JPH0974167A - Semiconductor module - Google Patents

Semiconductor module

Info

Publication number
JPH0974167A
JPH0974167A JP7230136A JP23013695A JPH0974167A JP H0974167 A JPH0974167 A JP H0974167A JP 7230136 A JP7230136 A JP 7230136A JP 23013695 A JP23013695 A JP 23013695A JP H0974167 A JPH0974167 A JP H0974167A
Authority
JP
Japan
Prior art keywords
semiconductor
semiconductor module
semiconductor device
electrode terminal
electrode terminals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7230136A
Other languages
Japanese (ja)
Other versions
JP2897696B2 (en
Inventor
Masahiko Ichise
理彦 市瀬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP7230136A priority Critical patent/JP2897696B2/en
Publication of JPH0974167A publication Critical patent/JPH0974167A/en
Application granted granted Critical
Publication of JP2897696B2 publication Critical patent/JP2897696B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/93Batch processes
    • H01L24/95Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • H01L24/97Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144Gold (Au) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a semiconductor module which can be electrically connected with electrodes of the respective semiconductor chips, by directly linking a plurality of semiconductor devices with electrode terminals, and by penetrating a plurality of the semiconductor devices, with a part of the electrode terminals. SOLUTION: Electrode terminals 15 for continuous connection which directly link the parts between semiconductor devices 11 are arranged on the side surfaces of semiconductor device bodies, besides normal electrode terminals 13 which connect the semiconductor devices 11 with boards. Electrode terminals 15a for continuous connection, as a part of the electrode terminals 15, penetrate a plurality of the semiconductor devices. In plastic molded parts 18, single ends of the electrode terminals 13 and the electrode terminals 15 for continuous connection of body side surfaces, and specified parts of the electrode terminals 15a for continuous connection of body side surfaces which penetrate the semiconductor devices are connected with specified electrodes of semiconductor chips 12 through Au wires 17 and electrically conductive with the electrodes.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は半導体モジュールに
関し、特に複数の半導体装置を連接用電極端子で連設し
た半導体モジュールに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor module, and more particularly to a semiconductor module in which a plurality of semiconductor devices are connected by connecting electrode terminals.

【0002】[0002]

【従来の技術】従来の半導体装置、例えばSOJ、SO
P、QFP、DIP、ZIPなどの電極端子は半導体装
置ごとに直接基板のランドにはんだで接続され、基板の
配線を介して複数の半導体装置の電極端子同士の電気的
接続を得るとと同時に基板からの電気的な入出力を受け
ている。
2. Description of the Related Art Conventional semiconductor devices such as SOJ and SO
The electrode terminals of P, QFP, DIP, ZIP, etc. are directly connected to the lands of the substrate for each semiconductor device by soldering, and the electrical connection between the electrode terminals of the plurality of semiconductor devices is obtained through the wiring of the substrate and at the same time the substrate is obtained. It receives electrical input and output from.

【0003】また、従来技術として半導体装置の両端の
電極端子に基板接続用電極端子を有する混成集積回路基
板を取り付け、その混成集積回路基板により半導体装置
を支持し、混成集積回路基板の基板接続用電極端子を基
板にはんだ付けして間接的に基板と電気的に接続する方
法もある(特開昭56−63058)。
Further, as a conventional technique, a hybrid integrated circuit board having electrode terminals for substrate connection is attached to the electrode terminals at both ends of the semiconductor device, the semiconductor device is supported by the hybrid integrated circuit board, and the board is connected to the hybrid integrated circuit board. There is also a method in which the electrode terminals are soldered to the substrate and indirectly electrically connected to the substrate (JP-A-56-63058).

【0004】基板を介さずに半導体装置同士が電気的導
通を得る方法として、図13に示す構成が採用されてい
る(特開平4−343462)。図13は従来例の電極
端子同士を連結した半導体装置の模式的側面図である。
図中符号131は垂直型半導体装置、133は通常の電
極端子、133aは電極端子133の平坦部、134は
連結した電極端子、134aは連結した電極端子134
の平坦部を示す。
The structure shown in FIG. 13 is adopted as a method for obtaining electrical conduction between semiconductor devices without using a substrate (Japanese Patent Laid-Open No. 4-343462). FIG. 13 is a schematic side view of a conventional semiconductor device in which electrode terminals are connected to each other.
In the figure, reference numeral 131 is a vertical semiconductor device, 133 is a normal electrode terminal, 133a is a flat portion of the electrode terminal 133, 134 is a connected electrode terminal, and 134a is a connected electrode terminal 134.
The flat part of FIG.

【0005】図13のように、2個の垂直型半導体装置
の一部の電極端子134同士を連結させ、それを屈曲さ
せて平坦部134aを設け、通常の電極端子133に設
けられた平坦部133aと共に半導体装置131を垂直
に保持して基板に実装する。このように複数の半導体装
置の各々の電極端子を連結させることにより、平坦部に
信号を入力すれば複数の半導体装置に信号が入力できる
ので、基板の信号入力ランドを削減することができる。
As shown in FIG. 13, electrode terminals 134 of a part of two vertical type semiconductor devices are connected to each other and bent to form a flat portion 134a, and a flat portion provided on a normal electrode terminal 133 is formed. The semiconductor device 131 is held vertically along with 133a and mounted on the substrate. By connecting the electrode terminals of each of the plurality of semiconductor devices in this way, the signals can be input to the plurality of semiconductor devices if the signals are input to the flat portion, so that the signal input land of the substrate can be reduced.

【0006】また、図15に示すようなTABリードを
用いて半導体装置の外部電極同士を直接連結する方法も
採用されている(特開平2−290033)。図15は
TABリードを用いて3個の半導体装置の外部電極を直
接連結した半導体モジュールの模式的平面図である。図
中符号152aは半導体装置159の外部電極、154
はTABリード、159は半導体装置を示す。図15で
近接して配置された3個の半導体装置159の隣接部分
の外部電極152aはTABリード154で直接連結さ
れ、それ以外の外部電極152aはTABリード154
で外部に引き出されている。
Further, a method of directly connecting external electrodes of a semiconductor device by using a TAB lead as shown in FIG. 15 has also been adopted (Japanese Patent Laid-Open No. 2-290033). FIG. 15 is a schematic plan view of a semiconductor module in which external electrodes of three semiconductor devices are directly connected using TAB leads. In the figure, reference numeral 152a indicates external electrodes of the semiconductor device 159, 154.
Is a TAB lead, and 159 is a semiconductor device. The external electrodes 152a of the adjacent portions of the three semiconductor devices 159 arranged close to each other in FIG. 15 are directly connected by the TAB lead 154, and the other external electrodes 152a are connected to the TAB lead 154.
Has been pulled out to the outside.

【0007】[0007]

【発明が解決しようとする課題】従来の基板を介して半
導体装置同士の電気的導通を得る方法は、現在のように
1枚の基板に非常に多くの半導体装置が高密度に実装さ
れるようになると、基板の配線の微細化や多層化が要求
されてくる。しかし配線の微細化には技術的な限界があ
るので、それ以上の微細化が要求される場合には、多層
化してスルーホールにより配線層間の導通を得るという
方法で回避するしかない。
The conventional method of electrically connecting semiconductor devices to each other through a substrate is such that a large number of semiconductor devices are mounted on one substrate at a high density as in the present method. In this case, it is required that the wiring of the substrate be miniaturized and the number of layers be increased. However, since there is a technical limit to the miniaturization of wiring, if further miniaturization is required, it is necessary to avoid it by a method in which the wiring is multilayered and conduction is provided between wiring layers.

【0008】このように基板上の半導体装置が増加すれ
ばするほど、配線層の多層化は避けられない。これらの
配線の微細化や多層化は基板のコストアップにつなが
る。そして、さらに基板上の半導体装置の増加は実装工
数の増大という問題も引き起こす。
As the number of semiconductor devices on the substrate is increased in this way, it is inevitable that the wiring layers are multi-layered. The miniaturization and multi-layering of these wirings increase the cost of the substrate. Further, an increase in the number of semiconductor devices on the substrate causes a problem of an increase in mounting man-hours.

【0009】上述の半導体装置の電極端子に混成集積回
路基板を接続し、接続した混成集積回路基板のリードを
基板にはんだ付けする方法は、半導体装置の高さが混成
集積回路基板により高くなってしまうという問題点があ
る。
In the method of connecting the hybrid integrated circuit substrate to the electrode terminals of the semiconductor device and soldering the leads of the connected hybrid integrated circuit substrate to the substrate, the height of the semiconductor device is increased by the hybrid integrated circuit substrate. There is a problem that it ends up.

【0010】また、従来の垂直型半導体装置の電極端子
同士を接続し、平坦部を設けて基板に実装する方法は、
3個以上の連結ができない。図14はリードフレームか
ら切り離し前の垂直型半導体装置の模式的平面図であ
る。図中符号141は垂直型半導体装置、144は電極
端子、144bは電極端子144の切断部、146はリ
ードフレームである。
Further, a method of connecting electrode terminals of a conventional vertical type semiconductor device, providing a flat portion, and mounting on a substrate is as follows.
Cannot connect more than three. FIG. 14 is a schematic plan view of the vertical semiconductor device before being separated from the lead frame. In the figure, reference numeral 141 is a vertical semiconductor device, 144 is an electrode terminal, 144b is a cut portion of the electrode terminal 144, and 146 is a lead frame.

【0011】図14に示すように2個の垂直型半導体素
子141の電極端子144を有する面を対面させ、各電
極端子が接続されている。アッセンブリ工程で接続しな
い端子の斜線で示した切断部144bを切り落し、2個
の垂直型半導体素子が平行になるように折り曲げる。折
り曲げる際に、図13のように接続する連接用電極端子
134には平坦部134aを設け、切り離された電極端
子133は垂直型半導体装置131の反対側に折り曲
げ、その電極端子133にも平坦部133aを設ける。
このような構造なので3個以上の場合は垂直半導体素子
の電極端子を対面させられないので接続できない。
As shown in FIG. 14, the surfaces of the two vertical semiconductor elements 141 having the electrode terminals 144 face each other, and the respective electrode terminals are connected. In the assembly process, the cut portions 144b shown by the diagonal lines of the terminals that are not connected are cut off and bent so that the two vertical semiconductor elements are parallel to each other. At the time of bending, the connecting electrode terminal 134 to be connected as shown in FIG. 133a is provided.
With such a structure, the electrode terminals of the vertical semiconductor element cannot be connected to each other when the number of the electrodes is three or more, so that connection is not possible.

【0012】また、従来のTABテープで半導体装置同
士を接続する方法では、1個の半導体装置とそれに隣接
する半導体装置とは電気的導通を得ることができるが、
隣接しない半導体装置との電気的導通は得ることができ
ない。さらにTABテープを使用する場合は、実装する
ときにすでに封止されており、実装直前に接続してある
TABテープ上の配線を切って半導体装置間の配線を変
更して半導体モジュールの機能を変更することはできな
い。
Further, in the conventional method of connecting semiconductor devices to each other with a TAB tape, one semiconductor device and a semiconductor device adjacent thereto can be electrically connected.
It is not possible to obtain electrical continuity with semiconductor devices that are not adjacent to each other. Furthermore, when using a TAB tape, the function of the semiconductor module is changed by cutting the wiring on the TAB tape which is already sealed at the time of mounting and is connected immediately before mounting to change the wiring between semiconductor devices. You cannot do it.

【0013】本発明の目的は、複数の半導体装置を直接
電極端子で連結し、一部の電極端子は複数の半導体装置
を貫通してそれぞれの半導体チップの電極と導通可能な
半導体モジュールを提供することにある。
An object of the present invention is to provide a semiconductor module in which a plurality of semiconductor devices are directly connected by electrode terminals, and some electrode terminals penetrate the plurality of semiconductor devices and can be electrically connected to the electrodes of the respective semiconductor chips. Especially.

【0014】[0014]

【課題を解決するための手段】本発明の半導体モジュー
ルは、複数の半導体装置が物理的および電気的に相互に
接続され、一体に形成された半導体モジュールにおい
て、それぞれの半導体素子は基板接続用の電極端子およ
び隣接の半導体装置と直接接続するための連接用電極端
子を有し、複数の前記半導体装置が、前記連接用電極端
子で直列に一体に連結されている。
A semiconductor module according to the present invention is a semiconductor module in which a plurality of semiconductor devices are physically and electrically connected to each other and are integrally formed, and each semiconductor element is for substrate connection. It has an electrode terminal and a connecting electrode terminal for directly connecting to an adjacent semiconductor device, and the plurality of semiconductor devices are integrally connected in series at the connecting electrode terminal.

【0015】連接用電極端子の少なくとも1本は、少な
くとも1個の半導体装置を接続可能に貫通横断して、該
半導体装置に隣接する半導体装置と接続されていてもよ
く、少なくとも1本の半導体装置を貫通横断する連接用
電極端子が、複数の半導体装置のそれぞれに内蔵された
半導体チップの機能の共通する電極パッドに、共通に接
続されていてもよく、半導体装置を貫通横断する連接用
電極端子が、半導体装置に内蔵される半導体チップの表
裏何れかの面上を横断していてもよい。
At least one of the connecting electrode terminals may be connected to a semiconductor device adjacent to the semiconductor device by traversing at least one semiconductor device so as to be connectable, and at least one semiconductor device. A connecting electrode terminal penetrating and traversing may be commonly connected to an electrode pad having a function of a semiconductor chip built in each of a plurality of semiconductor devices, and a connecting electrode terminal penetrating and traversing the semiconductor device. However, it may cross over either the front surface or the back surface of the semiconductor chip built in the semiconductor device.

【0016】また、半導体モジュールを構成する半導体
装置が垂直型半導体装置であり、基板接続用の電極端子
を有する側面に直交する2つの側面に、連接用電極端子
が配設されていてもよく、連接用電極端子が、連接する
2つの半導体装置の間で所定の角度で折り曲げられてい
てもよく、半導体モジュールの最端部の連接用電極端子
の先端が、半導体モジュールの基板への実装時に、基板
の配線と接続可能な位置に導出されていてもよい。
Further, the semiconductor device constituting the semiconductor module is a vertical semiconductor device, and the connecting electrode terminals may be provided on two side surfaces orthogonal to the side surface having the electrode terminals for connecting the substrate. The connection electrode terminal may be bent at a predetermined angle between the two semiconductor devices connected to each other, and the tip of the connection electrode terminal at the end of the semiconductor module may be mounted on a substrate of the semiconductor module at the time of mounting. It may be led out to a position where it can be connected to the wiring of the substrate.

【0017】さらに、半導体モジュールを構成する半導
体装置が表面実装型半導体装置であり、該半導体装置の
平行する2つの側面に連接用電極端子が配設されていて
もよく、連接用電極端子の所定の最端部および所定の半
導体装置連結部が、半導体モジュールの基板への実装時
に、基板の配線と接続可能な位置に導出されていてもよ
い。
Further, the semiconductor device constituting the semiconductor module may be a surface-mounting type semiconductor device, and connecting electrode terminals may be provided on two parallel side surfaces of the semiconductor device. The outermost portion and the predetermined semiconductor device connecting portion may be led out to a position connectable to the wiring of the substrate when the semiconductor module is mounted on the substrate.

【0018】本発明の半導体モジュールを使用すること
によって、従来は基板を介して行なっていた隣接する垂
直型半導体装置同士の導通を本体側面に設けた連接用電
極端子で直接行なえるために基板内の配線を削減でき
る。
By using the semiconductor module of the present invention, the connection between the vertical semiconductor devices adjacent to each other, which is conventionally performed through the substrate, can be directly performed by the connecting electrode terminals provided on the side surface of the main body. Wiring can be reduced.

【0019】また、複数の垂直型半導体装置の中を貫通
する本体側面の連接用電極端子によって上述の従来例の
ZIPやTABテープでの連結では不可能であった隣接
しない半導体との連結が可能となる。
Further, the connection electrode terminals on the side surface of the main body penetrating through a plurality of vertical semiconductor devices enable connection with non-adjacent semiconductors, which was impossible with the conventional connection using the ZIP or TAB tape described above. Becomes

【0020】さらに複数の垂直型半導体装置の中を通過
する本体側面の連接用電極端子の1本を各半導体装置の
半導体チップの共通の目的の電極と電気的に導通させて
いけば、一本の電極端子に信号を入力するだけで複数の
垂直型半導体装置に信号を入力することができ、これに
よって基板に接続する電極端子を削減できる。
Further, if one of the connecting electrode terminals on the side surface of the main body passing through the plurality of vertical semiconductor devices is electrically connected to a common purpose electrode of the semiconductor chips of the respective semiconductor devices, then one electrode is provided. It is possible to input signals to a plurality of vertical semiconductor devices simply by inputting signals to the electrode terminals of, and thus it is possible to reduce the number of electrode terminals connected to the substrate.

【0021】上述した配線の削減や電極端子数の削減に
よって、基板の配線の幅も従来よりも太くでき、配線の
多層化も抑えることができる。
By reducing the number of wirings and the number of electrode terminals as described above, the width of the wirings on the substrate can be made wider than before, and the number of wirings can be reduced.

【0022】隣接する垂直型半導体装置を折り曲げた連
接用電極素子で連結させることにより、個々の半導体装
置は実装の際にも倒れ難くなる。
By connecting the adjacent vertical type semiconductor devices with the bent connecting electrode elements, the individual semiconductor devices are less likely to fall down during mounting.

【0023】[0023]

【発明の実施の形態】次に、本発明の実施の形態につい
て図面を参照して説明する。図1は本発明の第1の実施
の形態の半導体モジュールの模式的平面図であり(a)
は外観の模式的平面図、(b)は(a)の封止樹脂内部
の構造を示す断面図である。図中符号11は垂直型半導
体装置、12は半導体チップ、13は通常の電極端子、
15は本体側面の連接用電極端子、15aは複数の半導
体装置を貫通する本体側面の連接用電極端子、17はA
uワイヤ、18は樹脂封止部を示す。
Next, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a schematic plan view of a semiconductor module according to a first embodiment of the present invention (a).
Is a schematic plan view of the appearance, and (b) is a cross-sectional view showing the internal structure of the sealing resin in (a). In the figure, reference numeral 11 is a vertical semiconductor device, 12 is a semiconductor chip, 13 is a normal electrode terminal,
Reference numeral 15 is a connecting electrode terminal on the side surface of the main body, 15a is a connecting electrode terminal on the side surface of the main body that penetrates a plurality of semiconductor devices, and 17 is A
u wire, 18 shows a resin sealing part.

【0024】図1に示すごとく、半導体装置11と基板
とを接続する通常の電極端子13の他に半導体装置本体
側面に半導体装置11間を直接連結する連接用電極端子
15が設けられ、その一部の連接用電極端子15aは複
数の半導体装置を貫通している。
As shown in FIG. 1, in addition to the normal electrode terminals 13 for connecting the semiconductor device 11 and the substrate, connection electrode terminals 15 for directly connecting the semiconductor devices 11 are provided on the side surface of the semiconductor device body. The connecting electrode terminal 15a of the part penetrates a plurality of semiconductor devices.

【0025】樹脂封止部18の内部では、電極端子13
および本体側面の連接用電極端子15の一端ならびに半
導体装置を貫通する本体側面の連接用電極端子15aの
所定部分が半導体チップ12の所定の電極とAuワイヤ
17で接続され電気的に導通している。
Inside the resin sealing portion 18, the electrode terminal 13
Also, one end of the connecting electrode terminal 15 on the side surface of the main body and a predetermined portion of the connecting electrode terminal 15a on the side surface of the main body penetrating the semiconductor device are connected to a predetermined electrode of the semiconductor chip 12 by the Au wire 17 and electrically connected. .

【0026】図2は本発明の第1の実施の形態を適用し
たLOC構造の半導体装置の封止樹脂内部の構造を示す
断面図である。図中符号21は垂直型半導体装置、22
は半導体チップ、23は通常の電極端子、25は本体側
面の連接用電極端子、25aは複数の半導体装置を貫通
する本体側面の連接用電極端子、27はAuワイヤ、2
8は樹脂封止部を示す。図2は本発明の実施の形態をL
OC(Lead−On−Chip)構造の半導体装置に
適用した形態で、このように本発明は現在一般に広く採
用されているパッケージ構造に採用可能である。
FIG. 2 is a sectional view showing the internal structure of the encapsulating resin of the semiconductor device having the LOC structure to which the first embodiment of the present invention is applied. Reference numeral 21 in the drawing is a vertical semiconductor device, 22
Is a semiconductor chip, 23 is a normal electrode terminal, 25 is a connecting electrode terminal on the side of the main body, 25a is an connecting electrode terminal on the side of the main body that penetrates a plurality of semiconductor devices, 27 is an Au wire, 2
Reference numeral 8 indicates a resin sealing portion. FIG. 2 shows an embodiment of the present invention L
The present invention is applicable to a semiconductor device having an OC (Lead-On-Chip) structure, and thus the present invention can be applied to a package structure that is widely adopted at present.

【0027】このように従来は基板を介して行なってい
た隣接する垂直型半導体装置同士の導通を本体側面に設
けた連接用電極端子15、25および15a、25aで
直接行なえるために基板内の配線を削減できる。
As described above, since the connection between the adjacent vertical type semiconductor devices, which is conventionally performed through the substrate, can be directly performed by the connecting electrode terminals 15, 25 and 15a, 25a provided on the side surface of the main body, the inside of the substrate is electrically connected. Wiring can be reduced.

【0028】また、上述の従来例のZIPやTABテー
プでの連結では不可能であった隣接しない半導体との連
結が、複数の垂直型半導体装置の中を貫通する本体側面
の連接用電極端子15a、25aによって可能となる。
Further, the connection with the non-adjacent semiconductors, which is not possible by the conventional connection using the ZIP or the TAB tape described above, is connected to the electrode terminals 15a on the side surface of the main body penetrating through the plurality of vertical semiconductor devices. , 25a.

【0029】さらに複数の垂直型半導体装置の中を通過
する本体側面の連接用電極端子15a、25aの1本を
各半導体装置の半導体チップ12、22の共通の目的の
電極と電気的に導通させていけば、一本の電極端子に信
号を入力するだけで複数の垂直型半導体装置に信号を入
力することができ、これによって基板に接続する電極端
子を削減できる。
Further, one of the connecting electrode terminals 15a and 25a on the side surface of the main body which passes through the plurality of vertical semiconductor devices is electrically connected to a common target electrode of the semiconductor chips 12 and 22 of each semiconductor device. By doing so, it is possible to input signals to a plurality of vertical semiconductor devices simply by inputting the signals to one electrode terminal, which can reduce the number of electrode terminals connected to the substrate.

【0030】上述した配線の削減や電極端子数の削減に
よって、基板の配線の幅も従来よりも太くでき、配線の
多層化も抑えることができる。
By reducing the number of wirings and the number of electrode terminals described above, the width of the wirings on the substrate can be made thicker than before, and the multilayering of wirings can be suppressed.

【0031】次に本発明の第1の実施の形態の実装方法
を説明する。図3は実装した半導体モジュールの模式的
上面図であり、(a)は第1の配置例、(b)は第2の
配置例を示す。図中31は垂直型半導体装置、35は本
体側面の連接用電極端子を示す。図3のように本体側面
の連接用電極端子35を折り曲げることにより、様々な
レイアウトが可能である。
Next, a mounting method according to the first embodiment of the present invention will be described. FIG. 3 is a schematic top view of the mounted semiconductor module, where (a) shows a first arrangement example and (b) shows a second arrangement example. In the figure, 31 is a vertical semiconductor device, and 35 is a connecting electrode terminal on the side surface of the main body. By bending the connecting electrode terminals 35 on the side surface of the main body as shown in FIG. 3, various layouts are possible.

【0032】このように隣接する垂直型半導体装置31
を連結させることにより、個々の半導体装置は倒れ難く
なり、実装の際に半導体装置が倒れることによるトラブ
ルを減少できる。このことは実装時の垂直型半導体装置
の安定性の向上を意味している。
The vertical type semiconductor devices 31 adjacent to each other in this manner
By connecting the above, it becomes difficult for the individual semiconductor devices to collapse, and troubles due to the semiconductor devices falling during mounting can be reduced. This means improvement in stability of the vertical semiconductor device during mounting.

【0033】また、複数の垂直型半導体装置を一つの半
導体モジュールとして一括して実装できるため、実装工
数の削減という効果もある。
Further, since a plurality of vertical semiconductor devices can be collectively mounted as one semiconductor module, there is an effect of reducing the number of mounting steps.

【0034】本発明の第2の実施の形態について図4を
参照して説明する。図4は本発明の第2の実施の形態の
半導体モジュールの模式的正面図であり、図中41は垂
直型半導体装置、43は通常の電極端子、45は本体側
面の連接用電極端子、45bは本体側面の連接用電極端
子45の切断部を示す。図4に示すように本体側面の電
極端子45を選択的に切断することにより、半導体モジ
ュールの機能を実装直前に変更させることが可能であ
る。
A second embodiment of the present invention will be described with reference to FIG. FIG. 4 is a schematic front view of a semiconductor module according to a second embodiment of the present invention, in which 41 is a vertical semiconductor device, 43 is a normal electrode terminal, 45 is a connecting electrode terminal on the side surface of the main body, and 45b. Indicates a cut portion of the connecting electrode terminal 45 on the side surface of the main body. By selectively cutting the electrode terminals 45 on the side surface of the main body as shown in FIG. 4, the function of the semiconductor module can be changed immediately before mounting.

【0035】次に、本発明の半導体モジュールの製造方
法の概略について図5を参照して説明する。図5はリー
ドフレームから切り離す前の半導体モジュールの模式的
正面図であり、図中符号51は垂直型半導体装置、53
は通常の電極端子、55は本体側面の連接用電極端子、
55bは本体側面の連接用電極端子55の切断部、56
はリードフレームを示す。
Next, an outline of the method of manufacturing the semiconductor module of the present invention will be described with reference to FIG. FIG. 5 is a schematic front view of the semiconductor module before being separated from the lead frame, in which reference numeral 51 denotes a vertical semiconductor device, and 53.
Is a normal electrode terminal, 55 is an electrode terminal for connection on the side surface of the main body,
55b is a cut portion of the connecting electrode terminal 55 on the side surface of the main body, 56
Indicates a lead frame.

【0036】図5に示すように全ての本体側面の連接用
電極端子55が接続された状態で、リードフレーム56
上に複数の垂直型半導体装置51が直列に連続して形成
される。次のアッセンブリ工程で基板に実装される半導
体装置51の下面の電極端子53が、実装時に基板に垂
直に保持可能なように図3のように本体側面の連接用電
極端子55を折り曲げて、リードフレーム56から切り
離されて完成する。この時点で本体側面の連接用電極端
子55を図の点線で示すような切断部55bで切断して
機能を変更することもできるが、実装直前にレーザー等
で連接用電極端子55の一部を切断して機能を変更する
ことも可能である。
As shown in FIG. 5, with all the connecting electrode terminals 55 on the side surfaces of the main body connected, a lead frame 56 is formed.
A plurality of vertical semiconductor devices 51 are continuously formed in series on the top. In order to allow the electrode terminals 53 on the lower surface of the semiconductor device 51 to be mounted on the substrate in the next assembly step to be held perpendicularly to the substrate during mounting, the connecting electrode terminals 55 on the side surface of the main body are bent as shown in FIG. Completed after being separated from the frame 56. At this point, the connecting electrode terminal 55 on the side surface of the main body can be cut at the cutting portion 55b as shown by the dotted line in the figure to change the function, but a part of the connecting electrode terminal 55 can be cut by a laser or the like immediately before mounting. It is also possible to disconnect and change the function.

【0037】以上説明した実施の形態においては、図1
のように本体側面の連接用電極端子15は半導体モジュ
ールを実装する基板と電気的な接合が取れない構造とな
っているが、必要であれば複数の半導体装置が連結され
た半導体モジュールの一方の端部にある本体側面の連接
用電極端子15を基板に実装する側へ導出すれば、基板
との電気的な直接の導通が可能となり、最小限の電極端
子数で複数の電極端子への信号の入出力が可能となる。
In the embodiment described above, FIG.
As described above, the connecting electrode terminal 15 on the side surface of the main body has a structure in which electrical connection with the substrate on which the semiconductor module is mounted cannot be obtained. However, if necessary, one of the semiconductor modules to which a plurality of semiconductor devices are connected is connected. If the connecting electrode terminals 15 on the side surface of the main body at the end are led out to the side where they are mounted on the board, electrical direct conduction with the board becomes possible, and signals to a plurality of electrode terminals can be obtained with a minimum number of electrode terminals. Input / output of is possible.

【0038】また、図1のように本体側面の連接用電極
端子15は、半導体装置を貫通している連接用電極端子
15aを除いては隣接した半導体装置11の半導体チッ
プ12の対向位置の電極パッドに対応しているため、接
続の関係から電極パッドの配置に制約を生ずる。例えば
図1(a)において隣接した半導体チップ12の左側の
右辺と右側の左辺の対象位置にある電極パッドを共通の
電極端子15で接続するため、電気的に共通な電極パッ
ドを隣接する半導体チップ12の左辺と右辺に設ける必
要がある。このような制約は従来の公知例として示した
図13および図15の場合も同様である。
Further, as shown in FIG. 1, the connecting electrode terminals 15 on the side surface of the main body are electrodes at positions opposite to the semiconductor chip 12 of the adjacent semiconductor device 11 except the connecting electrode terminal 15a penetrating the semiconductor device. Since it corresponds to a pad, the arrangement of the electrode pad is restricted due to the connection relationship. For example, in FIG. 1A, since the electrode pads at the target positions on the right side on the left side and the left side on the right side of the adjacent semiconductor chips 12 are connected by the common electrode terminal 15, the electrically common electrode pads are adjacent to each other. 12 must be provided on the left and right sides. Such restrictions also apply to the cases shown in FIGS. 13 and 15 which are known examples of the related art.

【0039】この制約を無くする方法を図6を参照して
説明する。図6は本発明の半導体モジュールのオーバー
リードボンディングを行なう場合の半導体モジュールの
模式的正面断面図である。図中符号61は垂直型半導体
装置、62は半導体チップ、62aは電極パッド、63
は通常の電極端子、65aは複数の半導体装置を貫通す
る本体側面の連接用電極端子、67はAuワイヤを示
す。
A method of eliminating this restriction will be described with reference to FIG. FIG. 6 is a schematic front cross-sectional view of a semiconductor module when over-bonding the semiconductor module of the present invention. In the figure, reference numeral 61 is a vertical semiconductor device, 62 is a semiconductor chip, 62a is an electrode pad, and 63.
Is a normal electrode terminal, 65a is an electrode terminal for connection on the side surface of the main body that penetrates a plurality of semiconductor devices, and 67 is an Au wire.

【0040】図6に示したのは、複数の半導体装置を貫
通する本体側面の連接用電極端子65aを2本以上に増
加し、他の電極端子のリードをまたいでAuワイヤ67
で電極パッド62aとリードとを結線するオーバーリー
ドボンディングを行なう方法である。ただし、この場合
には電極端子65aの端子数増加に対し、端子エリアの
制約とオーバーリードボンディングのワイヤ長やリード
とのショートの制約から、増加できる端子数に制限があ
る。
FIG. 6 shows that the number of connecting electrode terminals 65a on the side surface of the main body penetrating a plurality of semiconductor devices is increased to two or more, and the Au wire 67 straddles the leads of other electrode terminals.
Is a method of performing over-lead bonding for connecting the electrode pad 62a and the lead. However, in this case, the number of terminals that can be increased is limited due to the restriction of the terminal area, the wire length of over-lead bonding, and the short circuit with the lead, as the number of the electrode terminals 65a increases.

【0041】図7は本発明の半導体モジュールの電極端
子が半導体チップの裏面を通過する場合の模式的正面断
面図である。図中符号71は垂直型半導体装置、72は
半導体チップ、72aは電極パッド、73は通常の電極
端子、75aは複数の半導体装置を貫通する本体側面の
連接用電極端子、77はAuワイヤを示す。図7に示す
ように半導体装置71を貫通する連接用電極端子75a
を半導体チップ72の裏面に配置すれば、図6と同様に
半導体チップの右辺と左辺の電極パッド72aの配置に
制限無く共通の電極端子に接続できるとともに、オーバ
ーリードボンディングの必要もなくなり、さらに端子エ
リアの制約も解決できる。
FIG. 7 is a schematic front cross-sectional view when the electrode terminals of the semiconductor module of the present invention pass through the back surface of the semiconductor chip. In the figure, reference numeral 71 is a vertical semiconductor device, 72 is a semiconductor chip, 72a is an electrode pad, 73 is a normal electrode terminal, 75a is an electrode terminal for connection on the side surface of the main body penetrating a plurality of semiconductor devices, and 77 is an Au wire. . As shown in FIG. 7, a connecting electrode terminal 75a penetrating the semiconductor device 71.
Is disposed on the back surface of the semiconductor chip 72, the electrode pads 72a on the right side and the left side of the semiconductor chip can be connected to a common electrode terminal without limitation as in the case of FIG. Area restrictions can also be resolved.

【0042】電極端子75a上への半導体チップ72の
搭載は、絶縁フィルムを電極端子75aの半導体チップ
72aの搭載面に貼り付け、従来の半導体チップ搭載部
の代用として使用するか、フィルム上の接着剤を介して
半導体チップ72を搭載する方法等によって容易に実施
できる。
To mount the semiconductor chip 72 on the electrode terminal 75a, an insulating film is attached to the mounting surface of the semiconductor chip 72a of the electrode terminal 75a and used as a substitute for the conventional semiconductor chip mounting portion, or it is adhered on the film. This can be easily carried out by a method of mounting the semiconductor chip 72 via an agent or the like.

【0043】図8は本発明の半導体モジュールの電極端
子が半導体チップの表面を通過する場合の模式的正面断
面図である。図中符号81は垂直型半導体装置、82は
半導体チップ、82aは電極パッド、83は通常の電極
端子、85aは複数の半導体装置を貫通する本体側面の
連接用電極端子、87はAuワイヤを示す。図8に示す
ように半導体装置81を貫通する連接用電極端子85a
を半導体チップ82の表面に配置しても、図7と同様に
半導体チップの右辺と左辺の電極パッド82aの配置に
制限無く共通の電極端子に接続できるとともに、オーバ
ーリードボンディングの必要もなくなり、さらに端子エ
リアの制約も解決できる。通常このようにリードが半導
体チップ上に位置する構造をLOC(Lead On−
Chip)構造という。
FIG. 8 is a schematic front sectional view when the electrode terminals of the semiconductor module of the present invention pass through the surface of the semiconductor chip. In the figure, reference numeral 81 is a vertical semiconductor device, 82 is a semiconductor chip, 82a is an electrode pad, 83 is a normal electrode terminal, 85a is a connecting electrode terminal on the side surface of the main body penetrating a plurality of semiconductor devices, and 87 is an Au wire. . As shown in FIG. 8, a connecting electrode terminal 85a penetrating the semiconductor device 81.
7 is arranged on the surface of the semiconductor chip 82, the electrode pads 82a on the right and left sides of the semiconductor chip can be connected to a common electrode terminal without limitation as in FIG. 7, and the need for over-lead bonding is eliminated. The terminal area restrictions can also be solved. Normally, the structure in which the leads are located on the semiconductor chip is LOC (Lead On-).
Chip) structure.

【0044】これまでの実施の形態は、垂直型半導体装
置の装置間の電極端子による直接の連結による半導体モ
ジュールついて説明してきたが、次に第3の実施の形態
として表面実装型半導体装置における装置間の電極端子
による直接の連結による半導体モジュールについて説明
する。
Although the above-described embodiments have been described with respect to the semiconductor module in which the vertical semiconductor devices are directly connected to each other by the electrode terminals, a semiconductor device in a surface-mounted semiconductor device will be described as a third embodiment. A semiconductor module will be described which is directly connected by an electrode terminal between them.

【0045】図9は本発明のSOP半導体モジュールの
外形図で、(a)は模式的平面図、(b)は(a)の模
式的断面図、(c)は模式的側面図である。図中符号9
2は半導体チップ、92aは電極パッド、93は基板接
続用の電極端子、95aは複数の半導体装置を貫通連結
する連接用電極端子、97はAuワイヤ、99はSOP
半導体装置を示す。
9A and 9B are outline views of the SOP semiconductor module of the present invention. FIG. 9A is a schematic plan view, FIG. 9B is a schematic sectional view of FIG. 9A, and FIG. 9C is a schematic side view. Reference numeral 9 in the figure
2 is a semiconductor chip, 92a is an electrode pad, 93 is an electrode terminal for substrate connection, 95a is an electrode terminal for connection for penetrating and connecting a plurality of semiconductor devices, 97 is an Au wire, 99 is an SOP.
3 illustrates a semiconductor device.

【0046】図9に示す相対する2辺から電極端子が導
出されているSOP(SmallOutline Pa
ckage)半導体装置99は、複数の半導体装置を貫
通連結する連接用電極端子95aと通常の電極端子93
を有し、複数の半導体装置を貫通連結する連接用電極端
子95aの上に絶縁フイルム等を介して半導体チップ9
2が搭載され、電極端子93および複数の半導体を貫通
連結する連接用電極端子95aが半導体チップ92の所
定の電極パッド92aとAuワイヤ97で接続されてい
る。複数の半導体装置を貫通連結する連接用電極端子9
5aは、複数の半導体装置99が連結されている半導体
モジュールの最端辺において、実装時に基板との接続可
能な形状に電極端子が切断成形されている。
SOP (SmallOutline Pa) in which electrode terminals are derived from two opposite sides shown in FIG.
The semiconductor device 99 includes a connecting electrode terminal 95a for penetrating and connecting a plurality of semiconductor devices and a normal electrode terminal 93.
And the semiconductor chip 9 on the connecting electrode terminal 95a for penetrating and connecting a plurality of semiconductor devices via an insulating film or the like.
2 is mounted, and an electrode terminal 93 and a connecting electrode terminal 95a for penetrating and connecting a plurality of semiconductors are connected to a predetermined electrode pad 92a of the semiconductor chip 92 by an Au wire 97. Connecting electrode terminal 9 for penetrating and connecting a plurality of semiconductor devices
In 5a, the electrode terminals are cut and formed in a shape that can be connected to the substrate at the time of mounting on the outermost side of the semiconductor module to which the plurality of semiconductor devices 99 are connected.

【0047】図10と図11は、本発明の他の形状のS
OP半導体モジュールの模式的側面図であり、図中10
3、113は通常の電極端子、105a、115aは複
数の半導体装置を貫通連結する連接用電極端子、10
9、119はSOP半導体装置を示す。複数の半導体装
置を貫通連結する連接用電極端子95a、105a、1
15aは半導体装置99、109、119の共通端子で
あるから少なくとも1ヶ所で基板と接続されていれば十
分であり、図9のような最端辺でなくとも図10や図1
1に示すように半導体装置間の連結部を含む任意の位置
で実装時に基板と接続可能な電極端子成形を実施するこ
とができる。通常の電極端子93、103、113は、
従来と同様に各電極端子毎に切断成形が実施される。
FIG. 10 and FIG. 11 show S of another shape of the present invention.
FIG. 10 is a schematic side view of an OP semiconductor module, which is shown in FIG.
3, 113 are normal electrode terminals, 105a, 115a are connecting electrode terminals for penetrating and connecting a plurality of semiconductor devices, 10
Reference numerals 9 and 119 denote SOP semiconductor devices. Connecting electrode terminals 95a, 105a, 1 for penetrating and connecting a plurality of semiconductor devices
Since 15a is a common terminal of the semiconductor devices 99, 109, and 119, it is sufficient if it is connected to the substrate at least at one place, and it is not necessary to connect to the substrate as shown in FIG.
As shown in FIG. 1, electrode terminals that can be connected to the substrate at the time of mounting can be formed at any position including the connecting portion between the semiconductor devices. The normal electrode terminals 93, 103, 113 are
Cut molding is performed for each electrode terminal as in the conventional case.

【0048】なお、複数の半導体装置を貫通連結する連
接用電極端子95a、105a、115aの数には特に
制約はないが、数が多い場合は半導体モジュールを基板
に実装させた時の接続強度と接続安定性を向上させるた
めに1ヶ所で基板と接続させるのではなく図11のよう
に任意の複数箇所で基板を接続させることも可能であ
る。
The number of connecting electrode terminals 95a, 105a, 115a for penetrating and connecting a plurality of semiconductor devices is not particularly limited, but in the case of a large number, the connection strength when the semiconductor module is mounted on the substrate is In order to improve the connection stability, it is possible to connect the substrate at any desired plural places as shown in FIG. 11, instead of connecting the substrate at one place.

【0049】このような構造のS0P半導体モジュール
は、上述の垂直型半導体モジュールと同様に、基板に接
続する電極端子数の削減効果を有するとともに、半導体
チップの電極パッド配置の制約もなく、2ヶ以上の半導
体装置を連結することができるという効果を有する。
The S0P semiconductor module having such a structure has the effect of reducing the number of electrode terminals connected to the substrate, as well as the above-mentioned vertical semiconductor module, and there is no restriction on the electrode pad arrangement of the semiconductor chip. It has an effect that the above semiconductor devices can be connected.

【0050】さらに、図12に示すように半導体装置の
4辺から電極端子が導出している表面実装型半導体装置
であるQFP(Quad Flat Package)
についても同様に実施することができる。図12は本発
明のQFP半導体モジュールの模式的断面図である。図
中符号122は半導体チップ、122aは電極パッド、
123は通常の電極端子、125aは複数の半導体装置
を貫通連結する連接用電極端子、127はAuワイヤ、
129はQFP半導体装置を示す。ただし、この場合は
共通電極端子として使用できる複数の半導体装置を貫通
連結する連接用電極端子125aは、相対する2辺に限
定され、他の2辺は従来形状の電極端子123のみとな
る。
Further, as shown in FIG. 12, a QFP (Quad Flat Package) which is a surface mount type semiconductor device in which electrode terminals are led out from four sides of the semiconductor device.
Can be similarly implemented. FIG. 12 is a schematic sectional view of the QFP semiconductor module of the present invention. In the figure, reference numeral 122 is a semiconductor chip, 122a is an electrode pad,
123 is a normal electrode terminal, 125a is a connecting electrode terminal for penetrating and connecting a plurality of semiconductor devices, 127 is an Au wire,
Reference numeral 129 indicates a QFP semiconductor device. However, in this case, the connecting electrode terminals 125a for penetrating and connecting a plurality of semiconductor devices that can be used as the common electrode terminals are limited to two opposing sides, and the other two sides are only the electrode terminals 123 of the conventional shape.

【0051】なお、図9、図12の実施の形態では複数
の半導体装置を貫通連結する電極端子の上に半導体チッ
プを搭載する構造としたが、図8で説明したLOC構造
も同様に実施可能である。
In the embodiments shown in FIGS. 9 and 12, the semiconductor chip is mounted on the electrode terminals that connect a plurality of semiconductor devices through, but the LOC structure described with reference to FIG. 8 can be similarly implemented. Is.

【0052】[0052]

【発明の効果】以上説明したように本発明の半導体モジ
ュールは、複数の半導体装置同士を直接連結して電気的
に接続する連接用電極端子を設けることによって、基板
内の配線を削減し、基板に接続する電極端子数を削減す
ることができるので、基板内の配線の微細化と多層化を
抑え、基板のコストアップを防ぐという効果がある。
As described above, in the semiconductor module of the present invention, by providing the connecting electrode terminals for directly connecting and electrically connecting a plurality of semiconductor devices, the wiring in the substrate can be reduced, Since it is possible to reduce the number of electrode terminals connected to the substrate, it is possible to suppress the miniaturization and multilayering of the wiring in the substrate and prevent the cost of the substrate from increasing.

【0053】また、隣接する半導体装置を連結すること
によって、複数の垂直半導体装置を一括して実装可能と
するので、実装工数の削減という効果も得られる。
Moreover, since a plurality of vertical semiconductor devices can be collectively mounted by connecting adjacent semiconductor devices, the effect of reducing the number of mounting steps can be obtained.

【0054】本体側面の連接用電極端子を折り曲げて様
々なレイアウトを行なうことにより個々の半導体装置は
倒れ難くなり、実装の際に半導体装置が倒れることによ
るトラブルを減少でき安定性が向上する。
By bending the connecting electrode terminals on the side surface of the main body to perform various layouts, it becomes difficult for the individual semiconductor devices to collapse, and troubles due to the semiconductor devices falling during mounting can be reduced and stability can be improved.

【0055】さらに、従来例のTABテープによる連結
では不可能であった実装直前の機能の変更も、連結して
いる本体側面の連接用電極端子を切断することにより可
能である。
Furthermore, a change in the function immediately before mounting, which was not possible with the connection using the TAB tape of the conventional example, can be performed by cutting the connecting electrode terminal on the side surface of the connected main body.

【0056】本発明により、基板に実装する部品数にも
よるが基板のコストが約5〜10%程度抑制できた。
According to the present invention, the cost of the board can be suppressed by about 5 to 10% depending on the number of parts mounted on the board.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1の実施の形態の半導体モジュール
の模式的平面図である。(a)は外観の模式的平面図で
ある。(b)は(a)の封止樹脂内部の構造を示す断面
図である。
FIG. 1 is a schematic plan view of a semiconductor module according to a first embodiment of the present invention. (A) is a schematic plan view of an external appearance. (B) is sectional drawing which shows the structure inside the sealing resin of (a).

【図2】本発明の第1の実施の形態を適用したLOC構
造の半導体装置の封止樹脂内部の構造を示す断面図であ
る。
FIG. 2 is a cross-sectional view showing a structure inside a sealing resin of a semiconductor device having a LOC structure to which the first embodiment of the present invention is applied.

【図3】実装した半導体モジュールの模式的上面図であ
る。(a)は第1の配置例を示す。(b)は第2の配置
例を示す。
FIG. 3 is a schematic top view of a mounted semiconductor module. (A) shows the 1st example of arrangement. (B) shows a second arrangement example.

【図4】本発明の第2の実施の形態の半導体モジュール
の模式的正面図である。
FIG. 4 is a schematic front view of a semiconductor module according to a second embodiment of the present invention.

【図5】リードフレームから切り離す前の半導体モジュ
ールの模式的正面図である。
FIG. 5 is a schematic front view of the semiconductor module before being separated from the lead frame.

【図6】本発明の半導体モジュールのオーバーリードボ
ンディングを行なう場合の半導体モジュールの模式的正
面断面図である。
FIG. 6 is a schematic front cross-sectional view of a semiconductor module when performing over-lead bonding on the semiconductor module of the present invention.

【図7】本発明の半導体モジュールの電極端子が半導体
チップの裏面を通過する場合の模式的正面断面図であ
る。
FIG. 7 is a schematic front cross-sectional view when the electrode terminals of the semiconductor module of the present invention pass through the back surface of the semiconductor chip.

【図8】本発明の半導体モジュールの電極端子が半導体
チップの表面を通過する場合の模式的正面断面図であ
る。
FIG. 8 is a schematic front cross-sectional view when the electrode terminals of the semiconductor module of the present invention pass through the surface of the semiconductor chip.

【図9】本発明のSOP半導体モジュールの外形図であ
る。(a)は模式的平面図である。(b)は(a)の模
式的断面図である。(c)は模式的側面図である。
FIG. 9 is an outline view of the SOP semiconductor module of the present invention. (A) is a schematic plan view. (B) is a typical sectional view of (a). (C) is a typical side view.

【図10】本発明の他の形状のSOP半導体モジュール
の模式的側面図である。
FIG. 10 is a schematic side view of an SOP semiconductor module having another shape according to the present invention.

【図11】本発明の他の形状のSOP半導体モジュール
の模式的側面図である。
FIG. 11 is a schematic side view of an SOP semiconductor module having another shape according to the present invention.

【図12】本発明のQFP半導体モジュールの模式的断
面図である。
FIG. 12 is a schematic cross-sectional view of a QFP semiconductor module of the present invention.

【図13】従来例の電極端子同士を連結した半導体装置
の模式的側面図である。
FIG. 13 is a schematic side view of a semiconductor device in which electrode terminals of a conventional example are connected to each other.

【図14】従来例のリードフレームから切り離し前の垂
直型半導体装置の模式的平面図である。
FIG. 14 is a schematic plan view of a vertical semiconductor device before being separated from a lead frame of a conventional example.

【図15】従来例のTABリードを用いて3個の半導体
装置の電極パッドを直接連結した半導体モジュールの模
式的平面図である。
FIG. 15 is a schematic plan view of a semiconductor module in which electrode pads of three semiconductor devices are directly connected using TAB leads of a conventional example.

【符号の説明】[Explanation of symbols]

11、31、41、51、61、71、81、131、
141 垂直型半導体装置 12、22、62、72、82、92、122 半導
体チップ 13、23、43、53、63、73、83、93、1
23、133 電極端子 15、25、35、45、55 本体側面の連接用電
極端子 15a、25a、65a、75a、85a、95a、1
25a 複数の半導体装置を貫通する本体側面の連接
用電極端子 17、27、67、77、87、97、127 Au
ワイヤ 18、28 樹脂封止部 45b、55b 本体側面の連接用電極端子の切断部 56、146 リードフレーム 62a、72a、82a、92a、122a 電極パ
ッド 99、109、119 SOP半導体装置 129 QFP半導体装置 133a 平坦部 134、144 連結した電極端子 134a 平坦部 144b 切断部 152a 外部電極 154 タブリード 159 半導体装置
11, 31, 41, 51, 61, 71, 81, 131,
141 vertical type semiconductor device 12, 22, 62, 72, 82, 92, 122 semiconductor chip 13, 23, 43, 53, 63, 73, 83, 93, 1
23, 133 electrode terminals 15, 25, 35, 45, 55 connecting electrode terminals 15a, 25a, 65a, 75a, 85a, 95a, 1 on the side surface of the main body
25a Connection electrode terminals 17, 27, 67, 77, 87, 97, 127 Au on the side surface of the main body penetrating a plurality of semiconductor devices
Wires 18, 28 Resin sealing parts 45b, 55b Cutting parts of connecting electrode terminals on the side surface of the main body 56, 146 Lead frames 62a, 72a, 82a, 92a, 122a Electrode pads 99, 109, 119 SOP semiconductor device 129 QFP semiconductor device 133a Flat part 134, 144 Connected electrode terminals 134a Flat part 144b Cutting part 152a External electrode 154 Tab lead 159 Semiconductor device

Claims (9)

【特許請求の範囲】[Claims] 【請求項1】 複数の半導体装置が物理的および電気的
に相互に接続され、一体に形成された半導体モジュール
において、 それぞれの前記半導体素子は基板接続用の電極端子およ
び隣接の半導体装置と直接接続するための連接用電極端
子を有し、複数の前記半導体装置が、前記連接用電極端
子で直列に一体に連結されていることを特徴とする半導
体モジュール。
1. In a semiconductor module in which a plurality of semiconductor devices are physically and electrically connected to each other and integrally formed, each semiconductor element is directly connected to an electrode terminal for substrate connection and an adjacent semiconductor device. A semiconductor module having a connecting electrode terminal for connecting the plurality of semiconductor devices, wherein the plurality of semiconductor devices are integrally connected in series at the connecting electrode terminal.
【請求項2】 請求項1記載の半導体モジュールにおい
て、 前記連接用電極端子の少なくとも1本は、少なくとも1
個の半導体装置を接続可能に貫通横断して、該半導体装
置に隣接する半導体装置と接続されていることを特徴と
する半導体モジュール。
2. The semiconductor module according to claim 1, wherein at least one of the connecting electrode terminals is at least 1.
A semiconductor module, characterized in that the semiconductor module is connected to a semiconductor device adjacent to the semiconductor device so as to traverse through the semiconductor device in a connectable manner.
【請求項3】 請求項2記載の半導体モジュールにおい
て、 少なくとも1本の半導体装置を貫通横断する前記連接用
電極端子が、複数の前記半導体装置のそれぞれに内蔵さ
れた半導体チップの機能の共通する電極パッドに、共通
に接続されていることを特徴とする半導体モジュール。
3. The semiconductor module according to claim 2, wherein the connecting electrode terminal that penetrates and traverses at least one semiconductor device has an electrode having a function of a semiconductor chip incorporated in each of the plurality of semiconductor devices. A semiconductor module, which is commonly connected to a pad.
【請求項4】 請求項2または3に記載の半導体モジュ
ールにおいて、 半導体装置を貫通横断する前記連接用電極端子が、前記
半導体装置に内蔵される半導体チップの表裏何れかの面
上を横断することを特徴とする半導体モジュール。
4. The semiconductor module according to claim 2, wherein the connecting electrode terminal penetrating and traversing the semiconductor device traverses either one of the front and back surfaces of a semiconductor chip built in the semiconductor device. A semiconductor module characterized by.
【請求項5】 請求項1から請求項4のいずれか1項に
記載の半導体モジュールにおいて、 半導体モジュールを構成する前記半導体装置が垂直型半
導体装置であり、基板接続用の前記電極端子を有する側
面に直交する2つの側面に、前記連接用電極端子が配設
されていることを特徴とする半導体モジュール。
5. The semiconductor module according to claim 1, wherein the semiconductor device forming the semiconductor module is a vertical semiconductor device, and a side surface having the electrode terminal for substrate connection. 2. The semiconductor module, wherein the connecting electrode terminals are provided on two side surfaces orthogonal to each other.
【請求項6】 請求項5記載の半導体モジュールにおい
て、 前記連接用電極端子が、連接する2つの半導体装置の間
で所定の角度で折り曲げられていることを特徴とする半
導体モジュール。
6. The semiconductor module according to claim 5, wherein the connecting electrode terminal is bent at a predetermined angle between two connected semiconductor devices.
【請求項7】 請求項5または請求項6に記載の半導体
モジュールにおいて、 半導体モジュールの最端部の前記連接用電極端子の先端
が、半導体モジュールの基板への実装時に、基板の配線
と接続可能な位置に導出されていることを特徴とする半
導体モジュール。
7. The semiconductor module according to claim 5, wherein the tip of the connecting electrode terminal at the end of the semiconductor module can be connected to the wiring of the board when the semiconductor module is mounted on the board. The semiconductor module is characterized in that it is led to various positions.
【請求項8】 請求項1から請求項4のいずれか1項に
記載の半導体モジュールにおいて、 半導体モジュールを構成する前記半導体装置が表面実装
型半導体装置であり、該半導体装置の平行する2つの側
面に前記連接用電極端子が配設されていることを特徴と
する半導体モジュール。
8. The semiconductor module according to claim 1, wherein the semiconductor device forming the semiconductor module is a surface mount semiconductor device, and two parallel side surfaces of the semiconductor device. A semiconductor module, wherein the connecting electrode terminal is provided in the.
【請求項9】 請求項8記載の半導体モジュールにおい
て、 前記連接用電極端子の所定の最端部および所定の半導体
装置連結部が、半導体モジュールの基板への実装時に、
基板の配線と接続可能な位置に導出されていることを特
徴とする半導体モジュール。
9. The semiconductor module according to claim 8, wherein the predetermined outermost end of the connecting electrode terminal and the predetermined semiconductor device connecting portion are mounted on a substrate of the semiconductor module.
A semiconductor module, which is led out to a position where it can be connected to the wiring of a substrate.
JP7230136A 1995-09-07 1995-09-07 Semiconductor module Expired - Lifetime JP2897696B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7230136A JP2897696B2 (en) 1995-09-07 1995-09-07 Semiconductor module

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7230136A JP2897696B2 (en) 1995-09-07 1995-09-07 Semiconductor module

Publications (2)

Publication Number Publication Date
JPH0974167A true JPH0974167A (en) 1997-03-18
JP2897696B2 JP2897696B2 (en) 1999-05-31

Family

ID=16903151

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7230136A Expired - Lifetime JP2897696B2 (en) 1995-09-07 1995-09-07 Semiconductor module

Country Status (1)

Country Link
JP (1) JP2897696B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100287805B1 (en) * 1997-08-11 2001-04-16 다니구찌 이찌로오, 기타오카 다카시 Semiconductor component
KR100321088B1 (en) * 1997-10-09 2002-06-26 아끼구사 나오유끼 Semiconductor device and manufacturing method thereof
US6984882B2 (en) * 2002-06-21 2006-01-10 Renesas Technology Corp. Semiconductor device with reduced wiring paths between an array of semiconductor chip parts

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100287805B1 (en) * 1997-08-11 2001-04-16 다니구찌 이찌로오, 기타오카 다카시 Semiconductor component
KR100321088B1 (en) * 1997-10-09 2002-06-26 아끼구사 나오유끼 Semiconductor device and manufacturing method thereof
US6984882B2 (en) * 2002-06-21 2006-01-10 Renesas Technology Corp. Semiconductor device with reduced wiring paths between an array of semiconductor chip parts

Also Published As

Publication number Publication date
JP2897696B2 (en) 1999-05-31

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