JPH11160280A - イオン化検出器 - Google Patents
イオン化検出器Info
- Publication number
- JPH11160280A JPH11160280A JP10258169A JP25816998A JPH11160280A JP H11160280 A JPH11160280 A JP H11160280A JP 10258169 A JP10258169 A JP 10258169A JP 25816998 A JP25816998 A JP 25816998A JP H11160280 A JPH11160280 A JP H11160280A
- Authority
- JP
- Japan
- Prior art keywords
- chamber
- ionization
- ionization chamber
- detector
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000002245 particle Substances 0.000 claims abstract description 61
- 230000002285 radioactive effect Effects 0.000 claims abstract description 50
- 238000001514 detection method Methods 0.000 claims abstract description 45
- 239000012530 fluid Substances 0.000 claims abstract description 24
- 230000003993 interaction Effects 0.000 claims abstract description 16
- 230000004888 barrier function Effects 0.000 claims abstract description 8
- 239000012491 analyte Substances 0.000 claims description 34
- 230000007246 mechanism Effects 0.000 claims description 11
- 239000007789 gas Substances 0.000 abstract description 57
- 239000012159 carrier gas Substances 0.000 abstract description 20
- 230000005855 radiation Effects 0.000 abstract description 2
- 239000000463 material Substances 0.000 abstract 1
- 229910052734 helium Inorganic materials 0.000 description 21
- 239000001307 helium Substances 0.000 description 21
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 20
- 230000004044 response Effects 0.000 description 9
- 239000000203 mixture Substances 0.000 description 7
- 229910052756 noble gas Inorganic materials 0.000 description 7
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 6
- 150000002835 noble gases Chemical class 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 238000002347 injection Methods 0.000 description 4
- 239000007924 injection Substances 0.000 description 4
- 150000002500 ions Chemical class 0.000 description 4
- 230000005264 electron capture Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 230000000712 assembly Effects 0.000 description 2
- 238000000429 assembly Methods 0.000 description 2
- 238000004587 chromatography analysis Methods 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 239000011888 foil Substances 0.000 description 2
- -1 helium ions Chemical class 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 238000013375 chromatographic separation Methods 0.000 description 1
- 230000003750 conditioning effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/64—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
- G01N27/66—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber and measuring current or voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/64—Electrical detectors
- G01N30/70—Electron capture detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/18—Measuring radiation intensity with counting-tube arrangements, e.g. with Geiger counters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
- H01J47/02—Ionisation chambers
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Electrochemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Toxicology (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US940,511 | 1997-09-30 | ||
| US08/940,511 US5920072A (en) | 1997-09-30 | 1997-09-30 | Ionization detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH11160280A true JPH11160280A (ja) | 1999-06-18 |
| JPH11160280A5 JPH11160280A5 (https=) | 2005-11-04 |
Family
ID=25474955
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10258169A Pending JPH11160280A (ja) | 1997-09-30 | 1998-09-11 | イオン化検出器 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US5920072A (https=) |
| JP (1) | JPH11160280A (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100464184C (zh) * | 2002-10-18 | 2009-02-25 | 安纳托利·安纳托利维奇·库德利亚夫谢夫 | 气体分析方法及实现该方法的电离检测器 |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6084332A (en) * | 1997-12-17 | 2000-07-04 | Raytheon Company | High actuator density deformable mirror |
| US6107805A (en) * | 1998-04-30 | 2000-08-22 | Agilent Technologies, Inc. | Extended detection zone in an ionization detector |
| RU2299493C1 (ru) * | 2006-04-10 | 2007-05-20 | Закрытое акционерное общество Научно-исследовательский институт интроскопии Московского научно-производственного объединения "Спектр" | Объемная ионизационная камера |
| US8881576B2 (en) * | 2010-04-09 | 2014-11-11 | Inficon Gmbh | Test device for performing leak detection at a plurality of test sites |
| JP2016511396A (ja) * | 2013-01-31 | 2016-04-14 | スミスズ ディテクション モントリオール インコーポレイティド | 表面イオン化源 |
| US9341596B1 (en) | 2014-12-22 | 2016-05-17 | International Business Machines Corporation | Annular gas ionization delta E-E detector |
| CN105223265B (zh) * | 2015-10-14 | 2017-11-24 | 中船重工安谱（湖北）仪器有限公司 | 用于离子迁移谱仪的多通道检测板、检测系统及检测方法 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1070741A (en) * | 1962-12-06 | 1967-06-01 | Nat Res Dev | Improvements in and relating to gas or vapour detectors |
| GB8414311D0 (en) * | 1984-06-05 | 1984-07-11 | Lovelock J E | Gas chromatography |
| US5200614A (en) * | 1992-01-16 | 1993-04-06 | Ion Track Instruments, Inc. | Ion mobility spectrometers |
-
1997
- 1997-09-30 US US08/940,511 patent/US5920072A/en not_active Expired - Fee Related
-
1998
- 1998-09-11 JP JP10258169A patent/JPH11160280A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100464184C (zh) * | 2002-10-18 | 2009-02-25 | 安纳托利·安纳托利维奇·库德利亚夫谢夫 | 气体分析方法及实现该方法的电离检测器 |
Also Published As
| Publication number | Publication date |
|---|---|
| US5920072A (en) | 1999-07-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20050906 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050906 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20080904 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20090219 |