JPH10163543A - Method for polarizing piezoelectric ceramic - Google Patents

Method for polarizing piezoelectric ceramic

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Publication number
JPH10163543A
JPH10163543A JP32202196A JP32202196A JPH10163543A JP H10163543 A JPH10163543 A JP H10163543A JP 32202196 A JP32202196 A JP 32202196A JP 32202196 A JP32202196 A JP 32202196A JP H10163543 A JPH10163543 A JP H10163543A
Authority
JP
Japan
Prior art keywords
polarization
piezoelectric ceramic
polarization processing
state
processing apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP32202196A
Other languages
Japanese (ja)
Inventor
Takaaki Domon
孝彰 土門
Sukeyuki Ogasawara
祐之 小笠原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Corp
Original Assignee
TDK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TDK Corp filed Critical TDK Corp
Priority to JP32202196A priority Critical patent/JPH10163543A/en
Publication of JPH10163543A publication Critical patent/JPH10163543A/en
Withdrawn legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To evenly polarize a piezoelectric ceramic by polarizing the ceramic to a polarized state, which does not reach a desired polarized state in the air in an initial polarization treating process and polarizing the ceramic to the desired polarized state in the air in an additional polarization treating process. SOLUTION: In the initial polarization treating process by means of an initial polarization treating device 1, a piezoelectric ceramic substrate 3 is polarized to a polarized state which does not reach a desired polarized state. After the initial polarization treating process, the substrate 3 is brought to an additional polarization treating process 2, in which the substrate 3 is polarized to the desired polarized state. Since the substrate 3 brought to the process 2 is treated through the initial polarization treating process, only an additional polarization is performed on the substrate 3 so as to polarize the substrate 3 to the desired state from the initially polarized state. Since the substrate 3 is polarized in two stages in this way, the ceramic can be polarized evenly and sufficiently.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、圧電部品を構成す
るのに用いられる圧電セラミックの分極方法及び装置に
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for polarizing a piezoelectric ceramic used for forming a piezoelectric component.

【0002】[0002]

【従来の技術】一般に、圧電セラミック基板は焼成処理
したままでは、各結晶粒子内の自発分極が分域構造を取
り、圧電セラミック基板全体では圧電変形が打ち消され
てしまうため、圧電特性を示さない。圧電特性を付与す
るには、圧電セラミック基板に対し、高温下で直流電界
を印加し、自発分極を電極方向に配向する分極処理を施
さなければならない。
2. Description of the Related Art In general, a piezoelectric ceramic substrate does not exhibit piezoelectric characteristics because the spontaneous polarization in each crystal grain takes a domain structure when the firing treatment is performed, and the piezoelectric deformation is canceled out in the entire piezoelectric ceramic substrate. . In order to impart piezoelectric characteristics, a DC electric field must be applied to the piezoelectric ceramic substrate at a high temperature to perform a polarization process for orienting spontaneous polarization in the electrode direction.

【0003】従来、圧電セラミック基板の分極処理は、
PZT系材料のもので説明すると、圧電セラミック基板
を焼成した後、圧電セラミック基板の相対面に、銀等の
導電性ペーストでなる仮の両面電極を設け、この圧電セ
ラミック基板の複数枚を、60〜100℃の絶縁シリコ
ンオイル中に同時に浸漬し、2〜3Kv/mmの電圧を30
分間程度印加することにより分極処理していた。分極に
関する先行技術文献としては、特開昭64ー12587号公報、
特公昭57ー41109号公報、実公昭49ー32865号公報等があ
る。
Conventionally, the polarization processing of a piezoelectric ceramic substrate is performed by
In the case of a PZT-based material, after sintering a piezoelectric ceramic substrate, provisional double-sided electrodes made of a conductive paste such as silver are provided on the opposite surface of the piezoelectric ceramic substrate. Simultaneously immersed in insulating silicon oil at ~ 100 ° C and apply 2-3Kv / mm voltage for 30
Polarization was performed by applying for about a minute. Prior art documents on polarization include JP-A-64-12587,
There are JP-B-57-41109 and JP-B-49-32865.

【0004】しかしながら、圧電セラミック基板のそれ
ぞれは、同じ組成の圧電セラミック基板材料を用いてい
ても、分極のされ易さが同一であるとは限らない。ある
圧電セラミック基板は所望の状態に分極されたのに、他
の圧電セラミック基板は分極不足または分極過剰になる
ことがあり、均一に分極することが困難である。
[0004] However, even if the piezoelectric ceramic substrates use the same composition of piezoelectric ceramic substrate materials, the easiness of polarization is not always the same. While some piezoceramic substrates may be polarized to a desired state, other piezoceramic substrates may be under- or over-polarized, making uniform polarization difficult.

【0005】この問題点を緩和する手段として、従来
は、分極不足を生じさせないことを念頭におき、2〜3
kV/mmという比較的高い電圧を、30分間という比較的
長い時間の間印加していた。このため、絶縁シリコンオ
イル槽内で放電が発生し、圧電セラミック基板に悪影響
を及ぼす恐れがあった。
Conventionally, as a means for alleviating this problem, it is necessary to keep in mind that insufficient polarization is not caused.
A relatively high voltage of kV / mm was applied for a relatively long time of 30 minutes. For this reason, a discharge may occur in the insulating silicon oil tank, which may adversely affect the piezoelectric ceramic substrate.

【0006】また、仮の両面電極として圧電セラミック
基板に印刷された銀が、分極処理時間の経過と共にシリ
コンオイル中に析出することも避けられない。析出累積
した銀はシリコンオイルから分離除去しなければならな
い。この作業は非常に面倒な作業である。
In addition, it is inevitable that silver printed on the piezoelectric ceramic substrate as a temporary double-sided electrode will precipitate in silicon oil with the lapse of the polarization treatment time. The deposited silver must be separated and removed from the silicon oil. This is a very cumbersome task.

【0007】[0007]

【発明が解決しようとする課題】本発明の課題は、圧電
セラミックを均一に分極し得る分極方法及び装置を提供
することである。
SUMMARY OF THE INVENTION It is an object of the present invention to provide a method and an apparatus for polarizing a piezoelectric ceramic uniformly.

【0008】本発明のもう一つの課題は、セラミック基
板をシリコンオイル中に浸漬せず、大気中下で正確に分
極処理可能な分極方法及び装置を提供することである。
Another object of the present invention is to provide a polarization method and apparatus which can accurately perform polarization processing in the atmosphere without immersing the ceramic substrate in silicon oil.

【0009】[0009]

【課題を解決するための手段】上述した課題を解決する
ため、本発明に係る分極方法は、圧電セラミックを分極
するに当たり、初期分極処理工程(以下初期分極処理工
程と称する)と、第2の分極処理工程(以下追い込み分
極処理工程と称する)とを含む。初期分極処理工程で
は、大気中において、所望の分極状態に至らない分極状
態まで分極する。追い込み分極処理工程では、前記初期
分極処理工程の後、大気中において、所望の分極状態に
至るまで分極処理を行なう。
In order to solve the above-mentioned problems, a polarization method according to the present invention provides an initial polarization processing step (hereinafter referred to as an initial polarization processing step) for polarizing a piezoelectric ceramic. And a polarization treatment step (hereinafter referred to as a drive-in polarization treatment step). In the initial polarization processing step, polarization is performed in the atmosphere to a polarization state that does not reach a desired polarization state. In the drive polarization process, after the initial polarization process, a polarization process is performed in the atmosphere until a desired polarization state is reached.

【0010】上述したように、初期分極処理工程で、所
望の分極状態に至らない分極状態まで分極する。従っ
て、初期分極処理工程において、分極のために必要な印
加電圧を、従来よりも著しく低下させることができる。
As described above, in the initial polarization processing step, polarization is performed to a polarization state that does not reach a desired polarization state. Therefore, in the initial polarization treatment step, the applied voltage required for polarization can be significantly reduced as compared with the conventional case.

【0011】初期分極処理工程を経た圧電セラミック
は、追い込み分極処理工程に付される。追い込み分極処
理工程では、所望の分極状態に至るまで分極処理を行な
う。追い込み分極処理工程に付される圧電セラミック
は、既に、初期分極処理工程を経ているので、追い込み
分極処理工程では、初期分極状態から所望の分極状態ま
でに必要な分極だけを行なえばよい。従って、追い込み
分極処理工程においても、分極のために必要な印加電圧
を、従来よりも著しく低下させることができる。
The piezoelectric ceramic that has undergone the initial polarization process is subjected to a drive polarization process. In the drive-in polarization process, the polarization process is performed until a desired polarization state is reached. Since the piezoelectric ceramic to be subjected to the drive polarization process has already undergone the initial polarization process, only the necessary polarization from the initial polarization state to the desired polarization state needs to be performed in the drive polarization process. Therefore, even in the drive-in polarization process, the applied voltage required for polarization can be significantly reduced as compared with the conventional case.

【0012】上述の初期分極処理工程及び追い込み分極
処理工程の何れも、絶縁シリコンオイル槽内ではなく、
大気中で、圧電セラミックを分極する。前述したよう
に、分極の際の印加電圧が低くてよいので、このような
大気中における分極が可能になる。このため、絶縁シリ
コンオイル槽内での分極に付随する従来の問題点、例え
ば、放電に伴うセラミック基板への悪影響、仮電極から
の銀の析出、その分離除去作業等、従来は回避できなか
った問題点を生じる余地がなくなる。
In each of the above-mentioned initial polarization processing step and drive-in polarization processing step, not in the insulating silicon oil tank,
Polarize the piezoelectric ceramic in air. As described above, since the applied voltage at the time of polarization may be low, such polarization in the atmosphere becomes possible. For this reason, the conventional problems associated with the polarization in the insulating silicon oil tank, for example, the adverse effects on the ceramic substrate due to the discharge, the deposition of silver from the temporary electrode, the separation and removal work, etc. could not be avoided conventionally. There is no room for problems.

【0013】また、上記の2段階分極処理によれば、分
極のされ易さが異なるセラミック基板であっても、過不
足ない分極処理を施し、分極不足または分極過剰を生じ
させることなく、均一に分極することができる。
Further, according to the two-step polarization process, even if the ceramic substrates are easily polarized, the polarization process is performed without excess or shortage, and the polarization is uniformly performed without causing insufficient or excessive polarization. Can be polarized.

【0014】好ましくは、追い込み分極処理工程は、複
数の分極処理工程に分けて実行される。また、初期分極
処理工程を終了した後、追い込み分極処理工程を実行す
る前に、分極処理された圧電セラミックの分極状態を測
定する工程を含む。同様に、追い込み分極処理工程を終
了した後、分極処理された圧電セラミックの分極状態を
測定する工程を含んでいてもよい。初期分極処理工程及
び追い込み分極処理工程の何れにおいても、分極処理プ
ロセス自体は、従来と同様の方法によって実行される。
[0014] Preferably, the drive-in polarization processing step is executed by being divided into a plurality of polarization processing steps. Also, the method includes a step of measuring the polarization state of the polarized piezoelectric ceramic after the initial polarization processing step and before performing the drive polarization processing step. Similarly, the method may include a step of measuring the polarization state of the polarized piezoelectric ceramic after the drive-in polarization processing step is completed. In both the initial polarization processing step and the drive polarization processing step, the polarization processing itself is performed by a method similar to the conventional method.

【0015】本発明の他の目的、構成及び利点について
は、添付図面を参照し、更に詳しく説明する。図面は単
に実施例を示すに過ぎない。
Other objects, configurations and advantages of the present invention will be described in more detail with reference to the accompanying drawings. The drawings merely show examples.

【0016】[0016]

【発明の実施の形態】図1は本発明に係る分極方法を実
施する分極処理装置の構成を示す図である。本発明に係
る分極処理は、焼成された圧電セラミック基板3の板面
に、銀等の導電性ペーストを塗布して、両面電極を形成
する電極形成工程に引き続きいて行なわれる。分極処理
は必要な設備を工場内に備え付けて行い、また、圧電セ
ラミック基板3を一枚毎に各装置に搬送することによる
枚葉処理に従うのが望ましい。分極処理に付される圧電
セラミック基板3は、圧電部品を多数有する集合体であ
ることが望ましい。
FIG. 1 is a diagram showing the configuration of a polarization processing apparatus for performing a polarization method according to the present invention. The polarization process according to the present invention is performed after the electrode forming step of applying a conductive paste such as silver to the fired piezoelectric ceramic substrate 3 to form a double-sided electrode. It is preferable that the polarization process is performed by providing necessary facilities in a factory, and that the single-wafer process is performed by transporting the piezoelectric ceramic substrate 3 to each device one by one. It is desirable that the piezoelectric ceramic substrate 3 subjected to the polarization treatment is an aggregate having a large number of piezoelectric components.

【0017】本発明に係る分極処理装置は、第1の分極
処理装置(以下初期分極処理装置と称する)1と、第2
の分極処理装置(以下追い込み分極装置と称する)2と
を含んでいる。初期分極処理装置1は、大気中におい
て、圧電セラミック基板3を所望の分極状態に至らない
分極状態まで分極する。初期分極処理装置1による分極
処理は初期分極処理工程である。
The polarization processing apparatus according to the present invention comprises a first polarization processing apparatus (hereinafter referred to as an initial polarization processing apparatus) 1 and a second polarization processing apparatus.
(Hereinafter referred to as a drive-in polarizer) 2. The initial polarization processing device 1 polarizes the piezoelectric ceramic substrate 3 in the atmosphere to a polarization state that does not reach a desired polarization state. The polarization processing by the initial polarization processing apparatus 1 is an initial polarization processing step.

【0018】追い込み分極処理装置2は、初期分極処理
装置1によって処理された圧電セラミック基板3に対
し、大気中において、所望の分極状態に至るまで分極処
理を行なう。追い込み分極処理装置2による分極処理は
追い込み分極処理工程である。
The drive polarization processing device 2 performs a polarization process on the piezoelectric ceramic substrate 3 processed by the initial polarization processing device 1 in the atmosphere until a desired polarization state is reached. The polarization processing by the drive polarization processing device 2 is a drive polarization processing step.

【0019】初期分極処理装置1による初期分極処理工
程では、圧電セラミック基板3に対し、所望の分極状態
に至らない分極状態まで分極する。従って、初期分極処
理工程において、分極のために必要な印加電圧を、従来
よりも著しく低下させることができる。例えば、従来の
2〜3kV/mmという比較的高い電圧を、その1/2〜1/3程
度の1kV/mm程度まで低下させることができる。
In the initial polarization processing step by the initial polarization processing apparatus 1, the piezoelectric ceramic substrate 3 is polarized to a polarization state that does not reach a desired polarization state. Therefore, in the initial polarization treatment step, the applied voltage required for polarization can be significantly reduced as compared with the conventional case. For example, a relatively high voltage of 2-3 kV / mm in the related art can be reduced to about 1 to 3 kV / mm, which is about 1/2 to 1/3.

【0020】初期分極処理工程を経た圧電セラミック基
板3は、追い込み分極処理装置2に持ち込まれ、追い込
み分極処理工程に付される。追い込み分極処理工程で
は、圧電セラミック基板3に対し、所望の分極状態に至
るまで分極処理を行なう。追い込み分極処理工程に付さ
れる圧電セラミック基板3は、既に、初期分極処理工程
を経ているので、追い込み分極処理工程では、初期分極
状態から所望の分極状態まで、不足の分極だけを行なえ
ばよい。従って、追い込み分極処理工程においても、分
極のために必要な印加電圧を、従来よりも著しく低下さ
せることができる。例えば、従来の2〜3kV/mmという
比較的高い電圧を、その1/2〜1/3程度の1kV/mm程度ま
で低下させることができる。
The piezoelectric ceramic substrate 3 that has undergone the initial polarization processing step is carried into the drive polarization processing apparatus 2 and subjected to the drive polarization processing step. In the drive-in polarization process, a polarization process is performed on the piezoelectric ceramic substrate 3 until a desired polarization state is reached. Since the piezoelectric ceramic substrate 3 that has been subjected to the drive polarization process has already undergone the initial polarization process, only the insufficient polarization from the initial polarization state to the desired polarization state needs to be performed in the drive polarization process. Therefore, even in the drive-in polarization process, the applied voltage required for polarization can be significantly reduced as compared with the conventional case. For example, a relatively high voltage of 2-3 kV / mm in the related art can be reduced to about 1 to 3 kV / mm, which is about 1/2 to 1/3.

【0021】しかも、初期分極処理工程及び追い込み分
極処理工程の何れにおいても、絶縁シリコンオイル槽内
ではなく、大気中で、圧電セラミック基板3を分極す
る。このため、絶縁シリコンオイル槽内での分極に付随
する従来の問題点、例えば、放電に伴う圧電セラミック
基板3への悪影響、仮電極からの銀の析出、その分離除
去作業等、従来は回避できなかった問題点を生じる余地
がなくなる。
In both the initial polarization process and the drive-in polarization process, the piezoelectric ceramic substrate 3 is polarized not in the insulating silicon oil bath but in the atmosphere. For this reason, the conventional problems associated with the polarization in the insulating silicon oil tank, such as the adverse effects on the piezoelectric ceramic substrate 3 due to the discharge, the deposition of silver from the temporary electrode, and the separation and removal thereof, can be avoided conventionally. There is no room for problems that did not exist.

【0022】また、上記の2段階分極処理によれば、分
極のされ易さが異なる圧電セラミック基板3であって
も、それに対応して過不足ない分極処理を施し、分極不
足または分極過剰を生じさせることなく、均一に分極す
ることができる。
According to the two-stage polarization process, even if the piezoelectric ceramic substrate 3 has a different polarization easiness, the polarization process is performed in accordance with the degree of polarization, and insufficient polarization or excessive polarization occurs. Polarization can be performed uniformly without causing the polarization.

【0023】分極処理プロセス自体は、従来と同様の方
法によって実行される。初期分極処理工程及び追い込み
分極処理工程は、圧電セラミック基板3を加熱しなが
ら、両面電極に直流電圧を印加することにより行なわれ
る。その手段として、初期分極処理装置1は、作業テー
ブル11を備え、この作業テーブル11の基板載置面を
熱板等による加熱手段12で形成し、加熱手段12の上
方に電極棒等の電圧印加手段13を備える。
The polarization process itself is performed by a method similar to the conventional one. The initial polarization process and the drive-in polarization process are performed by applying a DC voltage to both electrodes while heating the piezoelectric ceramic substrate 3. As the means, the initial polarization processing apparatus 1 includes a work table 11, a substrate mounting surface of the work table 11 is formed by a heating means 12 such as a hot plate, and a voltage application such as an electrode rod is applied above the heating means 12. Means 13 are provided.

【0024】実施例において、追い込み分極処理装置2
は、複数の分極処理ステージ21、22、23を含んで
いる。従って、追い込み分極処理工程は、分極処理ステ
ージ21〜23により、複数の分極処理工程に分けて実
行される。追い込み分極処理装置2は、一台の作業テー
ブル24を備え、この作業テーブル24の基板載置面を
一枚の加熱手段25で形成し、電圧印加手段261〜2
63を加熱手段25の上方に備える。
In the embodiment, the driving polarization processing device 2
Includes a plurality of polarization processing stages 21, 22, and 23. Therefore, the drive-in polarization process is divided into a plurality of polarization processes by the polarization process stages 21 to 23 and executed. The drive-in polarization processing apparatus 2 includes one work table 24, and the substrate mounting surface of the work table 24 is formed by one heating unit 25, and the voltage application units 261-2 are provided.
63 is provided above the heating means 25.

【0025】圧電セラミック基板3は加熱手段25の板
面上で間欠的に移動する。これにより、分極処理を複数
回に分けて行う。このように、複数回に分けて分極処理
を行うことの利点は、直流印加電圧を低くできること、
印加時間を短縮できることである。
The piezoelectric ceramic substrate 3 moves intermittently on the plate surface of the heating means 25. As a result, the polarization process is performed a plurality of times. As described above, the advantage of performing the polarization process in a plurality of times is that the DC applied voltage can be reduced,
The application time can be shortened.

【0026】例えば、初期分極処理装置1においては、
両電極が設けられた圧電セラミック基板3を加熱手段1
1で150℃程度に印加すると共に、1kV程度の電圧を
10分程度印加することにより、所望の分極状態の約3
5%程度から数10%までの分極処理を行う。
For example, in the initial polarization processing device 1,
The piezoelectric ceramic substrate 3 provided with both electrodes is heated
By applying a voltage of about 1 kV for about 10 minutes while applying a voltage of about 150 ° C. for about 1 minute, a desired polarization state of about 3
The polarization process is performed from about 5% to several tens%.

【0027】次に、追い込み分極装置2の分極処理ステ
ージ21〜23のそれぞれにおいて、圧電セラミック基
板3を、初期分極処理装置1と同様の温度条件で、加熱
手段12で加熱すると共に、同程度の直流電圧を60〜
30秒程度印加する。これにより、所望の分極状態に至
るまで分極する。分極処理ステージ21〜23のそれぞ
れにおいては、10数%〜数%づつ、段階的に追い込み
分極処理を行なう。但し、これは一例であって圧電セラ
ミック基板3の材質に応じて分極条件を設定する。
Next, in each of the polarization processing stages 21 to 23 of the driving polarization device 2, the piezoelectric ceramic substrate 3 is heated by the heating means 12 under the same temperature conditions as those of the initial polarization processing device 1 and at the same time. DC voltage 60 ~
Apply for about 30 seconds. Thereby, polarization is performed until a desired polarization state is reached. In each of the polarization processing stages 21 to 23, the drive-in polarization processing is performed in steps of 10 to several percent. However, this is only an example, and the polarization condition is set according to the material of the piezoelectric ceramic substrate 3.

【0028】図2は本発明に係る分極処理装置の別の実
施例を示す図である。この実施例では、各分極処理後に
圧電セラミック基板3の分極変化を測定する分極変化測
定装置31〜33をワンステージ内に備えている。分極
変化測定装置31は、一対のプローブ311、312を
備え、初期分極処理装置1の後段に配置されている。分
極変化測定装置32は一対のプローブ321、322を
備え第1の追い込み分極処理装置21の後段に配置され
ている。分極変化測定装置33は一対のプローブ33
1、332を備え、第2の追い込み分極処理装置22の
後段に配置されている。初期分極処理装置1は、図1に
示された実施例と同様に、作業テーブル11、加熱手段
12及び電圧印加手段13を備える。
FIG. 2 is a view showing another embodiment of the polarization processing apparatus according to the present invention. In this embodiment, polarization change measuring devices 31 to 33 for measuring the polarization change of the piezoelectric ceramic substrate 3 after each polarization process are provided in one stage. The polarization change measuring device 31 includes a pair of probes 311, 312, and is arranged at a stage subsequent to the initial polarization processing device 1. The polarization change measuring device 32 includes a pair of probes 321 and 322 and is arranged at a stage subsequent to the first drive-in polarization processing device 21. The polarization change measuring device 33 includes a pair of probes 33.
1 and 332, and is disposed downstream of the second drive-in polarization processing device 22. The initial polarization processing apparatus 1 includes a work table 11, a heating unit 12, and a voltage applying unit 13, as in the embodiment shown in FIG.

【0029】第1の追い込み分極処理装置21は作業テ
ーブル211、加熱手段212及び電圧印加手段213
を備える。第2の追い込み分極処理装置22は作業テー
ブル221、加熱手段222及び電圧印加手段223を
備える。従って、この実施例の場合も、追い込み分極処
理工程では複数回に分けて分極処理を行うことができる
から、直流電圧は比較的低い電圧でよく、印加時間も短
くてよい。この点については、図1を参照して既に述べ
た。
The first drive polarization processing device 21 includes a work table 211, a heating unit 212, and a voltage application unit 213.
Is provided. The second drive polarization processing device 22 includes a work table 221, a heating unit 222, and a voltage application unit 223. Therefore, also in this embodiment, since the polarization process can be performed a plurality of times in the drive polarization process, the DC voltage may be a relatively low voltage and the application time may be short. This has already been described with reference to FIG.

【0030】分極変化測定装置31〜33としては、分
極処理された圧電セラミック基板3から直流電圧を発生
させ、その電圧値を検流計により測定する構成を採用で
きる。また、分極変化測定装置31〜33で得られるデ
ータを、コンピュータで処理し、次の追い込み分極処理
の条件設定を行うデータとして用いることもできる。
As the polarization change measuring devices 31 to 33, a configuration in which a DC voltage is generated from the piezoelectric ceramic substrate 3 subjected to the polarization treatment and the voltage value is measured by a galvanometer can be adopted. In addition, data obtained by the polarization change measuring devices 31 to 33 can be processed by a computer and used as data for setting conditions for the next drive-in polarization process.

【0031】上記の構成によれば、圧電セラミック基板
3の分極処理後に、圧電セラミック基板3の分極変化を
分極変化測定装置31〜33で測定し、この測定データ
に基づいて、各追い込み分極処理の時間設定を必要に応
じて調整制御することができる。このため、圧電セラミ
ック基板3の分極処理をより正確に行うことができる。
According to the above configuration, after the polarization processing of the piezoelectric ceramic substrate 3, the polarization change of the piezoelectric ceramic substrate 3 is measured by the polarization change measuring devices 31 to 33, and based on the measurement data, each of the drive-in polarization processing is performed. The time setting can be adjusted and controlled as needed. Therefore, the polarization processing of the piezoelectric ceramic substrate 3 can be performed more accurately.

【0032】ただし、本発明においては、圧電セラミッ
ク基板3の分極処理を、初期分極処理と追い込み分極処
理とに分けて行うことから、各工程における分極の設定
条件に応じた分極割合を、分極データとして得ることが
できる。この分極データは、同一の圧電セラミック基板
3の場合は勿論、同一のロットで製造された圧電セラミ
ック基板3であれば、略近似した数値を示す。従って、
その分極データに基づいて各工程の分極条件を設定する
ことにより、特に分極変化測定装置31〜33を備えな
くても所望の分極状態まで均一に分極処理することがで
きる。
However, in the present invention, the polarization process of the piezoelectric ceramic substrate 3 is performed by dividing the polarization process into an initial polarization process and a drive-in polarization process. Can be obtained as The polarization data shows substantially similar numerical values not only in the case of the same piezoelectric ceramic substrate 3 but also in the case of piezoelectric ceramic substrates 3 manufactured in the same lot. Therefore,
By setting the polarization conditions in each step based on the polarization data, it is possible to uniformly perform the polarization processing to a desired polarization state without particularly providing the polarization change measuring devices 31 to 33.

【0033】図3は分極処理された圧電セラミック基板
3から両面電極を除去する洗浄工程を示す。分極処理の
終了した圧電セラミック基板3は、図3で示すような洗
浄処理工程に送り込んで、圧電セラミック基板3から仮
の両面電極を除去する洗浄処理を施す。洗浄処理工程
は、浸漬洗浄槽41、泡洗浄槽42、シャワー洗浄槽4
3及び超音波洗浄槽44を順次に配置し、これらの槽4
1〜44により圧電セラミック基板3を順次に処理す
る。これにより、圧電セラミック基板3に付着された仮
の両面電極を確実に除去することができる。洗浄処理が
終了した圧電セラミック基板3はストッカ45に収容
し、次工程に搬送するようにできる。
FIG. 3 shows a cleaning step of removing the double-sided electrodes from the piezoelectric ceramic substrate 3 subjected to the polarization treatment. The piezoelectric ceramic substrate 3 that has been subjected to the polarization processing is sent to a cleaning processing step as shown in FIG. 3 and subjected to a cleaning processing for removing temporary double-sided electrodes from the piezoelectric ceramic substrate 3. The cleaning process includes immersion cleaning tank 41, foam cleaning tank 42, shower cleaning tank 4
3 and the ultrasonic cleaning tank 44 are sequentially arranged, and these tanks 4
The piezoelectric ceramic substrates 3 are sequentially processed by 1 to 44. Thereby, the temporary double-sided electrode attached to the piezoelectric ceramic substrate 3 can be reliably removed. The piezo-ceramic substrate 3 after the cleaning process is stored in the stocker 45 and can be transported to the next step.

【0034】[0034]

【発明の効果】以上述べたように、本発明によれば、次
のような効果を得ることができる。 (a)圧電セラミックを均一に分極し得る分極方法及び
装置を提供することができる。 (b)セラミック基板をシリコンオイル中に浸漬せず、
大気中下で正確に分極処理可能な分極方法及び装置を提
供することができる。
As described above, according to the present invention, the following effects can be obtained. (A) It is possible to provide a polarization method and apparatus capable of uniformly polarizing a piezoelectric ceramic. (B) without immersing the ceramic substrate in silicon oil,
It is possible to provide a polarization method and apparatus capable of performing polarization processing accurately in the atmosphere.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係る分極方法を実施する分極処理装置
の構成を示す図である。
FIG. 1 is a diagram illustrating a configuration of a polarization processing apparatus that performs a polarization method according to the present invention.

【図2】本発明に係る分極方法を実施する分極処理装置
の別の構成を示す図である。
FIG. 2 is a diagram illustrating another configuration of a polarization processing apparatus that performs the polarization method according to the present invention.

【図3】洗浄工程を示す図である。FIG. 3 is a view showing a cleaning step.

【符号の説明】[Explanation of symbols]

1 第1の分極処理装置(初期分
極処理装置) 2 第2の分極処理装置(追い込
み分極処理装置)
1 First polarization processing device (initial polarization processing device) 2 Second polarization processing device (run-in polarization processing device)

Claims (14)

【特許請求の範囲】[Claims] 【請求項1】 圧電セラミックを分極する方法であっ
て、 第1の分極処理工程では、大気中において、所望の分極
状態に至らない分極状態まで分極し、 第2の分極処理工程では、前記第1の分極処理工程の
後、大気中において、所望の分極状態に至るまで分極処
理を行なう分極方法。
1. A method for polarizing a piezoelectric ceramic, comprising: in a first polarization step, a polarization state in air is reduced to a polarization state that does not reach a desired polarization state; A polarization method in which, after the first polarization processing step, a polarization processing is performed in the atmosphere until a desired polarization state is reached.
【請求項2】 請求項1に記載された分極方法であっ
て、 前記第2の分極処理工程は、複数の分極処理工程に分け
て実行される分極方法。
2. The polarization method according to claim 1, wherein the second polarization processing step is performed in a plurality of polarization processing steps.
【請求項3】 請求項1に記載された分極方法であっ
て、 前記第1の分極処理工程を終了した後、前記第2の分極
処理工程を実行する前に、分極処理された圧電セラミッ
クの分極状態を測定する工程を含む分極方法。
3. The polarization method according to claim 1, wherein after the first polarization processing step is completed, and before the second polarization processing step is performed, the polarization-processed piezoelectric ceramic is removed. A polarization method including a step of measuring a polarization state.
【請求項4】 請求項1、2または3に記載された分極
方法であって、 前記第2の分極処理工程を終了した後、分極処理された
圧電セラミックの分極変化を測定する工程を含む分極方
法。
4. The polarization method according to claim 1, 2 or 3, further comprising a step of measuring a polarization change of the polarized piezoelectric ceramic after completing the second polarization processing step. Method.
【請求項5】 請求項1に記載された分極方法であっ
て、 前記第1の分極処理工程に供される前記圧電セラミック
は、焼成処理され、かつ、相対する両面に仮の両面電極
を設けた基板である分極方法。
5. The polarization method according to claim 1, wherein the piezoelectric ceramic subjected to the first polarization processing step is subjected to a sintering process, and a temporary double-sided electrode is provided on both opposing surfaces. The substrate is a polarized method.
【請求項6】 請求項5に記載された分極方法であっ
て、 前記第1の分極処理工程及び前記第2の分極処理工程
は、前記圧電セラミックを加熱しながら、前記両面電極
に直流電圧を印加することにより行なわれる分極方法。
6. The polarization method according to claim 5, wherein in the first polarization processing step and the second polarization processing step, a DC voltage is applied to the double-sided electrode while heating the piezoelectric ceramic. Polarization method performed by applying.
【請求項7】 圧電セラミックを分極するための装置で
あって、第1の分極処理装置と、第2の分極処理装置と
を含み、 第1の分極処理装置は、大気中において、所望の分極状
態に至らない分極状態まで分極し、 第2の分極処理装置は、前記第1の分極処理装置によっ
て処理された圧電セラミックに対し、大気中において、
所望の分極状態に至るまで分極処理を行なう分極処理装
置。
7. An apparatus for polarizing a piezoelectric ceramic, comprising: a first polarization processing apparatus and a second polarization processing apparatus, wherein the first polarization processing apparatus has a desired polarization in air. The second polarization processing device polarizes the piezoelectric ceramic processed by the first polarization processing device in the air to a polarization state that does not reach the state.
A polarization processing apparatus that performs polarization processing until a desired polarization state is reached.
【請求項8】 請求項7に記載された装置であって、 前記第2の分極処理装置は、複数の分極処理ステージを
含む分極処理装置。
8. The polarization processing apparatus according to claim 7, wherein the second polarization processing apparatus includes a plurality of polarization processing stages.
【請求項9】 請求項7に記載された装置であって、 分極変化測定装置を含み、前記分極変化測定装置は、前
記第1の分極処理装置によって分極処理された圧電セラ
ミックの分極変化を測定する分極処理装置。
9. The apparatus according to claim 7, further comprising a polarization change measuring device, wherein the polarization change measuring device measures a polarization change of the piezoelectric ceramic polarized by the first polarization processing device. Polarization processing equipment.
【請求項10】 請求項7、8または9に記載された装
置であって、 第2の分極変化測定装置を含み、前記第2の分極変化測
定装置は、前記第2の分極処理装置によって分極処理さ
れた圧電セラミックの分極変化を測定する分極処理装
置。
10. The apparatus according to claim 7, 8 or 9, further comprising a second polarization change measuring device, wherein the second polarization change measuring device is polarized by the second polarization processing device. A polarization processing device that measures the polarization change of the processed piezoelectric ceramic.
【請求項11】 請求項7に記載された装置であって、 前記第1の分極処理装置及び前記第2の分極処理装置
は、加熱手段と、電圧印加手段とを含み、 前記加熱手段は、その上面に載置された前記圧電セラミ
ックを加熱し、 前記電圧印加手段は、前記加熱手段上に載置された前記
圧電セラミックに直流電圧を印加する分極処理装置。
11. The apparatus according to claim 7, wherein the first polarization processing device and the second polarization processing device include a heating unit and a voltage application unit, and the heating unit includes: A polarization processing apparatus for heating the piezoelectric ceramic mounted on the upper surface thereof, and wherein the voltage applying means applies a DC voltage to the piezoelectric ceramic mounted on the heating means.
【請求項12】 請求項11に記載された分極処理装置
であって、 前記第2の分極処理装置は、前記加熱手段及び前記電極
板の組み合わせを複数組備える分極処理装置。
12. The polarization processing apparatus according to claim 11, wherein the second polarization processing apparatus includes a plurality of combinations of the heating unit and the electrode plate.
【請求項13】 請求項12に記載された分極処理装置
であって、 前記加熱手段及び前記電極板の組み合わせ毎に、分極変
化測定装置を備え、前記分極変化測定装置のそれぞれ
は、前記圧電セラミックの分極変化を測定する分極処理
装置。
13. The polarization processing apparatus according to claim 12, wherein a polarization change measuring device is provided for each combination of the heating means and the electrode plate, and each of the polarization change measuring devices is the piezoelectric ceramic. A polarization processing device that measures the polarization change of a substrate.
【請求項14】 請求項12に記載された分極処理装置
であって、 前記加熱手段及び前記電圧印加手段は、同一の作業テー
ブルに備えられている分極処理装置。
14. The polarization processing apparatus according to claim 12, wherein the heating unit and the voltage application unit are provided on a same work table.
JP32202196A 1996-12-02 1996-12-02 Method for polarizing piezoelectric ceramic Withdrawn JPH10163543A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32202196A JPH10163543A (en) 1996-12-02 1996-12-02 Method for polarizing piezoelectric ceramic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32202196A JPH10163543A (en) 1996-12-02 1996-12-02 Method for polarizing piezoelectric ceramic

Publications (1)

Publication Number Publication Date
JPH10163543A true JPH10163543A (en) 1998-06-19

Family

ID=18139044

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32202196A Withdrawn JPH10163543A (en) 1996-12-02 1996-12-02 Method for polarizing piezoelectric ceramic

Country Status (1)

Country Link
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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005006457A1 (en) * 2003-07-10 2005-01-20 Siemens Aktiengesellschaft Method for producing piezoceramic multi-layer laminations and a piezoelectric component
JP2009016819A (en) * 2007-07-09 2009-01-22 Samsung Electronics Co Ltd Method of polling piezoelectric actuator
JP2010226077A (en) * 2009-02-24 2010-10-07 Seiko Epson Corp Method for producing liquid ejecting head, liquid ejecting head, and liquid ejecting device
JP2014195998A (en) * 2009-02-24 2014-10-16 セイコーエプソン株式会社 Method for manufacturing piezoelectric element, and piezoelectric element
CN107026232A (en) * 2017-05-09 2017-08-08 湖南科技大学 A kind of piezoelectric fabric polar system and method

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005006457A1 (en) * 2003-07-10 2005-01-20 Siemens Aktiengesellschaft Method for producing piezoceramic multi-layer laminations and a piezoelectric component
JP2009016819A (en) * 2007-07-09 2009-01-22 Samsung Electronics Co Ltd Method of polling piezoelectric actuator
EP2023417A2 (en) * 2007-07-09 2009-02-11 Samsung Electronics Co., Ltd. Method of Poling Piezoelectric Actuator
EP2023417A3 (en) * 2007-07-09 2009-05-13 Samsung Electronics Co., Ltd. Method of Poling Piezoelectric Actuator
JP2010226077A (en) * 2009-02-24 2010-10-07 Seiko Epson Corp Method for producing liquid ejecting head, liquid ejecting head, and liquid ejecting device
JP2014195998A (en) * 2009-02-24 2014-10-16 セイコーエプソン株式会社 Method for manufacturing piezoelectric element, and piezoelectric element
CN107026232A (en) * 2017-05-09 2017-08-08 湖南科技大学 A kind of piezoelectric fabric polar system and method

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