JPH09306710A - Chip network electronic component - Google Patents

Chip network electronic component

Info

Publication number
JPH09306710A
JPH09306710A JP11743596A JP11743596A JPH09306710A JP H09306710 A JPH09306710 A JP H09306710A JP 11743596 A JP11743596 A JP 11743596A JP 11743596 A JP11743596 A JP 11743596A JP H09306710 A JPH09306710 A JP H09306710A
Authority
JP
Japan
Prior art keywords
portions
flat
chip network
electronic component
concave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11743596A
Other languages
Japanese (ja)
Inventor
Masato Doi
眞人 土井
Yoshiji Matsumoto
美司 松本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm Co Ltd
Original Assignee
Rohm Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm Co Ltd filed Critical Rohm Co Ltd
Priority to JP11743596A priority Critical patent/JPH09306710A/en
Priority to US08/855,813 priority patent/US5844468A/en
Publication of JPH09306710A publication Critical patent/JPH09306710A/en
Pending legal-status Critical Current

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  • Apparatuses And Processes For Manufacturing Resistors (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Abstract

PROBLEM TO BE SOLVED: To enable reduction in the possibility that a micro crack is generated at a portion where a plane part and a bottom part cross each other, causing a crack in a protruding portion and isolating a chip network electronic component from an electrode. SOLUTION: This competent has a plurality of element, such as, resistors or capacitors, on the surface of a base, and a plurality of recessed parts one the outer periphery thereof, each of which includes a pair of plane parts 8A and a bottom part 8B continued to both plane parts 8A. Protruding parts between the recessed parts are formed as electrodes. In this case, by chamfering a part where the plane part 8A and the bottom part 8B of the recessed part cross each other, so as to have a radius greater than 0.1mm, generation of a crack in the protruding part is prevented to reduce the possibility of a defective product.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、例えば複数の抵抗
やコンデンサ、並びにコイル等を備えたチップネットワ
ーク電子部品、または前記抵抗、コンデンサ、コイル等
を組み合わせた複合チップネットワーク電子部品および
その製造方法に係わる。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to, for example, a chip network electronic component provided with a plurality of resistors and capacitors, a coil and the like, or a composite chip network electronic component in which the resistors, capacitors and coils are combined and a manufacturing method thereof. Involve

【0002】[0002]

【従来の技術】従来、この種のチップネットワーク電子
部品としては、複数の抵抗素子を備えたチップネットワ
ーク抵抗器が知られている。このチップネットワーク抵
抗器を例にとって、図5乃至図9に基づき以下に従来の
技術を説明する。図5に示す符号20はネットワーク抵
抗器用のセラミック等の絶縁性を有する板厚を有する基
板で、該基板20はアルミ等の焼成用のいわゆるグリー
ンシート状基板20の上面及び下面に予め製品となる大
きさの略矩形状の基体21に分割(ブレーク)し、且つ
そのブレークを容易にするため、縦スリット線22と横
スリット線23とを刻み設け、更に前記縦横スリット2
2、23との交点及び縦スリットの中途に、平面視長方
形状の孔28を基板20の板厚を貫通するように施した
後、摂氏700度程度の高温で焼成してなる。
2. Description of the Related Art Conventionally, as a chip network electronic component of this type, a chip network resistor having a plurality of resistance elements has been known. Taking this chip network resistor as an example, a conventional technique will be described below with reference to FIGS. Reference numeral 20 shown in FIG. 5 is a substrate having a plate thickness having an insulating property such as a ceramic for a network resistor. The substrate 20 is a product on the upper and lower surfaces of a so-called green sheet substrate 20 for firing such as aluminum in advance. The substrate 21 is divided into a substantially rectangular base body 21 (break), and in order to facilitate the break, vertical slit lines 22 and horizontal slit lines 23 are provided on the base 21.
A rectangular hole 28 having a rectangular shape in plan view is formed so as to penetrate the plate thickness of the substrate 20 at the intersection with the lines 2 and 23 and in the middle of the vertical slit, and then baked at a high temperature of about 700 degrees Celsius.

【0003】このように形成した基板20の表面に、図
示しない例えば酸化ルテニュウムなどを主成分とした抵
抗体層と、その抵抗体層に通電する表面電極層29A、
前記抵抗体層と表面電極29の一部を覆う保護層30を
印刷や蒸着などにより設けた後、前記縦スリット22に
沿って基板20を割り、短冊状の複数の基板に分離す
る。
On the surface of the substrate 20 thus formed, a resistor layer (not shown) whose main component is, for example, ruthenium oxide, and a surface electrode layer 29A for energizing the resistor layer,
After providing a protective layer 30 covering a part of the resistor layer and the surface electrode 29 by printing or vapor deposition, the substrate 20 is divided along the vertical slits 22 and divided into a plurality of strip-shaped substrates.

【0004】このように分離された複数の基板の側面に
印刷焼成によって、側面電極29Bを設け、更に前記横
スリット23で分離し、一つ一つのチップネットワーク
抵抗器に分離する。このように分離され外部に露出した
チップネットワーク抵抗器の電極29表面部分をNiと
半田でメッキして完成品とされる。この完成品のチップ
ネットワ−クの外観平面図を図6に示すが、この図に示
すように外観は、基体21の外周から複数の電極29が
突出し、結果的に電極29、29間に凹状部を有し、凹
状部の間に凸状部21Aが形成される。この凹状部の形
状については後で詳述する。
Side electrodes 29B are provided by printing and baking on the side surfaces of the plurality of substrates thus separated, and further separated by the lateral slits 23 to separate each chip network resistor. The surface of the electrode 29 of the chip network resistor that is separated and exposed to the outside in this way is plated with Ni and solder to complete the product. FIG. 6 is an external plan view of the chip network of this finished product. As shown in FIG. 6, the external appearance is such that a plurality of electrodes 29 project from the outer periphery of the base 21 and, as a result, a concave shape is formed between the electrodes 29, 29. 21A of convex portions are formed between the concave portions. The shape of this concave portion will be described in detail later.

【0005】また、上述したようなネットワーク抵抗器
においては、同様に回路基板の配線パターン上に実装さ
れる他のICの電極ピッチと均一化を図り、この電極ピ
ッチと電極29、29間の寸法を同一にする必要性か
ら、隣合う電極29、29の間隔P2を0.3から0.
5mmの極狭くに設定されている。また、基板20の厚
みも非常に薄く0.5、0.4、0.3mmのセラミッ
ク基板が用いられる。
Further, in the network resistor as described above, the electrode pitch of other ICs similarly mounted on the wiring pattern of the circuit board is made uniform, and the dimension between this electrode pitch and the electrodes 29, 29. Therefore, the interval P2 between the adjacent electrodes 29 is set to 0.3 to 0.
It is set to an extremely narrow 5 mm. The thickness of the substrate 20 is also very thin, and a ceramic substrate of 0.5, 0.4, or 0.3 mm is used.

【0006】このように、電極29の間隔を0,5mm
以下にするとネットワーク抵抗をガラエポ等からなる回
路基板の配線パターンに半田付けする場合、その半田に
より隣合う電極同士が短絡されてしまうなどの恐れがあ
り、このような問題を改善するため、本願出願人は特公
平5−243020号または米国特許第5、334、9
68号に示すように、従来の丸孔や小判状孔から平面視
長方形状の孔28に変更することを提案している。
As described above, the distance between the electrodes 29 is 0.5 mm.
When soldering the network resistance to the wiring pattern of the circuit board made of glass epoxy or the like as described below, there is a fear that adjacent electrodes may be short-circuited by the solder, and in order to improve such a problem, the present application Person is Japanese Patent Publication No. 5-243020 or US Pat. No. 5,334,9.
As shown in No. 68, it is proposed to replace the conventional round hole or oval hole with a hole 28 having a rectangular shape in plan view.

【0007】前述した孔の形状を平面視長方形状の孔2
8に変更することによって、図8に示すように、対向す
る一対の直線状の平面部28A、28Aと、この平面部
28A、28Aと直交する底部28Bとが形成される。
一つのチップネットワーク抵抗器になる段階では、平面
部28A、28Aがそれぞれその中央部で2つに分離さ
れ、図6に示すように前述した凹状部が形成される。こ
のように、凹状部が一つの直線状の底部28Bと、これ
と直交する一対の平面部28Aとで構成することによ
り、前述した実装時の半田による短絡の問題が低減でき
る。このように低減できるのは実験的に判っているので
あるが、その技術的理由は様々考えられ、その一つを図
10に基づいて説明する。
The hole 2 described above has a rectangular shape in plan view.
By changing the number to 8, the pair of linear flat portions 28A and 28A facing each other and the bottom portion 28B orthogonal to the flat portions 28A and 28A are formed as shown in FIG.
In the step of becoming one chip network resistor, the plane portions 28A and 28A are divided into two at the central portions thereof, respectively, and the above-mentioned concave portions are formed as shown in FIG. As described above, by forming the concave portion with one linear bottom portion 28B and the pair of flat surface portions 28A orthogonal to the concave bottom portion 28B, it is possible to reduce the above-described problem of short circuit due to solder during mounting. It is experimentally known that such reduction can be achieved, but various technical reasons are conceivable, one of which will be described with reference to FIG.

【0008】電極29、29間の距離は、前述したよう
に他の配線パターン間隔と均一化を図る必要から0.5
mm以下に制限されるため、短絡を起こさないように大
きくとることはできない。しかし、電極29、29間を
上述したように一つの直線状の底部28Bと、これと直
交する一対の平面部28Aとで構成される凹状部で分離
することによって、基体21に沿った実質的な電極間距
離が長くとることができる。つまり、半田の伝搬は、図
7の矢印の方向に沿って、平面部28Aから底面部28
B、そして平面部28Aへと伝搬するから、半田の伝搬
する実質的な電極29、29間距離を延長できるのであ
る。例えば、前記凹状部を一点鎖線Kに示すような従来
(例えば、実開昭61−37994号参照)の半円状の
場合では、前述した平面部が平行していないことや底面
部が存在しないことから、実質的な電極間距離は前述し
た凹状部の構成に比べ、電極29、29間の直線距離と
その実質的半田の伝搬距離が略同じであるため、短絡の
恐れが高い。
The distance between the electrodes 29, 29 is 0.5 because it is necessary to make it uniform with other wiring pattern intervals as described above.
Since it is limited to mm or less, it cannot be made large so as not to cause a short circuit. However, as described above, the electrodes 29, 29 are separated from each other by the concave portion composed of the one linear bottom portion 28B and the pair of flat surface portions 28A orthogonal to the linear bottom portion 28B. The distance between the electrodes can be long. That is, the solder is propagated from the flat surface portion 28A to the bottom surface portion 28 along the direction of the arrow in FIG.
Since it propagates to B and the plane portion 28A, it is possible to extend the substantial distance between the electrodes 29 where solder propagates. For example, in the case of a conventional semi-circular shape where the concave portion is shown by the one-dot chain line K (see, for example, Japanese Utility Model Laid-Open No. 61-37994), the above-mentioned flat portions are not parallel and there is no bottom portion. Therefore, compared with the configuration of the concave portion described above, the substantial inter-electrode distance is substantially the same in the linear distance between the electrodes 29 and 29 and the substantial solder propagation distance, and thus the possibility of short circuit is high.

【0009】[0009]

【発明が解決しようとする課題】しかしながら、前述し
たように一対の平面部28Aと底面部28Bとからなる
凹状部を形成した場合、その凹状部間に形成される凸状
部の強度は、前記実開昭61−37994号のように半
円状の凹状部間に形成した凸状部の強度に比べて、その
強度が小さくなる。これを解消するには、電極29の幅
P1を大きくすることが考えられるが、実装する配線パ
ターンピッチとの関係から1mm以下(通常0.5mm
程度)の幅しかとれず大きくできない問題がある。この
ように凸状部21Aの強度が低いと、製造工程中(例え
ば、バレル等のメッキ時、または図9に示す測定端子3
1を上方から100g重程度の圧力によって押し当て、
抵抗値を測定する抵抗値測定時、並びに搬送時)に凸状
部21Aが割れて基体21から分離してしまい電極29
が一部なくなってしまったり、図8に示すように平面部
28Aと底面部28Bとの交点部分にマイクロクラック
が発生し凸状部21Aの割れの原因になることがある。
However, as described above, in the case where the concave portion formed of the pair of flat surface portions 28A and the bottom surface portion 28B is formed, the strength of the convex portion formed between the concave portions is the same as that described above. The strength is smaller than the strength of the convex portions formed between the semicircular concave portions as in Japanese Utility Model Laid-Open No. 61-37994. To solve this, it is conceivable to increase the width P1 of the electrode 29, but it is 1 mm or less (usually 0.5 mm in view of the wiring pattern pitch to be mounted).
There is a problem that it can not be increased because it can only take the width of (degree). When the strength of the convex portion 21A is low as described above, during the manufacturing process (for example, during plating of a barrel or the like, or the measuring terminal 3 shown in FIG. 9).
1 is pressed from above with a pressure of about 100 g,
When the resistance value is measured (and when the resistance value is measured), the convex portion 21A is cracked and separated from the base 21.
May disappear, or microcracks may occur at the intersections of the flat surface portion 28A and the bottom surface portion 28B, as shown in FIG. 8, causing breakage of the convex portion 21A.

【0010】[0010]

【課題を解決するための手段】前述の問題点を解決する
ために、本願の請求項1に記載した発明は、基体の表面
に複数の抵抗またはコンデンサ等の素子を備えるととも
に、その外周に一対の平面部と両平面部につながる底面
部とからなる凹状部を複数有し、前記凹状部間の凸状部
を電極としてなるチップネットワーク電子部品であっ
て、前記凹状部の平面部と底面部とが交わる部位を半径
0.1より大きい面取り形状としてなることを特徴とし
ている。通常セラミック基板を矩形状に内抜く場合、そ
の加工時(例えば焼成時など)に角部でクラックが生じ
ないように、半径0.08mm程度の面取りを行うこと
が推奨されるが、チップネットワーク電子部品の製造過
程でクラックなどの問題を生じることを低減するには
0.1mmより大きい面取りをする必要がある。
In order to solve the above-mentioned problems, the invention described in claim 1 of the present application has a plurality of elements such as resistors or capacitors on the surface of a substrate, and a pair of elements on the outer periphery thereof. Is a chip network electronic component having a plurality of concave portions each including a flat surface portion and a bottom surface portion connected to both flat surface portions, and a convex portion between the concave portions is an electrode, wherein the flat surface portion and the bottom surface portion of the concave portion It is characterized in that the portion where is intersected with has a chamfered shape with a radius larger than 0.1. Normally when chamfering a ceramic substrate in a rectangular shape, chamfering with a radius of about 0.08 mm is recommended so that cracks do not occur at the corners during processing (for example, during firing). In order to reduce the occurrence of problems such as cracks in the manufacturing process of parts, it is necessary to chamfer more than 0.1 mm.

【0011】また、請求項2では、基体の表面に複数の
抵抗またはコンデンサ等の素子を備えるとともに、その
外周に一対の平面部と両平面部につながる底面部とから
なる凹状部を複数有し、前記凹状部間の凸状部を電極と
してなるチップネットワークであって、前記凹状部の向
かい合う一対の平面部は略平行に配置され、両平面部の
距離P2が0.5mmより小さく、その平面部と底面部
とが交わる部位を半径0.1より大きい面取り形状とし
てなることを特徴としている。請求項3では、請求項2
のチップネットワーク電子部品において、前記凸状部の
電極の幅P1が前記平面部の距離P2より大きく設定す
るようにしている。
Further, according to the present invention, a plurality of elements such as resistors or capacitors are provided on the surface of the base body, and a plurality of concave portions having a pair of flat portions and a bottom portion connected to both flat portions are provided on the outer periphery thereof. A pair of plane portions facing each other of the concave portions are arranged substantially parallel to each other, and a distance P2 between the two flat portions is smaller than 0.5 mm. It is characterized in that a portion where the portion and the bottom portion intersect each other has a chamfered shape having a radius larger than 0.1. In claim 3, claim 2
In the above chip network electronic component, the width P1 of the electrode of the convex portion is set to be larger than the distance P2 of the plane portion.

【0012】前記基体の表面に形成する素子を電極と一
体的に形成した導体とするれば、ジャンパーチップネッ
トワークとしてのネットワーク電子部品にも適用するこ
とが可能であることは言うまでもない。
It goes without saying that if the element formed on the surface of the base is a conductor integrally formed with the electrode, it can be applied to a network electronic component as a jumper chip network.

【0013】[0013]

【発明の実施の形態】以下本発明のチップネットワーク
電子部品に抵抗素子を備えるに適用した場合の一つの実
施の形態を図1乃至図4に基づいて説明する。図1に示
すのがチップネットワーク抵抗器の平面図、図2に示す
のが図1のA−A断面図、図3に示すのがB−B断面図
である。
BEST MODE FOR CARRYING OUT THE INVENTION One embodiment in the case of applying a resistance element to a chip network electronic component of the present invention will be described below with reference to FIGS. 1 is a plan view of the chip network resistor, FIG. 2 is a sectional view taken along the line AA of FIG. 1, and FIG. 3 is a sectional view taken along the line BB.

【0014】平面視矩形状の基体1の表面に複数の抵抗
素子2を備えるとともに、その外周Mの内の対向する2
つの辺M1、M1に、一対の平面部8A、8Aと両平面
部8A、8Aにつながる底面部8Bとからなる凹状部8
を複数有し、前記凹状部間の凸状部9を電極としてなる
チップネットワークであって、前記凹状部の向かい合う
一対の平面部8A、8Aは略平行に配置されている。前
記抵抗素子2は酸化ルテニュウム等の抵抗材料を印刷に
て形成し、レーザトリミング等によって抵抗値調整を行
うか、叉は蒸着によって抵抗材料を所定の抵抗値になる
ように設けるかされ、その上部には、抵抗素子2の保護
のために、ガラス叉は樹脂の被覆層3によって保護され
る。
A plurality of resistance elements 2 are provided on the surface of a base 1 having a rectangular shape in a plan view, and two of the resistance elements 2 facing each other in the outer periphery M thereof are provided.
On one side M1, M1, a concave portion 8 including a pair of flat surface portions 8A, 8A and a bottom surface portion 8B connected to both flat surface portions 8A, 8A.
Is a chip network having a plurality of convex portions 9 between the concave portions as electrodes, and the pair of flat surface portions 8A, 8A facing each other of the concave portions are arranged substantially in parallel. The resistance element 2 is formed by printing a resistance material such as ruthenium oxide and adjusting the resistance value by laser trimming or by vapor deposition or by providing the resistance material so as to have a predetermined resistance value. In order to protect the resistance element 2, it is protected by the glass or resin coating layer 3.

【0015】前記両平面部8A、8Aの距離P2は、本
実施の態様で0.3mm、その平面部8Aと底面部8B
とが交わる部位を半径0.1mmより大きい面取り形状
としてなる。このように0.1mm以上の面取り形状と
すれば、前述した図12で説明した従来のように、前記
交わる部位にクラックが生じて凸状部9が割れ、基体1
から分離されるといった恐れを低減できる。実験によれ
ば、測定時や搬送時の割れがほとんどなくすことが可能
となる。
The distance P2 between the flat portions 8A and 8A is 0.3 mm in this embodiment, and the flat portion 8A and the bottom portion 8B are the same.
The portion where is intersected with has a chamfered shape with a radius larger than 0.1 mm. If the chamfered shape is 0.1 mm or more in this way, as in the conventional case described with reference to FIG.
The risk of being separated from According to the experiment, it is possible to almost eliminate cracks during measurement and during transportation.

【0016】また、本実施の態様では、図1に示す凸状
部の電極9の幅P1は、前記P2より大きい0.5mm
としてあるが、このようにP1>P2として電極幅をで
きるだけ大きくすることによって、クラックによる割れ
の影響を少なくすることができる。さらに、凹状部8は
一対の平面部8A、8Aと両平面部8A、8Aにつなが
る底面部8Bとからなるように構成することによって、
このチップネットワーク抵抗器を実装する回路基板の配
線パターン間のピッチが0.5mm以下のファインピッ
チであっても、隣合う電極9、9間の実質的距離(図8
の矢印参照)を大きくすることができるので、半田リフ
ロー等の半田付けやメッキ時の短絡の問題を低減できる
メリットがある。図1および図2において、9Aは表面
電極、9Bは側面電極、9Cは裏面電極であり、側面電
極9Bは印刷にて形成される結果、前記平面部8Aの一
部に被るような構成Oとなる。
Further, in the present embodiment, the width P1 of the electrode 9 of the convex portion shown in FIG. 1 is 0.5 mm larger than the width P2.
However, by making the electrode width as large as possible such that P1> P2, it is possible to reduce the influence of cracking. Further, the concave portion 8 is constituted by a pair of flat surface portions 8A, 8A and a bottom surface portion 8B connected to both flat surface portions 8A, 8A,
Even if the pitch between the wiring patterns of the circuit board on which the chip network resistor is mounted is a fine pitch of 0.5 mm or less, the substantial distance between the adjacent electrodes 9 (see FIG. 8).
(See arrow) can be increased, and there is an advantage that the problem of short circuit during soldering or plating such as solder reflow can be reduced. In FIGS. 1 and 2, 9A is a front surface electrode, 9B is a side surface electrode, 9C is a back surface electrode, and the side surface electrode 9B is formed by printing. Become.

【0017】前記凹状部8の半径0.1mmより大きい
面取りをした平面部8Aと底面部8Bとの交わる部位は
次のようにして形成される。基体1の材料となるセラミ
ックは、アルミナ粉末をバインダ及び溶剤とを混合した
液状粘性物を、例えばスプレッダーのロール上にドクタ
ーブレード法等により厚みを調整して薄く伸ばし、乾燥
してシート状に成形して未焼成セラミックシート混ぜ合
わせた、いわゆるグリーンシートを焼成して形成される
が、前記凹状部は、図4に示す金型10で焼成前の状態
時に打ち抜きによって形成される。そして、前記平面部
8Aと底面部8Bとの交わる部位の形状(0.1mmよ
り大きい面取り形状)は金型10の角部分10Aが転写
して形成される。
A portion where the flat surface portion 8A and the bottom surface portion 8B, which are chamfered and have a radius larger than 0.1 mm of the concave portion 8, intersect with each other is formed as follows. The ceramic used as the material of the base 1 is a liquid viscous material in which alumina powder is mixed with a binder and a solvent, for example, is spread on a roll of a spreader by adjusting the thickness by a doctor blade method or the like, dried, and formed into a sheet. Then, a so-called green sheet, which is a mixture of unfired ceramic sheets, is fired to be formed, and the concave portion is formed by punching in the die 10 shown in FIG. 4 before firing. The shape of the portion where the flat surface portion 8A and the bottom surface portion 8B intersect (the chamfered shape larger than 0.1 mm) is formed by transferring the corner portion 10A of the mold 10.

【0018】前述したように、グリーンシートに矩形状
の穴をあける場合、焼成時に角部でクラックが生じない
ように半径0.08mm程度の面取りをすることが推奨
されるが、このような面取りでは製造過程でのバレルメ
ッキや測定時の負荷によってクラックが発生し、完成品
をテーピングに電極が分離した(不良)状態で収納され
てしまう問題に鑑み、試行錯誤の結果、半径0.1mm
より大きい面取りをした場合、前述したような不良の問
題がほとんどなくなることが判明した。
As described above, when making a rectangular hole in the green sheet, it is recommended to chamfer with a radius of about 0.08 mm so that cracks do not occur at the corners during firing, but such chamfering is recommended. In view of the problem that cracks occur due to barrel plating during the manufacturing process and the load during measurement, and the finished product is stored in the taping with the electrodes separated (defective), the result of trial and error is a radius of 0.1 mm.
It was found that when the chamfering was performed to a larger extent, the problem of defects as described above was almost eliminated.

【0019】[0019]

【発明の効果】本発明のような構成を採ることにより、
平面部と底面部とが交わる部位にマイクロクラックが発
生して、凸状部が割れてチップネットワーク電子部品が
ら電極が分離されるなどの恐れが低減できる効果を奏す
る。
By adopting the configuration as in the present invention,
There is an effect that it is possible to reduce the risk that microcracks are generated at the intersection of the flat surface portion and the bottom surface portion, the convex portion is broken, and the electrodes are separated from the chip network electronic component.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のチップネットワーク抵抗器の平面図で
ある。
FIG. 1 is a plan view of a chip network resistor of the present invention.

【図2】図1のA−A断面図である。FIG. 2 is a sectional view taken along line AA of FIG.

【図3】図1のB−B断面図である。FIG. 3 is a sectional view taken along line BB of FIG. 1;

【図4】グリーンシートを打ち抜く金型を示す斜視図で
ある。
FIG. 4 is a perspective view showing a die for punching out a green sheet.

【図5】個々のチップネットワーク抵抗器に分離する状
態を示す部分斜視図である。
FIG. 5 is a partial perspective view showing a state of being separated into individual chip network resistors.

【図6】従来のチップネットワーク抵抗器の平面図であ
る。
FIG. 6 is a plan view of a conventional chip network resistor.

【図7】凹状部の拡大斜視図である。FIG. 7 is an enlarged perspective view of a concave portion.

【図8】従来の問題点を説明する説明図である。FIG. 8 is an explanatory diagram illustrating a conventional problem.

【図9】従来の問題点を説明する説明図である。FIG. 9 is an explanatory diagram illustrating a conventional problem.

【符号の説明】[Explanation of symbols]

28B・・・・底面部 28A・・・・平面部 10 ・・・・金型 10A・・・・角部分 28B ... ・ Bottom part 28A ・ ・ ・ ・ Flat part 10 ・ ・ ・ ・ ・ ・ Mold 10A ・ ・ ・ ・ Corner

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 基体の表面に複数の抵抗またはコンデン
サ等の素子を備えるとともに、その外周に一対の平面部
と両平面部につながる底面部とからなる凹状部を複数有
し、前記凹状部間の凸状部を電極としてなるチップネッ
トワーク電子部品であって、前記凹状部の平面部と底面
部とが交わる部位を半径0.1mmより大きい面取り形
状としてなることを特徴とするチップネットワーク電子
部品。
1. A substrate is provided with a plurality of elements such as resistors or capacitors on the surface thereof, and a plurality of concave portions each having a pair of flat portions and a bottom portion connected to both flat portions are provided on the outer periphery thereof, and between the concave portions. Is a chip network electronic component using the convex portion as an electrode, and a portion where the flat portion and the bottom portion of the concave portion intersect each other has a chamfered shape with a radius larger than 0.1 mm.
【請求項2】 基体の表面に複数の抵抗またはコンデン
サ等の素子を備えるとともに、その外周に一対の平面部
と両平面部につながる底面部とからなる凹状部を複数有
し、前記凹状部間の凸状部を電極としてなるチップネッ
トワーク電子部品であって、前記凹状部の向かい合う一
対の平面部は略平行に配置され、両平面部の距離P2が
0.5mmより小さく、その平面部と底面部とが交わる
部位を半径0.1mmより大きい面取り形状としてなる
ことを特徴とするチップネットワーク電子部品。
2. A substrate is provided with a plurality of elements such as resistors or capacitors on the surface thereof, and a plurality of concave portions each having a pair of flat surface portions and a bottom surface portion connected to both flat surface portions are provided on the outer periphery thereof, and between the concave portions Is a chip network electronic component using the convex portions as electrodes, and the pair of flat portions facing each other of the concave portions are arranged substantially parallel to each other, and the distance P2 between the flat portions is less than 0.5 mm, and the flat portions and the bottom surface are A chip network electronic component having a chamfered shape with a radius larger than 0.1 mm at a portion where the parts intersect.
【請求項3】 請求項2のチップネットワーク電子部品
において、前記凸状部の電極の幅P1が前記平面部の距
離P2より大きく設定されていることを特徴とするチッ
プネットワーク電子部品。
3. The chip network electronic component according to claim 2, wherein a width P1 of the electrode of the convex portion is set to be larger than a distance P2 of the flat portion.
JP11743596A 1996-05-13 1996-05-13 Chip network electronic component Pending JPH09306710A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP11743596A JPH09306710A (en) 1996-05-13 1996-05-13 Chip network electronic component
US08/855,813 US5844468A (en) 1996-05-13 1997-05-12 Chip network electronic component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11743596A JPH09306710A (en) 1996-05-13 1996-05-13 Chip network electronic component

Publications (1)

Publication Number Publication Date
JPH09306710A true JPH09306710A (en) 1997-11-28

Family

ID=14711584

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11743596A Pending JPH09306710A (en) 1996-05-13 1996-05-13 Chip network electronic component

Country Status (1)

Country Link
JP (1) JPH09306710A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6117141A (en) * 1998-01-05 2000-09-12 Asahi Kogaku Kogyo Kabushiki Kaisha Endoscopic drainage tube holder
JP2001015309A (en) * 1999-06-28 2001-01-19 Kooa T & T Kk Composite electronic component
US7227443B2 (en) 2002-10-31 2007-06-05 Rohm Co., Ltd. Fixed network resistor
WO2013111497A1 (en) * 2012-01-27 2013-08-01 ローム株式会社 Chip component
JP2014072239A (en) * 2012-09-27 2014-04-21 Rohm Co Ltd Chip component

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6117141A (en) * 1998-01-05 2000-09-12 Asahi Kogaku Kogyo Kabushiki Kaisha Endoscopic drainage tube holder
JP2001015309A (en) * 1999-06-28 2001-01-19 Kooa T & T Kk Composite electronic component
US7227443B2 (en) 2002-10-31 2007-06-05 Rohm Co., Ltd. Fixed network resistor
WO2013111497A1 (en) * 2012-01-27 2013-08-01 ローム株式会社 Chip component
JP2013232620A (en) * 2012-01-27 2013-11-14 Rohm Co Ltd Chip component
US9646747B2 (en) 2012-01-27 2017-05-09 Rohm Co., Ltd. Chip component
US10210971B2 (en) 2012-01-27 2019-02-19 Rohm Co., Ltd. Chip component
US10763016B2 (en) 2012-01-27 2020-09-01 Rohm Co., Ltd. Method of manufacturing a chip component
JP2014072239A (en) * 2012-09-27 2014-04-21 Rohm Co Ltd Chip component

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