JP3214685B2 - Conductive resin paste - Google Patents

Conductive resin paste

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Publication number
JP3214685B2
JP3214685B2 JP32005194A JP32005194A JP3214685B2 JP 3214685 B2 JP3214685 B2 JP 3214685B2 JP 32005194 A JP32005194 A JP 32005194A JP 32005194 A JP32005194 A JP 32005194A JP 3214685 B2 JP3214685 B2 JP 3214685B2
Authority
JP
Japan
Prior art keywords
conductive resin
resin paste
curing
weight
formula
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP32005194A
Other languages
Japanese (ja)
Other versions
JPH08176408A (en
Inventor
竜一 村山
光 大久保
道雄 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Bakelite Co Ltd
Original Assignee
Sumitomo Bakelite Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Bakelite Co Ltd filed Critical Sumitomo Bakelite Co Ltd
Priority to JP32005194A priority Critical patent/JP3214685B2/en
Publication of JPH08176408A publication Critical patent/JPH08176408A/en
Application granted granted Critical
Publication of JP3214685B2 publication Critical patent/JP3214685B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Plural Heterocyclic Compounds (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Epoxy Resins (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Conductive Materials (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明はIC、LSI等の半導体
素子を金属フレーム等に接着する導電性樹脂ペーストに
関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a conductive resin paste for bonding a semiconductor element such as an IC or an LSI to a metal frame or the like.

【0002】[0002]

【従来の技術】半導体製造工程における半導体素子の接
着、いわゆるダイボンド工程において生産性の向上を目
的としダイボンダー、ワイヤーボンダー等を同一ライン
上に配置したインライン硬化方式が採用され、今後益々
増加する傾向にある。インライン硬化方式では、従来か
ら行われてきたバッチ方式による導電性樹脂ペーストの
硬化に比較し、硬化に要する時間は著しく制限される。
例えば、オーブン硬化方式の場合には、150〜200
℃、60〜90分間で硬化を行っていたが、インライン
硬化方式の場合には15〜90秒間での硬化が要求され
ている。更に、チップサイズが大きく、銅フレームを用
いる半導体製品のインライン硬化に際して、チップと銅
フレームの熱膨張係数の差に基づく、チップの反り量の
最小限化及びフレームの酸化防止のためにも低温硬化が
求められ、又硬化時間に関してもより短時間での硬化が
要求されている。
2. Description of the Related Art An in-line curing method in which a die bonder, a wire bonder, and the like are arranged on the same line has been adopted for the purpose of improving productivity in the bonding of semiconductor elements in a semiconductor manufacturing process, that is, a so-called die bonding process. is there. In the in-line curing method, the time required for curing is significantly limited as compared with the conventional method of curing a conductive resin paste by a batch method.
For example, in the case of the oven curing method, 150 to 200
The curing was performed at 60 ° C. for 60 to 90 minutes. In the case of the in-line curing method, curing for 15 to 90 seconds is required. Furthermore, when in-line curing of semiconductor products with large chip size and copper frame, low-temperature curing is also used to minimize the amount of chip warpage and prevent oxidation of the frame based on the difference in thermal expansion coefficient between the chip and the copper frame. And a shorter curing time is required.

【0003】従来より用いられてきたポリイミド系の導
電性ペーストの場合、N−メチル−2−ピロリドン、ジ
メチルホルムアミド等の高沸点溶媒を使用しているため
90秒以下の短時間での硬化は難しく、短時間で硬化を
行うには硬化温度を250℃以上にしなければならない
ため、硬化中に多量のボイドが発生し接着力の低下、導
電性、熱伝導性の悪化等半導体製品の特性の低下につな
がっていた。一方、現在主流のエポキシ系の導電性ペー
ストの場合には、例えばアミン系硬化剤等を用いること
により60秒程度での硬化は可能であるが、15〜30
秒といった超短時間硬化への対応はなされていない。
In the case of a conventionally used polyimide conductive paste, it is difficult to cure in a short time of 90 seconds or less because a high boiling solvent such as N-methyl-2-pyrrolidone and dimethylformamide is used. In order to perform curing in a short time, the curing temperature must be 250 ° C. or higher, so that a large amount of voids are generated during curing, and the properties of semiconductor products such as adhesive strength, electrical conductivity and thermal conductivity are deteriorated. Was connected to. On the other hand, in the case of the currently mainstream epoxy-based conductive paste, curing can be performed in about 60 seconds by using, for example, an amine-based curing agent, but 15 to 30 seconds is possible.
It does not deal with ultra-short curing such as seconds.

【0004】[0004]

【発明が解決しようとする課題】本発明は、200℃以
下で30秒以下の硬化条件でも硬化可能で、かつナトリ
ウム、塩素等のイオン性不純物の少ない高信頼性の導電
性樹脂ペーストを提供するものである。
SUMMARY OF THE INVENTION The present invention provides a highly reliable conductive resin paste which can be cured under a curing condition of 200 ° C. or less for 30 seconds or less and which has little ionic impurities such as sodium and chlorine. Things.

【0005】[0005]

【課題を解決するための手段】本発明は、(A)銀粉、
(B)常温で液状のエポキシ樹脂、(C)下記式(1)
で示されるビフェノール誘導体、(D)下記式(2)で
示されるイミダゾール誘導体を必須成分とする導電性樹
脂ペーストであって、かつ全導電性樹脂ペースト中に銀
粉(A)を60〜85重量%、式(1)で示されるビフ
ェノール誘導体(C)を0.5〜5重量%、式(2)で
示されるイミダゾール誘導体(D)を0.5〜3.0重
量%含む導電性樹脂ペーストであり、塗布作業性が良好
で、かつ式(1)で示されるビフェノール誘導体及び式
(2)で示されるイミダゾール誘導体を併用することに
より、200℃以下で30秒以下の硬化が可能になると
共に、高温での接着性、応力緩和特性、低吸水性に優
れ、かつ十分なポットライフを有するものである。
The present invention provides (A) a silver powder,
(B) a liquid epoxy resin at room temperature, (C) the following formula (1)
And (D) a conductive resin paste containing an imidazole derivative represented by the following formula (2) as an essential component, and 60 to 85% by weight of silver powder (A) in the entire conductive resin paste. A conductive resin paste containing 0.5 to 5% by weight of the biphenol derivative (C) represented by the formula (1) and 0.5 to 3.0% by weight of the imidazole derivative (D) represented by the formula (2). The coating workability is good, and by using a biphenol derivative represented by the formula (1) and an imidazole derivative represented by the formula (2) in combination, curing at 200 ° C. or less for 30 seconds or less becomes possible, It is excellent in adhesiveness at high temperature, stress relaxation property, low water absorption and has a sufficient pot life.

【0006】[0006]

【化3】 (Rは、H、又はCH3で、同一でも異なってもよい)Embedded image (R is H or CH 3 and may be the same or different)

【0007】[0007]

【化4】 (R1=CH3、C25、C1123、又はフェニル、
2、R3=H、CH3、又はC25
Embedded image (R 1 CHCH 3 , C 2 H 5 , C 11 H 23 , or phenyl,
R 2 , R 3 HH, CH 3 , or C 2 H 5 )

【0008】本発明に用いる銀粉は用いる分野が電子電
気分野のためハロゲンイオン、アルカリ金属イオン等の
イオン性不純物量が10ppm以下であることが望まし
い。又、形状としてはフレーク状、樹枝状あるいは球状
のものを単独あるいは混合して用いることができる。更
に粒径に関しては、通常平均粒径が2〜10μm、最大
粒径は50μm程度のものが好ましく、比較的細かい銀
粉と粗い銀粉を混合して用いてもよい。全導電性樹脂ペ
ースト中の銀粉量が60重量%未満だと、硬化物の電気
伝導性が低下し、85重量%を越えると樹脂ペーストの
粘度が高くなり過ぎ塗布作業性の低下の原因となるので
好ましくない。
Since the silver powder used in the present invention is used in the field of electronics and electronics, the amount of ionic impurities such as halogen ions and alkali metal ions is desirably 10 ppm or less. Flakes, dendrites or spheres can be used alone or in combination. Further, with respect to the particle size, usually, the average particle size is preferably 2 to 10 μm and the maximum particle size is preferably about 50 μm, and a mixture of relatively fine silver powder and coarse silver powder may be used. When the amount of silver powder in the entire conductive resin paste is less than 60% by weight, the electric conductivity of the cured product decreases, and when the amount exceeds 85% by weight, the viscosity of the resin paste becomes too high, which causes a decrease in coating workability. It is not preferable.

【0009】本発明に用いるエポキシ樹脂は、常温で液
状のものであり、常温で液状のものでないと銀粉との混
練において溶剤を必要とする。溶剤は気泡の原因となり
硬化物の接着強度、熱伝導率を低下させてしまうので好
ましくない。常温で液状のエポキシ樹脂とは、例えば常
温で固形のものでも常温で液状のエポキシ樹脂と混合す
ることで常温で安定して液状を示すものを含む。本発明
に用いるエポキシ樹脂としては、ビスフェノールA、ビ
スフェノールF、フェノールノボラック樹脂、クレゾー
ル型ノボラック樹脂等とエピクロルヒドリンとの反応に
より得られるポリグリシジルエーテル、1、6ージヒド
ロキシナフタレンジグリシジルエーテル、ブタンジオー
ルジグリシジルエーテル、ネオペンチルグリコールジグ
リシジルエーテル等の脂肪族エポキシ、ジグリシジルヒ
ダントイン等の複素環式エポキシ、ビニルシクロヘキセ
ンジオキサイド、ジシクロペンタジエンジオキサイド、
アリサイクリックジエポキシーアジペイト等の脂環式エ
ポキシ、更にはn−ブチルグリシジルエーテル、バーサ
ティック酸グリシジルエステル、スチレンオキサイド、
エチルヘキシルグリシジルエーテル、フェニルグリシジ
ルエーテル、クレジルグリシジルエーテル、ブチルフェ
ニルグリシジルエーテル等の通常のエポキシ樹脂の希釈
剤として用いられるものがあり、これらは単独でも混合
して用いても差し支えない。
The epoxy resin used in the present invention is liquid at room temperature, and unless it is liquid at room temperature, a solvent is required for kneading with silver powder. The solvent is not preferable because it causes bubbles and lowers the adhesive strength and thermal conductivity of the cured product. The epoxy resin which is liquid at ordinary temperature includes, for example, a resin which is solid at ordinary temperature and shows a stable liquid at ordinary temperature by being mixed with the epoxy resin which is liquid at ordinary temperature. Examples of the epoxy resin used in the present invention include polyglycidyl ether obtained by reacting bisphenol A, bisphenol F, phenol novolak resin, cresol-type novolak resin, etc. with epichlorohydrin, 1,6-dihydroxynaphthalenediglycidyl ether, butanediol diglycidyl. Ethers, aliphatic epoxies such as neopentyl glycol diglycidyl ether, heterocyclic epoxies such as diglycidyl hydantoin, vinylcyclohexene dioxide, dicyclopentadiene dioxide,
Alicyclic epoxy such as alicyclic diepoxy-adipate, further n-butyl glycidyl ether, glycidyl versatate, styrene oxide,
Ethyl hexyl glycidyl ether, phenyl glycidyl ether, cresyl glycidyl ether, butyl phenyl glycidyl ether and the like are used as diluents for ordinary epoxy resins, and these may be used alone or in combination.

【0010】本発明で用いる式(1)のビフェノール誘
導体は、融点が高く、又通常のエポキシ樹脂には常温で
溶解しないので、導電性樹脂ペースト中に粉末にして分
散させるため保存性に優れている。又ビフェニル骨格は
内部回転のエネルギーが比較的小さいため得られた硬化
物は強靭であり、更に硬化物の自由体積が小さくなるの
で低吸水化が図れる。式(1)のRは、H、又はCH3
で、同一でも異なってもよいが、好ましいのは、全ての
Rが、CH3又はHである。式(1)のビフェノール誘
導体は、全導電性樹脂ペースト中に0.5〜5重量%、
好ましくは1〜3重量%含まれる。0.5重量%未満だ
と、目的とする強靭性、低吸水性が発現されず、5重量
%を越えると導電性樹脂ペーストの粘度が高くなり過ぎ
実用的でない。
The biphenol derivative of the formula (1) used in the present invention has a high melting point and does not dissolve in ordinary epoxy resins at room temperature. I have. Further, the biphenyl skeleton has a relatively small internal rotation energy, so that the obtained cured product is tough, and the free volume of the cured product is small, so that low water absorption can be achieved. R in the formula (1) is H or CH 3
And may be the same or different, but preferably all R are CH 3 or H. The biphenol derivative of the formula (1) is 0.5 to 5% by weight in the total conductive resin paste,
Preferably, it is contained in an amount of 1 to 3% by weight. If it is less than 0.5% by weight, the desired toughness and low water absorption are not exhibited, and if it exceeds 5% by weight, the viscosity of the conductive resin paste becomes too high to be practical.

【0011】本発明の式(2)のイミダゾール誘導体
は、式(1)のビフェノール誘導体単独では硬化性が悪
く、インライン硬化対応材としての速硬化性を有してい
ないため併用するものである。又式(2)以外の通常の
イミダゾール類を用いた場合、反応性は良好となるが、
反面保存性が悪くなり実用性に乏しい。本発明のイミダ
ゾール類とビニルトリアジンとの付加物を使用すること
により反応性と保存性を両立することが可能となった。
式(2)で示されるイミダゾール誘導体は、全導電性樹
脂ペースト中に0.5〜3.0重量%含まれる。0.5
重量%未満だと十分な硬化性が発現されず、3.0重量
%を越えるとイミダゾール類を用いた硬化物の欠点であ
る高温での接着力が低下するので好ましくない。式
(2)のR1は、CH3、C25、C1123、又はフェニ
ル、R2、R3=H、CH3、又はC25であるが、好ま
しいのは、R1がCH3で、R2とR3はHである。即ち、
2−メチルイミダゾールとビニルトリアジンの付加物で
ある。
The imidazole derivative of the formula (2) of the present invention is used in combination with the biphenol derivative of the formula (1) because it has poor curing properties and does not have rapid curing properties as an in-line curing material. In addition, when ordinary imidazoles other than the formula (2) are used, the reactivity becomes good,
On the other hand, the storage stability is poor and the utility is poor. By using the adduct of the imidazoles and vinyltriazine of the present invention, it has become possible to achieve both reactivity and storage stability.
The imidazole derivative represented by the formula (2) is contained in the entire conductive resin paste in an amount of 0.5 to 3.0% by weight. 0.5
If the amount is less than 30% by weight, sufficient curability is not exhibited, and if the amount is more than 3.0% by weight, the adhesive strength at a high temperature, which is a disadvantage of a cured product using imidazoles, is unpreferably reduced. R 1 in formula (2) is CH 3 , C 2 H 5 , C 11 H 23 , or phenyl, R 2 , R 3 HH, CH 3 , or C 2 H 5 ; 1 is CH 3 and R 2 and R 3 are H. That is,
It is an adduct of 2-methylimidazole and vinyltriazine.

【0012】又必要に応じ、潜在性アミン硬化剤等の他
の硬化剤と併用してもよい。併用するものとして、例え
ば第3級アミン、他のイミダゾール類、トリフェニルホ
スフィン、テトラフェニルホスフィン・テトラフェニル
ボレート、1,8−ジアザビシクロウンデセン等の一般
にエポキシ樹脂とフェノール系硬化剤との硬化促進剤が
挙げられる。本発明においては、必要に応じ可撓性付与
剤、消泡剤、カップリング剤等を用てもよい。本発明の
製造方法は例えば各成分を予備混合した後、3本ロール
を用いて混練し、混練後真空下脱泡し樹脂ペーストを得
るなどがある。
Further, if necessary, it may be used in combination with another curing agent such as a latent amine curing agent. As a combination, tertiary amines, other imidazoles, triphenylphosphine, tetraphenylphosphine / tetraphenylborate, 1,8-diazabicycloundecene and the like are generally used for curing epoxy resins and phenolic curing agents. Accelerators. In the present invention, a flexibility-imparting agent, an antifoaming agent, a coupling agent, and the like may be used as necessary. The production method of the present invention includes, for example, preliminarily mixing the components, kneading them using a three-roll mill, kneading and then defoaming under vacuum to obtain a resin paste.

【0013】以下実施例を用いて本発明を具体的に説明
する。配合割合は重量部で示す。 実施例1〜5 粒径1〜30μmで平均粒径3μmのフレーク状銀粉
と、ビスフェノールAとエピクロルヒドリンとの反応に
より得られるジグリシジルビスフェノールA(エポキシ
当量180、常温で液体、以下ビスAエポキシ)、クレ
ジルグリシジルエーテル(エポキシ当量185)、3,
3’,5,5’−テトラメチルビフェノール(本州化学
工業(株)・製、以下ビフェノールA)、2−メチルイ
ミダゾールアジン(2−メチルイミダゾールとビニルト
リアジンの付加物)(四国化成工業(株)・製2MZ−
A、以下2MZ−A)、ジシアンジアミド、1,8−ジ
アザビシクロウンデセンを表1に示す割合で配合し、3
本ロールで混練して導電性樹脂ペーストを得た。この導
電性樹脂ペーストを真空チャンバーにて2mmHgで3
0分間脱泡した後、以下の方法により各種性能を評価し
た。
Hereinafter, the present invention will be described in detail with reference to examples. The mixing ratio is shown in parts by weight. Examples 1 to 5 Diglycidyl bisphenol A (epoxy equivalent: 180, liquid at ordinary temperature, hereinafter referred to as bis-A epoxy) obtained by reacting flake silver powder having a particle diameter of 1 to 30 μm and an average particle diameter of 3 μm with bisphenol A and epichlorohydrin; Cresyl glycidyl ether (epoxy equivalent 185), 3,
3 ', 5,5'-Tetramethylbiphenol (hereinafter, biphenol A, manufactured by Honshu Chemical Industry Co., Ltd.), 2-methylimidazoleazine (addition product of 2-methylimidazole and vinyltriazine) (Shikoku Chemical Industry Co., Ltd.)・ 2MZ-
A, hereinafter 2MZ-A), dicyandiamide, and 1,8-diazabicycloundecene were blended in the ratio shown in Table 1, and 3
The conductive resin paste was obtained by kneading with this roll. This conductive resin paste is applied in a vacuum chamber at 2 mmHg for 3 hours.
After defoaming for 0 minutes, various performances were evaluated by the following methods.

【0014】ゲルタイム :導電性樹脂ペースト1cc
を170℃の熱板上に置きスパチュラでかきまぜ導電性
樹脂ペーストが流動性を示さなくなるまでの時間を測
定。 粘度 :E型粘度計(3°コーン)を用い、25
℃、2.5rpmでの値を測定し粘度とした。又、25
℃で3日間放置後の粘度を測定。 糸引き性 :導電性樹脂ペーストの中へ直径1mmφ
のピンを深さ5mmまで入れ、ピンを300mm/分の
速度で引き上げ、ペーストが切れたときの高さを測定。 体積抵抗率 :スライドガラス上に導電性樹脂ペースト
を幅4mm、厚さ30μmに塗布し、200℃のホット
プレート上で30秒間硬化した後、硬化物の体積抵抗率
を測定。 弾性率 :テフロンシート上に導電性樹脂ペースト
を10×150×0.1mmになるように塗布し、15
0℃のオーブン中で30分間硬化した後引張り試験機に
て試験長100mm、試験速度1mm/分で加重−変位
曲線を測定し、その初期勾配より弾性率を算出。
Gel time: 1 cc of conductive resin paste
Was placed on a hot plate at 170 ° C. and stirred with a spatula to measure the time until the conductive resin paste showed no fluidity. Viscosity: 25% using an E-type viscometer (3 ° cone)
The viscosity was measured at a temperature of 2.5 ° C. and a temperature of 2.5 ° C., and the viscosity was determined. Also, 25
Measure the viscosity after standing at ℃ for 3 days. Stringing property: 1mmφ in diameter into conductive resin paste
Was inserted to a depth of 5 mm, the pin was pulled up at a speed of 300 mm / min, and the height when the paste was cut was measured. Volume resistivity: A conductive resin paste having a width of 4 mm and a thickness of 30 μm was applied on a slide glass, cured on a hot plate at 200 ° C. for 30 seconds, and then the volume resistivity of the cured product was measured. Elastic modulus: A conductive resin paste is applied on a Teflon sheet so as to have a size of 10 × 150 × 0.1 mm.
After curing in an oven at 0 ° C. for 30 minutes, a load-displacement curve was measured with a tensile tester at a test length of 100 mm and a test speed of 1 mm / min, and the elastic modulus was calculated from the initial gradient.

【0015】吸水率 :テフロンシート上に導電性
樹脂ペーストを50×50×0.1mmになるように塗
布し、150℃のオーブン中で30分間硬化した後、8
5℃、85%、72時間吸水処理を行い、処理前後の重
量変化より吸水率を算出。 チップの反り:6×15×0.3mmシリコンチップを
銅フレーム(厚さ200μm)に導電性樹脂ペーストで
マウントし、200℃、30秒硬化した後、チップの反
りを表面粗さ計(測定長13mm)で測定。 接着強度 :5×5mmのシリコンチップを導電性樹
脂ペーストを用いて銅フレームにマウントし200℃の
ホットプレート上で、30秒間硬化した。硬化後プッシ
ュプルゲージを用い240℃での熱時ダイシェア強度を
測定。 不純物 :硬化、粉砕した導電性樹脂ペースト2g
及び純水40mlを125℃、20時間抽出して、得ら
れた抽出液のナトリウムおよび塩素イオン濃度をイオン
クロマトグラフィーにて測定。
Water absorption: A conductive resin paste was applied on a Teflon sheet so as to have a size of 50 × 50 × 0.1 mm, and was cured in an oven at 150 ° C. for 30 minutes.
Water absorption treatment was performed at 5 ° C, 85% for 72 hours, and the water absorption was calculated from the weight change before and after the treatment. Chip warpage: A 6 × 15 × 0.3 mm silicon chip was mounted on a copper frame (200 μm thick) with a conductive resin paste, cured at 200 ° C. for 30 seconds, and the chip warpage was measured with a surface roughness meter (measurement length). 13 mm). Adhesive strength: A 5 × 5 mm silicon chip was mounted on a copper frame using a conductive resin paste and cured on a 200 ° C. hot plate for 30 seconds. After curing, the die shear strength at 240 ° C. was measured using a push-pull gauge. Impurities: 2g of cured and ground conductive resin paste
Then, 40 ml of pure water was extracted at 125 ° C. for 20 hours, and the sodium and chloride ion concentrations of the obtained extract were measured by ion chromatography.

【0016】実施例6 硬化剤としてp,p’−ビフェノール(本州化学工業
(株)・製、以下ビフェノールB)を使用した他は、実
施例1〜5と同様にして導電性樹脂ペーストを作製し評
価した。評価結果を表1に示す。 比較例1〜6 表2に示す配合割合で実施例と全く同様にして導電性樹
脂ペーストを作製した。なお比較例5では、硬化剤とし
てフェノールノボラック樹脂(水酸基当量104、軟化
点85℃)を用いた。又比較例6では使用する硬化剤と
して2−メチルイミダゾール(四国化成工業(株)・
製、2MZ、以下2MZ)を用いた。評価結果を表2に
示す。
Example 6 A conductive resin paste was prepared in the same manner as in Examples 1 to 5, except that p, p'-biphenol (hereinafter, biphenol B, manufactured by Honshu Chemical Industry Co., Ltd.) was used as a curing agent. And evaluated. Table 1 shows the evaluation results. Comparative Examples 1 to 6 Conductive resin pastes were produced in exactly the same manner as in the examples with the mixing ratios shown in Table 2. In Comparative Example 5, a phenol novolak resin (hydroxyl equivalent: 104, softening point: 85 ° C.) was used as a curing agent. In Comparative Example 6, 2-methylimidazole (Shikoku Chemical Industry Co., Ltd.) was used as a curing agent.
2MZ, hereinafter 2MZ). Table 2 shows the evaluation results.

【0017】[0017]

【表1】 [Table 1]

【0018】[0018]

【表2】 [Table 2]

【0019】[0019]

【発明の効果】本発明の導電性樹脂ペーストは、ディス
ペンス塗布時の作業性が良好で、又ナトリウム、塩素な
どのイオン性不純物が少なく銅、42合金等の金属フレ
ーム、セラミック基板、ガラスエポキシ等の有機基板へ
のIC,LSI等の半導体素子の接着に用いることがで
きる。特に硬化性が良好なため、200℃以下、30秒
以下で硬化が可能であり、従来になかった高信頼性の半
導体素子接着用の導電性樹脂ペーストである。
The conductive resin paste of the present invention has good workability at the time of dispensing application and has a small amount of ionic impurities such as sodium and chlorine, a metal frame of copper, 42 alloy, a ceramic substrate, a glass epoxy, etc. For bonding semiconductor elements such as ICs and LSIs to organic substrates. In particular, since the curability is good, it can be cured at 200 ° C. or less for 30 seconds or less, and is a highly reliable conductive resin paste for bonding semiconductor elements, which has not existed conventionally.

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI H01B 1/22 H01B 1/22 A (56)参考文献 特開 昭53−59799(JP,A) 特開 昭53−114844(JP,A) 特開 昭60−84283(JP,A) 特開 昭62−145601(JP,A) 特開 平4−339883(JP,A) 特開 平5−163331(JP,A) 特開 平5−175253(JP,A) 特開 平6−84974(JP,A) 特開 平6−116514(JP,A) 特開 平6−184282(JP,A) 特開 平6−322350(JP,A) (58)調査した分野(Int.Cl.7,DB名) C08L 63/00 - 63/10 C08K 3/08 C08G 59/56 C08G 59/62 C09J 163/00 - 163/10 H01B 1/22 ──────────────────────────────────────────────────続 き Continuation of the front page (51) Int.Cl. 7 Identification symbol FI H01B1 / 22 H01B1 / 22 A (56) References JP-A-53-59799 (JP, A) JP-A-53-114844 ( JP, A) JP-A-60-84283 (JP, A) JP-A-62-145601 (JP, A) JP-A-4-339883 (JP, A) JP-A-5-163331 (JP, A) JP-A-5-175253 (JP, A) JP-A-6-84974 (JP, A) JP-A-6-116514 (JP, A) JP-A-6-184282 (JP, A) JP-A-6-322350 (JP) , A) (58) Fields investigated (Int. Cl. 7 , DB name) C08L 63/00-63/10 C08K 3/08 C08G 59/56 C08G 59/62 C09J 163/00-163/10 H01B 1 / twenty two

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 (A)銀粉、(B)常温で液状のエポキ
シ樹脂、(C)下記式(1)で示されるビフェノール誘
導体、(D)下記式(2)で示されるイミダゾール誘導
体を必須成分とする導電性樹脂ペーストであって、かつ
全導電性樹脂ペースト中に銀粉(A)を60〜85重量
%、式(1)で示されるビフェノール誘導体(C)を
0.5〜5重量%、式(2)で示されるイミダゾール誘
導体(D)を0.5〜3.0重量%含むことを特徴とす
る導電性樹脂ペースト。 【化1】 (Rは、H、又はCH3で、同一でも異なってもよい) 【化2】 (R1=CH3、C25、C1123、又はフェニル、
2、R3=H、CH3、又はC25
An essential component is (A) silver powder, (B) an epoxy resin liquid at room temperature, (C) a biphenol derivative represented by the following formula (1), and (D) an imidazole derivative represented by the following formula (2). A silver powder (A) of 60 to 85% by weight, a biphenol derivative (C) represented by the formula (1) of 0.5 to 5% by weight in the entire conductive resin paste, A conductive resin paste containing the imidazole derivative (D) represented by the formula (2) in an amount of 0.5 to 3.0% by weight. Embedded image (R is H or CH 3 and may be the same or different.) (R 1 CHCH 3 , C 2 H 5 , C 11 H 23 , or phenyl,
R 2 , R 3 HH, CH 3 , or C 2 H 5 )
【請求項2】 イミダゾール誘導体が、2−メチルイミ
ダゾールとビニルトリアジンの付加物である請求項1記
載の導電性樹脂ペースト。
2. The conductive resin paste according to claim 1, wherein the imidazole derivative is an adduct of 2-methylimidazole and vinyltriazine.
JP32005194A 1994-12-22 1994-12-22 Conductive resin paste Expired - Fee Related JP3214685B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32005194A JP3214685B2 (en) 1994-12-22 1994-12-22 Conductive resin paste

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32005194A JP3214685B2 (en) 1994-12-22 1994-12-22 Conductive resin paste

Publications (2)

Publication Number Publication Date
JPH08176408A JPH08176408A (en) 1996-07-09
JP3214685B2 true JP3214685B2 (en) 2001-10-02

Family

ID=18117185

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Link
JP (1) JP3214685B2 (en)

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US6593255B1 (en) 1998-03-03 2003-07-15 Ppg Industries Ohio, Inc. Impregnated glass fiber strands and products including the same
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6419981B1 (en) 1998-03-03 2002-07-16 Ppg Industries Ohio, Inc. Impregnated glass fiber strands and products including the same
US6593255B1 (en) 1998-03-03 2003-07-15 Ppg Industries Ohio, Inc. Impregnated glass fiber strands and products including the same
US8105690B2 (en) 1998-03-03 2012-01-31 Ppg Industries Ohio, Inc Fiber product coated with particles to adjust the friction of the coating and the interfilament bonding
US8062746B2 (en) 2003-03-10 2011-11-22 Ppg Industries, Inc. Resin compatible yarn binder and uses thereof

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