JPH08304852A - Method and device for inspecting liquid crystal display substrate - Google Patents

Method and device for inspecting liquid crystal display substrate

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Publication number
JPH08304852A
JPH08304852A JP12977095A JP12977095A JPH08304852A JP H08304852 A JPH08304852 A JP H08304852A JP 12977095 A JP12977095 A JP 12977095A JP 12977095 A JP12977095 A JP 12977095A JP H08304852 A JPH08304852 A JP H08304852A
Authority
JP
Japan
Prior art keywords
liquid crystal
crystal display
display substrate
light
pixel electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12977095A
Other languages
Japanese (ja)
Inventor
Hajime Kusumi
肇 久住
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP12977095A priority Critical patent/JPH08304852A/en
Publication of JPH08304852A publication Critical patent/JPH08304852A/en
Pending legal-status Critical Current

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  • Liquid Crystal (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To shorten an inspection time and to precisely inspect a voltage state of a pixel electrode in the inspection of a liquid crystal display substrate before sealing a liquid crystal in it. CONSTITUTION: A sensor element 2 simultaneously accompanying an optical change according to respective voltage states for plural pixel electrodes 12 is made approach to or abutted on the liquid crystal display substrate 1, and a light source 3 radiating light 6 from a substrate rear surface in the surface direction is provided on the substrate rear surface, and the device is provided with a light detection part 5 making the light passing through the sensor element 2 optically changed by the voltage of the pixel electrode 12 and whose polarization state is changed incident on a polarizing plate 4, and converting the light to a light quantity proportioning to the polarization change amount by the polarizing plate 4, and detecting the light quantity and converting it to an electric signal.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は液晶ディスプレイ基板の
検査に関し、特に液晶封入前に生じる液晶ディスプレイ
基板の欠陥を検査する方法及び装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection of a liquid crystal display substrate, and more particularly to a method and an apparatus for inspecting a defect of the liquid crystal display substrate which occurs before liquid crystal is filled.

【0002】[0002]

【従来の技術】従来、液晶注入前に液晶ディスプレイ基
板を検査する方法及び装置として、プローバを用いて各
画素の薄膜トランジスタおよび画素電極の動作を電気的
に検査する方法及び装置が用いられている。
2. Description of the Related Art Conventionally, as a method and apparatus for inspecting a liquid crystal display substrate before injecting liquid crystal, a method and apparatus for electrically inspecting the operation of a thin film transistor and a pixel electrode of each pixel using a prober have been used.

【0003】また、液晶ディスプレイ基板の複数の画素
を同時に検査するための従来の検査装置として、例えば
図4に示すものがある。
A conventional inspection apparatus for inspecting a plurality of pixels on a liquid crystal display substrate at the same time is shown in FIG. 4, for example.

【0004】図4を参照して、液晶やポッケルス結晶か
ら成る電気光学素子41の上面に薄膜透明電極42、下
面に反射板43を備えたモジュール50を液晶ディスプ
レイ基板1の上面に微小な空間(間隙)をおいて配置す
る。
Referring to FIG. 4, a module 50 having a thin film transparent electrode 42 on the upper surface of an electro-optical element 41 made of liquid crystal or Pockels crystal and a reflecting plate 43 on the lower surface is provided in a small space on the upper surface of the liquid crystal display substrate 1. Place a gap.

【0005】画素電極にある電圧(被検査電圧)が存在
すると、薄膜透明電極42との電位差によって電気光学
素子41の光学的性質が変化する。
When a voltage (inspected voltage) is applied to the pixel electrode, the optical property of the electro-optical element 41 changes due to the potential difference with the thin film transparent electrode 42.

【0006】液晶ディスプレイ基板1に対して照射方向
が水平方向に配置されている光源3から光を照射し、モ
ジュール50上側に備えられたビームスプリッタ44で
反射されてモジュールに照射される。
The liquid crystal display substrate 1 is irradiated with light from a light source 3 arranged in a horizontal direction, reflected by a beam splitter 44 provided on the upper side of the module 50, and irradiated onto the module.

【0007】モジュール50に入射された光は反射板4
3によって反射され、ビームスプリッタ44方向へモジ
ュール50から出射される。その際、モジュールからの
出射光は電気光学素子41の光学的性質変化に応じて偏
光または光量が変化している。
The light incident on the module 50 is reflected by the reflection plate 4
It is reflected by 3 and is emitted from the module 50 toward the beam splitter 44. At that time, the emitted light from the module has its polarization or the amount of light changed in accordance with the change in the optical property of the electro-optical element 41.

【0008】出射光はビームスプリッタ44を通過し、
さらにフィルタ45を通過することにより、赤色を中心
とした特定波長のみが光検出部5に入力される。CCD
等から成る光検出部5でこの入射光を検出し、電気信号
に変換して各画素の動作(電圧)状態を検査する。
The emitted light passes through the beam splitter 44,
Further, by passing through the filter 45, only the specific wavelength centered on red color is input to the photodetection section 5. CCD
The incident light is detected by the photodetector 5 including the above, and is converted into an electric signal to inspect the operation (voltage) state of each pixel.

【0009】[0009]

【発明が解決しようとする課題】しかしながら、従来の
プローバを用いる方法及び装置は各画素を一つずつ電気
的に検査する必要があるため、検査に時間がかかり過ぎ
るという問題がある。
However, in the conventional method and apparatus using the prober, it is necessary to electrically inspect each pixel one by one, so that there is a problem that the inspection takes too long.

【0010】また、同時に複数画素を光学的に検査する
前記従来の装置(図4参照)は、モジュールの反射板で
反射された光を検出しており、モジュール50の入射光
および反射光が同じ光路であるため反射光の一部が光源
に戻ってしまい、その戻り光の影響により、例えば画素
電極の電圧が小さい場合には画素電極の電圧状態を正確
に検査できないという問題がある。
Further, the conventional device (see FIG. 4) for optically inspecting a plurality of pixels at the same time detects the light reflected by the reflection plate of the module, and the incident light and the reflected light of the module 50 are the same. Since it is an optical path, a part of the reflected light returns to the light source, and due to the effect of the returned light, the voltage state of the pixel electrode cannot be accurately inspected when the voltage of the pixel electrode is low.

【0011】従って、本発明の目的は上記問題点を解消
し、液晶封入前の液晶ディスプレイ基板の検査におい
て、検査時間を短縮し、画素電極の電圧状態を正確に検
査する方法及び装置を提供することにある。
Therefore, an object of the present invention is to solve the above problems and provide a method and apparatus for shortening the inspection time and accurately inspecting the voltage state of the pixel electrode in the inspection of the liquid crystal display substrate before the liquid crystal is sealed. Especially.

【0012】[0012]

【課題を解決するための手段】前記目的を達成するた
め、本発明は、表面に少なくともゲート配線、ソース配
線、画素電極及び薄膜トランジスタが形成されてなる液
晶封入前の液晶ディスプレイ基板上に、前記各画素電極
の電圧状態に応じて光学的特性を可変するセンサ装置を
前記基板表面と離間又は当接するようにして配し、前記
液晶ディスプレイ基板の基板裏面から表面方向へ所定の
偏光状態の光を入射し、前記基板表面から出力された光
を前記センサ装置に入射し、前記センサ装置からの出力
光の偏光状態に基づき前記画素電極の電圧状態を検出す
ることを特徴とする液晶ディスプレイ基板の検査方法を
提供する。
In order to achieve the above-mentioned object, the present invention provides a liquid crystal display substrate before liquid crystal encapsulation, which has at least a gate wiring, a source wiring, a pixel electrode and a thin film transistor formed on the surface thereof. A sensor device that changes optical characteristics according to the voltage state of the pixel electrode is arranged so as to be separated from or in contact with the surface of the substrate, and light of a predetermined polarization state is incident from the rear surface of the liquid crystal display substrate toward the surface. Then, the light output from the substrate surface is made incident on the sensor device, and the voltage state of the pixel electrode is detected based on the polarization state of the output light from the sensor device. I will provide a.

【0013】また、本発明は、液晶封入前の画素電極、
薄膜トランジスタ及びゲート、ソース各配線が形成され
てなる液晶ディスプレイ基板の表面上に、印加された電
界に応じて光学的変化を伴うセンサ素子を前記表面と離
間又は当接するようにして配し、前記液晶ディスプレイ
基板の基板裏面から表面(前記画素電極が配設された
面)方向へ直線偏光を放射させ、前記画素電極の電圧に
よって光学的に変化した前記センサ素子を通過すること
により偏光状態が変化した光を偏光板を通過させて偏光
変化量に比例した光量に変換し、前記光量を検出して電
気信号に変換し、該電気信号により画素電極の電圧状態
を検査することを特徴とする液晶ディスプレイ基板の検
査方法を提供する。
The present invention also provides a pixel electrode before encapsulating liquid crystal,
On the surface of the liquid crystal display substrate on which the thin film transistor, the gate, and the source wiring are formed, a sensor element accompanied by an optical change according to an applied electric field is arranged so as to be separated from or in contact with the surface. Linearly polarized light is emitted from the back surface of the display substrate toward the front surface (the surface on which the pixel electrode is provided), and the polarization state is changed by passing through the sensor element that is optically changed by the voltage of the pixel electrode. A liquid crystal display characterized in that light is passed through a polarizing plate to be converted into a light quantity proportional to a polarization change quantity, the light quantity is detected and converted into an electric signal, and the voltage state of the pixel electrode is inspected by the electric signal. A method for inspecting a board is provided.

【0014】さらに、本発明は、液晶ディスプレイ基板
のシューティングバーに電気信号を与え、各画素を駆動
させるプローバと電気信号発生装置を備え、前記液晶デ
ィスプレイ基板表面上に前記画素電極の電圧に応じて光
学的変化を伴うセンサ素子を配し、前記液晶ディスプレ
イ基板裏面から表面方向へ直線偏光を放射させる光源
と、前記センサ素子を通過して前記画素電極の電圧強度
に比例して偏光変化した光をその偏光変化量に比例した
光量に変換する偏光板と、前記偏光板からの光量を電気
信号に変換して出力する光検出部と、前記出力電気信号
を信号処理して画素電極の電圧を検出表示する信号処理
装置と、を備えることを特徴とする液晶ディスプレイ基
板の検査装置を提供する。
Further, according to the present invention, a prober for supplying an electric signal to a shooting bar of a liquid crystal display substrate to drive each pixel and an electric signal generator are provided, and the liquid crystal display substrate surface is provided with a prober according to a voltage of the pixel electrode. A sensor element with an optical change is arranged, and a light source that emits linearly polarized light from the back surface of the liquid crystal display substrate to a surface direction, and light that has changed polarization in proportion to the voltage intensity of the pixel electrode through the sensor element are provided. A polarizing plate that converts the amount of light proportional to the amount of change in polarization, a photodetector that converts the amount of light from the polarizing plate into an electric signal and outputs the electric signal, and a signal processing of the output electric signal to detect the voltage of the pixel electrode. There is provided a signal processing device for displaying, and an inspection device for a liquid crystal display substrate.

【0015】本発明の液晶ディスプレイ基板の検査方法
においては、好ましくは、前記センサ装置の後段に偏光
板を備え、前記偏光板が偏光変化量に対応した光量を出
力し、前記光量を電気信号に変換して前記画素電極の電
圧状態を検査することを特徴とする。
In the liquid crystal display substrate inspecting method of the present invention, preferably, a polarizing plate is provided at the subsequent stage of the sensor device, the polarizing plate outputs a light amount corresponding to a polarization change amount, and the light amount is converted into an electric signal. The voltage state of the pixel electrode is inspected after conversion.

【0016】本発明の液晶ディスプレイ基板の検査方法
においては、好ましくは、前記センサ装置が、ポッケル
ス効果をもつ電気光学結晶を含むことを特徴とする。
In the liquid crystal display substrate inspection method of the present invention, preferably, the sensor device includes an electro-optic crystal having a Pockels effect.

【0017】本発明の液晶ディスプレイ基板の検査方法
においては、好ましくは、前記センサ装置が、ガラス基
板の対向する面上に設けられた透明電極層の間に介装さ
れた液晶を含むことを特徴とする。
In the method for inspecting a liquid crystal display substrate according to the present invention, preferably, the sensor device includes a liquid crystal interposed between transparent electrode layers provided on opposite surfaces of the glass substrate. And

【0018】本発明の液晶ディスプレイ基板の検査方法
においては、好ましくは、前記液晶ディスプレイ基板の
基板裏面から表面方向へ直線偏光の光を入射することを
特徴とする。
In the liquid crystal display substrate inspection method of the present invention, preferably, linearly polarized light is incident from the substrate rear surface of the liquid crystal display substrate toward the surface.

【0019】本発明の液晶ディスプレイ基板の検査装置
においては、好ましくは、前記センサ素子が、ポッケル
ス効果をもつ電気光学結晶と、前記電気光学結晶の両側
端面上に設けた第1、第2の透明導電層と、を備え、前
記第2の透明導電層が前記画素電極に対応する位置に合
わせて複数に分割され、前記第2の透明導電層上に前記
第2の透明電導層よりも小面積の金属電極を備えたこと
を特徴とする。
In the liquid crystal display substrate inspection apparatus of the present invention, preferably, the sensor element has an electro-optic crystal having a Pockels effect, and first and second transparent layers provided on both end faces of the electro-optic crystal. A conductive layer, the second transparent conductive layer is divided into a plurality of portions corresponding to the positions corresponding to the pixel electrodes, and has a smaller area than the second transparent conductive layer on the second transparent conductive layer. It is characterized in that it is equipped with a metal electrode.

【0020】本発明の液晶ディスプレイ基板の検査装置
においては、好ましくは、前記センサ素子が、第1の透
明導電層を設けた第1のガラス基板と、前記画素電極に
対応する位置に合わせて複数に分割された第2の透明導
電層を設けた第2のガラス基板と、を備え、前記第2の
ガラス基板は前記画素電極に対応する位置に開孔を備
え、前記開孔部には前記第2のガラス基板の前記画素電
極に対向する端面に突出するように金属電極を挿通し、
前記第1の透明導電層と前記第2のガラス基板との間に
前記第2の透明電極を覆うように液晶を封入してなるこ
とを特徴とする。
In the liquid crystal display substrate inspecting apparatus of the present invention, preferably, the sensor elements are provided in a plurality of positions in correspondence with the first glass substrate provided with the first transparent conductive layer and the positions corresponding to the pixel electrodes. A second glass substrate provided with a second transparent conductive layer divided into, and the second glass substrate has an opening at a position corresponding to the pixel electrode, and the opening has the opening The metal electrode is inserted so as to protrude from the end surface of the second glass substrate facing the pixel electrode,
A liquid crystal is enclosed between the first transparent conductive layer and the second glass substrate so as to cover the second transparent electrode.

【0021】本発明の液晶ディスプレイ基板の検査装置
においては、好ましくは、前記液晶が、ネマティック型
の液晶からなることを特徴とする。
In the liquid crystal display substrate inspection apparatus of the present invention, preferably, the liquid crystal is a nematic type liquid crystal.

【0022】[0022]

【作用】本発明によれば、液晶ディスプレイ基板裏面か
ら表面側に直線偏光の照射し、画素電極の電位に応じて
偏光状態を変化させるセンサを介して偏光状態の変化を
検出することにより動作状態を検査するようにしたた
め、光の複数の画素を同時に検査することが可能とさ
れ、検査時間が短縮される。そして、本発明によれば、
図4に示した構成における、反射光の一部が光源に戻っ
てしまいその戻り光の影響により例えば画素電極の電圧
が小さい場合には画素電極の電圧状態を正確に検査でき
ないという問題が解消され、画素電極の電圧が小さい場
合でも正確に画素電極の電圧状態を検査できる。
According to the present invention, the operation state is detected by irradiating the liquid crystal display substrate from the back surface to the front surface with linearly polarized light and detecting the change in the polarization state through the sensor that changes the polarization state according to the potential of the pixel electrode. Since it is possible to inspect a plurality of light pixels at the same time, the inspection time can be shortened. And according to the present invention,
In the configuration shown in FIG. 4, part of the reflected light returns to the light source, and the problem that the voltage state of the pixel electrode cannot be accurately inspected due to the effect of the returned light when the voltage of the pixel electrode is small is solved. Even if the voltage of the pixel electrode is small, the voltage state of the pixel electrode can be accurately inspected.

【0023】また、本発明によれば、画素電極の電圧に
よって光学的特性が変化するセンサ素子として液晶を用
いた場合、被検査液晶ディスプレイ基板と同一寸法にセ
ンサ素子を作製することが可能とされ、検査時間を大幅
に短縮し、例えば大型液晶ディスプレイ基板の検査時間
の増大を抑止することができる。
Further, according to the present invention, when liquid crystal is used as the sensor element whose optical characteristics change depending on the voltage of the pixel electrode, the sensor element can be manufactured in the same size as the liquid crystal display substrate to be inspected. In addition, the inspection time can be significantly shortened, and an increase in the inspection time of, for example, a large-sized liquid crystal display substrate can be suppressed.

【0024】[0024]

【実施例】図面を参照して、本発明の実施例を以下に説
明する。
Embodiments of the present invention will be described below with reference to the drawings.

【0025】[0025]

【実施例1】図1は、本発明の一実施例に係る液晶ディ
スプレイ基板の検査装置の構成を示す図である。
[Embodiment 1] FIG. 1 is a diagram showing the configuration of a liquid crystal display substrate inspection apparatus according to an embodiment of the present invention.

【0026】図1を参照して、液晶注入前の液晶ディス
プレイ基板1の表面にセンサ素子2を近接もしくは接触
させる。詳しくは後述するように、画素電極12の電圧
(被検査電圧)によってセンサ素子2は光学的性質が変
化する。
Referring to FIG. 1, the sensor element 2 is brought close to or in contact with the surface of the liquid crystal display substrate 1 before liquid crystal injection. As will be described later in detail, the optical properties of the sensor element 2 change depending on the voltage of the pixel electrode 12 (voltage to be inspected).

【0027】液晶ディスプレイ基板1の裏面側に備えら
れた光源3から直線偏光の光6が出力され、液晶ディス
プレイ基板1を透過して、センサ素子2に入射される。
光6は、センサ素子2を通過することによってその偏光
状態が変化する。
The linearly polarized light 6 is output from the light source 3 provided on the back surface side of the liquid crystal display substrate 1, passes through the liquid crystal display substrate 1, and is incident on the sensor element 2.
The polarization state of the light 6 changes as it passes through the sensor element 2.

【0028】偏光状態の変化した光(センサ素子2を透
過した光)は、さらに偏光板4を通過することにより偏
光状態の変化量に比例した光量に変換され、光検出部5
に入射される。
The light whose polarization state has changed (light which has passed through the sensor element 2) is further converted into a light amount proportional to the amount of change in the polarization state by passing through the polarizing plate 4, and the photodetection section 5
Is incident on.

【0029】光検出部5は、フォトダイオードがマトリ
ックス状に配置されて構成されたフォトダイオードアレ
イやCCD等から成り、例えば入射された光量に比例し
た電気信号を出力する。
The photo-detecting section 5 is composed of a photodiode array or CCD in which photodiodes are arranged in a matrix, and outputs, for example, an electrical signal proportional to the amount of incident light.

【0030】被検査電圧とこの電気信号は比例関係にあ
るため、光検出部5から出力される電気信号強度によっ
て画素電極12の電圧状態を知ることができ、各画素の
動作を検査することができる。なお、検査時において液
晶ディスプレイ基板1表面上においていずれも不図示の
ソース配線、ゲート配線に接続されたシューティングバ
ーにそれぞれ信号発生装置からプローバを介して電圧を
印加し、画素を駆動する。シューティングバーは、液晶
を封入して液晶表示板を組み立てる後工程において切断
除去される。
Since the voltage to be inspected and this electric signal are in a proportional relationship, the voltage state of the pixel electrode 12 can be known from the intensity of the electric signal output from the photodetector 5, and the operation of each pixel can be inspected. it can. During inspection, a voltage is applied from a signal generator to a shooting bar connected to a source line and a gate line (not shown) on the surface of the liquid crystal display substrate 1 via a prober to drive pixels. The shooting bar is cut and removed in a later step of assembling the liquid crystal display panel by enclosing the liquid crystal.

【0031】次に、センサ素子2について詳説する。図
2に、本実施例におけるセンサ素子2の構成例(断面
図)を模式的に示す。
Next, the sensor element 2 will be described in detail. FIG. 2 schematically shows a configuration example (cross-sectional view) of the sensor element 2 in this example.

【0032】LiNbO3、KDP、GaAs等の電気
光学結晶21の上面にインジウム、錫、酸化物から成る
ITO膜である第1の透明導電層22が蒸着されてい
る。第1の透明導電層22はセンサ素子の端に配線を接
続し、その配線の先に端子を設け、端子を液晶ディスプ
レイ基板1のGND(接地)部に接触させることにより
電気的にGNDレベルにしている。
A first transparent conductive layer 22 which is an ITO film made of indium, tin or oxide is vapor-deposited on the upper surface of the electro-optic crystal 21 such as LiNbO 3 , KDP or GaAs. The first transparent conductive layer 22 has a wire connected to the end of the sensor element, a terminal is provided at the end of the wire, and the terminal is brought into contact with the GND (ground) portion of the liquid crystal display substrate 1 to electrically bring it to the GND level. ing.

【0033】電気光学結晶21の下面には、同様に透明
電導層を蒸着した後、印刷・エッチング技術により複数
に分割した第2の透明電導層23を形成し、その下に同
様の方法で金属電極24が形成されている。
Similarly, a transparent conductive layer is vapor-deposited on the lower surface of the electro-optical crystal 21, and then a second transparent conductive layer 23 which is divided into a plurality of parts is formed by a printing / etching technique. The electrode 24 is formed.

【0034】金属電極24は第2の透明電導層23上の
中心に位置し、第2の透明導電層23の面積よりも小さ
な寸法(例えば30μm×30μm□以下程度の面積)
とされる。金属電極24の材質はITOと密着性の良い
材質、例えばCr等が好ましい。
The metal electrode 24 is located at the center of the second transparent conductive layer 23 and has a size smaller than the area of the second transparent conductive layer 23 (for example, an area of about 30 μm × 30 μm □ or less).
It is said. The material of the metal electrode 24 is preferably a material having good adhesion to ITO, such as Cr.

【0035】第2の透明導電層23は被検査対象の液晶
ディスプレイ基板1の各画素電極12の上に重なるよう
な位置に、画素電極12と同程度のサイズ(例えば10
0μm×300μm程度の面積)で、マトリックス状に
複数形成されている。
The second transparent conductive layer 23 has the same size as the pixel electrode 12 (for example, 10) at a position where it overlies each pixel electrode 12 of the liquid crystal display substrate 1 to be inspected.
Multiple areas are formed in a matrix with an area of about 0 μm × 300 μm).

【0036】画素電極12に電圧が印加されると、第1
の透明導電層22と画素電極12の間に電位差が生じ、
電気光学結晶21内に縦方向に電界が発生する。この電
界強度に比例して、電気光学結晶21の屈折率が変化す
る。そして、光を電気光学結晶21に通過させることに
より、この屈折率の変化量に比例して光の偏光状態を変
化させている。
When a voltage is applied to the pixel electrode 12, the first
Potential difference occurs between the transparent conductive layer 22 and the pixel electrode 12 of
An electric field is generated in the electro-optic crystal 21 in the vertical direction. The refractive index of the electro-optic crystal 21 changes in proportion to the electric field strength. Then, by passing the light through the electro-optic crystal 21, the polarization state of the light is changed in proportion to the change amount of the refractive index.

【0037】[0037]

【実施例2】図3に、本発明の第2の実施例に係るセン
サ素子の構成を示す。
[Embodiment 2] FIG. 3 shows the structure of a sensor element according to a second embodiment of the present invention.

【0038】図3を参照して、第1のガラス基板31に
第1の透明導電層22を蒸着したものと、第2のガラス
基板32に複数の穴を開孔し、その穴に金属電極24を
埋め込み、さらに透明導電層を蒸着した後、印刷・エッ
チング技術により分割して金属電極24上に第2の透明
導電層23を形成し、対向する第1の透明導電層22と
第2の透明導電層23(第2のガラス基板32)の間に
液晶33が封入されている。
Referring to FIG. 3, a first glass substrate 31 having a first transparent conductive layer 22 deposited thereon and a second glass substrate 32 having a plurality of holes formed therein are provided with metal electrodes. After embedding 24 and further depositing a transparent conductive layer, it is divided by a printing / etching technique to form a second transparent conductive layer 23 on the metal electrode 24, and the first transparent conductive layer 22 and the second transparent conductive layer 22 facing each other are formed. Liquid crystal 33 is enclosed between the transparent conductive layers 23 (second glass substrate 32).

【0039】第2のガラス基板32に開孔される穴のサ
イズは直径が略30μmφ以下程度とされ、被検査対象
の液晶ディスプレイ基板1の各画素電極12の中心に位
置するように複数開孔される。
The size of the holes formed in the second glass substrate 32 is about 30 μmφ or less, and a plurality of holes are formed so as to be located at the center of each pixel electrode 12 of the liquid crystal display substrate 1 to be inspected. To be done.

【0040】金属電極24は画素電極12に近接する面
に対し、数μm程度突出させる。
The metal electrode 24 is projected by about several μm with respect to the surface close to the pixel electrode 12.

【0041】第2の透明導電層23は、被検査液晶ディ
スプレイ基板1の各画素電極12の上に重なるように金
属電極24を覆って、画素電極12と同程度のサイズ
(例えば100μm×300μm程度の面積)とし、マ
トリックス状に複数形成されている。
The second transparent conductive layer 23 covers the metal electrode 24 so as to overlap with each pixel electrode 12 of the liquid crystal display substrate 1 to be inspected, and has a size similar to that of the pixel electrode 12 (for example, about 100 μm × 300 μm). Area) and a plurality of them are formed in a matrix.

【0042】また、封入する液晶33は、好ましくはネ
マティック液晶が用いられる。ネマティック液晶は、高
分子分散型の液晶に比べ、光学的変化を開始する電位差
が低いため画素電極23の低い電圧も検出できる。
Further, the liquid crystal 33 to be sealed is preferably a nematic liquid crystal. The nematic liquid crystal can detect a low voltage of the pixel electrode 23 because the potential difference at which the optical change starts is lower than that of the polymer-dispersed liquid crystal.

【0043】画素電極12に電圧が印加されると、第1
の透明導電層22と画素電極12の間に電位差が生じ、
液晶分子にねじれ現象が起きる。光を液晶33に通過さ
せることにより、このねじれ現象に応じて光の偏光状態
を変化させている。
When a voltage is applied to the pixel electrode 12, the first
Potential difference occurs between the transparent conductive layer 22 and the pixel electrode 12 of
The twist phenomenon occurs in the liquid crystal molecules. By passing the light through the liquid crystal 33, the polarization state of the light is changed according to the twist phenomenon.

【0044】前記第1の実施例のセンサ素子では、電気
光学結晶21の寸法(例えば直径3インチφ程度)によ
り同時に検査できる画素数は制限されるが、本実施例に
おいては、被検査液晶ディスプレイ基板1と同一寸法に
センサ素子を作製することができるため、前記第1の実
施例よりも更に検査時間を短縮できる。
In the sensor element of the first embodiment, the number of pixels that can be inspected at the same time is limited by the size of the electro-optic crystal 21 (for example, diameter of about 3 inches φ), but in this embodiment, the liquid crystal display to be inspected is limited. Since the sensor element can be manufactured in the same size as the substrate 1, the inspection time can be further shortened as compared with the first embodiment.

【0045】以上、本発明を上記実施例に即して説明し
たが、本発明は上記態様にのみ限定されず、本発明の原
理に準ずる各種態様を含むことは勿論である。
Although the present invention has been described with reference to the above embodiments, the present invention is not limited to the above embodiments, and it goes without saying that the invention includes various embodiments according to the principles of the present invention.

【0046】[0046]

【発明の効果】以上説明したように、本発明によれば、
複数の画素を同時に検査することが可能とされ、検査時
間を短縮し、画素電極の電圧が小さい場合でも正確に画
素電極の電圧状態を検査できるという効果を有する。
As described above, according to the present invention,
A plurality of pixels can be inspected at the same time, and the inspection time can be shortened, and the voltage state of the pixel electrode can be accurately inspected even when the voltage of the pixel electrode is small.

【0047】また、本発明によれば、画素電極の電圧に
よって光学的特性が変化するセンサ素子として液晶を用
いたことにより、被検査液晶ディスプレイ基板と同一寸
法にセンサ素子を作製することが可能とされ検査時間を
大幅に短縮することができる。
Further, according to the present invention, since the liquid crystal is used as the sensor element whose optical characteristics change depending on the voltage of the pixel electrode, the sensor element can be manufactured in the same size as the liquid crystal display substrate to be inspected. Therefore, the inspection time can be greatly reduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例に係る液晶ディスプレイ基板
の検査方法及び装置を説明する図である。
FIG. 1 is a diagram illustrating a method and an apparatus for inspecting a liquid crystal display substrate according to an embodiment of the present invention.

【図2】本発明の第1の実施例におけるセンサ素子の構
成を説明する図である。
FIG. 2 is a diagram illustrating a configuration of a sensor element according to the first embodiment of the present invention.

【図3】本発明の第2の実施例におけるセンサ素子の構
成を説明する図である。
FIG. 3 is a diagram illustrating a configuration of a sensor element according to a second embodiment of the present invention.

【図4】従来の液晶ディスプレイ基板の検査方法及び装
置を説明する図である。
FIG. 4 is a diagram illustrating a conventional method and apparatus for inspecting a liquid crystal display substrate.

【符号の説明】[Explanation of symbols]

1 液晶ディスプレイ基板 2 センサ素子 3 光源 4 偏光板 5 光検出部 6 光 11 薄膜トランジスタ 12 画素電極 21 電気光学結晶 22 第1の透明導電層 23 第2の透明導電層 24 金属電極 31 第1のガラス基板 32 第2のガラス基板 33 液晶 41 電気光学素子 42 薄膜透明電極 43 反射板 44 ビームスプリッタ 45 フィルタ DESCRIPTION OF SYMBOLS 1 Liquid crystal display substrate 2 Sensor element 3 Light source 4 Polarizing plate 5 Optical detection part 6 Light 11 Thin film transistor 12 Pixel electrode 21 Electro-optic crystal 22 First transparent conductive layer 23 Second transparent conductive layer 24 Metal electrode 31 First glass substrate 32 second glass substrate 33 liquid crystal 41 electro-optical element 42 thin film transparent electrode 43 reflector 44 beam splitter 45 filter

Claims (10)

【特許請求の範囲】[Claims] 【請求項1】表面に少なくともゲート配線、ソース配
線、画素電極及び薄膜トランジスタが形成されてなる液
晶封入前の液晶ディスプレイ基板上に、前記各画素電極
の電圧状態に応じて光学的特性を可変するセンサ装置を
前記基板表面と離間又は当接するようにして配し、 前記液晶ディスプレイ基板の基板裏面から表面方向へ所
定の偏光状態の光を入射し、 前記基板表面から出力された光を前記センサ装置に入射
し、 前記センサ装置からの出力光の偏光状態に基づき前記画
素電極の電圧状態を検出することを特徴とする液晶ディ
スプレイ基板の検査方法。
1. A sensor for varying optical characteristics according to a voltage state of each pixel electrode on a liquid crystal display substrate before liquid crystal encapsulation, which has at least a gate line, a source line, a pixel electrode and a thin film transistor formed on a surface thereof. The device is arranged so as to be separated from or in contact with the substrate surface, light of a predetermined polarization state is incident from the substrate back surface of the liquid crystal display substrate to the surface direction, and the light output from the substrate surface is applied to the sensor device. A method for inspecting a liquid crystal display substrate, which comprises detecting a voltage state of the pixel electrode based on a polarization state of incident light and output light from the sensor device.
【請求項2】前記センサ装置の後段に偏光板を備え、前
記偏光板が偏光変化量に対応した光量を出力し、前記光
量を電気信号に変換して前記画素電極の電圧状態を検査
することを特徴とする請求項1記載の液晶ディスプレイ
基板の検査方法。
2. A polarizing plate is provided at a subsequent stage of the sensor device, the polarizing plate outputs a light amount corresponding to a polarization change amount, and the light amount is converted into an electric signal to inspect a voltage state of the pixel electrode. The method for inspecting a liquid crystal display substrate according to claim 1, wherein:
【請求項3】前記センサ装置が、ポッケルス効果をもつ
電気光学結晶を含むことを特徴とする請求項1記載の液
晶ディスプレイ基板の検査方法。
3. The method for inspecting a liquid crystal display substrate according to claim 1, wherein the sensor device includes an electro-optic crystal having a Pockels effect.
【請求項4】前記センサ装置が、ガラス基板の対向する
面上に設けられた透明電極層の間に介装された液晶を含
むことを特徴とする請求項1記載の液晶ディスプレイ基
板の検査方法。
4. The method for inspecting a liquid crystal display substrate according to claim 1, wherein the sensor device includes a liquid crystal interposed between transparent electrode layers provided on opposite surfaces of the glass substrate. .
【請求項5】前記液晶ディスプレイ基板の基板裏面から
表面方向へ直線偏光の光を入射することを特徴とする請
求項1又は2記載の液晶ディスプレイ基板の検査方法。
5. The method for inspecting a liquid crystal display substrate according to claim 1, wherein linearly polarized light is incident from the back surface of the liquid crystal display substrate toward the front surface.
【請求項6】液晶封入前の画素電極、薄膜トランジスタ
及びゲート、ソース各配線が形成されてなる液晶ディス
プレイ基板の表面上に、印加された電界に応じて光学的
変化を伴うセンサ素子を前記表面と離間又は当接するよ
うにして配し、 前記液晶ディスプレイ基板の基板裏面から表面(前記画
素電極が配設された面)方向へ直線偏光を放射させ、 前記画素電極の電圧により光学的に変化した前記センサ
素子を通過することによって偏光状態が変化した光を偏
光板を通過させて偏光変化量に比例した光量に変換し、 前記光量を検出して電気信号に変換し、該電気信号によ
り画素電極の電圧状態を検査することを特徴とする液晶
ディスプレイ基板の検査方法。
6. A sensor element accompanied by an optical change according to an applied electric field is formed on a surface of a liquid crystal display substrate on which a pixel electrode before encapsulating liquid crystal, a thin film transistor, a gate and a source wiring are formed. Arranged so as to be separated or in contact with each other, linearly polarized light is radiated from the substrate rear surface of the liquid crystal display substrate toward the surface (the surface on which the pixel electrode is disposed) direction, and the linearly polarized light is optically changed by the voltage of the pixel electrode. The light whose polarization state is changed by passing through the sensor element is passed through the polarizing plate to be converted into a light amount proportional to the polarization change amount, the light amount is detected and converted into an electric signal, and the electric signal causes the pixel electrode A method for inspecting a liquid crystal display substrate, which comprises inspecting a voltage state.
【請求項7】液晶ディスプレイ基板のシューティングバ
ーに電気信号を与え、各画素を駆動させるプローバと電
気信号発生装置を備え、 前記液晶ディスプレイ基板表面上に前記画素電極の電圧
に応じて光学的変化を伴うセンサ素子を配し、 前記液晶ディスプレイ基板裏面から表面方向へ直線偏光
を放射させる光源と、 前記センサ素子を通過して前記画素電極の電圧強度に比
例して偏光変化した光をその偏光変化量に比例した光量
に変換する偏光板と、 前記偏光板からの光量を電気信号に変換して出力する光
検出部と、 前記出力電気信号を信号処理して画素電極の電圧を検出
表示する信号処理装置と、 を備えることを特徴とする液晶ディスプレイ基板の検査
装置。
7. A prober for driving each pixel by applying an electric signal to a shooting bar of the liquid crystal display substrate and an electric signal generator, wherein an optical change is made on the surface of the liquid crystal display substrate according to the voltage of the pixel electrode. A light source for arranging the accompanying sensor element and emitting linearly polarized light from the back surface of the liquid crystal display substrate to the front surface direction, and a polarization change amount of light passing through the sensor element and changed in polarization in proportion to the voltage intensity of the pixel electrode. A polarizing plate for converting the amount of light from the polarizing plate into a light amount, a photodetector for converting the amount of light from the polarizing plate into an electric signal and outputting the electric signal, and a signal processing for processing the output electric signal to detect and display the voltage of the pixel electrode. An apparatus for inspecting a liquid crystal display substrate, comprising:
【請求項8】前記センサ素子が、ポッケルス効果をもつ
電気光学結晶と、 前記電気光学結晶の両側端面上に設けた第1、第2の透
明導電層と、を備え、 前記第2の透明導電層が前記画素電極に対応する位置に
合わせて複数に分割され、 前記第2の透明導電層上に前記第2の透明電導層よりも
小面積の金属電極を備えたことを特徴とする請求項7記
載の液晶ディスプレイ基板の検査装置。
8. The sensor element includes an electro-optic crystal having a Pockels effect, and first and second transparent conductive layers provided on both end surfaces of the electro-optic crystal, wherein the second transparent conductive material is provided. The layer is divided into a plurality of parts corresponding to the positions corresponding to the pixel electrodes, and a metal electrode having an area smaller than that of the second transparent conductive layer is provided on the second transparent conductive layer. 7. The liquid crystal display substrate inspection device according to 7.
【請求項9】前記センサ素子が、第1の透明導電層を設
けた第1のガラス基板と、 前記画素電極に対応する位置に合わせて複数に分割され
た第2の透明導電層を設けた第2のガラス基板と、を備
え、 前記第2のガラス基板は前記画素電極に対応する位置に
開孔を備え、 前記開孔部には前記第2のガラス基板の前記画素電極に
対向する端面に突出するように金属電極を挿通し、 前記第1の透明導電層と前記第2のガラス基板との間に
前記第2の透明電極を覆うように液晶を封入してなるこ
とを特徴とする請求項7記載の液晶ディスプレイ基板の
検査装置。
9. The sensor element is provided with a first glass substrate provided with a first transparent conductive layer and a second transparent conductive layer divided into a plurality of portions corresponding to positions corresponding to the pixel electrodes. A second glass substrate, wherein the second glass substrate has an opening at a position corresponding to the pixel electrode, and the opening portion has an end surface facing the pixel electrode of the second glass substrate. A metal electrode is inserted so as to protrude into the space, and liquid crystal is sealed between the first transparent conductive layer and the second glass substrate so as to cover the second transparent electrode. The liquid crystal display substrate inspection device according to claim 7.
【請求項10】前記液晶が、ネマティック型の液晶から
なることを特徴とする請求項7記載の液晶ディスプレイ
基板の検査装置。
10. The inspection device for a liquid crystal display substrate according to claim 7, wherein the liquid crystal is a nematic liquid crystal.
JP12977095A 1995-04-28 1995-04-28 Method and device for inspecting liquid crystal display substrate Pending JPH08304852A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12977095A JPH08304852A (en) 1995-04-28 1995-04-28 Method and device for inspecting liquid crystal display substrate

Publications (1)

Publication Number Publication Date
JPH08304852A true JPH08304852A (en) 1996-11-22

Family

ID=15017785

Family Applications (1)

Application Number Title Priority Date Filing Date
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WO2002071135A1 (en) * 2001-03-05 2002-09-12 Ishikawajima-Harima Heavy Industries Co., Ltd. Inspection device for liquid crystal driving substrate
US7212024B2 (en) 2001-03-05 2007-05-01 Ishikawajima-Harima Heavy Industries Co., Ltd. Inspection apparatus for liquid crystal drive substrates
CN1313865C (en) * 2001-03-05 2007-05-02 石川岛播磨重工业株式会社 Inspection device for liquid crystal driving substrate
KR100756229B1 (en) * 2006-10-26 2007-09-07 주식회사 탑 엔지니어링 Array tester
JP2008134238A (en) * 2006-10-26 2008-06-12 Top Engineering Co Ltd Array tester
JP2015108804A (en) * 2013-12-03 2015-06-11 三星ディスプレイ株式會社Samsung Display Co.,Ltd. Substrate inspection apparatus including liquid crystal modulator
CN111220904A (en) * 2018-11-23 2020-06-02 三星电子株式会社 Method of testing an interconnect substrate and apparatus for performing the method
CN111220904B (en) * 2018-11-23 2024-04-19 三星电子株式会社 Method of testing interconnect substrate and apparatus for performing the same

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