JPH09288071A - Foreign matter detector by x-rays - Google Patents

Foreign matter detector by x-rays

Info

Publication number
JPH09288071A
JPH09288071A JP8100968A JP10096896A JPH09288071A JP H09288071 A JPH09288071 A JP H09288071A JP 8100968 A JP8100968 A JP 8100968A JP 10096896 A JP10096896 A JP 10096896A JP H09288071 A JPH09288071 A JP H09288071A
Authority
JP
Japan
Prior art keywords
ray
image
foreign matter
subject
control device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8100968A
Other languages
Japanese (ja)
Other versions
JP3263594B2 (en
Inventor
Iwao Takeuchi
五輪男 竹内
Mutsumi Sato
睦 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
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Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP10096896A priority Critical patent/JP3263594B2/en
Publication of JPH09288071A publication Critical patent/JPH09288071A/en
Application granted granted Critical
Publication of JP3263594B2 publication Critical patent/JP3263594B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Analysing Materials By The Use Of Radiation (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Measurement Of Radiation (AREA)
  • General Preparation And Processing Of Foods (AREA)

Abstract

PROBLEM TO BE SOLVED: To efficiently detect foreign matter by X-ray photographing, without matching the shape change position of an object to be inspected by the rotation or movement of an image, and being affected by the irregularity of the object to be inspected. SOLUTION: Radiation source voltage is altered while an X-ray source 1 alterable in photographing condition by the alteration of radiation source voltage, an X-ray source control device 2, an X-ray detector 4 detecting transmission quantity of X-rays transmitted through an object 12 to be inspected and an X-ray detector control device 5 are controlled by a photographing control unit 3. Two different X-ray images of the same object to be inspected are photographed under a condition capable of photographing both of the shape and foreign matter of the object to be inspected and a condition capable of photographing only the shape of the object to be inspected to be recorded by first and second image recording devices 6, 7. The relation between two X-ray images is preliminarily calculated on the basis of an object to be inspected free from foreign matter to be stored in an operation factor memory device 8 as an operation factor, and subtraction processing is performed by an operational processing apparatus 9 by using two X-ray images of the object 12 to be inspected and the previously calculated operation factor to detect foreign matter. The detection result is displayed on a display device 10 and recorded on a processing result recording apparatus 11.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明はX線による異物検出
装置に関し、缶詰やハム等の食品中の異物検査や、溶接
中のタングステン巻込み等の検査に関する非破壊検査、
或いは、これら異物混入等の検査以外に、電子部品等に
おける内部構造の非破壊検査等にも適用可能なものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an X-ray foreign matter detecting device, and a non-destructive inspection for foreign matter inspection in food such as canned food and ham, and tungsten entrainment during welding.
Alternatively, it can be applied to a nondestructive inspection of the internal structure of an electronic component or the like, in addition to the inspection of foreign matter contamination.

【0002】[0002]

【従来の技術】図5に従来の検査装置の構成図を示す。
同図において、従来の検査装置では、X線源1及び同X
線源1の照射タイミングや時間等を制御するX線源制御
装置19と、X線検出器4及び同X線検出器4を制御す
るX線検出器制御装置5とを、更に撮影制御装置3によ
って制御しながら、台13上の被検体12及び参照20
という2種類の対象についてX線透過画像を撮影する。
詳しくは、下記の通りである。
2. Description of the Related Art FIG. 5 shows a block diagram of a conventional inspection apparatus.
In the figure, in the conventional inspection apparatus, the X-ray source 1 and the X-ray source 1
An X-ray source control device 19 for controlling the irradiation timing and time of the radiation source 1, an X-ray detector 4 and an X-ray detector control device 5 for controlling the X-ray detector 4, and an imaging control device 3 are further provided. The object 12 and the reference 20 on the table 13 while being controlled by
X-ray transmission images are captured for these two types of objects.
Details are as follows.

【0003】まず、被検体12の代わりに参照20とし
て、通常は、異常が無い被検体と同等な物を撮影し、そ
の結果(参照画像)を参照画像記憶装置21に記録す
る。
First, instead of the object 12, an object equivalent to the object having no abnormality is usually imaged as the reference 20, and the result (reference image) is recorded in the reference image storage device 21.

【0004】次に、参照20を撮影したと同じ条件で、
被検体12を撮影し、その結果(検査画像)を検査画像
記憶装置22に記録する。
Next, under the same conditions as when the reference 20 was photographed,
The subject 12 is photographed and the result (inspection image) is recorded in the inspection image storage device 22.

【0005】基本的に、これら被検体12と参照20の
撮影では、撮影条件を一致させる。そのために、同じX
線源1及び同じX線検出器4を用い、更に、X線源1と
X線検出器4間の距離や、X線源1及びX線検出器4の
動作条件を同一にして、参照20と被検体12の撮影を
順番に行う。
Basically, the imaging conditions of the object 12 and the reference 20 are matched. Therefore, the same X
Using the same X-ray detector 4 as the X-ray source 1 and making the distance between the X-ray source 1 and the X-ray detector 4 and the operating conditions of the X-ray source 1 and X-ray detector 4 the same, see 20 Then, the subject 12 is imaged in order.

【0006】次に、それぞれの画像記憶装置22、21
に記録された検査画像から参照画像を減算する演算処理
を演算処理装置9で行い、処理結果を表示装置10に出
力し表示すると共に、処理結果記録装置11に記録し保
存を行う。
Next, the respective image storage devices 22 and 21
The arithmetic processing unit 9 performs arithmetic processing for subtracting the reference image from the inspection image recorded in 1., the processing result is output and displayed on the display unit 10, and is recorded and stored in the processing result recording unit 11.

【0007】ここで、参照画像は基本的に異常の無い状
態でのX線透過の分布を表しているので、異常の有無が
不明である検査画像から参照画像を減算することによ
り、X線透過分布の異なる範囲が抽出され、異常が検出
できる。
Here, since the reference image basically represents the distribution of X-ray transmission in a state in which there is no abnormality, the reference image is subtracted from the inspection image in which the presence or absence of abnormality is unknown, so that X-ray transmission is performed. Anomalies can be detected by extracting ranges with different distributions.

【0008】つまり、被検体12に異物が混入している
等の異常が有る場合は、その部分を透過するX線の減衰
量が異物の種類によって増減するので、異物が無い場合
とは異なるX線透過量(=画像の輝度値)の変化として
現れる。
That is, when there is an abnormality such as foreign matter mixed in the subject 12, the attenuation amount of X-rays passing through that portion increases or decreases depending on the type of foreign matter, so that X different from the case where there is no foreign matter. It appears as a change in the amount of line transmission (= luminance value of the image).

【0009】但し、被検体の形状が一様でなく厚みが変
化する部分でも、X線の透過量が異なり画像の輝度値が
変化するため、検査画像のみでは異物の混入による輝度
変化なのか、被検体12の形状変化による輝度変化なの
か判別が出来ない。
However, even in a portion where the shape of the subject is not uniform and the thickness is changed, the X-ray transmission amount is different and the brightness value of the image is changed. It cannot be discriminated whether or not the change in luminance is due to the change in shape of the subject 12.

【0010】そこで、異物混入等の無い被検体と同様な
対象(=参照20)を撮影することにより、被検体12
の形状変化に起因する輝度変化を、参照画像として予め
求めておき、この参照画像を検査画像から引算すること
で異物の混入等による異常部分のみを抽出する。
Therefore, by photographing an object (= reference 20) similar to the object without foreign matter, etc., the object 12
The luminance change due to the shape change is previously obtained as a reference image, and the reference image is subtracted from the inspection image to extract only the abnormal portion due to the inclusion of foreign matter.

【0011】従って、被検体12と参照20は、形状変
化の場所をも一致させて撮影するか、演算処理において
位置合わせを行う必要がある。
Therefore, the subject 12 and the reference 20 need to be photographed by matching the positions of the shape changes, or they must be aligned in the arithmetic processing.

【0012】なおX線検出器4としては、X線が当たる
ことによって可視光を発生する蛍光体を用いたイメージ
インテンシファイアや、X線カメラ等といった検出装置
がこれに相当する。
The X-ray detector 4 corresponds to a detection device such as an image intensifier or a X-ray camera which uses a phosphor that emits visible light when it is hit by X-rays.

【0013】[0013]

【発明が解決しようとする課題】しかし、前述のように
構成された従来の異物検出のための検査装置では、異常
が無い被検体に相当する”参照20”の選択の仕方によ
って、異物検出性能が大きく左右されるという問題があ
る。
However, in the conventional inspection apparatus for detecting a foreign substance constructed as described above, the foreign substance detection performance can be changed by selecting "reference 20" which corresponds to the subject having no abnormality. Is greatly affected by the problem.

【0014】また、被検体12が缶詰のように、内容物
が一様で無いばかりか、個々の被検体でも内容物に大き
なばらつきがある場合は、どのような物を”参照20”
として選択しても、缶詰の中身の偏り等による輝度変化
が生じるので、このような輝度変化が参照画像との減算
処理によって抽出されてしまい、異物として誤検出され
ることとなる。
Further, when the contents of the test object 12 are not uniform, such as the canned product, and there is a large variation in the content among the individual test objects, what kind of object should be referred to as "reference 20".
However, even if it is selected as, the brightness change occurs due to the uneven distribution of the contents of the can, and such a brightness change is extracted by the subtraction process with the reference image, and is erroneously detected as a foreign substance.

【0015】更に、同様に、缶詰など容器を開けるため
の爪やリップルがある場合には、参照20の撮影時と、
検査対象である被検体12の撮影時において、画像上に
映る爪等の位置を合わせておく必要がある。この位置が
ずれると、中身の偏りの場合と同様に、検査画像と参照
画像との演算処理によってこの位置ずれによる輝度変化
が抽出され、異物として誤検出されることとなる。
Similarly, when there is a nail or a ripple for opening a container such as a can, when photographing at reference 20,
It is necessary to align the positions of the nails and the like shown in the image when the subject 12 to be inspected is photographed. If this position shifts, the brightness change due to this position shift will be extracted by the arithmetic processing of the inspection image and the reference image, and will be erroneously detected as a foreign substance, as in the case of the uneven content.

【0016】特に、被検体の形状変化の位置ずれに起因
する輝度変化については、これを合わせるために、撮影
後の画像について画像の回転や移動を行い、形状変化の
場所を一致させる方法が取られることもあるが、単純な
減算処理ではない複雑な信号処理を行う必要がある他、
完全には一致しないこと、及び異物による輝度変化部と
は逆に合わせてしまうケースが生じること等、問題があ
った。
In particular, with respect to the brightness change caused by the positional deviation of the shape change of the subject, in order to match it, a method of rotating or moving the image of the photographed image so as to match the positions of the shape change is adopted. However, it is necessary to perform complicated signal processing that is not simple subtraction processing,
There are problems such as not completely matching, and a case where the brightness change portion due to a foreign substance is matched with the case in which the brightness is changed.

【0017】[0017]

【課題を解決するための手段】本発明では、前述の問題
点を解決するため、被検体のばらつき等に影響されない
X線による異物検出装置として、X線源と、このX線源
を制御するX線源制御装置と、前記X線源から照射さ
れ、被検体を透過するX線の透過量を検出するX線検出
器と、このX線検出器を制御するX線検出器制御装置
と、前記X線源制御装置及び前記X線検出器制御装置を
制御しながら、同一の被検体に対して、被検体の形状及
び異物の両方を撮影できる第一撮影条件と、異物には充
分な輝度が得られないが、被検体の形状は或る程度の輝
度で撮影できる第二撮影条件とで2つのX線画像の撮影
を行う撮影制御装置と、第一撮影条件で得られる第一画
像と第二撮影条件で得られる第二画像を記録するための
画像記憶装置と、予め異物の無い被検体についてのこれ
ら撮影条件が異なる第一、第二2つの画像間の関係を演
算係数として記憶しておく演算係数記憶装置と、検査対
象の被検体について第一画像と第二画像を先の演算係数
で減算処理を行い異物を検出する演算処理装置とで構成
されることを特徴とする。
In order to solve the above-mentioned problems, the present invention controls an X-ray source and this X-ray source as an X-ray foreign matter detection device that is not affected by variations in the subject. An X-ray source control device, an X-ray detector that detects the amount of X-rays that are emitted from the X-ray source and that passes through a subject, and an X-ray detector control device that controls the X-ray detector, While controlling the X-ray source control device and the X-ray detector control device, a first imaging condition capable of imaging both the shape of the subject and the foreign matter for the same subject, and sufficient brightness for the foreign matter. However, the shape of the subject is an imaging control device that captures two X-ray images under a second imaging condition that allows imaging with a certain level of brightness, and a first image obtained under the first imaging condition. An image storage device for recording a second image obtained under the second shooting condition; A calculation coefficient storage device that stores, as calculation coefficients, the relationship between the first and second images of the object having no object, which have different imaging conditions, and the first image and the second image of the object to be inspected. And an arithmetic processing unit that performs a subtraction process using the above arithmetic coefficient to detect a foreign substance.

【0018】更に、撮影条件を変更する手段として、例
えば、前記X線源制御装置が前記X線源に供給する線源
電圧及び線源電流のうち少なくとも一方が可変の回路を
有し、前記撮影制御装置で前記X線源制御装置を制御し
て線源電圧及び線源電流のうち少なくとも一方を変更さ
せることにより、撮影条件を変えて第一画像と第二画像
2つのX線画像の撮影を行うものであることを特徴と
し、或いは、前記X線源と前記X線検出器との間の距離
を変える移動機構を備え、前記撮影制御装置で前記移動
機構を制御して前記X線源と前記X線検出器との距離を
変更させることにより、撮影条件を変えて第一画像と第
二画像2つのX線画像の撮影を行うものであることを特
徴とし、或いは、X線に対するフィルタと、このフィル
タを前記X線源と前記X線検出器との間に出し入れする
フィルタ挿入装置とを備え、前記撮影制御装置で前記フ
ィルタ挿入装置を制御して前記フィルタを出し入れさせ
ることにより、撮影条件を変えて第一画像と第二画像2
つのX線画像の撮影を行うものであることを特徴とす
る。
Further, as a means for changing the photographing condition, for example, the X-ray source controller has a circuit in which at least one of a source voltage and a source current supplied to the X-ray source is variable, and the photographing is performed. The controller controls the X-ray source controller to change at least one of the source voltage and the source current, thereby changing the imaging conditions and capturing the two X-ray images, the first image and the second image. Or a moving mechanism for changing the distance between the X-ray source and the X-ray detector, wherein the moving mechanism is controlled by the imaging control device and the X-ray source is used. By changing the distance to the X-ray detector, the X-ray images of the first image and the second image are picked up by changing the shooting conditions, or a filter for X-rays is used. , This filter in front of the X-ray source A first image and a second image by changing the imaging condition by providing a filter insertion device to and from the X-ray detector, and controlling the filter insertion device by the imaging control device to move the filter in and out. Two
It is characterized in that one X-ray image is taken.

【0019】[0019]

【発明の実施の形態】このように構成されたX線による
異物検出装置では、X線源とX線検出器をそれぞれX線
源制御装置及びX線検出器制御装置を通じて撮影制御装
置により制御して被検体のX線画像を撮影するが、その
際、撮影制御装置が例えば、X線源制御装置を制御して
X線源に供給する線源電圧及び線源電流のうち少なくと
も一方を変更させ、或いは、移動機構を制御してX線源
とX線検出器との距離を変更させ、或いは、フィルタ挿
入装置を制御してX線源とX線検出器との間にフィルタ
を出し入れさせる等の調整をすることで、同じ被検体に
ついて撮影条件を第一撮影条件と第二撮影条件の2つに
変えて撮影することができる。これにより、形状変化等
が同じ場所に存在する状態で、第一画像及び第二画像と
いう2種類のX線画像を得ることが可能となり、形状変
化の位置合わせ等が不要となる。
BEST MODE FOR CARRYING OUT THE INVENTION In an X-ray foreign matter detection apparatus having such a configuration, the X-ray source and the X-ray detector are controlled by the imaging control apparatus through the X-ray source control apparatus and the X-ray detector control apparatus, respectively. An X-ray image of the subject is captured by the imaging control device, for example, by controlling the X-ray source control device to change at least one of the source voltage and the source current supplied to the X-ray source. Alternatively, the moving mechanism is controlled to change the distance between the X-ray source and the X-ray detector, or the filter insertion device is controlled to move the filter between the X-ray source and the X-ray detector. By adjusting the above, the same subject can be imaged by changing the imaging conditions into the first imaging condition and the second imaging condition. This makes it possible to obtain two types of X-ray images, the first image and the second image, in the state where the shape change and the like are present at the same place, and the alignment of the shape change and the like are unnecessary.

【0020】第一画像としては、被検体の形状と異物の
両方が撮影できる第一撮影条件でX線撮影を行い、被検
体に対し混入する恐れのある異物等と、被検体の内容物
の偏り等による輝度差及び形状変化とを共に得て、画像
記録装置例えば、第一画像記録装置に記録する。
As the first image, X-ray imaging is performed under the first imaging condition capable of imaging both the shape of the subject and the foreign matter, and the foreign matter and the like which may be mixed into the subject and the contents of the subject. The brightness difference and the shape change due to the deviation and the like are both obtained and recorded in the image recording apparatus, for example, the first image recording apparatus.

【0021】第二画像としては、なるべく被検体の形状
のみが撮影できるように、異物には充分な輝度が得られ
ないが、被検体の形状は或る程度の輝度で撮影できる第
二撮影条件でX線撮影を行うことにより、被検体に対し
混入する恐れのある異物等はなるべく低い輝度で、被検
体の内容物の偏りや形状変化はなるべく高い輝度変化で
得て、画像記録装置例えば、第二画像記録装置に記録す
る。
As the second image, it is possible to capture only the shape of the subject as much as possible, but sufficient brightness cannot be obtained for foreign matter, but the shape of the subject can be imaged with a certain degree of brightness. By performing X-ray imaging with, the foreign matter or the like that may be mixed into the subject can be obtained with the lowest possible brightness, and the deviation or shape change of the contents of the subject can be obtained with the highest possible brightness change. The image is recorded in the second image recording device.

【0022】実際の検査に先立ち、予め、異物が混入し
ていないことが明らかな被検体を用いて第一画像と第二
画像を撮影し、得られた第一画像と第二画像を用いて、
第一画像と第二画像に演算係数を掛けて減算した結果が
0(ゼロ)となるような当該演算係数を求め、演算係数
記憶装置に記憶しておく。
Prior to the actual inspection, the first image and the second image are photographed in advance using an object in which it is clear that no foreign matter is mixed, and the obtained first image and second image are used. ,
The calculation coefficient is calculated so that the result obtained by multiplying and subtracting the calculation coefficient from the first image and the second image becomes 0 (zero) and stored in the calculation coefficient storage device.

【0023】次に、実際の検査において、異物の混入の
有無が不明な被検体に対して第一画像と第二画像を撮影
し、得られた第一画像と第二画像について、先の演算係
数記憶部に記憶された演算係数を用いて演算処理装置で
減算処理を行い、混入した異物による輝度変化のみを抽
出して異物の有無を判定する。必要あれば、表示装置に
結果を出力し表示すると共に、処理結果記録装置に結果
を記録し保管する。
Next, in the actual inspection, the first image and the second image are photographed with respect to the subject whose presence / absence of foreign matter is unknown, and the first calculation and the second image obtained are subjected to the above calculation. The arithmetic processing unit performs subtraction processing using the arithmetic coefficients stored in the coefficient storage unit, and only the change in luminance due to the mixed foreign matter is extracted to determine the presence or absence of the foreign matter. If necessary, the result is output and displayed on the display device, and the result is recorded and stored in the processing result recording device.

【0024】このように、撮影条件を変えて得られる同
じ被検体の第一画像と第二画像を演算処理に用いること
により、個々の被検体のばらつきが2つの画像間で無く
なるために、ばらつきの影響を取り除くことができ、誤
検出が生じにくくなる。
As described above, by using the first image and the second image of the same subject obtained by changing the imaging conditions for the arithmetic processing, the variation of each subject is eliminated between the two images. The effect of can be removed, and erroneous detection is less likely to occur.

【0025】異物混入の無い被検体の2つのX線画像か
ら演算係数を求める方法としては、前述の「第一画像と
第二画像に演算係数を掛けて減算した結果が0(ゼロ)
となるような当該演算係数」を求めることであるため、
考え方によって幾つかの方法がある。
As a method for obtaining the calculation coefficient from the two X-ray images of the subject free from foreign matter, the above-mentioned "first image and second image are multiplied by the calculation coefficient and subtracted is 0 (zero)".
Since the calculation coefficient "
There are several methods depending on the way of thinking.

【0026】その方法として、一つは単純に、2つの画
像を画像と画像とすると、これら2つの画像の
同一の画素(x,y)の値「画像(x,y)、画像
(x,y)」を用いて、下記数1の式のように個々の画
素毎に係数(x,y)を求める方法が有る。或いは下記
数2の式のように個々の画素で求められた係数を画像全
体で平均して一つの係数を求める方法が有り、その他、
画像の縦横を配列と見なし、係数も配列として求める方
法等が有る。後者の画像データを配列と見なす方法で
は、画像の配列を「配列:A」と表し、画像の配列
を「配列:B」と表し、係数配列を「配列:K」と表す
と、下記数3の式のように「配列:A」と「配列:B」
の逆行列とから係数配列Kを求める。
As one of the methods, if two images are simply referred to as an image and an image, the value of the same pixel (x, y) of these two images is “image (x, y), image (x, y). y) ”, there is a method of obtaining the coefficient (x, y) for each pixel as in the following formula (1). Alternatively, there is a method of averaging the coefficients calculated for each pixel in the entire image to obtain one coefficient as in the following formula (2).
There is a method in which the vertical and horizontal directions of an image are regarded as an array and the coefficients are also calculated as an array. In the latter method of considering image data as an array, the image array is represented as “array: A”, the image array is represented as “array: B”, and the coefficient array is represented as “array: K”. "Array: A" and "Array: B" as in the formula
The coefficient array K is obtained from the inverse matrix of

【0027】[0027]

【数1】 係数(x,y)=画像(x,y)/画像(x,y) ・・・式(1)[Equation 1] coefficient (x, y) = image (x, y) / image (x, y) (1)

【0028】[0028]

【数2】 係数=[Σ{画像(x,y)/画像(x,y)}]/N ・・・式(2) 但し、Nは画像の画素数。## EQU00002 ## Coefficient = [. SIGMA. {Image (x, y) / image (x, y)}] / N equation (2) where N is the number of pixels of the image.

【0029】[0029]

【数3】 配列:K=(配列:A)×(配列:Bの逆行列) ・・・式(3)## EQU00003 ## Array: K = (array: A) .times. (Array: inverse matrix of B) ... Equation (3)

【0030】また、2つの画像間の減算処理は、下記数
4の式となる。
Further, the subtraction process between two images is expressed by the following equation (4).

【0031】[0031]

【数4】 減算処理結果画像=画像−画像×演算係数 ・・・式(3)## EQU00004 ## Subtraction processing result image = image-image * calculation coefficient ... Equation (3)

【0032】次に、図に示す具体的実施例を用いて、本
発明に係るX線による異物検出装置を説明する。
Next, the X-ray foreign matter detecting apparatus according to the present invention will be described with reference to a specific embodiment shown in the drawings.

【0033】図1は、本発明に係るX線による異物検出
装置の構成例を示し、この例の異物検出装置は、撮影条
件が変更可能なX線源1及びX線源制御装置2と、被検
体12を透過するX線の透過量を検出するX線検出器4
及びX線検出器制御装置5と、これらを制御しながら、
同一の被検体に対し、被検体の形状と異物の両方が撮影
できる第一撮影条件と、被検体の形状のみが撮影できる
第一撮影条件とで、異なる2つのX線画像の撮影を行う
撮影制御装置3と、得られた2つのX線画像を記録する
ための第一、第二各画像記録装置6、7と、予め異物の
無い被検体でこれら2つのX線画像間の関係を求めた演
算係数を記憶しておく演算係数記憶装置8と、検査対象
の被検体の2つのX線画像を先に求めた演算係数で減算
処理を行い異物を検出する演算処理装置9と、検出結果
を表示する表示装置10と、検出結果を記録する処理結
果記録装置11とで構成される。被検体12は台13に
設置される。
FIG. 1 shows an example of the configuration of an X-ray foreign matter detection device according to the present invention. The foreign matter detection device of this example includes an X-ray source 1 and an X-ray source control device 2 whose imaging conditions can be changed. X-ray detector 4 for detecting the amount of X-rays transmitted through the subject 12
And the X-ray detector control device 5 and controlling these,
Imaging in which two different X-ray images are captured for the same subject under the first imaging condition in which both the shape of the subject and foreign matter can be imaged and the first imaging condition in which only the shape of the subject is imaged The control device 3, the first and second image recording devices 6 and 7 for recording the two obtained X-ray images, and the relationship between these two X-ray images are previously obtained in a subject free from foreign matter. A calculation coefficient storage device 8 for storing the calculated calculation coefficient, a calculation processing device 9 for performing a subtraction process on the two X-ray images of the subject to be inspected with the calculation coefficient previously obtained, and detecting a foreign matter; And a processing result recording device 11 that records the detection result. The subject 12 is installed on the table 13.

【0034】X線源1は、X線照射タイミングや時間等
の制御機能に加えてX線を発生するための線源電圧及び
線源電流の可変回路を持つX線源制御装置2の制御によ
って、同X線源1の撮影条件が変更可能なものである。
例えば、線源電圧を高くすることにより、発生するX線
のエネルギを高めることができ、X線が被検体12を透
過し易くなる。従って、例えばX線のエネルギの大小に
より、同一の被検体に対して、被検体の形状及び異物の
両方を撮影できる第一撮影条件と、異物には充分な輝度
が得られないが、被検体の形状は或る程度の輝度で撮影
できる第二撮影条件とを選択して設定することができ
る。
The X-ray source 1 is controlled by an X-ray source controller 2 having a variable circuit of a source voltage and a source current for generating X-rays in addition to a control function of X-ray irradiation timing and time. The imaging conditions of the X-ray source 1 can be changed.
For example, by increasing the source voltage, the energy of the generated X-rays can be increased, and the X-rays can easily pass through the subject 12. Therefore, for example, due to the magnitude of the energy of X-rays, the first imaging condition that allows both the shape of the subject and the foreign matter to be photographed for the same subject, and sufficient luminance for the foreign matter cannot be obtained. The shape of can be set by selecting a second shooting condition that allows shooting with a certain brightness.

【0035】X線検出器4はX線源1から照射されて被
検体12を透過したX線の量を検出するものであり、X
線検出器制御装置5の制御によって、被検体12を透過
したX線の強度分布を輝度の明暗値とする画像が得られ
る。
The X-ray detector 4 detects the amount of X-rays emitted from the X-ray source 1 and transmitted through the subject 12.
By the control of the line detector control device 5, an image in which the intensity distribution of the X-rays transmitted through the subject 12 is used as the brightness value of brightness is obtained.

【0036】撮影制御装置3は、X線源制御装置2に対
して線源電圧等を変更させてX線源1の撮影条件等を制
御すると共に、X線検出器4並びにX線検出器制御装置
5を制御することによって、被検体12を透過したX線
の強度分布を輝度の明暗値とするX線画像を、撮影条件
を変えて取り込み、第一画像は第一画像記憶装置6に記
録し、第二画像は第二画像記憶装置7に記録するもので
ある。
The imaging controller 3 controls the X-ray source controller 2 to change the source voltage and the like to control the imaging conditions and the like of the X-ray source 1, and controls the X-ray detector 4 and the X-ray detector. By controlling the device 5, an X-ray image in which the intensity distribution of the X-rays transmitted through the subject 12 is used as the brightness value of the brightness is captured under different imaging conditions, and the first image is recorded in the first image storage device 6. However, the second image is recorded in the second image storage device 7.

【0037】そして実際に検査を行う前に、予め、異物
等が混入していない被検体を用いて、撮影制御装置3の
制御により上述した被検体の形状と異物の両方が撮影で
きる第一撮影条件と、異物には充分な輝度が得られない
が、被検体の形状は或る程度の輝度で撮影できる第二撮
影条件で、撮影条件の異なる2つのX線画像を撮影し、
第一画像及び第二画像を第一、第二各画像記憶装置6、
7に記録する。ここでは、得られた第一画像及び第二画
像を用いて、演算処理装置9において、これら2つの画
像間の関係を前述した数1〜3の式等の方法で減算処理
用の演算係数として求め、演算係数記憶装置8に記録す
る。
Before actually carrying out the inspection, a first radiographing in which both the shape and the foreign matter of the subject described above can be photographed by the control of the photographing control device 3 by using the subject in which the foreign matter is not mixed in advance. The condition and the foreign object does not have sufficient brightness, but the shape of the subject is the second imaging condition that allows imaging with a certain brightness, and two X-ray images with different imaging conditions are taken.
The first image and the second image are stored in the first and second image storage devices 6,
Record at 7. Here, using the obtained first image and second image, in the arithmetic processing unit 9, the relationship between these two images is used as the arithmetic coefficient for the subtraction process by the method of the equations 1 to 3 described above. Obtained and recorded in the calculation coefficient storage device 8.

【0038】次に、実際に異物混入の有無の検査を行う
被検体12について、同様に、被検体の形状と異物の両
方が撮影できる第一撮影条件と、異物には充分な輝度が
得られないが、被検体の形状は或る程度の輝度で撮影で
きる第二撮影条件で、撮影制御装置3の制御により撮影
条件の異なる2つのX線画像を撮影し、第一画像及び第
二画像を第一、第二各画像記憶装置6、7に記録する。
今度は、これら記憶された第一画像及び第二画像と、先
の演算係数記憶装置8に記憶されている演算係数とを用
い、これら2つの画像の減算処理を前述した数4の式等
の方法で演算処理装置9において行い、減算処理結果の
画像を求める。
Next, regarding the subject 12 which is actually inspected for the presence of foreign matter, similarly, the first photographing condition capable of photographing both the shape of the subject and the foreign matter and sufficient brightness for the foreign matter are obtained. However, the shape of the subject is a second imaging condition that allows imaging with a certain level of brightness, and two X-ray images with different imaging conditions are taken under the control of the imaging control device 3, and the first image and the second image are taken. The data is recorded in the first and second image storage devices 6 and 7.
This time, using the stored first image and second image and the calculation coefficient stored in the previous calculation coefficient storage device 8, the subtraction processing of these two images is performed by the above-described equation (4). The calculation processing device 9 is used to obtain the image of the subtraction processing result.

【0039】図2に示すように、形状変化等以外の異物
等の混入による濃淡が有る場合は、先の演算係数を用い
て第一画像14と第二画像15間の減算処理を行うと、
演算処理結果画像16では異物等の混入のみが強調され
て抽出される。
As shown in FIG. 2, when there is a shading due to the inclusion of foreign matter or the like other than the shape change, if the subtraction process between the first image 14 and the second image 15 is performed using the above calculation coefficient,
In the calculation processing result image 16, only the inclusion of foreign matter or the like is emphasized and extracted.

【0040】減算処理結果画像16に濃淡が抽出されれ
ば、演算処理装置9はその被検体12中に異物の混入が
有ると判定し、判定結果を表示装置10に出力し表示す
るとともに、処理結果記録装置11に記録し保存する。
When the grayscale is extracted in the subtraction processing result image 16, the arithmetic processing unit 9 determines that the foreign matter is mixed in the subject 12 and outputs the determination result to the display unit 10 to display it. The result is recorded and stored in the result recording device 11.

【0041】これらにより、被検体12中の異物等の混
入の有無が判定され、リアルタイムのX線異物検出装置
として極めて有用である。
From these, the presence / absence of foreign matter in the subject 12 is determined, which is extremely useful as a real-time X-ray foreign matter detecting apparatus.

【0042】次に、図3及び図4は、本発明に係るX線
による異物検出装置のそれぞれ別の構成例のブッロク図
を示しており、図1に示したX線による異物検出装置と
は、基本的に、撮影条件の変更方法だけが異なる。
Next, FIG. 3 and FIG. 4 are block diagrams of different constitutional examples of the X-ray foreign matter detecting apparatus according to the present invention. The X-ray foreign matter detecting apparatus shown in FIG. , Basically, only the method of changing the shooting condition is different.

【0043】図3の例では、撮影条件をX線源1の制御
装置であるX線源制御装置により源線電圧等を変えるこ
とで変更するのではなく、X線源1を移動させる移動機
構17を用い、X線源制御装置19を通して撮影制御装
置3でX線源移動機構17を制御することにより、X線
源1を図面上で上下方向に移動させ、X線源1と被検体
12及びX線検出器4との距離を変えて撮影条件を変え
る。つまり、X線源1が発生するX線エネルギが一定で
あっても、X線源1と被検体12及びX線検出器4との
距離を変更するとX線の透過強度が変わることを利用し
て、撮影条件を変更し、同一の被検体に対して第一と第
二2つの画像を得る構成となっている。得られた第一画
像と第二画像の処理部分については、図1に示したX線
による異物検出装置と同様に行われる。
In the example of FIG. 3, the moving conditions for moving the X-ray source 1 are not changed by changing the source line voltage or the like by the X-ray source control device which is the control device of the X-ray source 1 in the example. 17, the X-ray source moving mechanism 17 is controlled by the imaging control device 3 through the X-ray source control device 19 to move the X-ray source 1 in the vertical direction in the drawing, and the X-ray source 1 and the subject 12 And the imaging conditions are changed by changing the distance from the X-ray detector 4. That is, even if the X-ray energy generated by the X-ray source 1 is constant, the fact that the X-ray transmission intensity changes when the distance between the X-ray source 1 and the subject 12 and the X-ray detector 4 changes is used. Then, the imaging conditions are changed to obtain the first and second images for the same subject. Processing of the obtained first image and second image is performed in the same manner as in the X-ray foreign matter detection apparatus shown in FIG.

【0044】図4の例では、薄い鉄板等のフィルタ18
Aと、このフィルタ18Aを被検体12とX線検出器4
との間に挿入するフィルタ挿入装置18とを用い、撮影
制御装置3でフィルタ挿入装置18を制御してフィルタ
18Aを被検体12とX線検出器4との間に挿入したり
外させたり、或いは挿入度合を変えることにより、撮影
条件を変える。つまり、X線検出器4自体の感度が一定
であっても、フィルタ18Aの挿入によりX線検出感度
が等価的に低下することを利用して、撮影条件を変更
し、同一の被検体に対して第一と第二2つの画像を得る
構成となっている。得られた第一画像と第二画像の処理
部分については、図1に示したX線による異物検出装置
と同様に行われる。
In the example of FIG. 4, the filter 18 such as a thin iron plate is used.
A, this filter 18A, the object 12 and the X-ray detector 4
And a filter insertion device 18 to be inserted between the X-ray detector 4 and the subject 12 and the X-ray detector 4 by controlling the filter insertion device 18 with the imaging control device 3. Alternatively, the shooting condition is changed by changing the insertion degree. That is, even if the sensitivity of the X-ray detector 4 itself is constant, the fact that the X-ray detection sensitivity is equivalently lowered by the insertion of the filter 18A is used to change the imaging conditions and As a result, the first and second images are obtained. Processing of the obtained first image and second image is performed in the same manner as in the X-ray foreign matter detection apparatus shown in FIG.

【0045】図3の変形例として、X線源移動機構17
の代わりに、図示はしないがX線検出器4を移動させる
移動機構を用い、X線検出器制御装置5を通して撮影制
御装置3でX線検出器移動機構を制御してX線検出器4
を図面上で上下方向に移動させることにより、X線源1
と被検体12及びX線検出器4との距離を変えて撮影条
件を変える。この場合も、X線源1と被検体12及びX
線検出器4との距離の変更によりX線の透過強度が変わ
るので、撮影条件を変更することができる。
As a modification of FIG. 3, the X-ray source moving mechanism 17 is used.
Instead of the above, a moving mechanism (not shown) for moving the X-ray detector 4 is used, and the X-ray detector moving mechanism is controlled by the imaging controller 3 through the X-ray detector controller 5 to control the X-ray detector 4.
X-ray source 1 by moving the
The imaging conditions are changed by changing the distance between the subject 12 and the X-ray detector 4. Also in this case, the X-ray source 1, the subject 12 and the X
Since the X-ray transmission intensity changes according to the change in the distance from the line detector 4, the imaging conditions can be changed.

【0046】図4の変形例として、これも図示はしない
が、フィルタ18AをX線源1と被検体12との間に挿
入する構成とする。この場合もフィルタ18Aの挿入の
有無によりX線検出感度が等価的に変わり、撮影条件を
変更することができる。
As a modification of FIG. 4, although not shown, the filter 18A is inserted between the X-ray source 1 and the subject 12. Also in this case, the X-ray detection sensitivity is equivalently changed depending on whether the filter 18A is inserted, and the imaging condition can be changed.

【0047】図4の例に関連して、フィルタ18Aを用
いる代わりに、X線検出器4自体を感度変更可能なもの
とし、X線検出器制御装置5を通して撮影制御装置3で
X線検出器4自体の感度を電気的に変更させることによ
り撮影条件を変更するように構成しても良い。
In connection with the example of FIG. 4, instead of using the filter 18A, the sensitivity of the X-ray detector 4 itself can be changed, and the X-ray detector is controlled by the imaging controller 3 through the X-ray detector controller 5. The photographing condition may be changed by electrically changing the sensitivity of 4 itself.

【0048】更に、線源電圧等を変更することによりに
よりX線源1が発生するX線エネルギ自体を変更して撮
影条件を変更する図1の撮影条件変更手段、X線源1又
はX線検出器4を移動して撮影条件を変更する図3及び
その変形例の撮影条件変更手段、フィルタ18Aの出し
入れで撮影条件を変更する図4及びその変形例の撮影条
件変更手段、並びにX線検出器4自体の感度を電気的に
変更して撮影条件を変更する手段の何れか複数を併用し
て撮影条件を変更する構成としても良い。
Further, by changing the radiation source voltage or the like, the X-ray energy generated by the X-ray source 1 is changed to change the photographing conditions, the photographing condition changing means of FIG. 1, the X-ray source 1 or the X-rays. 3 for changing the imaging condition by moving the detector 4 and its modified example of the imaging condition changing means, FIG. 4 for changing the imaging condition by inserting and removing the filter 18A and its modified example of the imaging condition changing means, and X-ray detection. A configuration may be used in which any of a plurality of means for electrically changing the sensitivity of the device 4 itself to change the shooting condition is used to change the shooting condition.

【0049】[0049]

【発明の効果】以上説明したように、本発明のX線によ
る異物検出装置では、下記(1)〜(3)の効果が得られる。 (1)個々の被検体にばらつきがあっても、同じ被検体
で撮影条件の異なる2つのX線画像を撮影して減算処理
を行うため、上記ばらつきが処理結果に影響しないとい
う利点がある。 (2)同様に、被検体の形状変化等に起因するX線画像
の濃淡が、基本的に、同じ被検体に対する撮影条件の異
なる2つのX線画像中の同じ場所現れるので、従来のよ
うな被検体と参照の間で形状変化が存在する位置を合わ
せるための処理や制約が無くて済む。 (3)異物の混入によるX線画像の輝度変化(=X線透
過量の変化)のみを抽出することができるため、異物検
出の効率が向上する。
As described above, the foreign matter detecting device using X-rays according to the present invention has the following effects (1) to (3). (1) Even if there is a variation in each subject, two X-ray images of the same subject with different imaging conditions are imaged and the subtraction processing is performed, so there is an advantage that the above variation does not affect the processing result. (2) Similarly, since the light and shade of the X-ray image due to the shape change of the subject and the like basically appear at the same place in two X-ray images with different imaging conditions for the same subject, the conventional There is no need for processing or restrictions for matching the position where the shape change exists between the subject and the reference. (3) Since only the change in the brightness of the X-ray image (= the change in the X-ray transmission amount) due to the inclusion of foreign matter can be extracted, the efficiency of foreign matter detection is improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施の形態に係るX線による異物検査
装置の第一実施例の構成を示すブロック図。
FIG. 1 is a block diagram showing a configuration of a first example of a foreign matter inspection apparatus using X-rays according to an embodiment of the present invention.

【図2】本発明に係る画像間の減算処理を示す模式図。FIG. 2 is a schematic diagram showing subtraction processing between images according to the present invention.

【図3】本発明の実施の形態に係るX線による異物検査
装置の第二実施例の構成を示すブロック図。
FIG. 3 is a block diagram showing a configuration of a second example of the foreign matter inspection apparatus using X-rays according to the embodiment of the present invention.

【図4】本発明の実施の形態に係るX線による異物検査
装置の第三実施例の構成を示すブロック図。
FIG. 4 is a block diagram showing a configuration of a third example of the foreign matter inspection apparatus using X-rays according to the embodiment of the present invention.

【図5】従来の異物検査装置の構成を示すブロック図。FIG. 5 is a block diagram showing a configuration of a conventional foreign matter inspection device.

【符号の説明】[Explanation of symbols]

1 X線源 2 X線源制御装置(線源電圧及び線源電流可変回路) 3 撮影制御装置 4 X線検出器 5 X線検出器制御装置 6 第一画像記憶装置 7 第二画像記憶装置 8 演算係数記憶装置 9 演算処理装置 10 表示装置 11 処理結果記録装置 12 被検体 13 台 14 第一画像 15 第二画像 16 演算処理結果画像 17 X線源移動機構 18 フィルタ挿入装置 18A フィルタ 19 X線源制御装置 1 X-ray source 2 X-ray source control device (source voltage and source current variable circuit) 3 Imaging control device 4 X-ray detector 5 X-ray detector control device 6 First image storage device 7 Second image storage device 8 Arithmetic coefficient storage device 9 Arithmetic processing device 10 Display device 11 Processing result recording device 12 Subject 13 units 14 First image 15 Second image 16 Arithmetic processing result image 17 X-ray source moving mechanism 18 Filter insertion device 18A filter 19 X-ray source Control device

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】X線源と、このX線源を制御するX線源制
御装置と、前記X線源から照射され、被検体を透過する
X線の透過量を検出するX線検出器と、このX線検出器
を制御するX線検出器制御装置と、前記X線源制御装置
及び前記X線検出器制御装置を制御しながら、同一の被
検体に対して、被検体の形状及び異物の両方を撮影でき
る第一撮影条件と、異物には充分な輝度が得られない
が、被検体の形状は或る程度の輝度で撮影できる第二撮
影条件とで2つのX線画像の撮影を行う撮影制御装置
と、第一撮影条件で得られる第一画像と第二撮影条件で
得られる第二画像を記録するための画像記憶装置と、予
め異物の無い被検体についてのこれら撮影条件が異なる
第一、第二2つの画像間の関係を演算係数として記憶し
ておく演算係数記憶装置と、検査対象の被検体について
第一画像と第二画像を先の演算係数で減算処理を行い異
物を検出する演算処理装置とで構成されることを特徴と
するX線による異物検出装置。
1. An X-ray source, an X-ray source control device for controlling the X-ray source, and an X-ray detector for detecting the amount of X-rays emitted from the X-ray source and transmitted through a subject. While controlling the X-ray detector controller controlling the X-ray detector, the X-ray source controller and the X-ray detector controller, the shape of the subject and the foreign matter with respect to the same subject Two X-ray images can be taken under the first imaging condition in which both of the two can be imaged and the second imaging condition in which the shape of the subject can be imaged with a certain level of brightness, although sufficient brightness cannot be obtained for foreign matter. The image capturing control device that performs the image capturing, the image storage device that records the first image obtained under the first image capturing condition and the second image obtained under the second image capturing condition, and these image capturing conditions for a subject free of foreign matter in advance are different. A calculation coefficient storage device that stores the relationship between the first and second images as a calculation coefficient When foreign matter detecting device according to X-rays, characterized in that it is constituted by a processing unit for detecting a foreign object performs subtraction processing by the calculation coefficient of the first image and the second image for the subject to be examined first.
【請求項2】前記X線源制御装置は前記X線源に供給す
る線源電圧及び線源電流のうち少なくとも一方が可変の
回路を有し、前記撮影制御装置は前記X線源制御装置を
制御して線源電圧及び線源電流のうち少なくとも一方を
変更させることにより、撮影条件を変えて第一画像と第
二画像2つのX線画像の撮影を行うものであることを特
徴とする請求項1に記載のX線による異物検出装置。
2. The X-ray source control device has a circuit in which at least one of a source voltage and a source current supplied to the X-ray source is variable, and the imaging control device includes the X-ray source control device. By controlling and changing at least one of the source voltage and the source current, the X-ray images of the first image and the second image are imaged under different imaging conditions. Item 1. An X-ray foreign matter detection device according to item 1.
【請求項3】前記X線源と前記X線検出器との間の距離
を変える移動機構を備え、前記撮影制御装置は前記移動
機構を制御して前記X線源と前記X線検出器との距離を
変更させることにより、撮影条件を変えて第一画像と第
二画像2つのX線画像の撮影を行うものであることを特
徴とする請求項1に記載のX線による異物検出装置。
3. A moving mechanism for changing the distance between the X-ray source and the X-ray detector, wherein the imaging control device controls the moving mechanism to cause the X-ray source and the X-ray detector to move. The X-ray foreign matter detection device according to claim 1, wherein the X-ray image capturing apparatus is configured to capture the two X-ray images of the first image and the second image by changing the imaging condition by changing the distance.
【請求項4】X線に対するフィルタと、このフィルタを
前記X線源と前記X線検出器との間に出し入れするフィ
ルタ挿入装置とを備え、前記撮影制御装置は前記フィル
タ挿入装置を制御して前記フィルタを出し入れさせるこ
とにより、撮影条件を変えて第一画像と第二画像2つの
X線画像の撮影を行うものであることを特徴とする請求
項1に記載のX線による異物検出装置。
4. An X-ray filter, and a filter insertion device for inserting and removing the filter between the X-ray source and the X-ray detector, wherein the imaging control device controls the filter insertion device. The foreign matter detection device by X-rays according to claim 1, wherein the X-ray image capturing apparatus includes a first image and a second image, which are two X-ray images, by changing the imaging conditions by moving the filter in and out.
JP10096896A 1996-04-23 1996-04-23 X-ray foreign matter detection device Expired - Fee Related JP3263594B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10096896A JP3263594B2 (en) 1996-04-23 1996-04-23 X-ray foreign matter detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10096896A JP3263594B2 (en) 1996-04-23 1996-04-23 X-ray foreign matter detection device

Publications (2)

Publication Number Publication Date
JPH09288071A true JPH09288071A (en) 1997-11-04
JP3263594B2 JP3263594B2 (en) 2002-03-04

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Country Status (1)

Country Link
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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008020346A (en) * 2006-07-13 2008-01-31 Fuji Xerox Co Ltd Apparatus and method for detecting object
JP2008173486A (en) * 1998-08-26 2008-07-31 Fujifilm Corp Radiation image detecting system
JP2009139230A (en) * 2007-12-06 2009-06-25 Anritsu Sanki System Co Ltd X-ray foreign-material detecting device
JP2010091483A (en) * 2008-10-09 2010-04-22 Anritsu Sanki System Co Ltd Method and device for detecting foreign matter
JP2010281649A (en) * 2009-06-03 2010-12-16 Nagoya Electric Works Co Ltd Device, method and program for radiographic inspection
JP2013205338A (en) * 2012-03-29 2013-10-07 Anritsu Sanki System Co Ltd X-ray inspection apparatus
JP2016090494A (en) * 2014-11-10 2016-05-23 株式会社 オプトメカトロ X-ray inspection device

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01196551A (en) * 1988-01-31 1989-08-08 Shimadzu Corp Quantitative analyzer for bone salt
JPH02266248A (en) * 1989-04-06 1990-10-31 Hitachi Plant Eng & Constr Co Ltd Inspection of foreign matter
JPH02278974A (en) * 1989-04-19 1990-11-15 Matsushita Electric Ind Co Ltd X-ray radiograph processor

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01196551A (en) * 1988-01-31 1989-08-08 Shimadzu Corp Quantitative analyzer for bone salt
JPH02266248A (en) * 1989-04-06 1990-10-31 Hitachi Plant Eng & Constr Co Ltd Inspection of foreign matter
JPH02278974A (en) * 1989-04-19 1990-11-15 Matsushita Electric Ind Co Ltd X-ray radiograph processor

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008173486A (en) * 1998-08-26 2008-07-31 Fujifilm Corp Radiation image detecting system
JP4709237B2 (en) * 1998-08-26 2011-06-22 富士フイルム株式会社 Radiation image detection device
JP2008020346A (en) * 2006-07-13 2008-01-31 Fuji Xerox Co Ltd Apparatus and method for detecting object
JP2009139230A (en) * 2007-12-06 2009-06-25 Anritsu Sanki System Co Ltd X-ray foreign-material detecting device
JP2010091483A (en) * 2008-10-09 2010-04-22 Anritsu Sanki System Co Ltd Method and device for detecting foreign matter
JP2010281649A (en) * 2009-06-03 2010-12-16 Nagoya Electric Works Co Ltd Device, method and program for radiographic inspection
JP2013205338A (en) * 2012-03-29 2013-10-07 Anritsu Sanki System Co Ltd X-ray inspection apparatus
JP2016090494A (en) * 2014-11-10 2016-05-23 株式会社 オプトメカトロ X-ray inspection device

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