JPH0846284A - Semiconductor laser pellet - Google Patents

Semiconductor laser pellet

Info

Publication number
JPH0846284A
JPH0846284A JP17686094A JP17686094A JPH0846284A JP H0846284 A JPH0846284 A JP H0846284A JP 17686094 A JP17686094 A JP 17686094A JP 17686094 A JP17686094 A JP 17686094A JP H0846284 A JPH0846284 A JP H0846284A
Authority
JP
Japan
Prior art keywords
insulating film
pellet
semiconductor laser
electrode metal
metal film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17686094A
Other languages
Japanese (ja)
Inventor
Akiro Kobayashi
章朗 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Original Assignee
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Semiconductor Manufacturing Co Ltd, Kansai Nippon Electric Co Ltd filed Critical Renesas Semiconductor Manufacturing Co Ltd
Priority to JP17686094A priority Critical patent/JPH0846284A/en
Publication of JPH0846284A publication Critical patent/JPH0846284A/en
Pending legal-status Critical Current

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  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To correct the defective mounting and bonding in the assembling step by a method wherein a long protrusion is provided along an insulating film formed side on the surface of a metallic film near said side for preventing an insulator from bonding onto the surface of the electrode metallic film of a pellet or narrowing the bonding area for avoiding any defective mounting and bonding. CONSTITUTION:In order to form an insulating film 17 on the side of a pellet 10, a bar substrate 12 of a semiconductor layer is held between spacers 11 so as to form the insulating film 17 on the sides 13a, 13b of the insulating film 17 by sputtering step. At this time, if a protrusion 15a is formed on the electrode metallic film 14 on the surface of the pellet 10, no sputtered insulator will be bonded onto the shade 16a of the protrusion of a sputter source. Successively, the insulating film 17 is formed likewise on the opposite insulating film formed surface 13b. At this time, if another protrusion 15b is formed, any sputtered insulator will not be bonded onto the shade 16b of the sputter source.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体レーザペレット
の構造に関する。
FIELD OF THE INVENTION This invention relates to the structure of semiconductor laser pellets.

【0002】[0002]

【従来の技術】従来の半導体レーザ装置のペレットを図
4に示す平面図aおよび側面図bを用いて説明する。半
導体レーザペレットはInP基板42の表面にCr/A
u/Ti/Pt/Auの5層の表面電極金属膜44を有
する。裏面にはAu/Ge/Au/Ni/Ti/Auの
6層の裏面電極金属膜45を有する。ペレットの対向す
る2つの絶縁膜形成側面43は絶縁膜46を形成してな
る。上記半導体レーザペレットの製造工程のうち、本発
明に関わるInP基板42に電極金属膜(44、45)
を形成後、ペレット側面に酸化珪素、窒化珪素等の絶縁
膜をスパッタにより形成する方法について説明する。ペ
レットの対向する2箇所の側面に絶縁膜を形成するため
に、ウェーハ状態で電極金属膜(44、45)形成後、
絶縁膜形成側面をあらわし数十個のペレットが繋がった
状態でバー状(バー状基板)にへき開される。以下は図
5を用いて説明する。前記半導体レーザのバー状基板2
とほぼ同じ大きさ、形状のスペーサ1を絶縁膜形成側面
3を揃えて交互に重ね合わせる。この時、バー状基板2
のスパッタする絶縁物形成側面3とスペーサ1の側面を
同一平面になるように揃えて重ね合わせる。この重ね合
わせたスペーサ1とバー状基板2を蒸着用治具8に装着
し、押さえバネ9で重ね合わせ部4に隙間が生じないよ
うに保持する。この状態で絶縁物形成側面3に絶縁物を
スパッタし、絶縁膜を形成する。つづいて、反対側の側
面にも同様処理で絶縁膜を形成する。この絶縁膜が形成
されたバー状基板2を一個一個の半導体レーザーペレッ
トにへき開する。
2. Description of the Related Art A pellet of a conventional semiconductor laser device will be described with reference to a plan view a and a side view b shown in FIG. The semiconductor laser pellet is Cr / A on the surface of the InP substrate 42.
It has a surface electrode metal film 44 of five layers of u / Ti / Pt / Au. The back surface has a six-layer back surface electrode metal film 45 of Au / Ge / Au / Ni / Ti / Au. An insulating film 46 is formed on the two insulating film forming side surfaces 43 of the pellet which face each other. In the process of manufacturing the semiconductor laser pellet, the electrode metal film (44, 45) is formed on the InP substrate 42 according to the present invention.
A method of forming an insulating film of silicon oxide, silicon nitride, or the like on the side surface of the pellet by sputtering after forming is described. After forming the electrode metal films (44, 45) in a wafer state in order to form the insulating films on the two side surfaces of the pellet facing each other,
The side surface of the insulating film is shown, and several tens of pellets are connected to each other to be cleaved into a bar (bar-shaped substrate). The following will be described with reference to FIG. Bar-shaped substrate 2 of the semiconductor laser
The spacers 1 having substantially the same size and shape are alternately stacked with the insulating film formation side surfaces 3 aligned. At this time, the bar-shaped substrate 2
The side surface 3 of the insulator to be sputtered and the side surface of the spacer 1 are aligned and superposed so as to be flush with each other. The spacer 1 and the bar-shaped substrate 2 thus superposed are mounted on a vapor deposition jig 8 and held by a pressing spring 9 so that no gap is created in the superposed portion 4. In this state, an insulator is sputtered on the insulator forming side surface 3 to form an insulating film. Subsequently, an insulating film is formed on the opposite side surface by the same process. The bar-shaped substrate 2 on which this insulating film is formed is cleaved into individual semiconductor laser pellets.

【0003】[0003]

【発明が解決しようとする課題】上記半導体レーザのバ
ー状基板2の表面はエッチング処理工程を経ているため
に、スペーサ1との合わせ面に小さな隙間を生ずる場合
がある。また、スパッタのためのスペーサ1とバー状基
板の重ね合わせ時に異物が間に入っても隙間を生ずる。
この隙間に、スパッタ時の絶縁物が入り、半導体レーザ
ペレットの電極金属膜表面に付着する。この表面に付着
した絶縁物が、その後の組み立て工程のマウント性、ボ
ンディング性を阻害し、組み立て不良の原因になると言
う問題があった。
Since the surface of the bar-shaped substrate 2 of the semiconductor laser has undergone the etching process, a small gap may be formed on the mating surface with the spacer 1. In addition, when the spacer 1 for sputtering and the bar-shaped substrate are superposed on each other, a gap is created even if a foreign matter enters.
Insulators during sputtering enter this gap and adhere to the surface of the electrode metal film of the semiconductor laser pellet. There is a problem that the insulator attached to the surface hinders the mountability and the bondability in the subsequent assembling process and causes a defective assembly.

【0004】[0004]

【課題を解決するための手段】本発明は、側面に絶縁膜
を形成した半導体レーザペレットであって、前記絶縁膜
形成側面に沿って長い凸部を前記絶縁膜形成側面近傍の
金属膜表面に設けた半導体レーザペレットである。
According to the present invention, there is provided a semiconductor laser pellet having an insulating film formed on a side surface thereof, wherein a long protrusion along the insulating film forming side surface is formed on a metal film surface in the vicinity of the insulating film forming side surface. It is a semiconductor laser pellet provided.

【0005】[0005]

【作用】上記半導体レーザペレットによれば、ペレット
側面に絶縁膜を形成する際に金属膜表面のスパッタ側面
近傍の凸部はスパッタされた絶縁物を遮蔽し、スパッタ
源に対して凸部の影となる内部には絶縁物が付着しな
い。また、電極金属膜表面の凸部は重ね合わせ時にスペ
ーサと接触すると隙間を塞ぎ絶縁物の内部への侵入を防
ぐ。
According to the above semiconductor laser pellet, when the insulating film is formed on the side surface of the pellet, the convex portion near the sputter side surface of the metal film surface shields the sputtered insulator, and the convex portion shadows the sputter source. Insulation does not adhere to the inside. Further, the convex portion on the surface of the electrode metal film closes the gap when it comes into contact with the spacer at the time of stacking and prevents the insulative substance from entering the inside.

【0006】[0006]

【実施例1】本発明の一例を図2に示す。図2aは平面
図、図2bは側面図である。半導体レーザペレットはI
nP基板21の表面にCr/Au/Ti/Pt/Auの
5層の表面電極金属膜25を有して、最上層のAu層は
絶縁膜形成側面23に平行なストライブ状の凹部24、
凸部22を有してなる。この時、絶縁膜27側は凸部2
5にすることが望ましい。裏面はAu/Ge/Au/N
i/Ti/Auの6層の裏面電極金属膜26を有して、
ペレットの対向する2つの絶縁膜形成側面23は絶縁膜
27を形成してなる。本発明のペレットの製造方法は、
半導体レーザウェーハのInP基板21に裏面電極金属
膜26を蒸着またはスパッタにより形成する。さらに表
面電極金属は5層を蒸着またはスパッタで形成した後
に、厚さを必要とするためにAuメッキをすることによ
り表面電極金属膜25を形成する。つぎに、この表面電
極金属膜25にホトレジスト(図示せず)およびエッチ
ング(図示せず)により絶縁膜形成側面23に平行にス
トライブ状の凹部24、凸部22を形成する。この凹部
24、凸部22の各々のストライブ幅および段差は課題
に対する効果、製造上の制約を考慮して選ぶ。また、凹
部24および凸部22の各々のストライブ幅は同一にす
る必要はなく、ペレットの位置で変化させてよい。つぎ
に、このウェーハ上のペレットの対向する2箇所の絶縁
膜形成側面23に絶縁膜27を形成するために、ウェー
ハ状態で電極金属膜(25、26)形成後、ウェーハを
絶縁膜形成側面をあらわし数十個のペレットが繋がった
状態でバー状(バー状基板)にへき開する。本発明の半
導体レーザのバー状基板とスペーサ重ね合わせて、側面
へ絶縁物をスパッタする時のバー状基板とスペーサとの
隙間の状態を図1に示す。スペーサ11の間に半導体レ
ーザのバー状基板12を挟み、絶縁膜形成側面13aに
スパッタにより絶縁膜を形成する(従来の技術で説明し
た方法と同じ)。この時、ペレット表面の電極金属膜1
4に凸部15aが形成されていると、スパッタ源にたい
する凸部の影16aにはスパッタされた絶縁物が付着し
ない。つづいて、対向する絶縁膜形成面13bに同様に
スパッタにより絶縁膜を形成する。この時、ペレット表
面の電極金属膜14に凸部15bが形成されていると、
スパッタ源にたいする凸部の影16bにはスパッタされ
た絶縁物が付着しない。
Embodiment 1 An example of the present invention is shown in FIG. 2a is a plan view and FIG. 2b is a side view. The semiconductor laser pellet is I
A five-layered surface electrode metal film 25 of Cr / Au / Ti / Pt / Au is provided on the surface of the nP substrate 21, and the uppermost Au layer is a stripe-shaped recess 24 parallel to the insulating film formation side surface 23.
It has a convex portion 22. At this time, the insulating film 27 side is provided with the convex portion 2
5 is desirable. The back side is Au / Ge / Au / N
Having a six-layer back electrode metal film 26 of i / Ti / Au,
An insulating film 27 is formed on the two insulating film forming side surfaces 23 of the pellet which face each other. The manufacturing method of the pellet of the present invention,
The back electrode metal film 26 is formed on the InP substrate 21 of the semiconductor laser wafer by vapor deposition or sputtering. Further, five layers of the surface electrode metal are formed by vapor deposition or sputtering, and then Au plating is performed to obtain a thickness, so that the surface electrode metal film 25 is formed. Next, a stripe-shaped concave portion 24 and convex portion 22 are formed on the surface electrode metal film 25 in parallel with the insulating film formation side surface 23 by photoresist (not shown) and etching (not shown). The stripe width and the step of each of the concave portion 24 and the convex portion 22 are selected in consideration of the effect on the problem and manufacturing restrictions. Further, the stripe widths of the concave portion 24 and the convex portion 22 do not have to be the same, and may be changed depending on the position of the pellet. Next, in order to form the insulating films 27 on the insulating film forming side surfaces 23 of the two facing pellets on the wafer, after forming the electrode metal films (25, 26) in the wafer state, the wafer is placed on the insulating film forming side surfaces. Representation It is cleaved into a bar shape (bar-shaped substrate) with dozens of pellets connected. FIG. 1 shows a state of a gap between the bar-shaped substrate and the spacer when the bar-shaped substrate of the semiconductor laser of the present invention is superposed on the spacer and an insulator is sputtered on the side surface. The bar-shaped substrate 12 of the semiconductor laser is sandwiched between the spacers 11 and an insulating film is formed on the insulating film formation side surface 13a by sputtering (the same as the method described in the conventional technique). At this time, the electrode metal film 1 on the pellet surface
When the convex portion 15a is formed in 4, the sputtered insulator does not adhere to the shadow 16a of the convex portion with respect to the sputtering source. Subsequently, an insulating film is similarly formed on the opposing insulating film formation surface 13b by sputtering. At this time, if the convex portion 15b is formed on the electrode metal film 14 on the surface of the pellet,
The sputtered insulator does not adhere to the shadow 16b of the convex portion on the sputter source.

【0007】[0007]

【実施例2】本発明の例1と異なる他の一例を図3に示
す。図3aは平面図、図3bは側面図である。半導体レ
ーザペレットはInP基板31の表面にCr/Au/T
i/Pt/Auの5層の表面電極金属膜32を有して、
最上層のAu層の周辺部33は内部34より厚い。裏面
はAu/Ge/Au/Ni/Ti/Auの6層の裏面電
極金属膜35を有してなる。ペレットの対向する2つの
絶縁膜形成面36は絶縁膜37を形成してなる。本発明
のペレットの製造方法は、半導体レーザウェーハのIn
P基板31に裏面電極金属膜35を蒸着またはスパッタ
により形成する。さらに表面電極金属は5層を蒸着また
はスパッタで形成した後に、周辺の4辺を厚くするため
にAuメッキをして表面電極金属膜32を形成する。こ
のメッキ時にメッキ条件(Au濃度を含むメッキ液組
成、メッキ液の攪拌、陽極金属形状、メッキ温度、極性
を含む電圧波形、電流密度等)を選んで電極周辺部を厚
くした電極金属膜32を形成する。つぎに、このウェー
ハ上のペレットの対向する2箇所の側面に絶縁膜を形成
するために、ウェーハ状態で電極金属膜(32、35)
形成後、絶縁膜形成側面をあらわし数十個のペレットが
繋がった状態でバー状(バー状基板)にへき開される。
絶縁膜形成側面36への絶縁膜37形成方法および本発
明の効果は実施例1と同じである。
Second Embodiment Another example different from the first embodiment of the present invention is shown in FIG. 3a is a plan view and FIG. 3b is a side view. The semiconductor laser pellet is formed of Cr / Au / T on the surface of the InP substrate 31.
Having a five-layer surface electrode metal film 32 of i / Pt / Au,
The peripheral portion 33 of the uppermost Au layer is thicker than the inside 34. The back surface has six layers of back electrode metal film 35 of Au / Ge / Au / Ni / Ti / Au. An insulating film 37 is formed on the two opposing insulating film forming surfaces 36 of the pellet. The method for manufacturing pellets according to the present invention is based on In
The back electrode metal film 35 is formed on the P substrate 31 by vapor deposition or sputtering. Further, five layers of the surface electrode metal are formed by vapor deposition or sputtering, and then Au plating is performed to thicken the four peripheral sides to form the surface electrode metal film 32. At the time of this plating, a plating condition (plating solution composition including Au concentration, stirring of plating solution, anode metal shape, plating temperature, voltage waveform including polarity, current density, etc.) is selected to form an electrode metal film 32 having a thickened electrode peripheral portion. Form. Next, in order to form insulating films on two side surfaces of the pellet on the wafer which face each other, the electrode metal film (32, 35) is formed in a wafer state.
After the formation, the side surface of the insulating film is shown, and several tens of pellets are connected to each other and cleaved into a bar (bar-shaped substrate).
The method of forming the insulating film 37 on the insulating film forming side surface 36 and the effects of the present invention are the same as those in the first embodiment.

【0008】[0008]

【発明の効果】本発明によれば、ペレットの電極金属膜
表面への絶縁物の付着がなくなるか、付着面積が少なく
なり、組み立て時のマウント不良、ボンディング不良を
なくすか、少なくとも大幅に減少させる。
According to the present invention, the adhesion of the insulating material to the surface of the electrode metal film of the pellet is eliminated or the adhesion area is reduced to eliminate mounting defects and bonding defects during assembly, or at least greatly reduce them. .

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明のバー状基板とスペーサの隙間の状態
の側面図
FIG. 1 is a side view of a state in which a gap between a bar-shaped substrate and a spacer of the present invention is present.

【図2】 本発明のストライブ状電極金属膜表面ペレッ
トの平面図および側面図
FIG. 2 is a plan view and a side view of a stripe-shaped electrode metal film surface pellet of the present invention.

【図3】 本発明の電極金属膜表面周辺部凸状ペレット
の平面図および側面図
FIG. 3 is a plan view and a side view of a convex pellet around the surface of an electrode metal film of the present invention.

【図4】 従来のペレットの平面図および側面図FIG. 4 is a plan view and a side view of a conventional pellet.

【図5】 ペレット側面への絶縁物形成方法の斜視図FIG. 5 is a perspective view of a method for forming an insulator on the side surface of a pellet.

【符号の説明】[Explanation of symbols]

10 ペレット 13a,13b,23,36 絶縁物形成側面 14,25,32,34 電極金属膜 15,22,33 凸部 24 凹部 17,27,37 絶縁膜 10 Pellet 13a, 13b, 23, 36 Insulator formation side surface 14, 25, 32, 34 Electrode metal film 15, 22, 33 Convex part 24 Recessed part 17, 27, 37 Insulating film

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】側面に絶縁膜を形成した半導体レーザペレ
ットであって、前記絶縁膜形成側面に沿って長い凸部を
前記絶縁膜形成側面近傍の金属膜表面に設けた半導体レ
ーザペレット。
1. A semiconductor laser pellet having an insulating film formed on a side surface thereof, wherein a convex portion long along the insulating film forming side surface is provided on a metal film surface near the insulating film forming side surface.
【請求項2】側面に絶縁膜を形成した半導体レーザペレ
ットであって、前記絶縁膜形成側面に沿って平行なスト
ライブ状の凹凸を電極金属膜に設けた半導体レーザペレ
ット。
2. A semiconductor laser pellet having an insulating film formed on its side surface, wherein the electrode metal film is provided with stripe-shaped irregularities parallel to the side surface on which the insulating film is formed.
【請求項3】側面に絶縁膜を形成した半導体レーザペレ
ットであって、電極金属膜の周辺4辺に凸部を設けた半
導体レーザペレット。
3. A semiconductor laser pellet having an insulating film formed on a side surface thereof, wherein a convex portion is provided on four peripheral sides of an electrode metal film.
JP17686094A 1994-07-28 1994-07-28 Semiconductor laser pellet Pending JPH0846284A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17686094A JPH0846284A (en) 1994-07-28 1994-07-28 Semiconductor laser pellet

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17686094A JPH0846284A (en) 1994-07-28 1994-07-28 Semiconductor laser pellet

Publications (1)

Publication Number Publication Date
JPH0846284A true JPH0846284A (en) 1996-02-16

Family

ID=16021091

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17686094A Pending JPH0846284A (en) 1994-07-28 1994-07-28 Semiconductor laser pellet

Country Status (1)

Country Link
JP (1) JPH0846284A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007288090A (en) * 2006-04-20 2007-11-01 Nec Electronics Corp Semiconductor laser device, and its fabrication method
JP2008141180A (en) * 2006-11-10 2008-06-19 Sony Corp Semiconductor light emitting device, optical pickup device, and information recording/reproducing device
JP2018170308A (en) * 2017-03-29 2018-11-01 日本オクラロ株式会社 Semiconductor optical element, optical transmission module, optical module, optical transmission apparatus, and manufacturing method therefor

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007288090A (en) * 2006-04-20 2007-11-01 Nec Electronics Corp Semiconductor laser device, and its fabrication method
JP2008141180A (en) * 2006-11-10 2008-06-19 Sony Corp Semiconductor light emitting device, optical pickup device, and information recording/reproducing device
JP2011044719A (en) * 2006-11-10 2011-03-03 Sony Corp Semiconductor light emitting device, optical pickup device, and information recording/reproducing apparatus
US8243769B2 (en) 2006-11-10 2012-08-14 Sony Corporation Semiconductor light emitting device, optical pickup unit and information recording/reproduction apparatus
US8494020B2 (en) 2006-11-10 2013-07-23 Sony Corporation Semiconductor light emitting device, optical pickup unit and information recording/reproduction apparatus
JP2018170308A (en) * 2017-03-29 2018-11-01 日本オクラロ株式会社 Semiconductor optical element, optical transmission module, optical module, optical transmission apparatus, and manufacturing method therefor

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