JPH10142241A5 - - Google Patents
Info
- Publication number
- JPH10142241A5 JPH10142241A5 JP1996298872A JP29887296A JPH10142241A5 JP H10142241 A5 JPH10142241 A5 JP H10142241A5 JP 1996298872 A JP1996298872 A JP 1996298872A JP 29887296 A JP29887296 A JP 29887296A JP H10142241 A5 JPH10142241 A5 JP H10142241A5
- Authority
- JP
- Japan
- Prior art keywords
- cantilever
- wafer
- vibration
- detection means
- fixed end
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP29887296A JP3670777B2 (ja) | 1996-11-11 | 1996-11-11 | カンチレバーの評価装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP29887296A JP3670777B2 (ja) | 1996-11-11 | 1996-11-11 | カンチレバーの評価装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JPH10142241A JPH10142241A (ja) | 1998-05-29 |
JPH10142241A5 true JPH10142241A5 (enrdf_load_html_response) | 2004-10-07 |
JP3670777B2 JP3670777B2 (ja) | 2005-07-13 |
Family
ID=17865285
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP29887296A Expired - Fee Related JP3670777B2 (ja) | 1996-11-11 | 1996-11-11 | カンチレバーの評価装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3670777B2 (enrdf_load_html_response) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001183257A (ja) * | 1999-12-28 | 2001-07-06 | Mitsutoyo Corp | プローブの検査方法及び装置 |
JP2005049219A (ja) * | 2003-07-29 | 2005-02-24 | Toudai Tlo Ltd | 走査型プローブ顕微鏡 |
US7719663B2 (en) | 2005-03-02 | 2010-05-18 | Japan Science And Technology Agency | Heterodyne laser doppler probe and measurement system using the same |
JP5004223B2 (ja) * | 2007-06-27 | 2012-08-22 | 国立大学法人長岡技術科学大学 | 振動測定装置及び振動測定方法 |
-
1996
- 1996-11-11 JP JP29887296A patent/JP3670777B2/ja not_active Expired - Fee Related
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR101569960B1 (ko) | 다이나믹 탐침 검출 시스템 | |
JP3511361B2 (ja) | 走査プローブ顕微鏡 | |
JP2730673B2 (ja) | 超音波を導入するカンチレバーを用いた物性の計測方法および装置 | |
JP5183989B2 (ja) | 形状測定装置 | |
Rabe et al. | Vibrations of free and surface‐coupled atomic force microscope cantilevers: Theory and experiment | |
US8359661B2 (en) | Magnetic device inspection apparatus and magnetic device inspection method | |
EP1482297A4 (en) | RASTERSONDENMIKROSKOP AND METHOD FOR MEASURING THE SURFACE STRUCTURE OF PREPARATIONS | |
KR102484671B1 (ko) | 헤테로다인 원자력 현미경 장치, 방법 및 리소그래피 시스템 | |
JPWO2007072706A1 (ja) | 走査型プローブ顕微鏡 | |
JPH10142241A5 (enrdf_load_html_response) | ||
JP2001108601A (ja) | 走査型プローブ顕微鏡 | |
JP3670777B2 (ja) | カンチレバーの評価装置 | |
JP3595849B1 (ja) | マイクロ・ナノ材料用疲労試験装置 | |
JP4680196B2 (ja) | 原子間力顕微鏡の、片側が固定されたばねカンチレバー中にねじれ振動を非接触に励起する方法および装置 | |
JP2013007666A (ja) | 表面形状測定用触針式段差計及び該段差計における測定精度の改善方法 | |
RU2510009C1 (ru) | Устройство для измерения параметров рельефа поверхности и механических свойств материалов | |
US7423264B2 (en) | Atomic force microscope | |
JP3971305B2 (ja) | 機械式マイクロオシレータの動きを平行検知するための装置 | |
US20140139843A1 (en) | Optical cantilever based analyte detection | |
US20070151341A1 (en) | Device and method for measuring flexural damping of fibres | |
JPH0915137A (ja) | 摩擦力測定装置および走査型摩擦力顕微鏡 | |
JP4895379B2 (ja) | レバー加振機構及び走査型プローブ顕微鏡 | |
WO2006025447A1 (ja) | カンチレバーおよびその利用 | |
JPH0772230A (ja) | 磁気力顕微鏡 | |
Huang et al. | Vibration frequency matching in fiber-based interferometer for femtogram measurement |