. FIG. 3 shows a support member 3 made of a ceramic, plastic, metal or the like on which a circuit pattern is applied.
The semiconductor element 1 is joined via the joining member 2, and the semiconductor element 1 is joined to the circuit pattern electrode of the support member 3 by the bonding wire 4. This support member 3
Has electrical continuity in the thickness direction by a substrate laminating technique or the like, and the electrodes of the semiconductor element 1 are electrically connected to the external solder balls 7 through the bonding wires 4. The entire semiconductor device is sealed with epoxy resin 5.

【0031】[0031]

【実施例】次に、本発明の実施例をより具体的に説明す
るが、本発明はこれら実施例のみによって限定されるも
のではない。
Next, examples of the present invention will be described more specifically, but the present invention is not limited only to these examples.

【0032】実施例1 氷浴中において、撹拌機を備えた500ml三口セパラ
ブルフラスコに1,2-ビス(2-(4-アミノフェノキシ)エ
トキシ)エタン(以下、DA3EGと略す)16.5g
(49.6mmol)とN,N-ジメチルホルムアミド(以
下、DMFと略す。)239.6gを入れ、窒素雰囲気
下で撹拌し十分溶かした。次に、2,2'-ビス(4−ヒド
ロキシフェニル)プロパンジベンゾエート-3,3',4,4'-
テトラカルボン酸二無水物(ESDA)27.9g(4
8.6mmol)を投入し、10gのDMFでセパラブ
ルフラスコの壁面を洗浄した。約1時間撹拌しながら放
置した後、あらかじめ0.6gのESDAを5.4gの
DMFに溶かした溶液を、フラスコ中のワニス粘度に注
意しながらフラスコ中に徐々に投入した。粘度が200
0ポイズに達した後、ESDA溶液の投入を終了し、ポ
リアミド酸溶液を得た。
Example 1 In an ice bath, 16.5 g of 1,2-bis (2- (4-aminophenoxy) ethoxy) ethane (hereinafter abbreviated as DA3EG) was placed in a 500 ml three-neck separable flask equipped with a stirrer.
(49.6 mmol) and 239.6 g of N, N-dimethylformamide (hereinafter abbreviated as DMF) were added, and the mixture was stirred under a nitrogen atmosphere and dissolved sufficiently. Next, 2,2'-bis (4-hydroxyphenyl) propanedibenzoate-3,3 ', 4,4'-
27.9 g of tetracarboxylic dianhydride (ESDA) (4
8.6 mmol), and the wall of the separable flask was washed with 10 g of DMF. After being left for about 1 hour while stirring, a solution of 0.6 g of ESDA previously dissolved in 5.4 g of DMF was gradually charged into the flask while paying attention to the varnish viscosity in the flask. Viscosity 200
After reaching 0 poise, the introduction of the ESDA solution was terminated to obtain a polyamic acid solution.

【0033】ポリアミド酸の溶液状態で、イミド化を行
うため、室温でポリアミド酸溶液中に、無水酢酸10
g、ピリジン10g、DMF100gを入れ、数十分か
ら数時間撹拌し、イミド化を行った。
In order to carry out imidation in the state of a polyamic acid solution, acetic anhydride is added to the polyamic acid solution at room temperature.
g, 10 g of pyridine and 100 g of DMF were added, and the mixture was stirred for several tens of minutes to several hours to perform imidization.

【0034】得られたポリエステルイミド重合体溶液を
200g取り分け、2リットルのメタノール中に滴下
し、濾別してポリイミド重合体を得た。さらに、真空オ
ーブン100℃で、1日間真空乾燥し、粉体を得た。
A 200 g portion of the obtained polyesterimide polymer solution was separated, dropped into 2 liters of methanol, and filtered to obtain a polyimide polymer. Furthermore, it was vacuum-dried in a vacuum oven at 100 ° C. for one day to obtain a powder.

【0035】得られたポリエステルイミド重合粉体10
gを90gのN−メチル−2−ピロリドン(以下、NM
Pと略す)、DMF、N,N-ジメチルアセトアミド(以
下、DMAcと略す)に10重量%の濃度で溶解した。
さらに、得られた可溶性ポリイミド樹脂について、吸水
率とガラス転移温度を測定した。以下に、その測定方法
を示す。
The obtained polyesterimide polymerized powder 10
g to 90 g of N-methyl-2-pyrrolidone (hereinafter referred to as NM)
P), DMF, and N, N-dimethylacetamide (hereinafter abbreviated as DMAc) at a concentration of 10% by weight.
Further, the water absorption and the glass transition temperature of the obtained soluble polyimide resin were measured. Hereinafter, the measurement method will be described.

【0036】可溶性ポリイミド樹脂の固形分濃度が10
%のNMP溶液をガラス板上に、アプリケーターで0.
3mmの厚みに塗布後、熱風オーブンを用い、100
℃、150℃で5分間乾燥させた後、ガラス基板から剥
がし、得られた半乾燥状態のポリイミドフィルムの両端
部を固定し、さらに200℃、250℃で5分間乾燥さ
せ、30μm厚のポリイミドフィルムを得た。このよう
にして得られたポリイミドフィルムの吸水率をASTM
D−570に従い測定した。また、ガラス転移温度
は、得られたフィルムをDMS(動的粘弾性測定器、セ
イコー電子社製)により測定した。
When the solid concentration of the soluble polyimide resin is 10
% NMP solution on a glass plate with an applicator.
After applying to a thickness of 3 mm, using a hot air oven, 100
After drying at 150 ° C. for 5 minutes, peel off from the glass substrate, fix both ends of the obtained semi-dry polyimide film, and further dry at 200 ° C. and 250 ° C. for 5 minutes to obtain a 30 μm thick polyimide film. I got The water absorption of the polyimide film thus obtained was determined by ASTM.
It measured according to D-570. The glass transition temperature of the obtained film was measured by DMS (dynamic viscoelasticity meter, manufactured by Seiko Denshi Co., Ltd.).

【0037】得られた液状接合部材の接着性の評価は、
10×20mmの大きさの支持部材(42アロイ板)の
上に、アプリケーターで0.3mmの厚みに塗布後、1
00、150、200、250℃で5分間オーブンで焼
成し、30μmの塗布膜を得た。このようにして作製し
た、接合部材付き支持部材(42アロイ板)の上に、2
×2mmの半導体素子を載置して、300℃、2MPa
の圧力で2秒間プレスした。得られた半導体素子が接合
された支持部材のシェア強度を、シェア強度測定器を用
いて、テストスピード5mm/minで測定を行った。
The evaluation of the adhesiveness of the obtained liquid joining member is as follows.
On a support member (42 alloy plate) with a size of 10 × 20 mm, apply it to a thickness of 0.3 mm with an applicator, and then
It was baked in an oven at 00, 150, 200 and 250 ° C. for 5 minutes to obtain a 30 μm coating film. On the supporting member with the joining member (42 alloy plate) thus produced, 2
× 2mm semiconductor element is placed, 300 ℃, 2MPa
For 2 seconds. The shear strength of the support member to which the obtained semiconductor element was bonded was measured at a test speed of 5 mm / min using a shear strength measuring device.

【0038】また、ダミーのリードフレーム上に上記と
同様の条件で半導体素子を接合し、ビフェニル系のエポ
キシ樹脂を用いて封止した。そのダミーの半導体装置
を、85℃/85%の環境下で168時間放置した後、
室温から徐々に昇温し、最高温度245℃で約10秒間
加熱されるように、IRリフロー炉に通した。その後、
サンプルをX線透過装置(Ultra−X125)を用
いて非破壊検査を行い、半導体装置のパッケージクラッ
クの有無を確認した。その結果を表2に示す。
Further, a semiconductor element was bonded on a dummy lead frame under the same conditions as described above, and sealed using a biphenyl-based epoxy resin. After leaving the dummy semiconductor device in an environment of 85 ° C./85% for 168 hours,
The temperature was gradually raised from room temperature and passed through an IR reflow furnace so as to be heated at a maximum temperature of 245 ° C. for about 10 seconds. afterwards,
The sample was subjected to a nondestructive inspection using an X-ray transmission apparatus (Ultra-X125) to confirm the presence or absence of a package crack of the semiconductor device. Table 2 shows the results.

【0039】実施例2〜11 表1の原料を使用して、実施例1と同様に液状接合部材
を得、評価を行った。その結果を表2に示す。
Examples 2 to 11 Using the raw materials shown in Table 1, a liquid bonding member was obtained and evaluated in the same manner as in Example 1. Table 2 shows the results.

【0040】比較例1〜5 表1の原料を使用して、実施例1と同様にポリイミド重
合体の粉体を得た。その評価結果を表2に示す。
Comparative Examples 1 to 5 Using the raw materials shown in Table 1, powders of a polyimide polymer were obtained in the same manner as in Example 1. Table 2 shows the evaluation results.

【0041】[0041]

【表1】 ESDA;2,2'- ビス(4-ヒドロキシフェニル)プロパ
ンジベンゾエート-3,3',4,4'- テトラカルボン酸二無水
物 EGDA;3,3',4,4'-エチレングリコールベンゾエート
テトラカルボン酸二無水物 TMHQ;3,3',4,4'-ハイドロキノンジベンゾエートテ
トラカルボン酸二無水物 BPDA;3,3',4,4'-ビフェニルテトラカルボン酸二無
水物 ODPA;3,3',4,4'-オキシジフタル酸二無水物 BTDA;3,3',4,4'-ベンゾフェノンテトラカルボン酸
二無水物 DSDA;3,3',4,4'-ジフェニルスルホンテトラカルボ
ン酸二無水物 ODA;オキシジアニリン BAPP;2,2-ビス(4-アミノフェノキシ)フェニルプ
ロパン BAPS;ビス(4-(4-アミノフェノキシ)フェニル)
スルホン DA2EG;前記した[化6]におけるnが2のもの DA3EG;前記した[化6]におけるnが3のもの DA4EG;前記した[化6]におけるnが4のもの DA5EG;前記した[化6]におけるnが5のもの DA6EG;前記した[化6]におけるnが6のもの。
[Table 1] ESDA; 2,2'-bis (4-hydroxyphenyl) propanedibenzoate-3,3 ', 4,4'-tetracarboxylic dianhydride EGDA; 3,3', 4,4'-ethylene glycol benzoate tetra 3,3 ′, 4,4′-hydroquinone dibenzoate tetracarboxylic dianhydride BPDA; 3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride ODPA; 3,3 ′, 4,4′-hydroquinone dibenzoate tetracarboxylic dianhydride ODPA; ', 4,4'-oxydiphthalic dianhydride BTDA; 3,3', 4,4'-benzophenonetetracarboxylic dianhydride DSDA; 3,3 ', 4,4'-diphenylsulfonetetracarboxylic dianhydride Oda; oxydianiline BAPP; 2,2-bis (4-aminophenoxy) phenylpropane BAPS; bis (4- (4-aminophenoxy) phenyl)
Sulfone DA2EG; n of 2 in the above [Chemical Formula 6] is DA3EG; n of 3 in the above [Chemical Formula 6] is DA4EG; n in the above [Chemical Formula 6] is 4 DA5EG; And n is 5 in the above formula. DA6EG;

【0042】[0042]

【表2】 [Table 2]

【0043】[0043]

【発明の効果】以上のように、本発明に係る液状接合部
材は、NMP等の極性溶媒への溶解性がよく、接着性に
も優れ、しかも、ガラス転移温度が200℃以下であり
吸水率が1.0%以下という低い値を有している。
As described above, the liquid bonding member according to the present invention has good solubility in polar solvents such as NMP, excellent adhesiveness, and has a glass transition temperature of 200 ° C. or less and a water absorption rate. Has a low value of 1.0% or less.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例を示す液状接合部材を使用し
た半導体装置である。
FIG. 1 is a semiconductor device using a liquid bonding member according to an embodiment of the present invention.

【図2】他の実施例を示す液状接合部材を使用した半導
体装置である。
FIG. 2 is a semiconductor device using a liquid bonding member according to another embodiment.

【図3】さらに他の実施例を示す液状接合部材を使用し
た半導体装置である。
FIG. 3 is a semiconductor device using a liquid bonding member according to yet another embodiment.

【符号の説明】[Explanation of symbols]

1;半導体素子 2;接合部材 3;支持部材 4;ボンディングワイヤ 5;エポキシ封止樹脂 6;外部リード線 7;ハンダボール DESCRIPTION OF SYMBOLS 1; Semiconductor element 2; Joint member 3; Support member 4; Bonding wire 5; Epoxy sealing resin 6; External lead wire 7;

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】下記一般式(1) 【化1】 (ただし、式中Rは4価の有機基、nは1〜10の整
数を示す)で表される繰り返し単位を含有し、かつガラ
ス転移温度が200℃以下、吸水率が1%以下のポリイ
ミド重合体を含む液状接合部材。
(1) The following general formula (1): (Wherein, R 1 is a tetravalent organic group, and n is an integer of 1 to 10), and has a glass transition temperature of 200 ° C. or less and a water absorption of 1% or less. A liquid joining member containing a polyimide polymer.
【請求項2】前記一般式(1)において、Rが、下記
一般式(2) 【化2】 (ただし、式中Xは2価の有機基である)で表される基
から選択される少なくとも1種である請求項1記載の液
状接合部材。
2. In the general formula (1), R 1 represents the following general formula (2): The liquid joining member according to claim 1, wherein the liquid joining member is at least one selected from groups represented by the following formula (where X is a divalent organic group).
JP1870698A 1998-01-30 1998-01-30 Liquid joint member Pending JPH11209734A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1870698A JPH11209734A (en) 1998-01-30 1998-01-30 Liquid joint member

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1870698A JPH11209734A (en) 1998-01-30 1998-01-30 Liquid joint member

Publications (1)

Publication Number Publication Date
JPH11209734A true JPH11209734A (en) 1999-08-03

Family

ID=11979102

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1870698A Pending JPH11209734A (en) 1998-01-30 1998-01-30 Liquid joint member

Country Status (1)

Country Link
JP (1) JPH11209734A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005154436A (en) * 2003-11-05 2005-06-16 Chisso Corp New diamine and polymer using the same as raw material
JP2005157346A (en) * 2003-11-05 2005-06-16 Chisso Corp Liquid crystal aligning agent and liquid crystal display using the same
JP2007277384A (en) * 2006-04-06 2007-10-25 Sumitomo Metal Mining Co Ltd Electroconductive adhesive

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005154436A (en) * 2003-11-05 2005-06-16 Chisso Corp New diamine and polymer using the same as raw material
JP2005157346A (en) * 2003-11-05 2005-06-16 Chisso Corp Liquid crystal aligning agent and liquid crystal display using the same
JP4665487B2 (en) * 2003-11-05 2011-04-06 チッソ株式会社 New diamine and polymer made from it
JP2007277384A (en) * 2006-04-06 2007-10-25 Sumitomo Metal Mining Co Ltd Electroconductive adhesive

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