JPH0864547A - Automatic teaching device of semiconductor manufacturing device - Google Patents

Automatic teaching device of semiconductor manufacturing device

Info

Publication number
JPH0864547A
JPH0864547A JP20092794A JP20092794A JPH0864547A JP H0864547 A JPH0864547 A JP H0864547A JP 20092794 A JP20092794 A JP 20092794A JP 20092794 A JP20092794 A JP 20092794A JP H0864547 A JPH0864547 A JP H0864547A
Authority
JP
Japan
Prior art keywords
boat
cassette
center
jig
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20092794A
Other languages
Japanese (ja)
Inventor
Hitoshi Nakagawa
均 中川
Shinji Yashima
伸二 八島
Mitsuhiro Oshima
光洋 尾島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kokusai Electric Corp
Original Assignee
Kokusai Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kokusai Electric Corp filed Critical Kokusai Electric Corp
Priority to JP20092794A priority Critical patent/JPH0864547A/en
Publication of JPH0864547A publication Critical patent/JPH0864547A/en
Pending legal-status Critical Current

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE: To enable the carriage of processed element to be constantly repeated smoothly and precisely. CONSTITUTION: An alignment jig 3 comprising a checked item (ball) 2 for checking the center thereof welded onto the center point of a quartz or SiC made dummy processed element 1 is mounted on a cassette, boat, etc., so that the check item 2 of the jig 3 may be checked for automatically correcting the checking center position to be regular one.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、縦型拡散・CVD装置
等の半導体製造装置の自動ティーチング装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an automatic teaching apparatus for semiconductor manufacturing equipment such as vertical diffusion / CVD equipment.

【0002】[0002]

【従来の技術】半導体製造装置、例えば縦型拡散・CV
D装置の自動ティーチング装置は、カセット棚のカセッ
トから被処理物、例えばウェーハを移載機により取出し
てボートへ搬送し、多数枚のウェーハを載置したボート
を反応管内に搬入し、ウェーハに拡散膜又はCVD膜を
生成し、膜処理済のウェーハを載置したボートを反応管
内より搬出し、膜処理済のウェーハをボートからカセッ
ト棚のカセット内へ搬送するものである。
2. Description of the Related Art Semiconductor manufacturing equipment such as vertical diffusion / CV
The automatic teaching device of the D device takes out an object to be processed, for example, a wafer from a cassette on a cassette shelf by a transfer machine and conveys it to a boat. A boat on which a film or a CVD film is generated and a film-processed wafer is placed is carried out from the reaction tube, and the film-processed wafer is transferred from the boat into the cassette on the cassette shelf.

【0003】このような縦型拡散・CVD装置の自動テ
ィーチング装置は、カセットとボートとの間でウェーハ
を搬送する場合、該搬送動作を移載機に教え込み、以
後、教え込んだ動作を正確に繰り返すことになる。又、
位置ずれにより前記動作が遂行されなくなると、これを
自動修正し再び当該動作を繰り返すことになる。この
際、カセット内のウェーハ中心とボート内のウェーハ中
心を検出し、正規の位置にあるかどうかを判断し、正規
位置にあることを確認してウェーハの搬送動作を正確に
繰り返すようにしている。
Such an automatic teaching apparatus for a vertical diffusion / CVD apparatus teaches a transfer operation to a transfer machine when a wafer is transferred between a cassette and a boat, and thereafter, the taught operation is accurately performed. Will be repeated. or,
When the operation is not performed due to the displacement, the operation is automatically corrected and the operation is repeated again. At this time, the center of the wafer in the cassette and the center of the wafer in the boat are detected to determine whether or not the wafer is in the proper position, and it is confirmed that the wafer is in the proper position to accurately repeat the wafer transfer operation. .

【0004】従来技術としては、カセット内のウェーハ
中心とボート内のウェーハ中心を検出する治具がなく、
移載機をオペレータが手動運転で搬出,搬入動作に必要
な経路,位置等をオペレータが目視で判断し、決定して
移載機に記憶させ、位置ずれが生じた場合再度目視し直
し、改めて記憶し直している。
As a conventional technique, there is no jig for detecting the center of the wafer in the cassette and the center of the wafer in the boat.
When the operator manually carries out the transfer machine, the operator visually judges the route, position, etc. required for the carry-in operation, makes a decision and stores it in the transfer machine. I remember it again.

【0005】[0005]

【発明が解決しようとする課題】上記従来例にあって
は、カセット内のウェーハ中心やボート内のウェーハ中
心を目視により測定しているため、熟練を要し、中心位
置調整に多大の労力と時間を必要とするばかりでなく、
中心位置調整を正確に行い難いという課題がある。
In the above-mentioned conventional example, since the center of the wafer in the cassette and the center of the wafer in the boat are visually measured, it requires skill and a great deal of labor and labor for adjusting the center position. Not only does it take time,
There is a problem that it is difficult to adjust the center position accurately.

【0006】[0006]

【課題を解決するための手段】本発明装置は、上記の課
題を解決するため、図1に示すようにカセットから被処
理物を取出してボートへ搬送し、該ボートを反応管内に
搬入して被処理物を処理し、該処理済みの被処理物をカ
セットへ搬送して被処理物の搬送動作を繰り返し行う半
導体製造装置の自動ティーチング装置において、石英又
はSiC製のダミー被処理物1の中心に、該中心を検出
するための被検出物2を溶接してなる位置合せ用治具3
をカセット,ボート内等に載置し、該治具3の被検出物
2を検出し、該検出中心位置を正規位置になるように自
動修正することを特徴とする。
In order to solve the above-mentioned problems, the apparatus of the present invention takes out an object to be processed from a cassette and conveys it to a boat as shown in FIG. In an automatic teaching device of a semiconductor manufacturing apparatus that processes an object to be processed, conveys the object to be processed to a cassette, and repeats the operation of conveying the object to be processed, the center of a dummy object 1 to be processed made of quartz or SiC. And a positioning jig 3 formed by welding a detected object 2 for detecting the center.
Is placed in a cassette, a boat, or the like, the object 2 to be detected of the jig 3 is detected, and the detection center position is automatically corrected to a normal position.

【0007】[0007]

【作 用】このような構成であるから、カセット内やボ
ート内に位置合せ用治具3を置き、該治具3の中心に設
けられた被検出物2を検出し、この検出中心位置が正規
の位置にあるかどうかを判断し、正規位置にないとき
は、その偏差を修正し、正規位置になったことを確認し
て被処理物の搬送動作を繰り返すことになる。
[Operation] With such a configuration, the positioning jig 3 is placed in the cassette or the boat, and the object 2 to be detected provided at the center of the jig 3 is detected. It is judged whether or not it is in the regular position, and when it is not in the regular position, the deviation is corrected, it is confirmed that it is in the regular position, and the transport operation of the object to be processed is repeated.

【0008】[0008]

【実施例】図1(A),(B)はそれぞれ本発明装置で
使用される位置合せ用治具の第1例を示す平面図及び側
面図である。本実施例は、カセット棚のカセットからウ
ェーハを移載機により取出してボートへ搬送し、多数枚
のウェーハが移載されたら、該ボートを反応管内に搬入
し、ウェーハに拡散膜又はCVD膜を生成し、ボートを
反応管より搬出してから膜生成済のウェーハをボートか
らカセットに戻し、以下ウェーハの搬送動作を繰り返し
行う縦型拡散・CVD装置の自動ティーチング装置にお
いて、石英又はSiC製、例えば石英製のダミー被処理
物1の中心に、該中心を検出するための石英又はSiC
製、例えば石英製のポール2を溶接してなる位置合せ用
治具3をカセット内やボート内に載置する。この治具3
のポール2を赤外線センサ、音波センサ等の位置検知セ
ンサ、例えば位置検知赤外線センサにより検出し、該検
出位置を正規位置になるように自動修正する。
1 (A) and 1 (B) are a plan view and a side view, respectively, showing a first example of a positioning jig used in an apparatus of the present invention. In this embodiment, the wafer is taken out from the cassette of the cassette shelf by a transfer machine and transferred to a boat, and when a large number of wafers are transferred, the boat is carried into a reaction tube, and a diffusion film or a CVD film is transferred to the wafer. In the automatic teaching apparatus of the vertical diffusion / CVD apparatus, in which the wafer having the film formed is returned from the boat to the cassette after the boat is carried out from the reaction tube, the wafer is made of quartz or SiC, for example, In the center of the dummy workpiece 1 made of quartz, quartz or SiC for detecting the center
A positioning jig 3 made by welding a pole 2 made of, for example, quartz, is placed in a cassette or a boat. This jig 3
The pole 2 is detected by a position detection sensor such as an infrared sensor or a sound wave sensor, for example, a position detection infrared sensor, and the detected position is automatically corrected to a regular position.

【0009】上記構成の本実施例において縦型拡散・C
VD装置のカセット内やボート内に位置合せ用治具3を
載置し、この治具3のポール2を位置検知赤外線センサ
により検出する。この検出位置が正規の位置にあるかど
うかを判断し、カセット,ボートの中心にウェーハの中
心がセットできる正規位置にないときは、その偏差を修
正し、正規位置にあることを確認してウェーハの搬送動
作を繰り返し、成膜動作を繰り返し行うことになる。正
規位置より位置ずれしたときは、これを自動修正し、再
びウェーハの搬送動作及び成膜動作を実行することにな
る。
In this embodiment having the above structure, the vertical diffusion C
The positioning jig 3 is placed in the cassette of the VD device or in the boat, and the pole 2 of the jig 3 is detected by the position detecting infrared sensor. It is judged whether or not this detection position is in the normal position, and if the center of the wafer is not in the normal position where the center of the cassette or boat can be set, correct the deviation and confirm that the wafer is in the normal position. The carrying operation is repeated, and the film forming operation is repeated. When the position is deviated from the normal position, it is automatically corrected and the wafer transfer operation and the film forming operation are executed again.

【0010】図1に示す位置合せ用治具を用いる場合
は、カセット内,ボート内のウェーハの中心位置を目視
により決定する従来例よりも位置検知赤外線センサによ
り正確に検出できるので、ウェーハの中心位置を速やか
に自動修正でき、ウェーハの搬送動作を常にスムーズに
正確に繰り返し実行することができる。なお、ウェーハ
の中心にポールを載せただけの治具ではポールの位置ず
れ、落下等により自動搬送できないが、本発明における
位置合せ用治具3は、ボートに直接、容易に載せること
ができることは勿論、ポール2を溶接してあるので、ポ
ールの位置ずれ、落下等が起るおそれがなく、自動搬送
することができる。又、ウェーハの中心にポールを接着
させた治具では自動搬送できるものの、超音波洗浄がで
きないばかりでなく、低圧下で接着剤からガスを放出す
るおそれがあるが、本発明治具では洗浄ができ、ガス放
出のおそれがなく、そのため客先のクリーンルームに持
ち込みができる等の特長を備えている。
When the alignment jig shown in FIG. 1 is used, the center of the wafer can be more accurately detected by the position detection infrared sensor than the conventional example in which the center position of the wafer in the cassette or the boat is visually determined. The position can be quickly and automatically corrected, and the wafer transfer operation can always be performed smoothly and accurately. It should be noted that a jig having only a pole placed on the center of the wafer cannot automatically convey the pole due to displacement of the pole, drop, etc. However, the alignment jig 3 in the present invention can be easily placed directly on the boat. Of course, since the pole 2 is welded, there is no risk of the pole being displaced or dropped, and it can be automatically conveyed. Further, although a jig having a pole attached to the center of the wafer can be automatically transported, ultrasonic cleaning cannot be performed, and gas may be released from the adhesive under low pressure. It is possible to carry it out into the customer's clean room without any fear of gas emission.

【0011】図2(A),(B)はそれぞれ本発明にお
ける位置合せ用治具の第2例を示す平面図及び側面図で
ある。図1に示す第1例では、治具3のポール2と、ボ
ートを形成するボート柱を誤検出するおそれがある。図
2に示す第2例は、この誤検出を回避するため、ダミー
被処理物1の中心に溶接されたポール2の左右いずれか
の側、例えば左側に、ボート4を形成するボート柱5を
隠す石英又はSiC製、例えば石英製の隠ぺい用プレー
ト6を溶接してなる。このような構成とすることによ
り、ボート4に本発明の位置合せ用治具3を載置し、こ
の治具3のポール2を位置検知赤外線センサにより検出
する。この際、位置検知赤外線センサを左方から右方へ
旋回させると、隠ぺい用プレート6により左側のボート
柱5を隠して検出することなく中心のポール2を確実に
検出することができる。
FIGS. 2A and 2B are a plan view and a side view showing a second example of the positioning jig of the present invention. In the first example shown in FIG. 1, there is a possibility that the pole 2 of the jig 3 and the boat column forming the boat may be erroneously detected. In order to avoid this erroneous detection, in the second example shown in FIG. 2, the boat pillar 5 forming the boat 4 is provided on either the left or right side of the pole 2 welded to the center of the dummy workpiece 1, for example, the left side. It is made by welding a concealing plate 6 made of concealing quartz or SiC, for example, quartz. With such a configuration, the positioning jig 3 of the present invention is placed on the boat 4, and the pole 2 of the jig 3 is detected by the position detection infrared sensor. At this time, when the position detecting infrared sensor is swung from the left to the right, the central pole 2 can be reliably detected without hiding and detecting the boat pillar 5 on the left side by the concealing plate 6.

【0012】図1,図2に示す第1,第2例では、石英
製であり、透明であるため、位置検知赤外線センサによ
るポール2の検出が誤検出となるおそれがある。そこ
で、この誤検出を回避するため、少なくともポール2及
び隠ぺい用プレート6、例えば治具全体を不透明にする
加工を施す。このように治具3を不透明に加工すること
により、ポール2を正確に検出することができる。
In the first and second examples shown in FIGS. 1 and 2, since they are made of quartz and transparent, the detection of the pole 2 by the position detection infrared sensor may be erroneous detection. Therefore, in order to avoid this erroneous detection, at least the pole 2 and the concealing plate 6, for example, the entire jig is processed to be opaque. By thus making the jig 3 opaque, the pole 2 can be accurately detected.

【0013】[0013]

【発明の効果】上述のように本発明によれば、石英又は
SiC製のダミー被処理物1の中心に、該中心を検出す
るための被検出物2を溶接してなる位置合せ用治具3を
カセット,ボート内等に載置し、該治具3の被検出物2
を検出し、該検出中心位置を正規位置になるように自動
修正することを特徴とするので、被処理物の搬送動作を
常にスムーズに正確に繰り返し行うことができる。
As described above, according to the present invention, the jig for alignment is formed by welding the object 2 to be detected for detecting the center of the dummy object 1 made of quartz or SiC. 3 is placed in a cassette, a boat, etc.
Is detected, and the detection center position is automatically corrected so as to be a normal position. Therefore, the transport operation of the object to be processed can always be performed smoothly and accurately.

【図面の簡単な説明】[Brief description of drawings]

【図1】(A),(B)はそれぞれ本発明装置で使用さ
れる位置合せ用治具の第1例を示す平面図及び側面図で
ある。
1A and 1B are a plan view and a side view showing a first example of a positioning jig used in an apparatus of the present invention.

【図2】(A),(B)はそれぞれ本発明における位置
合せ用治具の第2例を示す平面図及び側面図である。
2A and 2B are a plan view and a side view, respectively, showing a second example of the positioning jig in the present invention.

【符号の説明】[Explanation of symbols]

1 ダミー被処理物 2 被検出物(ポール) 3 位置合せ用治具 4 ボート 5 ボート柱 6 隠ぺい用プレート 1 Dummy processed object 2 Detected object (pole) 3 Jig for alignment 4 Boat 5 Boat pillar 6 Hiding plate

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 カセットから被処理物を取出してボート
へ搬送し、該ボートを反応管内に搬入して被処理物を処
理し、該処理済みの被処理物をカセットへ搬送して被処
理物の搬送動作を繰り返し行う半導体製造装置の自動テ
ィーチング装置において、石英又はSiC製のダミー被
処理物の中心に、該中心を検出するための被検出物を溶
接してなる位置合せ用治具をカセット,ボート内等に載
置し、該治具の被検出物を検出し、該検出中心位置を正
規位置になるように自動修正することを特徴とする半導
体製造装置の自動ティーチング装置。
1. An object to be treated is taken out from a cassette and conveyed to a boat, the boat is loaded into a reaction tube to treat the object to be treated, and the treated object is conveyed to a cassette to be treated. In an automatic teaching device of a semiconductor manufacturing apparatus that repeatedly carries out the above-mentioned transport operation, a positioning jig formed by welding an object to be detected for detecting the center of a dummy object made of quartz or SiC to a cassette An automatic teaching device for a semiconductor manufacturing apparatus, which is placed in a boat or the like, detects an object to be detected by the jig, and automatically corrects the detection center position to a regular position.
JP20092794A 1994-08-25 1994-08-25 Automatic teaching device of semiconductor manufacturing device Pending JPH0864547A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20092794A JPH0864547A (en) 1994-08-25 1994-08-25 Automatic teaching device of semiconductor manufacturing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20092794A JPH0864547A (en) 1994-08-25 1994-08-25 Automatic teaching device of semiconductor manufacturing device

Publications (1)

Publication Number Publication Date
JPH0864547A true JPH0864547A (en) 1996-03-08

Family

ID=16432603

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20092794A Pending JPH0864547A (en) 1994-08-25 1994-08-25 Automatic teaching device of semiconductor manufacturing device

Country Status (1)

Country Link
JP (1) JPH0864547A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002018753A (en) * 2000-06-29 2002-01-22 Asm Japan Kk Device and method for teaching wafer handling robot
JP2002367888A (en) * 2001-06-06 2002-12-20 Nikon Corp Aligner, substrate housing apparatus, and device production system
JP2005123261A (en) * 2003-10-14 2005-05-12 Yaskawa Electric Corp Teaching jig

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002018753A (en) * 2000-06-29 2002-01-22 Asm Japan Kk Device and method for teaching wafer handling robot
JP2002367888A (en) * 2001-06-06 2002-12-20 Nikon Corp Aligner, substrate housing apparatus, and device production system
JP4724954B2 (en) * 2001-06-06 2011-07-13 株式会社ニコン Exposure apparatus, device manufacturing system
JP2005123261A (en) * 2003-10-14 2005-05-12 Yaskawa Electric Corp Teaching jig
JP4501102B2 (en) * 2003-10-14 2010-07-14 株式会社安川電機 Teaching jig, robot taught using the same and teaching method of the robot

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