JPH10307982A - テスト環境情報の統合記憶方法及び装置 - Google Patents

テスト環境情報の統合記憶方法及び装置

Info

Publication number
JPH10307982A
JPH10307982A JP10066438A JP6643898A JPH10307982A JP H10307982 A JPH10307982 A JP H10307982A JP 10066438 A JP10066438 A JP 10066438A JP 6643898 A JP6643898 A JP 6643898A JP H10307982 A JPH10307982 A JP H10307982A
Authority
JP
Japan
Prior art keywords
data
test
file
context data
setup
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10066438A
Other languages
English (en)
Japanese (ja)
Other versions
JPH10307982A5 (https=
Inventor
A Alexander J
ジェイ・エー・アレクサンダー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JPH10307982A publication Critical patent/JPH10307982A/ja
Publication of JPH10307982A5 publication Critical patent/JPH10307982A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/006—Identification

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Debugging And Monitoring (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
JP10066438A 1997-03-17 1998-03-17 テスト環境情報の統合記憶方法及び装置 Pending JPH10307982A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/821,972 US5953684A (en) 1997-03-17 1997-03-17 Methods and apparatus for integrated storage of test environment context information
US821,972 1997-03-17

Publications (2)

Publication Number Publication Date
JPH10307982A true JPH10307982A (ja) 1998-11-17
JPH10307982A5 JPH10307982A5 (https=) 2005-06-02

Family

ID=25234750

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10066438A Pending JPH10307982A (ja) 1997-03-17 1998-03-17 テスト環境情報の統合記憶方法及び装置

Country Status (2)

Country Link
US (1) US5953684A (https=)
JP (1) JPH10307982A (https=)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19839121A1 (de) * 1998-08-27 2000-03-02 Rohde & Schwarz Anordnung zum kontinuierlichen und unterbrechungsfreien Einlesen einer großen Datenmenge eines elektronischen Meßgerätes in einen Speicher
US7296060B2 (en) * 1998-12-24 2007-11-13 Intel Corporation System and method for automatically identifying and attaching related documents
JP3522662B2 (ja) * 1999-07-23 2004-04-26 シャープ株式会社 半導体集積回路の検査装置及びその検査方法並びにその検査プログラムを記録した記憶媒体
US7409531B1 (en) * 1999-10-29 2008-08-05 Hewlett-Packard Development Company, L.P. Integrated micro-controller and programmable device
US6904389B2 (en) * 2001-03-06 2005-06-07 Hewlett-Packard Development Company, L.P. Remote computer testing
US7401272B1 (en) * 2001-03-09 2008-07-15 Pmc-Sierra, Inc. Apparatus and method for high speed sampling or testing of data signals using automated testing equipment
US6975955B1 (en) 2001-07-26 2005-12-13 Ciena Corporation Method and system for managing manufacturing test stations
US20060167947A1 (en) * 2003-03-01 2006-07-27 Dunkle Mark V Communications interface database for electronic diagnostic apparatus
US20050149569A1 (en) * 2003-12-03 2005-07-07 Forest Laboratories, Inc. Electronic lab notebook
US7158907B1 (en) * 2004-08-04 2007-01-02 Spirent Communications Systems and methods for configuring a test setup
WO2006120853A1 (ja) * 2005-05-09 2006-11-16 Advantest Corporation 試験装置、試験方法、および半導体デバイス
US7555639B2 (en) * 2006-01-31 2009-06-30 Verigy (Singapore) Pte. Ltd. Method for configuring a data formatting process using configuration values of a highest priority for each of a number of configuration keys storing in several configuration layers
EP3686609B1 (en) * 2019-01-25 2026-04-08 Rohde & Schwarz GmbH & Co. KG Measurement system and method for recording context information of a measurement

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5771240A (en) * 1996-11-14 1998-06-23 Hewlett-Packard Company Test systems for obtaining a sample-on-the-fly event trace for an integrated circuit with an integrated debug trigger apparatus and an external pulse pin
US5751735A (en) * 1996-11-14 1998-05-12 Hewlett-Packard Company Integrated debug trigger method and apparatus for an integrated circuit

Also Published As

Publication number Publication date
US5953684A (en) 1999-09-14

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