JPH1038971A - Apparatus for measuring surface-mounting-type electronic part - Google Patents

Apparatus for measuring surface-mounting-type electronic part

Info

Publication number
JPH1038971A
JPH1038971A JP8197911A JP19791196A JPH1038971A JP H1038971 A JPH1038971 A JP H1038971A JP 8197911 A JP8197911 A JP 8197911A JP 19791196 A JP19791196 A JP 19791196A JP H1038971 A JPH1038971 A JP H1038971A
Authority
JP
Japan
Prior art keywords
electronic component
measuring
conductor
pair
type electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8197911A
Other languages
Japanese (ja)
Other versions
JP3305585B2 (en
Inventor
Hiroshi Katsuta
宏 勝田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP19791196A priority Critical patent/JP3305585B2/en
Publication of JPH1038971A publication Critical patent/JPH1038971A/en
Application granted granted Critical
Publication of JP3305585B2 publication Critical patent/JP3305585B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To enable correct and highly reproducible measurement by bringing input/output terminals into electric contact with a transmission line layer of a micro strip line respectively and bringing other electrode terminals into electric contact with a measuring device substrate or a conductor groove member respectively. SOLUTION: A surface-mounting-type electronic part is positioned and mounted on a measuring device 25, and the electronic part is pressed and fixed by a pressing part with a pressing rod operated, so that a micro strip line 32 is brought into direct contact with input/output terminals of the electronic part or a conductor groove member 31 or a measuring device substrate 30 is brought into direct contact with other terminals (ground terminal) for electric connection. Then with a signal line of a measuring machine connected to a connector 26 for measuring electric characteristics of the surface-mounting-type electronic part, correct and highly reproducible measurement results can be obtained.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は表面実装型電子部品
の電気的特性を効率良く正確に測定するための測定装置
に関し、詳しくは安定した電気的接続が行なえる測定治
具部を有する表面実装型電子部品の測定装置に関するも
のである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a measuring device for efficiently and accurately measuring the electrical characteristics of a surface-mounted electronic component, and more particularly, to a surface-mounting device having a measuring jig capable of performing stable electrical connection. The present invention relates to a measuring device for electronic components.

【0002】[0002]

【従来の技術】近年、無線電話や携帯電話を始めとする
移動体通信機等の小型電子機器の需要の増大に伴い、そ
れらに使用される電子部品にも小型化・薄型化・軽量化
ならびに高密度実装に対応することが要求されている。
そのような電子部品として表面実装型の電子部品の需要
が飛躍的に伸びており、その結果としてそれら表面実装
型電子部品の電気的特性をどのようにして正確かつ簡易
に測定するかが課題となっている。
2. Description of the Related Art In recent years, with the increase in demand for small electronic devices such as wireless communication devices and mobile communication devices such as mobile phones, the electronic components used in them have been reduced in size, thickness and weight. It is required to support high-density mounting.
As such electronic components, the demand for surface-mounted electronic components has increased dramatically. As a result, how to accurately and easily measure the electrical characteristics of these surface-mounted electronic components has become an issue. Has become.

【0003】これら表面実装型電子部品の電気的特性を
測定するための通常の測定装置においては、測定機器に
接続されたフィクスチャといわれる測定治具部に測定対
象である表面実装型電子部品を保持して電気的・機械的
に接続することが必要となる。中でも高周波帯用の表面
実装型電子部品に対しては、測定治具部に表面実装型電
子部品を機械的に保持することにより、測定治具部の測
定治具基板に設けられたグランド電極と表面実装型電子
部品のグランド端子とが接続されるとともに、測定機器
の信号線が接続されたマイクロストリップ線路等から成
る測定治具部の非同軸伝送ラインと表面実装型電子部品
の入出力端子とが接続されている。
In a conventional measuring device for measuring the electrical characteristics of these surface-mounted electronic components, the surface-mounted electronic component to be measured is mounted on a measuring jig called a fixture connected to the measuring device. It is necessary to hold and electrically and mechanically connect. Above all, for surface mount electronic components for high frequency band, by mechanically holding the surface mount electronic components on the measurement jig, the ground electrode provided on the measurement jig substrate of the measurement jig is removed. The ground terminal of the surface-mount type electronic component is connected, and the non-coaxial transmission line of the measurement jig part, such as a microstrip line, to which the signal line of the measurement device is connected, and the input / output terminal of the surface-mount type electronic component. Is connected.

【0004】このような従来の測定装置ならびに測定治
具部の例について図6〜図9により説明する。
An example of such a conventional measuring device and a measuring jig will be described with reference to FIGS.

【0005】図6は従来の測定装置の例を示す外観斜視
図であり、同図の測定装置1において2は台座板、3は
保持測定部、4は表面実装型電子部品を保持測定部3に
固定するための押さえ機構部である。5は保持測定部3
で表面実装型電子部品を保持するとともに電気的に接続
するための測定治具部であり、6は外部の測定機器と電
気的に接続するためのコネクタ、7は測定治具部5の台
座である。また、8は押さえ機構部4において表面実装
型電子部品を測定治具部5に固定するための押さえ部、
9は押さえ部8を上下させるための押さえ棒である。
FIG. 6 is an external perspective view showing an example of a conventional measuring apparatus. In the measuring apparatus 1 shown in FIG. 6, 2 is a pedestal plate, 3 is a holding and measuring unit, and 4 is a holding and measuring unit for holding a surface-mounted electronic component. This is a pressing mechanism for fixing the pressing mechanism. 5 is a holding measuring unit 3
Reference numeral 6 denotes a measurement jig for holding and electrically connecting the surface mount type electronic component, 6 denotes a connector for electrically connecting to an external measurement device, and 7 denotes a pedestal of the measurement jig 5. is there. Reference numeral 8 denotes a holding unit for fixing the surface-mounted electronic component to the measuring jig unit 5 in the holding mechanism unit 4,
Reference numeral 9 denotes a holding rod for moving the holding portion 8 up and down.

【0006】このような測定装置1により、測定治具部
5上に表面実装型電子部品(図示せず)を位置決めして
載置し、押さえ棒9を操作して押さえ部8により表面実
装型電子部品を押さえて固定して、コネクタ6に測定機
器の信号線を接続して表面実装型電子部品の電気的特性
を測定する。
[0006] With such a measuring apparatus 1, a surface mount type electronic component (not shown) is positioned and placed on the measurement jig section 5, and a holding rod 9 is operated to hold the surface mount type electronic component (not shown). The electronic component is pressed down and fixed, and the signal line of the measuring device is connected to the connector 6 to measure the electrical characteristics of the surface-mounted electronic component.

【0007】図7は測定治具部5の部分拡大斜視図であ
る。同図において10は金属等の導体から成る測定治具基
板であり、測定治具基板10のほぼ中央には凹部10aが形
成されている。凹部10aの周りには表面実装型電子部品
の電極端子と接続される端子板等が配置されており、11
は電子部品の電極端子のうちグランド端子と接続される
金属端子板、12は電子部品の入出力端子と接続される伝
送線路(マイクロストリップ線路)であり、伝送線路12
はセラミック等の誘電体などから成る絶縁基体12aと、
上面に形成された伝送線路層12bと、下面に形成された
グランド導体層12cとから成る。これら金属端子板11お
よび伝送線路12はそれぞれ平坦度を出して電子部品の電
極端子と接続させるために測定治具基板10に対してスプ
リング等を利用して弾性的に取り付けられている。13は
電子部品の位置決めをするためのガイド板、14はコネク
タ6を保持するコネクタ保持具である。なお、金属端子
板11はグランド(接地)に接続されており、コネクタ6
は伝送線路12と電気的に接続されて測定機器の信号線に
接続されている。
FIG. 7 is a partially enlarged perspective view of the measuring jig portion 5. In FIG. 1, reference numeral 10 denotes a measuring jig substrate made of a conductor such as a metal, and a concave portion 10a is formed substantially at the center of the measuring jig substrate 10. Around the recess 10a, a terminal plate or the like connected to the electrode terminals of the surface mount electronic component is arranged.
Is a metal terminal plate connected to the ground terminal among the electrode terminals of the electronic component, and 12 is a transmission line (microstrip line) connected to the input / output terminal of the electronic component.
Is an insulating substrate 12a made of a dielectric material such as ceramic,
The transmission line layer 12b is formed on the upper surface, and the ground conductor layer 12c is formed on the lower surface. The metal terminal plate 11 and the transmission line 12 are elastically attached to the measuring jig substrate 10 using a spring or the like in order to obtain flatness and connect to the electrode terminals of the electronic component. Reference numeral 13 denotes a guide plate for positioning electronic components, and reference numeral 14 denotes a connector holder for holding the connector 6. The metal terminal plate 11 is connected to ground (ground), and the connector 6
Is electrically connected to the transmission line 12 and connected to the signal line of the measuring instrument.

【0008】一方、図8は上記測定装置1により測定さ
れる表面実装型電子部品の例を示す下面(実装面)側か
ら見た外観斜視図であり、同図において15は表面実装型
電子部品、16aおよび16bは電極端子であり、この電子
部品15においては、電極端子16a・16bのうち16aはグ
ランド端子、16bは入出力端子に割り当てられている。
そして、この表面実装型電子部品15が上記測定治具部5
にガイド板6により位置決めされて載置され、押さえ部
8によりクランプされて保持されることにより、グラン
ド端子16aと金属端子板11、および入出力端子16bと伝
送線路12の伝送線路層12bがそれぞれ接触して電気的に
接続される。
On the other hand, FIG. 8 is an external perspective view showing an example of a surface-mounted electronic component measured by the measuring apparatus 1 as viewed from the lower surface (mounting surface) side. In FIG. , 16a and 16b are electrode terminals. In the electronic component 15, among the electrode terminals 16a and 16b, 16a is assigned to a ground terminal and 16b is assigned to an input / output terminal.
The surface mount electronic component 15 is connected to the measuring jig 5
The ground terminal 16a and the metal terminal plate 11, and the input / output terminal 16b and the transmission line layer 12b of the transmission line 12 are respectively positioned and mounted on the guide plate 6 and clamped and held by the holding portion 8. Contact and electrical connection.

【0009】この接続状態を図9(a)および(b)に
それぞれ断面図で示す。同図(a)は伝送線路12に垂直
な断面を示しており、(b)は伝送線路12に沿った断面
を示している。これらの図に示すように、測定治具部5
の上にガイド板13により位置決めされて保持された表面
実装型電子部品15は、グランド端子16aと金属端子板1
1、および入出力端子16bと伝送線路12の伝送線路層12
bがそれぞれ接触して電気的に接続された状態となる。
FIGS. 9A and 9B are sectional views showing this connection state. FIG. 1A shows a cross section perpendicular to the transmission line 12, and FIG. 1B shows a cross section along the transmission line 12. As shown in these figures, the measuring jig unit 5
The surface-mounted electronic component 15 positioned and held by the guide plate 13 on the
1, and the transmission line layer 12 of the input / output terminal 16b and the transmission line 12.
b contact each other and become electrically connected.

【0010】[0010]

【発明が解決しようとする課題】ところで、表面実装型
電子部品には、図9に示したような電極端子の配置のも
の以外にも種々の電極配置を有するものがある。例えば
図10に下面(実装面)側から見た外観斜視図で示す表面
実装型電子部品17のように、下面の4辺に電極端子18a
・18bを有し、そのうち18aをグランド端子に、対向す
る2辺のそれぞれ対向する角側に配置された18bに入出
力端子を割り当てたもの、あるいは図11に同じく外観斜
視図で示す表面実装型電子部品19のように、下面の3辺
に電極端子20a・20bを有し、そのうち20aをグランド
端子に、対向する2辺の片側同士に配置された20bを入
出力端子に割り当てたものなどがある。なお、表面実装
型電子部品19においては、電極端子20a・20bが電子部
品本体の下面に対して凹状に形成されている例を示して
いる。
By the way, some surface mount electronic components have various electrode arrangements other than the arrangement of the electrode terminals as shown in FIG. For example, as shown in a surface mount type electronic component 17 shown in an external perspective view seen from the lower surface (mounting surface) side in FIG.
· 18b, of which 18a is a ground terminal, and input / output terminals are assigned to 18b arranged on opposite corners of two opposing sides, or a surface mount type similarly shown in an external perspective view in FIG. 11 Like the electronic component 19, there are electrode terminals 20a and 20b on three sides on the lower surface, of which 20a is assigned to a ground terminal, and 20b arranged on one side of two opposing sides is assigned to an input / output terminal. is there. In the surface-mounted electronic component 19, an example is shown in which the electrode terminals 20a and 20b are formed in a concave shape with respect to the lower surface of the electronic component body.

【0011】しかしながら、従来の測定装置1では、こ
れらのように電極端子配置の異なる表面実装型電子部品
17・19に対しては、表面実装型電子部品15の電極端子配
置に合わせて凹部10a・金属端子板11・伝送線路12を配
置した測定治具部5によっては伝送線路12と表面実装型
電子部品の入出力端子とが電気的に接続できなくなり、
その都度凹部10aの形状・寸法および伝送線路12・金属
端子板11の配置を変更して形成した測定治具基板を用意
して、台座7上の測定治具部5をコネクタ6およびコネ
クタ保持具14ごと交換しなければ、それらの電子部品を
測定することができないという問題点があった。
However, in the conventional measuring device 1, the surface-mounted electronic components having different electrode terminal arrangements as described above.
17 and 19, the transmission line 12 and the surface mount type electronic component 15 are arranged depending on the measurement jig 5 in which the concave portion 10a, the metal terminal plate 11, and the transmission line 12 are arranged according to the electrode terminal arrangement of the surface mount type electronic component 15. The input and output terminals of the parts cannot be electrically connected,
In each case, a measurement jig substrate formed by changing the shape and dimensions of the recess 10a and the arrangement of the transmission line 12 and the metal terminal plate 11 is prepared, and the measurement jig portion 5 on the pedestal 7 is connected to the connector 6 and the connector holder. Unless all 14 were replaced, there was a problem that those electronic components could not be measured.

【0012】また、測定治具基板10上に金属端子板11を
スプリング等を介して弾性を持たせて配設したことによ
り、寄生インダクタンスの影響でグランドが同電位にな
らず、そのために正確な測定ができなくなるという問題
点もあった。
In addition, since the metal terminal plate 11 is disposed on the measuring jig substrate 10 with elasticity via a spring or the like, the ground does not become the same potential due to the influence of the parasitic inductance. There was also a problem that measurement could not be performed.

【0013】本発明は、上記問題点を解決すべく完成さ
れたものであり、その目的は、電極端子配置の異なる表
面実装型電子部品に対しても、測定治具基板を交換する
程度の簡単な変更で測定が可能であり、かつグランド端
子とグランドとの電気的な接続が安定していて正確で再
現性の良い測定が可能な測定治具部を有する表面実装型
電子部品の測定装置を提供することにある。
SUMMARY OF THE INVENTION The present invention has been completed to solve the above problems, and has as its object the purpose of replacing a measuring jig substrate with a surface mount type electronic component having a different electrode terminal arrangement. The measurement device for surface mount type electronic components has a measurement jig that can measure with simple changes, and has a stable electrical connection between the ground terminal and the ground, and can perform accurate and reproducible measurements. To provide.

【0014】[0014]

【課題を解決するための手段】本発明の表面実装型電子
部品の測定装置は、上面に表面実装型電子部品が載置さ
れ、かつ上面に一対の嵌合用溝が形成されている電気的
に接地された導体から成る測定治具基板と、前記嵌合用
溝に嵌合して固定される上側に開口部を有するU字状の
一対の導体溝部材と、前記一対の導体溝部材中に電気的
に絶縁されて配置され、前記測定治具基板上面に載置さ
れる表面実装型電子部品の下面側に形成された一対の入
出力端子と当接するように少なくとも一部が前記測定治
具基板上面に露出している一対のマイクロストリップ線
路と、前記一対の導体溝部材および一対のマイクロスト
リップ線路が取着され、内部にマイクロストリップ線路
が電気的に絶縁されて配置された前記導体溝部材を前記
測定治具基板の嵌合用溝に嵌合させるべく移動させる調
整部材とを具備して成るものである。
According to the present invention, there is provided an apparatus for measuring a surface mount type electronic component, comprising: a surface mount type electronic component mounted on an upper surface and a pair of fitting grooves formed on an upper surface; A measuring jig substrate made of a grounded conductor, a pair of U-shaped conductor groove members having an opening at the upper side fitted and fixed in the fitting groove, and an electric The measurement jig substrate is arranged so as to be insulated from each other, and at least partly comes into contact with a pair of input / output terminals formed on the lower surface side of the surface mount electronic component mounted on the measurement jig substrate upper surface. The pair of microstrip lines exposed on the upper surface, the pair of conductor groove members and the pair of microstrip lines are attached, and the conductor groove members in which the microstrip lines are electrically insulated are disposed. Fitting of the measurement jig substrate Those formed by including an adjustment member for moving in order to fit the use grooves.

【0015】本発明の表面実装型電子部品の測定装置に
よれば、表面実装型電子部品の一対の入出力端子と当接
させる一対のマイクロストリップ線路をそれぞれ上側に
開口部を有するU字状の一対の導体溝部材中に導体溝部
材とは電気的に絶縁して配置し、それらを導体から成る
電気的に接地された測定治具基板に表面実装型電子部品
の入出力端子に対応させて形成された嵌合用溝に嵌合せ
しめて固定した構成としたことから、表面実装型電子部
品の入出力端子がそれぞれマイクロストリップ線路の伝
送線路層と電気的に接触するとともに、その他の電極端
子(グランド端子)が接地された導体から成る測定治具
基板またはその基板と電気的に同電位となる導体溝部材
と直接電気的に接触することにより、それぞれの電気的
な接続が安定していて正確で再現性の良い測定が可能と
なる。
According to the surface mount type electronic component measuring apparatus of the present invention, a pair of microstrip lines to be brought into contact with a pair of input / output terminals of the surface mount type electronic component are formed in a U-shape having openings on the upper side. A pair of conductor groove members are electrically insulated from the conductor groove members, and are arranged on an electrically grounded measuring jig substrate made of a conductor so as to correspond to the input / output terminals of the surface mount electronic component. Since the input and output terminals of the surface-mounted electronic component are in electrical contact with the transmission line layer of the microstrip line, and the other electrode terminals (ground) Terminals) are electrically connected directly to a measuring jig substrate made of a grounded conductor or a conductor groove member having the same electric potential as the substrate, so that the respective electric connections are stabilized. Good measurement of accurate and reproducible Te becomes possible.

【0016】また、本発明の測定装置によれば、嵌合用
溝に嵌合させる導体溝部材とマイクロストリップ線路と
が取着された調整部材により、一対のマイクロストリッ
プ線路と一対の導体溝部材とを嵌合用溝の形成位置に合
わせて移動できるようにしたことから、電極端子の配置
が異なる表面実装型電子部品に対しても、測定対象の電
子部品の形状・寸法に応じて測定治具基板上の保持位置
にその入出力端子の配置に対応させて嵌合用溝を形成し
た測定治具基板を用意して交換し、その嵌合用溝の位置
関係に合わせて導体溝部材およびマイクロストリップ線
路の位置を調整することによってそれぞれの表面実装型
電子部品の入出力端子の配置に対応することができ、種
々の表面実装型電子部品の電気的特性の測定に簡単に対
応することが可能となる。
According to the measuring device of the present invention, the pair of microstrip lines and the pair of conductor groove members can be formed by the adjusting member having the conductor groove member to be fitted into the fitting groove and the microstrip line attached thereto. Can be moved in accordance with the formation position of the fitting groove, so that even for surface-mounted electronic components with different electrode terminal arrangements, the measurement jig board can be used according to the shape and dimensions of the electronic component to be measured. Prepare and replace a measuring jig substrate in which a fitting groove is formed corresponding to the arrangement of the input / output terminals at the upper holding position, and replace the measuring jig substrate with the conductor groove member and the microstrip line according to the positional relationship of the fitting groove. By adjusting the position, it is possible to respond to the arrangement of input / output terminals of each surface-mounted electronic component, and it is possible to easily measure the electrical characteristics of various surface-mounted electronic components It made.

【0017】その結果、本発明の表面実装型電子部品の
測定装置によれば、電極端子配置の異なる表面実装型電
子部品に対しても、測定治具基板を交換する程度の簡単
な変更で測定が可能であり、かつグランド端子とグラン
ドとの電気的な接続が安定していて正確で再現性の良い
測定が可能な測定治具部を有する表面実装型電子部品の
測定装置を提供することができる。
As a result, according to the surface mount type electronic component measuring apparatus of the present invention, even a surface mount type electronic component having a different electrode terminal arrangement can be measured with a simple change such that the measurement jig substrate is replaced. It is possible to provide a measuring device for a surface mount type electronic component having a measuring jig portion capable of performing accurate and reproducible measurement with stable electrical connection between a ground terminal and a ground. it can.

【0018】[0018]

【発明の実施の形態】以下、本発明の表面実装型電子部
品の測定装置について図面を参照しながら詳細に説明す
る。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a measuring device for a surface-mounted electronic component according to the present invention will be described in detail with reference to the drawings.

【0019】図1は本発明の表面実装型電子部品の測定
装置の一実施形態を示す図6と同様の外観斜視図であ
り、図2はその測定装置における測定治具部の一実施形
態を示す図7と同様の部分拡大斜視図である。
FIG. 1 is an external perspective view similar to FIG. 6 showing an embodiment of a measuring device for a surface-mounted electronic component of the present invention, and FIG. 2 shows an embodiment of a measuring jig in the measuring device. FIG. 8 is a partially enlarged perspective view similar to FIG.

【0020】図1および図2において、21は表面実装型
電子部品の測定装置、22は台座板、23は保持測定部、24
は表面実装型電子部品を保持測定部23に固定するための
押さえ機構部である。25は保持測定部23で表面実装型電
子部品を保持するとともに電気的に接続するための測定
治具部、26は外部の測定機器と電気的に接続するための
コネクタ、27は測定治具部25の台座であり、台座27は固
定台座27a・27cおよび可動台座27b・連結部材27dな
どから成る。また、28は押さえ機構部24において表面実
装型電子部品を測定治具部25に固定するための押さえ
部、29は押さえ部28を上下させるための押さえ棒であ
る。
In FIGS. 1 and 2, reference numeral 21 denotes a measuring device for surface-mounted electronic components, 22 denotes a pedestal plate, 23 denotes a holding / measuring unit, and 24 denotes a holding / measuring unit.
Is a pressing mechanism for fixing the surface-mounted electronic component to the holding and measuring unit 23. Reference numeral 25 denotes a holding / measuring unit 23 for holding and electrically connecting the surface mount type electronic component, 26 a connector for electrically connecting to an external measuring device, and 27 a measuring jig unit. The pedestal 27 includes fixed pedestals 27a and 27c, a movable pedestal 27b, a connecting member 27d, and the like. Reference numeral 28 denotes a pressing unit for fixing the surface-mounted electronic component to the measuring jig unit 25 in the pressing mechanism unit 24, and reference numeral 29 denotes a pressing bar for moving the pressing unit 28 up and down.

【0021】また、30は金属等の直方体状の導体から成
る測定治具基板であり、電気的に接地されているととも
に、その2辺から中央部の電子部品の保持位置にかけ
て、導体溝部材31を嵌合して固定するための嵌合用溝30
aが形成されている。31は金属等の導体から成り上側に
開口部を有するU字状の導体溝部材、32は導体溝部材31
中に電気的に絶縁されて配置された電子部品の入出力端
子と当接するマイクロストリップ線路であり、マイクロ
ストリップ線路32はセラミックス等の誘電体などから成
る絶縁基体32aと、その上面に形成された伝送線路層32
bと、下面に形成されたグランド導体層32cとから成
る。これら導体溝部材31とマイクロストリップ線路32と
は、導体溝部材31が嵌合用溝30aに嵌合せしめられてそ
の先端が電子部品の保持位置において電子部品の入出力
端子に対応するように測定治具基板30に固定されてお
り、表面実装型電子部品を載置固定した場合に電子部品
の入出力端子と伝送線路層32bとが当接するように、導
体溝部材31の開口部からマイクロストリップ線路32が測
定治具基板30上面にわずかに突き出て露出するように弾
性的に組み合わされている。なお、導体溝部材31はコネ
クタ26の接地線と接続することならびに測定治具基板30
と嵌合することにより電気的に接地に接続されており、
またコネクタ26の信号線はマイクロストリップ線路32と
電気的に接続されて測定機器の信号線に接続されてい
る。
Reference numeral 30 denotes a measuring jig substrate made of a rectangular parallelepiped conductor such as a metal, which is electrically grounded and extends from two sides to a central electronic component holding position. Mating groove 30 for mating and fixing
a is formed. 31 is a U-shaped conductor groove member made of a conductor such as metal and having an opening on the upper side, 32 is a conductor groove member 31
A microstrip line which is in contact with input / output terminals of an electronic component disposed electrically insulated therein, and the microstrip line 32 is formed on an insulating base 32a made of a dielectric material such as ceramics and an upper surface thereof. Transmission line layer 32
b and a ground conductor layer 32c formed on the lower surface. The conductor groove member 31 and the microstrip line 32 are measured and measured so that the conductor groove member 31 is fitted into the fitting groove 30a, and the tip thereof corresponds to the input / output terminal of the electronic component at the electronic component holding position. The microstrip line is fixed from the opening of the conductor groove member 31 so that the input / output terminals of the electronic component and the transmission line layer 32b are in contact with each other when the surface-mounted electronic component is mounted and fixed. 32 is elastically combined so as to slightly protrude and be exposed on the upper surface of the measurement jig substrate 30. The conductor groove member 31 is connected to the ground wire of the connector 26 and the measurement jig substrate 30
Is electrically connected to ground by mating with
The signal line of the connector 26 is electrically connected to the microstrip line 32 and connected to the signal line of the measuring instrument.

【0022】また、33は表面実装型電子部品の位置決め
をするためのガイド板、34a・34bは測定治具基板30が
載置固定されるとともに一対の導体溝部材31および一対
のマイクロストリップ線路32が取着され、それらを嵌合
用溝30aに合わせて移動させるための調整部材であり、
それぞれ台座27上に取着されてその機能を果している。
そしてこの例では、一方の調整部材34bは可動台座27b
に取着されており、可動台座27bを連結部材27d方向に
移動させ、調整部材34bを可動台座27b上でそれと垂直
方向に移動させることにより図中の矢印方向にそれぞれ
動かすことができ、同一平面上でもう一方の調整部材34
aとの相対位置を調整することができ、両者に取着され
た導体溝部材31およびマイクロストリップ線路32同士の
相対位置を測定治具基板30の嵌合用溝30aを設けた位置
に応じて調整することができる。
Reference numeral 33 denotes a guide plate for positioning the surface-mounted electronic component, and reference numerals 34a and 34b denote a pair of conductor groove members 31 and a pair of microstrip lines 32 on which the measurement jig substrate 30 is mounted and fixed. Is an adjusting member for moving them in accordance with the fitting groove 30a,
Each is mounted on a pedestal 27 to perform its function.
In this example, one of the adjusting members 34b is connected to the movable base 27b.
The movable pedestal 27b is moved in the direction of the connecting member 27d, and the adjusting member 34b is moved in the vertical direction on the movable pedestal 27b, whereby the movable pedestal 27b can be moved in the direction of the arrow in the drawing, and can be moved in the same plane. The other adjustment member 34 above
The relative position between the conductor groove member 31 and the microstrip line 32 attached to both can be adjusted according to the position where the fitting groove 30a of the measuring jig substrate 30 is provided. can do.

【0023】なお、台座27の可動範囲や機構を変更する
ことにより、嵌合用溝30aを測定治具基板30の隣合う2
辺に形成した場合にも容易に対応させることができる。
By changing the movable range and the mechanism of the pedestal 27, the fitting groove 30a is moved to the position adjacent to the measuring jig substrate 30.
It is possible to easily cope with the case where it is formed on the side.

【0024】このような本発明の表面実装型電子部品の
測定装置21によれば、測定治具部25上に表面実装型電子
部品(図示せず)を位置決めして載置し、押さえ棒29を
操作して押さえ部28により表面実装型電子部品を押さえ
て固定して、表面実装型電子部品の入出力端子にマイク
ロストリップ線路32を、またその他の端子(グランド端
子)に導体溝部材31または測定治具基板30を直接接触さ
せて電気的に接続し、コネクタ26に測定機器の信号線を
接続して表面実装型電子部品の電気的特性を測定する。
According to the surface mount type electronic component measuring apparatus 21 of the present invention, the surface mount type electronic component (not shown) is positioned and placed on the measuring jig section 25, and the pressing rod 29 is provided. And press and fix the surface-mount type electronic component by the holding portion 28, and the microstrip line 32 is used as the input / output terminal of the surface-mount type electronic component, and the conductor groove member 31 or the other terminal (ground terminal) is used. The measurement jig substrate 30 is brought into direct contact and electrically connected, and the signal line of the measurement device is connected to the connector 26 to measure the electric characteristics of the surface mount type electronic component.

【0025】本発明の測定装置21における測定治具部25
と表面実装型電子部品との接続状態を、図3(a)およ
び(b)にそれぞれ図9と同様の断面図で示す。図3
(a)はマイクロストリップ線路32に垂直な断面を示し
ており、(b)はマイクロストリップ線路32に沿った断
面を示している。また、表面実装型電子部品としては図
8に示した表面実装型電子部品15を例に示している。こ
れらの図に示すように、測定治具部25の上にガイド板33
により位置決めされて保持された表面実装型電子部品15
は、グランド端子16aと導体溝部材31または測定治具基
板30、および入出力端子16bとマイクロストリップ線路
32の伝送線路層32bがそれぞれ接触して電気的に接続さ
れた状態となる。なお、図3(a)においてはグランド
端子16aが測定治具基板30と接触している例を示してい
るが、導体溝部材31を幅広の形状として上述のようにグ
ランド端子16aと導体溝部材31とが接触するようにして
もよい。
The measuring jig 25 in the measuring apparatus 21 of the present invention
3 (a) and 3 (b) are cross-sectional views similar to those of FIG. FIG.
(A) shows a cross section perpendicular to the microstrip line 32, and (b) shows a cross section along the microstrip line 32. Further, as the surface-mounted electronic component, the surface-mounted electronic component 15 shown in FIG. 8 is shown as an example. As shown in these figures, the guide plate 33 is placed on the measuring jig 25.
Electronic component 15 positioned and held by
Are the ground terminal 16a and the conductor groove member 31 or the measuring jig substrate 30, and the input / output terminal 16b and the microstrip line.
The 32 transmission line layers 32b come into contact with each other and become electrically connected. Although FIG. 3A shows an example in which the ground terminal 16a is in contact with the measurement jig substrate 30, the conductor groove member 31 is formed to have a wide shape as described above and the ground terminal 16a and the conductor groove member 31 may be contacted.

【0026】また、本発明の表面実装型電子部品の測定
装置によれば、表面実装型電子部品の電極端子の配置が
図10に示した表面実装型電子部品17や図11に示した表面
実装型電子部品19のように異なる場合であっても、それ
らの表面実装型電子部品17・19の入出力端子18b・20b
の配置に対応した位置に嵌合用溝30aを設けた測定治具
基板30を用意し、その嵌合用溝30aの位置に合わせて調
整部材34bの位置を調整してマイクロストリップ線路32
の位置を調整することにより、それら表面実装型電子部
品17・19についても同様に入出力端子18b・20bとマイ
クロストリップ線路32とを電気的に接続して電気的特性
の測定を行なうことができる。
According to the surface mount type electronic component measuring apparatus of the present invention, the arrangement of the electrode terminals of the surface mount type electronic component is different from that of the surface mount type electronic component 17 shown in FIG. 10 and the surface mount type electronic component 17 shown in FIG. Input / output terminals 18b / 20b of the surface-mounted electronic components 17/19
The measurement jig substrate 30 provided with the fitting groove 30a at a position corresponding to the arrangement of the microstrip line 32 is prepared by adjusting the position of the adjusting member 34b in accordance with the position of the fitting groove 30a.
, The electrical characteristics of the surface-mounted electronic components 17 and 19 can be similarly measured by electrically connecting the input / output terminals 18b and 20b to the microstrip line 32. .

【0027】さらに、表面実装型電子部品の測定対象で
ある入出力端子が電子部品本体の対向する2辺の対角位
置に設けられているものに対しても、図4に外観斜視図
で示す測定治具部35の一部のように、直方体状の導体の
対向する2辺の対角位置から中央部の電子部品の保持位
置にかけて電子部品の入出力端子に対応させて嵌合用溝
36aを形成することにより、その対角位置に導体溝部材
37およびマイクロストリップ線路38を配置させて固定す
ることができ、このようにして種々の電極端子配置の表
面実装型電子部品についても簡単に対応して測定するこ
とができる。
FIG. 4 is a perspective view showing the external appearance of an electronic component main body in which input / output terminals to be measured are provided at diagonal positions of two opposing sides of the electronic component main body. Like a part of the measuring jig part 35, a fitting groove is provided from the diagonal position of two opposing sides of the rectangular parallelepiped conductor to the holding position of the electronic part in the center so as to correspond to the input / output terminals of the electronic part.
The formation of the conductor groove member at the diagonal position by forming 36a
The microstrip line 37 and the microstrip line 38 can be arranged and fixed. In this way, surface-mounted electronic components having various electrode terminal arrangements can be easily measured.

【0028】なお、図4においても39は表面実装型電子
部品の位置決めをするためのガイド板であり、マイクロ
ストリップ線路38は絶縁基体38aと、その上面に形成さ
れた伝送線路層38bと、下面に形成されたグランド導体
層38cとから成る。
In FIG. 4, reference numeral 39 denotes a guide plate for positioning the surface-mounted electronic component, and the microstrip line 38 comprises an insulating base 38a, a transmission line layer 38b formed on the upper surface thereof, and a lower surface. And a ground conductor layer 38c formed on the substrate.

【0029】また、図11に示した表面実装型電子部品19
のように電極端子20a・20bが電子部品本体の下面に対
して凹状に形成されている場合には、図5に外観斜視図
で示す測定治具基板40のように、電子部品19の入出力端
子20bに対応させて嵌合用溝40aを形成するとともにグ
ランド端子20aに対応する位置に凸状部40bを形成する
ことにより、入出力端子20bとマイクロストリップ線路
の伝送線路層およびグランド端子20aと接地された測定
治具基板40のそれぞれの電気的な接触を良好に行なうこ
とができるものとなる。なお、図11においては測定治具
基板40のみを図示している。また、測定治具基板40の上
面に点線で示した領域はガイド板が取着されて電子部品
の保持位置となる部分である。
The surface mount type electronic component 19 shown in FIG.
When the electrode terminals 20a and 20b are formed in a concave shape with respect to the lower surface of the electronic component body as shown in FIG. By forming a fitting groove 40a corresponding to the terminal 20b and forming a convex portion 40b at a position corresponding to the ground terminal 20a, the input / output terminal 20b, the transmission line layer of the microstrip line and the ground terminal 20a are grounded. The electrical contact of each of the measurement jig substrates 40 thus obtained can be favorably performed. FIG. 11 shows only the measurement jig substrate 40. The area indicated by the dotted line on the upper surface of the measurement jig substrate 40 is a portion where the guide plate is attached and becomes a holding position of the electronic component.

【0030】そして、本発明の測定装置21によれば、測
定治具部25の測定治具基板30を測定治具基板40と交換し
て導体溝部材31およびマイクロストリップ線路32の位置
を調整することによって、表面実装型電子部品19にも容
易に対応できて正確で再現性の良い測定が可能である。
Then, according to the measuring apparatus 21 of the present invention, the positions of the conductor groove member 31 and the microstrip line 32 are adjusted by replacing the measuring jig substrate 30 of the measuring jig section 25 with the measuring jig substrate 40. This makes it possible to easily cope with the surface-mounted electronic component 19 and perform accurate and reproducible measurement.

【0031】本発明の表面実装型電子部品の測定装置に
おいて、測定治具基板30・36・40は、金属等の導体を用
い、導体溝部材31・37を嵌合せしめて固定させるための
嵌合用溝30a・36a・40aが形成された、表面実装型電
子部品の電極端子の配置と下面側の構造に適合したもの
であり、可動台座27bならびに調整部材34により位置決
めした導体溝部材31・37を嵌合させ、金属等の導体を使
用したL字型の形状の調整部材34にはめ込むなどして保
持される。また、嵌合用溝30a・36aは、表面実装型電
子部品の入出力端子の位置に対応させて、導体溝部材31
・37が嵌合できるような形状に、導体溝部材31・37の高
さと同じ深さもしくは導体溝部材31・37がやや突出する
ような深さとなるように形成すればよい。
In the surface mount type electronic component measuring apparatus of the present invention, the measuring jig substrates 30, 36, and 40 are made of metal or the like, and are used for fitting and fixing the conductor groove members 31 and 37 to each other. The grooves 30a, 36a, and 40a are formed and are adapted to the arrangement of the electrode terminals of the surface mount electronic component and the structure of the lower surface side. The conductor groove members 31 and 37 positioned by the movable pedestal 27b and the adjustment member 34 are provided. It is fitted and held by being fitted into an L-shaped adjusting member 34 using a conductor such as a metal. Further, the fitting grooves 30a and 36a are provided with conductor groove members 31 corresponding to the positions of the input / output terminals of the surface mount electronic component.
The conductor groove members 31 and 37 may be formed so as to have the same depth as the conductor groove members 31 and 37 or a depth such that the conductor groove members 31 and 37 protrude slightly.

【0032】また導体溝部材31・37は金属等の導体を使
用し、開口部側の上面が平坦で中に配置されるマイクロ
ストリップ線路を囲むような位置・寸法とすればよく、
コネクタ26の接地線とは半田等で接続する。
The conductor groove members 31 and 37 may be made of a conductor such as a metal, and may have a position and a size such that the upper surface on the opening side is flat and surrounds the microstrip line disposed therein.
The ground wire of the connector 26 is connected with solder or the like.

【0033】また、マイクロストリップ線路32・38は、
絶縁基板32a・38aにセラミック等の高誘電率の誘電体
材料が、伝送線路層32b・38bおよびグランド導体層32
c・38cには銅などの金属導体が用いられ、コネクタ26
の信号線と伝送線路層32b・38bおよびコネクタ26の接
地線とグランド導体層32c・38cとの接続は半田等にて
行なう。
The microstrip lines 32 and 38 are
A dielectric material having a high dielectric constant such as ceramic is provided on the insulating substrates 32a and 38a, and the transmission line layers 32b and 38b and the ground conductor
A metal conductor such as copper is used for c and 38c.
The connection between the signal line and the transmission line layers 32b and 38b and the ground line of the connector 26 and the ground conductor layers 32c and 38c is performed by soldering or the like.

【0034】コネクタ26は例えばSMAコネクタ等であ
り、ネジまたは半田等によって調整部材34に取り付けら
れ、外部の測定機器と接続される。
The connector 26 is, for example, an SMA connector, and is attached to the adjusting member 34 with screws or solder, and is connected to an external measuring device.

【0035】ガイド板33・39は表面実装型電子部品の入
出力端子とマイクロストリップ線路32・38とが当接して
電気的に接続されるよう電子部品を位置決めできるよう
に配置する。電子部品を保持して位置決めできれば種々
の形状や寸法としてよく、ネジや接着剤等により測定治
具基板に固定すればよい。
The guide plates 33 and 39 are arranged so that the electronic components can be positioned so that the input / output terminals of the surface mount type electronic components and the microstrip lines 32 and 38 are in contact with each other and are electrically connected. Various shapes and dimensions may be used as long as the electronic component can be held and positioned, and the electronic component may be fixed to the measurement jig substrate with screws or an adhesive.

【0036】一方、押さえ機構24において、押さえ部28
は例えばプラスチック等を使用して電子部品を保持・固
定できるような平坦な形状であればよく、測定者が押さ
え棒29を操作して保持測定部23との間で表面実装型電子
部品を保持して、各入出力端子とマイクロストリップ線
路、およびグランド端子と導体溝部材または測定治具基
板が安定して接触して電気的に確実に接続されるように
している。
On the other hand, in the holding mechanism 24, the holding portion 28
For example, a flat shape may be used so that the electronic component can be held and fixed using plastic or the like, and the measurer operates the holding rod 29 to hold the surface-mounted electronic component with the holding / measuring unit 23. Then, each input / output terminal and the microstrip line, and the ground terminal and the conductor groove member or the measuring jig substrate are stably contacted and electrically connected.

【0037】[0037]

【発明の効果】以上のように本発明の表面実装型電子部
品の測定装置によれば、表面実装型電子部品の一対の入
出力端子と接触させる一対のマイクロストリップ線路を
それぞれ上側に開口部を有するU字状の一対の導体溝部
材中にその導体溝部材とは電気的に絶縁して配置し、そ
れらを電気的に接地された導体から成る測定治具基板上
面にその基板中央の保持位置にかけて形成された一対の
嵌合用溝に嵌合せしめて固定して、マイクロストリップ
線路の少なくとも一部を測定治具基板上面に載置される
表面実装型電子部品の下面側に形成された一対の入出力
端子と当接するように測定治具基板上面に露出した構成
としたことから、表面実装型電子部品の入出力端子がそ
れぞれマイクロストリップ線路の伝送線路層と確実に接
触して電気的に接続されるとともに、その他の電極端子
(グランド端子)が接地された導体から成る測定治具基
板またはその基板と電気的に同電位となる導体溝部材と
直接接触して電気的に接続されることにより、それぞれ
を簡単にかつ安定して電気的に接続させることができ、
正確で再現性の良い測定が可能となった。
As described above, according to the apparatus for measuring a surface-mounted electronic component of the present invention, a pair of microstrip lines to be brought into contact with a pair of input / output terminals of the surface-mounted electronic component are respectively provided with openings on the upper side. A pair of U-shaped conductor groove members having a conductor groove member electrically insulated from the conductor groove member, and are arranged on the upper surface of a measuring jig substrate made of an electrically grounded conductor at a center holding position of the substrate. The microstrip line is fitted and fixed in a pair of fitting grooves formed over the pair, and at least a part of the microstrip line is formed on a lower surface side of a surface mount electronic component mounted on the upper surface of the measurement jig substrate. The configuration is such that the input and output terminals of the surface-mounted electronic component are securely in contact with the transmission line layer of the microstrip line and are electrically connected to each other because the configuration is such that the input and output terminals are exposed on the upper surface of the measurement jig substrate so as to contact the output terminals. And the other electrode terminals (ground terminals) are in direct contact with and electrically connected to the measuring jig substrate made of a grounded conductor or a conductor groove member having the same electric potential as the substrate. , Each can be easily and stably electrically connected,
Accurate and reproducible measurement has become possible.

【0038】また、本発明の表面実装型電子部品の測定
装置によれば、測定治具基板が載置固定されるとともに
その嵌合用溝に嵌合させる導体溝部材が取着された調整
部材により、導体溝部材の相対位置を同一平面内で調整
できるようにしたことから、電極端子の配置が異なる表
面実装型電子部品に対しても、測定対象の電子部品の形
状・寸法ならびに入出力端子の配置に対応した位置の嵌
合用溝を形成した測定治具基板を用意して交換するだけ
で、その嵌合用溝の位置関係に合わせて導体溝部材およ
びマイクロストリップ線路の位置を調整することによっ
てそれぞれの表面実装型電子部品の入出力端子の配置に
対応することができ、種々の表面実装型電子部品の電気
的特性の測定に簡単に対応することが可能となった。
Further, according to the surface mount type electronic component measuring apparatus of the present invention, the measuring jig substrate is placed and fixed, and the adjusting member to which the conductor groove member to be fitted into the fitting groove is attached is provided. Since the relative position of the conductor groove member can be adjusted in the same plane, the shape and dimensions of the electronic component to be measured and the By simply preparing and replacing a measuring jig substrate having a fitting groove at a position corresponding to the arrangement, adjusting the positions of the conductor groove member and the microstrip line according to the positional relationship of the fitting groove, respectively Thus, the arrangement of the input / output terminals of the surface-mounted electronic component can be supported, and the measurement of the electrical characteristics of various surface-mounted electronic components can be easily performed.

【0039】その結果、本発明の表面実装型電子部品の
測定装置によれば、電極端子配置の異なる表面実装型電
子部品に対しても、測定治具基板を交換する程度の簡単
な変更で測定が可能であり、かつグランド端子とグラン
ドとの電気的な接続が安定していて正確で再現性の良い
測定が可能な測定治具部を有する表面実装型電子部品の
測定装置を提供することができた。
As a result, according to the surface mount type electronic component measuring apparatus of the present invention, even a surface mount type electronic component having a different electrode terminal arrangement can be measured with a simple change such that the measurement jig substrate is replaced. It is possible to provide a measuring device for a surface mount type electronic component having a measuring jig portion capable of performing accurate and reproducible measurement with stable electrical connection between a ground terminal and a ground. did it.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の表面実装型電子部品の測定装置の一実
施形態を示す外観斜視図である。
FIG. 1 is an external perspective view showing an embodiment of a measuring device for a surface-mounted electronic component of the present invention.

【図2】本発明の表面実装型電子部品の測定装置の測定
治具部の一実施形態を示す部分拡大斜視図である。
FIG. 2 is a partially enlarged perspective view showing one embodiment of a measuring jig section of the measuring device for a surface-mounted electronic component of the present invention.

【図3】(a)および(b)はそれぞれ本発明の表面実
装型電子部品の測定装置における測定治具部と表面実装
型電子部品との接続状態を示す断面図である。
FIGS. 3A and 3B are cross-sectional views showing a connection state between a measuring jig unit and a surface-mounted electronic component in the surface-mounted electronic component measuring apparatus according to the present invention.

【図4】本発明の表面実装型電子部品の測定装置の測定
治具部の他の実施形態を示す外観斜視図である。
FIG. 4 is an external perspective view showing another embodiment of the measuring jig portion of the measuring device for a surface-mounted electronic component of the present invention.

【図5】本発明の表面実装型電子部品の測定装置の測定
治具基板の他の実施形態を示す外観斜視図である。
FIG. 5 is an external perspective view showing another embodiment of the measuring jig substrate of the measuring device for a surface-mounted electronic component of the present invention.

【図6】従来の表面実装型電子部品の測定装置の例を示
す外観斜視図である。
FIG. 6 is an external perspective view showing an example of a conventional measuring device for surface mount electronic components.

【図7】従来の表面実装型電子部品の測定装置の測定治
具部を示す部分拡大斜視図である。
FIG. 7 is a partially enlarged perspective view showing a measuring jig portion of a conventional measuring device for surface-mounted electronic components.

【図8】表面実装型電子部品の例を示す外観斜視図であ
る。
FIG. 8 is an external perspective view showing an example of a surface mount electronic component.

【図9】(a)および(b)はそれぞれ従来の表面実装
型電子部品の測定装置における測定治具部と表面実装型
電子部品との接続状態を示す断面図である。
FIGS. 9A and 9B are cross-sectional views showing a connection state between a measuring jig unit and a surface-mounted electronic component in a conventional measuring apparatus for surface-mounted electronic components.

【図10】表面実装型電子部品の他の例を示す外観斜視
図である。
FIG. 10 is an external perspective view showing another example of the surface mount electronic component.

【図11】表面実装型電子部品の他の例を示す外観斜視
図である。
FIG. 11 is an external perspective view showing another example of the surface mount electronic component.

【符号の説明】[Explanation of symbols]

15、17、19・・・・・・・・表面実装型電子部品 16、18、20・・・・・・・・電極端子 16b、18b、20b・・・入出力端子 21・・・・・・・・・・・・表面実装型電子部品の測定
装置 25、35・・・・・・・・・・測定治具部 30、36、40・・・・・・・・測定治具基板 30a、36a、40a・・・嵌合用溝 31、37・・・・・・・・・・導体溝部材 32、38・・・・・・・・・・マイクロストリップ線路 34a、34b・・・・・・・・測定治具基板保持部
15, 17, 19 ... Surface mount electronic components 16, 18, 20 ... Electrode terminals 16b, 18b, 20b ... Input / output terminals 21 ... ······ Surface mount type electronic component measurement device 25, 35 ····· Measurement jig unit 30, 36, 40 ····· Measurement jig substrate 30a , 36a, 40a Fitting grooves 31, 37 ... Conductor groove members 32, 38 ... Microstrip lines 34a, 34b ... ... Measurement jig substrate holder

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 上面に表面実装型電子部品が載置され、
かつ上面に一対の嵌合用溝が形成されている電気的に接
地された導体から成る測定治具基板と、前記嵌合用溝に
嵌合して固定される上側に開口部を有するU字状の一対
の導体溝部材と、前記一対の導体溝部材中に電気的に絶
縁されて配置され、前記測定治具基板上面に載置される
表面実装型電子部品の下面側に形成された一対の入出力
端子と当接するように少なくとも一部が前記測定治具基
板上面に露出している一対のマイクロストリップ線路
と、前記一対の導体溝部材および一対のマイクロストリ
ップ線路が取着され、内部にマイクロストリップ線路が
電気的に絶縁されて配置された前記導体溝部材を前記測
定治具基板の嵌合用溝に嵌合させるべく移動させる調整
部材とを具備して成る表面実装型電子部品の測定装置。
1. A surface-mounted electronic component is mounted on an upper surface,
And a measuring jig substrate made of an electrically grounded conductor having a pair of fitting grooves formed on the upper surface thereof, and a U-shaped having an upper opening to be fitted and fixed in the fitting grooves. A pair of conductor groove members, and a pair of input grooves formed on the lower surface side of the surface mount type electronic component placed on the upper surface of the measurement jig substrate and electrically insulated in the pair of conductor groove members. A pair of microstrip lines, at least a part of which is exposed on the upper surface of the measurement jig substrate so as to be in contact with the output terminal, a pair of the conductor groove members and a pair of the microstrip lines are attached, and the microstrip is internally provided. A measuring device for a surface-mounted electronic component, comprising: an adjusting member for moving the conductor groove member, in which a line is electrically insulated and arranged, into a fitting groove of the measuring jig substrate.
JP19791196A 1996-07-26 1996-07-26 Measuring device for surface mounted electronic components Expired - Fee Related JP3305585B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19791196A JP3305585B2 (en) 1996-07-26 1996-07-26 Measuring device for surface mounted electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19791196A JP3305585B2 (en) 1996-07-26 1996-07-26 Measuring device for surface mounted electronic components

Publications (2)

Publication Number Publication Date
JPH1038971A true JPH1038971A (en) 1998-02-13
JP3305585B2 JP3305585B2 (en) 2002-07-22

Family

ID=16382329

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19791196A Expired - Fee Related JP3305585B2 (en) 1996-07-26 1996-07-26 Measuring device for surface mounted electronic components

Country Status (1)

Country Link
JP (1) JP3305585B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004138546A (en) * 2002-10-18 2004-05-13 Hioki Ee Corp Chip component measuring tool
JP2004279110A (en) * 2003-03-13 2004-10-07 Soshin Electric Co Ltd Antenna measuring device and antenna measuring method
JP2005070050A (en) * 2003-08-25 2005-03-17 Delaware Capital Formation Inc Contactor for inspecting test interface system, and semiconductor package for semiconductor circuit
CN104034925A (en) * 2014-06-24 2014-09-10 中国科学院上海微系统与信息技术研究所 W-waveband multiport planar circuit test clamp
JP2020169895A (en) * 2019-04-03 2020-10-15 Necプラットフォームズ株式会社 Fixture for component evaluation

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004138546A (en) * 2002-10-18 2004-05-13 Hioki Ee Corp Chip component measuring tool
JP2004279110A (en) * 2003-03-13 2004-10-07 Soshin Electric Co Ltd Antenna measuring device and antenna measuring method
JP2005070050A (en) * 2003-08-25 2005-03-17 Delaware Capital Formation Inc Contactor for inspecting test interface system, and semiconductor package for semiconductor circuit
CN104034925A (en) * 2014-06-24 2014-09-10 中国科学院上海微系统与信息技术研究所 W-waveband multiport planar circuit test clamp
JP2020169895A (en) * 2019-04-03 2020-10-15 Necプラットフォームズ株式会社 Fixture for component evaluation

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