JP2004279110A - Antenna measuring device and antenna measuring method - Google Patents

Antenna measuring device and antenna measuring method Download PDF

Info

Publication number
JP2004279110A
JP2004279110A JP2003068250A JP2003068250A JP2004279110A JP 2004279110 A JP2004279110 A JP 2004279110A JP 2003068250 A JP2003068250 A JP 2003068250A JP 2003068250 A JP2003068250 A JP 2003068250A JP 2004279110 A JP2004279110 A JP 2004279110A
Authority
JP
Japan
Prior art keywords
antenna
dielectric
substrate
dielectric antenna
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2003068250A
Other languages
Japanese (ja)
Other versions
JP4621414B2 (en
Inventor
Hitoshi Makino
仁 牧野
Etsuteru Inoue
悦照 井上
Takami Hirai
隆己 平井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Soshin Electric Co Ltd
Original Assignee
Soshin Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Soshin Electric Co Ltd filed Critical Soshin Electric Co Ltd
Priority to JP2003068250A priority Critical patent/JP4621414B2/en
Publication of JP2004279110A publication Critical patent/JP2004279110A/en
Application granted granted Critical
Publication of JP4621414B2 publication Critical patent/JP4621414B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Measurement Of Resistance Or Impedance (AREA)
  • Waveguide Aerials (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To measure with an inspection specification at the time of mounting by reducing to the utmost the influence of a fixing element, when placing and fixing a dielectric antenna on a measuring substrate. <P>SOLUTION: This antenna measuring device 10 for measuring the characteristic of the dielectric antenna 12 in the state where the dielectric antenna 12 is placed and fixed on the measuring substrate 14 has a casing 50 for storing the measuring substrate 14, an arm mechanism 42 for conveying the fixing element 40, a transmission/reception part 52 installed in contact with or near the casing 50, for receiving a radio wave radiated from the dielectric antenna 12 or radiating the radio wave to the dielectric antenna 12, an alignment mechanism 54 for adjusting a relative position between the measuring substrate 14 and the transmission/reception part 52, and a network analyzer 56 installed outside the casing 50, for analyzing a signal from the transmission/reception part 52 or a signal from the dielectric antenna 12. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

【0001】
【発明の属する技術分野】
本発明は、アンテナ装置の特性を測定するアンテナ測定装置及びアンテナ測定方法に関し、特に、誘電体基板にアンテナ電極が形成されて構成された誘電体アンテナの特性を測定する上で好適なアンテナ測定装置及びアンテナ測定方法に関する。
【0002】
【従来の技術】
従来から、アンテナ装置の小型化並びに通信機の小型化を図るために、例えば誘電体基板の表面に電極膜によるアンテナパターンを形成した誘電体アンテナが多数提案されている(例えば、特許文献1、特許文献2及び特許文献3参照)。
【0003】
これらの誘電体アンテナの特性を測定する場合、一部にアース電極が形成された測定用基板を用意し、誘電体アンテナの一部をアース電極に載置固定して行うようにしている。
【特許文献1】
特開平9−162633号公報(図1)
【特許文献2】
特開平10−32413号公報(図1)
【特許文献3】
特開平10−41722号公報(図1)
【0004】
【発明が解決しようとする課題】
しかしながら、この誘電体アンテナの載置固定においては、例えば固定具によって誘電体アンテナを測定用基板に押さえつける方法が採用されている。この場合、固定具が誘電体アンテナの一部に接触することによって誘電体アンテナの共振周波数やインピーダンスがずれるという問題がある。
【0005】
つまり、誘電体アンテナを測定用基板に載置した際の誘電体アンテナの特性と、誘電体アンテナを配線基板(測定用基板と同等のもの)に半田実装した際の誘電体アンテナの特性とが大きく異なることとなる。従って、特性の測定にあたっては、実装時の検査規格をそのまま使用することができない。
【0006】
そこで、従来では、測定用基板に誘電体アンテナを載置固定した際の特性と、実際の配線基板に誘電体アンテナを半田実装した際の特性との相関をとり、この相関関係から代替的な検査規格を定め、測定用基板に誘電体アンテナを載置固定した際の特性を前記代替的な検査規格と照らし合わせるようにしている。
【0007】
このような検査方法では、実際の検査工程に入る前に、代替的な検査規格を決定するための工程が必要になり、工数の削減に限界が生じるおそれがある。
【0008】
また、誘電体アンテナのアンテナ利得を測定するためには、誘電体アンテナに対向させて送信アンテナを設置して行うことが考えられる。しかし、この場合も、アンテナ利得を測定するための代替の検査規格が別途必要になるが、この代替の検査規格を作成するのは、多大な時間と労力が必要であり、コスト的に不利になる。
【0009】
従って、従来では、測定用基板に誘電体アンテナを載置固定して測定する特性としては、もっぱら反射特性のみであり、誘電体アンテナのアンテナ利得、指向性特性や利得の周波数特性の測定は、実装した段階で行うか、別の設備を用いて行うようにしている。そのため、従来は、検査工程にかかる設備や工数が多く、コストの低廉化を図るには限界がある。
【0010】
本発明はこのような課題を考慮してなされたものであり、誘電体アンテナを測定用基板に載置固定する際に、固定具の影響をできるだけなくすことができ、実装時の検査規格で測定することができるアンテナ測定装置及びアンテナ測定方法を提供することを目的とする。
【0011】
また、本発明の目的は、前記条件に加えて、誘電体アンテナのアンテナ利得、反射特性、指向性特性及び利得の周波数特性を1つの測定装置でほぼ同時に測定することができ、測定設備の簡略化や工数の削減を有効に図ることができるアンテナ測定装置及びアンテナ測定方法を提供することにある。
【0012】
【課題を解決するための手段】
本発明に係るアンテナ測定装置は、誘電体基板にアンテナ電極が形成され、かつ、前記誘電体基板の表面の一部にアース電極が形成された誘電体アンテナを測定用基板に載置固定した状態で誘電体アンテナの特性を測定するアンテナ測定装置において、前記誘電体アンテナの前記アース電極に接触して、該誘電体アンテナを前記測定用基板に押さえつける固定具を有することを特徴とする。
【0013】
測定時に、固定具が誘電体アンテナのアース電極に接触して、該誘電体アンテナを測定用基板に押さえつけることから、固定具による誘電体アンテナへの影響はほとんどなくなり、測定時に、固定具が接触しても誘電体アンテナの共振周波数やインピーダンスがずれるということはない。
【0014】
このことから、誘電体アンテナを測定用基板に載置した際の誘電体アンテナの特性と、誘電体アンテナを配線基板(測定用基板と同等のもの)に半田実装した際の誘電体アンテナの特性とはほとんど同じになる。
【0015】
従って、本発明に係るアンテナ測定装置においては、誘電体アンテナにおける特性の測定にあたって、実装時の検査規格をそのまま使用することができ、従来のような代替の検査規格を作る必要はない。その結果、検査工程にかかる工数の削減を有効に図ることができる。
【0016】
そして、前記構成において、前記測定用基板が収容される筐体と、前記固定具を搬送するアーム機構と、前記筐体に接触あるいは近接して取り付けられ、前記誘電体アンテナから放射される電波を受信し、又は前記誘電体アンテナへ電波を放射する送受信部と、前記測定用基板と前記送受信部との相対位置を調整する位置合わせ機構と、前記筐体外に設置され、前記送受信部からの信号あるいは誘電体アンテナからの信号を解析する解析部とを有するようにしてもよい。
【0017】
上述したように、誘電体アンテナにおける特性の測定にあたって、実装時の検査規格をそのまま使用することができることから、送受信部を使用して、アンテナ利得、指向性特性並びに利得の周波数特性を測定する場合においても、実装時の各検査規格をそのまま使用することができる。このため、各特性に合わせた代替の検査規格を別途作成する必要はない。従って、同一の測定装置で誘電体アンテナのアンテナ利得、反射特性、指向性特性、利得の周波数特性を1つの測定装置でほぼ同時に測定することができ、検査工程の工数の大幅なる削減を図ることができる。
【0018】
また、前記測定用基板と前記送受信部との相対位置を調整する位置合わせ機構を有することから、1つの測定装置で様々なサイズの誘電体アンテナの測定を行うことができる。
【0019】
この位置合わせ機構は、前記測定用基板を任意の方向に移動させる基板移動機構と、前記筐体を任意の方向に移動させる筐体移動機構とを有するようにしてもよい。
【0020】
この場合、前記基板移動機構は、前記測定用基板を支持する1以上の支持部材を有し、前記1以上の支持部材は、少なくとも低誘電率の材料で構成されていることが好ましい。前記1以上の支持部材の誘電率は、前記誘電体アンテナの誘電体基板の誘電率よりも低いことが好ましい。これにより、支柱による誘電体アンテナへの影響をほとんどなくすことができ、測定時に、支持部材によって誘電体アンテナの共振周波数やインピーダンスがずれるということはない。
【0021】
また、本発明に係るアンテナ測定方法は、誘電体基板にアンテナ電極が形成され、かつ、前記誘電体基板の表面の一部にアース電極が形成された誘電体アンテナを測定用基板に載置固定した状態で誘電体アンテナの特性を測定するアンテナ測定方法において、固定具を前記誘電体アンテナの前記アース電極に接触させて、該誘電体アンテナを前記基板に押さえつけながら前記誘電体アンテナの特性を測定することを特徴とする。
【0022】
これにより、誘電体アンテナを測定用基板に載置固定する際に、固定具の影響をできるだけなくすことができ、実装時の検査規格で測定することができる。また、誘電体アンテナのアンテナ利得、反射特性、指向性特性及び利得の周波数特性をほぼ同時に測定することができ、測定設備の簡略化や工数の削減を有効に図ることができる。
【0023】
そして、前記方法において、筐体内に前記測定用基板を収容し、前記固定具を用いて前記測定用基板に前記誘電体アンテナを載置固定し、前記筐体に接触あるいは近接して取り付けられた送受信部を通じて、前記誘電体アンテナから放射される電波を受信し、又は前記誘電体アンテナへ電波を放射し、前記送受信部からの信号あるいは誘電体アンテナからの信号を解析して前記誘電体アンテナの特性を測定するようにしてもよい。
【0024】
また、前記測定用基板を支持する支持部材として、少なくとも低誘電率の材料で構成された支持部材を使用することが好ましい。この場合、前記1以上の支持部材の誘電率は、前記誘電体アンテナの誘電体基板の誘電率よりも低いことが好ましい。
【0025】
【発明の実施の形態】
以下、本発明に係るアンテナ測定装置及びアンテナ測定方法の実施の形態例を図1〜図4を参照しながら説明する。
【0026】
本実施の形態に係るアンテナ測定装置10は、図1に示すように、誘電体アンテナ12(図3参照)を測定用基板14に載置固定した状態で該誘電体アンテナ12の特性を測定する装置である。
【0027】
測定用基板14は、図2に示すように、接地電極16が1つのコーナー部18を除いてほぼ全面に形成されている。誘電体アンテナ12は、測定用基板14のうち、接地電極16が形成されていない前記1つのコーナー部18に載置固定されることになる。
【0028】
ここで、誘電体アンテナ12の構成について図3を参照しながら説明する。この誘電体アンテナ12は、図3に示すように、複数枚の板状の誘電体層が積層、焼成されて構成された誘電体基板20と、該誘電体基板20の上面に形成されたアンテナパターン22とを有して構成されている。アンテナパターン22は、電極膜によって例えば帯状に形成されている。
【0029】
また、この誘電体アンテナ12は、誘電体基板20の後端面に電極膜による入出力端子24が形成されており、該入出力端子24とアンテナパターン22の後端とは、誘電体基板20内に形成されたストリップライン電極やビアホール等を介して電気的に接続されている。そして、前記入出力端子24とアンテナの後端とを電気的に接続する部分が給電部分であって、この給電部分がアース電極30で囲まれた形態となっている。
【0030】
そして、本実施の形態に係るアンテナ測定装置10は、図1及び図3に示すように、測定用基板14に載置された誘電体アンテナ12を測定用基板14に押さえつける固定具40を有し、この固定具40は、アーム機構42によって移動するようになっている。
【0031】
誘電体アンテナ12は、例えば多数の誘電体アンテナ12が配列された図示しないパレットから取り出されて、測定用基板14に載置される。図3に示すように、固定具40は、測定用基板14に載置された誘電体アンテナ12のうち、上面に形成されたアース電極30に接触して、該誘電体アンテナ12を測定用基板14に押さえつける。
【0032】
なお、前記パレットから1つの誘電体アンテナ12を取り出して測定用基板14に載置する治具として、前記固定具40を兼用するようにしてもよい。これは、固定具40に例えば真空チャック機構を持たせることで容易に実現することができる。
【0033】
本実施の形態に係るアンテナ測定装置10の全体的な構成は、図1及び図2に示すように、筐体50と、送受信部52と、位置合わせ機構54と、ネットワークアナライザ56と、少なくともアーム機構42、位置合わせ機構54及びネットワークアナライザ56を制御するコンピュータ58とを有する。なお、誘電体アンテナ12の入出力端子24はネットワークアナライザ56に接続されている。
【0034】
筐体50は、内部に測定用基板14が収容される空間60を有し、内壁のうち、少なくとも上下に関する内壁にはそれぞれ多数の電波吸収体62が設けられている。この電波吸収体62の構成材料としては、フェライト焼結材料(MHz帯吸収用)や、ゴム及び樹脂系複合材料(GHz帯吸収用)がある。
【0035】
送受信部52は、筐体50の前面に接触あるいは近接して取り付けられており、誘電体アンテナ12から放射される電波を受信し、及び誘電体アンテナ12に電波を放射する送受信アンテナを有する。
【0036】
位置合わせ機構54は、測定用基板14を、X軸方向(送受信部52に対して接近及び離間する方向)と、Y軸方向(上下方向)と、X軸を中心としたねじり方向θに移動させる基板移動機構70と、筐体50をY軸方向に移動させる第1の筐体移動機構72と、図2に示すように、筐体50をZ軸方向(水平方向であって、かつ、X軸方向と直交する方向)に移動させる第2の筐体移動機構74とを有する。
【0037】
基板移動機構70は、図1に示すように、基台76上に配設され、かつ、基台76に対してX軸方向、Y軸方向及びθ方向に相対移動するステージ78と、該ステージ78上に固定された複数本の円柱状の支柱80と、これら支柱80によって水平に支持された平板状の支持板82とを有する。この支持板82上に測定用基板14が載置固定される。具体的には、図4に示すように、測定用基板14は、そのうちの1つのコーナー部84と、支持板82の1つのコーナー部86とが一致するように、支持板82上に載置固定される。
【0038】
第1の筐体移動機構72は、図1に示すように、基台76上に配設され、かつ、基台76に対してY軸方向に相対移動する第1のステージ88を有し、該第1のステージ88に筐体50の下面又は上面が固定されている。
【0039】
第2の筐体移動機構74は、図2に示すように、基台76上に配設され、かつ、基台76に対してZ軸方向に相対移動する第2のステージ90を有し、該第2のステージ90に筐体50の1つの側面が固定されている。
【0040】
これらの各機構は、例えばコンピュータ58にて制御され、検査対象の誘電体アンテナ12の種類に応じて、測定上、最適な位置に誘電体アンテナ12(もしくは測定用基板14)が配置されるように駆動される。
【0041】
基板移動機構70における複数本の支柱80は、少なくとも低誘電率の材料で構成され、具体的には、支柱80の誘電率は、誘電体アンテナ12における誘電体基板20の誘電率よりも低い。
【0042】
また、複数本の支柱80の設置個所は、誘電体アンテナ12から離れた位置に設置している。本実施の形態では、図4に示すように、支持板82の3つのコーナー部に対応した位置(図4において、1、2及び3で示す位置)に設置した例を示す。
【0043】
次に、この実施の形態に係るアンテナ測定装置10を使用して誘電体アンテナ12の特性を測定する方法について説明する。
【0044】
まず、検査対象の誘電体アンテナ12の種類をコンピュータ58に入力する。コンピュータ58は、入力されたデータに基づいて基板移動機構70、第1及び第2の筐体移動機構72及び74を駆動制御して、測定用基板14を、検査対象である誘電体アンテナ12の特性を測定する上で最適な位置に設定する。
【0045】
その後、コンピュータ58は、アーム機構42を駆動制御して固定具40を図示しないパレット上に搬送し、該パレット内に配列された多数の誘電体アンテナ12から1つの誘電体アンテナ12を真空吸着して保持する。このとき、固定具40は、誘電体アンテナ12の上面のうち、アース電極30に接触した状態で誘電体アンテナ12を保持する。
【0046】
次いで、コンピュータ58は、アーム機構42を駆動制御して固定具40(誘電体アンテナ12を保持している)を測定用基板14上に搬送し、更に、誘電体アンテナ12を、測定用基板14の1つのコーナー部18(接地電極16が形成されていないコーナー部)に載置し、押し付ける。
【0047】
その後、コンピュータ58は、誘電体アンテナ12に対して送信用の信号を送る。誘電体アンテナ12からは、送信用の信号に応じた電波の放射がなされ、その電波が送受信部52にて受信され、ネットワークアナライザ56に受信信号として入力される。この段階で、誘電体アンテナ12のアンテナ利得、反射特性、指向性特性、利得の周波数特性が測定されることになる。
【0048】
このように、本実施の形態に係るアンテナ測定装置10及びアンテナ測定方法は、誘電体アンテナ12を測定用基板14に載置固定する際に、固定具40が誘電体アンテナ12のアース電極30に接触して、該誘電体アンテナ12を測定用基板14に押さえつけることから、固定具40による誘電体アンテナ12への影響はほとんどなくなり、測定時に、固定具40が接触しても誘電体アンテナ12の共振周波数やインピーダンスがずれるということはない。
【0049】
このことから、誘電体アンテナ12を測定用基板14に載置した際の誘電体アンテナ12の特性と、誘電体アンテナ12を配線基板(測定用基板14と同等のもの)に半田実装した際の誘電体アンテナ12の特性とはほとんど同じになる。従って、本実施の形態に係るアンテナ測定装置10及びアンテナ測定方法においては、誘電体アンテナ12における特性の測定にあたって、実装時の検査規格をそのまま使用することができ、従来のような代替の検査規格を作る必要はない。その結果、検査工程にかかる工数の削減を有効に図ることができる。
【0050】
誘電体アンテナ12における特性の測定にあたって、実装時の検査規格をそのまま使用することができることから、送受信部52を使用して、誘電体アンテナ12のアンテナ利得、反射特性、指向性特性並びに利得の周波数特性を測定する場合においても、実装時の各検査規格をそのまま使用することができる。このため、各特性に合わせた代替の検査規格を別途作成する必要はない。従って、誘電体アンテナ12のアンテナ利得、反射特性、指向性特性、利得の周波数特性を同一のアンテナ測定装置10でほぼ同時に測定することができ、検査工程の工数を大幅に削減することができる。
【0051】
また、測定用基板14と送受信部52との相対位置を調整する位置合わせ機構54(基板移動機構70、第1及び第2の筐体移動機構72及び74)を有することから、1つのアンテナ測定装置10で様々なサイズの誘電体アンテナ12の測定を行うことができる。
【0052】
特に、基板移動機構70は、支持板82を支持する複数本の支柱80を、少なくとも低誘電率の材料で構成するようにしたので、支柱80による誘電体アンテナ12への影響をほとんどなくすことができ、測定時に、支柱80によって、誘電体アンテナ12の共振周波数やインピーダンスがずれるということはない。本実施の形態では、支柱80を誘電体アンテナ12から離れた個所に設置するようにしたので、支柱80による影響を更になくすことができる。
【0053】
なお、この発明に係るアンテナ測定装置及びアンテナ測定方法は、上述の実施の形態に限らず、この発明の要旨を逸脱することなく、種々の構成を採り得ることはもちろんである。
【0054】
【発明の効果】
以上説明したように、本発明に係るアンテナ測定装置及びアンテナ測定方法によれば、誘電体アンテナを測定用基板に載置固定する際に、固定具の影響をできるだけなくすことができ、実装時の検査規格で測定することができる。
【0055】
また、誘電体アンテナのアンテナ利得、反射特性、指向性特性及び利得の周波数特性を1つの測定装置でほぼ同時に測定することができ、測定設備の簡略化や工数の削減を有効に図ることができる。
【図面の簡単な説明】
【図1】本実施の形態に係るアンテナ測定装置の概略構成を側面から見て示す説明図である。
【図2】本実施の形態に係るアンテナ測定装置の概略構成を平面から見て示す説明図である。
【図3】測定用基板に載置固定された誘電体アンテナを示す斜視図である。
【図4】支持板に対する支柱の配置を示す説明図である。
【符号の説明】
10…アンテナ測定装置 12…誘電体アンテナ
14…測定用基板 20…誘電体基板
22…アンテナパターン 24…入出力端子
30…アース電極 40…固定具
42…アーム機構 50…筐体
52…送受信部 54…位置合わせ機構
56…ネットワークアナライザ 58…コンピュータ
62…電波吸収体 70…基板移動機構
72…第1の筐体移動機構 74…第2の筐体移動機構
80…支柱 82…支持板
[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to an antenna measuring device and an antenna measuring method for measuring characteristics of an antenna device, and particularly to an antenna measuring device suitable for measuring characteristics of a dielectric antenna formed by forming an antenna electrode on a dielectric substrate. And an antenna measurement method.
[0002]
[Prior art]
2. Description of the Related Art Conventionally, in order to reduce the size of an antenna device and the size of a communication device, for example, a large number of dielectric antennas in which an antenna pattern formed of an electrode film is formed on the surface of a dielectric substrate have been proposed (for example, Patent Document 1, Patent Documents 2 and 3).
[0003]
When measuring the characteristics of these dielectric antennas, a measurement substrate in which a ground electrode is partially formed is prepared, and a part of the dielectric antenna is mounted and fixed on the ground electrode.
[Patent Document 1]
JP-A-9-162633 (FIG. 1)
[Patent Document 2]
JP-A-10-32413 (FIG. 1)
[Patent Document 3]
JP-A-10-41722 (FIG. 1)
[0004]
[Problems to be solved by the invention]
However, in mounting and fixing the dielectric antenna, a method is employed in which the dielectric antenna is pressed against the measurement substrate by a fixture, for example. In this case, there is a problem that the resonance frequency and the impedance of the dielectric antenna are shifted due to the fixing tool contacting a part of the dielectric antenna.
[0005]
In other words, the characteristics of the dielectric antenna when the dielectric antenna is mounted on the measurement substrate and the characteristics of the dielectric antenna when the dielectric antenna is solder-mounted on the wiring substrate (equivalent to the measurement substrate) are different. It will be very different. Therefore, in measuring the characteristics, the inspection standard at the time of mounting cannot be used as it is.
[0006]
Therefore, in the past, the correlation between the characteristic when the dielectric antenna was mounted and fixed on the measurement substrate and the characteristic when the dielectric antenna was solder-mounted on the actual wiring board was calculated. An inspection standard is determined, and characteristics when the dielectric antenna is mounted and fixed on the measurement substrate are compared with the alternative inspection standard.
[0007]
In such an inspection method, a step for determining an alternative inspection standard is required before starting an actual inspection step, and there is a possibility that reduction in the number of steps may be limited.
[0008]
In addition, in order to measure the antenna gain of the dielectric antenna, it is conceivable to perform the measurement by installing a transmission antenna so as to face the dielectric antenna. However, also in this case, an alternative inspection standard for measuring the antenna gain is separately required, but creating this alternative inspection standard requires a great deal of time and effort, and is disadvantageous in terms of cost. Become.
[0009]
Therefore, conventionally, as a characteristic for mounting and fixing the dielectric antenna on the measurement substrate, only the reflection characteristic is used, and the antenna gain, the directivity characteristic, and the frequency characteristic of the gain of the dielectric antenna are measured. Either at the stage of mounting or using another facility. Therefore, conventionally, there are many facilities and man-hours required for the inspection process, and there is a limit in reducing the cost.
[0010]
The present invention has been made in view of such a problem, and when mounting and fixing a dielectric antenna on a measurement substrate, the influence of the fixture can be eliminated as much as possible. It is an object of the present invention to provide an antenna measuring device and an antenna measuring method capable of performing the above.
[0011]
Further, an object of the present invention is that, in addition to the above conditions, the antenna gain, the reflection characteristic, the directivity characteristic, and the frequency characteristic of the gain of the dielectric antenna can be measured almost at the same time by one measuring device, and the measuring equipment can be simplified. It is an object of the present invention to provide an antenna measuring device and an antenna measuring method capable of effectively reducing the number of steps and man-hours.
[0012]
[Means for Solving the Problems]
An antenna measuring apparatus according to the present invention is configured such that an antenna electrode is formed on a dielectric substrate, and a dielectric antenna having a ground electrode formed on a part of the surface of the dielectric substrate is mounted and fixed on a measuring substrate. In the antenna measuring apparatus for measuring the characteristics of the dielectric antenna, there is provided a fixture for contacting the earth electrode of the dielectric antenna and pressing the dielectric antenna against the substrate for measurement.
[0013]
At the time of measurement, the fixture comes into contact with the earth electrode of the dielectric antenna and presses the dielectric antenna against the substrate for measurement. Even if this happens, the resonance frequency and impedance of the dielectric antenna will not shift.
[0014]
From this, the characteristics of the dielectric antenna when the dielectric antenna is mounted on the measurement substrate and the characteristics of the dielectric antenna when the dielectric antenna is solder-mounted on the wiring board (equivalent to the measurement substrate) Will be almost the same.
[0015]
Therefore, in the antenna measuring apparatus according to the present invention, when measuring the characteristics of the dielectric antenna, the inspection standard at the time of mounting can be used as it is, and there is no need to create an alternative inspection standard as in the related art. As a result, it is possible to effectively reduce the number of steps required for the inspection process.
[0016]
Then, in the above configuration, a housing accommodating the measurement substrate, an arm mechanism for transporting the fixture, and a radio wave radiated from the dielectric antenna attached to or close to the housing. A transmission / reception unit that receives or radiates radio waves to the dielectric antenna, a positioning mechanism that adjusts a relative position between the measurement substrate and the transmission / reception unit, and a signal from the transmission / reception unit that is installed outside the housing. Or you may make it have the analysis part which analyzes the signal from a dielectric antenna.
[0017]
As described above, when measuring the characteristics of the dielectric antenna, since the inspection standard at the time of mounting can be used as it is, when measuring the antenna gain, the directivity characteristics, and the frequency characteristics of the gain using the transmission / reception unit Also, each inspection standard at the time of mounting can be used as it is. For this reason, it is not necessary to separately create an alternative inspection standard corresponding to each characteristic. Accordingly, the antenna gain, reflection characteristics, directivity characteristics, and frequency characteristics of the gain of the dielectric antenna can be measured almost simultaneously with one measuring device using the same measuring device, and the number of steps in the inspection process can be significantly reduced. Can be.
[0018]
In addition, since there is a positioning mechanism for adjusting a relative position between the measurement substrate and the transmitting / receiving unit, it is possible to measure dielectric antennas of various sizes with one measuring device.
[0019]
The positioning mechanism may include a substrate moving mechanism for moving the measurement substrate in an arbitrary direction and a housing moving mechanism for moving the housing in an arbitrary direction.
[0020]
In this case, it is preferable that the substrate moving mechanism has one or more support members for supporting the measurement substrate, and the one or more support members are made of at least a material having a low dielectric constant. It is preferable that the dielectric constant of the one or more support members is lower than the dielectric constant of the dielectric substrate of the dielectric antenna. Thereby, the influence of the support on the dielectric antenna can be almost eliminated, and the resonance frequency and impedance of the dielectric antenna are not shifted by the support member during measurement.
[0021]
Further, in the antenna measuring method according to the present invention, an antenna electrode is formed on a dielectric substrate, and a dielectric antenna having a ground electrode formed on a part of the surface of the dielectric substrate is placed and fixed on a measuring substrate. In the antenna measuring method for measuring the characteristics of the dielectric antenna in a state in which the dielectric antenna is in contact with the earth electrode of the dielectric antenna, the characteristics of the dielectric antenna are measured while pressing the dielectric antenna against the substrate. It is characterized by doing.
[0022]
Thereby, when mounting and fixing the dielectric antenna on the measurement substrate, the influence of the fixture can be eliminated as much as possible, and the measurement can be performed according to the inspection standard at the time of mounting. In addition, the antenna gain, reflection characteristics, directivity characteristics, and frequency characteristics of the gain of the dielectric antenna can be measured almost simultaneously, so that the measurement equipment can be simplified and the number of steps can be effectively reduced.
[0023]
Then, in the method, the measurement substrate is accommodated in a housing, and the dielectric antenna is mounted and fixed on the measurement substrate using the fixing tool, and is attached to or close to the housing. Through the transmission / reception unit, receives a radio wave radiated from the dielectric antenna, or radiates a radio wave to the dielectric antenna, analyzes a signal from the transmission / reception unit or a signal from the dielectric antenna, and analyzes the signal from the dielectric antenna. The characteristic may be measured.
[0024]
Further, it is preferable to use a support member made of at least a material having a low dielectric constant as a support member for supporting the measurement substrate. In this case, it is preferable that the dielectric constant of the one or more support members is lower than the dielectric constant of the dielectric substrate of the dielectric antenna.
[0025]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, an embodiment of an antenna measuring device and an antenna measuring method according to the present invention will be described with reference to FIGS.
[0026]
As shown in FIG. 1, the antenna measuring apparatus 10 according to the present embodiment measures the characteristics of the dielectric antenna 12 while the dielectric antenna 12 (see FIG. 3) is placed and fixed on a measurement substrate 14. Device.
[0027]
As shown in FIG. 2, the ground electrode 16 is formed on almost the entire surface of the measurement substrate 14 except for one corner portion 18. The dielectric antenna 12 is placed and fixed on the one corner portion 18 of the measurement substrate 14 where the ground electrode 16 is not formed.
[0028]
Here, the configuration of the dielectric antenna 12 will be described with reference to FIG. As shown in FIG. 3, the dielectric antenna 12 includes a dielectric substrate 20 formed by stacking and firing a plurality of plate-shaped dielectric layers, and an antenna formed on the upper surface of the dielectric substrate 20. And a pattern 22. The antenna pattern 22 is formed, for example, in a band shape by the electrode film.
[0029]
The dielectric antenna 12 has an input / output terminal 24 formed of an electrode film on the rear end surface of the dielectric substrate 20. The input / output terminal 24 and the rear end of the antenna pattern 22 are Are electrically connected via a strip line electrode, a via hole, or the like formed on the substrate. A portion that electrically connects the input / output terminal 24 and the rear end of the antenna is a power supply portion, and the power supply portion is surrounded by a ground electrode 30.
[0030]
As shown in FIGS. 1 and 3, the antenna measurement device 10 according to the present embodiment has a fixture 40 that presses the dielectric antenna 12 placed on the measurement substrate 14 against the measurement substrate 14. The fixture 40 is moved by an arm mechanism 42.
[0031]
The dielectric antenna 12 is taken out, for example, from a pallet (not shown) in which a large number of dielectric antennas 12 are arranged, and is mounted on the measurement substrate 14. As shown in FIG. 3, the fixture 40 contacts the earth electrode 30 formed on the upper surface of the dielectric antenna 12 placed on the measurement substrate 14, and fixes the dielectric antenna 12 to the measurement substrate 14. Press down on 14.
[0032]
The fixture 40 may also be used as a jig for taking out one dielectric antenna 12 from the pallet and placing it on the measurement substrate 14. This can be easily realized by providing the fixture 40 with, for example, a vacuum chuck mechanism.
[0033]
As shown in FIGS. 1 and 2, the overall configuration of the antenna measuring device 10 according to the present embodiment includes a housing 50, a transmitting / receiving unit 52, a positioning mechanism 54, a network analyzer 56, A computer 58 for controlling the mechanism 42, the alignment mechanism 54, and the network analyzer 56; The input / output terminal 24 of the dielectric antenna 12 is connected to a network analyzer 56.
[0034]
The housing 50 has a space 60 in which the measurement substrate 14 is housed, and a large number of radio wave absorbers 62 are provided on at least the upper and lower inner walls among the inner walls. As a constituent material of the radio wave absorber 62, there are a ferrite sintered material (for absorption in the MHz band) and a rubber and resin-based composite material (for absorption in the GHz band).
[0035]
The transmission / reception unit 52 is attached to or close to the front surface of the housing 50 and has a transmission / reception antenna that receives a radio wave radiated from the dielectric antenna 12 and radiates a radio wave to the dielectric antenna 12.
[0036]
The positioning mechanism 54 moves the measurement substrate 14 in the X-axis direction (direction approaching and separating from the transmission / reception unit 52), the Y-axis direction (vertical direction), and the torsional direction θ about the X-axis. A substrate moving mechanism 70 for moving the housing 50, a first housing moving mechanism 72 for moving the housing 50 in the Y-axis direction, and a housing 50 for moving the housing 50 in the Z-axis direction (horizontal direction and (A direction orthogonal to the X-axis direction).
[0037]
As shown in FIG. 1, the substrate moving mechanism 70 is provided on a base 76 and moves relative to the base 76 in the X-axis direction, the Y-axis direction, and the θ direction. There are a plurality of columnar columns 80 fixed on 78, and a flat supporting plate 82 horizontally supported by the columns 80. The measurement substrate 14 is placed and fixed on the support plate 82. Specifically, as shown in FIG. 4, the measurement substrate 14 is placed on the support plate 82 such that one of the corner portions 84 and one of the corner portions 86 of the support plate 82 match. Fixed.
[0038]
As shown in FIG. 1, the first housing moving mechanism 72 has a first stage 88 disposed on the base 76 and moving relatively to the base 76 in the Y-axis direction. The lower surface or the upper surface of the housing 50 is fixed to the first stage 88.
[0039]
As shown in FIG. 2, the second housing moving mechanism 74 has a second stage 90 that is disposed on the base 76 and moves relatively to the base 76 in the Z-axis direction. One side surface of the housing 50 is fixed to the second stage 90.
[0040]
Each of these mechanisms is controlled by, for example, a computer 58, and the dielectric antenna 12 (or the measurement substrate 14) is arranged at an optimal position for measurement according to the type of the dielectric antenna 12 to be inspected. Is driven.
[0041]
The plurality of columns 80 in the substrate moving mechanism 70 are made of at least a material having a low dielectric constant. Specifically, the dielectric constant of the columns 80 is lower than the dielectric constant of the dielectric substrate 20 in the dielectric antenna 12.
[0042]
In addition, the installation positions of the plurality of columns 80 are installed at positions away from the dielectric antenna 12. In the present embodiment, as shown in FIG. 4, an example is shown in which the support plate 82 is installed at positions corresponding to three corners (positions indicated by 1, 2, and 3 in FIG. 4).
[0043]
Next, a method for measuring the characteristics of the dielectric antenna 12 using the antenna measuring device 10 according to this embodiment will be described.
[0044]
First, the type of the dielectric antenna 12 to be inspected is input to the computer 58. The computer 58 controls the driving of the board moving mechanism 70 and the first and second housing moving mechanisms 72 and 74 based on the input data, so that the measuring board 14 is mounted on the dielectric antenna 12 to be inspected. Set to the optimal position for measuring characteristics.
[0045]
Thereafter, the computer 58 drives and controls the arm mechanism 42 to convey the fixture 40 onto a pallet (not shown), and vacuum-adsorbs one of the dielectric antennas 12 arranged in the pallet from one of the dielectric antennas 12. Hold. At this time, the fixture 40 holds the dielectric antenna 12 in a state of being in contact with the ground electrode 30 on the upper surface of the dielectric antenna 12.
[0046]
Next, the computer 58 controls the drive of the arm mechanism 42 to transport the fixture 40 (holding the dielectric antenna 12) onto the measurement substrate 14, and further moves the dielectric antenna 12 to the measurement substrate 14. Is placed on one corner 18 (the corner where the ground electrode 16 is not formed) and pressed.
[0047]
After that, the computer 58 sends a signal for transmission to the dielectric antenna 12. Radio waves are emitted from the dielectric antenna 12 in accordance with transmission signals, and the radio waves are received by the transmission / reception unit 52 and input to the network analyzer 56 as reception signals. At this stage, the antenna gain, reflection characteristics, directivity characteristics, and frequency characteristics of the gain of the dielectric antenna 12 are measured.
[0048]
As described above, in the antenna measuring apparatus 10 and the antenna measuring method according to the present embodiment, when the dielectric antenna 12 is placed and fixed on the measurement substrate 14, the fixture 40 is connected to the ground electrode 30 of the dielectric antenna 12. Since the dielectric antenna 12 comes into contact and presses the dielectric antenna 12 against the measurement substrate 14, the effect of the fixture 40 on the dielectric antenna 12 is almost eliminated. The resonance frequency and impedance do not shift.
[0049]
From this, the characteristics of the dielectric antenna 12 when the dielectric antenna 12 is mounted on the measurement board 14 and the characteristics when the dielectric antenna 12 is solder-mounted on the wiring board (equivalent to the measurement board 14). The characteristics of the dielectric antenna 12 are almost the same. Therefore, in the antenna measuring apparatus 10 and the antenna measuring method according to the present embodiment, when measuring the characteristics of the dielectric antenna 12, the inspection standard at the time of mounting can be used as it is, and the alternative inspection standard as in the related art is used. There is no need to make. As a result, it is possible to effectively reduce the number of steps required for the inspection process.
[0050]
In measuring the characteristics of the dielectric antenna 12, since the inspection standard at the time of mounting can be used as it is, the antenna gain, the reflection characteristics, the directivity characteristics, and the frequency of the gain of the dielectric antenna 12 can be measured by using the transmission / reception unit 52. Even when measuring the characteristics, each inspection standard at the time of mounting can be used as it is. For this reason, it is not necessary to separately create an alternative inspection standard corresponding to each characteristic. Therefore, the antenna gain, the reflection characteristics, the directivity characteristics, and the frequency characteristics of the gain of the dielectric antenna 12 can be measured almost simultaneously by the same antenna measurement device 10, and the number of steps in the inspection process can be greatly reduced.
[0051]
In addition, since the positioning mechanism 54 (the board moving mechanism 70 and the first and second housing moving mechanisms 72 and 74) for adjusting the relative position between the measuring board 14 and the transmitting / receiving section 52 is provided, one antenna measurement is performed. The device 10 can measure dielectric antennas 12 of various sizes.
[0052]
In particular, since the plurality of columns 80 supporting the support plate 82 are made of at least a material having a low dielectric constant, the substrate moving mechanism 70 can substantially eliminate the influence of the columns 80 on the dielectric antenna 12. It is possible to prevent the resonance frequency and impedance of the dielectric antenna 12 from being shifted by the support 80 during the measurement. In the present embodiment, the column 80 is installed at a location away from the dielectric antenna 12, so that the effect of the column 80 can be further eliminated.
[0053]
In addition, the antenna measuring device and the antenna measuring method according to the present invention are not limited to the above-described embodiment, but may adopt various configurations without departing from the gist of the present invention.
[0054]
【The invention's effect】
As described above, according to the antenna measuring device and the antenna measuring method according to the present invention, when the dielectric antenna is placed and fixed on the measurement substrate, the influence of the fixture can be eliminated as much as possible. It can be measured by inspection standards.
[0055]
Further, the antenna gain, reflection characteristics, directivity characteristics, and frequency characteristics of the gain of the dielectric antenna can be measured almost simultaneously with one measuring device, so that the measuring equipment can be simplified and the number of steps can be effectively reduced. .
[Brief description of the drawings]
FIG. 1 is an explanatory diagram showing a schematic configuration of an antenna measuring device according to the present embodiment as viewed from a side.
FIG. 2 is an explanatory diagram showing a schematic configuration of the antenna measuring device according to the present embodiment as viewed from above.
FIG. 3 is a perspective view showing a dielectric antenna placed and fixed on a measurement substrate.
FIG. 4 is an explanatory view showing an arrangement of a support with respect to a support plate.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 10 ... Antenna measuring device 12 ... Dielectric antenna 14 ... Measurement board 20 ... Dielectric substrate 22 ... Antenna pattern 24 ... Input / output terminal 30 ... Earth electrode 40 ... Fixture 42 ... Arm mechanism 50 ... Housing 52 ... Transmitter / receiver 54 ... Positioning mechanism 56 ... Network analyzer 58 ... Computer 62 ... Radio wave absorber 70 ... Substrate moving mechanism 72 ... First housing moving mechanism 74 ... Second housing moving mechanism 80 ... Support 82 ... Support plate

Claims (9)

誘電体基板にアンテナ電極が形成され、かつ、前記誘電体基板の表面の一部にアース電極が形成された誘電体アンテナを測定用基板に載置固定した状態で誘電体アンテナの特性を測定するアンテナ測定装置において、
前記誘電体アンテナの前記アース電極に接触して、該誘電体アンテナを前記測定用基板に押さえつける固定具を有することを特徴とするアンテナ測定装置。
An antenna electrode is formed on a dielectric substrate, and a characteristic of the dielectric antenna is measured with the dielectric antenna having a ground electrode formed on a part of the surface of the dielectric substrate mounted and fixed on a measurement substrate. In the antenna measuring device,
An antenna measuring apparatus, comprising: a fixture that contacts the ground electrode of the dielectric antenna and presses the dielectric antenna against the measurement substrate.
請求項1記載のアンテナ測定装置において、
前記測定用基板が収容される筐体と、
前記固定具を搬送するアーム機構と、
前記筐体に接触あるいは近接して取り付けられ、前記誘電体アンテナから放射される電波を受信、又は前記誘電体アンテナへ電波を放射する送受信部と、
前記測定用基板と前記送受信部との相対位置を調整する位置合わせ機構と、
前記筐体外に設置され、前記送受信部からの信号あるいは誘電体アンテナからの信号を解析する解析部とを有することを特徴とするアンテナ測定装置。
The antenna measuring device according to claim 1,
A housing in which the measurement substrate is housed,
An arm mechanism for transporting the fixture,
A transmitter / receiver that is attached to or close to the housing and receives radio waves radiated from the dielectric antenna, or radiates radio waves to the dielectric antenna,
A positioning mechanism for adjusting a relative position between the measurement substrate and the transmitting and receiving unit,
An antenna measuring device, which is provided outside the housing and has an analyzing unit for analyzing a signal from the transmitting / receiving unit or a signal from a dielectric antenna.
請求項1〜3のいずれか1項に記載のアンテナ測定装置において、
前記位置合わせ機構は、
前記測定用基板を任意の方向に移動させる基板移動機構と、
前記筐体を任意の方向に移動させる筐体移動機構とを有することを特徴とするアンテナ測定装置。
The antenna measuring device according to any one of claims 1 to 3,
The alignment mechanism includes:
A substrate moving mechanism for moving the measurement substrate in an arbitrary direction,
An antenna measuring device comprising: a housing moving mechanism for moving the housing in an arbitrary direction.
請求項3記載のアンテナ測定装置において、
前記基板移動機構は、前記測定用基板を支持する1以上の支持部材を有し、
前記1以上の支持部材は、少なくとも低誘電率の材料で構成されていることを特徴とするアンテナ測定装置。
The antenna measuring device according to claim 3,
The substrate moving mechanism has one or more support members that support the measurement substrate,
The antenna measuring device according to claim 1, wherein the at least one support member is made of at least a material having a low dielectric constant.
請求項4記載のアンテナ測定装置において、
前記1以上の支持部材の誘電率は、前記誘電体アンテナの誘電体基板の誘電率よりも低いことを特徴とするアンテナ測定装置。
The antenna measuring apparatus according to claim 4,
An antenna measuring apparatus, wherein the dielectric constant of the one or more support members is lower than the dielectric constant of a dielectric substrate of the dielectric antenna.
誘電体基板にアンテナ電極が形成され、かつ、前記誘電体基板の表面の一部にアース電極が形成された誘電体アンテナを測定用基板に載置固定した状態で誘電体アンテナの特性を測定するアンテナ測定方法において、
固定具を前記誘電体アンテナの前記アース電極に接触させて、該誘電体アンテナを前記基板に押さえつけながら前記誘電体アンテナの特性を測定することを特徴とするアンテナ測定方法。
An antenna electrode is formed on a dielectric substrate, and a characteristic of the dielectric antenna is measured with the dielectric antenna having a ground electrode formed on a part of the surface of the dielectric substrate mounted and fixed on a measurement substrate. In the antenna measurement method,
An antenna measuring method, comprising: bringing a fixture into contact with the ground electrode of the dielectric antenna, and measuring characteristics of the dielectric antenna while pressing the dielectric antenna against the substrate.
請求項6記載のアンテナ測定方法において、
筐体内に前記測定用基板を収容し、
前記固定具を用いて前記測定用基板に前記誘電体アンテナを載置固定し、
前記筐体に接触あるいは近接して取り付けられた送受信部を通じて、前記誘電体アンテナから放射される電波を受信し、又は前記誘電体アンテナへ電波を放射し、
前記送受信部からの信号あるいは誘電体アンテナからの信号を解析して前記誘電体アンテナの特性を測定することを特徴とするアンテナ測定方法。
The antenna measuring method according to claim 6,
Housing the measurement substrate in a housing,
The dielectric antenna is placed and fixed on the measurement substrate using the fixture,
Through a transmitting / receiving unit attached to or close to the housing, receives a radio wave radiated from the dielectric antenna, or radiates a radio wave to the dielectric antenna,
An antenna measuring method, comprising analyzing a signal from the transmitting / receiving unit or a signal from a dielectric antenna to measure characteristics of the dielectric antenna.
請求項6又は7記載のアンテナ測定方法において、
前記測定用基板を支持する支持部材として、少なくとも低誘電率の材料で構成された支持部材を使用することを特徴とするアンテナ測定方法。
The antenna measuring method according to claim 6 or 7,
An antenna measurement method, wherein a support member made of at least a material having a low dielectric constant is used as a support member for supporting the measurement substrate.
請求項8記載のアンテナ測定方法において、
前記1以上の支持部材の誘電率は、前記誘電体アンテナの誘電体基板の誘電率よりも低いことを特徴とするアンテナ測定方法。
The antenna measuring method according to claim 8,
The antenna measurement method according to claim 1, wherein a dielectric constant of the one or more support members is lower than a dielectric constant of a dielectric substrate of the dielectric antenna.
JP2003068250A 2003-03-13 2003-03-13 Antenna measuring apparatus and antenna measuring method Expired - Fee Related JP4621414B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003068250A JP4621414B2 (en) 2003-03-13 2003-03-13 Antenna measuring apparatus and antenna measuring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003068250A JP4621414B2 (en) 2003-03-13 2003-03-13 Antenna measuring apparatus and antenna measuring method

Publications (2)

Publication Number Publication Date
JP2004279110A true JP2004279110A (en) 2004-10-07
JP4621414B2 JP4621414B2 (en) 2011-01-26

Family

ID=33285645

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003068250A Expired - Fee Related JP4621414B2 (en) 2003-03-13 2003-03-13 Antenna measuring apparatus and antenna measuring method

Country Status (1)

Country Link
JP (1) JP4621414B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021230592A1 (en) * 2020-05-13 2021-11-18 동우화인켐 주식회사 Antenna inspection device and method

Citations (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02112768A (en) * 1988-10-21 1990-04-25 Mitsubishi Electric Corp High frequency element evaluating device
JPH02128175A (en) * 1988-11-08 1990-05-16 Nec Yamagata Ltd High frequency measuring jig
JPH0348776A (en) * 1989-07-17 1991-03-01 Mitsubishi Electric Corp Alignment adjusting device for measuring neighboring area of antenna
JPH0450780A (en) * 1990-06-18 1992-02-19 Mitsubishi Electric Corp Semiconductor evaluation device
JPH0536772A (en) * 1991-07-29 1993-02-12 Murata Mfg Co Ltd Jig for high-frequency characteristic measuring
JPH05333096A (en) * 1992-06-01 1993-12-17 Rohm Co Ltd Measuring method and device of high frequency element
JPH06102314A (en) * 1992-09-18 1994-04-15 Mitsubishi Electric Corp Semiconductor inspection device
JPH06295949A (en) * 1993-04-09 1994-10-21 Matsushita Electric Ind Co Ltd Inspecting device and method and semiconductor device
JPH07249924A (en) * 1994-03-10 1995-09-26 Murata Mfg Co Ltd Antenna and antenna system
JPH07297630A (en) * 1994-04-26 1995-11-10 Yokogawa Denshi Kiki Kk Plane antenna
JPH0894688A (en) * 1994-09-26 1996-04-12 Murata Mfg Co Ltd Instrument for measuring temperature coefficient of dielectric resonator
JPH1038971A (en) * 1996-07-26 1998-02-13 Kyocera Corp Apparatus for measuring surface-mounting-type electronic part
JPH1078465A (en) * 1996-09-03 1998-03-24 Ando Electric Co Ltd Shielded box
JPH10246742A (en) * 1997-03-03 1998-09-14 Kokusai Electric Co Ltd Method and apparatus for measuring characteristics of linear antenna
JPH11183565A (en) * 1997-12-25 1999-07-09 Anritsu Corp Terminal pressurizing equipment for electronic device and method for measuring electronic characteristics using the device
JP2000292470A (en) * 1999-04-13 2000-10-20 Ten Kk Antenna reception performance measuring device for communication device
JP2001349917A (en) * 2000-06-12 2001-12-21 Advantest Corp Apparatus for measuring radiation directivity of antenna
JP2003017923A (en) * 2001-07-02 2003-01-17 Ngk Insulators Ltd Antenna system
JP2003069331A (en) * 2001-06-15 2003-03-07 Hitachi Metals Ltd Surface-mounted antenna and communication apparatus mounting the same

Patent Citations (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02112768A (en) * 1988-10-21 1990-04-25 Mitsubishi Electric Corp High frequency element evaluating device
JPH02128175A (en) * 1988-11-08 1990-05-16 Nec Yamagata Ltd High frequency measuring jig
JPH0348776A (en) * 1989-07-17 1991-03-01 Mitsubishi Electric Corp Alignment adjusting device for measuring neighboring area of antenna
JPH0450780A (en) * 1990-06-18 1992-02-19 Mitsubishi Electric Corp Semiconductor evaluation device
JPH0536772A (en) * 1991-07-29 1993-02-12 Murata Mfg Co Ltd Jig for high-frequency characteristic measuring
JPH05333096A (en) * 1992-06-01 1993-12-17 Rohm Co Ltd Measuring method and device of high frequency element
JPH06102314A (en) * 1992-09-18 1994-04-15 Mitsubishi Electric Corp Semiconductor inspection device
JPH06295949A (en) * 1993-04-09 1994-10-21 Matsushita Electric Ind Co Ltd Inspecting device and method and semiconductor device
JPH07249924A (en) * 1994-03-10 1995-09-26 Murata Mfg Co Ltd Antenna and antenna system
JPH07297630A (en) * 1994-04-26 1995-11-10 Yokogawa Denshi Kiki Kk Plane antenna
JPH0894688A (en) * 1994-09-26 1996-04-12 Murata Mfg Co Ltd Instrument for measuring temperature coefficient of dielectric resonator
JPH1038971A (en) * 1996-07-26 1998-02-13 Kyocera Corp Apparatus for measuring surface-mounting-type electronic part
JPH1078465A (en) * 1996-09-03 1998-03-24 Ando Electric Co Ltd Shielded box
JPH10246742A (en) * 1997-03-03 1998-09-14 Kokusai Electric Co Ltd Method and apparatus for measuring characteristics of linear antenna
JPH11183565A (en) * 1997-12-25 1999-07-09 Anritsu Corp Terminal pressurizing equipment for electronic device and method for measuring electronic characteristics using the device
JP2000292470A (en) * 1999-04-13 2000-10-20 Ten Kk Antenna reception performance measuring device for communication device
JP2001349917A (en) * 2000-06-12 2001-12-21 Advantest Corp Apparatus for measuring radiation directivity of antenna
JP2003069331A (en) * 2001-06-15 2003-03-07 Hitachi Metals Ltd Surface-mounted antenna and communication apparatus mounting the same
JP2003017923A (en) * 2001-07-02 2003-01-17 Ngk Insulators Ltd Antenna system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021230592A1 (en) * 2020-05-13 2021-11-18 동우화인켐 주식회사 Antenna inspection device and method

Also Published As

Publication number Publication date
JP4621414B2 (en) 2011-01-26

Similar Documents

Publication Publication Date Title
CN109444702B (en) Air wireless test system and test method
JP3212787U (en) Electronic device with millimeter-wave antenna on laminated printed circuit
CN103051390B (en) For reducing the method and apparatus of path loss
TWI502337B (en) Testing system with mobile storage carts and computer-controlled loading equipment
US10637590B2 (en) Millimeter wave test systems
US9154972B2 (en) Methods and apparatus for testing electronic devices with antenna arrays
JP4098409B2 (en) Antenna coupler for testing mobile and car phones
EP2608315B1 (en) Switchable diversity antenna apparatus and methods
US9070968B2 (en) Methods for characterizing tunable radio-frequency elements in wireless electronic devices
TW200928382A (en) RF integrated circuit test methodology and system
JP2004506912A (en) Highly integrated single-substrate MMW multi-beam sensor
JP7252277B2 (en) dielectric resonator antenna module
US20140055147A1 (en) Testing Systems with Automated Loading Equipment and Positioners
US7652633B2 (en) Antenna for GPS
US20140240195A1 (en) Electronic Device With Diverse Antenna Array Having Soldered Connections
US20240113449A9 (en) Millimeter-Wave Antenna Module and Electronic Device
TW202210397A (en) Electronic component pressing apparatus and electronic component testing apparatus
CN108600448A (en) A kind of communication terminal
JP2004279110A (en) Antenna measuring device and antenna measuring method
KR100577055B1 (en) Wireless repeater and cradle structure for the same
US11624758B2 (en) Test kit for testing a device under test
US11579178B1 (en) Inspection apparatus for bare circuit board
JP2003307536A (en) Electromagnetic wave effect inspection system
WO2019184748A1 (en) Electronic device
WO2023181290A1 (en) Socket assembly and electronic component test device

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20060221

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20080403

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090106

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090309

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20091110

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100112

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20101012

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20101101

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20131105

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees