JPH10277957A - Polishing film - Google Patents

Polishing film

Info

Publication number
JPH10277957A
JPH10277957A JP8783197A JP8783197A JPH10277957A JP H10277957 A JPH10277957 A JP H10277957A JP 8783197 A JP8783197 A JP 8783197A JP 8783197 A JP8783197 A JP 8783197A JP H10277957 A JPH10277957 A JP H10277957A
Authority
JP
Japan
Prior art keywords
polishing
layer
abrasive
water
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8783197A
Other languages
Japanese (ja)
Other versions
JP3978253B2 (en
Inventor
Yuichiro Yoneyama
祐一郎 米山
Naotoshi Shiokawa
直利 塩川
Kiyoshi Kurumada
潔 車田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kimoto Co Ltd
Seikoh Giken Co Ltd
Original Assignee
Kimoto Co Ltd
Seikoh Giken Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kimoto Co Ltd, Seikoh Giken Co Ltd filed Critical Kimoto Co Ltd
Priority to JP8783197A priority Critical patent/JP3978253B2/en
Publication of JPH10277957A publication Critical patent/JPH10277957A/en
Application granted granted Critical
Publication of JP3978253B2 publication Critical patent/JP3978253B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Polishing Bodies And Polishing Tools (AREA)
  • Mechanical Coupling Of Light Guides (AREA)
  • Light Guides In General And Applications Therefor (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a polishing film which requires no polishing agent, and can manufacture an optical fiber connector part excellent in optical, characteristics. SOLUTION: A first polishing layer 2 is formed over a supporting body 1 such as a plastic film and the like, in which a polishing agent composed of silica perticulates is dispersed over water insoluble resin, and a second polishing layer 3 is formed over the second polishing layer, in which a polishing agent composed of silica perticulates that are smaller in grain size than the polishing agent used by the first polishing layer, is dispersed over water soluble resin. This polishing film 10 is suitably used as a final finishing film for polishing an optical connector part, enables both ferrules and quartz fibers to be simultaneously polished, and thereby to be formed into a mirror surface, can prevent the occurrence of the difference in level between each ferrule and each quartz fiber, and also prevents a work deterioration layer different in index of refraction from being formed up over the surface of quartz fibers.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、光ファイバコネク
タ部を研磨加工するための研磨フィルムに関し、特に研
磨剤を含有する研磨液を不要とした研磨フィルムに関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a polishing film for polishing an optical fiber connector, and more particularly to a polishing film which does not require a polishing liquid containing an abrasive.

【0002】[0002]

【従来の技術】光ファイバコネクタは、光ファイバどう
しを接続・切り離しを行うもので、通常ジルコニア等か
らなるフェルールの中心にガラスファイバを固定し、そ
の端面を鏡面状に研磨したものが用いられている。ガラ
スファイバはこの端面で他のガラスファイバと接続され
るため、接続端面における通信ロスが最小限となるよう
に精密に研磨されている必要がある。特にフェルールと
ガラスファイバとの間に段差がないこと、ガラスファイ
バ端面に研磨加工による加工変質層がないことが重要と
なる。
2. Description of the Related Art Optical fiber connectors are used for connecting and disconnecting optical fibers. Usually, a glass fiber is fixed to the center of a ferrule made of zirconia or the like, and the end surface thereof is polished to a mirror surface. I have. Since the glass fiber is connected to another glass fiber at this end face, it must be precisely polished so as to minimize communication loss at the connection end face. In particular, it is important that there is no step between the ferrule and the glass fiber, and that the end face of the glass fiber has no damaged layer due to polishing.

【0003】従来、光ファイバコネクタ部分の研磨方法
として、ダイアモンド等の硬質の研磨剤で1次研磨を行
った後、フィルムにコネクタ部を押しつけた状態で研磨
剤を含む研磨液をフィルムとコネクタ部との間に供給し
ながら光ファイバを回転させて研磨する方法が知られて
いる(特開昭62−173159号、特開平3−817
08号など)。
Conventionally, as a method of polishing an optical fiber connector portion, after a primary polishing is performed with a hard abrasive such as diamond, a polishing liquid containing an abrasive is applied to the film while the connector portion is pressed against the film and the connector portion. There is known a method in which an optical fiber is rotated while being supplied between the substrates and polished (JP-A-62-173159, JP-A-3-817).
08).

【0004】また最終仕上として、酸化セリウム、アル
ミナ、ジルコニア、酸化クロム等の研磨剤を含む研磨層
を設けた研磨フィルムを用いて、石英ファイバだけを鏡
面仕上する方法も一般的に行われている。このような研
磨フィルムとして、基材上に樹脂中に研磨剤を含有せし
めた層を設けたものが提案されている(特開平8−33
6758号等)。
As a final finish, a method of mirror-finishing only a quartz fiber using a polishing film provided with a polishing layer containing a polishing agent such as cerium oxide, alumina, zirconia, and chromium oxide is generally performed. . As such a polishing film, there has been proposed a film provided with a layer in which an abrasive is contained in a resin on a base material (Japanese Patent Laid-Open No. 8-33).
No. 6758).

【0005】[0005]

【発明が解決しようとする課題】しかしながら、上述し
た研磨剤を分散させた研磨液を用いる従来の研磨方法で
は、研磨液中の研磨剤濃度が研磨中に変化してしまう、
また研磨剤を常に均一な濃度でコネクタ部とフィルムと
の間に供給することが困難であるといった問題があり、
さらに寒冷地など低温(氷点下)の環境では溶媒中の研
磨粒子が結晶化して本来の性能を発揮できないという問
題があった。
However, in the conventional polishing method using the above-mentioned polishing liquid in which the polishing liquid is dispersed, the concentration of the polishing liquid in the polishing liquid changes during polishing.
In addition, there is a problem that it is difficult to always supply an abrasive with a uniform concentration between the connector portion and the film,
Further, in a low temperature environment (below the freezing point) such as a cold region, there is a problem that the abrasive particles in the solvent are crystallized and cannot exhibit their original performance.

【0006】磁気ディスク等の研磨シートとして、研磨
粒子と水溶性バインダー接着剤からなる研磨層を不織布
上に設けたものが提案されており(特開平7−1007
69号)、この研磨シートを用いた研磨工程では研磨剤
を含有する研磨液を不要とし自動化大量研磨処理を容易
にすることが可能とされている。しかしこのような研磨
シートは、光ファイバの最終研磨工程に必要な高精度の
研磨を行うことはできない。
As a polishing sheet for a magnetic disk or the like, a polishing sheet having a polishing layer made of polishing particles and a water-soluble binder adhesive provided on a non-woven fabric has been proposed (JP-A-7-1007).
No. 69), in the polishing step using this polishing sheet, a polishing liquid containing an abrasive is not required, and it is possible to facilitate automated mass polishing. However, such a polishing sheet cannot perform high-precision polishing required for a final polishing step of an optical fiber.

【0007】また従来の研磨フィルムには、フェルール
と石英ファイバとを同時に研磨し、鏡面を作り出すこと
ができるものがなかったため、従来の研磨フィルムを用
いた最終仕上では石英ファイバだけの研磨を行うので、
フェルールと石英ファイバとの間に凹部ができてしま
い、これにより接続部に空気層ができ、通信ロスを招い
ていた。さらに従来の研磨フィルムで最終研磨を行うと
鏡面にはなるものの、石英ファイバ表面に加工変質層が
できてしまい、この加工変質層において石英ファイバの
屈折率が変化するという問題がある。一般に、光ファイ
バコネクタ部の光学特性として反射減衰量は、直角球面
研磨(PC研磨)の場合50dB以上、斜め球面研磨
(APC研磨)の場合、60dB以上が要求されるが、
加工変質層ができた石英ファイバでは反射減衰量が40
dB程度になってしまっていた。
[0007] Further, there is no conventional polishing film capable of simultaneously polishing a ferrule and a quartz fiber to produce a mirror surface. Therefore, in the final finish using the conventional polishing film, only the quartz fiber is polished. ,
A concave portion is formed between the ferrule and the quartz fiber, and an air layer is formed at the connection portion, thereby causing a communication loss. Further, when the final polishing is performed with a conventional polishing film, although a mirror surface is obtained, a damaged layer is formed on the surface of the quartz fiber, and there is a problem that the refractive index of the quartz fiber changes in the damaged layer. Generally, as the optical characteristics of the optical fiber connector, the return loss is required to be 50 dB or more in the case of right-angle spherical polishing (PC polishing) and 60 dB or more in the case of oblique spherical polishing (APC polishing).
In the case of a quartz fiber with a deteriorated layer, the return loss is 40
It was about dB.

【0008】そこで本発明は、研磨剤を分散させた研磨
液を不要とすることができ、しかも光ファイバの最終研
磨用として高精度の研磨を行うことができる研磨フィル
ムを提供することを目的とする。また本発明は、フェル
ールとの段差がなく、反射減衰量の極めて少ない光学特
性の優れた光ファイバコネクタを得ることが可能な光フ
ァイバコネクタ部研磨用の研磨フィルムを提供すること
を目的とする。
Accordingly, an object of the present invention is to provide a polishing film that can eliminate the need for a polishing liquid in which a polishing agent is dispersed and that can perform high-precision polishing for final polishing of an optical fiber. I do. Another object of the present invention is to provide a polishing film for polishing an optical fiber connector portion, which can obtain an optical fiber connector having no difference in level with a ferrule and having an extremely small return loss and excellent optical characteristics.

【0009】[0009]

【課題を解決するための手段】上記目的を達成するた
め、本発明者らは研磨剤とバインダー樹脂との組合せに
ついて鋭意研究した結果、研磨層を2層で構成するとと
もに上層となる研磨層の樹脂として水溶性樹脂を用いた
場合、精製水を供給することによって上層の研磨剤が遊
離し、研磨液を用いることなく均一な研磨が可能である
こと、更に上層の研磨剤として下層の研磨剤よりも粒径
の細かい研磨剤を用いることにより、極めて高精度の研
磨を行うことが可能であることを見出し本発明に至っ
た。
Means for Solving the Problems In order to achieve the above object, the present inventors have conducted intensive studies on the combination of an abrasive and a binder resin. When a water-soluble resin is used as the resin, the upper layer abrasive is released by supplying purified water, and uniform polishing can be performed without using a polishing liquid, and the lower layer abrasive is used as the upper layer abrasive. The present inventors have found that it is possible to perform polishing with extremely high precision by using an abrasive having a smaller particle size than the present invention, and have reached the present invention.

【0010】即ち本発明の研磨フィルムは、支持体上に
形成され、水不溶性樹脂および水不溶性樹脂中に分散さ
れた研磨剤を含む第1の研磨層と、第1の研磨層上に形
成され、水溶性樹脂および水溶性樹脂中に分散された研
磨剤を含む第2の研磨層とを備えたものであり、好適に
は第2の研磨層に含有される研磨剤の平均粒径が、第1
の研磨層に含有される研磨剤の平均粒径より小さいもの
である。
That is, the polishing film of the present invention is formed on a support, and includes a first polishing layer containing a water-insoluble resin and an abrasive dispersed in the water-insoluble resin, and a first polishing layer formed on the first polishing layer. And a second polishing layer containing a water-soluble resin and an abrasive dispersed in the water-soluble resin, and preferably the average particle diameter of the abrasive contained in the second polishing layer is: First
Is smaller than the average particle size of the abrasive contained in the polishing layer.

【0011】第1の研磨層の研磨剤および第2の研磨層
の研磨剤として、好適には同種類のもの、特にシリカ微
粒子を用いる。シリカ微粒子は石英のみならずジルコニ
アセラミックに対しても若干の研磨力を有するので、こ
れを用いることによりフェルールと石英ファイバとを同
時に研磨することができ、しかも研磨加工後の表面の屈
折率が石英ファイバの屈折率とほぼ同じになるため、端
面における反射減衰量を低くし、光信号のノイズ、半導
体光源に対する悪影響を最小にすることができる。
As the polishing agent for the first polishing layer and the polishing agent for the second polishing layer, the same type, particularly silica fine particles, is preferably used. Since the silica fine particles have a slight polishing power not only for quartz but also for zirconia ceramics, it is possible to polish the ferrule and the quartz fiber at the same time by using this, and furthermore, the refractive index of the surface after polishing is reduced to quartz. Since the refractive index is almost the same as that of the fiber, the return loss at the end face can be reduced, and the noise of the optical signal and the adverse effect on the semiconductor light source can be minimized.

【0012】また第2の研磨層に用いられる水溶性樹脂
は、ポリビニルアルコール、ポリビニルピロリドン、水
溶性セルロース樹脂、水溶性ポリエステル樹脂、ポリビ
ニルアセタール、アクリル酸−アクリルアミド共重合
体、メラミン樹脂、ポリエーテルポリオール、ゼラチ
ン、カゼイン、澱粉、キチン、キトサンから選ばれる1
種または2種以上が好適である。
The water-soluble resin used for the second polishing layer is polyvinyl alcohol, polyvinyl pyrrolidone, water-soluble cellulose resin, water-soluble polyester resin, polyvinyl acetal, acrylic acid-acrylamide copolymer, melamine resin, polyether polyol. 1 selected from, gelatin, casein, starch, chitin, chitosan
Species or two or more are preferred.

【0013】第2の研磨層の研磨剤は、水溶性樹脂に対
し重量比で1:5〜5:1の割合で含有される。
The abrasive for the second polishing layer is contained in a weight ratio of 1: 5 to 5: 1 with respect to the water-soluble resin.

【0014】[0014]

【発明の実施の態様】図1は本発明の研磨フィルムの一
実施例を示す図で、この研磨フィルムは支持体1と、そ
の上に形成された第1の研磨層2と、さらにその上に形
成された第2の研磨層3とからなる。
FIG. 1 is a view showing one embodiment of a polishing film of the present invention. The polishing film comprises a support 1, a first polishing layer 2 formed thereon, and And the second polishing layer 3 formed on the substrate.

【0015】第2の研磨層は、直接、被研磨材である光
ファイバの端面が接触される層で水溶性樹脂と研磨剤と
からなる。この研磨層は、研磨層と光ファイバ端面との
間に水(精製水)を供給して研磨したときに、水溶性樹
脂から研磨剤が遊離して研磨を行うことができる。
The second polishing layer is a layer in which the end face of the optical fiber, which is the material to be polished, is brought into direct contact, and is composed of a water-soluble resin and an abrasive. When the polishing layer is polished by supplying water (purified water) between the polishing layer and the end face of the optical fiber, the polishing agent can be released from the water-soluble resin and polished.

【0016】水溶性樹脂としては研磨時に研磨剤が直ち
に遊離できるように低粘度のものが好ましい。このよう
な水溶性樹脂として、ポリビニルアルコール、ポリビニ
ルピロリドン、水溶性セルロース樹脂、水溶性ポリエス
テル樹脂、ポリビニルアセタール、アクリル酸−アクリ
ルアミド共重合体、メラミン樹脂、ポリエーテルポリオ
ール等の合成樹脂や、ゼラチン、カゼイン、澱粉、キチ
ン、キトサン等の天然樹脂が挙げられる。これらの樹脂
は1種または2種以上を混合して用いることができる。
The water-soluble resin is preferably of a low viscosity so that the abrasive can be released immediately during polishing. Examples of such a water-soluble resin include polyvinyl alcohol, polyvinyl pyrrolidone, a water-soluble cellulose resin, a water-soluble polyester resin, polyvinyl acetal, an acrylic acid-acrylamide copolymer, a melamine resin, a synthetic resin such as a polyether polyol, gelatin, and casein. , Starch, chitin, chitosan and the like. These resins can be used alone or in combination of two or more.

【0017】研磨剤としては、シリカ、アルミナ、酸化
セリウム、酸化アルミニウム等公知の研磨剤を用いるこ
とができるが、被研磨材である光ファイバが石英ファイ
バである場合にはシリカが好適である。特に表面にシラ
ノール基を有する結晶性或いは非結晶性のシリカが好適
である。一般に光ファイバ端面を研磨剤により研磨した
場合に、表面に加工変質層ができ、この加工変質層と光
ファイバコアとの屈折率の差により、反射減衰量が増加
し、通信ロスの原因となるが、研磨剤としてシリカを用
いた場合には石英表面において加工変質層の生成が抑え
られ、端面における屈折率の変化を極めて少なくするこ
とができる。
As the polishing agent, known polishing agents such as silica, alumina, cerium oxide, and aluminum oxide can be used. When the optical fiber to be polished is a quartz fiber, silica is preferable. Particularly, crystalline or non-crystalline silica having a silanol group on the surface is preferable. In general, when the end face of an optical fiber is polished with an abrasive, a damaged layer is formed on the surface, and the difference in refractive index between the damaged layer and the optical fiber core causes an increase in return loss and causes communication loss. However, when silica is used as the polishing agent, the formation of a damaged layer on the quartz surface is suppressed, and the change in the refractive index at the end face can be extremely reduced.

【0018】尚、本発明の研磨フィルムを最終研磨目的
で用いない場合或いは光ファイバとしてプラスチックフ
ァイバを用いた場合には、研磨剤はシリカに限定されな
い。
When the polishing film of the present invention is not used for the purpose of final polishing or when a plastic fiber is used as an optical fiber, the abrasive is not limited to silica.

【0019】研磨剤の平均粒径は、その下層となる研磨
層2の研磨剤の平均粒径よりも小さいことが必要であ
る。比較的大きい粒径の研磨剤の層の上に微粒研磨剤の
層を設けることにより良好な研磨性能を得ることができ
ると考えられる。このように研磨層3の研磨剤の平均粒
径は、研磨層2の研磨剤の平均粒径との関係で決まり、
本発明の研磨フィルムを研磨のどの段階で用いるかによ
り変化するが、最終研磨用の研磨フィルムの場合には好
適には1nm〜1μm、より好適には1〜100nmの
範囲とする。また均一な研磨を行うために、できるだけ
粒径分布の狭いものを用いることが好ましい。
It is necessary that the average particle size of the abrasive is smaller than the average particle size of the abrasive in the lower polishing layer 2. It is considered that good polishing performance can be obtained by providing a layer of fine abrasive on a layer of abrasive having a relatively large particle size. As described above, the average particle size of the abrasive in the polishing layer 3 is determined by the relationship with the average particle size of the abrasive in the polishing layer 2,
The polishing film of the present invention varies depending on the stage of polishing, but in the case of a polishing film for final polishing, the thickness is preferably in the range of 1 nm to 1 μm, more preferably 1 to 100 nm. In order to perform uniform polishing, it is preferable to use a material having a narrow particle size distribution as much as possible.

【0020】水溶性樹脂と研磨剤の含有割合は、5:1
〜1:5が好適であり、3:1〜1:3がより好適であ
る。研磨剤の割合が5:1より少ない場合には、十分な
研磨効果を得ることができない。また研磨剤の割合が
1:5より多い場合には、樹脂中に保持できず層形成が
困難になる。
The content ratio of the water-soluble resin and the abrasive is 5: 1.
1 : 1: 5 is preferred, and 3: 1 to 1: 3 is more preferred. If the ratio of the abrasive is less than 5: 1, a sufficient polishing effect cannot be obtained. If the ratio of the abrasive is more than 1: 5, it cannot be held in the resin, and it becomes difficult to form a layer.

【0021】第1の研磨層2は、上述した第2の研磨3
の下層となる層で、水不溶性の樹脂と研磨剤とから構成
される。水不溶性の樹脂としてはアクリル系樹脂、エチ
レン−酢酸ビニル共重合体、ポリビニルブチラール樹
脂、シリコーン樹脂、熱可塑性ポリエステル樹脂、ポリ
スチレン樹脂、塩化ビニル−酢酸ビニル共重合体、セル
ロース誘導体樹脂、架橋性ポリエステルポリオール、架
橋性アクリルポリオール等を用いることができるが、特
にイソシアネートで架橋されたポリエステルポリオー
ル、アクリルポリオールが好適である。これらの架橋性
樹脂は、研磨層としての硬度、可撓性に優れ、また支持
体との接着性も良好である。架橋性樹脂は、単独で或い
は他の水不溶性の樹脂と混合して用いることができる。
The first polishing layer 2 is made of the second polishing layer 3 described above.
The lower layer is composed of a water-insoluble resin and an abrasive. Water-insoluble resins include acrylic resins, ethylene-vinyl acetate copolymers, polyvinyl butyral resins, silicone resins, thermoplastic polyester resins, polystyrene resins, vinyl chloride-vinyl acetate copolymers, cellulose derivative resins, and crosslinkable polyester polyols And a crosslinkable acrylic polyol, and the like, and a polyester polyol and an acrylic polyol crosslinked with isocyanate are particularly preferable. These crosslinkable resins have excellent hardness and flexibility as a polishing layer, and also have good adhesion to a support. The crosslinkable resin can be used alone or in combination with another water-insoluble resin.

【0022】第1の研磨層2の研磨剤としては、第2の
研磨層3に用いた研磨剤と同様のものを用いることがで
き、特に被研磨材である光ファイバが石英ファイバであ
る場合にはシリカが好適である。また平均粒径が、第2
の研磨層3の研磨剤の平均粒径よりも大きいものを用い
る。本発明の研磨フィルムを最終研磨用として用いる場
合には、具体的には1μm〜10μmが好適である。平
均粒径が1μmより小さい場合には研磨能力が低下す
る。また10μmより大きい場合には被研磨面のキズの
原因となる。
As the polishing agent for the first polishing layer 2, the same polishing agent as that used for the second polishing layer 3 can be used, particularly when the optical fiber to be polished is a quartz fiber. Is preferably silica. The average particle size is
Of the polishing layer 3 having a larger average particle size than the polishing agent. When the polishing film of the present invention is used for final polishing, specifically, 1 μm to 10 μm is suitable. When the average particle size is smaller than 1 μm, the polishing ability is reduced. On the other hand, if it is larger than 10 μm, it may cause scratches on the surface to be polished.

【0023】水不溶性樹脂と研磨剤の含有割合は、5:
1〜1:5が好適である。研磨剤の割合が5:1より少
ない場合には、十分な研磨効果を得ることができない。
また研磨剤の割合が1:5より多い場合には、樹脂中に
保持できず層形成が困難になる。
The content ratio of the water-insoluble resin to the abrasive is 5:
1-1 to 1: 5 is preferred. If the ratio of the abrasive is less than 5: 1, a sufficient polishing effect cannot be obtained.
If the ratio of the abrasive is more than 1: 5, it cannot be held in the resin, and it becomes difficult to form a layer.

【0024】支持体1としては、研磨時の圧力に耐え得
る機械的強度と寸法安定性を備えた合成紙、プラスチッ
クフィルム等が使用でき、特にポリエチレンテレフタレ
ート、ポリエチレン、ポリ塩化ビニル、ポリ塩化ビニリ
デン、ポリカーボネート、ポリスチレン、ポリアクリロ
ニトリル、ABS、ナイロン、ポリプロピレン等のプラ
スチックフィルムが好適に用いられる。支持体1の上に
は第1の研磨層2の接着性を高めるためにアンカー層を
設けてもよい。
As the support 1, synthetic paper or plastic film having mechanical strength and dimensional stability capable of withstanding the pressure during polishing can be used. In particular, polyethylene terephthalate, polyethylene, polyvinyl chloride, polyvinylidene chloride, Plastic films such as polycarbonate, polystyrene, polyacrylonitrile, ABS, nylon, and polypropylene are preferably used. An anchor layer may be provided on the support 1 in order to increase the adhesion of the first polishing layer 2.

【0025】本発明の研磨フィルムは、上述した支持体
1の上に、第1の研磨層2を構成する水不溶性樹脂と研
磨剤とを含む塗工液を塗布後、乾燥させて第1の研磨層
2を形成した後、この上に第2の研磨層3を構成する水
不溶性樹脂と研磨剤とを含む塗工液を塗布後、乾燥させ
ることにより製造することができる。第1および第2の
研磨層には上述した材料の他、必要に応じてレベリング
剤、分散剤、酸化剤、帯電防止剤、防カビ剤等を添加す
ることができる。
The polishing film of the present invention is applied with a coating solution containing a water-insoluble resin and an abrasive which constitute the first polishing layer 2 on the support 1 described above, and then dried to obtain a first polishing film. After the polishing layer 2 is formed, a coating liquid containing a water-insoluble resin and an abrasive, which constitute the second polishing layer 3, is applied thereon, followed by drying. In addition to the above-mentioned materials, a leveling agent, a dispersant, an oxidizing agent, an antistatic agent, a fungicide, and the like can be added to the first and second polishing layers as needed.

【0026】第1の研磨層2の厚さは、1〜20μm、
好適には3〜10μmとする。研磨層2の厚さが1μm
より少ないと十分な研磨効果を得ることができない。第
2の研磨層3の厚さは1〜30μm、好適には3〜20
μmとする。研磨層3の厚さが1μmより少ないと最終
研磨として良好な研磨特性を得ることができない。また
厚さが30μmより多いと研磨フィルムの反り、即ちカ
ーリング性が生じるので好ましくない。
The thickness of the first polishing layer 2 is 1 to 20 μm,
Preferably, it is 3 to 10 μm. The thickness of the polishing layer 2 is 1 μm
If the amount is smaller, a sufficient polishing effect cannot be obtained. The thickness of the second polishing layer 3 is 1 to 30 μm, preferably 3 to 20 μm.
μm. If the thickness of the polishing layer 3 is less than 1 μm, good polishing characteristics cannot be obtained as final polishing. On the other hand, if the thickness is more than 30 μm, it is not preferable because warpage of the polishing film, that is, curling property occurs.

【0027】本発明の研磨フィルムは、ダイヤモンド等
の研磨剤を用いた1次研磨加工により予め球面加工され
た光ファイバコネクタ部の2次研磨以降の研磨用として
用いられ、好適には最終仕上用として用いられる。例え
ば図2に示すように研磨機の研磨パッド20上に研磨フ
ィルム10を固定するとともに第2の研磨層3の表面に
精製水を散布しておき、研磨ホルダ(図示せず)に光フ
ァイバコネクタ部30を固定した後、コネクタ部30を
研磨フィルム10に一定圧力で当接させて研磨パッド2
0又は研磨ホルダを回転させることにより、コネクタ部
30を研磨する。これにより第2の研磨層3中に分散さ
れた研磨剤(シリカ微粒子)が遊離し、光ファイバコネ
クタ部30の石英ファイバを鏡面研磨する。このときフ
ェルールのジルコニアをも研磨し、石英ファイバ部分に
凹部が生じるのが防止される。
The polishing film of the present invention is used for polishing after the second polishing of the optical fiber connector portion which has been subjected to the first polishing using a polishing agent such as diamond or the like, and is preferably used for final finishing. Used as For example, as shown in FIG. 2, the polishing film 10 is fixed on a polishing pad 20 of a polishing machine, and purified water is sprayed on the surface of the second polishing layer 3, and an optical fiber connector is mounted on a polishing holder (not shown). After the part 30 is fixed, the connector part 30 is brought into contact with the polishing film 10 at a constant pressure, so that the polishing pad 2
The connector portion 30 is polished by rotating the polishing holder 0 or the polishing holder. As a result, the abrasive (silica fine particles) dispersed in the second polishing layer 3 is released, and the quartz fiber of the optical fiber connector 30 is mirror-polished. At this time, the zirconia of the ferrule is also polished to prevent a concave portion from being formed in the quartz fiber portion.

【0028】一般に光ファイバコネクタ部において、フ
ェルール先端の曲率が10〜25mmの範囲では、凹み量
±0.05μmが良好な光学特性が得られる許容限界と
されるが、本発明の研磨フィルムを用いることにより、
許容値以内の凹み量とすることができる。また本発明の
研磨フィルムを用いて光ファイバコネクタ部を研磨した
場合、接続面における反射減衰量を50dB以上とする
ことができる。
In general, in the optical fiber connector portion, when the curvature of the tip of the ferrule is in the range of 10 to 25 mm, the dent amount ± 0.05 μm is regarded as an allowable limit for obtaining good optical characteristics. However, the polishing film of the present invention is used. By doing
The dent amount can be within an allowable value. When the optical fiber connector is polished by using the polishing film of the present invention, the return loss at the connection surface can be set to 50 dB or more.

【0029】[0029]

【実施例】以下に本発明の実施例を示す。 実施例1 厚さ75μmのポリエステルフィルムの片面に下記処方
の研磨層用塗布液を塗布し、乾燥させて厚さ6μmの研
磨層(第1の研磨層)を形成した。この研磨層の表面粗
さRaは0.7μmであった。
Examples of the present invention will be described below. Example 1 A coating liquid for a polishing layer having the following formulation was applied to one surface of a polyester film having a thickness of 75 μm and dried to form a polishing layer (first polishing layer) having a thickness of 6 μm. The surface roughness Ra of this polishing layer was 0.7 μm.

【0030】第1の研磨層用塗布液 アクリルポリオール 44重量部 (アクリテ゛ィックA804、固形分50%:大日本インキ化学工業
社) ニトロセルロース 17重量部 (L1/2:固形分70%) シリカ 25重量部 (サイリシア730、粒径3.0μm:富士シリシア化学社) イソシアネート硬化剤 14重量部 (タケネートD110N、固形分60%:武田薬品工業社) メチルエチルケトン 200重量部 トルエン 200重量部
First polishing layer coating liquid Acrylic polyol 44 parts by weight (Acrylic A804, solid content 50%: Dainippon Ink and Chemicals, Inc.) Nitrocellulose 17 parts by weight (L1 / 2: solid content 70%) Silica 25 Parts by weight (Sylysia 730, particle size 3.0 μm: Fuji Silysia Chemical Ltd.) Isocyanate curing agent 14 parts by weight (Takenate D110N, solid content 60%: Takeda Pharmaceutical Co., Ltd.) Methyl ethyl ketone 200 parts by weight Toluene 200 parts by weight

【0031】次に第1の研磨層の上に下記処方の第2の
研磨層用塗布液を塗布、乾燥させて乾燥厚さ10μm第
2の研磨層を形成し、研磨フィルムを作製した。 ポリビニルアルコール 5重量部 (コ゛ーセノールGL-03:日本合成化学社) シリカ 5重量部 (アエロシ゛ル200、粒径12nm:日本アエロジル社) 水 40重量部
Next, a second polishing layer coating solution having the following formulation was applied on the first polishing layer and dried to form a second polishing layer having a dry thickness of 10 μm, thereby producing a polishing film. 5 parts by weight of polyvinyl alcohol (Co-Senol GL-03: Nippon Gohsei) 5 parts by weight of silica (Aerosil 200, particle size 12 nm: Aerosil Nippon) 40 parts by weight of water

【0032】このように作製した研磨フィルム(φ12
7mm)を用いて、光コネクタ研磨機(SFP-120A:(株)精
工技研製)により石英ファイバの光コネクタフェルール
を最終研磨した。研磨は前記光コネクタフェルール12
本を研磨機の研磨ホルダーに取付け、精製水を研磨フィ
ルム上に3〜5cc供給し、最終研磨時間30秒で行っ
た。研磨後のコネクタ部について、鏡面性、反射減衰
量、曲率およびフェルールから石英ファイバの凹み量を
評価した。鏡面性は光学顕微鏡(倍率200)で観察し
た。反射減衰量は光測定器(JISFITEL:RM3750B)で評価
した。また曲率および凹み量は、自動コネクトチェック
干渉システム(アクシス:NTTAT)で評価した。
The polishing film (φ12
7 mm), an optical connector ferrule of quartz fiber was finally polished by an optical connector polishing machine (SFP-120A: manufactured by Seiko Giken Co., Ltd.). Polishing is performed using the optical connector ferrule 12 described above.
The book was mounted on a polishing holder of a polishing machine, and 3-5 cc of purified water was supplied onto the polishing film, and the final polishing time was 30 seconds. With respect to the polished connector portion, the concave amount of the quartz fiber was evaluated from the specularity, return loss, curvature and ferrule. The specularity was observed with an optical microscope (magnification: 200). The return loss was evaluated with a light meter (JISFITEL: RM3750B). The curvature and the dent amount were evaluated by an automatic connect check interference system (Axis: NTTAT).

【0033】光学顕微鏡による観察の結果、この研磨フ
ィルムはジルコニアフェルールと石英ファイバとを同時
に研磨し、鏡面を作り出しているので、従来のような凹
みが視られず、自動コネクトチェック干渉システムの計
測結果でも曲率11mm〜16mmに対し、凹み量は平均で
−0.01μmであった。また反射減衰量も平均56d
Bであった。
As a result of observation with an optical microscope, this polished film simultaneously polished the zirconia ferrule and the quartz fiber to create a mirror surface, so that no dent as in the prior art was seen, and the measurement result of the automatic connect check interference system was used. However, the dent amount was -0.01 µm on average for the curvature of 11 mm to 16 mm. The return loss is also 56d on average
B.

【0034】[0034]

【発明の効果】以上の実施例からも明らかなように本発
明の研磨フィルムは、第1の研磨層の上に、水溶性樹脂
と第1の研磨層の研磨剤より粒径の細かい研磨剤を含む
第2の研磨層を備えた構成を有しているので、フェルー
ルとガラスファイバとを同時に研磨することができ、フ
ェルールとガラスバファイバとの段差を発生させること
なく、優れた研磨性能を有する。とくに研磨剤としてシ
リカを用いることにより、加工変質層の生成を抑制し
て、反射減衰量を大幅に改善し、光学特性の優れた光フ
ァイバコネクタ部を作製することができる。また本発明
の研磨フィルムは、最上層となる第2の研磨層を水溶性
樹脂と研磨剤とで構成することにより、研磨剤を含む研
磨液を不要とし、低温の環境でも使用でき、しかも優れ
た研磨特性を実現することができる。
As is clear from the above examples, the polishing film of the present invention comprises a water-soluble resin and an abrasive having a finer particle size than the abrasive of the first abrasive layer, on the first abrasive layer. Since the ferrule and the glass fiber can be polished at the same time since the second polishing layer including the second polishing layer is included, excellent polishing performance can be achieved without generating a step between the ferrule and the glass bar fiber. Have. In particular, by using silica as an abrasive, the formation of a deteriorated layer can be suppressed, the return loss can be greatly improved, and an optical fiber connector having excellent optical characteristics can be manufactured. In addition, the polishing film of the present invention can be used in a low-temperature environment by eliminating the need for a polishing solution containing a polishing agent by forming the second polishing layer, which is the uppermost layer, with a water-soluble resin and a polishing agent. Polishing characteristics can be realized.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の研磨フィルムの一実施例を示す図。FIG. 1 is a view showing one embodiment of a polishing film of the present invention.

【図2】本発明の研磨フィルムの使用方法を説明する
図。
FIG. 2 is a diagram illustrating a method of using the polishing film of the present invention.

【符号の説明】[Explanation of symbols]

1・・・・・・支持体 2・・・・・・第1の研磨層 3・・・・・・第2の研磨層 DESCRIPTION OF SYMBOLS 1 ... Support 2 ... 1st polishing layer 3 ... 2nd polishing layer

───────────────────────────────────────────────────── フロントページの続き (72)発明者 車田 潔 千葉県松戸市松飛台286番地の23 株式会 社精工技研内 ────────────────────────────────────────────────── ─── Continuing from the front page (72) Inventor Kiyoshi Kurumada 286 Matsushitadai, Matsudo-shi, Chiba 23 Seiko Giken Co., Ltd.

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】支持体上に形成され、水不溶性樹脂および
前記水不溶性樹脂中に分散された研磨剤を含む第1の研
磨層と、前記第1の研磨層上に形成され、水溶性樹脂お
よび前記水溶性樹脂中に分散された研磨剤を含む第2の
研磨層とを備えた研磨フィルム。
A first polishing layer formed on a support and containing a water-insoluble resin and an abrasive dispersed in the water-insoluble resin; and a water-soluble resin formed on the first polishing layer. And a second polishing layer containing an abrasive dispersed in the water-soluble resin.
【請求項2】前記第2の研磨層に含有される研磨剤の平
均粒径が、前記1の研磨層に含有される研磨剤の平均粒
径より小さいことを特徴とする請求項1記載の研磨フィ
ルム。
2. The method according to claim 1, wherein the average particle size of the abrasive contained in the second polishing layer is smaller than the average particle size of the abrasive contained in the first polishing layer. Polishing film.
【請求項3】前記第1の研磨層の研磨剤および前記第2
の研磨層の研磨剤がシリカ微粒子からなることを特徴と
する請求項1記載の研磨フィルム。
3. An abrasive for said first polishing layer and said second polishing agent.
2. The polishing film according to claim 1, wherein the polishing agent of said polishing layer comprises silica fine particles.
【請求項4】前記水溶性樹脂が、ポリビニルアルコー
ル、ポリビニルピロリドン、水溶性セルロース樹脂、水
溶性ポリエステル樹脂、ポリビニルアセタール、アクリ
ル酸−アクリルアミド共重合体、メラミン樹脂、ポリエ
ーテルポリオール、ゼラチン、カゼイン、澱粉、キチ
ン、キトサンから選ばれる1種または2種以上であるこ
とを特徴とする請求項1記載の研磨フィルム。
4. The water-soluble resin is polyvinyl alcohol, polyvinyl pyrrolidone, water-soluble cellulose resin, water-soluble polyester resin, polyvinyl acetal, acrylic acid-acrylamide copolymer, melamine resin, polyether polyol, gelatin, casein, starch. 2. The polishing film according to claim 1, wherein the polishing film is at least one member selected from the group consisting of chitin, chitin, and chitosan.
【請求項5】前記第2の研磨層の研磨剤が、前記水溶性
樹脂に対し重量比で1:5〜5:1の割合で含有される
ことを特徴とする請求項1記載の研磨フィルム。
5. The polishing film according to claim 1, wherein the abrasive of said second polishing layer is contained in a weight ratio of 1: 5 to 5: 1 with respect to said water-soluble resin. .
JP8783197A 1997-04-07 1997-04-07 Polishing film for optical fiber connector and polishing method using the same Expired - Lifetime JP3978253B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8783197A JP3978253B2 (en) 1997-04-07 1997-04-07 Polishing film for optical fiber connector and polishing method using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8783197A JP3978253B2 (en) 1997-04-07 1997-04-07 Polishing film for optical fiber connector and polishing method using the same

Publications (2)

Publication Number Publication Date
JPH10277957A true JPH10277957A (en) 1998-10-20
JP3978253B2 JP3978253B2 (en) 2007-09-19

Family

ID=13925894

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8783197A Expired - Lifetime JP3978253B2 (en) 1997-04-07 1997-04-07 Polishing film for optical fiber connector and polishing method using the same

Country Status (1)

Country Link
JP (1) JP3978253B2 (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001287166A (en) * 2000-02-04 2001-10-16 Toyobo Co Ltd Polishing pad and manufacturing method therefor
JP2002239921A (en) * 2001-02-07 2002-08-28 Dainippon Printing Co Ltd Abrasive film and manufacturing method of the same
WO2002092286A1 (en) * 2001-05-14 2002-11-21 Nihon Micro Coating Co., Ltd. Abrasive film and method of producing the same
WO2003019251A1 (en) * 2001-08-24 2003-03-06 Nihon Micro Coating Co., Ltd. Method and device for polishing optical fiber connectors
US6758727B2 (en) 2000-09-08 2004-07-06 3M Innovative Properties Company Abrasive article and methods of manufacturing and use of same
JP2014121752A (en) * 2012-12-20 2014-07-03 Nippon Telegr & Teleph Corp <Ntt> Optical fiber polishing sheet, optical fiber tip processing device, and polishing processing method
CN104889898A (en) * 2015-02-10 2015-09-09 衢州学院 A method of manufacturing nano-silica polished wafers by using a hydrolytic sol-gel method

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001287166A (en) * 2000-02-04 2001-10-16 Toyobo Co Ltd Polishing pad and manufacturing method therefor
US6758727B2 (en) 2000-09-08 2004-07-06 3M Innovative Properties Company Abrasive article and methods of manufacturing and use of same
JP2002239921A (en) * 2001-02-07 2002-08-28 Dainippon Printing Co Ltd Abrasive film and manufacturing method of the same
JP4597395B2 (en) * 2001-02-07 2010-12-15 大日本印刷株式会社 Polishing film and method for producing the same
WO2002092286A1 (en) * 2001-05-14 2002-11-21 Nihon Micro Coating Co., Ltd. Abrasive film and method of producing the same
WO2003019251A1 (en) * 2001-08-24 2003-03-06 Nihon Micro Coating Co., Ltd. Method and device for polishing optical fiber connectors
EP1332385A1 (en) * 2001-08-24 2003-08-06 Nihon Micro Coating Co., Ltd. Method and device for polishing optical fiber connectors
EP1332385A4 (en) * 2001-08-24 2005-08-10 Nippon Micro Coating Kk Method and device for polishing optical fiber connectors
JP2014121752A (en) * 2012-12-20 2014-07-03 Nippon Telegr & Teleph Corp <Ntt> Optical fiber polishing sheet, optical fiber tip processing device, and polishing processing method
CN104889898A (en) * 2015-02-10 2015-09-09 衢州学院 A method of manufacturing nano-silica polished wafers by using a hydrolytic sol-gel method

Also Published As

Publication number Publication date
JP3978253B2 (en) 2007-09-19

Similar Documents

Publication Publication Date Title
US6398826B1 (en) Abrasive tape, process for producing it, and coating agent for abrasive tape
JP3978253B2 (en) Polishing film for optical fiber connector and polishing method using the same
JP3782346B2 (en) End face polishing method
JP3924252B2 (en) Polishing film and method for producing the same
JP2003071729A (en) Grinding film
JP4597395B2 (en) Polishing film and method for producing the same
US5465314A (en) Method of manufacturing optical connector
JP3867704B2 (en) Device for polishing optical fiber connectors
JP4080583B2 (en) Polishing film
JPH1071572A (en) Abrasive tape and its manufacture
JPH08187665A (en) Abrasive tape
JP2004322253A (en) Fixed abrasive grain polishing material
JPH09248771A (en) Abrasive tape for optical connector ferrule end surface, polishing method for optical connector ferrule end surface, and polishing device for optical connector ferrule end surface
JPH11333731A (en) Abrasive tape, coating liquid for the abrasive tape, and manufacture of the abrasive tape
JPH11277450A (en) Polishing body
JPH09183055A (en) Method for polishing terminal of optical fiber connector
JP2000024936A (en) Polishing film
JP3676726B2 (en) Abrasive tape and method for producing the same
JPH01240273A (en) Polishing film for polishing optical fiber end face
JP2002346938A (en) Grinder for grinding glass surface
JP2980930B2 (en) Polishing tape and method for manufacturing the polishing tape
JPH11281846A (en) Method for joining optical connector ferrule
JP2002254326A (en) Abrasive tape
JP2002254325A (en) Abrasive film and manufacturing method therefor
JP2002254323A (en) Abrasive film and manufacturing method therefor

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20040401

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20040401

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20050815

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20050823

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20051020

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20060606

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20060804

A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A711

Effective date: 20070413

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070417

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20070413

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070521

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070524

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20070619

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20070625

FPAY Renewal fee payment (prs date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100629

Year of fee payment: 3

R150 Certificate of patent (=grant) or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150