JPH0949070A - Jig for vapor deposition - Google Patents

Jig for vapor deposition

Info

Publication number
JPH0949070A
JPH0949070A JP22588395A JP22588395A JPH0949070A JP H0949070 A JPH0949070 A JP H0949070A JP 22588395 A JP22588395 A JP 22588395A JP 22588395 A JP22588395 A JP 22588395A JP H0949070 A JPH0949070 A JP H0949070A
Authority
JP
Japan
Prior art keywords
vapor deposition
jig
plating layer
plating
plastic substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22588395A
Other languages
Japanese (ja)
Inventor
Toshihiro Suzuki
敏浩 鈴木
Akiyoshi Yamagami
明美 山上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tanaka Kikinzoku Kogyo KK
Mitsubishi Chemical Corp
Mitsubishi Plastics Inc
Original Assignee
Tanaka Kikinzoku Kogyo KK
Mitsubishi Chemical Corp
Mitsubishi Plastics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tanaka Kikinzoku Kogyo KK, Mitsubishi Chemical Corp, Mitsubishi Plastics Inc filed Critical Tanaka Kikinzoku Kogyo KK
Priority to JP22588395A priority Critical patent/JPH0949070A/en
Publication of JPH0949070A publication Critical patent/JPH0949070A/en
Pending legal-status Critical Current

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  • Physical Vapour Deposition (AREA)

Abstract

PROBLEM TO BE SOLVED: To prevent the dislodgment of Au sticking to a substrate holder made of Cu onto a plastic substrate at the time of vapor deposition and to improve the yield of products by providing the surface of the holder with a Pt plating layer, then further, forming a metallic plating layer having good adhesion to Au at the time of depositing Au by evaporation on the substrate by using the holder. SOLUTION: This jig (substrate holder) for vapor deposition is formed of Cu or Cu alloy having good heat radiatability and the surface thereof is provided with the Pt plating layer. The surface of the Pt plating layer is further plated with any of Au, Ag, Cu or Ni. The thickness of the plating layer of Au, Ag, etc., formed on the Pt plating surface is specified to 0.1 to 1.0μm. Not only the yield of the products is improved but also the recovery of the Au sticking to the surface of the jig for vapor deposition by a treatment with chemical materials and move the regeneration of the jig are facilitated by the double layer plating treatment.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、スパッタリング、イオ
ンプレーティングなどに用いる蒸着用治具に係り、特に
CD、CDR等のプラスチック基材への真空薄膜を形成
するのに好適な蒸着用治具に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a vapor deposition jig used for sputtering, ion plating, etc., and is particularly suitable for forming a vacuum thin film on a plastic substrate such as CD or CDR. It is about.

【0002】[0002]

【従来の技術】スパッタリング、イオンプレーティン
グ、真空蒸着などに代表される真空薄膜形成技術は、半
導体産業に広く普及している。基材上に真空薄膜を形成
する際には、ホルダーと呼ばれる蒸着用治具に基材を装
着し、基材上に薄膜を形成するのが一般的である。蒸着
用治具の材質としては、ステンレスやチタニウムを使用
するのが一般的である。しかし、光ディスク等のプラス
チック基材に薄膜を形成する際には、放熱を良くして基
材の変形や変質を防止する為に、CuやCu合金よりな
る蒸着用治具が用いられている。CuやCu合金の蒸着
用治具に蒸着した蒸着物を剥すことは、サンドブラスト
法により行われている。Au又はAg等の貴金属がCu
又はCu合金の蒸着用治具に付着した場合も同様にサン
ドブラスト法により剥離を行うと、おおむね90%前後は
大きく剥がれた貴金属として回収することができる。し
かし、残りの約10%はエメリー内に混入してしまう。エ
メリー内に混入した貴金属を回収すれば、回収率を高め
ることができるが、多くの手間がかかる。全ての貴金属
を回収するには、王水や硝酸、シアン等の薬液で処理す
れば、貴金属を簡単に回収することができる。しかし、
CuやCu合金製の蒸着用治具は、耐蝕製が無いので台
材も溶解してしまい、蒸着用治具を再利用することがで
きなくなる。貴金属も高価な材料であるが、蒸着用治具
も高額であるので、通常は蒸着用治具の再生が可能な前
者の方法が採られている。
2. Description of the Related Art Vacuum thin film forming techniques represented by sputtering, ion plating, vacuum deposition and the like are widely used in the semiconductor industry. When forming a vacuum thin film on a base material, it is common to mount the base material on a deposition jig called a holder and form a thin film on the base material. Generally, stainless steel or titanium is used as the material of the deposition jig. However, when a thin film is formed on a plastic substrate such as an optical disk, a vapor deposition jig made of Cu or a Cu alloy is used in order to improve heat radiation and prevent deformation and deterioration of the substrate. Peeling off the deposited material deposited on the Cu or Cu alloy deposition jig is performed by a sandblast method. Noble metal such as Au or Ag is Cu
Alternatively, when the Cu alloy is attached to a jig for vapor deposition, if it is similarly peeled by the sandblast method, about 90% of the precious metal can be recovered as largely peeled precious metal. However, the remaining 10% is mixed in the emery. If the noble metal mixed into the emery is recovered, the recovery rate can be increased, but it takes much time and effort. To recover all the precious metals, the precious metals can be easily recovered by treating with a chemical solution such as aqua regia, nitric acid, or cyanide. But,
Since the evaporation jig made of Cu or Cu alloy does not have corrosion resistance, the base material is also melted, and the evaporation jig cannot be reused. Noble metals are also expensive materials, but vapor deposition jigs are also expensive, so the former method, which allows the vapor deposition jigs to be regenerated, is usually adopted.

【0003】このようなことから、本出願人は、Cu又
はCu合金よりなる蒸着用治具の表面に、Ptめっき層
を設けることにより、特にプラスチック基材への蒸着に
於いて、良好に放熱でき、プラスチック基材の変形を防
止でき、また蒸着時に蒸着用治具の表面にも蒸着したA
u、Ag、Pdを回収できると共に再生できる蒸着用治
具とその再生方法を開発した。(特願平6−28890
号参照) 然し乍ら、このPtめっき層を設けた蒸着用治具を用い
てプラスチック基材にAu蒸着を行うと、蒸着用治具表
面のPtとAuとの密着性が低い為に、作業中にAuが
剥脱するという問題が発生した。剥脱したAuはプラス
チック基材である被蒸着物の上に落下するなどしてCD
やCDR等の品質に支障を来す恐れがある。特にPtめ
っき前の蒸着用治具の表面をエッチング法により行った
ものについて多く発生している。この理由として、エッ
チング法を用いたものは、表面がより滑らかであり、さ
らにPtとAuとの密着強度を低下させているものと思
われる。
From the above, the applicant of the present invention satisfactorily dissipates heat by providing a Pt plating layer on the surface of a jig for vapor deposition made of Cu or Cu alloy, particularly in vapor deposition on a plastic substrate. It is possible to prevent the deformation of the plastic base material, and vapor-deposited on the surface of the vapor deposition jig during vapor deposition.
We have developed a vapor deposition jig that can recover and recycle u, Ag, and Pd, and a method for regenerating it. (Japanese Patent Application No. 6-28890
However, when Au vapor deposition is performed on a plastic substrate using the vapor deposition jig provided with this Pt plating layer, the adhesion between Pt and Au on the vapor deposition jig surface is low. The problem of Au exfoliation occurred. The exfoliated Au drops onto the material to be vapor-deposited, which is a plastic substrate, and then CDs.
There is a possibility that quality of CDR and CDR will be affected. In particular, many problems occur when the surface of the evaporation jig before Pt plating is performed by the etching method. It is considered that the reason for this is that the one using the etching method has a smoother surface and further reduces the adhesion strength between Pt and Au.

【0004】[0004]

【発明が解決しようとする課題】そこで本発明は、蒸着
用治具に装着したプラスチック基材へのAu蒸着時に蒸
着用治具に対するAuの密着強度を高め、Auの剥脱を
無くし、プラスチック基材への落下を無くしてCD、C
DR等の製品の不良発生を防止できるようにした蒸着用
治具を提供しようとするものである。
SUMMARY OF THE INVENTION Therefore, the present invention increases the adhesion strength of Au to the vapor deposition jig during vapor deposition of Au on the plastic substrate mounted on the vapor deposition jig and eliminates the exfoliation of Au. CD, C without falling to
An object of the present invention is to provide a deposition jig capable of preventing the occurrence of defects in products such as DR.

【0005】[0005]

【課題を解決するための手段】上記課題を解決するため
の本発明の蒸着用治具は、Cu又はCu合金よりなる蒸
着用治具の表面に、Ptめっき層が設けられ、そのPt
めっき層の表面にAu、Ag、Cu、Niのいずれかの
めっき層が設けられていることを特徴とするものであ
る。この蒸着用治具は、特にCD、CDR等のプラスチ
ック基材への真空薄膜形成用として好ましい。上記の蒸
着用治具に於けるめっき層の厚さは 0.1〜 1.0μmが好
ましい。
A vapor deposition jig of the present invention for solving the above-mentioned problems is provided with a Pt plating layer on the surface of a vapor deposition jig made of Cu or a Cu alloy.
It is characterized in that a plating layer of any one of Au, Ag, Cu and Ni is provided on the surface of the plating layer. This vapor deposition jig is particularly preferable for forming a vacuum thin film on a plastic substrate such as CD or CDR. The thickness of the plating layer in the above evaporation jig is preferably 0.1 to 1.0 μm.

【0006】[0006]

【作用】上記のように本発明の蒸着用治具は、Ptめっ
き層の表面に、Au、Ag、Cu、Niのいずれかの、
Auと密着性の良い金属のめっき層が設けられているの
で、蒸着用治具に装着したプラスチック基材へAu蒸着
した際、蒸着用治具にも装着されるAuの密着強度が高
くなる。従って、蒸着作業中Auの剥脱が無くなって、
プラスチック基材への落下が無くなり、CD、CDR等
の製品の不良発生率が大幅に減少する。
As described above, in the evaporation jig of the present invention, any one of Au, Ag, Cu and Ni is formed on the surface of the Pt plating layer.
Since the metal plating layer having good adhesion to Au is provided, when Au is vapor-deposited on the plastic substrate mounted on the evaporation jig, the adhesion strength of Au also mounted on the evaporation jig is increased. Therefore, there is no exfoliation of Au during the evaporation work,
Since it does not fall onto the plastic substrate, the incidence of defective products such as CDs and CDRs is greatly reduced.

【0007】[0007]

【実施例】本発明の蒸着用治具の実施例と従来例につい
て説明する。具体的な実施例に先立って、材料試験につ
いて説明すると、長さ40mm、幅20mm、厚さ 0.5mmのCu
製試験片を用意した。これに実施例1として、そのまま
脱脂、活性化処理を行った後、Ptめっき(プラチナー
ト 100:日本エレクトロプレイティング・エンジニヤー
ス社製使用)5μmを施し、水洗した後さらにAuめっ
き(オーロボンドTN:日本エレクトロプレイテンィグ
・エンジニヤース社製使用) 0.1μm施した。次に実施
例2のものとして、用意したCu製試験片にサンドブラ
スト処理を3分間行って粗面化した後、実施例1と同様
にPtめっき、次いでAuめっきを行った。また従来例
1として、用意したCu製試験片に脱脂、活性化処理を
行った後、Ptめっき5μmのみを施した。従来例2と
しては、用意したCu製試験片にサンドブラスト処理を
3分間行って粗面化した後、従来例1と同様にPtめっ
き5μmのみを施した。
EXAMPLES Examples and conventional examples of the evaporation jig of the present invention will be described. Prior to a concrete example, a material test will be described. Cu having a length of 40 mm, a width of 20 mm and a thickness of 0.5 mm is used.
Prepared test pieces were prepared. As Example 1, this was directly subjected to degreasing and activation treatment, then subjected to Pt plating (Platinate 100: used by Nippon Electroplating Engineering Co., Ltd.) 5 μm, washed with water, and further subjected to Au plating (Aurobond TN: Japan). Electroplating Engineering (manufactured by The Company)) 0.1 μm. Next, as in Example 2, the prepared Cu test piece was sandblasted for 3 minutes to roughen the surface, and then Pt-plated and then Au-plated as in Example 1. In addition, as Conventional Example 1, the prepared Cu test piece was subjected to degreasing and activation treatment, and then subjected to only Pt plating of 5 μm. In Conventional Example 2, a prepared Cu test piece was sandblasted for 3 minutes to roughen the surface, and then, similarly to Conventional Example 1, only Pt plating of 5 μm was applied.

【0008】以上用意した実施例1、実施例2、従来例
1及び従来例2の試験片にコンパクトディスクへのAu
蒸着を想定した条件でAuを1000回単位でスパッタリン
グした。1000回毎にAuの剥脱をおこしそうかどうかを
確認して、剥脱をおこしそうになる迄くり返した。まず
1000回Auスパッタリング被覆した試験片をAuの剥脱
を起こしてないか確認し、起こしてないものについてシ
アン系Au溶解液(シアン化カリウムと反応促進剤含
有)に50℃にて浸漬し乍ら空気を吹き込み、Au被覆を
溶解した。その後、実施例1及び2の試験片について
は、再度オーロボンドTNを用いてAuめっき 0.1μm
を施し、また従来例1及び2の試験片についてはそのま
ま、それぞれの試験片についてAuスパッタリングを行
った。このような工程をくり返し、何回スパッタリング
をくり返すまで、スパッタリング中にAuの剥脱を起こ
すようなことなくスパッタリングできたかを調べた結果
が表1である。
Au for compact discs was added to the test pieces prepared in Example 1, Example 2, Conventional Example 1 and Conventional Example 2.
Au was sputtered every 1000 times under the condition of vapor deposition. Every 1000 times, it was confirmed whether Au was likely to be exfoliated, and the process was repeated until it was about to be exfoliated. First
It is confirmed that the test piece coated with 1000 times Au sputtering does not exfoliate Au. If it does not occur, it is immersed in a cyan-based Au solution (containing potassium cyanide and a reaction accelerator) at 50 ° C and air is blown into it. , The Au coating was dissolved. After that, for the test pieces of Examples 1 and 2, Au plating 0.1 μm was again used using Aurobond TN.
The test pieces of Conventional Examples 1 and 2 were subjected to Au sputtering as they were. Table 1 shows the results of examining the number of times the sputtering was repeated until the sputtering was repeated until the Au was not exfoliated during the sputtering.

【0009】[0009]

【表1】 [Table 1]

【0010】表1より明らかなようにAuめっきを施し
た試験片は、施さないものに比べてスパッタリング可能
な回数が格段と向上している。
As is clear from Table 1, the number of times that sputtering is possible is significantly improved in the test piece plated with Au as compared with the test piece not plated with Au.

【0011】次に、具体的な実施例と従来例について説
明する。図1に示すように直径 140mm、厚さ12mmの円形
のCu製下片1の下面に複数の取付用のねじピン2が固
設され、上面外周部に断面逆L形の上部内径 115mm、下
部内径 120mm、外径 140mm、高さ8mmの環状のCu製上
片3が下側から止めねじ4にて固定されて、Cu製蒸着
用治具5が構成され、このCu製蒸着用治具5の表面に
従来例としてPtめっき層6が5μm施され、実施例と
してさらにそのPtめっき層6の上にAuめっき層7が
0.5μm施されている。この両蒸着用治具に、図2に示
すように中央部に内径15mmの円形穴8を有するドーナツ
形のプラスチック製基板9を図3に示すように装着し、
スパッタリングによりプラスチック製基板9にAuを蒸
着した。その結果蒸着用治具のプラスチック製基板装着
後に露出している外周面、上片3の上面及び内周面、下
片1の上面中央部に図4に示すようにAu10が付着し
た。上記スパッタリングによるプラスチック製基板9へ
のAuの蒸着作業中、従来例の蒸着用治具にあってはP
tめっき層6と蒸着Auとの密着強度が高くないため、
極く稀に、Auが剥脱し、これがプラスチック製基板9
の上に落下し、製品の品質に支障を来すことがあった
が、実施例の蒸着用治具にあっては、Auめっき層7と
蒸着Auとの密着強度が高い為、Auが全く剥脱せず、
従って、プラスチック製基板9の上に落下せず、製品の
品質は良好であった。
Next, specific examples and conventional examples will be described. As shown in Fig. 1, a plurality of mounting screw pins 2 are fixedly mounted on the lower surface of a circular Cu lower piece 1 having a diameter of 140 mm and a thickness of 12 mm. An annular Cu upper piece 3 having an inner diameter of 120 mm, an outer diameter of 140 mm, and a height of 8 mm is fixed from the lower side with a set screw 4 to form a Cu vapor deposition jig 5. The Cu vapor deposition jig 5 is formed. As a conventional example, a Pt plating layer 6 of 5 μm is applied to the surface of, and as an example, an Au plating layer 7 is further formed on the Pt plating layer 6.
0.5 μm is applied. A donut-shaped plastic substrate 9 having a circular hole 8 with an inner diameter of 15 mm in the central portion as shown in FIG. 2 was attached to both of these evaporation jigs as shown in FIG.
Au was vapor-deposited on the plastic substrate 9 by sputtering. As a result, as shown in FIG. 4, Au10 adhered to the outer peripheral surface of the evaporation jig that was exposed after the plastic substrate was mounted, the upper and inner peripheral surfaces of the upper piece 3, and the central portion of the upper surface of the lower piece 1. During the work of vapor deposition of Au on the plastic substrate 9 by the above-mentioned sputtering, in the conventional vapor deposition jig, P
Since the adhesion strength between the t-plated layer 6 and the evaporated Au is not high,
Very rarely, Au peels off and this is the plastic substrate 9
However, in the case of the vapor deposition jig of the example, since the adhesion strength between the Au plating layer 7 and the vapor deposition Au was high, Au was completely eliminated. Without exfoliation,
Therefore, the product did not fall onto the plastic substrate 9 and the product quality was good.

【0012】尚、本発明の蒸着用治具の上記実施例は、
Ptめっき層6の上にAuめっき層7が 0.5μm施され
ているが、Agめっき層、Cuめっき層、Niめっき層
などでも上記と同様の結果が得られる。これらめっき層
の厚さを 0.1〜 1.0μmとした理由は、 0.1μm未満で
は蒸着Auとの密着強度が不十分で、 1.0μm以上では
さらに密着強度が高くなることがなく、コスト高となる
からである。
The above-described embodiment of the vapor deposition jig of the present invention is
Although the Au plating layer 7 is applied to the Pt plating layer 6 by 0.5 μm, the same results as above can be obtained with an Ag plating layer, a Cu plating layer, a Ni plating layer, or the like. The reason for setting the thickness of these plating layers to 0.1 to 1.0 μm is that the adhesion strength with the vapor deposition Au is insufficient when the thickness is less than 0.1 μm, and the adhesion strength does not increase further when the thickness is 1.0 μm or more, resulting in high cost. Is.

【0013】[0013]

【発明の効果】以上の説明で判るように本発明の蒸着用
治具は、最外表面にAu、Ag、Cu、Niのいずれか
のめっき層が設けられているので、これに装着したプラ
スチック基材へのAu蒸着時に蒸着用治具に対するAu
の密着強度が高められ、Auの剥脱が無くなって、プラ
スチック基材への落下が無くなって、CD、CDR等の
製品の不良発生を防止できる。
As can be seen from the above description, the vapor deposition jig of the present invention has the plating layer of any one of Au, Ag, Cu, and Ni provided on the outermost surface thereof. Au for the jig for vapor deposition during Au vapor deposition on the substrate
It is possible to prevent the occurrence of defective products such as CDs and CDRs by eliminating the peeling of Au and eliminating the drop on the plastic substrate.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の蒸着用治具の実施例を示す図である。FIG. 1 is a view showing an embodiment of a vapor deposition jig of the present invention.

【図2】Auを蒸着するドーナツ形のプラスチック基板
を示す図である。
FIG. 2 is a diagram showing a donut-shaped plastic substrate on which Au is deposited.

【図3】図1の蒸着用治具に図2のプラスチック基板を
装着した状態を示す図である。
FIG. 3 is a diagram showing a state in which the plastic substrate of FIG. 2 is mounted on the vapor deposition jig of FIG.

【図4】図3の蒸着用治具に装着したプラスチック基板
にAuを蒸着した際に、蒸着用治具にAuが付着した状
態を示す図である。
FIG. 4 is a diagram showing a state in which Au is attached to a vapor deposition jig when Au is vapor deposited on a plastic substrate mounted on the vapor deposition jig shown in FIG.

【符号の説明】[Explanation of symbols]

5 Cu製蒸着用治具 6 Ptめっき層 7 Auめっき層 5 Cu deposition jig 6 Pt plating layer 7 Au plating layer

───────────────────────────────────────────────────── フロントページの続き (72)発明者 山上 明美 神奈川県平塚市長瀞2番14号 田中貴金属 工業株式会社平塚第二工場内 ─────────────────────────────────────────────────── ─── Continuation of front page (72) Inventor Akemi Yamagami 2-14 Mayor Toru, Hiratsuka, Kanagawa Tanaka Kikinzoku Kogyo Co., Ltd.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 Cu又はCu合金よりなる蒸着用治具の
表面に、Ptめっき層が設けられ、そのPtめっき層の
表面にAu、Ag、Cu、Niのいずれかのめっき層が
設けられていることを特徴とする蒸着用治具。
1. A Pt plating layer is provided on the surface of a vapor deposition jig made of Cu or a Cu alloy, and a plating layer of any one of Au, Ag, Cu, and Ni is provided on the surface of the Pt plating layer. A vapor deposition jig characterized in that
【請求項2】 請求項1記載の蒸着用治具が、プラスチ
ック基材への真空薄膜形成用であることを特徴とする蒸
着用治具。
2. A vapor deposition jig according to claim 1, which is for forming a vacuum thin film on a plastic substrate.
【請求項3】 請求項1又は2記載の蒸着用治具に於け
るめっき層の厚さが、 0.1〜 1.0μmであることを特徴
とする蒸着用治具。
3. The evaporation jig according to claim 1, wherein the plating layer has a thickness of 0.1 to 1.0 μm.
JP22588395A 1995-08-10 1995-08-10 Jig for vapor deposition Pending JPH0949070A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22588395A JPH0949070A (en) 1995-08-10 1995-08-10 Jig for vapor deposition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22588395A JPH0949070A (en) 1995-08-10 1995-08-10 Jig for vapor deposition

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JPH0949070A true JPH0949070A (en) 1997-02-18

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011508079A (en) * 2007-12-19 2011-03-10 アプライド マテリアルズ インコーポレイテッド Method for cleaning process kit and chamber, and method for recovering ruthenium
CN110541148A (en) * 2019-09-26 2019-12-06 深圳市华星光电半导体显示技术有限公司 Vacuum evaporation device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011508079A (en) * 2007-12-19 2011-03-10 アプライド マテリアルズ インコーポレイテッド Method for cleaning process kit and chamber, and method for recovering ruthenium
JP2014194085A (en) * 2007-12-19 2014-10-09 Quantam Global Technologies Llc Method for cleaning process kit and chamber, and method for recovering ruthenium
CN110541148A (en) * 2019-09-26 2019-12-06 深圳市华星光电半导体显示技术有限公司 Vacuum evaporation device

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