JPH089627Y2 - ガスサンプリング装置 - Google Patents
ガスサンプリング装置Info
- Publication number
- JPH089627Y2 JPH089627Y2 JP1990121146U JP12114690U JPH089627Y2 JP H089627 Y2 JPH089627 Y2 JP H089627Y2 JP 1990121146 U JP1990121146 U JP 1990121146U JP 12114690 U JP12114690 U JP 12114690U JP H089627 Y2 JPH089627 Y2 JP H089627Y2
- Authority
- JP
- Japan
- Prior art keywords
- gas
- pipe
- temperature
- spray nozzle
- sampling device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005070 sampling Methods 0.000 title claims description 16
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 18
- 239000007921 spray Substances 0.000 claims description 17
- 238000005507 spraying Methods 0.000 claims description 3
- 238000010790 dilution Methods 0.000 description 9
- 239000012895 dilution Substances 0.000 description 9
- 238000001514 detection method Methods 0.000 description 3
- 239000003085 diluting agent Substances 0.000 description 3
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 230000003685 thermal hair damage Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000003595 mist Substances 0.000 description 2
- 238000009834 vaporization Methods 0.000 description 2
- 230000008016 vaporization Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000007865 diluting Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Landscapes
- Sampling And Sample Adjustment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990121146U JPH089627Y2 (ja) | 1990-11-19 | 1990-11-19 | ガスサンプリング装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990121146U JPH089627Y2 (ja) | 1990-11-19 | 1990-11-19 | ガスサンプリング装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0478539U JPH0478539U (OSRAM) | 1992-07-08 |
| JPH089627Y2 true JPH089627Y2 (ja) | 1996-03-21 |
Family
ID=31869019
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1990121146U Expired - Lifetime JPH089627Y2 (ja) | 1990-11-19 | 1990-11-19 | ガスサンプリング装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH089627Y2 (OSRAM) |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4586367A (en) * | 1984-03-19 | 1986-05-06 | Horiba Instruments Incorporated | Proportional exhaust sampler and control means |
| JPS6227549U (OSRAM) * | 1985-08-03 | 1987-02-19 | ||
| JP2675561B2 (ja) * | 1987-12-18 | 1997-11-12 | 株式会社日立製作所 | プラズマ微量元素分折装置 |
| JPH01227048A (ja) * | 1988-03-08 | 1989-09-11 | Fujitsu Ltd | 粒子組成分析装置 |
-
1990
- 1990-11-19 JP JP1990121146U patent/JPH089627Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0478539U (OSRAM) | 1992-07-08 |
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