JPH09508701A - 基板コーティングの蛍光分光微分測定法 - Google Patents
基板コーティングの蛍光分光微分測定法Info
- Publication number
- JPH09508701A JPH09508701A JP7521387A JP52138795A JPH09508701A JP H09508701 A JPH09508701 A JP H09508701A JP 7521387 A JP7521387 A JP 7521387A JP 52138795 A JP52138795 A JP 52138795A JP H09508701 A JPH09508701 A JP H09508701A
- Authority
- JP
- Japan
- Prior art keywords
- emission
- wavelength
- wavelength range
- region
- narrower
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000576 coating method Methods 0.000 title claims description 45
- 239000011248 coating agent Substances 0.000 title claims description 37
- 239000000758 substrate Substances 0.000 title claims description 14
- 238000005259 measurement Methods 0.000 title description 5
- 238000001506 fluorescence spectroscopy Methods 0.000 title description 2
- 230000008859 change Effects 0.000 claims abstract description 22
- 238000001228 spectrum Methods 0.000 claims abstract description 16
- 150000001875 compounds Chemical class 0.000 claims abstract description 14
- 238000004364 calculation method Methods 0.000 claims abstract description 8
- 238000000034 method Methods 0.000 claims description 42
- 239000000463 material Substances 0.000 claims description 9
- 239000000853 adhesive Substances 0.000 claims description 7
- 230000001070 adhesive effect Effects 0.000 claims description 7
- 238000004458 analytical method Methods 0.000 claims description 7
- 238000010521 absorption reaction Methods 0.000 claims description 6
- 238000001514 detection method Methods 0.000 claims description 6
- 230000005855 radiation Effects 0.000 claims description 6
- 239000000126 substance Substances 0.000 claims description 4
- 230000004888 barrier function Effects 0.000 claims description 3
- -1 fluorene compound Chemical class 0.000 claims description 3
- 230000000704 physical effect Effects 0.000 claims description 2
- 239000011253 protective coating Substances 0.000 claims description 2
- 150000001491 aromatic compounds Chemical group 0.000 claims 2
- 241000254158 Lampyridae Species 0.000 claims 1
- 230000007547 defect Effects 0.000 claims 1
- NIHNNTQXNPWCJQ-UHFFFAOYSA-N o-biphenylenemethane Natural products C1=CC=C2CC3=CC=CC=C3C2=C1 NIHNNTQXNPWCJQ-UHFFFAOYSA-N 0.000 claims 1
- 238000005070 sampling Methods 0.000 claims 1
- 239000007850 fluorescent dye Substances 0.000 abstract description 40
- 239000000523 sample Substances 0.000 abstract description 18
- 230000002452 interceptive effect Effects 0.000 abstract description 2
- 239000000047 product Substances 0.000 description 20
- 239000000203 mixture Substances 0.000 description 19
- WWVFJJKBBZXWFV-UHFFFAOYSA-N 2-naphthalen-1-yl-5-phenyl-1,3-oxazole Chemical compound C=1N=C(C=2C3=CC=CC=C3C=CC=2)OC=1C1=CC=CC=C1 WWVFJJKBBZXWFV-UHFFFAOYSA-N 0.000 description 13
- 238000000295 emission spectrum Methods 0.000 description 8
- 239000004831 Hot glue Substances 0.000 description 7
- AIXZBGVLNVRQSS-UHFFFAOYSA-N 5-tert-butyl-2-[5-(5-tert-butyl-1,3-benzoxazol-2-yl)thiophen-2-yl]-1,3-benzoxazole Chemical compound CC(C)(C)C1=CC=C2OC(C3=CC=C(S3)C=3OC4=CC=C(C=C4N=3)C(C)(C)C)=NC2=C1 AIXZBGVLNVRQSS-UHFFFAOYSA-N 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 6
- 239000010410 layer Substances 0.000 description 6
- 239000010409 thin film Substances 0.000 description 6
- 229920002633 Kraton (polymer) Polymers 0.000 description 4
- 230000005284 excitation Effects 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000003595 spectral effect Effects 0.000 description 3
- 238000002798 spectrophotometry method Methods 0.000 description 3
- 239000004743 Polypropylene Substances 0.000 description 2
- 239000012943 hotmelt Substances 0.000 description 2
- 229920001155 polypropylene Polymers 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000004611 spectroscopical analysis Methods 0.000 description 2
- 238000001429 visible spectrum Methods 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 239000012790 adhesive layer Substances 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000008199 coating composition Substances 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 238000002189 fluorescence spectrum Methods 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 239000012462 polypropylene substrate Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 108090000623 proteins and genes Proteins 0.000 description 1
- 238000013441 quality evaluation Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N2021/6417—Spectrofluorimetric devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G01N2021/8427—Coatings
Landscapes
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/193,428 US5464986A (en) | 1994-02-08 | 1994-02-08 | Fluorescent spectral differential measurement of a substrate coating |
| US08/193,428 | 1994-02-08 | ||
| PCT/US1995/001777 WO1995022048A1 (en) | 1994-02-08 | 1995-02-08 | Fluorescent spectral differential measurement of a substrate coating |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH09508701A true JPH09508701A (ja) | 1997-09-02 |
Family
ID=22713595
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7521387A Pending JPH09508701A (ja) | 1994-02-08 | 1995-02-08 | 基板コーティングの蛍光分光微分測定法 |
Country Status (11)
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014168442A (ja) * | 2013-03-05 | 2014-09-18 | Azbil Corp | 微生物検出装置及び微生物検出方法 |
| JP2019518206A (ja) * | 2016-04-26 | 2019-06-27 | モレキュラー デバイシーズ， エルエルシー | 選択可能な励起光経路を用いる光学ベースの測定のための方法およびシステム |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5717217A (en) * | 1994-05-05 | 1998-02-10 | Spectra Group Limited, Inc. | Method for determining thickness, degree of cure and other properties of a polymeric coating |
| ATE270437T1 (de) * | 1996-01-11 | 2004-07-15 | Univ Princeton | Organische luminiszenzbeschichtung fur lichtdetektoren |
| JP3606499B2 (ja) * | 1996-11-13 | 2005-01-05 | 株式会社堀場製作所 | 化学発光法分析計のサンプル希釈方法 |
| US6402986B1 (en) | 1999-07-16 | 2002-06-11 | The Trustees Of Boston University | Compositions and methods for luminescence lifetime comparison |
| US6836362B2 (en) | 2001-05-14 | 2004-12-28 | General Electric Company | Method for the rapid determination of the optical quality of combinatorial libraries |
| KR20040036124A (ko) * | 2002-10-23 | 2004-04-30 | 현대자동차주식회사 | 자동차 글라스 프라이머 도포 검사장치 및 방법 |
| EP1558917B1 (en) * | 2002-10-24 | 2007-01-10 | R & D Intellectual Property, Llc | Characterizing a mass distribution pattern |
| US9241388B2 (en) * | 2011-06-29 | 2016-01-19 | Panasonic Intellectual Property Management Co., Ltd. | Method and apparatus for manufacturing a light-emitting device including correction of an application amount of a fluorescent resin based on a fluorescent particle concentration |
| US8879066B2 (en) * | 2012-10-26 | 2014-11-04 | Ppg Industries Ohio, Inc. | Texture analysis of a painted surface using specular angle data |
| CN113720824B (zh) * | 2021-11-01 | 2022-02-11 | 北京理工大学 | 一种荧光探测系统及荧光光谱拼接方法 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5127155B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1970-11-24 | 1976-08-11 | ||
| US3737234A (en) * | 1970-12-17 | 1973-06-05 | Shimadzu Corp | Spectrophotometer for measurement of derivative spectra |
| JPS4982378A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1972-12-11 | 1974-08-08 | ||
| US3832555A (en) * | 1973-04-10 | 1974-08-27 | Hitachi Ltd | Fluorescence spectrophotometer |
| JPS5214636B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1973-11-05 | 1977-04-22 | ||
| US3956630A (en) * | 1975-03-14 | 1976-05-11 | Westvaco Corporation | Fluorimetric coat weight measurement |
| US4153369A (en) * | 1977-11-11 | 1979-05-08 | Farrand Optical Co., Inc. | Convertible dual beam differential spectrofluorometer and absorption meter |
| SU819647A1 (ru) * | 1978-09-05 | 1981-04-07 | Всесоюзный Научно-Исследовательскийгеологоразведочный Нефтяной Инсти-Тут | Способ компенсации фоновой флуо-РЕСцЕНции B МНОгОКОМпОНЕНТНОйСиСТЕМЕ |
| US4250382A (en) * | 1979-08-14 | 1981-02-10 | Scott Paper Company | Coat detection method |
| US4877965A (en) * | 1985-07-01 | 1989-10-31 | Diatron Corporation | Fluorometer |
| US4978731A (en) * | 1986-07-10 | 1990-12-18 | Minnesota Mining And Manufacturing Company | Process for fluorimetric monitoring of functional coatings and compositions and fluorescent agents therefor |
| US4922113A (en) * | 1986-07-10 | 1990-05-01 | Minnesota Mining And Manufacturing Company | Process for fluorimetric monitoring of functional coatings and compositions and fluorescent agents therefor |
| US5087670A (en) * | 1986-07-10 | 1992-02-11 | Minnesota Mining And Manufacturing Company | Process for fluorimetric monitoring of functional coatings and compositions and fluorescent agents therefor |
| US4841156A (en) * | 1987-05-15 | 1989-06-20 | Electronic Instrumentation And Technology, Inc. | Measurement of the thickness of thin films |
| SU1539608A1 (ru) * | 1987-12-02 | 1990-01-30 | Киевский Государственный Университет Им.Т.Г.Шевченко | Способ измерени дифференциальных спектров пропускани на двухлучевых спектральных приборах |
-
1994
- 1994-02-08 US US08/193,428 patent/US5464986A/en not_active Expired - Lifetime
-
1995
- 1995-02-08 JP JP7521387A patent/JPH09508701A/ja active Pending
- 1995-02-08 EP EP95912550A patent/EP0745218B1/en not_active Expired - Lifetime
- 1995-02-08 WO PCT/US1995/001777 patent/WO1995022048A1/en active IP Right Grant
- 1995-02-08 CN CN95191922A patent/CN1143414A/zh active Pending
- 1995-02-08 DE DE69524575T patent/DE69524575T2/de not_active Expired - Fee Related
- 1995-02-08 MX MX9603271A patent/MX9603271A/es unknown
- 1995-02-08 BR BR9506765A patent/BR9506765A/pt not_active IP Right Cessation
- 1995-02-08 CA CA002182865A patent/CA2182865A1/en not_active Abandoned
- 1995-02-08 KR KR1019960704314A patent/KR100367240B1/ko not_active Expired - Fee Related
- 1995-03-03 TW TW084102003A patent/TW295625B/zh active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014168442A (ja) * | 2013-03-05 | 2014-09-18 | Azbil Corp | 微生物検出装置及び微生物検出方法 |
| JP2019518206A (ja) * | 2016-04-26 | 2019-06-27 | モレキュラー デバイシーズ， エルエルシー | 選択可能な励起光経路を用いる光学ベースの測定のための方法およびシステム |
Also Published As
| Publication number | Publication date |
|---|---|
| US5464986A (en) | 1995-11-07 |
| EP0745218A1 (en) | 1996-12-04 |
| CA2182865A1 (en) | 1995-08-17 |
| WO1995022048A1 (en) | 1995-08-17 |
| DE69524575T2 (de) | 2002-08-08 |
| EP0745218B1 (en) | 2001-12-12 |
| KR970701343A (ko) | 1997-03-17 |
| CN1143414A (zh) | 1997-02-19 |
| KR100367240B1 (ko) | 2003-05-09 |
| DE69524575D1 (de) | 2002-01-24 |
| TW295625B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1997-01-11 |
| MX9603271A (es) | 1997-03-29 |
| BR9506765A (pt) | 1997-10-07 |
| EP0745218A4 (en) | 1999-01-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20040323 |
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| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20040623 |
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| A602 | Written permission of extension of time |
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| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20040924 |
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| A02 | Decision of refusal |
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