JPH09116291A - Semiconductor integrated circuit device and its packaging structure - Google Patents

Semiconductor integrated circuit device and its packaging structure

Info

Publication number
JPH09116291A
JPH09116291A JP29208495A JP29208495A JPH09116291A JP H09116291 A JPH09116291 A JP H09116291A JP 29208495 A JP29208495 A JP 29208495A JP 29208495 A JP29208495 A JP 29208495A JP H09116291 A JPH09116291 A JP H09116291A
Authority
JP
Japan
Prior art keywords
semiconductor integrated
integrated circuit
circuit device
power supply
terminals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP29208495A
Other languages
Japanese (ja)
Inventor
Koichi Murakami
晃一 村上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP29208495A priority Critical patent/JPH09116291A/en
Publication of JPH09116291A publication Critical patent/JPH09116291A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0213Electrical arrangements not otherwise provided for
    • H05K1/0216Reduction of cross-talk, noise or electromagnetic interference
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3421Leaded components

Landscapes

  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)

Abstract

PROBLEM TO BE SOLVED: To prevent adjacent electronic parts from receiving electromagnetic interference(EMI) from an electromagnetic fields generated by current loops even when electric currents are made to flow in a semiconductor integrated circuit device. SOLUTION: In a semiconductor integrated circuit device LSI, a plurality of current circuits is enclosed in a package 100 and the current circuits are respectively provided with power supply terminals PS1-PS4 and grounding terminals GND1-GND4. The power supply terminals PS1-PS4 or grounding terminals GND1-GND4 are arranged on the facing sides of the package 100 so that the electric currents made to flow to the current circuits can flow in the opposite directions. Since the current loops of the current circuits are formed in the opposite directions, the electromagnetic fields H1 and H2 generated by the current loops are also directed in the opposite directions and the fields H1 and H2 offset each other. As a result, the radiation of electromagnetic waves from the LSI is suppressed as a whole and an effective countermeasure can be taken against EMI.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は通信装置やコンピュ
ータ等に用いられる半導体集積回路装置に関し、特にE
MI(不要電磁放射:electro magneti
c interference)を効果的に抑制するこ
とを可能にした半導体集積回路装置とその実装構造に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor integrated circuit device used for communication devices, computers, etc.
MI (unnecessary electromagnetic radiation: electro magneti)
The present invention relates to a semiconductor integrated circuit device capable of effectively suppressing c interference) and its mounting structure.

【0002】[0002]

【従来の技術】半導体集積回路装置はパッケージに電源
端子(PS端子)と接地端子(GND端子)が設けら
れ、これらの端子を通して通電を行うと、パッケージ内
に設けた回路に通流される電流が原因とされて電磁界が
発生し、これが近接する電子部品に対してEMIを生じ
させることがある。特に、近年の半導体集積回路装置の
大容量化に伴って通電力が増加されると、EMIの影響
は無視できないものとなる。このようなEMIを抑制す
るためには、半導体集積回路装置にEMIを吸収する等
して電磁波の発生を抑制するフェライト等の部品を挿入
する対策や、発生される電磁界が他の電子部品に影響を
与えないようなシールド壁を設ける対策が行われてい
る。しかしながら、これらの対策では半導体集積回路装
置が大型化され、或いは半導体集積回路装置を実装する
回路基板が大型化されるという問題が生じる。
2. Description of the Related Art In a semiconductor integrated circuit device, a package is provided with a power supply terminal (PS terminal) and a ground terminal (GND terminal). When power is supplied through these terminals, a current flowing through a circuit provided in the package is generated. An electromagnetic field is generated as a cause, and this may cause EMI to an electronic component in the vicinity. In particular, if the power supply is increased with the recent increase in capacity of semiconductor integrated circuit devices, the effect of EMI cannot be ignored. In order to suppress such EMI, measures such as inserting a component such as ferrite that suppresses the generation of electromagnetic waves by absorbing the EMI into the semiconductor integrated circuit device, or the generated electromagnetic field may be transmitted to other electronic components. Measures are being taken to install a shield wall that does not affect it. However, these measures cause a problem that the semiconductor integrated circuit device becomes large-sized or the circuit board on which the semiconductor integrated circuit device is mounted becomes large-sized.

【0003】このような問題に対して、特開平3−16
199号公報では、半導体集積回路装置における電磁放
射の原因となるクロック信号に流れる電流を抑制するこ
とで電磁放射を抑制する対策や、特開平4−26351
5号公報のように複数の回路におけるスイッチングタイ
ミングをずらして大電流が同時に流れないようにして電
磁放射を抑制する対策がなされている。
To address this problem, Japanese Patent Laid-Open No. 3-16
Japanese Patent Laid-Open No. Hei 4-26351 discloses a measure for suppressing electromagnetic radiation by suppressing a current flowing in a clock signal that causes electromagnetic radiation in a semiconductor integrated circuit device.
As described in Japanese Patent No. 5, a countermeasure is taken to suppress electromagnetic radiation by shifting switching timings in a plurality of circuits so that a large current does not flow at the same time.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、これら
公報に記載の対策では、半導体集積回路装置に通流する
電流量や信号のタイミングを制御しているために、回路
動作の制約が多くなり、回路設計の自由度が損なわれる
おそれがある。また、図5(a)に示すように、1枚或
いは複数の回路基板500に複数個の半導体集積回路装
置ICを実装した通信装置やコンピュータ等において、
個々の半導体集積回路装置ICからの電磁界の影響を抑
制する場合には、全ての半導体集積回路装置ICに対し
てその通電量の制御や信号タイミングの制御を行う必要
があり、そのための制御系が極めて複雑なものになると
いう問題がある。
However, in the measures described in these publications, the amount of current flowing through the semiconductor integrated circuit device and the timing of signals are controlled, so that there are many restrictions on the circuit operation. The degree of freedom in design may be impaired. Further, as shown in FIG. 5A, in a communication device, a computer, or the like in which a plurality of semiconductor integrated circuit device ICs are mounted on one or a plurality of circuit boards 500,
In order to suppress the influence of the electromagnetic field from each semiconductor integrated circuit device IC, it is necessary to control the energization amount and signal timing of all the semiconductor integrated circuit devices IC, and a control system therefor. Has the problem of being extremely complicated.

【0005】さらに、図5(a)のように、複数個の半
導体集積回路装置ICを実装した場合には、個々の半導
体集積回路装置ICから放射される電磁波を抑制して
も、図5(b)のように個々の半導体集積回路装置IC
において発生される電磁界Hがそれぞれ積算されるため
に、回路基板全体の放射量が極めて大きなものとなり、
EMIの影響が極めて顕著なものとなる。
Further, when a plurality of semiconductor integrated circuit devices ICs are mounted as shown in FIG. 5A, even if electromagnetic waves radiated from individual semiconductor integrated circuit devices ICs are suppressed, FIG. Individual semiconductor integrated circuit device IC as in b)
Since the electromagnetic fields H generated at are integrated respectively, the radiation amount of the entire circuit board becomes extremely large,
The effect of EMI becomes extremely significant.

【0006】本発明の目的は、個々の半導体集積回路装
置における電磁放射を抑制することが可能な半導体集積
回路装置を提供することにある。また、本発明の他の目
的は多数個の半導体集積回路装置を回路基板に配列実装
して半導体機器を構成した場合に、機器全体としての電
磁放射を抑制することが可能な実装構造を提供すること
にある。
An object of the present invention is to provide a semiconductor integrated circuit device capable of suppressing electromagnetic radiation in each semiconductor integrated circuit device. Another object of the present invention is to provide a mounting structure capable of suppressing electromagnetic radiation of the entire device when a large number of semiconductor integrated circuit devices are arranged and mounted on a circuit board to form a semiconductor device. Especially.

【0007】[0007]

【課題を解決するための手段】本発明の半導体集積回路
装置は、パッケージ内に複数の電流回路を封止し、かつ
各電流回路のそれぞれに電源端子と接地端子とを備えて
おり、かつ各電源端子または接地端子を前記パッケージ
の互いに対向する辺に配置し、各電流回路に通流される
電流の向きが互いに逆方向に向けられるように構成した
ことを特徴とする。
A semiconductor integrated circuit device according to the present invention has a package in which a plurality of current circuits are sealed, and each current circuit has a power supply terminal and a ground terminal. A power supply terminal or a ground terminal is arranged on opposite sides of the package, and the currents flowing through the current circuits are directed in opposite directions.

【0008】また、本発明の半導体集積回路装置の実装
構造は、電源端子と接地端子とを備える半導体集積回路
装置を1枚の回路基板に行列方向に配列して複数個搭載
し、かつ行方向または列方向の少なくとも一方向に隣接
する半導体集積回路装置は、それぞれの電源端子と接地
端子とが互いに反対方向に向けられていることを特徴と
する。あるいは、電源端子と接地端子とを備える半導体
集積回路装置をそれぞれ複数枚の回路基板に搭載し、こ
れらの回路基板をその厚さ方向に配列し、隣接する回路
基板に搭載されている半導体集積回路装置は、各電源端
子と接地端子とが互いに反対方向に向けられていること
を特徴とする。
Further, according to the semiconductor integrated circuit device mounting structure of the present invention, a plurality of semiconductor integrated circuit devices each having a power supply terminal and a ground terminal are arranged in a matrix direction on a single circuit board and mounted in a row direction. Alternatively, the semiconductor integrated circuit devices adjacent to each other in at least one of the column directions are characterized in that their power supply terminals and ground terminals are oriented in opposite directions. Alternatively, semiconductor integrated circuit devices each including a power supply terminal and a ground terminal are mounted on a plurality of circuit boards, the circuit boards are arranged in the thickness direction, and the semiconductor integrated circuits mounted on adjacent circuit boards. The device is characterized in that the power supply terminals and the ground terminals are oriented in opposite directions.

【0009】[0009]

【発明の実施の形態】次に、本発明の実施形態を図面を
参照して説明する。図1(a)は本発明を大規模半導体
集積回路装置LSIに適用した実施形態の平面図であ
る。このLSIは、矩形をしたフラット型パッケージ1
00の四周囲からそれぞれ多数本のリード101が突出
されており、各リード101はそれぞれPS端子、GN
D端子、信号端子として構成されており、特に、このL
SIでは、第1ないし第4のPS端子PS1〜PS4
と、これらPS端子に対応する第1ないし第4のGND
端子GND1〜GND4が設けられ、他の端子101は
全て信号端子として構成される。前記第1ないし第4の
PS端子PS1〜PS4と、第1ないし第4のGND端
子GND1〜GND4はそれぞれ対をなしており、それ
ぞれPS端子からGND端子に向けてLSI内で電流が
通流されるように構成される。
Next, embodiments of the present invention will be described with reference to the drawings. FIG. 1A is a plan view of an embodiment in which the present invention is applied to a large-scale semiconductor integrated circuit device LSI. This LSI is a rectangular flat type package 1
A large number of leads 101 are respectively projected from the four circumferences of 00, and each lead 101 has a PS terminal and a GN.
It is configured as a D terminal and a signal terminal.
In SI, the first to fourth PS terminals PS1 to PS4
And the first to fourth GNDs corresponding to these PS terminals
The terminals GND1 to GND4 are provided, and the other terminals 101 are all configured as signal terminals. The first to fourth PS terminals PS1 to PS4 and the first to fourth GND terminals GND1 to GND4 form a pair, and a current flows in the LSI from the PS terminal to the GND terminal. Is configured as follows.

【0010】そして、このLSIでは前記第1ないし第
4の各PS端子PS1〜PS4とGND端子GND1〜
GND4はそれぞれLSIパッケージ100の互いに反
対側の辺に対向するように配置しており、しかも第1及
び第3のPS端子PS1,PS3と第2及び第4のPS
端子PS2,PS4は互いに反対側の辺に対向して配置
され、したがって、第1及び第3のGND端子GND
1,GND3と第2及び第4のGND端子GND3,G
ND4もこれに対応して互いに反対側の辺に対向して配
置されている。
In this LSI, the first to fourth PS terminals PS1 to PS4 and the GND terminals GND1 to GND1 are connected.
The GNDs 4 are arranged so as to face the opposite sides of the LSI package 100, and the first and third PS terminals PS1 and PS3 and the second and fourth PS terminals are arranged.
The terminals PS2 and PS4 are arranged so as to face each other on opposite sides, and therefore, the first and third GND terminals GND are provided.
1, GND3 and second and fourth GND terminals GND3, G
Corresponding to this, the ND 4 is also arranged so as to face the opposite sides.

【0011】したがって、このLSIでは、第1ないし
第4の各PS端子とGND端子の間に通電を行うと、L
SI内において第1及び第3のPS端子とGND端子間
に通流される電流の向きと、同じく第2及び第4のPS
端子とGND端子間に通流される電流の向きは互いに逆
向きとなる。このため、図1(b)に模式的な斜視図を
示すように、第1及び第3のPS端子とGND端子間に
流れる電流により発生する電磁界H1の方向と、第2及
び第3のPS端子とGND端子間に流れる電流により発
生する電磁界H2の方向とは互いに逆向きとなり、この
結果両電磁界H1,H2が相互に打ち消しあい、LSI
全体としてみればLSIから発生される電磁界は殆ど零
となり、不要電磁放射が抑制される。これにより、LS
Iに近接された他の電子部品に対するEMIの影響を解
消することが可能となる。
Therefore, in this LSI, when electricity is applied between the first to fourth PS terminals and the GND terminal, L
The direction of the current flowing between the first and third PS terminals and the GND terminal in SI and the second and fourth PS terminals are the same.
The directions of the currents flowing between the terminals and the GND terminals are opposite to each other. Therefore, as shown in the schematic perspective view of FIG. 1B, the direction of the electromagnetic field H1 generated by the current flowing between the first and third PS terminals and the GND terminal, and the second and third directions. The directions of the electromagnetic fields H2 generated by the current flowing between the PS terminal and the GND terminal are opposite to each other, and as a result, both electromagnetic fields H1 and H2 cancel each other out, and the LSI
As a whole, the electromagnetic field generated from the LSI becomes almost zero, and unnecessary electromagnetic radiation is suppressed. This allows LS
It is possible to eliminate the influence of EMI on other electronic components located close to I.

【0012】なお、電流がLSI内の回路(ループ)に
流れた場合の差動モード放射(ディファレンシャル放
射)は、 E=131.6×10-16 (f2 AI)(1/r) sinθ で表される。なお、Eは電界(V/m)、fは周波数
(Hz)、Aは面積(m2 )、Iは電流(A)、rは距
離(m)である。したがって、この差動モード放射が互
いに逆方向に発生されるため、第1および第3のPS端
子とGND端子間に流れる電流と、第2および第4のP
S端子とGND端子間に流れる電流が等しいとすれば、
電磁界を互いに打ち消しあうことになる。
The differential mode radiation (differential radiation) when a current flows in a circuit (loop) in the LSI is E = 131.6 × 10 -16 (f 2 AI) (1 / r) sin θ expressed. E is an electric field (V / m), f is a frequency (Hz), A is an area (m 2 ), I is a current (A), and r is a distance (m). Therefore, since the differential mode radiation is generated in the opposite directions, the current flowing between the first and third PS terminals and the GND terminal and the second and fourth P terminals are generated.
If the currents flowing between the S terminal and the GND terminal are equal,
The electromagnetic fields will cancel each other out.

【0013】図2は本発明の第2の実施形態を示す図で
あり、(a)は平面図、(b)はその列方向の断面構成
図である。この実施例では多数個の半導体集積回路装置
ICを1枚の回路基板200に配列実装して通信装置や
コンピュータ等の電子装置を構成した例を示している。
この実施形態では、4×4=16個のICを回路基板2
00に行、列方向に枡目配列し、それぞれ回路基板20
0に電気接続して実装している。ここで、各ICでは、
その一方の角部に近いリードがPS端子として構成さ
れ、この角部と対角位置に近いリードがGND端子とし
て構成され、その他のリードが信号端子として構成され
ている。また、前記回路基板200は、多層配線構造と
され、電源層201、接地層202、信号層203がそ
れぞれ独立した配線層として構成され、回路基板200
に実装された前記ICは、それぞれのPS端子が電源層
201に、GND端子が接地層202に、信号端子が信
号層203にそれぞれ電気接続されている。
2A and 2B are views showing a second embodiment of the present invention, in which FIG. 2A is a plan view and FIG. 2B is a sectional view in the column direction. In this embodiment, an example in which a large number of semiconductor integrated circuit device ICs are arrayed and mounted on one circuit board 200 to constitute an electronic device such as a communication device or a computer is shown.
In this embodiment, 4 × 4 = 16 ICs are provided on the circuit board 2
00 in rows and columns arranged in a grid,
0 is electrically connected and mounted. Here, in each IC,
The lead near one of the corners is configured as a PS terminal, the lead near the corner is configured as a GND terminal, and the other leads are configured as signal terminals. In addition, the circuit board 200 has a multilayer wiring structure, and the power supply layer 201, the ground layer 202, and the signal layer 203 are configured as independent wiring layers.
The PS terminals of the above ICs are electrically connected to the power supply layer 201, the GND terminals to the ground layer 202, and the signal terminals to the signal layer 203, respectively.

【0014】そして、前記16個のICは、互いに行方
向(図の横方向)にはその平面方向の向きが同一方向に
向けられているが、列方向(図の縦方向)には、隣接す
るICの平面方向の向きが180度反対に向けられてい
る。したがって、特に列方向に隣接するIC間では、そ
のPS端子とGND端子が互いに逆方向に向けられてい
ることになる。
The 16 ICs are oriented in the same plane direction in the row direction (horizontal direction in the figure), but are adjacent to each other in the column direction (vertical direction in the figure). The direction of the plane of the IC is 180 degrees. Therefore, especially between the ICs adjacent in the column direction, the PS terminal and the GND terminal are directed in the opposite directions.

【0015】したがって、図2(b)に示されるよう
に、列方向に並ぶ各行のICにおいて、奇数行のICは
電源層201、PS端子、LSI内部、GND端子、接
地層202に向けて時計方向に電流ループが生じ、逆に
偶数行のICは反時計方向に電流ループが生じることに
なる。そして、各ICの電流ループによって前記したよ
うに電磁界H1,H2が発生されるが、各電磁界H1,
H2は隣接するICの電流ループの向きが逆であるため
に互いに逆方向に発生され、相互に打ち消しあうことに
なる。これにより、回路基板200の全体として発生さ
れる電磁界は殆ど零に近くなり、不要電磁放射が低減さ
れ、回路基板200に隣接する他の電子部品に対するE
MIの影響を解消ないし緩和することが可能となる。な
お、各行のICの電磁界を効果的に打ち消しあうために
は、各ICの電流値が等しく、あるいは略等しくなるよ
うに設計することが好ましい。
Therefore, as shown in FIG. 2B, in the ICs in each row arranged in the column direction, the ICs in the odd rows are clocked toward the power supply layer 201, the PS terminal, the inside of the LSI, the GND terminal, and the ground layer 202. A current loop is generated in the direction, and conversely, the ICs in the even rows have a current loop in the counterclockwise direction. Then, the electromagnetic fields H1 and H2 are generated by the current loop of each IC as described above.
H2 is generated in the opposite directions because the directions of the current loops of the adjacent ICs are opposite to each other, and cancels each other. As a result, the electromagnetic field generated as a whole of the circuit board 200 becomes close to zero, unnecessary electromagnetic radiation is reduced, and E for other electronic components adjacent to the circuit board 200 is reduced.
It is possible to eliminate or mitigate the influence of MI. In order to effectively cancel the electromagnetic fields of the ICs in each row, it is preferable to design the current values of the ICs to be equal or substantially equal.

【0016】図3は本発明の第3の実施形態を示す図で
あり、(a)はその側面図、(b),(c)はAA,B
Bの各線に沿う各回路基板の正面図である。この実施形
態では、複数枚(ここでは4枚)の回路基板300を上
下方向に多段に配置したブロックを構成し、このブロッ
クを左右方向に4段に積層して大規模な装置を構築して
いる。ここで、各回路基板の長さ方向、すなわち図3
(a)の左右方向に隣接する各回路基板300はそれぞ
れ同じ構成であるが、回路基板300の厚さ方向、すな
わち同図の上下方向に隣接する各回路基板はそれぞれ異
なる構成とされている。すなわち、同図において、奇数
列の回路基板301では、図3(b)のように、それぞ
れ実装されているICは全て同じ向きとされ、ここでは
PS端子を左側に、GND端子を右側に向けて配置され
ている。一方、偶数列の回路基板302では、図3
(c)のように、それぞれ実装されているICは全て同
じ向きとされているが、ここではPS端子を右側に、G
ND端子を左側に向けて配置されている。
FIG. 3 is a view showing a third embodiment of the present invention, (a) is a side view thereof, and (b) and (c) are AA and B.
It is a front view of each circuit board along each line of B. In this embodiment, a block in which a plurality of (here, four) circuit boards 300 are arranged in multiple stages in the vertical direction is configured, and the blocks are stacked in four stages in the horizontal direction to construct a large-scale device. There is. Here, the length direction of each circuit board, that is, FIG.
The circuit boards 300 adjacent to each other in the left-right direction in (a) have the same configuration, but the circuit boards 300 adjacent to each other in the thickness direction of the circuit board 300, that is, the vertical direction in FIG. That is, in the figure, in the odd-numbered circuit boards 301, as shown in FIG. 3B, all the mounted ICs are oriented in the same direction. Are arranged. On the other hand, in the even-numbered circuit boards 302, as shown in FIG.
As shown in (c), all the mounted ICs have the same orientation, but here, the PS terminal is on the right side and G
It is arranged with the ND terminal facing left.

【0017】したがって、この構成では、奇数列の各回
路基板301のICにおける電流の通流方向は全て同じ
であり、左側から右側に向けて電流が通流されるため、
各回路基板301において図3(a)の時計回りの電流
ループが生じ、これに応じた電磁界が発生される。これ
に対し、偶数列の各回路基板302のICにおける電流
の通流方向は右側から左側に向けて電流が通流されるた
め、各回路基板302においては図3(a)の反時計回
りの電流ループが生じ、これに応じた電磁界が発生され
る。したがって、奇数列と偶数列とではそれぞれ発生さ
れる電磁界の方向が逆となり、互いに打ち消しあい、装
置全体としての電磁界は殆ど零となり、他の電子部品に
対するEMIの影響を解消ないし緩和する。
Therefore, in this configuration, the currents in the ICs of the circuit boards 301 in the odd columns all flow in the same direction, and the currents flow from the left side to the right side.
A clockwise current loop shown in FIG. 3A is generated in each circuit board 301, and an electromagnetic field corresponding to the current loop is generated. On the other hand, since the current flows in the ICs of the circuit boards 302 in the even-numbered columns from the right side to the left side, the counterclockwise current of FIG. A loop is generated and an electromagnetic field corresponding to the loop is generated. Therefore, the directions of the electromagnetic fields generated in the odd-numbered columns and the directions in the even-numbered columns are opposite to each other, canceling each other, and the electromagnetic field of the entire device becomes almost zero, so that the influence of EMI on other electronic components is eliminated or alleviated.

【0018】なお、前記第2及び第3の実施形態では、
本発明を多数個のICを回路基板に実装した例を示して
いるが、図4に示すように、LSIを実装する回路基板
400においても同様に適用することができる。この実
施形態では、LSIに設けられたPS端子とGND端子
を、隣接するLSIで互いに逆方向に向けており、これ
により各LSIで発生される電流ループの向きを逆と
し、それぞれ発生される電磁界を互いに打ち消し合うよ
うにして不要電子放射を抑制し、EMIの影響を解消し
ているものである。
In the second and third embodiments,
Although the present invention shows an example in which a large number of ICs are mounted on a circuit board, the present invention can be similarly applied to a circuit board 400 on which an LSI is mounted as shown in FIG. In this embodiment, the PS terminal and the GND terminal provided in the LSI are directed in the opposite directions to each other in the adjacent LSIs, whereby the directions of the current loops generated in the respective LSIs are reversed, and the electromagnetic waves generated in the respective LSIs are reversed. By canceling the fields with each other, unnecessary electron emission is suppressed, and the effect of EMI is eliminated.

【0019】なお、この図4に示したLSIの実装構造
は、多数個のLSIを回路基板に実装する場合において
も、第1及び第2の実施形態で説明したように、行方向
或いは列方向に配列されるLSIの電流の通流方向を逆
向きとし、或いは多数の回路基板における隣接する回路
基板での電流通流方向を逆向きとした場合においても同
様に適用することができる。また、図示は省略したが、
1枚の回路基板の表裏両面にそれぞれICやLSIを実
装する場合においても、各ICやLSIの電流通流方向
を逆向きとすることで、同様に不要電磁放射の発生を抑
制することが可能である。
The mounting structure of the LSI shown in FIG. 4 has a row direction or a column direction even when a large number of LSIs are mounted on a circuit board, as described in the first and second embodiments. The same can be applied to the case where the current flowing directions of the LSIs arranged in the above are reversed, or the current flowing directions of the adjacent circuit boards in many circuit boards are reversed. Although illustration is omitted,
Even when ICs and LSIs are mounted on both the front and back sides of a single circuit board, the generation of unwanted electromagnetic radiation can be suppressed by setting the current flow direction of each IC or LSI in the opposite direction. Is.

【0020】[0020]

【発明の効果】以上説明したように本発明は、半導体集
積回路装置に設けられる複数個のPS端子またはGND
端子をパッケージの互いに反対側の辺に配置しているの
で、各PS端子とGND端子に通流される電流ループの
向きを逆向きとし、各電流ループによって発生される電
磁界を相互に打ち消し、半導体集積回路装置からの不要
電磁放射を抑制ないし解消して有効なEMI対策が実現
できる。
As described above, according to the present invention, a plurality of PS terminals or GNDs provided in a semiconductor integrated circuit device are provided.
Since the terminals are arranged on opposite sides of the package, the directions of the current loops flowing through the PS terminals and the GND terminals are opposite to each other, and the electromagnetic fields generated by the current loops are mutually canceled out, so that the semiconductor An effective EMI countermeasure can be realized by suppressing or eliminating unnecessary electromagnetic radiation from the integrated circuit device.

【0021】また、本発明の実装構造は、回路基板に搭
載された複数の半導体集積回路装置のPS端子とGND
端子を、平面上で隣接する半導体集積回路装置間で互い
に逆方向に向け、或いは複数の回路基板に搭載された半
導体集積回路装置のPS端子とGND端子を回路基板の
厚さ方向に隣接する半導体集積回路装置間で互いに逆方
向に向けているので、隣接する半導体集積回路装置の相
互間での電磁界を相互に打ち消し、回路基板全体とし
て、或いは複数の回路基板で構成される装置全体として
の不要電磁放射を抑制ないし解消し、有効なEMI対策
が実現できる。
Further, the mounting structure of the present invention has a PS terminal and a GND of a plurality of semiconductor integrated circuit devices mounted on a circuit board.
A semiconductor device in which terminals are oriented in mutually opposite directions between adjacent semiconductor integrated circuit devices on a plane, or PS terminals and GND terminals of semiconductor integrated circuit devices mounted on a plurality of circuit boards are adjacent in the thickness direction of the circuit boards. Since the integrated circuit devices are directed in opposite directions to each other, the electromagnetic fields between adjacent semiconductor integrated circuit devices are canceled each other, so that the entire circuit board or the entire device composed of a plurality of circuit boards is provided. Effective electromagnetic interference control can be realized by suppressing or eliminating unnecessary electromagnetic radiation.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の半導体集積回路装置の平面図と模式的
な斜視図である。
FIG. 1 is a plan view and a schematic perspective view of a semiconductor integrated circuit device of the present invention.

【図2】本発明の半導体集積回路装置の実装構造の正面
図と断面図である。
FIG. 2 is a front view and a sectional view of a mounting structure of a semiconductor integrated circuit device of the present invention.

【図3】本発明の実装構造の他の実施形態の側面図とA
A線、BB線に沿う正面図である。
FIG. 3 is a side view of another embodiment of the mounting structure of the present invention and FIG.
It is a front view which follows the A line and the BB line.

【図4】本発明の実装構造の更に他の実施形態の正面図
である。
FIG. 4 is a front view of still another embodiment of the mounting structure of the present invention.

【図5】従来の半導体集積回路装置の実装構造とその問
題点を説明するための図である。
FIG. 5 is a diagram for explaining a mounting structure of a conventional semiconductor integrated circuit device and its problems.

【符号の説明】[Explanation of symbols]

LSI 半導体集積回路装置 IC 半導体装置 100 パッケージ 101 リード 200,300,400 回路基板 201 電源層 202 接地層 203 信号層 301 奇数回路基板 302 偶数回路基板 PS 電源端子 GND GND(接地)端子 LSI semiconductor integrated circuit device IC semiconductor device 100 package 101 lead 200, 300, 400 circuit board 201 power supply layer 202 ground layer 203 signal layer 301 odd circuit board 302 even circuit board PS power supply terminal GND GND (ground) terminal

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 パッケージ内に複数の電流回路を封止
し、かつ各電流回路のそれぞれに電源端子と接地端子と
を備える半導体集積回路装置において、前記各電源端子
または接地端子を前記パッケージの互いに対向する辺に
配置し、前記各電流回路に通流される電流の向きが互い
に逆方向に向けられるように構成したことを特徴とする
半導体集積回路装置。
1. A semiconductor integrated circuit device in which a plurality of current circuits are sealed in a package, and each current circuit has a power supply terminal and a ground terminal, wherein each of the power supply terminals or ground terminals is mutually connected to the package. A semiconductor integrated circuit device, wherein the semiconductor integrated circuit devices are arranged on opposite sides so that the currents flowing through the current circuits are directed in opposite directions.
【請求項2】 電源端子と接地端子とを備える半導体集
積回路装置を1枚の回路基板に行列方向に配列して複数
個搭載してなる半導体集積回路装置の実装構造におい
て、行方向または列方向の少なくとも一方向に隣接する
半導体集積回路装置は、それぞれの電源端子と接地端子
とが互いに反対方向に向けられていることを特徴とする
半導体集積回路装置の実装構造。
2. A mounting structure of a semiconductor integrated circuit device, comprising a plurality of semiconductor integrated circuit devices having a power supply terminal and a ground terminal, arranged in a matrix direction on a single circuit board and mounted in a row direction or a column direction. In the semiconductor integrated circuit device mounting structure, the power supply terminal and the ground terminal of the semiconductor integrated circuit device adjacent to each other in at least one direction are directed in opposite directions.
【請求項3】 行方向または列方向のいずれか一方向に
隣接する半導体集積回路装置の電源端子と接地端子とが
互いに反対方向に向けられ、他の方向に隣接する半導体
集積回路装置は電源端子と接地端子とが同じ方向に向け
られてなる請求項2の半導体集積回路装置の実装構造。
3. A power supply terminal and a ground terminal of a semiconductor integrated circuit device adjacent to each other in one of a row direction and a column direction are oriented in opposite directions, and a semiconductor integrated circuit device adjacent to another direction is a power supply terminal. 3. The mounting structure for a semiconductor integrated circuit device according to claim 2, wherein the ground terminal and the ground terminal are oriented in the same direction.
【請求項4】 電源端子と接地端子とを備える半導体集
積回路装置をそれぞれ複数枚の回路基板に搭載し、これ
らの回路基板をその厚さ方向に配列してなる半導体集積
回路装置の実装構造において、隣接する回路基板に搭載
されている半導体集積回路装置は、各電源端子と接地端
子とが互いに反対方向に向けられていることを特徴とす
る半導体集積回路装置の実装構造。
4. A mounting structure of a semiconductor integrated circuit device, comprising: a semiconductor integrated circuit device having a power supply terminal and a ground terminal, each mounted on a plurality of circuit boards; and arranging the circuit boards in a thickness direction thereof. A semiconductor integrated circuit device mounted on an adjacent circuit board, wherein each power supply terminal and ground terminal are oriented in opposite directions.
JP29208495A 1995-10-14 1995-10-14 Semiconductor integrated circuit device and its packaging structure Pending JPH09116291A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29208495A JPH09116291A (en) 1995-10-14 1995-10-14 Semiconductor integrated circuit device and its packaging structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29208495A JPH09116291A (en) 1995-10-14 1995-10-14 Semiconductor integrated circuit device and its packaging structure

Publications (1)

Publication Number Publication Date
JPH09116291A true JPH09116291A (en) 1997-05-02

Family

ID=17777346

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29208495A Pending JPH09116291A (en) 1995-10-14 1995-10-14 Semiconductor integrated circuit device and its packaging structure

Country Status (1)

Country Link
JP (1) JPH09116291A (en)

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