JPH04144028A - Automatic detecting method for mask clogging of color cathode ray tube - Google Patents
Automatic detecting method for mask clogging of color cathode ray tubeInfo
- Publication number
- JPH04144028A JPH04144028A JP26392490A JP26392490A JPH04144028A JP H04144028 A JPH04144028 A JP H04144028A JP 26392490 A JP26392490 A JP 26392490A JP 26392490 A JP26392490 A JP 26392490A JP H04144028 A JPH04144028 A JP H04144028A
- Authority
- JP
- Japan
- Prior art keywords
- image
- ray tube
- cathode ray
- data
- color cathode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title description 3
- 230000007547 defect Effects 0.000 claims abstract description 43
- 238000010894 electron beam technology Methods 0.000 claims description 18
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 7
- 238000001514 detection method Methods 0.000 claims description 2
- 238000003860 storage Methods 0.000 description 12
- 238000007689 inspection Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000011179 visual inspection Methods 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 2
- 208000019914 Mental Fatigue Diseases 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000012850 discrimination method Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 210000004907 gland Anatomy 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 230000001568 sexual effect Effects 0.000 description 1
Landscapes
- Formation Of Various Coating Films On Cathode Ray Tubes And Lamps (AREA)
- Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
Abstract
Description
[産業上の利用分野]
本発明は、カラー陰極線管のシャドウマスク開口の詰り
に起因する画像欠陥だけを分離検出できるようにしたカ
ラー陰陽線管マスク詰り自動検出法に関する。
[従来の技術]
シャ1〜ウマスク方式カラー¥A極線管の画像欠陥の中
に、螢光面を形成する螢光体の塗布状態不良などにより
螢光面を電子ビームが走査しても発光しない螢光面自体
に不良箇所が生じているためのものと、シャドウマスク
の電子ビーム通過用の開口部にゴミなど管内異物が詰っ
て電子ビームが螢光面に到達するのを妨げているために
本来は正常に発光する筈の螢光面が電子ビームに励起さ
れないので生ずるものとがある。
カラー陰極線管の製造者にとっては、前圧の画像欠陥も
絶滅させなければならないものであるが、上記2種類の
欠陥の原因は一般には異なっており対策もそれぞれ異な
るから、両者を区別しなければならない。
[発明が解l失しようとする課題]
カラー陰極線管のような量産される製品を人間の五感た
とえば肉眼による目視に頼って検査することは、検査者
の個人的な状態たとλば検査時の身体的または精神的疲
労の程度、性癖などの個人差5等々種ケの要因によって
常に正常な結果を得ることは困離であるという問題は以
前から長く指摘されてきたところであり、近年の技術の
進歩に伴って、自動検査機の実用化が進展している。
上記のような、カラー陰極線管の画像欠陥の検出も、対
象が通常かなり小さいから、検査者の南限による目視検
査では1作業者が疲労してきた場合など、全ての欠陥を
見逃さずに正しく検出することは期待し難く、自動検査
機を導入することが望ましい。
しかし、従来からカラー陰極線管の自動検査機の量定、
実用化は行われていたが、カラー陰極線管の画像表示状
態を検査して、検出した画像欠陥が、螢光面自体の不良
に基つくものか、シャドウマスクの電子ビーム用開口の
閉塞すなわち目詰りに基づくものかを明確に分別して示
す自動検査機や自動譚別法は確立さ九でいなかった。勿
論5多数の量産製品の全数検査ではなく、比較的少数の
ものについて、画像欠陥の原因を研究的に追及して、欠
陥原因の識別を行うことが不可能だったわけではない。
本発明は、量産した多数のシャドウマスク方式カラー陰
極線管を自動的に検査して画像欠陥を検出し、しかも、
その画像欠陥の中から、シャドウマスクの目詰りによる
ものと、螢光面の不良によるものとを識別する方法を提
供することを目的とする。
[課題を解決するための手段]
」−2目的を達成するために本発明においては、自動的
に順次、カラー陰極線管に2表示面の全体を走査するラ
スタを表示させ、この表示を其の侭ビデオカメラで撮影
した映像のディジタルデータから、次いで上記同様のラ
スタ走査状態で、高い周波数の交流磁界の印加によりカ
ラー陰膳腺管内の電子ビームの螢光面到達位置を高速で
移動させながら、ビデオカメラで撮影した映像のディジ
タルデータを減算した結果を、被検カラー陰極線管のシ
ャドウマスクの電子ビーム通過用開口の詰りに起因する
映像の欠陥を示すデータと見做すことにした。
[作用]
シャドウマスク方式カラー陰極線管では、シャドウマス
クの特定の電子ビーム通過用開口を通過した夫1X3J
i色専用の電子ビームは、パネル内面の螢光面を形成す
る夫々特定の螢光体に射突して発光させなければならな
い。しかし、第2図(a)に示すように、シャドウマス
ク1bの電子ビーム通過用間に11に管内異物が詰って
目詰り12を生じているものがあると、螢光面1aを走
査中のデイビーム1oは、上記目詰りを生じている孔を
通過することは出来ないので、螢光面1a上に常に発光
しない黒い影13すなわち画像欠陥が生じる。一方、第
2図(b)に示すようにカラー陰極線管1の管内電子ビ
ーム軌道にコイル3によって交流磁界をかけると、電子
ビーム軌道に直交する磁界成分によってシャドウマスク
の開口を通過してから螢光面に到達するまでの13’ビ
ーム軌道が曲げら九、上記螢光面1a上に生ずる画像欠
陥13の位置も移動する。高い周波数の交流による電磁
界をかければ画像欠陥13の位置も高速で移動する。陰
極線管1の画面を撮影するビデオカメラ2の感度と露光
(シャッタ開放)時間を適当に選定しておけば、高周波
の交流による磁界をかけながら撮影したビデオカメラ2
の映像には、シャドウマスク1bの目詰りによる画像欠
陥13は、はっきりした黒い影となって現われなくなり
、現われるにしても、薄く、ぼんやり、広い範囲に広が
ったものになる。このような薄く広い影は、カメラ感度
を適当にするとか、映像回路の何処かで適当なしきい値
でデータを取捨選別するようにしておけば完全に除去で
きる。
すなわち、螢光面そのものの欠陥による画像欠陥は螢光
面に到達する電子ビーム軌道が途中でどんなになってい
ても(即ち高周波交流磁界印加状態でも)、陰極線管の
螢光面上で常に同じ箇所に現われるのに対して、シャド
ウマスクの目詰りによる画像欠陥の方は、高周波交流磁
界印加によって、ビデオカメラで撮影した映像のデータ
として残らなくなってしまう。従って、交流磁界を印加
し7ないて撮1したラスタの映像のデータから、高周波
交流磁界を印加しながC3撮影したラスタの映像のデー
タを減算すれば、上v、2種類の映像データの何右、に
も含まれでいるのは、螢光面自体の欠陥による画像欠陥
を示すデータであるから、減算した残りはシャドウマス
クの目詰りに起因する画像欠陥のデータという二とにな
る。
[実施例〕
第1図は本発明−・実施例の概略説明図である。
図中、1は被検カラー陰極線管、2はビデオカメラ、3
は−1−分高い周波数の交流を流すコイル、4はA /
D変換器、5はコイル3に通電せずに陰極IiA管1
に表示されたラスタを撮影し其の映像信号夕、へ7/゛
D変換したデータの記憶装r、6はコイル3に交流を流
して陰極線管内の電子ビーム軌道を振らせながら陰極線
管1に表示されたラスタの状態を撮影したビデオカメラ
2の映像のディジタルデータの記憶装置57は:2悼n
’1115 f、、1′−: 憶すI=、 t:−テ
9かI)記憶装置[Industrial Field of Application] The present invention relates to an automatic color cathode ray tube mask clogging detection method that is capable of separately detecting only image defects caused by clogging of the shadow mask aperture of a color cathode ray tube. [Prior art] Among the image defects of the 1~U mask type color A pole ray tube, due to poor coating of the phosphor that forms the phosphor surface, the phosphor surface does not emit light even when an electron beam scans it. This is because there is a defect in the fluorescent surface itself, and the opening of the shadow mask for the electron beam to pass is clogged with foreign matter such as dust, which prevents the electron beam from reaching the fluorescent surface. This occurs because the fluorescent surface, which should normally emit light, is not excited by the electron beam. For manufacturers of color cathode ray tubes, front pressure image defects must also be eradicated, but since the causes of the two types of defects mentioned above are generally different and the countermeasures are different, it is necessary to distinguish between the two. No. [Problem to be solved by the invention] Inspecting mass-produced products such as color cathode ray tubes by relying on human five senses, such as visual inspection with the naked eye, is difficult due to the personal condition of the inspector and the It has been pointed out for a long time that it is difficult to always obtain normal results due to various factors such as individual differences such as degree of physical or mental fatigue, sexual tendencies, etc. With progress, automatic inspection machines are being put into practical use. When detecting image defects in color cathode ray tubes, as mentioned above, the target is usually quite small, so visual inspection by the inspector's southern limit can accurately detect all defects without missing them, such as when one worker becomes fatigued. It is difficult to expect that this will happen, so it is desirable to introduce an automatic inspection machine. However, conventionally, automatic inspection machines for color cathode ray tubes have been used for quantitative determination.
Although it has been put into practical use, the image defects detected by inspecting the image display condition of color cathode ray tubes are either due to a defect in the phosphor surface itself or due to blockage or clogging of the electron beam aperture in the shadow mask. There was no established automatic inspection machine or automatic discrimination method that could clearly distinguish whether or not it was based on the above. Of course, it is not impossible to research and identify the causes of image defects in a relatively small number of products, rather than conducting a 100% inspection of a large number of mass-produced products. The present invention automatically inspects a large number of mass-produced shadow mask type color cathode ray tubes to detect image defects.
It is an object of the present invention to provide a method for distinguishing between image defects caused by clogging of a shadow mask and defects caused by a defective fluorescent surface. [Means for Solving the Problems] In order to achieve the object 2, the present invention automatically and sequentially causes the color cathode ray tube to display a raster that scans the entire 2 display surfaces; From the digital data of the image taken with the side video camera, the video is then generated in the same raster scanning state as above, while moving the fluorescent surface landing position of the electron beam in the color gland duct at high speed by applying a high frequency alternating magnetic field. We decided to consider the result of subtracting the digital data of the image taken by the camera as data indicating an image defect caused by clogging of the electron beam passage opening in the shadow mask of the color cathode ray tube to be tested. [Operation] In a shadow mask type color cathode ray tube, the electron beam passing through a specific electron beam passage aperture of the shadow mask is
The i-color electron beam must be emitted by striking each specific phosphor forming the phosphor surface on the inner surface of the panel. However, as shown in FIG. 2(a), if the electron beam passing gap 11 of the shadow mask 1b is clogged with foreign matter in the tube, causing a clogging 12, the fluorescent surface 1a is scanned. Since the day beam 1o cannot pass through the clogged hole, a black shadow 13 that does not emit light always appears on the fluorescent surface 1a, that is, an image defect. On the other hand, when an alternating current magnetic field is applied by the coil 3 to the electron beam trajectory in the color cathode ray tube 1 as shown in FIG. As the beam trajectory 13' is bent until it reaches the optical surface, the position of the image defect 13 occurring on the fluorescent surface 1a also moves. If an electromagnetic field due to high frequency alternating current is applied, the position of the image defect 13 will also move at high speed. By appropriately selecting the sensitivity and exposure (shutter opening) time of the video camera 2 that photographs the screen of the cathode ray tube 1, the video camera 2 can record images while applying a magnetic field due to high-frequency alternating current.
In the video, the image defect 13 due to the clogging of the shadow mask 1b no longer appears as a clear black shadow, and even if it does appear, it is thin, vague, and spread over a wide range. Such thin and wide shadows can be completely removed by adjusting the camera sensitivity appropriately or by selecting data with an appropriate threshold somewhere in the video circuit. In other words, image defects due to defects in the fluorescent surface itself will always occur at the same location on the fluorescent surface of the cathode ray tube, no matter what happens to the electron beam trajectory that reaches the fluorescent surface along the way (that is, even when a high-frequency AC magnetic field is applied). On the other hand, image defects due to shadow mask clogging are no longer retained as data in images shot by a video camera when a high-frequency alternating current magnetic field is applied. Therefore, if we subtract the data of the raster image taken C3 while applying a high-frequency AC magnetic field from the data of the raster image taken C3 without applying an AC magnetic field, we can obtain the data of the two types of image data. What is included on the right is data indicating image defects caused by defects in the fluorescent surface itself, so the remainder after subtraction is data about image defects caused by clogging of the shadow mask. [Example] FIG. 1 is a schematic explanatory diagram of an example of the present invention. In the figure, 1 is a color cathode ray tube to be tested, 2 is a video camera, and 3 is a video camera.
is a coil that sends alternating current at a high frequency by -1 minutes, and 4 is A /
D converter, 5 is the cathode IiA tube 1 without energizing the coil 3.
The storage device r, 6 for storing the data converted into 7/゛D by photographing the raster image displayed on the video signal 6 sends the data to the cathode ray tube 1 by passing an alternating current through the coil 3 to swing the electron beam trajectory in the cathode ray tube. The storage device 57 for digital data of the image taken by the video camera 2 that captures the displayed raster state is: 2.
'1115 f,,1'-: Store I=, t:-te 9 or I) Storage device
【31こ記憶されたデータを各アト
: 1.2毎19、−減算した結果を記憶する記憶装置
、8は記憶装置7内のデータの画像表示、9は制御装置
、13はシャ1へウマスフ詰りによる画像欠陥】4は螢
光面そのものの欠陥による画像欠陥である。なお、実際
には、ビデオカメラ2は、十分精細度の高い映像を得る
ために数十台使用することもある。また、記憶装置5,
6.7は大きな容量の記憶装置の中で、記憶内容に応じ
て割り振られた記憶領域であっても勿論差支えない。記
憶装置5.6,7などの代わりにレジスタを使用しでも
良いが、このような多数の製品についての自動検吉の結
果のデータは、−色にしばらく記憶装置内番、二保存し
ておく方が便利な場合が多い。制御装置9は、上記一連
の処理の制御だけを行うMPUでも、全自動検査システ
ムを制御するC P Uであっても良い。画像表示8に
はシャドウマスク詰りによる画像欠陥13だけが示され
る。螢光面自体υ)不良たけに基づく画像欠陥は、記憶
装置6内のブタを画像表示させて見力、ば!1IIIる
。なお、本実施例で使用したビデオカメラ2の各画素に
対する光電変換素子には、1/3o又は]/60秒の光
蓄積時間のものを・用いた2、ロイル:3に漆、す交流
の周波数置5ON 7以上り一すtl:f、1N詰りに
よる画像欠陥の映像は見えなくなる。、コイ′ル3によ
る交流磁界は、カラー陰極線管内の電子ビーム軌道に直
交すイ、成4分を有り、ていれば良く、′817印加の
方向に余り神経質になる必要はない。
[発明の効果コ
以り説明し、たように本発明によれば、シャドウマスク
方式カラー陰極線管の、螢光面自体の不良による画像欠
陥と、シャドウマスク詰りによる画像欠陥とを、目視作
業の場合に起こり易い見逃り。
など力問題を土することなく、自動的に確実に分別して
検出する二)、が可能になり、カラー陰暎線管の製造工
程の改善に極めて有効である。[31 pieces of stored data are stored in each atto: 1.2 every 19, - a storage device that stores the subtraction result, 8 is an image display of the data in the storage device 7, 9 is a control device, 13 is a screen 1 Image defect due to clogging] 4 is an image defect due to a defect in the fluorescent surface itself. Note that, in reality, several dozen video cameras 2 may be used in order to obtain images with sufficiently high definition. In addition, the storage device 5,
6.7 may of course be a storage area allocated according to the storage contents in a large capacity storage device. Registers may be used in place of the memory devices 5, 6, 7, etc., but the data of the automatic test results for such a large number of products should be saved for a while in the memory device. It is often more convenient. The control device 9 may be an MPU that only controls the series of processes described above, or a CPU that controls a fully automatic inspection system. Image display 8 shows only image defects 13 due to shadow mask clogging. Image defects due to defects in the fluorescent surface itself υ) can be detected by displaying the image of the pig in the storage device 6 and checking the visibility. 1III. The photoelectric conversion element for each pixel of the video camera 2 used in this example was one with a light accumulation time of 1/3 o or ]/60 seconds. Frequency position 5ON 7 or higher tl:f, 1N Images with image defects due to clogging become invisible. The alternating current magnetic field generated by the coil 3 has components (a) and (4) perpendicular to the trajectory of the electron beam in the color cathode ray tube. [Effects of the Invention] As described above, according to the present invention, image defects due to defects in the fluorescent surface itself of a shadow mask type color cathode ray tube and image defects due to shadow mask clogging can be eliminated by visual inspection. This is an oversight that can easily occur. This makes it possible to automatically and reliably separate and detect 2) without causing problems such as power problems, and is extremely effective in improving the manufacturing process of color shadow ray tubes.
第1図は本宛明−実施例の概略説明図、第2図(a)は
シャドウマスクの目詰りによる画像欠陥発生を説明する
図、第2回(b)はシャドウマスク詰り1゛Lる欠陥を
交流磁界の印加により現われなくシ1.−いろ状態を示
す図7″千八、
1 カラー陰曝線管、 1a−螢光面、 ]bシャ
1−ウマスク、 2 ビデオカメラ、3 コイル、
、4−A/D変換器、 5.6 画像欠陥映像データの
記憶装置、 7 減算結果の記憶装置、 8 減算結果
の画像表示、 9 制御装置、 10−・電子ビーム
、 11・・・シャドウマスクの電子ビーム通過用開
口、 12・目詰り、13−シャドウマスク目詰りに
よる画像欠陥、第
図
4−’tffDtlイf()2%% I=X6alX”
X’S白第
図
lb)Fig. 1 is a schematic explanatory diagram of an embodiment of the present invention, Fig. 2 (a) is a diagram illustrating the occurrence of an image defect due to a clogged shadow mask, and Part 2 (b) is a diagram illustrating the occurrence of an image defect due to a clogged shadow mask. 1. To prevent defects from appearing by applying an alternating magnetic field. - Figure 7" showing the colored state, 1 Color shaded radiation tube, 1a - Fluorescent surface, ]b Shade mask, 2 Video camera, 3 Coil,
, 4-A/D converter, 5.6 Storage device for image defect video data, 7 Storage device for subtraction results, 8 Image display for subtraction results, 9 Control device, 10-Electron beam, 11-Shadow mask 12-Clogging, 13-Image defect due to shadow mask clogging, Figure 4-'tffDtl if()2%% I=X6alX''
X'S white diagram lb)
Claims (1)
るラスタを表示させ、この表示を其の儘ビデオカメラで
撮影した映像のディジタルデータから、次いで上記同様
のラスタ走査状態で、交流磁界によりカラー陰極線管の
電子ビームの蛍光面到達位置を移動させながら、ビデオ
カメラで撮影した映像のディジタルデータを減算した結
果を、被検カラー陰極線管の、シャドウマスクの電子ビ
ーム通過用開口の詰りに起因する映像の欠陥を示すデー
タと見做すことを特徴とするカラー陰極線管マスク詰り
自動検出法。1. Automatically and sequentially display a raster pattern that scans the display surface on the color cathode ray tube, and then convert this display from the digital data of the image taken by the video camera, and then apply an alternating current magnetic field in the same raster scanning state as above. While moving the position where the electron beam of the color cathode ray tube reaches the phosphor screen, the result of subtracting the digital data of the image taken by the video camera is used to detect the blockage of the electron beam passage opening of the shadow mask of the color cathode ray tube under test. An automatic color cathode ray tube mask clogging detection method characterized in that the data is regarded as indicating a defect in an image caused by the clogging.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26392490A JPH04144028A (en) | 1990-10-03 | 1990-10-03 | Automatic detecting method for mask clogging of color cathode ray tube |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26392490A JPH04144028A (en) | 1990-10-03 | 1990-10-03 | Automatic detecting method for mask clogging of color cathode ray tube |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04144028A true JPH04144028A (en) | 1992-05-18 |
Family
ID=17396163
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP26392490A Pending JPH04144028A (en) | 1990-10-03 | 1990-10-03 | Automatic detecting method for mask clogging of color cathode ray tube |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04144028A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100378955B1 (en) * | 2000-09-26 | 2003-04-08 | 주식회사 현 시스템 | Wobbling apparatus for adjusting a DY and a CPM |
KR100393259B1 (en) * | 2001-01-30 | 2003-07-31 | 한국전기초자 주식회사 | Apparatus for compensating change of curvature in surface |
-
1990
- 1990-10-03 JP JP26392490A patent/JPH04144028A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100378955B1 (en) * | 2000-09-26 | 2003-04-08 | 주식회사 현 시스템 | Wobbling apparatus for adjusting a DY and a CPM |
KR100393259B1 (en) * | 2001-01-30 | 2003-07-31 | 한국전기초자 주식회사 | Apparatus for compensating change of curvature in surface |
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