JPH0959487A - Conductive resin paste - Google Patents

Conductive resin paste

Info

Publication number
JPH0959487A
JPH0959487A JP22127495A JP22127495A JPH0959487A JP H0959487 A JPH0959487 A JP H0959487A JP 22127495 A JP22127495 A JP 22127495A JP 22127495 A JP22127495 A JP 22127495A JP H0959487 A JPH0959487 A JP H0959487A
Authority
JP
Japan
Prior art keywords
conductive resin
resin paste
paste
weight
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22127495A
Other languages
Japanese (ja)
Inventor
Ryuichi Murayama
竜一 村山
Hikari Okubo
光 大久保
Shingo Ito
慎吾 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Bakelite Co Ltd
Original Assignee
Sumitomo Bakelite Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Bakelite Co Ltd filed Critical Sumitomo Bakelite Co Ltd
Priority to JP22127495A priority Critical patent/JPH0959487A/en
Publication of JPH0959487A publication Critical patent/JPH0959487A/en
Pending legal-status Critical Current

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  • Compositions Of Macromolecular Compounds (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Conductive Materials (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain a conductive resin paste which can be cured at 200 deg.C or lower within 30sec or shorter. SOLUTION: The paste comprises (A) silver particles, (B) an epoxy resin which is liquid at ordinary temp., (C) a compound having at least two cyanate groups per molecule and represented by the formula (wherein R1 is CH2 , CH(CH3 ), or C(CH3 )2 , R2 and R3 each is H of CH3 , and n is 0 or a positive integer), and (D) a metal complex as essential components. The amounts of the components (A), (B), and (C) are 60-85wt.%, 0.1-30wt.%, and 9-39wt.%, respectively, based on the whole paste.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はIC、LSI等の半導体
素子を金属フレーム等の基板に接着させる導電性樹脂ペ
ーストに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a conductive resin paste for adhering semiconductor elements such as IC and LSI to a substrate such as a metal frame.

【0002】[0002]

【従来の技術】半導体素子を金属フレームに接着させる
工程、いわゆるダイボンディング工程において、導電性
樹脂ペーストを用いる方法では半導体素子を金属フレー
ムにマウント後硬化する必要がある。従来は、オーブン
によるバッチ方式での硬化が主流であった。ところが近
年半導体素子を金属フレームにマウントするダイボンダ
ーの横に硬化炉を設置し、ダイボンディング、硬化、ワ
イヤーボンディングの工程を同一ライン上で連続して行
い、生産性の向上が図れるインライン方式が採用され、
今後さらに増加する傾向にある。このインライン方式
は、従来のバッチ方式に比べ硬化時間の制約があり、例
えば、硬化時間が従来のバッチ方式では150〜200
℃で、60〜120分であったが、インライン方式では
150〜200℃で15〜90秒でなければならない。
また近年銅フレームが採用になり、硬化時の温度による
フレーム表面の酸化が半導体製品の信頼性を著しく低下
させるため、より低温で硬化する導電性樹脂ペーストの
要求が高まってきた。これらに対応すべく、エポキシ樹
脂を用いる導電性樹脂ペーストでは硬化剤として短時間
で硬化するアミン系硬化剤を用いてきた。ところがアミ
ン系硬化剤を用いた導電性樹脂ペーストは180℃以下
の温度では良好な硬化物を得られず、高温での接着力が
劣り、より低温での硬化には対応でなかった。
2. Description of the Related Art In a process of bonding a semiconductor element to a metal frame, that is, in a so-called die bonding step, it is necessary to mount the semiconductor element on the metal frame and then harden it by a method using a conductive resin paste. Conventionally, curing in a batch system using an oven has been the mainstream. However, in recent years, a curing furnace has been installed next to the die bonder that mounts semiconductor elements on a metal frame, and the steps of die bonding, curing, and wire bonding are performed continuously on the same line, and an in-line method that improves productivity is adopted. ,
There is a tendency to increase further in the future. This in-line method has a limitation on the curing time as compared with the conventional batch method. For example, the curing time is 150 to 200 in the conventional batch method.
The temperature was 60 to 120 minutes at 0 ° C, but it should be 15 to 90 seconds at 150 to 200 ° C in the in-line method.
Further, in recent years, a copper frame has been adopted, and oxidation of the frame surface due to the temperature during curing significantly lowers the reliability of semiconductor products. Therefore, there is an increasing demand for a conductive resin paste that cures at a lower temperature. In order to cope with these problems, an amine-based curing agent that cures in a short time has been used as a curing agent in a conductive resin paste that uses an epoxy resin. However, a conductive resin paste using an amine-based curing agent cannot obtain a good cured product at a temperature of 180 ° C. or lower, has poor adhesive strength at high temperatures, and cannot be cured at lower temperatures.

【0003】[0003]

【発明が解決しようとする課題】本発明は、180℃以
下、60秒以内の条件で硬化性に優れた導電性樹脂ペー
ストを提供するものである。
DISCLOSURE OF THE INVENTION The present invention provides a conductive resin paste having excellent curability under the conditions of 180 ° C. or lower and 60 seconds or less.

【0004】[0004]

【課題を解決するための手段】本発明は、(A)銀粉、
(B)常温で液状のエポキシ樹脂、(C)式(1)に示
される1分子内に少なくとも2個以上のシアネート基を
有する化合物、及び(D)金属錯体を必須成分とする導
電性樹脂ペーストであって、全導電性樹脂ペースト中に
(A)成分を60〜85重量%、(B)成分を0.1〜
30重量%、(C)成分を9〜39重量%含む導電性樹
脂ペーストである。
The present invention provides (A) silver powder,
(B) Epoxy resin that is liquid at room temperature, (C) A compound having at least two cyanate groups in one molecule represented by formula (1), and (D) a conductive resin paste containing a metal complex as an essential component. In the total conductive resin paste, the component (A) is 60 to 85% by weight, and the component (B) is 0.1 to
It is a conductive resin paste containing 30% by weight and 9 to 39% by weight of the component (C).

【0005】[0005]

【化3】 Embedded image

【0006】本発明に用いる式(1)の1分子内に少な
くとも2個以上のシアネート基を有する化合物(以下、
シアネート化合物という)のシアネート基は、金属錯体
の存在下、加熱することにより容易に三量化反応が起こ
りトリアジン環を生成する。このトリアジン環の生成に
より、シアネート化合物は三次元構造、所謂網目構造を
とり硬化する。またこのトリアジン環の生成により、従
来の導電性樹脂ペーストに用いるエポキシ樹脂よりも、
ガラス転移温度が高い。即ちエポキシ樹脂のガラス転移
温度が120〜150℃程度あるのに対して、シアネー
ト化合物では180〜220℃程度である。ガラス転移
温度が高いと熱時の高接着強度を得ることができる。即
ち、本発明の導電性樹脂ペーストを用いるとICの組み
立て時のワイヤーボンディング工程でのチップはずれを
防止できる。本発明のシアナート化合物は式(1)で示
され、より好ましいのは式(2)であり、これは式
(1)で示される化合物の分子量が大きすぎると粘度が
高くなり、ペーストの塗布作業性を著しく低下させるも
のである。シアネート化合物の配合量は、9〜39重量
%であり、9重量%未満だとシアネート化合物の特徴で
ある高接着強度を得ることができない。39重量%を越
えると、又はエポキシ樹脂との併用をしないと冷凍保存
中にシアネート化合物が結晶化し粘度が極めて高くなり
塗布作業性を悪くする。
The compound of the formula (1) used in the present invention having at least two or more cyanate groups in one molecule (hereinafter, referred to as
The cyanate group (referred to as a cyanate compound) easily undergoes a trimerization reaction by heating in the presence of a metal complex to form a triazine ring. Due to the formation of the triazine ring, the cyanate compound has a three-dimensional structure, so-called network structure, and is cured. Also, due to the formation of this triazine ring, compared to the epoxy resin used in the conventional conductive resin paste,
High glass transition temperature. That is, the glass transition temperature of the epoxy resin is about 120 to 150 ° C, whereas that of the cyanate compound is about 180 to 220 ° C. When the glass transition temperature is high, high adhesive strength when heated can be obtained. That is, by using the conductive resin paste of the present invention, it is possible to prevent the chip from slipping in the wire bonding process at the time of assembling the IC. The cyanate compound of the present invention is represented by the formula (1), more preferably the formula (2), in which the viscosity of the compound represented by the formula (1) is too high and the paste coating operation It significantly reduces the sex. The amount of the cyanate compound blended is 9 to 39% by weight, and if it is less than 9% by weight, the high adhesive strength characteristic of the cyanate compound cannot be obtained. If it exceeds 39% by weight or if it is not used in combination with an epoxy resin, the cyanate compound crystallizes during freezing storage and the viscosity becomes extremely high, deteriorating the coating workability.

【0007】[0007]

【化4】 Embedded image

【0008】エポキシ樹脂を用いたインライン方式対応
の導電性樹脂ペーストは、硬化剤として反応性に優れた
アミン系硬化剤、例えばイミダゾール類、第一級アミン
等を用いているが、これらの硬化剤は硬化温度が180
℃以下では良好な硬化性を示さず、高温での接着強度が
著しく低い。ところが本発明のシアネート化合物を用い
た導電性樹脂ペーストでは、180℃以下の硬化温度で
も良好な硬化物を得ることができ高温での接着強度も高
い。またこの様なシアネート化合物の環化反応には金属
錯体を触媒とし、助触媒として活性水素を有するフェノ
ール類、特にノニルフェノールを用いるのが一般的であ
る。しかし導電性樹脂ペーストの使用に際し、急激な粘
度変化があると塗布作業性が悪化するためポットライフ
が重要視される。シアネート化合物を用いた導電性樹脂
ペーストでは、フェノール類が極わずかでも添加されて
いると急激に反応が進行し、ポットライフを低下させ、
塗布作業性を著しく悪化させるので、本発明ではシアネ
ート化合物の環化反応の助触媒であるノニルフェノール
等のフェノール類は添加しない。
The in-line type conductive resin paste using an epoxy resin uses an amine-based curing agent having excellent reactivity, such as imidazoles and primary amines, as a curing agent. Has a curing temperature of 180
If the temperature is lower than 0 ° C, good curability is not exhibited, and the adhesive strength at high temperature is extremely low. However, with the conductive resin paste using the cyanate compound of the present invention, a good cured product can be obtained even at a curing temperature of 180 ° C. or lower, and the adhesive strength at high temperatures is also high. Further, in such a cyclization reaction of a cyanate compound, it is general to use a metal complex as a catalyst and a phenol having active hydrogen, particularly nonylphenol, as a cocatalyst. However, when the conductive resin paste is used, if there is a rapid change in viscosity, the coating workability deteriorates, so pot life is important. In a conductive resin paste using a cyanate compound, the reaction proceeds rapidly if phenols are added even in a very small amount, and the pot life is reduced,
In the present invention, phenols such as nonylphenol, which is a co-catalyst for the cyclization reaction of the cyanate compound, is not added because it significantly deteriorates the coating workability.

【0009】本発明に用いる銀粉は、50μm以下のも
のが望ましい。50μmを越えるとペースト塗布時にニ
ードル詰まりが起こりやすい。銀粉に含まれるナトリウ
ム、塩素等のイオン性不純物は使用される分野が半導体
関連であり、LSI等の信頼性からもなるべく少ないこ
とが望ましく、例えばプレッシャークッカーで125
℃、20時間抽出で20ppm以下であることが望まし
い。また銀粉の形状はフレーク状、樹枝状、球状等があ
り、単独でも混合して用いてもよい。全導電性樹脂ペー
スト中の銀粉の配合量は60〜85重量%であり、60
重量%未満だと満足できる導電性を得ることができな
い。また、85重量%を越えると粘度が高くなり塗布作
業性が悪化する。本発明に用いるエポキシ樹脂は常温で
液状のものに限定しているが、常温で液状でないと銀粉
との混練において、溶剤をより多く必要とする。溶剤は
気泡発生の原因となり、硬化物の接着強度を低下させて
しまう。エポキシ樹脂の配合量は、0.1〜30重量%
であり、0.1重量%未満だと、冷凍保存時シアネート
の結晶化を防止できない。30重量%を越えると高接着
性を得ることができない。本発明に用いるエポキシ樹脂
としは、例えばビスフェノールA、ビスフェノールF、
フェノールノボラック樹脂とエピクロルヒドリンとの反
応で得られるポリグリシジルエーテルで常温のもの、ビ
ニルシクロヘキセンジオキシド、ジシクロペンタジエン
オキシド、アリサイクリックジエポキシ−アジペイドの
様な脂環式エポキシ、更にn−ブチルグリシジルエーテ
ル、バーサティック酸グリシジルエステル、スチレンオ
キサイドフェニルグリシジルエーテル、ブチルフェニル
グリシジルエーテル、クレグリシジルエーテル、ジシク
ロペンタジエンジエポキシドの様な通常エポキシ樹脂の
希釈剤として用いられるものがある。
The silver powder used in the present invention is preferably 50 μm or less. If it exceeds 50 μm, needle clogging is likely to occur during paste application. The field of use of ionic impurities such as sodium and chlorine contained in silver powder is related to semiconductors, and it is desirable to be as small as possible in view of the reliability of LSI and the like.
It is desirable that the concentration be 20 ppm or less after extraction at 20 ° C. for 20 hours. The silver powder may have a flake shape, a dendritic shape, a spherical shape, etc., and may be used alone or as a mixture. The content of silver powder in the total conductive resin paste is 60 to 85% by weight.
If it is less than wt%, satisfactory conductivity cannot be obtained. On the other hand, if it exceeds 85% by weight, the viscosity becomes high and the coating workability deteriorates. The epoxy resin used in the present invention is limited to a liquid at ordinary temperature, but if it is not liquid at ordinary temperature, a larger amount of solvent is required in kneading with silver powder. The solvent causes generation of bubbles and reduces the adhesive strength of the cured product. Epoxy resin content is 0.1-30% by weight
If less than 0.1% by weight, crystallization of cyanate cannot be prevented during frozen storage. If it exceeds 30% by weight, high adhesiveness cannot be obtained. Examples of the epoxy resin used in the present invention include bisphenol A, bisphenol F,
Polyglycidyl ether obtained by reaction of phenol novolac resin and epichlorohydrin at room temperature, alicyclic epoxy such as vinylcyclohexene dioxide, dicyclopentadiene oxide, alicyclic diepoxy-adipide, and n-butylglycidyl ether. , Versidic acid glycidyl ester, styrene oxide phenyl glycidyl ether, butyl phenyl glycidyl ether, creglycidyl ether, and dicyclopentadiene diepoxide, which are commonly used as diluents for epoxy resins.

【0010】本発明で用いるシアネート化合物は、上記
のエポキシ樹脂とも反応し、エポキシの硬化剤としても
効果があるが、本発明では通常のエポキシ樹脂の硬化剤
を添加しても差し支えない。用いる硬化剤としては、例
えばフェノール類、イミダゾール、ジシアンジアミド等
の一般に活性水素を分子内に有するものが望ましいが、
前述した様にフェノール類はポットライフを低下させる
ため望ましくない。本発明に用いる金属錯体には、例え
ばコバルト、亜鉛、鉄、銅、クロム、マンガン、ニッケ
ル、チタン等の金属ナフテン酸塩、アセチルアセトナー
ト又その誘導体の塩、各種カルボン酸塩、アルコキシド
等の有機金属塩があり、単独でも混合して用いてもよ
い。更に本発明の樹脂組成物には必要に応じて硬化促進
剤、顔料、消泡剤等の添加剤を用いることができる。本
発明の製造方法は、例えば各成分を予備混練し、三本ロ
ールを用いて混練し、ペーストを得て真空下脱泡するこ
となどがある。
The cyanate compound used in the present invention also reacts with the above-mentioned epoxy resin and is effective as a curing agent for epoxy, but in the present invention, a general curing agent for epoxy resin may be added. As the curing agent to be used, those generally having active hydrogen in the molecule such as phenols, imidazole and dicyandiamide are desirable,
As mentioned above, phenols are not desirable because they reduce pot life. The metal complex used in the present invention includes, for example, metal naphthenates such as cobalt, zinc, iron, copper, chromium, manganese, nickel and titanium, salts of acetylacetonate or its derivative, various carboxylates, organic compounds such as alkoxides. There are metal salts, which may be used alone or in combination. Further, additives such as a curing accelerator, a pigment and an antifoaming agent can be used in the resin composition of the present invention, if necessary. The production method of the present invention includes, for example, pre-kneading each component, kneading using a three-roll mill, obtaining a paste, and defoaming under vacuum.

【0011】以下に本発明を実施例で具体的に説明す
る。 実施例1〜7 ビスフェノールAとエピクロルヒドリンとの反応により
得られるジグリシジルエーテル(エポキシ当量180で
常温で液状、以下エポキシ樹脂)、シアネート化合物と
してビスフェノールA型のシアネートエステル〔式
(2)のR1はC(CH32、R2及びR3はH、分子量
278、以下シアネート化合物A〕、又はビスフェノー
ルAD型のシアネートエステル〔式(2)のR1はCH
CH3、R2及びR3はH、分子量306、以下シアネー
ト化合物B〕、金属錯体としてコバルトのナフテン酸
塩、又はコバルトのアセチルアセトナート塩を用いた。
更に最大粒径50μm以下の銀粉を表1に示す割合で配
合し、3本ロールで混練して導電性樹脂ペーストを得
た。この導電性樹脂ペーストを真空チャンバーにて2m
mHgで30分脱泡後、以下に示す方法により各種性能
を評価した。評価結果を表1に示す。 粘度:E型粘度計(3°コーン)を用い、25℃、2.
5rpmでの測定値。また25℃の恒温槽に3日間放置
後の測定値を3日後の粘度とした。 体積抵抗率:スライドガラス上にペーストを幅4mm、
厚み30μmに塗布し、170℃熱盤上にて30秒間硬
化した後の硬化物の体積抵抗率を測定した。 350℃熱時接着強度:ペーストを用いて2mm角のシ
リコンチップを銅フレームにマウントし、170℃熱盤
上にて30秒間硬化した。硬化後、プッシュプルゲージ
を用い350℃での熱時ダイシェア強度を測定した。
The present invention will be specifically described below with reference to examples. Examples 1 to 7 Diglycidyl ether obtained by the reaction of bisphenol A and epichlorohydrin (liquid at room temperature with an epoxy equivalent of 180, hereinafter epoxy resin), bisphenol A type cyanate ester as a cyanate compound [R 1 of formula (2) is C (CH 3 ) 2 , R 2 and R 3 are H, a molecular weight of 278, hereinafter cyanate compound A], or a bisphenol AD type cyanate ester [R 1 of the formula (2) is CH.
CH 3 , R 2 and R 3 were H, molecular weight 306, cyanate compound B] below, and cobalt naphthenate or cobalt acetylacetonate salt was used as the metal complex.
Further, silver powder having a maximum particle size of 50 μm or less was mixed in a ratio shown in Table 1 and kneaded with a three-roll mill to obtain a conductive resin paste. 2m of this conductive resin paste in a vacuum chamber
After defoaming at mHg for 30 minutes, various performances were evaluated by the methods described below. Table 1 shows the evaluation results. Viscosity: Using an E-type viscometer (3 ° cone), 25 ° C, 2.
Measured value at 5 rpm. The measured value after standing for 3 days in a constant temperature bath at 25 ° C was taken as the viscosity after 3 days. Volume resistivity: paste 4 mm wide on glass slide,
The volume resistivity of the cured product after being applied to a thickness of 30 μm and cured on a 170 ° C. hot plate for 30 seconds was measured. Adhesive strength at 350 ° C. heat: A 2 mm square silicon chip was mounted on a copper frame using a paste, and cured on a 170 ° C. hot plate for 30 seconds. After curing, the die shear strength under heat at 350 ° C. was measured using a push-pull gauge.

【0012】比較例1〜6 表2に示す配合割合で実施例と全く同様にして導電性樹
脂ペーストを作製した。比較例1では、エポキシを添加
しないためシアネート化合物が結晶化し始めたため導電
性樹脂ペーストの粘度が高くなってしまった。比較例2
では、シアネート化合物の量が少ないため充分な硬化性
を得ることができなかった。比較例3では、銀粉量が少
ないため充分な導電性が得られなかった。比較例4で
は、銀粉量が多いため粘度が高くなり塗布作業性が悪化
した。比較例5では、金属錯体が添加されていないため
充分な硬化性を得ることができなかった。比較例6で
は、助触媒であるノニルフェノールを添加したことによ
りポットライフが著しく低下した。
Comparative Examples 1 to 6 Conductive resin pastes were prepared with the compounding ratios shown in Table 2 in exactly the same manner as in the examples. In Comparative Example 1, since the epoxy compound was not added, the cyanate compound started to crystallize, and the viscosity of the conductive resin paste was increased. Comparative Example 2
However, sufficient curability could not be obtained because the amount of the cyanate compound was small. In Comparative Example 3, sufficient conductivity could not be obtained because the amount of silver powder was small. In Comparative Example 4, since the amount of silver powder was large, the viscosity was high and the coating workability was deteriorated. In Comparative Example 5, since no metal complex was added, sufficient curability could not be obtained. In Comparative Example 6, the addition of nonylphenol, which is a co-catalyst, significantly reduced the pot life.

【0013】[0013]

【表1】 [Table 1]

【0014】[0014]

【表2】 [Table 2]

【0015】[0015]

【発明の効果】本発明の導電性樹脂ペーストは、特に硬
化性に優れるため200℃以下、30秒以下で硬化が可
能であり、従来になかった高信頼性の特性を有してい
る。また、ディスペンス塗布時の作業性が良好で、また
ナトリウム、塩素などのイオン性不純物が少なく銅、4
2合金等の金属フレーム、セラミック基板、ガラスエポ
キシ等の有機基板へのIC、LSI等の半導体素子の接
着に用いることができる。
Since the conductive resin paste of the present invention is particularly excellent in curability, it can be cured at 200 ° C. or lower for 30 seconds or less, and has a highly reliable characteristic which has never been obtained. In addition, it has good workability during dispense application, and has less ionic impurities such as sodium and chlorine.
It can be used for bonding a semiconductor element such as an IC or an LSI to an organic substrate such as a metal frame of two alloys, a ceramic substrate, or a glass epoxy.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 (A)銀粉、(B)常温で液状のエポキ
シ樹脂、(C)式(1)に示される1分子内に少なくと
も2個以上のシアネート基を有する化合物、及び(D)
金属錯体を必須成分とする導電性樹脂ペーストであっ
て、全導電性樹脂ペースト中に(A)成分を60〜85
重量%、(B)成分を0.1〜30重量%、(C)成分
を9〜39重量%含むことを特徴とする導電性樹脂ペー
スト。 【化1】
1. An (A) silver powder, (B) an epoxy resin which is liquid at room temperature, (C) a compound having at least two cyanate groups in one molecule represented by the formula (1), and (D).
A conductive resin paste containing a metal complex as an essential component, wherein the component (A) is 60 to 85 in the total conductive resin paste.
%, The component (B) is 0.1 to 30% by weight, and the component (C) is 9 to 39% by weight. Embedded image
【請求項2】 (C)成分が式(2)である請求項1記
載の導電性樹脂ペースト。 【化2】
2. The conductive resin paste according to claim 1, wherein the component (C) has the formula (2). Embedded image
JP22127495A 1995-08-30 1995-08-30 Conductive resin paste Pending JPH0959487A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22127495A JPH0959487A (en) 1995-08-30 1995-08-30 Conductive resin paste

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22127495A JPH0959487A (en) 1995-08-30 1995-08-30 Conductive resin paste

Publications (1)

Publication Number Publication Date
JPH0959487A true JPH0959487A (en) 1997-03-04

Family

ID=16764214

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22127495A Pending JPH0959487A (en) 1995-08-30 1995-08-30 Conductive resin paste

Country Status (1)

Country Link
JP (1) JPH0959487A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002117720A (en) * 2000-10-10 2002-04-19 Namics Corp Metallic paste
KR20020087287A (en) * 2001-05-15 2002-11-22 삼성전기주식회사 Cyanate ester-containing insulating composition, insulating film made by the composition and multilayer printed circuit board having the film
JP2014080455A (en) * 2012-10-12 2014-05-08 Nippon Shokubai Co Ltd Liquid curable resin composition and application thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002117720A (en) * 2000-10-10 2002-04-19 Namics Corp Metallic paste
KR20020087287A (en) * 2001-05-15 2002-11-22 삼성전기주식회사 Cyanate ester-containing insulating composition, insulating film made by the composition and multilayer printed circuit board having the film
JP2014080455A (en) * 2012-10-12 2014-05-08 Nippon Shokubai Co Ltd Liquid curable resin composition and application thereof

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