JPH09298181A - Substrate rear surface washer - Google Patents

Substrate rear surface washer

Info

Publication number
JPH09298181A
JPH09298181A JP11223596A JP11223596A JPH09298181A JP H09298181 A JPH09298181 A JP H09298181A JP 11223596 A JP11223596 A JP 11223596A JP 11223596 A JP11223596 A JP 11223596A JP H09298181 A JPH09298181 A JP H09298181A
Authority
JP
Japan
Prior art keywords
substrate
cleaning
chuck
backside
back surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11223596A
Other languages
Japanese (ja)
Inventor
Hidenori Miyamoto
英典 宮本
Yasuji Ueda
康爾 上田
Susumu Okano
進 岡野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Ohka Kogyo Co Ltd
Original Assignee
Tokyo Ohka Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Ohka Kogyo Co Ltd filed Critical Tokyo Ohka Kogyo Co Ltd
Priority to JP11223596A priority Critical patent/JPH09298181A/en
Publication of JPH09298181A publication Critical patent/JPH09298181A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To wash the rear surface of a substrate and wash the edge of the substrate in a same station by a method wherein a spinner chuck is employed as a chuck which holds the substrate so as to be able to rotate and, further, a mechanism for washing the circumferential edge of the substrate is provided. SOLUTION: A spinner chuck 6 is made to ascend above a washing table 2 and, at that position, a substrate W is attracted and held by the spinner chuck 6 at the center of the rear surface. Then the spinner chuck 6 is made to descend a little and, when the level of the substrate W reaches a level a little lower than the level of the upper edge of a case 1, the descend of the spinner chuck 6 is temporarily stopped and, at that position, washing solution is spouted out of an edge washing nozzle 15 against the edge part of the substrate W while the substrate W is made to rotate by the spinner chuck 6 to remove excessive coating film formed along the circumferential edge of the upper surface of the substreate W. Then the spinner chuck 6 is further made to descend and the substrate W is transferred onto the washing table 2. In this state, a gap is formed between the upper surface of the spinner chuck 6 and the rear surface of the substrate W. Then, in that state, the washing solution is spouted out of a washing nozzle against the rear surface of the substrate W to wash the whole rear surface of the substrate w.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は半導体基板やガラス
基板の裏面を洗浄する装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for cleaning the back surface of a semiconductor substrate or glass substrate.

【0002】[0002]

【従来の技術】例えば、フォトリソグラフィによって所
定パターンのマスクを形成するには、ステージに基板を
セットして露光する工程がある。この露光工程において
基板裏面に埃等が付着していると、ステージにセットし
た際に基板の水平度を出すことができず、露光精度が低
下する。そこで、特開平3−30426号公報等に基板
裏面を洗浄する技術が開示されている。
2. Description of the Related Art For example, in order to form a mask having a predetermined pattern by photolithography, there is a step of setting a substrate on a stage and exposing it. If dust or the like adheres to the back surface of the substrate in this exposure step, the levelness of the substrate cannot be obtained when it is set on the stage, and the exposure accuracy is reduced. Therefore, a technique for cleaning the back surface of the substrate is disclosed in Japanese Patent Laid-Open No. 3-30426.

【0003】一方、スピンナーによる感光性樹脂の塗
布、あるいは基板周縁部に形成された塗膜を除去するエ
ッジ洗浄は基板を回転しつつ行っている。このように基
板を回転させつつ作業をするために、従来は基板の裏面
中央をスピンナーチャックで吸着保持した状態で行って
いる。
On the other hand, application of a photosensitive resin by a spinner or edge cleaning for removing a coating film formed on the peripheral portion of the substrate is performed while rotating the substrate. In order to perform the work while rotating the substrate in this manner, conventionally, it is performed in a state where the center of the back surface of the substrate is suction-held by a spinner chuck.

【0004】[0004]

【発明が解決しようとする課題】上記した回転塗布やエ
ッジ洗浄と基板の裏面洗浄とを同一のステージで行う場
合には、従来にあっては常に基板裏面をチャックで吸着
保持しているため、チャックと接触している部分につい
ては洗浄できないことになる。そして、チャックと接触
している部分に埃などが付着していると、そのまま露光
工程に持ち越されることになる。
When the above-mentioned spin coating and edge cleaning and the back surface cleaning of the substrate are performed on the same stage, the back surface of the substrate is always sucked and held by a chuck in the conventional case. The part in contact with the chuck cannot be cleaned. If dust or the like adheres to the portion in contact with the chuck, it will be carried over to the exposure process as it is.

【0005】[0005]

【課題を解決するための手段】上記課題を解決すべく本
発明に係る基板の裏面洗浄装置は、基板の下面を支持す
る突起を備え且つ中央に開口を形成した洗浄テーブル
と、前記開口に対し出没可能とされ上昇位置で洗浄テー
ブルよりも高い位置で基板裏面を支持し、下降位置で洗
浄テーブル上に基板を移載したのち基板裏面との間に隙
間を形成するチャックと、このチャックの中心穴内に配
置され、その上端部には洗浄液噴出口が形成された洗浄
ノズルにて洗浄装置を構成した。
SUMMARY OF THE INVENTION To solve the above problems, a substrate backside cleaning apparatus according to the present invention includes a cleaning table having a protrusion for supporting the lower surface of the substrate and having an opening formed in the center, and A chuck that can be retracted and supports the backside of the substrate at a position higher than the cleaning table in the ascending position, transfers the substrate on the cleaning table at the descending position, and then forms a gap between the backside of the substrate and the center of this chuck. A cleaning device was configured with a cleaning nozzle that was placed in the hole and that had a cleaning liquid ejection port formed at its upper end.

【0006】本発明に係る基板の裏面洗浄装置として
は、チャックをスピンナーチャックとして基板を回転可
能とし、且つ基板周縁部の洗浄機構を備えたものとする
ことで、裏面洗浄とエッジ洗浄とを同一ステーションで
行い得る。
In the substrate backside cleaning apparatus according to the present invention, the chuck is a spinner chuck, the substrate is rotatable, and the substrate peripheral edge cleaning mechanism is provided, so that the backside cleaning and the edge cleaning are the same. It can be done at the station.

【0007】また、洗浄テーブルを回転可能とすること
で、基板裏面の中央部に吹き付けられた洗浄液を遠心力
で基板の裏面全体に飛散せしめることができる。
Further, by making the cleaning table rotatable, the cleaning liquid sprayed on the central portion of the back surface of the substrate can be scattered by the centrifugal force over the entire back surface of the substrate.

【0008】また、洗浄ノズルが配置されるチャックの
中心穴を洗浄液回収通路とし、洗浄ノズル内の洗浄液通
路を乾燥用ガスの通路を兼ねる構造とすることで、洗浄
後の基板裏面の乾燥を短時間のうちに行うことができ
る。
Further, the central hole of the chuck in which the cleaning nozzle is arranged serves as a cleaning liquid recovery passage, and the cleaning liquid passage in the cleaning nozzle also serves as a passage for the drying gas, so that the backside of the substrate after drying can be dried quickly. Can be done in time.

【0009】更に、チャック上面には吸着時に基板裏面
に接触する突起の形状をテーパ状とすることで、突起の
側面に洗浄液が滞留すること、洗浄液が突起から基板裏
面に転移することを防げる。
Further, by making the shape of the projection on the upper surface of the chuck, which comes into contact with the back surface of the substrate during adsorption, to be tapered, it is possible to prevent the cleaning liquid from staying on the side surface of the projection and to prevent the cleaning liquid from transferring from the projection to the back surface of the substrate.

【0010】[0010]

【発明の実施の形態】以下に本発明の実施の形態を添付
図面に基づいて説明する。ここで、図1は本発明に係る
基板の裏面洗浄装置の平面図、図2(a)〜(c)は本
発明に係る基板の裏面洗浄装置の作用を説明した縦断面
図、図3はチャックの平面図、図4はチャックの縦断面
図である。
Embodiments of the present invention will be described below with reference to the accompanying drawings. Here, FIG. 1 is a plan view of a substrate backside cleaning apparatus according to the present invention, FIGS. 2A to 2C are vertical cross-sectional views illustrating the operation of the substrate backside cleaning apparatus according to the present invention, and FIG. FIG. 4 is a plan view of the chuck, and FIG. 4 is a vertical sectional view of the chuck.

【0011】基板の裏面洗浄装置はケース1を備えてい
る。このケース1は上方を基板Wの出入りが可能となる
ように開放し、内部には洗浄テーブル2を配置してい
る。この洗浄テーブル2は中央に開口3が形成され、ま
た上面には基板Wの裏面を点支持する突起4が設けら
れ、更に突起4よりも外側の洗浄テーブル周縁部には洗
浄テーブル2を回転せしめた際に基板Wが外れないよう
にするためのストッパ5が設けられている。
The substrate backside cleaning device includes a case 1. The case 1 is open at the top so that the substrate W can be moved in and out, and the cleaning table 2 is arranged inside. The cleaning table 2 has an opening 3 formed in the center, a projection 4 for supporting the back surface of the substrate W at a point on the upper surface, and the cleaning table 2 is rotated around the periphery of the cleaning table outside the projection 4. A stopper 5 is provided to prevent the substrate W from coming off when it is opened.

【0012】また、前記洗浄テーブル2の開口3に対し
スピンナーチャック6が出没自在に配置されている。こ
のスピンナーチャック6は回転可能且つ上下動可能で、
図2(a)に示すように、上昇位置で洗浄テーブル2よ
りも高い位置で基板Wの裏面を支持し、図2(c)に示
すように、下降位置で洗浄テーブル2上に基板Wを移載
し基板Wの裏面との間に隙間を形成する。
Further, a spinner chuck 6 is disposed so as to be retractable from the opening 3 of the cleaning table 2. This spinner chuck 6 is rotatable and vertically movable,
As shown in FIG. 2A, the back surface of the substrate W is supported at a position higher than the cleaning table 2 in the raised position, and the substrate W is placed on the cleaning table 2 in the lowered position as shown in FIG. 2C. A gap is formed between the transferred substrate W and the back surface of the substrate W.

【0013】また、スピンナーチャック6に形成される
中心穴7には同心円状の空間13が中心穴7に内接して
設けられるよう2重パイプ8が取り付けられ、この空間
13は上方においてスピンナーチャック6上面の真空引
孔14と連通し、下方において吸引装置につながってい
る。スピンナーチャック6の上面には、吸着時に基板W
の裏面に接触するテーパ状突部9が形成されている。こ
こで突部9をテーパー状とすることで突部9の側面に洗
浄液が滞留しにくくなるし、また、基板Wを載置すると
きに洗浄液がスピンナーチャック6の上面から基板W裏
面に転移することがない。尚、図示例ではパイプ8を取
付けたが、パイプを取付ける代りにスピンナーチャック
6中心の筒部を下方へ伸ばし、内側に1重パイプを取り
付けても同じことである。
Further, a double pipe 8 is attached to a central hole 7 formed in the spinner chuck 6 so that a concentric space 13 is provided so as to be inscribed in the central hole 7. It communicates with the vacuum suction hole 14 on the upper surface and is connected to the suction device at the bottom. On the upper surface of the spinner chuck 6, the substrate W
Is formed with a tapered protrusion 9 that contacts the back surface of the. Here, by making the protrusion 9 tapered, the cleaning liquid is less likely to stay on the side surface of the protrusion 9, and when the substrate W is placed, the cleaning liquid is transferred from the upper surface of the spinner chuck 6 to the rear surface of the substrate W. Never. In the illustrated example, the pipe 8 is attached, but instead of attaching the pipe, the same can be done by extending the cylindrical portion at the center of the spinner chuck 6 downward and attaching the single pipe inside.

【0014】また、パイプ8の内部には洗浄ノズル10
を配置している。洗浄ノズル10はその上端部が突部9
よりも低くなるように設計されている。更に、洗浄ノズ
ル10の上端部は絞られ且つ上方に開口する非円形の洗
浄液噴出口11と斜め上方に開口する円形の洗浄液噴出
口12を備えている。このような構造の洗浄液噴出口1
1,12を備えることで、洗浄液を基板Wの裏面に対し
ある程度広げた状態で吹き付けることができ、効率よく
洗浄を行うことができる。
A cleaning nozzle 10 is provided inside the pipe 8.
Has been arranged. The cleaning nozzle 10 has a protrusion 9 at its upper end.
It is designed to be lower than. Further, the upper end of the cleaning nozzle 10 is provided with a non-circular cleaning liquid ejection port 11 that is narrowed and opens upward, and a circular cleaning liquid ejection port 12 that opens obliquely upward. Cleaning liquid spout 1 having such a structure
By including 1 and 12, the cleaning liquid can be sprayed onto the back surface of the substrate W in a state of being spread to some extent, and cleaning can be efficiently performed.

【0015】ところで、パイプ8内側と洗浄ノズル10
外側との間の通路7は洗浄液の排出通路となり、また洗
浄ノズル10の内側通路は洗浄液の噴出通路の他に、洗
浄終了後は乾燥用空気の通路となる。尚、パイプ8内側
と洗浄ノズル10外側との間の通路を乾燥用空気の通路
とすることも可能であるが、このようにすると、乾燥用
空気の吹き出しに連れてノズルから洗浄液が出てきて基
板裏面に付着し乾燥が遅れることも考えられるので、、
洗浄ノズル10の内側通路を乾燥用空気の通路とする方
が有利である。
By the way, the inside of the pipe 8 and the cleaning nozzle 10
The passage 7 between the outside and the outside serves as a discharge passage for the cleaning liquid, and the inside passage of the cleaning nozzle 10 serves as a passage for the cleaning liquid, as well as a jet passage for the cleaning liquid, and a passage for drying air after the cleaning is completed. The passage between the inside of the pipe 8 and the outside of the washing nozzle 10 can be used as a passage for the drying air. However, in this case, the washing liquid comes out of the nozzle as the drying air is blown out. Since it is possible that it adheres to the back surface of the substrate and delays drying,
It is advantageous for the inner passage of the washing nozzle 10 to be the passage for the drying air.

【0016】以上において、基板Wを洗浄するには、先
ず図2(a)に示すように、洗浄テーブル2に対しスピ
ンナーチャック6を上昇させた位置で、基板Wの裏面中
央を吸着保持し、次いでスピンナーチャック6を若干下
降せしめ、基板Wがケース1の上端よりも下がった位置
で一旦スピンナーチャック6の下降を停止し、この位置
でスピンナーチャック6によって基板Wを回転させつつ
エッジ洗浄ノズル15から基板のエッジ部に向けて洗浄
液を吐出し、基板W上面の周縁部に形成された余分な塗
膜を除去する。
In order to clean the substrate W as described above, first, as shown in FIG. 2A, at the position where the spinner chuck 6 is raised with respect to the cleaning table 2, the center of the back surface of the substrate W is sucked and held, Next, the spinner chuck 6 is slightly lowered, and once the substrate W is lower than the upper end of the case 1, the spinner chuck 6 is stopped from descending. The cleaning liquid is discharged toward the edge portion of the substrate to remove the excess coating film formed on the peripheral portion of the upper surface of the substrate W.

【0017】次いで、エッジ洗浄が終了したならば、ス
ピンナーチャック6を更に下降させ、洗浄テーブル2上
に基板Wを移載する。この状態でスピンナーチャック6
上面と基板W裏面との間には図2(c)に示すように隙
間が形成される。そして、この状態で、前記洗浄ノズル
10から洗浄液を基板Wの裏面に吐出し、基板Wの裏面
全面を洗浄する。
Next, when the edge cleaning is completed, the spinner chuck 6 is further lowered to transfer the substrate W onto the cleaning table 2. In this state, spinner chuck 6
A gap is formed between the upper surface and the back surface of the substrate W as shown in FIG. Then, in this state, the cleaning liquid is discharged from the cleaning nozzle 10 to the back surface of the substrate W to clean the entire back surface of the substrate W.

【0018】そしてこの後、洗浄液通路を乾燥用空気通
路にバルブ等の操作で切換えることによって、洗浄ノズ
ル10から基板W裏面に向けて乾燥用空気を吹き付け、
基板W裏面を短時間のうちに乾燥せしめる。
After that, by switching the cleaning liquid passage to the drying air passage by operating a valve or the like, the drying air is blown from the cleaning nozzle 10 toward the rear surface of the substrate W,
The back surface of the substrate W is dried in a short time.

【0019】[0019]

【発明の効果】以上に説明したように本発明は、基板の
下面を支持する突起を備え且つ中央に開口を形成した洗
浄テーブルと、前記開口に対し出没可能とされ上昇位置
で洗浄テーブルよりも高い位置で基板裏面を支持し、下
降位置で洗浄テーブル上に基板を移載し基板裏面との間
に隙間を形成するチャックと、このチャックの中心穴内
に配置され、その上端部には洗浄液噴出口が形成された
洗浄ノズルにて基板の裏面洗浄装置を構成したので、基
板の裏面を吸着保持するチャックを備えつつも基板の裏
面全面を洗浄することができ、露光精度をたかめること
ができる。
As described above, according to the present invention, a cleaning table having a projection for supporting the lower surface of the substrate and having an opening formed in the center, and a cleaning table which can be retracted into and raised from the opening and which is higher than the cleaning table are provided. A chuck that supports the backside of the substrate at a high position and transfers the substrate onto the cleaning table at a lowered position to form a gap between the backside of the substrate and a chuck that is placed in the center hole of this chuck and has a cleaning solution sprayed on the upper end. Since the backside cleaning device for the substrate is configured by the cleaning nozzle having the outlet, it is possible to clean the entire backside of the substrate while having a chuck for sucking and holding the backside of the substrate, and it is possible to improve the exposure accuracy.

【0020】また、チャックをスピンナーチャックとし
て基板を回転可能とし、且つ基板周縁部の洗浄機構を備
えたものとすることで、裏面洗浄とエッジ洗浄とを同一
ステーションで行うことができ、効率的である。
Further, by using the chuck as a spinner chuck to rotate the substrate and having a cleaning mechanism for the peripheral portion of the substrate, the back surface cleaning and the edge cleaning can be performed at the same station, which is efficient. is there.

【0021】また、洗浄テーブルを回転可能とすること
で、基板裏面に吹き付けられた洗浄液を遠心力で飛散せ
しめることができ、更に、洗浄ノズルが配置されるチャ
ックの中心穴を洗浄液回収通路とし、洗浄ノズル内の洗
浄液通路を乾燥用ガスの通路を兼ねる構造とすること
で、洗浄後の基板裏面を短時間のうちに乾燥せしめるこ
とができる。
Further, by making the cleaning table rotatable, the cleaning liquid sprayed on the back surface of the substrate can be scattered by the centrifugal force, and further, the central hole of the chuck in which the cleaning nozzle is arranged serves as the cleaning liquid recovery passage, By making the cleaning liquid passage in the cleaning nozzle also serve as the passage for the drying gas, the back surface of the substrate after cleaning can be dried in a short time.

【0022】更に、チャック上面には吸着時に基板裏面
に接触する突起の形状をテーパ状とすることで、突起の
側面に洗浄液が滞留することを防げ、搬送する際等にチ
ャック上面に残った洗浄液が基板裏面に付着することが
なくなる。
Further, by making the shape of the protrusion on the upper surface of the chuck which comes into contact with the back surface of the substrate at the time of adsorption to be tapered, the cleaning liquid can be prevented from staying on the side surface of the protrusion, and the cleaning liquid remaining on the upper surface of the chuck during transportation or the like. Will not adhere to the back surface of the substrate.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る基板の裏面洗浄装置の平面図FIG. 1 is a plan view of a substrate backside cleaning apparatus according to the present invention.

【図2】(a)〜(c)は本発明に係る基板の裏面洗浄
装置の作用を説明した縦断面図
2A to 2C are vertical sectional views for explaining the operation of the substrate back surface cleaning apparatus according to the present invention.

【図3】チャックの平面図FIG. 3 is a plan view of the chuck.

【図4】チャックの縦断面図FIG. 4 is a vertical sectional view of a chuck.

【符号の説明】[Explanation of symbols]

1…ケース、2…洗浄テーブル、3…洗浄テーブルの開
口、4…突起、5…ストッパ、6…スピンナーチャッ
ク、7…スピンナーチャックの中心穴、9…突部、10
…洗浄ノズル、11,12…洗浄液噴出口、15…エッ
ジ洗浄ノズル、W…基板。
1 ... Case, 2 ... Washing table, 3 ... Washing table opening, 4 ... Protrusion, 5 ... Stopper, 6 ... Spinner chuck, 7 ... Spinner chuck center hole, 9 ... Projection, 10
... washing nozzles, 11, 12 ... washing liquid jets, 15 ... edge washing nozzles, W ... substrate.

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 基板の下面を支持する突起を備え且つ中
央に開口を形成した洗浄テーブルと、前記開口に対し出
没可能とされ上昇位置で洗浄テーブルよりも高い位置で
基板裏面を支持し、下降位置で洗浄テーブル上に基板を
移載した後、基板裏面との間に隙間を形成するチャック
と、このチャックの中心穴内に配置され、その上端部に
は洗浄液噴出口が形成された洗浄ノズルとを備えたこと
を特徴とする基板の裏面洗浄装置。
1. A cleaning table having a projection for supporting the lower surface of the substrate and having an opening formed in the center, and a back surface of the substrate supported at a position higher than the cleaning table at a rising position which can be retracted and retracted, and descends. After the substrate is transferred onto the cleaning table at the position, a chuck that forms a gap between the substrate and the back surface of the substrate, a cleaning nozzle that is arranged in the center hole of the chuck, and has a cleaning liquid ejection port formed at the upper end thereof. An apparatus for cleaning a back surface of a substrate, comprising:
【請求項2】 請求項1に記載の基板の裏面洗浄装置に
おいて、この洗浄装置は基板周縁部の洗浄機構を備える
とともに、前記チャックは基板を回転せしめることが可
能なスピンナーチャックであることを特徴とする基板の
裏面洗浄装置。
2. The backside cleaning apparatus for a substrate according to claim 1, wherein the cleaning apparatus includes a cleaning mechanism for a peripheral portion of the substrate, and the chuck is a spinner chuck capable of rotating the substrate. Backside cleaning device for the substrate.
【請求項3】 請求項1に記載の基板の裏面洗浄装置に
おいて、前記洗浄テーブルは基板を載置したまま回転可
能であることを特徴とする基板の裏面洗浄装置。
3. The backside cleaning apparatus for a substrate according to claim 1, wherein the cleaning table is rotatable while the substrate is placed on the cleaning table.
【請求項4】 請求項1に記載の基板の裏面洗浄装置に
おいて、前記チャックの中心穴を洗浄液回収通路とし、
また洗浄ノズル内の洗浄液通路は乾燥用ガスの通路を兼
ねることを特徴とする基板の裏面洗浄装置。
4. The backside cleaning apparatus for a substrate according to claim 1, wherein the central hole of the chuck is a cleaning liquid recovery passage,
Further, the cleaning liquid passage in the cleaning nozzle also serves as a passage for the drying gas, which is a backside cleaning device for a substrate.
【請求項5】 請求項1に記載の基板の裏面洗浄装置に
おいて、前記チャック上面には吸着時に基板裏面に接触
するテーパ状突部が形成されていることを特徴とする基
板の裏面洗浄装置。
5. The backside cleaning apparatus for a substrate according to claim 1, wherein the chuck upper surface is formed with a tapered protrusion that comes into contact with the backside of the substrate during adsorption.
JP11223596A 1996-05-07 1996-05-07 Substrate rear surface washer Pending JPH09298181A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11223596A JPH09298181A (en) 1996-05-07 1996-05-07 Substrate rear surface washer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11223596A JPH09298181A (en) 1996-05-07 1996-05-07 Substrate rear surface washer

Publications (1)

Publication Number Publication Date
JPH09298181A true JPH09298181A (en) 1997-11-18

Family

ID=14581635

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11223596A Pending JPH09298181A (en) 1996-05-07 1996-05-07 Substrate rear surface washer

Country Status (1)

Country Link
JP (1) JPH09298181A (en)

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JP2001135612A (en) * 1999-07-09 2001-05-18 Applied Materials Inc Apparatus and method for etching substrate
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4603136B2 (en) * 1999-07-09 2010-12-22 アプライド マテリアルズ インコーポレイテッド Apparatus and method for etching a substrate
JP2001135612A (en) * 1999-07-09 2001-05-18 Applied Materials Inc Apparatus and method for etching substrate
KR100697265B1 (en) * 2000-02-18 2007-03-21 삼성전자주식회사 Device and method for coupling a bracket with a flat type display
JP2004134431A (en) * 2002-10-08 2004-04-30 Sprout Co Ltd Substrate processing apparatus and its manufacturing method
JP2006261546A (en) * 2005-03-18 2006-09-28 Dainippon Screen Mfg Co Ltd Substrate processing equipment
US8932672B2 (en) 2006-02-02 2015-01-13 Screen Semiconductor Solutions Co., Ltd. Substrate processing apparatus
US9477162B2 (en) 2006-02-02 2016-10-25 Screen Semiconductor Solutions Co., Ltd. Substrate processing method
US8043440B2 (en) 2006-10-23 2011-10-25 Tokyo Electron Limited Cleaning apparatus and method and computer readable medium
KR101238123B1 (en) * 2006-10-23 2013-02-27 도쿄엘렉트론가부시키가이샤 Cleaning apparatus, cleaning method and computer readable medium
JP2014017499A (en) * 2006-12-20 2014-01-30 Tokyo Electron Ltd Substrate cleaning apparatus, substrate cleaning method, and storage medium
JP2012191215A (en) * 2006-12-20 2012-10-04 Tokyo Electron Ltd Substrate cleaning apparatus, substrate cleaning method, and storage medium
US8696863B2 (en) 2009-02-12 2014-04-15 Tokyo Electron Limited Liquid processing apparatus and liquid processing method
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US11670492B2 (en) 2020-10-15 2023-06-06 Applied Materials, Inc. Chamber configurations and processes for particle control
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KR102623921B1 (en) * 2022-12-01 2024-01-11 세메스 주식회사 Substrate processing apparatus and substrate processing method

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