JPH086303Y2 - 光半導体装置測定装置 - Google Patents

光半導体装置測定装置

Info

Publication number
JPH086303Y2
JPH086303Y2 JP13615889U JP13615889U JPH086303Y2 JP H086303 Y2 JPH086303 Y2 JP H086303Y2 JP 13615889 U JP13615889 U JP 13615889U JP 13615889 U JP13615889 U JP 13615889U JP H086303 Y2 JPH086303 Y2 JP H086303Y2
Authority
JP
Japan
Prior art keywords
semiconductor device
optical semiconductor
holder
measuring
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP13615889U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0374368U (enExample
Inventor
和久 鵜川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP13615889U priority Critical patent/JPH086303Y2/ja
Publication of JPH0374368U publication Critical patent/JPH0374368U/ja
Application granted granted Critical
Publication of JPH086303Y2 publication Critical patent/JPH086303Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP13615889U 1989-11-22 1989-11-22 光半導体装置測定装置 Expired - Lifetime JPH086303Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13615889U JPH086303Y2 (ja) 1989-11-22 1989-11-22 光半導体装置測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13615889U JPH086303Y2 (ja) 1989-11-22 1989-11-22 光半導体装置測定装置

Publications (2)

Publication Number Publication Date
JPH0374368U JPH0374368U (enExample) 1991-07-25
JPH086303Y2 true JPH086303Y2 (ja) 1996-02-21

Family

ID=31683382

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13615889U Expired - Lifetime JPH086303Y2 (ja) 1989-11-22 1989-11-22 光半導体装置測定装置

Country Status (1)

Country Link
JP (1) JPH086303Y2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5603705B2 (ja) * 2010-08-06 2014-10-08 株式会社アドバンテスト デバイスインターフェイス装置および試験装置
JP6390354B2 (ja) * 2014-11-06 2018-09-19 オムロン株式会社 端子固定装置および端子固定方法
CN110987172B (zh) * 2019-12-18 2020-10-30 扬州天润传感技术有限公司 一种光敏传感器性能测试仪器

Also Published As

Publication number Publication date
JPH0374368U (enExample) 1991-07-25

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term